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Synonyme wurden verwendet für: Time-of-flight mass spectrometry
Suche ohne Synonyme: keywords:("Time-of-flight mass spectrometry")
Verwendete Synonyme:
- flugzeitmassenspektrometrie
- flugzeitmessung
- flugzeitmethode
- flugzeitspektrometrie
- flugzeitspektroskopie
- laufzeitspektrometrie
- laufzeitspektroskopie
- time of flight method
- time of flight secondary ion mass spectroscopy
- tof massenspektrometrie
- tof ms
- tof sims
- tof spektrometrie
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The relationship between end-group concentrations and stability of spin-coated thin polymer films investigated by ToF-SIMS depth profiling
Tema Archiv | 2013|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Online study on the co-pyrolysis of coal and corn with vacuum ultraviolet photoionization mass spectrometry
Elsevier | 2017|Schlagwörter: Photoionization time-of-flight mass spectrometry -
Self-localization of mixed organophosphonic acid and organothiol monolayers on patterned Al–Cu substrates
Elsevier | 2013|Schlagwörter: Imaging Time-of-Flight Secondary Ion Mass Spectroscopy -
Chemical and structural analysis of the bone-implant interface by TOF-SIMS, SEM, FIB and TEM: Experimental study in animal
Elsevier | 2012|Schlagwörter: Time of flight-secondary ion mass spectroscopy (TOF-SIMS) -
Degradation Mechanism of Solution-Processed Organic Light-Emitting Diodes: Sputter Depth-Profile Study
Elsevier | 2021|Schlagwörter: Time-of-flight secondary ion mass spectroscopy -
Investigation on the co-combustion mechanism of coal and biomass on a fixed-bed reactor with advanced mass spectrometry
Elsevier | 2019|Schlagwörter: Time-of-flight mass spectrometry -
Ar cluster ion beam sputtering of InSb investigated by ToF-SIMS
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy
NationallizenzElsevier | 2002|Schlagwörter: Time-of-flight-secondary ion mass spectroscopy -
Thermal cracking of triacylglycerols: Molecular beam studies
Elsevier | 2015|Schlagwörter: Time of flight mass spectrometry -
A novel mobile navigation monitoring system based on single photon ionization time-of-flight mass spectrometry: Instrumentation development, performance and application
Elsevier | 2022|Schlagwörter: Time-of-flight mass spectrometry -
Gas aggregated Ag nanoparticles as the inorganic matrix for laser desorption/ionization mass spectrometry
Elsevier | 2020|Schlagwörter: Laser desorption/ionization time-of-flight mass spectrometry -
ToF‐SIMS Imaging of DBD‐Plasma‐Printed Microspots on BOPP Substrates
Wiley | 2008|Schlagwörter: time‐of‐flight secondary‐ion mass spectroscopy (ToF‐SIMS) imaging -
Optical properties of MgO thin films grown by laser ablation technique
Freier ZugriffOnline Contents | 2016|Schlagwörter: Time-of-flight mass spectrometry -
Investigation of tribo-chemistry by means of stable isotopic tracers: Mechanism for durability of monomolecular boundary film
Elsevier | 2008|Schlagwörter: Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) -
The use of argon cluster bombardment for the surface preparation of paint cross-sections for analysis by ToF-SIMS
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Effects of fine‐dispersed PTFE on load carrying capacity of PEEK
Wiley | 2008|Schlagwörter: time‐of‐flight secondary ion mass spectroscopy (TOF‐SIMS) -
Effect of tribochemistry on lubricity of DLC films in hydrogen
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Tribochemical Reactions of Ionic Liquids Under Vacuum Conditions
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
The role of the adhesion promoter in a model water-borne primer
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Novel insight into pyrolysis behaviors of lignin using in-situ pyrolysis-double ionization time-of-flight mass spectrometry combined with electron paramagnetic resonance spectroscopy
Elsevier | 2020|Schlagwörter: Time-of-flight mass spectrometry -
Dual beam organic depth profiling using large argon cluster ion beams
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
ToF-SIMS analysis of anti-fretting films generated on the surface of ball bearings containing dithiocarbamate and dithiophosphate grease additives
