FTIR-based polarimeter with high-quality Brewster's angle polarizers [3425-24] (Englisch)
- Neue Suche nach: Kaplan, S. G.
- Neue Suche nach: Hanssen, L. M.
- Neue Suche nach: SPIE
- Neue Suche nach: Kaplan, S. G.
- Neue Suche nach: Hanssen, L. M.
- Neue Suche nach: Datla, R. V.
- Neue Suche nach: Hanssen, L. M.
- Neue Suche nach: SPIE
In:
Optical diagnostic methods for inorganic transmissive materials
3425
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239-247
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1998
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:FTIR-based polarimeter with high-quality Brewster's angle polarizers [3425-24]
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Beteiligte:
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Kongress:Conference, Optical diagnostic methods for inorganic transmissive materials ; 1998 ; San Diego; CA
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Erschienen in:Optical diagnostic methods for inorganic transmissive materials , 3425 ; 239-247PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 3425 ; 239-247
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1998
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Format / Umfang:9 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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FTIR reflectance characterization of SIMOX buried oxide layersYakovlev, Victor A. / Bosch-Charpenay, Sylvie / Rosenthal, Peter A. / Solomon, Peter R. / Xu, Jiazhan et al. | 1998
- 2
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FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]Yakovlev, V. A. / Charpenay, S. / Rosenthal, P. A. / Solomon, P. R. / SPIE et al. | 1998
- 10
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Intercomparisons of reflectance measurementsBarnes, Patricia Y. / Early, Edward A. / Johnson, B. Carol / Butler, James J. / Bruegge, Carol J. / Biggar, Stuart F. / Spyak, Paul R. / Pavlov, Milutin M. et al. | 1998
- 10
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Intercomparisons of reflectance measurements [3425-02]Barnes, P. Y. / Early, E. A. / Johnson, B. C. / Butler, J. J. / SPIE et al. | 1998
- 16
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Methods for absolute reflectance measurement of transmissive materials in the infraredHanssen, Leonard M. / Kaplan, Simon G. et al. | 1998
- 16
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Methods for absolute reflectance measurement of transmissive materials in the infrared [3425-03]Hanssen, L. M. / Kaplan, S. G. / SPIE et al. | 1998
- 28
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Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurementsHanssen, Leonard M. / Kaplan, Simon G. et al. | 1998
- 28
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Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements [3425-04]Hanssen, L. M. / Kaplan, S. G. / SPIE et al. | 1998
- 37
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Optical characterization of synthetic faceted gem materials grown from hydrothermal solutions [3425-31]Lu, T. / Shigley, J. E. / SPIE et al. | 1998
- 37
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Optical characterization of synthetic faceted gem materials grown from hydrothermal solutionsLu, Taijin / Shigley, James E. et al. | 1998
- 48
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Characterization of narrowband infrared interference filters [3425-05]Kaplan, S. G. / Hanssen, L. M. / SPIE et al. | 1998
- 48
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Characterization of narrowband infrared interference filtersKaplan, Simon G. / Hanssen, Leonard M. et al. | 1998
- 56
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Characterization of high-OD ultrathin infrared neutral density filtersKaplan, Simon G. / Hanssen, Leonard M. / Migdall, Alan L. / Lefever-Button, Glenn et al. | 1998
- 56
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Characterization of high-OD ultrathin infrared neutral density filters [3425-06]Kaplan, S. G. / Hanssen, L. M. / Migdall, A. L. / Lefever-Button, G. / SPIE et al. | 1998
- 64
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Ultrathin film neutral density filter set for the infrared [3425-07]Lefever-Button, G. / Lindblom, J. F. / Powell, F. R. / SPIE et al. | 1998
- 64
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Ultrathin film neutral density filter set for the infraredLefever-Button, Glenn / Lindblom, Joakim F. / Powell, Forbes R. et al. | 1998
- 73
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Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBrRahmlow, Thomas D. / Lazo-Wasem, Jeanne E. / Rahmlow, David A. et al. | 1998
- 73
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Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr [3425-08]Rahmlow, T. D. / Lazo-Wasem, J. E. / Rahmlow, D. A. / SPIE et al. | 1998
- 85
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Environmental stability of rugate filters: in-situ measurements of their spectral propertiesJohnson, Walter E. / Edmonds, Byron P. / Wolf, Marsha J. et al. | 1998
- 85
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Environmental stability of rugate filters: in-situ measurements of their spectral properties [3425-09]Johnson, W. E. / Edmonds, B. P. / Wolf, M. J. / SPIE et al. | 1998
- 94
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cSRM 2035: a rare-earth oxide glass for the wavelength calibration of near-infrared dispersive and Fourier transform spectrometers [3425-10]Choquette, S. J. / Travis, J. C. / Duewer, D. L. / SPIE et al. | 1998
- 94
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cSRM 2035: a rare-earth oxide glass for the wavelength calibration of near-infrared dispersive and Fourier transform spectrometersChoquette, Steven J. / Travis, John C. / Duewer, David L. et al. | 1998
- 103
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Re-evaluation of spectrophotometric standard reference materials for additional geometries and wavelengthsBarnes, Patricia Y. / Early, Edward A. et al. | 1998
- 103
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Re-evaluation of spectrophotometric standard reference materials for additional geometries and wavelengths [3425-11]Barnes, P. Y. / Early, E. A. / SPIE et al. | 1998
- 111
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Absorption-line evaluation methods for wavelength standardsZhu, Changjiang / Hanssen, Leonard M. et al. | 1998
