Measuring the thermography of friction-welding process [3558-109] (Englisch)
- Neue Suche nach: Gao, J.
- Neue Suche nach: Li, J.
- Neue Suche nach: Feng, Y.
- Neue Suche nach: SPIE
- Neue Suche nach: Chinese Optical Society
- Neue Suche nach: China Optics & Optoelectronic Manufacturers Association
- Neue Suche nach: Gao, J.
- Neue Suche nach: Li, J.
- Neue Suche nach: Feng, Y.
- Neue Suche nach: Ye, S.
- Neue Suche nach: SPIE
- Neue Suche nach: Chinese Optical Society
- Neue Suche nach: China Optics & Optoelectronic Manufacturers Association
In:
Automated optical inspection for industry: theory, technology, and applications II
3558
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531-534
;
1998
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Measuring the thermography of friction-welding process [3558-109]
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Beteiligte:Gao, J. ( Autor:in ) / Li, J. ( Autor:in ) / Feng, Y. ( Autor:in ) / Ye, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association
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Kongress:Conference, Automated optical inspection for industry: theory, technology, and applications II ; 1998 ; Beijing
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 3558 ; 531-534
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1998
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Format / Umfang:4 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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New 3D profilometry based on modulation measurement [3558-01]Su, X. / Su, L. / Li, W. / Xiang, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 1
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New 3D profilometry based on modulation measurementSu, Xianyu / Su, Likun / Li, Wansong / Xiang, Liqun et al. | 1998
- 8
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Experimental study of determining the optical properties of glass online [3558-02]Liu, Y. / Bi, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 8
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Experimental study of determining the optical properties of glass onlineLiu, Yufeng / Bi, Weihong et al. | 1998
- 12
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Design of image scanning and sampling system for 3D laser radar [3558-03]Hong, Z. / Wang, W. / Gao, Z. / Li, P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 12
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Design of image scanning and sampling system for 3D laser radarHong, Zhi / Wang, Wei / Gao, Zhinhua / Li, Peiyong / Lu, Zukang et al. | 1998
- 18
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Automonitoring the status of a mobile microsphereYin, Hao / Shi, Baixuan / Li, Caifeng / Huang, Xiao / Wang, JinSong et al. | 1998
- 18
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Automonitoring the status of a mobile microsphere [3558-04]Yin, H. / Shi, B. / Li, C. / Huang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 23
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Technology of online spectral response measurementZong, Zhiyuan / Chang, Benkang et al. | 1998
- 23
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Technology of online spectral response measurement [3558-05]Zong, Z. / Chang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 28
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Online turbidity measurement using light surface scatteringHong, Zhi / Bao, Chengfang / Qiu, Wenfa / Lu, Zukang et al. | 1998
- 28
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Online turbidity measurement using light surface scattering [3558-06]Hong, Z. / Bao, C. / Qiu, W. / Lu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 31
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Visible automeasurement of positional accuracy to complex objects [3558-07]Shen, B. / Tian, C. / Tang, M. / Yang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 31
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Visible automeasurement of positional accuracy to complex objectsShen, Bangxin / Tian, Changhui / Tang, Min / Yang, Yincai / Cheng, Jiabo / Shen, Lu et al. | 1998
- 39
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Topography measurement by changing distanceYu, Yingjie / Li, Pengsheng / Qiang, Xifu et al. | 1998
- 39
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Topography measurement by changing distance [3558-08]Yu, Y. / Li, P. / Qiang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 45
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Photoelectric detection of the position of electric transmission contact net in electrification railwayCao, Guohua / Zhang, Lizhong / Jiang, Tao / Song, Xueping et al. | 1998
- 45
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Photoelectric detection of the position of electric transmission contact net in electrification railway [3558-09]Cao, G. / Zhang, L. / Jiang, T. / Song, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 49
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Scannerless laser three-dimensional imaging method [3558-10]Yan, H. / Lu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 49
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Scannerless laser three-dimensional imaging methodYan, Huimin / Lu, Zukang et al. | 1998
- 53
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Measuring rotation angles in high speed with laser interferenceFan, Zhigang / Xu, Shiwen / Long, Funian / Fu, Ling / Li, Chunxia et al. | 1998
- 53
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Measuring rotation angles in high speed with laser interference [3558-11]Fan, Z. / Xu, S. / Long, F. / Fu, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 58
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Precision navigation sensor using position-sensitive detector for automatic navigation vehicle [3558-12]Zhang, W. / Chang, S. / Shen, J. / Zhang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 58
