Quantum Mechanical Narrow Channel Effect in Nano-Scale MOSFETs (Englisch)
- Neue Suche nach: Hiramoto, T.
- Neue Suche nach: Majima, H.
- Neue Suche nach: Electrochemical Society
- Neue Suche nach: Hiramoto, T.
- Neue Suche nach: Majima, H.
- Neue Suche nach: Electrochemical Society
In:
Electrochemical Society
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401
;
2001
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Quantum Mechanical Narrow Channel Effect in Nano-Scale MOSFETs
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Beteiligte:
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Kongress:Meeting; 199th, Electrochemical Society ; 2001 ; Washington, DC
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Erschienen in:Electrochemical Society ; 401MEETING ABSTRACTS- ELECTROCHEMICAL SOCIETY -ALL DIVISIONS- ; 2001-1 ; 401
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Verlag:
- Neue Suche nach: Electrochemical Society
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Erscheinungsdatum:01.01.2001
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Format / Umfang:401 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Effect of NaOH in Electroless Polyol Fe-Ni DepositionYin, H. / Chow, G. M. / Electrochemical Society et al. | 2001
- 2
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Application of Local Electrochemical Impedance Spectroscopy to Localized Corrosion of Organic CoatingsPhilippe, L. / Lyon, S. / Electrochemical Society et al. | 2001
- 3
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Computer Simulations of 2-Dimensional Metal Electro-DepositionSochnikov, V. / Efrima, S. / Electrochemical Society et al. | 2001
- 4
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Isotropic (Citric Acid: Hydrogen Peroxide: Phosphoric Acid) Etchant for Multilayer GaAs/AlAs MirrorJou, F.-C. J. / Pellegrino, J. G. / Edelstein, M. D. / Tseng, W. F. / Electrochemical Society et al. | 2001
- 5
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Electrodeposition of Transition Metal Oxide: Cu~2O and ZnO SemiconductorLee, J. / Tak, Y. / Electrochemical Society et al. | 2001
- 6
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Chloride Interactions with the Oxide Film on Aluminum Single CrystalsCanavan, H. / Yu, S. / Natishan, P. / Ramaker, D. / O Grady, W. / Electrochemical Society et al. | 2001
- 7
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Metallised Carbon-Epoxy Based Glucose And Lactate SensorsKhurana, M. / Winlove, C. P. / O Hare, D. / Electrochemical Society et al. | 2001
- 8
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Ionic Transport in Oligo-Ethylene Oxide/Fumed Silica Composite ElectrolytesWalls, H. / Fedkiw, P. / Khan, S. / Zawodzinski, T. / Electrochemical Society et al. | 2001
- 9
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Redox Flow Battery ElectrolytesBae, C. / Roberts, E. / Chakrabarti, B. / Electrochemical Society et al. | 2001
- 10
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Study of Copper Dissolution in Lithium-Ion Battery Electrolytes by Atomic Absorption Spectroscopy (AAS)Zhao, M. / Dewald, H. / Electrochemical Society et al. | 2001
- 11
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Transmembrane Charge Transfer in Normal Human Breast Cells and Breast Cancer CellsLiu, B. / Mirkin, M. / Electrochemical Society et al. | 2001
- 12
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Excimer Laser Doping for ZnO pn Diode FabricationAoki, T. / Nakamura, A. / Look, D. / Hatanaka, Y. / Electrochemical Society et al. | 2001
- 13
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The Electrochemical Behavior of Carbon Steel in Nitrite and Bicarbonate SolutionsKhalafpour, P. / Paulson, S. / Birss, V. / Cramb, D. / Electrochemical Society et al. | 2001
- 14
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Electrochemical and Structural Studies of Sol-Gel (SG) Formed Co Oxide FilmsCo, A. / Abel, C. / Serebrennikova, I. / Birss, V. / Electrochemical Society et al. | 2001
- 15
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The Development of Electrochemical Impedance Biosensors for the Detection of Small MoleculesCorry, B. / Crawley, C. / Electrochemical Society et al. | 2001
- 16