- 111
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Absorption-line evaluation methods for wavelength standards [3425-12]Zhu, C. / Hanssen, L. M. / SPIE et al. | 1998
- 120
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Normal infrared spectral emittance of Al~2O~3 [3425-13]Kaplan, S. G. / Hanssen, L. M. / SPIE et al. | 1998
- 120
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Normal infrared spectral emittance of Al2O3Kaplan, Simon G. / Hanssen, Leonard M. et al. | 1998
- 126
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Multispectral pyrometry for insulating material emissometryThomas, Michael E. / Linevsky, Milton J. et al. | 1998
- 126
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Multispectral pyrometry for insulating material emissometry [3425-15]Thomas, M. E. / Linevsky, M. J. / SPIE et al. | 1998
- 134
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Design and operation of a highly sensitive and accurate laser calorimeter for low-absorbtion materialsKawate, Etsuo / Hanssen, Leonard M. / Kaplan, Simon G. / Datla, Raju V. et al. | 1998
- 134
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Design and operation of a highly sensitive and accurate laser calorimeter for low-absorbtion materials [3425-17]Kawate, E. / Hanssen, L. M. / Kaplan, S. G. / Datla, R. V. / SPIE et al. | 1998
- 148
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Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared [3425-28]Leviton, D. B. / Madison, T. J. / Petrone, P. / SPIE et al. | 1998
- 148
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Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infraredLeviton, Douglas B. / Madison, Timothy J. / Petrone, Peter et al. | 1998
- 160
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Infrared refractive indices and thermo-optic coefficients for several materialsTropf, William J. / Thomas, Michael E. / Linevsky, Milton J. et al. | 1998
- 160
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Infrared refractive indices and thermo-optic coefficients for several materials [3425-18]Tropf, W. J. / Thomas, M. E. / Linevsky, M. J. / SPIE et al. | 1998
- 172
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AC phase measuring interferometer for measuring dn/dT of fused silica and calcium fluoride at 193 nmShagam, Richard N. et al. | 1998
- 172
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AC phase measuring interferometer for measuring dn/dT of fused silica and calcium fluoride at 193 nm [3425-19]Shagam, R. N. / SPIE et al. | 1998
- 182
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Transient grating in KNbO3/KTaO3superlatticeLiu, Huimin / Fernandez, Felix E. / Jia, Weiyi / Boatner, Lynn A. et al. | 1998
- 182
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Transient grating in KNbO~3/KTaO~3 superlattice [3425-20]Liu, H. / Fernandez, F. E. / Jia, W. / Boatner, L. A. / SPIE et al. | 1998
- 188
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Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum-deviation method [3425-21]Burnett, J. H. / Gupta, R. / Griesmann, U. / SPIE et al. | 1998
- 188
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Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum-deviation methodBurnett, John H. / Gupta, Rajeev / Griesmann, Ulf et al. | 1998
- 196
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Determination of birefringence by Brillouin spectroscopyChey, TongChull / Lee, Sukmock / Yu, YunSik / Kim, SungChul et al. | 1998
- 196
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Determination of birefringence by Brillouin spectroscopy [3425-27]Chey, T. C. / Lee, S. / Yu, Y. / Kim, S. / SPIE et al. | 1998
- 203
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Fourier transform refractometry [3425-22]Kaplan, S. G. / Hanssen, L. M. / Griesmann, U. / Gupta, R. / SPIE et al. | 1998
- 203
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Fourier transform refractometryKaplan, Simon G. / Hanssen, Leonard M. / Griesmann, Ulf / Gupta, Rajeev et al. | 1998
- 213
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Variations in refractive index of color filter glasses [3425-29]Leviton, D. B. / Petrone, P. / SPIE et al. | 1998
- 213
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Variations in refractive index of color filter glassesLeviton, Douglas B. / Petrone, Peter et al. | 1998
- 219
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Far-ultraviolet refractive index of optical materials for solar blind channel (SBC) filters for the HST advanced camera for surveys (ACS) [3425-30]Leviton, D. B. / Madison, T. J. / Petrone, P. / SPIE et al. | 1998
- 219
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Far-ultraviolet refractive index of optical materials for solar blind channel (SBC) filters for the HST advanced camera for surveys (ACS)Leviton, Douglas B. / Madison, Timothy J. / Petrone, Peter et al. | 1998
- 232
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Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE) [3425-23]Jellison, G. E. / Modine, F. A. / Boatner, L. A. / SPIE et al. | 1998
- 232
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Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE)Jellison, Gerald E. / Modine, Frank A. / Boatner, Lynn A. et al. | 1998
- 239
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FTIR-based polarimeter with high-quality Brewster's angle polarizers [3425-24]Kaplan, S. G. / Hanssen, L. M. / SPIE et al. | 1998
- 239
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FTIR-based polarimeter with high-quality Brewster's angle polarizersKaplan, Simon G. / Hanssen, Leonard M. et al. | 1998
- 248
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Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angle [3425-25]Nee, S.-M. F. / SPIE et al. | 1998
- 248
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Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angleNee, Soe-Mie F. et al. | 1998
- 258
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Fourier transform spectropolarimetry for optical diagnostics of transmissive materialsChenault, David B. / Goldstein, Dennis H. / Hayes, Diana M. et al. | 1998
- 258
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Fourier transform spectropolarimetry for optical diagnostics of transmissive materials [3425-26]Chenault, D. B. / Goldstein, D. H. / Hayes, D. M. / SPIE et al. | 1998