Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) (Invited Paper) [2516-18] (Englisch)
- Neue Suche nach: Ko, C.-H.
- Neue Suche nach: Kirz, J.
- Neue Suche nach: Maier, K.
- Neue Suche nach: Winn, B.
- Neue Suche nach: SPIE
- Neue Suche nach: Ko, C.-H.
- Neue Suche nach: Kirz, J.
- Neue Suche nach: Maier, K.
- Neue Suche nach: Winn, B.
- Neue Suche nach: Yun, W.
- Neue Suche nach: SPIE
In:
X-ray microbeam technology and applcations
2516
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150-159
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1995
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) (Invited Paper) [2516-18]
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Beteiligte:
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Kongress:Conference, X-ray microbeam technology and applcations ; 1995 ; San Diego; CA
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Erschienen in:X-ray microbeam technology and applcations , 2516 ; 150-159PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 2516 ; 150-159
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1995
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Format / Umfang:10 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Fabrication of high-resolution x-ray diffractive optics at King's College LondonCharalambous, Pambos S. / Anastasi, Peter A. F. / Burge, Ronald E. / Popova, Katia et al. | 1995
- 2
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Fabrication of high-resolution x-ray diffractive optics at King's College London (Invited Paper) [2516-01]Charalambous, P. S. / Anastasi, P. A. / Burge, R. E. / Propova, K. / SPIE et al. | 1995
- 15
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Microfocusing optics for hard xrays fabricated by x-ray lithographyKrasnoperova, Azalia A. / Chen, Zheng / Cerrina, Franco / Di Fabrizio, Enzo M. / Gentili, Massimo / Yun, Wenbing / Lai, Barry P. / Gluskin, Efim S. et al. | 1995
- 15
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Microfocusing optics for hard x rays fabricated by x-ray lithography (Invited Paper) [2516-02]Krasnoperova, A. A. / Chen, Z. / Cerrina, F. / Difabrizio, E. / SPIE et al. | 1995
- 27
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Bragg-Fresnel optics at the ESRF: microdiffraction and microimaging applications (Invited Paper) [2516-03]Snigirev, A. A. / Kohn, V. / SPIE et al. | 1995
- 27
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Bragg-Fresnel optics at the ESRF: microdiffraction and microimaging applicationsSnigirev, Anatoly A. / Kohn, Victor et al. | 1995
- 38
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New generation of multilayer Bragg-Fresnel lenses [2516-04]Erko, A. I. / Firsov, A. / Yakshin, A. / Chevallier, P. / SPIE et al. | 1995
- 38
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New generation of multilayer Bragg-Fresnel lensesErko, Alexei I. / Firsov, Alexander A. / Yakshin, Andrey E. / Chevallier, Pierre / Dhez, Pierre et al. | 1995
- 41
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Microfocusing 4-keV to 65-keV xrays with bent Kirkpatrick-Baez mirrorsEng, Peter J. / Rivers, Mark L. / Yang, Bingxin X. / Schildkamp, Wilfried et al. | 1995
- 41
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Microfocusing 4-keV to 65-keV x rays with bent Kirkpatrick-Baez mirrors (Invited Paper) [2516-05]Eng, P. J. / Rivers, M. L. / Yang, B. X. / Schildkamp, W. / SPIE et al. | 1995
- 52
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Parameter optimization for producing an elliptical surface from a spherical surface by differential deposition [2516-06]Cai, Z. / Yun, W. / Plag, P. / SPIE et al. | 1995
- 52
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Parameter optimization for producing an elliptical surface from a spherical surface by differential depositionCai, Zhonghou / Yun, Wenbing / Plag, P. et al. | 1995
- 69
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Development of a novel x-ray focusing technique using crystals with a two-dimensionally modulated surfaces [2516-07]Chang, W. Z. / Kley, E.-B. / Fuchs, H.-J. / Schnabel, B. / SPIE et al. | 1995
- 69