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Study of the Retrogress and Reaging of High Strength Aluminum AlloysFerrer, C. / Moran, A. / Koul, M. / Electrochemical Society et al. | 2001
- 17
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Lithium-Conductive Perfluorosulfonate Membranes in Nonaqueous SolventsRay, C. / Perusich, S. / Electrochemical Society et al. | 2001
- 18
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Effect of Inhibitor Ions on The Dissolution of Surface Intermetallics on Al 2024-T3 AlloyBesing, A. / Kolics, A. / Wieckowski, A. / Electrochemical Society et al. | 2001
- 19
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Fabrication of Thin-Film LiNiO~2 for Rechargable Lithium BatteryKim, D. / Kim, J. G. / Kim, H. G. / Electrochemical Society et al. | 2001
- 20
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Combustion Chemical Vapor Deposition of Yttria Stabilized Zirconia Thin Films For Solid Oxide Fuel CellsXu, Z. / Wei, Q. / Sankar, J. / Electrochemical Society et al. | 2001
- 21
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Modeling of The H~2-(O)~2 Proton-Exchange Membrane Fuel Cell. Electrode Microstructure, Kinetics and Transport AspectsThampan, T. / Zhang, J. / Datta, R. / Electrochemical Society et al. | 2001
- 22
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Combinatorial Electrochemical Techniques for the Discovery of Improved Fuel-Cell Electrode MaterialsStrasser, P. / Gorer, S. / Devenney, M. / Electrochemical Society et al. | 2001
- 23
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A Fast Method for Pre-Screening of Pt Based Catalysts for PEMFCPetrov, K. / Gamburzev, S. / Appleby, A. J. / Napolitano, P. / Atanasova, P. / Hampden-Smith, M. / Electrochemical Society et al. | 2001
- 24
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A Two-phase Flow and Transport Model for PEM Fuel CellsYou, L. / Liu, H. / Electrochemical Society et al. | 2001
- 25
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Performance of Non-Precious-Metal Catalyst for Alkaline Fuel CellGamburzev, S. / Kunze, K. / Atanassova, P. / Atanassov, P. / Hampden-Smith, M. / Kodas, T. / Electrochemical Society et al. | 2001
- 26
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Pt-Mo Binary Alloys as Advanced CO Tolerant Catalysts for PEM Fuel CellsEnayetullah, M. / Urian, R. / Mukerjee, S. / Tinoco, F. / Shaik, K. / Allen, R. / Electrochemical Society et al. | 2001
- 27
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Effect of Anode Flow Rate on the CO Poisoning of PEM Fuel CellZhang, J. / Thampan, T. / Datta, R. / Electrochemical Society et al. | 2001
- 28
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Contributions of Fundamental Research to Carbonate Fuel Cell TechnologySelman, J. R. / Electrochemical Society et al. | 2001
- 29
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Design Optimization and Advanced Material Development for Molten Carbonate Fuel CellUchida, I. / Electrochemical Society et al. | 2001
- 30
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A New Method for Preparation of Gas Diffusion Electrodes for Alkaline Fuel Cells and Metal-air BatteriesGamburzev, S. / Petrov, K. / Appleby, A. J. / Electrochemical Society et al. | 2001
- 31
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Ni-based Glasses as Electrocatalysts for PEMFCsLu, G. / Zangari, G. / Electrochemical Society et al. | 2001
- 32
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Fuel Processor for Portable Fuel Cell ApplicationsRogers, S. / Koripella, R. / Tasic, S. / Gervasio, D. / Dyer, C. / Zindel, D. / Hallmark, J. / Wilcox, D. / Electrochemical Society et al. | 2001
- 33
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A High Current Density Laccase Cathode for In-vivo Biofuel CellsBarton, S. C. / Binyamin, G. / Kim, H.-H. / Heller, A. / Electrochemical Society et al. | 2001
- 34
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Reduced-Temperature SOFCs Using Ceria-Based Electrolytes Fabricated by Sceen PrintingXia, C. / Chen, F. / Liu, M. / Electrochemical Society et al. | 2001
- 35
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Selective Oxidation of CO in Hydrogen under Fuel Cell Operating ConditionsHe, C. / Fenton, J. / Kunz, R. / Electrochemical Society et al. | 2001
