Analytical Predictions of Thermal Stress in MOSFETs (Englisch)
- Neue Suche nach: O'Connor, J.
- Neue Suche nach: IEEE; Aerospace and Electronics Systems Society
- Neue Suche nach: O'Connor, J.
- Neue Suche nach: IEEE; Aerospace and Electronics Systems Society
In:
Aerospace applications conference
2
;
131-144
;
1995
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ISBN:
- Aufsatz (Konferenz) / Print
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Titel:Analytical Predictions of Thermal Stress in MOSFETs
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Beteiligte:O'Connor, J. ( Autor:in ) / IEEE; Aerospace and Electronics Systems Society
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Kongress:Aerospace applications conference ; 1995 ; Snowmass; CO
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Erschienen in:Aerospace applications conference , 2 ; 131-144IEEE AEROSPACE APPLICATIONS CONFERENCE , 2 ; 131-144
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.01.1995
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Format / Umfang:14 pages
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Anmerkungen:IEEE cat no 95TH8043; May be asked for as being held, Snowmass at Aspen, CO and being the 16th in this annual series of winter conferences
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ISBN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
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