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Development of a novel x-ray focusing technique using crystals with a two-dimensionally modulated surfacesChang, William Z. / Kley, Ernst-Bernhard / Fuchs, Hans-Joerg / Schnabel, Bernd / Foerster, Eckhart / Chukhovskii, Felix N. et al. | 1995
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Scanning transmission x-ray microscope at the NSLS: from XANES to cryoMaser, Jorg M. / Chapman, Henry N. / Jacobsen, Chris J. / Kalinovsky, Alex / Kirz, Janos / Osanna, Angelika / Spector, Steve / Wang, Steve / Winn, Barry L. / Wirick, Sue et al. | 1995
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X-ray microscopy with high-resolution zone plates: recent developments (Invited Paper) [2516-09]Schneider, G. / Wilhein, T. / Niemann, B. / Guttman, P. / SPIE et al. | 1995
- 90
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X-ray microscopy with high-resolution zone plates: recent developmentsSchneider, Gerd / Wilhein, Thomas / Niemann, Bastian / Guttman, P. / Schliebe, T. / Lehr, J. / Aschoff, H. / Thieme, Juergen / Rudolph, Dietbert M. / Schmahl, Guenther A. et al. | 1995
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Ultrahigh-resolution soft x-ray tomographyHaddad, Waleed S. / Trebes, James E. / Goodman, Dennis M. / Lee, Heung-Rae / McNulty, Ian / Anderson, Erik H. / Zalensky, Andrei O. et al. | 1995
- 102
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Ultrahigh-resolution soft x-ray tomography (Invited Paper) [2516-10]Haddad, W. S. / Trebes, J. E. / Goodman, D. M. / Lee, H.-R. / SPIE et al. | 1995
- 108
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Soft x-ray imaging and vector diffraction theoryBurge, Ronald E. / Yuan, XiaoCong et al. | 1995
- 108
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Soft x-ray imaging and vector diffraction theory [2516-12]Burge, R. E. / Yuan, X.-C. / SPIE et al. | 1995
- 120
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Simulations and experiments on capillary optics for x-ray microbeamsCargill, G. Slade / Hwang, K. / Lam, J. W. / Wang, P.C. / Liniger, E. / Noyan, I. C. et al. | 1995
- 120
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Simulations and experiments on capillary optics for x-ray microbeams (Invited Paper) [2516-13]Cargill, G. S. / Hwang, K. / Lam, J. W. / Wang, P.-C. / SPIE et al. | 1995
- 135
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Toward a micrometer resolution x-ray tomographic microscope [2516-14]Silver, M. D. / SPIE et al. | 1995
- 135
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Toward a micrometer resolution x-ray tomographic microscopeSilver, Michael D. et al. | 1995
- 150
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Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II)Ko, Cheng-Hao / Kirz, Janos / Maier, Klaus / Winn, Barry L. / Ade, Harald / Hulbert, Steven L. / Johnson, Erik D. / Anderson, Erik H. et al. | 1995
- 150
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Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) (Invited Paper) [2516-18]Ko, C.-H. / Kirz, J. / Maier, K. / Winn, B. / SPIE et al. | 1995
- 160
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Direct observation of microscopic inhomogeneities in high-T~c superconductors using energy-dispersive diffraction of synchrotron-produced x rays [2516-19]Skelton, E. F. / Qadri, S. B. / Osofsky, M. S. / Drews, A. R. / SPIE et al. | 1995
- 160
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Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xraysSkelton, Earl F. / Qadri, Syen B. / Osofsky, Michael S. / Drews, A. R. / Broussard, P. R. / Hu, J. Z. / Finger, L. W. / Vanderah, Terrell A. / Kaiser, D. / Peng, J. L. et al. | 1995
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Capillary xray compressor: principle versus practiceBrewe, Dale L. / Heald, Steve M. / Barg, Bill / Brown, Frederick C. / Kim, Kyungha H. / Stern, Edward A. et al. | 1995
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Elliptical wiggler beam line with minimum focal spot size at the ALSMartynov, Vladimir V. / McKinney, Wayne R. / Padmore, Howard A. et al. | 1995
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