- 36
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Development of High Stability Cathodes for Molten Carbonate Fuel Cell ApplicationsDurairajan, A. / Haran, B. / White, R. / Popov, B. / Electrochemical Society et al. | 2001
- 37
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Design and Optimization of Molten Carbonate Fuel Cell CathodesHaran, B. / Durairajan, A. / Popov, B. / White, R. / Electrochemical Society et al. | 2001
- 38
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Compound Semiconductor Electrodeposition via Ligand Stabilized Cations over Large pH RangesWilliams, R. / Herman, J. / Ryan, M. / Electrochemical Society et al. | 2001
- 39
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The Electrochemistry of Non-Aqueous Aluminum of BatteriesLevitin, G. / Tel-Vered, R. / Yarnitzky, C. / Licht, S. / Electrochemical Society et al. | 2001
- 40
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A Generalized Symbolic Solution for Diffusional Impedance of Particle ElectrodesSubramanian, V. / Guo, Q. / Weidner, J. / White, R. / Electrochemical Society et al. | 2001
- 41
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Cycling Behavior of Microscopic Nickel-Zinc BatteriesHumble, P. / Harb, J. / Bennett, D. / Selfridge, R. / LaFollette, R. / Electrochemical Society et al. | 2001
- 42
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Material and Electrochemical Characterization of Tetrapropylammonium Manganese Oxide Thin Films as Novel Electrode Materials for Electrochemical CapacitorsChin, S.-F. / Pang, S.-C. / Anderson, M. / Electrochemical Society et al. | 2001
- 43
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Modeling of Thermal Behavior of Nickel/Metal Hydride Batteries for Electric VehiclesShin, C. B. / Yun, C. Y. / Park, S.-Y. / Electrochemical Society et al. | 2001
- 44
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Effects of the Chemical Structures of Ru- and Ir-Chloride Precursors on the Preparation of Hydrous Ru-Ir Oxides for the Electrochemical Capacitors by Cyclic VoltammetryHu, C.-C. / Chang, K.-H. / Electrochemical Society et al. | 2001
- 45
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Synthesis and Characterization of Mn Based Alloy Materials for SupercapacitorsKim, H. / Popov, B. / Electrochemical Society et al. | 2001
- 46
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Performance and Life Evaluations of Advanced Technology Development Lithium-Ion CellsMotloch, C. / Electrochemical Society et al. | 2001
- 47
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Ion Distribution of Spinel Type Zn~1~-~xLi~xFe~2~-~xTi~xO~4Arachi, Y. / Asai, T. / Yuichi, K. / Tabuchi, M. / Electrochemical Society et al. | 2001
- 48
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The Effect of Amorphous Structure on the Improvement of Anode Material for Lithium BatteryZhu, X. / Lee, J. Y. / Liu, Z. / Electrochemical Society et al. | 2001
- 49
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On the Origin of the Electrochemical Degradation of Rocking-Chair Manganese Dioxide MaterialsDelplancke, J.-L. / Segato, T. / Duvigneaud, P.-H. / Rousche, J.-C. / Soupart, J.-B. / Piton, M.-F. / Electrochemical Society et al. | 2001
- 50
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The Cycling Stability of Solid Electrolyte Interface Film Formed on Graphite ElectrodesWang, C. / Appleby, A. J. / Little, F. E. / Electrochemical Society et al. | 2001
- 51
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Optimized LiFePO~4 for Lithium Battery CathodesYamada, A. / Chung, S.-C. / Hinokuma, K. / Electrochemical Society et al. | 2001
- 52
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Three-Dimensional Thermal Electrochemical Modeling of a Lithium-Ion BatteryGomadam, P. / Weidner, J. / White, R. / Electrochemical Society et al. | 2001
- 53
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Use of Nano Materials as Cathodes in Primary and Secondary Lithium and Lithium Ion BatteriesGhantous, D. / Chaloner-Gill, B. / Electrochemical Society et al. | 2001
- 54
