Optimization of polishing parameters in computer-controlled optical polishing process [2861-46] (Englisch)
- Neue Suche nach: Zhang, X.
- Neue Suche nach: Yu, J.
- Neue Suche nach: Zhang, Z.
- Neue Suche nach: SPIE
- Neue Suche nach: Zhang, X.
- Neue Suche nach: Yu, J.
- Neue Suche nach: Zhang, Z.
- Neue Suche nach: Pryputniewicz, R. J.
- Neue Suche nach: Brown, G. M.
- Neue Suche nach: Juptner, W. P. O.
- Neue Suche nach: SPIE
In:
Laser interferometry VIII: applications
2861
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296-298
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1996
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Optimization of polishing parameters in computer-controlled optical polishing process [2861-46]
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Beteiligte:Zhang, X. ( Autor:in ) / Yu, J. ( Autor:in ) / Zhang, Z. ( Autor:in ) / Pryputniewicz, R. J. / Brown, G. M. / Juptner, W. P. O. / SPIE
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Kongress:Conference; 8th, Laser interferometry VIII: applications ; 1996 ; Denver; CO
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Erschienen in:Laser interferometry VIII: applications , 2861 ; 296-298PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 2861 ; 296-298
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1996
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Format / Umfang:3 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Hybrid techniques in experimental strain/stress analysis by optical methods (Invited Paper) [2861-01]Laermann, K.-H. / SPIE et al. | 1996
- 2
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Hybrid techniques in experimental strain/stress analysis by optical methodsLaermann, Karl-Hans et al. | 1996
- 13
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Hybrid, experimental and computational, investigation of mechanical componentsFurlong, Cosme / Pryputniewicz, Ryszard J. et al. | 1996
- 13
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Hybrid, experimental and computational, investigation of mechanical components [2861-02]Furlong, C. / Pryputniewicz, R. J. / SPIE et al. | 1996
- 26
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Composite-embedded highly birefringent optical fiber strain gauge with zero thermal-apparent strainLuke, David G. / McBride, Roy / Jones, Julian D. C. / Lloyd, Peter A. / Burnett, James G. / Greenaway, Alain H. et al. | 1996
- 26
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Composite-embedded highly birefringent optical fiber strain gauge with zero thermal-apparent strain [2861-03]Luke, D. G. / McBride, R. / Jones, J. D. C. / Lloyd, P. A. / SPIE et al. | 1996
- 32
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Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) film [2861-05]Dovgalenko, G. E. / Kniazkov, A. / Onischenko, Y. / Salamo, G. J. / SPIE et al. | 1996
- 32
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Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) filmDovgalenko, George E. / Kniazkov, Anatoli / Onischenko, Yuri I. / Salamo, Gregory J. et al. | 1996
- 41
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Vibration analysis and nondestructive testing by digital shearographySteinchen, Wolfgang / Yang, Lian Xiang / Kupfer, Gerhard et al. | 1996
- 41
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Vibration analysis and nondestructive testing by digital shearography [2861-07]Steinchen, W. / Yang, L. / Kupfer, G. / SPIE et al. | 1996
- 52
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High-sensitivity displacement measurement using a novel fiber optic electronically scanned white light interferometerMarshall, Raymond H. / Ning, Yanong N. / Palmer, Andrew W. / Grattan, Kenneth T. V. et al. | 1996
- 52
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High-sensitivity displacement measurement using a novel fiber optic electronically scanned white light interferometer [2861-08]Marshall, R. H. / Ning, Y. N. / Palmer, A. W. / Grattan, K. T. V. / SPIE et al. | 1996
- 62
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Aspects of the use of self-mixing interference in laser diodes for displacement sensingAddy, Richard C. / Palmer, Andrew W. / Grattan, Kenneth T. V. et al. | 1996
- 62
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Aspects of the use of self-mixing interference in laser diodes for displacement sensing [2861-09]Addy, R. C. / Palmer, A. W. / Grattan, K. T. V. / SPIE et al. | 1996
- 72
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Three-dimensional displacement analysis by projected fringes and speckle correlation [2861-10]Wolf, T. / Gutmann, B. / Weber, H. / SPIE et al. | 1996
- 72
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Three-dimensional displacement analysis by projected fringes and speckle correlationWolf, Thomas / Gutmann, Bernd / Weber, H. et al. | 1996
