ZnSe quality analysis by x-ray luminescence [2113-17] (Englisch)
- Neue Suche nach: Artamonova, A. A.
- Neue Suche nach: Degoda, V. Y.
- Neue Suche nach: Rodionov, V. E.
- Neue Suche nach: SPIE
- Neue Suche nach: Artamonova, A. A.
- Neue Suche nach: Degoda, V. Y.
- Neue Suche nach: Rodionov, V. E.
- Neue Suche nach: Svechnikov, S. V.
- Neue Suche nach: Valakh, M. Y.
- Neue Suche nach: SPIE
In:
Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics
2113
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98-103
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1994
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:ZnSe quality analysis by x-ray luminescence [2113-17]
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Beteiligte:Artamonova, A. A. ( Autor:in ) / Degoda, V. Y. ( Autor:in ) / Rodionov, V. E. ( Autor:in ) / Svechnikov, S. V. / Valakh, M. Y. / SPIE
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Kongress:International workshop, Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 1993 ; Kiev
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Erschienen in:
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1994
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Format / Umfang:6 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Photodiffractive and photoabsorptive techniques for nondestructive control of semiconducting wafers and structures (Invited Paper) [2113-01]Jarasiuenas, K. / Gaubas, E. / SPIE et al. | 1994
- 2
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Photodiffractive and photoabsorptive techniques for nondestructive control of semiconducting wafers and structuresJarasiunas, Kestutis / Gaubas, E. et al. | 1994
- 12
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Some aspects of thin-film ellipsometry (Invited Paper) [2113-02]Bortchagovsky, E. G. / SPIE et al. | 1994
- 12
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Some aspects of thin-film ellipsometryBortchagovsky, Eugene G. et al. | 1994
- 17
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Optical diagnostics of quaternary narrow-gap semiconductors [2113-03]Tarasov, G. G. / Mazur, Y. I. / Tomm, J. W. / Kriven, S. I. / SPIE et al. | 1994
- 17
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Optical diagnostics of quaternary narrow-gap semiconductorsTarasov, Georgiy G. / Mazur, Yuri I. / Tomm, Jens W. / Kriven, S. I. / Lavorik, S. R. / Shevchenko, N. V. et al. | 1994
- 27
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Technique for studying thermodynamics of local influence laser radiation on thin films [2113-04]Ionov, V. V. / Grinko, D. A. / Teologov, V. V. / SPIE et al. | 1994
- 27
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Technique for studying thermodynamics of local influence laser radiation on thin filmsIonov, Vyacheslav V. / Grinko, D. A. / Teologov, V. V. et al. | 1994
- 31
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Spectral diagnostics of microelectronic material surface structure with high spatial resolution [2113-05]Bobrovskaya, I. P. / Chepilko, A. G. / Levash, L. V. / Puchkovskaya, G. A. / SPIE et al. | 1994
- 31
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Spectral diagnostics of microelectronic material surface structure with high spatial resolutionBobrovskaya, I. P. / Chepilko, A. G. / Levash, L. V. / Puchkovskaya, G. A. / Vedula, M. Y. et al. | 1994
- 35
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Diagnostics of the parameters, mechanism, and nature of the cadmium iodide crystal light sensitivity by optical absorption spectroscopy [2113-06]Bondar, V. D. / SPIE et al. | 1994
- 35
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Diagnostics of the parameters, mechanism, and nature of the cadmium iodide crystal light sensitivity by optical absorption spectroscopyBondar, Vyacheslav D. et al. | 1994
- 40
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Noninterference method of optical surface roughness measurementsKalugin, V. V. / Trofimov, A. V. / Zuniga, V. L. et al. | 1994
- 40
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Noninterference method of optical surface roughness measurements [2113-07]Kalugin, V. V. / Trofimov, A. V. / Zuniga, V. L. / SPIE et al. | 1994
- 45
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Diagnostics of multilayer dielectric coating based on reflection and transmission spectra [2113-08]Pervak, Y. A. / Fekeshgazi, I. V. / SPIE et al. | 1994
- 45
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Diagnostics of multilayer dielectric coating based on reflection and transmission spectraPervak, Yury A. / Fekeshgazi, Ishtvan V. et al. | 1994