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Reaction Mechanism of the Olivine-Type Li~x(Mn~yFe~1~-~y)PO~4Yamada, A. / Chung, S.-C. / Hosoya, M. / Li, G. / Kudo, Y. / Liu, K.-Y. / Electrochemical Society et al. | 2001
- 55
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Spectroelectrochemical Investigations of Cation-Insertion Reactions at Mesoporous Manganese Oxide Thin FilmsLong, J. / Qadir, L. / Rolison, D. / Electrochemical Society et al. | 2001
- 56
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The Effect of Cathode Materials of Li-ion Cells as a Back-up Power SupplyAsakura, K. / Shimomura, M. / Hirai, T. / Electrochemical Society et al. | 2001
- 57
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Improvement of the Electrochemical properties of LiNi~0~.~5Mn~1~.~5O~4 SpinelWu, X. / Kim, S. B. / Electrochemical Society et al. | 2001
- 58
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Preparation and Characterization of Mesoporous Sn-SiO~2 Composite as Anode for Lithium-Ion BatteryShi, Z. / Chen, F. / Liu, M. / Electrochemical Society et al. | 2001
- 59
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Temperature Dependent Performance of Li~xM~yMn~y~-~2O~4: In situ XRD and XAS StudiesUrian, R. / Mukerjee, S. / Electrochemical Society et al. | 2001
- 60
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Studies of Ion Transport Mechanisms in Semicrystalline P(EO)n -based Polymer ElectrolytesGolodnitsky, D. / Livshits, E. / Lapidas, I. / Peled, E. / Electrochemical Society et al. | 2001
- 61
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Electrochemical Properties of Thin-Layer Electrodes Based on Iron Sulfide Compounds in Polymer and Solid Nonaqueous ElectrolytesShembel, E. / Kalinushkin, E. / Maksyuta, I. / Chervakov, O. / Tysyachny, V. / Kylyvnyk, K. / Pastushkin, T. / Oleshko, S. / Reisner, D. / Novak, P. et al. | 2001
- 62
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Tin Encapsulated Graphite as Anode Material for Li-Ion BatteriesBasker, V. / Durairajan, A. / White, R. / Popov, B. / Electrochemical Society et al. | 2001
- 63
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Adhesion Studies of Cathode Materials in Lithium BatteriesSugita, M. / Yoshio, M. / Electrochemical Society et al. | 2001
- 64
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Direct-Oxidation Fuel Cells Based on Nanoporous Proton- Conducting Membrane (NP-PCM)Peled, E. / Duvdevani, T. / Aharon, A. / Melman, A. / Electrochemical Society et al. | 2001
- 65
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The Nature of Proton Transport in Fully Hydrated NafionPaddison, S. / Pivovar, B. / Paul, R. / Electrochemical Society et al. | 2001
- 66
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Organic-Inorganic Hybrid Polymer Electrolyte for Application of DMFCKim, H. / Lim, C. / Chang, H. / Electrochemical Society et al. | 2001
- 67
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High-Temperature Protonic Conducting Properties of Organic/Inorganic Hybrid Polymer Membrane for DMFCNakajima, H. / Nomura, S. / Honma, I. / Electrochemical Society et al. | 2001
- 68
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Theoretically Computed Proton Diffusion Coefficients in Hydrated PEEKK MembranesPaddison, S. / Paul, R. / Kreuer, K.-D. / Zawodzinski, T. / Electrochemical Society et al. | 2001
- 69
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Development of High Temperature Polymer Electrolyte Fuel Cells Using Polyphosphazene MembranesLvov, S. / Zhou, X. / Chalkova, E. / Fedkin, M. / Allcock, H. / Hofmann, M. / Electrochemical Society et al. | 2001
- 70
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Nanoparticle Catalysis for DMFCWaszczuk, P. / Kim, H. S. / Solla, J. / Wieckowski, A. / Electrochemical Society et al. | 2001
- 71
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Electrochemical Impedance Studies of the Methanol Electro-oxidation on Pt/C Thin Film ELectrodeHsing, I.-M. / Leng, Y. / Wang, X. / Yue, P.-L. / Electrochemical Society et al. | 2001
- 72
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Thin-film Pt-RuO~xH~y Electrodes for Direct Methanol Fuel CellsLove, C. / Swider-Lyons, K. / Rolison, D. / Electrochemical Society et al. | 2001
- 73