- 86
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Phase-shifting techniques applied to unique applications [2861-13]Koliopoulos, C. L. / SPIE et al. | 1996
- 86
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Phase-shifting techniques applied to unique applicationsKoliopoulos, Chris L. et al. | 1996
- 94
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Realization and accuracy of a phase-shifting speckle interferometer for full 3D shape measurement [2861-14]Maack, T. / Kowarschik, R. M. / Notni, G. / Schreiber, W. / SPIE et al. | 1996
- 94
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Realization and accuracy of a phase-shifting speckle interferometer for full 3D shape measurementMaack, Thomas / Kowarschik, Richard M. / Notni, Gunther / Schreiber, Wolfgang et al. | 1996
- 107
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Multiaperture overlap-scanning technique for moire metrologyChen, Mingyi / Wu, De-zhu et al. | 1996
- 107
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Multiaperture overlap-scanning technique for moire metrology [2861-16]Chen, M. / Wu, D. / SPIE et al. | 1996
- 114
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Ultrahigh resolution interferometry (Invited Paper) [2861-18]Trolinger, J. D. / SPIE et al. | 1996
- 114
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Ultrahigh resolution interferometryTrolinger, James D. et al. | 1996
- 124
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Measurements of transonic shock structures using shearographyBurnett, Mark / Bryanston-Cross, Peter J. et al. | 1996
- 124
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Measurements of transonic shock structures using shearography [2861-19]Burnett, M. / Bryanston-Cross, P. J. / SPIE et al. | 1996
- 136
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Scanning laser speckle photography for temperature field measurement in fluid flows [2861-20]Kulenovic, R. / Song, Y. Z. / Groll, M. / SPIE et al. | 1996
- 136
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Scanning laser speckle photography for temperature field measurement in fluid flowsKulenovic, Rudi / Song, Yaozu / Groll, Manfred et al. | 1996
- 146
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Moire tomography by ART [2861-21]Yan, D.-P. / Liu, F. / Wang, Z.-D. / He, A.-Z. / SPIE et al. | 1996
- 146
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Moire tomography by ARTYan, Dapeng / Liu, Feng / Wang, Zhen-Dang / He, Anzhi et al. | 1996
- 152
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Computer-controlled active phase stabilization for electronic holography [2861-23]Hrebabetzky, F. / SPIE et al. | 1996
- 152
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Computer-controlled active phase stabilization for electronic holographyHrebabetzky, Frank et al. | 1996
- 164
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Real-time interferometric analysis of spinning liquid filmsHorowitz, Flavio / Bacchieri, A. / Michels, Alexandre F. / Yeatman, Eric M. / Grieneisen, H. P. et al. | 1996
- 164
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Real-time interferometric analysis of spinning liquid films [2861-24]Horowitz, F. / Bacchieri, A. / Michels, A. / Yeatman, E. M. / SPIE et al. | 1996
- 170
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Nondestructive quantitative 3D characterization of a car brake [2861-26]Jueptner, W. P. O. / Osten, W. / Andrae, P. / Nadeborn, W. / SPIE et al. | 1996
- 170
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Nondestructive quantitative 3D characterization of a car brakeJueptner, Werner P. O. / Osten, Wolfgang / Andrae, Peter / Nadeborn, Werner et al. | 1996
- 180
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Interferometric analysis of strained thin silicon films [2861-27]Trolard, B. / Tribillon, G. M. / Bonnotte, E. / Delobelle, P. / SPIE et al. | 1996
- 180
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Interferometric analysis of strained thin silicon filmsTrolard, Bertrand / Tribillon, Gilbert M. / Bonnotte, Eric / Delobelle, Patrick / Bornier, Luc et al. | 1996
- 192
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Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary results [2861-28]Van Dongeren, H. / Pryputniewicz, R. J. / Sacco, A. / SPIE et al. | 1996
- 192
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Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary resultsvan Dongeren, Hans / Pryputniewicz, Ryszard J. / Sacco, Albert et al. | 1996
- 203
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New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulation [2861-30]Zeng, L. / Ohnuki, T. / Matsumoto, H. / Kawachi, K. / SPIE et al. | 1996
- 203