- 50
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High-resolution IR laser spectral analysis in nondestructive onco-hematological diagnostics and semiconductor technique applicationsDarchuk, Sergey D. / Korovina, Larisa A. / Bebeshko, Vladimir G. / Sizov, Fiodor F. et al. | 1994
- 50
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High-resolution IR laser spectral analysis in nondestructive onco-hematological diagnostics and semiconductor technique applications (Invited Paper) [2113-09]Darchuk, S. D. / Korovina, L. A. / Bebeshko, V. G. / Sizov, F. F. / SPIE et al. | 1994
- 55
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Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurementsIndutnyi, Ivan Z. / Stetsun, Apollinary I. et al. | 1994
- 55
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Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurements [2113-10]Indutnyi, I. Z. / Stetsun, A. I. / SPIE et al. | 1994
- 60
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Solid state surface spectroscopy using the ellipsometric characteristics of guided-wave and surface polaritons [2113-11]Burshta, I. I. / Venger, E. F. / Zavadskii, S. N. / SPIE et al. | 1994
- 60
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Solid state surface spectroscopy using the ellipsometric characteristics of guided-wave and surface polaritonsBurshta, I. I. / Venger, Evgenie F. / Zavadskii, S. N. et al. | 1994
- 65
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Compound material investigation by spectroscopic ellipsometry [2113-12]Litovchenko, V. G. / Frolov, S. I. / Klyui, N. I. / SPIE et al. | 1994
- 65
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Compound material investigation by spectroscopic ellipsometryLitovchenko, Vladimir G. / Frolov, Sergey I. / Klyui, Nickolai I. et al. | 1994
- 70
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Optical monitoring of vitreous films: structure and composition [2113-13]Lisovskii, I. P. / Litovchenko, V. G. / Lozinskii, V. B. / Schmidt, E. G. / SPIE et al. | 1994
- 70
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Optical monitoring of vitreous films: structure and compositionLisovskii, I. P. / Litovchenko, Vladimir G. / Lozinskii, V. B. / Schmidt, E. G. et al. | 1994
- 78
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Photoluminescence characterization of silicon subjected to various industrial treatments (Invited Paper) [2113-14]Valakh, M. Y. / Rudko, G. Y. / Shakhraychuk, N. I. / SPIE et al. | 1994
- 78
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Photoluminescence characterization of silicon subjected to various industrial treatmentsValakh, Mikhail Y. / Rudko, Galina Y. / Shakhraychuk, N. I. et al. | 1994
- 85
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Spectral-luminescent determination of radiation-induced changes in scintillator crystals of registering systemsBelyi, M. U. / Nedelko, Sergiy G. / Diab, M. / Krisjuk, M. O. / Apanasenko, A. L. et al. | 1994
- 85
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Spectral-luminescent determination of radiation-induced changes in scintillator crystals of registering systems [2113-15]Belyi, M. U. / Nedelko, S. G. / Diab, M. / Krisjuk, M. O. / SPIE et al. | 1994
- 94
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Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels [2113-16]Shevel, S. G. / Taranenko, L. V. / Voznyi, V. L. / SPIE et al. | 1994
- 94
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Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levelsShevel, Serhiy G. / Taranenko, L. V. / Voznyi, Vladimir L. et al. | 1994
- 98
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ZnSe quality analysis by x-ray luminescence [2113-17]Artamonova, A. A. / Degoda, V. Y. / Rodionov, V. E. / SPIE et al. | 1994
- 98
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ZnSe quality analysis by x-ray luminescenceArtamonova, A. A. / Degoda, V. Y. / Rodionov, V. E. et al. | 1994
- 104
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Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials [2113-18]Babentsov, V. N. / Vlasenko, A. I. / Tarbaev, N. I. / SPIE et al. | 1994
- 104
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Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materialsBabentsov, Vladimir N. / Vlasenko, Aleksandr I. / Tarbaev, N. I. et al. | 1994
- 112
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Application of hyper-Raman spectroscopy in the study of bulk materialsPodobedov, V. B. et al. | 1994
- 112