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Precision navigation sensor using position-sensitive detector for automatic navigation vehicleZhang, Wenwei / Chang, Shengjiang / Shen, Jinyuan / Zhang, YanXin et al. | 1998
- 67
-
Method of dynamic geometric parameter measurement by laser tracking systemLiu, Yongdong / Wang, Jia / Liang, Jinwen et al. | 1998
- 67
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Method of dynamic geometric parameter measurement by laser tracking system [3558-13]Liu, Y. / Wang, J. / Liang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 74
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Computer-vision-based auto-alignment drilling machine for PCB [3558-14]Shan, Y. / Xu, C. / Jiang, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 74
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Computer-vision-based auto-alignment drilling machine for PCBShan, Yuekang / Xu, Chang / Jiang, Qing et al. | 1998
- 81
-
Automated optical inspection for high-speed electron in synchrotron acceleratorGuo, Congliang / Liu, Tonghui / Wang, Rongsheng et al. | 1998
- 81
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Automated optical inspection for high-speed electron in synchrotron accelerator [3558-15]Guo, C. / Liu, T. / Wang, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 87
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Automation of temperature measurement by laserFei, Yue / Xi, Yangang / Chen, Yuanjie / Ma, Xiufang / Shen, Yuanhua et al. | 1998
- 87
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Automation of temperature measurement by laser [3558-16]Fei, Y. / Xi, Y. / Chen, Y. / Ma, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 93
-
Application of TDICCD on real-time Earth reconnaissance satellite [3558-17]Huang, Q. / Li, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 93
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Application of TDICCD on real-time Earth reconnaissance satelliteHuang, Qiaolin / Li, Xiangmin et al. | 1998
- 105
-
Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field [3558-18]Wang, Q. / Chang, J. / Jiang, J. / Liu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 105
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Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature fieldWang, Qi L. / Chang, Jianxin / Jiang, Jianliang / Liu, Xiaohua et al. | 1998
- 110
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Visual measurement on BGA chip leaders [3558-19]Ye, S. / Qiu, Y. / Sun, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 110
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Visual measurement on BGA chip leadersYe, Shenghua / Qiu, Yu / Sun, Changku et al. | 1998
- 114
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New method for real-time monitoring of laser power and mode online [3558-20]Wang, Y. / An, C. / Gao, S. / Lu, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 114
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New method for real-time monitoring of laser power and mode onlineWang, You-qing / An, Chengwu / Gao, Shuzhong / Lu, Dongsheng et al. | 1998
- 118
-
Experimental study of vibration measurement based on laser frequency splitting principleZhang, Yi / Deng, Zhibeng / Han, Yanmei / Li, Yan / Zhang, Shulian et al. | 1998
- 118
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Experimental study of vibration measurement based on laser frequency splitting principle [3558-21]Zhang, Y. / Deng, Z. / Han, Y. / Li, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 125
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Practical coordinate mapping method for phase-measuring profilometry [3558-22]Li, W. / Su, X. / Su, L. / Xiang, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 125
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Practical coordinate mapping method for phase-measuring profilometryLi, Wansong / Su, Xianyu / Su, Likun / Xiang, Liqun et al. | 1998
- 131
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Online inspection system for steel-plate thicknessZhang, Guoyu / Song, Jiawu / An, Zhiyong / Li, Chengzhi / Gao, Yujin / Chen, Rowei et al. | 1998
- 131
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Online inspection system for steel-plate thickness [3558-23]Zhang, G. / Song, J. / An, Z. / Li, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 138
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Measurement technology of ultrafast optoelectronics [3558-24]Wang, J. / Wang, Y. / Chen, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 138
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Measurement technology of ultrafast optoelectronicsWang, Jilong / Wang, Yuncai / Chen, Shijie et al. | 1998
- 142
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New inline field tester on visual distance of night vision instrument with faint lightChen, Zhibin / Zhang, Yong et al. | 1998
- 142
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New inline field tester on visual distance of night-vision instrument with faint light [3558-25]Chen, Z. / Zhang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 146
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New scheme of high-precision visual collimatorGe, Zhaoxiang / Ying, Han / Chen, Lei et al. | 1998
- 146
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New scheme of high-precision visual collimator [3558-26]Ge, Z. / Han, Y. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 150
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Television automatic video-line tester [3558-27]Ge, Z. / Tang, D. / Feng, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 150
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Television automatic video-line testerGe, Zhaoxiang / Tang, Dongsheng / Feng, Binghua et al. | 1998