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Electrochemical Characterization of Nanomaterials in Composite Films Using a Rotating Disc Electrode (RDE)Fink, N. / Lopez, M. / Konig, U. / Electrochemical Society et al. | 2001
- 74
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High-Temperature Electrocatalytic Properties of Pt alloys for DMFC Studied by High Pressure RDEToda, T. / Honma, I. / Electrochemical Society et al. | 2001
- 75
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The Strategy by the Kinetic Study for the Enhancement of Anode Activity of Methanol Fuel CellAramata, A. / Masuda, M. / Ohnishi, R. / Matsudaira, K. / Electrochemical Society et al. | 2001
- 76
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COad Coverage and Current Efficiency of Methanol Oxidation Studied by DEMS and Potential Step ExperimentsWang, H. / Baltruschat, H. / Electrochemical Society et al. | 2001
- 77
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Surface Area Determination of Carbon Supported Platinum-Ruthenium Electrocatalysts by Underpotential Deposition of CopperGreen, C. / Kucernak, A. / Electrochemical Society et al. | 2001
- 78
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Oxygen Reduction Activity and Corrosion Resistance of Some Base Metal Carbides in an Acidic ElectrolyteVossen, A. / McIntyre, D. R. / Burstein, G. T. / Electrochemical Society et al. | 2001
- 79
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Electrocatalyzed Oxidation of C~1 Fuels on Pt Electrode Modified by Ad-AtomsLee, J. / Christoph, J. / Strasser, P. / Eiswirth, M. / Ertl, G. / Electrochemical Society et al. | 2001
- 80
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Effects of Anions Leading to Large Increases in Steady-State Efficiency and Reaction Rates in the Electrochemical Oxidation of Formic AcidSchell, M. / Chen, S. / Noles, T. / Electrochemical Society et al. | 2001
- 81
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Combinatorial Discovery of New Methanol-Tolerant Non-Noble Metal Cathode Electrocatalysts for Direct Methanol Fuel CellsMallouk, T. / Smotkin, E. / Sarangapani, S. / Electrochemical Society et al. | 2001
- 82
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Heat-Treated Binary Metalloporphyrins for Methanol Tolerant Cathode in Direct Methanol Fuel CellsChu, D. / Jiang, R. / Electrochemical Society et al. | 2001
- 83
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Methanol Oxidation Activity of Co-Sputter Deposited Pt-Ru CatalystsWitham, C. / Narayanan, S. / Valdez, T. / Electrochemical Society et al. | 2001
- 84
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Direct Methanol Fuel Cells at Reduced Catalyst LoadingsZelenay, P. / Guyon, F. / Gottesfeld, S. / Electrochemical Society et al. | 2001
- 85
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Designed Materials for Enhanced Methanol Oxidation and CO Tolerance in PEM Fuel Cell Environment: Electrochemical and In situ SpectroscopyUrian, R. / Mukerjee, S. / Witham, C. / Narayanan, S. / Valdez, T. / Electrochemical Society et al. | 2001
- 86
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Combinatorial Approach to High Speed Screening Electrocatalysts for Direct Methanol Fuel CellsChu, D. / Jiang, R. / Electrochemical Society et al. | 2001
- 87
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The Influence of the Nafion Content in DMFC Anode Catalyst LayersHavranek, A. / Klafki, K. / Wippermann, K. / Electrochemical Society et al. | 2001
- 88
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Analysis of Open Circuit Voltage Transients in Direct Methanol Fuel CellsNarayanan, S. R. / Valdez, T. / Electrochemical Society et al. | 2001
- 89
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Carbon Supported Pt, Pt/W and Pt/Mo Electrocatalyst for Methanol Oxidation: Electrochemical and IR Spectroscopic CharacterizationGokagac, G. / Hahn, F. / Lamy, C. / Leger, J.-M. / Electrochemical Society et al. | 2001
- 90
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Development of an Air-Breathing 50W Direct Methanol Fuel Cell StackDohle, H. / Mergel, J. / Scharmann, H. / Schmitz, H. / Electrochemical Society et al. | 2001
- 91
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Direct Methanol Fuel Cell System under Air OperationPreidel, W. / Electrochemical Society et al. | 2001