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New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulationZeng, LiJiang / Ohnuki, Takeshi / Matsumoto, Hirokazu / Kawachi, Keiji et al. | 1996
- 212
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Novel material studies by automatic grating interferometry [2861-31]Salbut, L. A. / Kujawinska, M. / SPIE et al. | 1996
- 212
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Novel material studies by automatic grating interferometrySalbut, Leszek A. / Kujawinska, Malgorzata et al. | 1996
- 220
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Recognition by synthesis: a new approach for the recognition of material faults in HNDE [2861-32]Osten, W. / Elandaloussi, F. / Jueptner, W. P. O. / SPIE et al. | 1996
- 220
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Recognition by synthesis: a new approach for the recognition of material faults in HNDEOsten, Wolfgang / Elandaloussi, Frank / Jueptner, Werner P. O. et al. | 1996
- 225
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Fault detection and classification in and on transparent films by light scattering [2861-33]Stojanoff, C. G. / Ante, A. / Schaller, J. K. / SPIE et al. | 1996
- 225
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Fault detection and classification in and on transparent films by light scatteringStojanoff, Christo G. / Ante, Andreas / Schaller, Johannes K. et al. | 1996
- 234
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Measurement of the ac impedance of aluminum samples by holographic interferometryHabib, Khaled J. et al. | 1996
- 234
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Measurement of the ac impedance of aluminum samples by holographic interferometry [2861-34]Habib, K. J. / SPIE et al. | 1996
- 248
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Recent applications of TV holography and shearographyKrishna Mohan, Nandigana K. / Saldner, Henrik O. / Molin, Nils-Erik et al. | 1996
- 248
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Recent applications of TV holography and shearography [2861-35]Krishna Mohan, N. / Saldner, H. O. / Molin, N.-E. / SPIE et al. | 1996
- 257
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New simple ESPI configurations for deformation studies on large structures based on diffused reference beam [2861-36]Santhanakrishnan, T. / Krishna Mohan, N. / Sirohi, R. S. / SPIE et al. | 1996
- 257
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New simple ESPI configurations for deformation studies on large structures based on diffused reference beamSanthanakrishnan, T. / Krishna Mohan, Nandigana K. / Sirohi, Rajpal S. et al. | 1996
- 264
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In-process laser diode heterodyne profilometer with moving-coil objective lens [2861-39]Wu, Y. / Li, D. / Cao, M. / Lu, Y. / SPIE et al. | 1996
- 264
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In-process laser diode heterodyne profilometer with moving-coil objective lensWu, Yongjun / Li, Dacheng / Cao, Mang / Lu, Yuechuan et al. | 1996
- 269
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New type of common-path heterodyne profilometerLi, Jinjin / Zhao, Yang / Li, Dacheng et al. | 1996
- 269
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New type of common-path heterodyne profilometer [2861-40]Li, J. / Zhao, Y. / Li, D. / SPIE et al. | 1996
- 272
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Measurements of dew droplets deposited on a metal plate by using an interference microscope with laser light [2861-41]Matsumoto, S. / Takayama, K. / Toyooka, S. / SPIE et al. | 1996
- 272
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Measurements of dew droplets deposited on a metal plate by using an interference microscope with laser lightMatsumoto, Shigeaki / Takayama, Kinya / Toyooka, Satoru et al. | 1996
- 278
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Laser sizing of fine particulatesUygur, Mustafa E. et al. | 1996
- 278
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Laser sizing of fine particulates [2861-43]Uygur, M. E. / SPIE et al. | 1996
- 289
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Simple laser interferometers for testing optics [2861-44]Popov, E. G. / SPIE et al. | 1996
- 289
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Simple laser interferometers for testing opticsPopov, Yevgen G. et al. | 1996
- 296
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Optimization of polishing parameters in computer-controlled optical polishing processZhang, Xuejun / Yu, Jingchi / Zhang, Zhongyu et al. | 1996
- 296
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Optimization of polishing parameters in computer-controlled optical polishing process [2861-46]Zhang, X. / Yu, J. / Zhang, Z. / SPIE et al. | 1996