- 155
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Active trigonometry and its application to thickness measurement on reflective surface [3558-28]Miao, H. / Wu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 155
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Active trigonometry and its application to thickness measurement on reflective surfaceMiao, Hong / Wu, Xiaoping et al. | 1998
- 161
-
Interference measurements for roughness of silicon mirror with Twyman interferometerZhang, Yaoning / Zhang, Xiaoli / Cheng, ZuHai et al. | 1998
- 161
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Interference measurements for roughness of silicon mirror with Twyman interferometer [3558-29]Zhang, Y. / Zhang, X. / Cheng, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 165
-
Displacement quantity test and measurement system with the laser light triangle methodLi, Guiying / Chen, Dianren / Du, Zhenlin / Song, Zhengxun et al. | 1998
- 165
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Displacement quantity test and measurement system with the laser light triangle method [3558-30]Li, G. / Chen, D. / Du, Z. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 168
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Probe imaging vision coordinate measuring system using single cameraZhang, Zhi-jiang / Huang, Qingcheng / Lin, Weiguo / Che, Rensheng et al. | 1998
- 168
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Probe imaging vision coordinate measuring system using single camera [3558-31]Zhang, Z. / Huang, Q. / Lin, W. / Che, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 175
-
CCD-based microscopic measurement system for precision part geometry errorWang, GuangLin / Chen, Dawei / Tao, Chongde / Wang, Weiping / Jiang, Jianfeng et al. | 1998
- 175
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CCD-based microscopic measurement system for precision part geometry error [3558-32]Wang, G. L. / Chen, D. W. / Tao, C. D. / Wang, W. P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 186
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Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel [3558-33]Che, Y. / Shen, Y. / Liu, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 186
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Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrelChe, Ying / Shen, Yuzhi / Liu, Jiong et al. | 1998
- 191
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Parallel confocal detection method for three-dimensional surface topography with a micro-optic componentTian, Weijian / Bao, Zhengkang / Ding, Zhihua / Sui, Chenghua / Xu, Zhijun et al. | 1998
- 191
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Parallel confocal detection method for three-dimensional surface topography with a micro-optic component [3558-34]Tian, W. / Bao, Z. / Ding, Z. / Sui, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 197
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High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularity [3558-35]Zhang, X. / Fang, Y. / Ye, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 197
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High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularityZhang, Xianhe / Fang, Youbin / Ye, Jiaxiong et al. | 1998
- 201
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Laser diffraction measurement [3558-36]Ran, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 201
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Laser diffraction measurementRan, Duogang et al. | 1998
- 209
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Optical method of measuring the thickness of optical films in devicesQian, Yunsheng / Fu, Rongguo / Xu, Denggao / Chang, Benkang et al. | 1998
- 209
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Optical method of measuring the thickness of optical films in devices [3558-37]Qian, Y. / Fu, R. / Xu, D. / Chang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 214
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Large-scale form and position error measurementHao, Qun / Li, Dacheng et al. | 1998
- 214
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Large-scale form and position error measurement [3558-38]Hao, Q. / Li, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 219
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Detection system of the dynamic starting characteristic of an electric motorSong, Lu / Yen, Fucang / Wang, Xiaoman / Xu, Bo / Song, Zhengxun et al. | 1998
- 219
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Detection system of the dynamic starting characteristic of an electric motor [3558-39]Song, L. / Yen, F. / Wang, X. / Xu, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 223
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Research for the cylinder edge-checkout models [3558-40]Lu, H. / Shen, T. / Zhou, W. / Luo, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 223
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Research for the cylinder edge-checkout modelsLu, Haibao / Shen, Tingzheng / Zhou, Weihong / Luo, Wusheng / Yang, Huayong et al. | 1998
- 228
-
Modeling and simulation of optimization design for structure parameters of CCD intersection measurement systemLu, Haibao / Yang, Huayong / Luo, Wusheng / Yan, Shuhua / Feng, Qinqun et al. | 1998
- 228
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Modeling and simulation of optimization design for structure parameters of CCD intersection measurement system [3558-41]Lu, H. / Yang, H. / Luo, W. / Yan, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 234
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Computer-aided internal thread parameters testingTu, Dawei / Tao, Jing / Qi, Shan et al. | 1998
- 234
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Computer-aided internal thread parameters testing [3558-42]Tu, D. / Tao, J. / Qi, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 239