- 92
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System Issues for Nafion-based Portable Direct Methanol Fuel CellsPivovar, B. / Hickner, M. / Zawodzinski, T. / Ren, X. / Gottesfeld, S. / Neutzler, J. / Electrochemical Society et al. | 2001
- 93
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Development of a 1 kW Direct Methanol Fuel Cell SystemKindler, A. / Valdez, T. / Cropley, C. / Stone, S. / Veksler, E. / Electrochemical Society et al. | 2001
- 94
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Experimental Study of a Direct Methanol Fuel CellMench, M. / Boslet, S. / Thynell, S. / Scott, J. / Wang, C.-Y. / Electrochemical Society et al. | 2001
- 95
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Development of Miniature Direct Methanol Fuel Cell Systems for Cellular Phone ApplicationsNarayanan, S. R. / Clara, F. / Valdez, T. / Electrochemical Society et al. | 2001
- 96
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Hydrogen Peroxide Oxidant Fuel Cell Systems for Ultra-Portable ApplicationsValdez, T. I. / Narayanan, S. R. / Chun, W. / Electrochemical Society et al. | 2001
- 97
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Microfluidic Fuel Delivery System for 100mW DMFCBostaph, J. / Koripella, R. / Neutzler, J. / Fisher, A. / Zindel, D. / Hallmark, J. / Electrochemical Society et al. | 2001
- 98
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A Mathematical Model for the Effects of Methanol Crossover and Oxygen Depletion in a Direct Methanol Fuel CellBaxter, S. / Battaglia, V. / White, R. / Electrochemical Society et al. | 2001
- 99
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Mathematical Modeling of Liquid-Feed Direct Methanol Fuel CellsWang, Z. H. / Wang, C. Y. / Electrochemical Society et al. | 2001
- 100
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Evaluation of Flow Distribution in PEM and DMFC Fuel CellsBewer, T. / Beckmann, T. / Dohle, H. / Mergel, J. / Neitzel, R. / Electrochemical Society et al. | 2001
- 101
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A Model for the Porous DMFC AnodeNordlund, J. / Lindbergh, G. / Electrochemical Society et al. | 2001
- 102
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Lithium Transport of Potential New Salts for Polymer ElectrolytesDai, H. / McCord, E. / Soper, P. / Vega, A. / Electrochemical Society et al. | 2001
- 103
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PEO-Based Network Solid Polymer Electrolyte with Enhanced Mechanical Stability and ConductivityKang, Y. / Kim, S.-K. / Lee, C. / Electrochemical Society et al. | 2001
- 104
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Solid Polymer Electrolytes from Dilithium Salts Based on New Bis[(perfluoroalkyl)sulfonyl]imide DianionsGeiculescu, O. / Yang, J. / Shafer, G. / Bailey-Walsh, R. / Creager, S. / DesMarteau, D. / Pennington, W. / Electrochemical Society et al. | 2001
- 105
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Changes in the Vibrational Modes of Monoglyme Induced by Coordination to Lithium and Sodium IonsRhodes, C. / Boesch, S. / Wheeler, R. / Frech, R. / Electrochemical Society et al. | 2001
- 106
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SinglenIon Conductive Polymer Electrolyte with Lithium Sulphonate End GroupTravas-Sejdic, J. / Steiner, R. / Desillvestro, J. / Electrochemical Society et al. | 2001
- 107
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Determination of Ionic Conductivity of Polymer/Carbon Composite ElectrodesSaab, A. / Weidner, J. / Zawodzinski, T. / Electrochemical Society et al. | 2001
- 108
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Transport Phenomena and Electrostatic Interactions in Thermoresponsive Hydrogels Undergoing Volume Phase TransitionsMa, C. / Ciszkowska, M. / Electrochemical Society et al. | 2001
- 109
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Molecular Modeling of the Dielectric Saturation in a Proton Exchange Membrane PorePaul, R. / Paddison, S. / Electrochemical Society et al. | 2001
- 110
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Solid Polymer Electrolyte for Alkaline Fuel CellsAgel, E. / Bouet, J. / Brincourt, T. / Fauvarque, J.-F. / Yassir, H. / Electrochemical Society et al. | 2001
