3D processing of range image data for vision applications in manufacturing [3521-04] (Englisch)
- Neue Suche nach: Zhao, D.
- Neue Suche nach: Li, S.
- Neue Suche nach: Deng, J.
- Neue Suche nach: SPIE
- Neue Suche nach: Zhao, D.
- Neue Suche nach: Li, S.
- Neue Suche nach: Deng, J.
- Neue Suche nach: Solomon, S. S.
- Neue Suche nach: Batchelor, B. G.
- Neue Suche nach: Miller, J. W. V.
- Neue Suche nach: SPIE
In:
Machine vision systems for inspection and metrology
3521
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27-33
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1998
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:3D processing of range image data for vision applications in manufacturing [3521-04]
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Beteiligte:Zhao, D. ( Autor:in ) / Li, S. ( Autor:in ) / Deng, J. ( Autor:in ) / Solomon, S. S. / Batchelor, B. G. / Miller, J. W. V. / SPIE
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Kongress:Conference; 7th, Machine vision systems for inspection and metrology ; 1998 ; Boston; MA
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Erschienen in:Machine vision systems for inspection and metrology , 3521 ; 27-33
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.1998
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Format / Umfang:7 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Machine vision is not computer visionBatchelor, Bruce G. / Charlier, Jean-Ray et al. | 1998
- 2
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Machine vision is not computer vision [3521-01]Batchelor, B. G. / Charlier, J.-R. / SPIE et al. | 1998
- 14
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Very low cost in-process gauging system [3521-02]Miller, J. W. V. / Shridhar, V. / Wicke, E. / Griffin, C. / SPIE et al. | 1998
- 14
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Very low cost in-process gauging systemMiller, John W. V. / Shridhar, V. / Wicke, E. / Griffin, C. et al. | 1998
- 20
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Image processing benchmark study [3521-03]Miller, J. W. V. / Eddy, C. / Waltz, F. M. / Hack, R. / SPIE et al. | 1998
- 20
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Image processing benchmark studyMiller, John W. V. / Eddy, C. / Waltz, Frederick M. / Hack, Ralf / Wood, James / Stokes, D. et al. | 1998
- 27
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3D processing of range image data for vision applications in manufacturing [3521-04]Zhao, D. / Li, S. / Deng, J. / SPIE et al. | 1998
- 27
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3D processing of range image data for vision applications in manufacturingZhao, Dongming / Li, Songtao / Deng, Jin et al. | 1998
- 34
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Recent advances in computer camera methods for machine vision [3521-05]Olson, G. G. / Walker, J. N. / SPIE et al. | 1998
- 34
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Recent advances in computer camera methods for machine visionOlson, Gaylord G. / Walker, Jo N. et al. | 1998
- 42
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Camera model and calibration process for high-accuracy digital image metrology of inspection planesCorreia, Bento A. B. / Dinis, Joao et al. | 1998
- 42
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Camera model and calibration process for high-accuracy digital image metrology of inspection planes [3521-07]Correia, B. A. / Dinis, J. / SPIE et al. | 1998
- 54
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Direct calibration methodology for stereo cameras [3521-08]Do, Y. / Yoo, S.-H. / Lee, D.-S. / SPIE et al. | 1998
- 54
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Direct calibration methodology for stereo camerasDo, Yongtae / Yoo, Seog-Hwan / Lee, Dae-Sik et al. | 1998
- 68
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Device for simultaneous measurement of the gyrotropic and birefringence characteristics of liquid and solid media [3521-09]Gourari, M. L. / Liberman, A. A. / SPIE et al. | 1998
- 68
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Device for simultaneous measurement of the gyrotropic and birefringence characteristics of liquid and solid mediaGourari, Mark L. / Liberman, Anatolyi A. et al. | 1998
- 73
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Model-based inspection of multipackage food products using a twin-beam x-ray system [3521-10]Palmer, S. C. / Batchelor, B. G. / SPIE et al. | 1998
- 73
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Model-based inspection of multipackage food products using a twin-beam x-ray systemPalmer, Stephen C. / Batchelor, Bruce G. et al. | 1998
- 86
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INFIBRA: machine vision inspection of acrylic fiber productionDavies, Roger / Correia, Bento A. B. / Contreiras, Jose / Carvalho, Fernando D. et al. | 1998
- 86
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INFIBRA: machine vision inspection of acrylic fiber production [3521-11]Davies, R. / Correia, B. A. / Contreiras, I. / Carvalho, F. D. / SPIE et al. | 1998
- 95
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Morphological measurement of surface roughness [3521-12]Balagurunathan, Y. / Dougherty, E. R. / SPIE et al. | 1998
- 95
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Morphological measurement of surface roughnessBalagurunathan, Yoganand / Dougherty, Edward R. et al. | 1998
- 104
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Machine vision for controlling moving 3D reflective productsDelcroix, Gaetan / Aluze, Denis / Merrienne, Frederic / Jender, Hafid / Dumont, Christophe et al. | 1998
- 104
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Machine vision for controlling moving 3D reflective products [3521-13]Delcroix, G. / Aluze, D. / Merrienne, F. / Jender, H. / SPIE et al. | 1998