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Optoelectronic noncontact inspection method of taper [3558-43]Zhang, G. / An, Z. / Jiang, H. / Li, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 239
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Optoelectronic noncontact inspection method of taperZhang, Guoyu / An, Zhiyong / Jiang, Huilin / Li, Chengzhi / Gao, Yujin / Chen, Rowei et al. | 1998
- 244
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System of photoelectric automeasurement of internal diameterSong, Tong / Lin, Xinyang et al. | 1998
- 244
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System of photoelectric automeasurement of internal diameter [3558-44]Song, T. / Lin, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 248
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Stereo-vision system for measurement of 3D objectDeng, Wenyi / Lu, Naiguang / Zhuang, Jingcheng / Guo, Shuyi / Qu, Xuguang et al. | 1998
- 248
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Stereo-vision system for measurement of 3D object [3558-45]Deng, W. / Lu, N. / Zhuang, J. / Guo, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 253
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Application of Twyman-CCD computer system in automeasurement displacementWang, Wensheng / Xiang, Yang / Zhang, Haicheng et al. | 1998
- 253
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Application of Twyman-CCD computer system in automeasurement displacement [3558-46]Wang, W. / Xiang, Y. / Zhang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 256
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Three-dimensional profile measurement by using an artificial neural networkLu, Naiguang / Deng, Wenyi / Sun, Shaofeng / Yang, Jiping et al. | 1998
- 256
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Three-dimensional profile measurement by using an artificial neural network [3558-47]Lu, N. / Deng, W. / Sun, S. / Yang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 262
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Nonlinearity of optical triangulation [3558-48]Zhang, X. / Sui, Y. / Yang, J. / Shi, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 262
-
Nonlinearity of optical triangulationZhang, Xinming / Sui, Yongxin / Yang, Jiandong / Shi, Yuxiang et al. | 1998
- 266
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Photoelectric automeasurement system for shape and positionLiu, Weina / Xie, Jinsong / Yang, Jiandong / Zhao, Tiejun et al. | 1998
- 266
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Photoelectric automeasurement system for shape and position [3558-49]Liu, W. / Xie, J. / Yang, J. / Zhao, T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 272
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Realization of spherical absolute testingWang, Qingyun / Zhu, Rihong / Chen, Jinbang / Chen, Lei et al. | 1998
- 272
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Realization of spherical absolute testing [3558-50]Wang, Q. / Zhu, R. / Chen, J. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 278
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Submicron position and measurement system for optical edges [3558-51]Yuan, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 278
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Submicron position and measurement system for optical edgesYuan, JiaHu et al. | 1998
- 283
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Computer-aided testing for contact-type interferometer [3558-52]Wang, Q. / Chen, L. / Zhu, Y. / Chen, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 283
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Computer-aided testing for contact-type interferometerWang, Qingyun / Chen, Lei / Zhu, Yu / Chen, Jinbang / Zhu, Rihong et al. | 1998
- 288
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Noncontact optical sensor for inside-diameter measurementsWang, Xiangjun / Kou, Xinyu et al. | 1998
- 288
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Noncontact optical sensor for inside-diameter measurements [3558-53]Wang, X. / Kou, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 293
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Portable laser roughometerWang, Shihua / Wu, Jun et al. | 1998
- 293
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Portable laser roughometer [3558-54]Wang, S. / Wu, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 298
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Calibration errors in laser-scanning 3D-vision measurement using the space encoding method [3558-55]Yu, X. / Zhang, J. / Wu, L. / Lin, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 298
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Calibration errors in laser-scanning 3D-vision measurement using the space encoding methodYu, Xiaoyang / Zhang, Jian / Wu, Liying / Lin, Qing / Qiang, Xifu et al. | 1998
- 304
-
Automated inspection of chip type using image analysis methodLiu, Xianli / Teng, Hong / Yan, Fugang / Meng, An / Li, Zhengjia et al. | 1998
- 304
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Automated inspection of chip type using image analysis method [3558-56]Liu, X. / Teng, H. / Yan, F. / Meng, A. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 308
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Distortion compensation in large-FOV CCD optical measurement system [3558-57]Zhang, Y. / Xiong, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 308
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Distortion compensation in large-FOV CCD optical measurement systemZhang, Yun / Xiong, Rensheng et al. | 1998
- 314
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Exploiting potentialities of linear CCD arrays in real-time dynamic measurement [3558-58]Li, C. / Liu, J. / Lin, Y. / Sun, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 314