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Application of hyper-Raman spectroscopy in the study of bulk materials (Invited Paper) [2113-19]Podobedov, V. B. / SPIE et al. | 1994
- 120
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Raman scattering (RS) and photoluminescence (PL) study of AlGaAs films grown from Ga-Bi-Al solution melt by LPEVasilkovskii, S. A. / Bacherikov, Yu. Y. / Krukovskii, Semen I. et al. | 1994
- 120
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Raman scattering (RS) and photoluminescence (PL) study of AlGaAs films grown from Ga-Bi-Al solution melt by LPE [2113-20]Vasilkovskii, S. A. / Bacherikov, Y. Y. / Krukovskii, S. I. / SPIE et al. | 1994
- 128
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Intracavity diagnostics of optical inhomogeneity [2113-21]Bekshaev, A. Y. / Grimblatov, V. M. / SPIE et al. | 1994
- 128
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Intracavity diagnostics of optical inhomogeneityBekshaev, Alexander Y. / Grimblatov, Valentin M. et al. | 1994
- 135
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Piezo-optic diagnostic of elastic tension and identification of defect types in CdTe by examination of exciton-defect complexes [2113-22]Pesetsky, B. E. / Shepelskii, G. A. / Strikha, M. V. / Tarbaev, N. I. / SPIE et al. | 1994
- 135
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Piezo-optic diagnostic of elastic tension and identification of defect types in CdTe by examination of exciton-defect complexesPesetsky, B. E. / Shepelskii, G. A. / Strikha, M. V. / Tarbaev, N. I. et al. | 1994
- 140
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Stress diagnostics in the plates of semiconductor crystals by means of light polarization modulation [2113-23]Serdega, B. K. / Zykov, V. G. / SPIE et al. | 1994
- 140
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Stress diagnostics in the plates of semiconductor crystals by means of light polarization modulationSerdega, Boris K. / Zykov, V. G. et al. | 1994
- 146
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Diagnostics of third-order nonlinear materials by nonlinear coherent polarimetry based on vector two-wave mixing (Invited Paper) [2113-24]Taranenko, V. B. / Bazhenov, V. Y. / Kulikovskaya, O. A. / SPIE et al. | 1994
- 146
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Diagnostics of third-order nonlinear materials by nonlinear coherent polarimetry based on vector two-wave mixingTaranenko, Victor B. / Bazhenov, Vladimir Y. / Kulikovskaya, Olga A. et al. | 1994
- 153
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Determination of parameters of transitional layers on metals by linear and nonlinear optical methodsBelyi, M. U. / Poperenko, Leonid V. / Robur, Lubomir I. / Shaikevich, Igor A. et al. | 1994
- 153
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Determination of parameters of transitional layers on metals by linear and nonlinear optical methods [2113-25]Belyi, M. U. / Poperenko, L. V. / Robur, L. I. / Shaikevich, I. A. / SPIE et al. | 1994
- 164
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Express method for optical strength diagnostics in transparent dielectrics and semiconductors [2113-26]Korsunskaya, N. E. / Kulish, N. R. / Pekar, G. S. / Singaevsky, A. F. / SPIE et al. | 1994
- 164
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Express method for optical strength diagnostics in transparent dielectrics and semiconductorsKorsunskaya, Nadezhda E. / Kulish, Nicolai R. / Pekar, Grigory S. / Singaevsky, Aleksandr F. et al. | 1994
- 169
-
Multiple charging of recombination centers as one of the causes of semiconductor scintillators inertialityRyzhikov, V. D. / Suprunenko, V. N. / Vakulenko, Olegh V. et al. | 1994
- 169
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Multiple charging of recombination centers as one of the causes of semiconductor scintillator inertiality [2113-27]Ryzhikov, V. D. / Suprunenko, V. N. / Vakulenko, O. V. / SPIE et al. | 1994
- 173
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Recharging of local centers and diagnostics of laser and nonlinear crystals (Invited Paper) [2113-28]Gorban, I. S. / Gumenjuk, A. F. / Kutovoy, S. Y. / SPIE et al. | 1994
- 173
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Recharging of local centers and diagnostics of laser and nonlinear crystalsGorban, Ivan S. / Gumenjuk, A. F. / Kutovoy, S. Y. et al. | 1994
- 180
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Laser-thermal diagnostics of multilayer opto- and microelectronic structuresSvechnikov, Sergey V. / Fedorenko, Leonid L. / Kaganovich, E. B. / Plahkotny, V. P. / Baranetz, S. V. / Antonov, V. A. et al. | 1994