- 111
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Bis[(perfluoroalkyl)]Sulfonyl Imide Ionomers for Use in PEM Fuel CellsAtkins, J. / Creager, S. / Thomas, B. / DesMarteau, D. / Electrochemical Society et al. | 2001
- 112
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New Proton Exchange Membranes Via Direct Step or PolycondensationHickner, M. A. / Wang, F. / Shobha, H. / Gunduz, N. / Mecham, J. B. / McGrath, J. E. / Zawodzinski, T. / Electrochemical Society et al. | 2001
- 113
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Growth and Characterisation of Ultrathin and High Surface Area Proton Exchange MembranesWang, R. / Kucernak, A. / Electrochemical Society et al. | 2001
- 114
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The Role of Composition and Microstructure on the Electrochemistry of Proton Exchange MembranesBeattie, P. / Basura, V. / Chuy, C. / Schmeisser, J. / Ding, J. / Holdcroft, S. / Electrochemical Society et al. | 2001
- 115
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Improving Selectivity in Methanol Fuel Cell Membranes: A Study of a Polymer-Zeolite Composite MembraneLibby, B. / Cussler, E. L. / Electrochemical Society et al. | 2001
- 116
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Preparation of MEAs for PEM Fuel Cells Operating at Above 100^oCSi, Y. / Fenton, J. M. / Kunz, H. R. / Electrochemical Society et al. | 2001
- 117
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Effects of Catalyst Layer and Membrane Thickness on Performance of Polymer Electrolyte Fuel CellsYan, S. / Sompalli, B. / Scozzafava, M. / Gasteiger, H. / Electrochemical Society et al. | 2001
- 118
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Acid Dissociation and Hydration of Various Acidic Moieties for Fuel Cell PolymersEikerling, M. / Pratt, L. / Zawodzinski, T. / Electrochemical Society et al. | 2001
- 119
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Microporous Oxides for Higher Temperature Proton Exchange MembranesAnderson, M. / Tejedor-Tejedor, M. I. / Electrochemical Society et al. | 2001
- 120
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Investigation of CO Poisoning of High Performance PEMFC ElectrodesMurthy, M. / Esayian, M. / MacKenzie, S. / Hobson, A. / Van Zee, J. / Lee, W.-K. / Glandt, J. / Electrochemical Society et al. | 2001
- 121
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Analysis of the Oxygen Reduction on Pt Microelectrode with Various Equivalent Weight Polymer ElectrolytesMitsushima, S. / Araki, N. / Kamiya, N. / Ota, K.-I. / Electrochemical Society et al. | 2001
- 122
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Performance and Characterization of Lithium Ion Type Polymer BatteryCho, M. D. / Kim, J. Y. / Seung, D. Y. / Electrochemical Society et al. | 2001
- 123
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The Investigation and Application of Anti-Corrosion Coating for Internal Food ContainerLu, F. / Yu, Y. / Yue, W. / Situ, Z. / Electrochemical Society et al. | 2001
- 124
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Influence of Toxic Metals/Chemicals on Microbial Cluster Formation in Biofilm and on Steel CorrosionXu, L.-C. / Chan, K.-Y. / Fang, H. H. P. / Electrochemical Society et al. | 2001
- 125
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A Novel Conducting Polymer Nanocomposite Coating for Corrosion Protection of A12024: Preparation and CharacterizationZhu, Y. / Iroh, J. O. / Electrochemical Society et al. | 2001
- 126
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Formulation of Cooling Water Inhibitor with Multifunctional PropertiesFarooqi, I. / Saini, P. / Quraishi, M. / Electrochemical Society et al. | 2001
- 127
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Corrosion Inhibiting Properties of Mannich Bases on Brass, Copper ans ZincQuraishi, M. / Rawat, J. / Electrochemical Society et al. | 2001
- 128
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Use of Volatile Corrosion Inhibitors for the Protection of Electronic Equipment during Transit and StorageChandler, C. / Electrochemical Society et al. | 2001
- 129