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Exploiting potentialities of linear CCD arrays in real-time dynamic measurementLi, Changgui / Liu, Jinghai / Lin, Youna / Sun, Zhiyong et al. | 1998
- 320
-
Application of CCD camera to test radar-angle tracking performanceWang, Yusheng / Wang, Zhiyun / Han, Qingshan / Liu, Limin et al. | 1998
- 320
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Application of CCD camera to test radar-angle tracking performance [3558-59]Wang, Y. / Wang, Z. / Han, Q. / Liu, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 323
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Real-time error compensation of coordinate measurement system using combined gratingsTang, Wenjun / Zhang, Yukun / Duan, Minmo / Li, Lihua / Fang, Zhongyan et al. | 1998
- 323
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Real-time error compensation of coordinate measurement system using combined gratings [3558-60]Tang, W. / Zhang, Y. / Duan, M. / Li, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 333
-
Measuring the space direction of a laser beam by means of linear-array CCD [3558-61]Liu, B. Q. / Shen, X. J. / Wang, F. / Hu, W. G. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 333
-
Measuring the space direction of a laser beam by means of linear-array CCDLiu, Bingqi / Shen, XueJu / Wang, Fu / Hu, Wengang et al. | 1998
- 336
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LED automatic graderJin, Shangzhong et al. | 1998
- 336
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LED automatic grader [3558-62]Jin, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 339
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Vibration measurements using CCDWang, Qingyou / He, Liu / Guo, Qing / Li, Wei et al. | 1998
- 339
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Vibration measurements using CCD [3558-63]Wang, Q. / He, L. / Guo, Q. / Li, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 344
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Measuring instantaneous planar motion of rigid body with a linear CCDLi, Kaiming / Wang, Qingyou / Li, Wei / Zhang, Shaoyong et al. | 1998
- 344
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Measuring instantaneous planar motion of rigid body with a linear CCD [3558-64]Li, K. / Wang, Q. / Li, W. / Zhang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 348
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Test of the time and space domain in three-dimensional image [3558-65]Huang, Z. / Cong, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 348
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Test of the time and space domain in three-dimensional imageHuang, Zuoming / Cong, Qiushi et al. | 1998
- 354
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Computer vision application for weld defect detection and evaluation [3558-66]Liu, Y. / Li, X. / Ren, D. / Ye, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 354
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Computer vision application for weld defect detection and evaluationLiu, Yue / Li, Xiaohong / Ren, Dahai / Ye, Shenghua / Wang, Bengang / Sun, Jie et al. | 1998
- 358
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Analysis of CCD output signal in velocity measurement systemFu, Yongqi et al. | 1998
- 358
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Analysis of CCD output signal in velocity measurement system [3558-67]Fu, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 362
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Range finding precision analysis of long-distance high-precision laser range finder [3558-68]Liu, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 362
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Range finding precision analysis of long-distance high-precision laser range finderLiu, BaoYing et al. | 1998
- 367
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Tool-damage analysis based on imagingLiu, Xianli / Chen, Bo / Yu, Xiaoyang / Meng, An / Li, Zhengjia et al. | 1998
- 367
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Tool-damage analysis based on imaging [3558-69]Liu, X. / Chen, B. / Yu, X. / Meng, A. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 371
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Technology of speed measurement by CCDWang, Xiaoman / Song, Lu / Xu, Bo / Song, Zhengxun et al. | 1998
- 371
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Technology of speed measurement by CCD [3558-70]Wang, X. / Song, L. / Xu, B. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 375
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Extracting multiple lines from the Hough domainChen, Linsen / Shen, Yang / Xie, Jianfong et al. | 1998
- 375
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Extracting multiple lines from the Hough domain [3558-71]Chen, L. / Shen, Y. / Xie, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 383
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Theoretical model for IR imaging of buried object sitesZhang, Jianqi / Fang, Xiaoping / Yang, Weidong / Shao, Xiaopeng / Zhu, Changchun et al. | 1998
- 383
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Theoretical model for IR imaging of buried object sites [3558-72]Zhang, J. / Fang, X. / Yang, W. / Shao, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 388
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Design of a measurement and control system of partial environmental illuminance [3558-73]Wang, Y. / Niu, Y. / Guo, X. / Zuo, F. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 388
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Design of a measurement and control system of partial environmental illuminanceWang, Yuefeng / Niu, Yanxiong / Guo, Xiaowei / Zuo, Fang / Dong, Wei / Xu, Hong et al. | 1998