- 115
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Stereo vision and CMM-integrated intelligent inspection system in reverse engineeringFang, Yong / Chen, Kangning / Lin, Zhihang et al. | 1998
- 115
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Stereo vision and CMM-integrated intelligent inspection system in reverse engineering [3521-14]Fang, Y. / Chen, K.-N. / Lin, Z.-H. / SPIE et al. | 1998
- 123
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Collimation method using an image processing technique for an assembling-type antennaOkuyama, Toshiyuki / Kimura, Shinichi / Fukase, Yutaro / Ueno, Hiroshi / Harima, Kouichi / Sato, Hitoshi / Yoshida, Tetsuji et al. | 1998
- 123
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Collimation method using an image processing technique for an assembling-type antenna [3521-15]Okuyama, T. / Kimura, S. / Fukase, Y. / Ueno, H. / SPIE et al. | 1998
- 131
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Engine VideoScope software: a common user interface for online inspection, data management, and image processingSchmidradler, Dieter J. / van Dyck, Walter / Oberleitner, Johann / Zeichen, Gerfried et al. | 1998
- 131
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Engine VideoScope software: a common user interface for online inspection, data management, and image processing [3521-16]Schmidradler, D. J. / Van Dyck, W. / Oberleitner, J. / Zeichen, G. / SPIE et al. | 1998
- 141
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Fish detection and classification systemTidd, Richard A. / Wilder, Joseph et al. | 1998
- 141
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Fish detection and classification system [3521-17]Tidd, R. A. / Wilder, J. / SPIE et al. | 1998
- 149
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Real-time face trackingLiang, Yufeng / Wilder, Joseph et al. | 1998
- 149
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Real-time face tracking [3521-18]Liang, Y. / Wilder, J. / SPIE et al. | 1998
- 157
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Compact representation of the facial images for identification in a parallel-hierarchical networkKutaev, Yuri F. / Timchenko, Leonid I. / Gertsiy, Alexander A. / Zahoruiko, Lubov V. et al. | 1998
- 157
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Compact representation of the facial images for identification in a parallel-hierarchical network [3521-19]Kutaev, Y. F. / Timchenko, L. I. / Gertsiy, A. A. / Zahoruiko, L. V. / SPIE et al. | 1998
- 168
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Online inspection and accuracy analysis for parts using neural networksXiong, Yingen / Zhang, Guangzhao et al. | 1998
- 168
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Online inspection and accuracy analysis for parts using neural networks [3521-20]Xiong, Y. / Zhang, G. / SPIE et al. | 1998
- 179
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Basic design principles of colorimetric vision systems [3521-44]Mumzhiu, A. M. / SPIE et al. | 1998
- 179
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Basic design principles of colorimetric vision systemsMumzhiu, Alex M. et al. | 1998
- 184
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NSF-supported undergraduate machine vision research activitiesMiller, John W. V. / Shridhar, Malayappan et al. | 1998
- 184
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NSF-supported undergraduate machine vision research activities [3521-45]Miller, J. W. V. / Shridhar, M. / SPIE et al. | 1998
- 190
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Inspection of power and ground layers in PCB images [3521-21]Bunyak, F. / Ercal, F. / SPIE et al. | 1998
- 190
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Inspection of power and ground layers in PCB imagesBunyak, Filiz / Ercal, Fikret et al. | 1998
- 198
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Visual-information-assisted microphone array processing in a high-noise environmentWang, Jian / Liang, Yufeng / Wilder, Joseph et al. | 1998
- 198
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Visual-information-assisted microphone array processing in a high-noise environment [3521-22]Wang, J. / Liang, Y. / Wilder, J. / SPIE et al. | 1998
- 204
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Superresolution of bar codes [3521-23]Bailey, D. G. / SPIE et al. | 1998
- 204
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Superresolution of bar codesBailey, Donald G. et al. | 1998
- 214
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Real-time detection and classification of objects in flowing waterIwamoto, Sadahiro / Trivedi, Mohan M. / Checkley, David M. et al. | 1998
- 214
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Real-time detection and classification of objects in flowing water [3521-24]Iwamoto, S. / Trivedi, M. M. / Checkley, D. M. / SPIE et al. | 1998
- 221
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Machine vision algorithms for semiconductor wafer inspection: a project with Inspex [3521-25]Chen, C.-H. / Cheng, T.-H. / Wu, W.-T. / Driscoll, S. A. / SPIE et al. | 1998
- 221
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Machine vision algorithms for semiconductor wafer inspection: a project with InspexChen, Chi Hau / Cheng, Tzu-Hung / Wu, Wo-Tak / Driscoll, Shawn et al. | 1998
- 229
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Online inspection of circular fluorescent lampAng, Beng-Hoe et al. | 1998
- 229
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Online inspection of circular fluorescent lamp [3521-26]Ang, B.-H. / SPIE et al. | 1998
- 237
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Experimental measurement system for industrial inspection of 3D parts [3521-27]Brenner, C. / Boehm, J. / Guehring, J. / SPIE et al. | 1998