- 180
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Laser-thermal diagnostics of multilayer opto- and microelectronic structures (Invited Paper) [2113-29]Svechnikov, S. V. / Fedorenko, L. L. / Kaganovich, E. B. / Plahkotny, V. P. / SPIE et al. | 1994
- 186
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Laser-interference dilatometry method for the investigation of thin-film structure mechanical stabilityTrunov, M. L. / Antchugin, A. G. / Savtchenko, N. D. / Rubish, V. M. et al. | 1994
- 186
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Laser-interference dilatometry method for the investigation of thin-film structure mechanical stability [2113-30]Trunov, M. L. / Antchugin, A. G. / Savtchenko, N. D. / Rubish, V. M. / SPIE et al. | 1994
- 194
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Photoacoustic spectro- and microscopy: new diagnostic methods for materials and devices for electronicsBlonskij, Ivan V. / Grytz, V. G. / Kozenev, V. F. / Thoryk, V. A. / Semenov, V. V. et al. | 1994
- 194
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Photoacoustic spectro- and microscopy: new diagnostic methods for materials and devices for electronics (Invited Paper) [2113-31]Blonskyi, I. V. / Grytz, V. G. / Kozenev, V. F. / Thoryk, V. A. / SPIE et al. | 1994
- 205
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Light-scattering method for structural perfection testing of both silicon surface and near-surface layers (Invited Paper) [2113-32]Domashev, G. E. / Shirshov, Y. M. / Sterligov, V. A. / Subbota, Y. V. / SPIE et al. | 1994
- 205
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Light-scattering method for structural perfection testing of both silicon surface and near-surface layersDomashev, G. E. / Shirshov, Yuri M. / Sterligov, Valeri A. / Subbota, Yuri V. / Svechnikov, Sergey V. et al. | 1994
- 214
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Method and measuring device for micro-optics element assessmentBondarenko, Alexander V. / Predko, Konstantin G. et al. | 1994
- 214
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Method and measuring device for micro-optics element assessment [2113-33]Bondarenko, A. V. / Predko, K. G. / SPIE et al. | 1994
- 219
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Polarization of the subthreshold emission and diagnostic of mechanical strain in semiconductor lasers and light-emitting diodesPtashchenko, Alexander A. / Prokopovich, Ludvig P. / Deych, Michael V. et al. | 1994
- 219
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Polarization of the subthreshold emission and diagnostic of mechanical strain in semiconductor lasers and light-emitting diodes [2113-34]Ptashchenko, A. A. / Prokopovich, L. P. / Deych, M. V. / SPIE et al. | 1994
- 226
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Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronicsBachevsky, Roman S. / Dostojny, Volodymyr A. / Muravsky, Leonid I. / Stefansky, Arkadiy I. / Naidich, Yurij V. / Grygorenko, Mykola F. et al. | 1994
- 226
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Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics [2113-35]Bachevsky, R. S. / Dostojny, V. A. / Muravsky, L. I. / Stefansky, A. I. / SPIE et al. | 1994
- 232
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Thermovisual system for qualitative control of electronic products [2113-36]Yablotchnikov, S. / Zavalnjuk, E. / SPIE et al. | 1994
- 232
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Thermovisual system for qualitative control of electronic productsYablotchnikov, Sergej / Zavalnjuk, Eugene et al. | 1994
- 236
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Express-control method of frequency nonreproducibility sources in frequency-stabilized He-Ne lasers [2113-37]Grimblatov, V. M. / Kalugin, V. V. / Mikhaylovskaya, L. V. / Zuniga, V. L. / SPIE et al. | 1994
- 236
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Express-control method of frequency nonreproducibility sources in frequency-stabilized He-Ne lasersGrimblatov, Valentin M. / Kalugin, V. V. / Mikhaylovskaya, Lidiya V. / Zuniga, V. L. et al. | 1994
- 243
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Methods and systems of indestructible contact-free television control of micro-objects [2113-38]Svechnikov, S. V. / Khorushenko, V. U. / Samoilova, I. A. / SPIE et al. | 1994
- 243
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Methods and systems of indestructible contact-free television control of micro-objectsSvechnikov, Sergey V. / Khorushenko, V. U. / Samoilova, I. A. et al. | 1994