- 394
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Measurement of two-dimensional vector velocity using spatial filtering technique [3558-74]Li, P. / Ma, B. / Zhang, B. / Qu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 394
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Measurement of two-dimensional vector velocity using spatial filtering techniqueLi, Ping / Ma, Baomin / Zhang, Bingrong / Qu, Xinmei et al. | 1998
- 397
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Laser-scanner-based self-localization for autonomous mobile robots using neural networkGu, Dongbing / Song, Zhengxun et al. | 1998
- 397
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Laser-scanner-based self-localization for autonomous mobile robots using neural network [3558-75]Gu, D. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 402
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Quantitative detection of subsurface defects by pulse-heating infrared thermographyZong, Mingcheng / Ding, Tieying / Xue, Shuwen / Tang, Huijun / van der Meer, Theo H. et al. | 1998
- 402
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Quantitative detection of subsurface defects by pulse-heating infrared thermography [3558-76]Zong, M. / Ding, T. / Xue, S. / Tang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 407
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Using digital spatial phase-shifting technique to gain quasi-hologramZhu, Shaoming / Peng, Xiang / Zhang, Zonghua / Hu, Xiaotang et al. | 1998
- 407
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Using digital spatial phase-shifting technique to gain quasi-hologram [3558-77]Zhu, S. M. / Peng, X. / Zhang, Z. / Hu, X. T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 413
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Near-field optical imaging properties by passive and active fiber probesZhang, Guoping / Ming, Hai / Bai, Ming / Chen, Xiaogang / Wu, Yunxia / Xie, Jiangping et al. | 1998
- 413
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Near-field optical imaging properties by passive and active fiber probes [3558-78]Zhang, G. / Ming, H. / Bai, M. / Chen, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 421
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New intelligent target for laser shooting practice [3558-79]Dai, B. / Ren, H. / Zhou, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 421
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New intelligent target for laser shooting practiceDai, Bingming / Ren, HongYan / Zhou, Bing et al. | 1998
- 424
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Simple and easy automation test and measurement method of large-size optical glass homogeneity [3558-80]Yang, W. / Yang, Y. / Yang, T. / Deng, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 424
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Simple and easy automation test and measurement method of large-size optical glass homogeneityYang, Wenku / Yang, Yujing / Yang, Tao / Deng, Wenrong et al. | 1998
- 430
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Development of infrared nondestructive testing system with laser scanning automatic heat loadingBai, Fengming / Liu, Weina / Ma, Li / Chen, Ling / Ma, Qianli et al. | 1998
- 430
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Development of infrared nondestructive testing system with laser scanning automatic heat loading [3558-81]Bai, F. / Liu, W. / Ma, L. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 436
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Automeasurement system of belt transmission parameters [3558-82]Li, Z. / Wang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 436
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Automeasurement system of belt transmission parametersLi, Zhanguo / Wang, Xiaoman et al. | 1998
- 439
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Surveying converter lining erosion state based on laser measurement technique [3558-83]Li, H. / Shi, T. / Yang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 439
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Surveying converter lining erosion state based on laser measurement techniqueLi, Hongsheng / Shi, Tielin / Yang, Shuzi et al. | 1998
- 445
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Detecting laser-range-finding signals in surveying converter lining based on wavelet transform [3558-84]Li, H. / Yang, X. / Shi, T. / Yang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 445
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Detecting laser-range-finding signals in surveying converter lining based on wavelet transformLi, Hongsheng / Yang, Xiaofei / Shi, Tielin / Yang, Shuzi et al. | 1998
- 451
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Optoelectronic technology for detecting flaws on internal surface of cylinderChe, Ying / Shen, Yuzhi / Ma, Hong et al. | 1998
- 451
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Optoelectronic technology for detecting flaws on internal surface of cylinder [3558-85]Che, Y. / Shen, Y. / Ma, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 455
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Development of high-precision system for measuring rotational inertia of bulletChe, Ying / Li, Zhanguo / Ma, Hong / Yiang, Jun et al. | 1998
- 455
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Development of high-precision system for measuring rotational inertia of bullet [3558-86]Che, Y. / Li, Z. / Ma, H. / Yiang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 462
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New method of measuring photoelastic properties of optical materials by using laser heterodyne interferometry [3558-87]Kou, G. / Tao, C. / Gao, W. / Hao, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 462