Elsevier | 2004|Schlagwörter: Time-of-flight secondary ion mass spectroscopy (ToF-SIMS) -
Electrochemical, TOF-SIMS and XPS studies on the corrosion behavior of Q-phase in NaCl solutions as a function of pH
Elsevier | 2019|Schlagwörter: ToF-SIMS -
Investigation of biomass depolymerization by surface techniques
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Comparison of WTi and WTi(N) as diffusion barriers for Al and Cu metallization on Si with respect to thermal stability and diffusion behavior of Ti
Tema Archiv | 2014|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Multi-instrument characterization of the surfaces and materials in microfabricated, carbon nanotube-templated thin layer chromatography plates. An analogy to 'The Blind Men and the Elephant’
Tema Archiv | 2013|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
Surface characterization and stability of an epoxy resin surface modified with polyamines grafted on polydopamine
Elsevier | 2014|Schlagwörter: TOF-SIMS -
Multivariate Calibration of ToF‐SIMS and XPS Data from Plasma‐Treated Polypropylene Thin Films
Wiley | 2014|Schlagwörter: ToF‐SIMS -
Application of ToF-SIMS and PCA to study interaction mechanism of dodecylamine and smithsonite
Elsevier | 2019|Schlagwörter: ToF-SIMS -
Time of Flight – Secondary Ion Mass Spectroscopy Profiling of Self-Assembled Monolayer Patterns Based on Vapor Deposition Technique
Elsevier | 2022|Schlagwörter: Time of flight-secondary ion mass spectroscopy (TOF-SIMS) -
Why don’t biologists use SIMS?
A critical evaluation of imaging MSElsevier | 2006|Schlagwörter: Time-of-flight mass spectrometry -
Study of polymers and their blends using TOF-SIMS ion imaging
Elsevier | 2014|Schlagwörter: TOF-SIMS -
Laboratory Scale Systems for the Plasma Treatment and Coating of Particles
Tema Archiv | 2015|Schlagwörter: TOF-SIMS (time-of-flight secondary ion mass spectroscopy) -
A novel ToF-SIMS operation mode for sub 100nm lateral resolution: Application and performance
Elsevier | 2013|Schlagwörter: ToF-SIMS -
Changes in the chemical state of metallic Cr during deposition on a polyimide substrate: Full soft XPS and ToF-SIMS depth profiles
Elsevier | 2021|Schlagwörter: ToF-SIMS -
Surface analysis of EVOH and its nanocomposite photoageing: Particles effect
Elsevier | 2017|Schlagwörter: ToF-SIMS -
ToF-SIMS analysis of abiotic and biotic iron sulfide layers formed in aqueous conditions on iron surfaces
Elsevier | 2019|Schlagwörter: ToF-SIMS -
Using ToF-SIMS to study metal ions transfer between chalcopyrite and galena during grinding
Elsevier | 2020|Schlagwörter: ToF-SIMS -
Spectroscopic study of chemically stabilized dichroic thin crystal films
Elsevier | 2004|Schlagwörter: Time of flight secondary ion mass spectroscopy -
Multitechnique characterisation of 304L surface states oxidised at high temperature in steam and air atmospheres
Elsevier | 2016|Schlagwörter: ToF-SIMS -
Comprehensive study of deuterium-induced effects in austenitic stainless steel AISI 304L
Elsevier | 2019|Schlagwörter: ToF-SIMS -
Characterization of sulfide film on smithsonite surface during sulfidation processing and its response to flotation performance
Elsevier | 2019|Schlagwörter: TOF-SIMS -
Surface analytical investigation of nearly-frictionless carbon films after tests in dry and humid nitrogen
Elsevier | 2007|Schlagwörter: ToF-SIMS -
Thermal diffusion of lithium implanted in small and large grain boron carbide
Elsevier | 2023|Schlagwörter: TOF-SIMS -
Stability of La0.6Sr0.4Co0.2Fe0.8O3/Ce0.9Gd0.1O2 cathodes during sintering and solid oxide fuel cell operation
Elsevier | 2015|Schlagwörter: TOF-SIMS -
Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
Elsevier | 2015|Schlagwörter: ToF-SIMS -
Thermal annealing behavior of hydrogen and surface topography of H2 + ion implanted tungsten
Taylor & Francis Verlag | 2018|Schlagwörter: ToF-SIMS -
A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF
Elsevier | 2011|Schlagwörter: ToF-SIMS -
Time of flight mass spectrometry with continuously operating ion source
Elsevier | 2005|Schlagwörter: Time-of-flight mass spectrometry
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