- 237
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Experimental measurement system for industrial inspection of 3D partsBrenner, Claus / Boehm, Jan / Guehring, Jens et al. | 1998
- 248
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Calibration of x-ray digital tomosynthesis system including the compensation for image distortion [3521-28]Roh, Y. J. / Koh, K. W. / Cho, H. S. / Kim, J. Y. / SPIE et al. | 1998
- 248
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Calibration of x-ray digital tomosynthesis system including the compensation for image distortionRoh, Young Jun / Koh, Kuk Won / Cho, Hyungsuck / Kim, Jin-Young / Kim, Hyung C. / Byun, Jong-Eun et al. | 1998
- 260
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Automated visual inspection of cooking platesLahajnar, Franci / Bernard, Rok / Pernus, Franjo / Kovacic, Stanislav et al. | 1998
- 260
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Automated visual inspection of cooking plates [3521-29]Lahajnar, F. / Bernard, R. / Pernus, F. / Kovacic, S. / SPIE et al. | 1998
- 270
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Application of SKIPSM to various 3 x 3 image processing operations [3521-30]Waltz, F. M. / SPIE et al. | 1998
- 270
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Application of SKIPSM to various 3x3 image processing operationsWaltz, Frederick M. et al. | 1998
- 278
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Fast efficient algorithms for 3 x 3 ranked filters using finite-state machines [3521-31]Waltz, F. M. / Hack, R. / Batchelor, B. G. / SPIE et al. | 1998
- 278
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Fast efficient algorithms for 3x3 ranked filters using finite-state machinesWaltz, Frederick M. / Hack, Ralf / Batchelor, Bruce G. et al. | 1998
- 288
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Automated generation of efficient code for gray-scale image processing [3521-32]Waltz, F. M. / SPIE et al. | 1998
- 288
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Automated generation of efficient code for gray-scale image processingWaltz, Frederick M. et al. | 1998
- 298
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Image processing operations in color space using finite-state machinesWaltz, Frederick M. et al. | 1998
- 298
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Image processing operations in color space using finite-state machines [3521-33]Waltz, F. M. / SPIE et al. | 1998
- 304
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Protyping machine vision software on the World Wide Web [3521-34]Karantalis, G. / Batchelor, B. G. / SPIE et al. | 1998
- 304
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Protyping machine vision software on the World Wide WebKarantalis, George / Batchelor, Bruce G. et al. | 1998
- 312
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Knowledge-based program to assist in the design of machine vision systemsBatchelor, Bruce G. et al. | 1998
- 312
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Knowledge-based program to assist in the design of machine vision systems [3521-35]Batchelor, B. G. / SPIE et al. | 1998
- 325
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Data compression for digital video cameras in online machine vision systems [3521-36]Arshad, N. M. / Harvey, D. M. / Hobson, C. A. / SPIE et al. | 1998
- 325
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Data compression for digital video cameras in online machine vision systemsArshad, Norhashim M. / Harvey, David M. / Hobson, Clifford A. et al. | 1998
- 334
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Efficient algorithm for Gaussian blur using finite-state machinesWaltz, Frederick M. / Miller, John W. V. et al. | 1998
- 334
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Efficient algorithm for Gaussian blur using finite-state machines [3521-37]Waltz, F. M. / Miller, J. W. V. / SPIE et al. | 1998
- 342
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Platform-independent optical character and curve recognition systemGoldberg, Robert R. / Robinson, Jonathan et al. | 1998
- 342
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Platform-independent optical character and curve recognition system [3521-38]Goldberg, R. R. / Robinson, J. / SPIE et al. | 1998
- 351
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Color texture analysis: a unified approachLiang, Yufeng / Wilder, Joseph et al. | 1998
- 351
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Color texture analysis: a unified approach [3521-39]Liang, Y. / Wilder, J. / SPIE et al. | 1998
- 359
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High-frame-rate display system for brief presentation of static images [3521-40]Kaur, M. / Wilder, J. / Hung, G. / SPIE et al. | 1998
- 359
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High-frame-rate display system for brief presentation of static imagesKaur, Manpreet / Wilder, Joseph / Hung, George et al. | 1998
- 366
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Identification of junction structures during lung developmentGoldberg, Robert R. / Goldberg, Michael R. et al. | 1998
- 366
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Identification of junction structures during lung development [3521-41]Goldberg, R. R. / Goldberg, M. R. / SPIE et al. | 1998
- 374
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Development of an algorithm for the analysis of surface defects in mechanical elements [3521-42]Fargione, G. A. / Geraci, A. L. / Pennisi, L. / Risitano, A. / SPIE et al. | 1998
- 374
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Development of an algorithm for the analysis of surface defects in mechanical elementsFargione, Giovanna A. / Geraci, Alberto L. / Pennisi, Luigi / Risitano, Antonino et al. | 1998