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New method of measuring photoelastic properties of optical materials by using laser heterodyne interferometryKou, Ge / Tao, ChunKan / Gao, Wanrong / Hao, Luguo / Yang, Xuan M. / Li, Ting et al. | 1998
- 470
-
Digital optical profiler with automatic reference phase calibrationWei, Chunlong / Chen, Mingyi / Wang, Zhijiang et al. | 1998
- 470
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Digital optical profiler with automatic reference phase calibration [3558-88]Wei, C. / Chen, M. / Wang, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 480
-
Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometry [3558-89]Wei, C. / Chen, M. / Hou, W. / Guo, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 480
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Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometryWei, Chunlong / Chen, Mingyi / Hou, Weidong / Guo, Hongwei / Wang, Zhijiang et al. | 1998
- 487
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Characteristics of laser scanning for bar code recognition [3558-90]Shen, S. / Shen, Y. / Fan, R. / Xu, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 487
-
Characteristics of laser scanning for bar code recognitionShen, Shuqun / Shen, Yuchao / Fan, Rong / Hsu, Dahsiung et al. | 1998
- 491
-
Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection [3558-91]Li, H. / Lu, Z. / Xie, S. / Lin, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 491
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Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflectionLi, Hui / Lu, Zukang / Xie, Shusen / Lin, Lei et al. | 1998
- 498
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New method of two-color calibration and one-color measurement for real-time inspection of temperature fieldZhang, Hua / Pan, Jiluan / Wang, Huiqin et al. | 1998
- 498
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New method of two-color calibration and one-color measurement for real-time inspection of temperature field [3558-92]Zhang, H. / Pan, J. / Wang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 505
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Effective approach for detecting bands of EBSP with Hough transform [3558-105]Chen, L. / Casasent, D. P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 505
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Effective approach for detecting bands of EBSP with Hough transformChen, Linsen / Casasent, David P. et al. | 1998
- 515
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Experimental method for underwater acoustic field detection from water surface using laser probe [3558-106]Zhou, C. / Liu, K. / He, J. / Sun, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 515
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Experimental method for underwater acoustic field detection from water surface using laser probeZhou, Chenbo / Liu, Kaihua / He, Junqing / Sun, Jinzuo / Jiang, Rongxi / Chui, Guihua / Li, Rongfu / Yun, Taihui / He, Jinlin / Shang, Guoming et al. | 1998
- 522
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Application of SPD to fast spectral color measurement [3558-107]Xu, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 522
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Application of SPD to fast spectral color measurementXu, Haisong et al. | 1998
- 526
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Multifunctional photoelectric detection and measurement systemLiu, Weina / Bai, Fengming / Zhao, Tiejun / Chen, Ling / Li, Yanhong et al. | 1998
- 526
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Multifunctional photoelectric detection and measurement system [3558-108]Liu, W. / Bai, F. / Zhao, T. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 531
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Measuring the thermography of friction-welding process [3558-109]Gao, J. / Li, J. / Feng, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 531
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Measuring the thermography of friction-welding processGao, JiaoBo / Li, Jing / Feng, Yue-you et al. | 1998
- 535
-
Wedge-ring wavelet detectorFeng, Wenyi / Yan, Yingbai / Jin, Guofan / Huang, Gaogui / Wu, Minxian et al. | 1998
- 535
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Wedge-ring wavelet detector [3558-110]Feng, W. / Yan, Y. / Jin, G. / Huang, G. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 542
-
New Monte Carlo method of backscattered lidar signals [3558-111]Du, Z. / Lu, Y. / Huang, T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 542
-
New Monte Carlo method of backscattered lidar signalsDu, Zhufeng / Lu, Yimin / Huang, Tiexia et al. | 1998
- 550
-
Optical method for measuring electric currentZhao, Junliang / Guan, Rongfeng / Wang, Yilu et al. | 1998
- 550
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Optical method for measuring electric current [3558-112]Zhao, J. / Guan, R. / Wang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 554
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Technological research on an application of neural network in character recognitionLi, Ping / Mu, Xiaofeng et al. | 1998
- 554
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Technological research on an application of neural network in character recognition [3558-113]Li, P. / Mu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 561
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Spectroellipsometric study of optical and electrical properties of buried CoSi~2 layers in silicon produced by MEVVA implantation [3558-114]Guo, W. / Wong, S. / Zhu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 561
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Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEVVA implantationGuo, Wensheng / Wong, Saipeng / Zhu, Ziqing et al. | 1998
- 571
