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p-Co3O4/n-ZnO, Obtained by PECVD, Analyzed by X-ray Photoelectron Spectroscopy
American Institute of Physics | 2011|Schlagwörter: XE-AES -
Analysis of the Be KLL Auger Transition of Beryllium Nitride and Beryllium Carbide by AES
American Institute of Physics | 2015|Schlagwörter: AES -
HAXPES reference spectra of In, Sn, and ITO with Cr Kα excitation
American Institute of Physics | 2024|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
Analysis of the Be KLL Auger Transition on Beryllium and Beryllium Oxide by AES
American Institute of Physics | 2013|Schlagwörter: Auger electron spectroscopy AES -
Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (3): Transition metals period 6 elements (Hf, Ta, W, Re, Ir, Pt, Au)
American Institute of Physics | 2022|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
HAXPES reference spectra of bulk Mo and MoSe2 with Cr Kα excitation
American Institute of Physics | 2024|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
Oxidation of cobalt as investigated by x-ray photoelectron spectroscopy
American Institute of Physics | 2024|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (5): Various elements (Mg, Sb, Bi, Se, Gd, Dy, Yb)
American Institute of Physics | 2022|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
Analysis of Silicon Germanium Standards for the Quantification of SiGe Microelectronic Devices Using AES
American Institute of Physics | 2015|Schlagwörter: AES -
Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (2): Transition metals period 5 elements (Y, Zr, Nb, Mo, Ru, Rh, Pd, and Ag)
American Institute of Physics | 2022|Schlagwörter: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES) -
Introduction to Surface Science Spectra data on electron and x-ray damage: Sample degradation during XPS and AES measurements
American Institute of Physics | 2003|Schlagwörter: AES -
Insulator-based dielectrophoresis of mitochondriaa)
Freier ZugriffAmerican Institute of Physics | 2014|Schlagwörter: SPECIAL TOPIC: AES AT SCIX 2013: NEW DEVELOPMENTS IN ELECTROPHORESIS AND RELATED TECHNIQUES -
An unexpected particle oscillation for electrophoresis in viscoelastic fluids through a microchannel constrictiona)
Freier ZugriffAmerican Institute of Physics | 2014|Schlagwörter: SPECIAL TOPIC: AES AT SCIX 2013: NEW DEVELOPMENTS IN ELECTROPHORESIS AND RELATED TECHNIQUES -
Using surface plasmon resonance imaging to study bacterial biofilmsa)
Freier ZugriffAmerican Institute of Physics | 2014|Schlagwörter: SPECIAL TOPIC: AES AT SCIX 2013: NEW DEVELOPMENTS IN ELECTROPHORESIS AND RELATED TECHNIQUES -
Spatially variant red blood cell crenation in alternating current non-uniform fieldsa)
Freier ZugriffAmerican Institute of Physics | 2014|Schlagwörter: SPECIAL TOPIC: AES AT SCIX 2013: NEW DEVELOPMENTS IN ELECTROPHORESIS AND RELATED TECHNIQUES -
The Pd M4,5N1N2,3 Transition of Palladium Oxide
American Institute of Physics | 1998|Schlagwörter: AES -
Analysis of the Li KLL Auger Transition on Freshly Exposed Lithium and Lithium Surface Oxide by AES
American Institute of Physics | 2013|Schlagwörter: Auger electron spectroscopy AES -
The Ti LMM Auger Spectrum of a Titanium Hydride Film
American Institute of Physics | 2001|Schlagwörter: AES -
Electron Beam Damage in Poly(vinyl chloride) and Poly(acrylonitrile) as Observed by Auger Electron Spectroscopy
American Institute of Physics | 2003|Schlagwörter: AES -
A Comparison of Auger Electron Spectra from Stoichiometric Epitaxial TiN(001) After (1) UHV Cleaving and (2) Ar+ Sputter Etching
American Institute of Physics | 2000|Schlagwörter: AES
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