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Spectroellipsometric study of diamondlike carbon filmsGuo, Wensheng / Wong, Saipeng / Zhu, Ziqing et al. | 1998
- 571
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Spectroellipsometric study of diamondlike carbon films [3558-115]Guo, W. / Wong, S. / Zhu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 578
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Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation [3558-116]Guo, W. / Zhu, Z. / Wong, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 578
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Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantationGuo, Wensheng / Zhu, Ziqing / Wong, Saipeng et al. | 1998
- 587
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Processing of infrared thermography images in pulsed-heating infrared thermography nondestructive testingTang, Huijun / Ding, Tieying / Xue, Shuwen / Zong, Mingcheng et al. | 1998
- 587
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Processing of infrared thermography images in pulsed-heating infrared thermography nondestructive testing [3558-117]Tang, H. / Ding, T. / Xue, S. / Zong, M. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 591
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Intelligent measuring equipment for the width of fibersChen, Jinxiang / Chang, Benkang / Qian, Yunsheng / Huang, Yuanyuan / Yi, Feng / Zhang, Ming et al. | 1998
- 591
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Intelligent measuring equipment for the width of fibers [3558-93]Chen, J. / Chang, B. / Qian, Y. / Huang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 595
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Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuitLu, Fuyun / Yuan, Shuzhong / Pan, Jiaqi / Gai, Qi / Zhao, Yuanchao / He, Qingguo et al. | 1998
- 595
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Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit [3558-94]Lu, F. / Yuan, S. / Pan, J. / Gai, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 601
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Fault signal detection with autocorrelation methodYang, Xuexian / Zhang, Qin-Yan / Han, Yueqiu et al. | 1998
- 601
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Fault signal detection with autocorrelation method [3558-95]Yang, X. / Zhang, Q. / Han, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 607
-
Stress-induced birefringence and extinction ratioLi, Gaoping / Yang, Zhaojing / Lu, Chunli / Liu, Xunzhang / Xiang, Shiming et al. | 1998
- 607
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Stress-induced birefringence and extinction ratio [3558-96]Li, G. / Yang, Z. / Lu, C. / Liu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 615
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Optical measurement method of necking process in the material tensile testZhang, Lizhong / Song, Xueping / Cao, Guohua / Yu, Zhenglin et al. | 1998
- 615
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Optical measurement method of necking process in the material tensile test [3558-97]Zhang, L. / Song, X. / Cao, G. / Yu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 618
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Infrared detection technique based on multicorrelation of frequency and time [3558-98]Gu, G. / Chen, Q. / Bai, L. / Zhang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 618
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Infrared detection technique based on multicorrelation of frequency and timeGu, Guohua / Chen, Qian / Bai, Lianfa / Zhang, Baomin et al. | 1998
- 622
-
New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse lightYang, Jingguo / Yang, Cangli / Ha, Yuanqian / Chen, Xiaobo / Jin, Lihong / Tan, Hua / Hu, Shaolou / Wang, Xiang / Peng, Qixian et al. | 1998
- 622
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New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse light [3558-99]Yang, J. / Yang, C. / Ha, Y. / Chen, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 626
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Constraint of Laplace transform method used in the reconstruction of axisymmetric fieldWu, Donglou / He, Anzhi / Yao, Wei et al. | 1998
- 626
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Constraint of Laplace transform method used in the reconstruction of axisymmetric field [3558-100]Wu, D. / He, A. / Yao, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 630
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Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical componentsHu, Yongming / Chen, Zhe / Liao, Yanbiao / Chang, Shengli / Meng, Zhou / Han, Zhe et al. | 1998
- 630
-
Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components [3558-101]Hu, Y. / Chen, Z. / Liao, Y. / Chang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 637
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Design of weak-signal detection filters [3558-102]Cao, Y. / Li, F. / Lin, Y. / Gu, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 637
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Design of weak-signal detection filtersCao, Yang / Li, Fang / Lin, YongChang / Gu, Yonglin et al. | 1998
- 643
-
Mine dust optical measurement methodHe, Bin / Chen, Jidong / Tian, Xiaoyan / Qiao, Song et al. | 1998
- 643
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Mine-dust optical measurement method [3558-103]He, B. / Chen, J. / Tian, X. / Qiao, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 646
-
Photoelectric detection system in equipment for recognition and sorting of billsLiao, Jihong / Yin, Baozhi / Lao, Wenwei / Xie, Hua et al. | 1998
- 646
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Photoelectric detection system in equipment for recognition and sorting of bills [3558-104]Liao, J. / Yin, B. / Lao, W. / Xie, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998