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Effect of Pb(II)on Stress Corrosion Cracking of Sensitised AISI 304 SS Monitored by Electrochemical Current NoiseSantiso, L. / Abella, J. / Victori, L. / Electrochemical Society et al. | 2001
- 130
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Platinum Electrochemical Behavior & Corrosion During Consistent Pulses PolarizationPikelny, A. / Schulman, J. / Helland, M. / Electrochemical Society et al. | 2001
- 131
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Corrosion Studies with Total Internal Reflection EllipsometryPoksinski, M. / Dzuho, H. / Arwin, H. / Electrochemical Society et al. | 2001
- 132
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Electronic Structure Of Passive Films Formed on AISI 304 Stainless SteelFerreira, M. / Hakiki, N. / Simoes, A. / Cunha-Belo, M. / Electrochemical Society et al. | 2001
- 133
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An Optical and Electron Spectroscopic Study of the Decontamination of Corroded Steel Surfaces Exposed to Radionuclides Using Hydroxycarboxylic AcidsHalada, G. / Clayton, C. / Cuiffo, M. / Eng, C. / Francis, A. / Dodge, C. / Gillow, J. / Electrochemical Society et al. | 2001
- 134
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Study of Processes of Underrfilm Corrosion of Metals in the Presence of Siloxane LayersPetrunin, M. / Maksaeva, L. / Yurasova, T. / Electrochemical Society et al. | 2001
- 135
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Effect of Organosilicon Surface Layers on Hydrogen Entry into Iron in Presence of Promotors of HydrogenationMaksaeva, L. / Petrunin, M. / Marshakov, A. / Electrochemical Society et al. | 2001
- 136
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Serface Active Compounds Action on Localized Corrosion of MagnesiumYurasova, T. / Petrunin, M. / Electrochemical Society et al. | 2001
- 137
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Combined Electrochemical and AFM Studies of General and Localized Corrosion of Carbon SteelPaulson, S. / Khalafpour, P. / Cramb, D. / Birss, V. / Electrochemical Society et al. | 2001
- 138
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Monitoring of Evaporation Precess Using an Electrochemical SensorVictor, O. / Facundo, A. / Citlalli, G. / Adan, B. / Alberto, M. / Electrochemical Society et al. | 2001
- 139
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Cyclic Polarization Behavior of Aluminum Oxide Films in Near Neutral SolutionsLee, H. / Isaacs, H. / Xu, F. / Electrochemical Society et al. | 2001
- 140
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Effect of Sulfide Ions on the Electrochemical Impedance of Copper in Benzotriazole Inhibited MediaAl-Kharafi, F. M. / Ateya, B. G. / Electrochemical Society et al. | 2001
- 141
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2-Enedithiolate Hydrazone Compounds for Corrosion Inhibition of ZincManov, S. / LamazouEre, A.-M. / Aries, L. / Electrochemical Society et al. | 2001
- 142
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Interaction of Non-Chromate Inhibitors With Surface Intermetallics on AL 2024-T3Besing, A. / Kolics, A. / Wieckowski, A. / Electrochemical Society et al. | 2001
- 143
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Development of New Corrosion and Hydrogen Permeation Resistant Nanostructured Composite CoatingsDurairajan, A. / Kim, H. / Bala, H. / White, R. / Popov, B. / Electrochemical Society et al. | 2001
- 144
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Corrosion Science as a Tool for the Development of XPSCastle, J. E. / Electrochemical Society et al. | 2001
- 145
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Overview of Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron SpectroscopyPowell, C. J. / Conny, J. M. / Jablonski, A. / Electrochemical Society et al. | 2001
- 146
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Valence Band Photoelectron Spectroscopy as a Probe of the Surface Chemistry Associated with Corrosion and its PreventionSherwood, P. / Electrochemical Society et al. | 2001
- 147
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Oxide Networks, Surface Analysis, and the Passivity of Chromium Binary AlloysMcCafferty, E. / Electrochemical Society et al. | 2001
- 148
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Tarnish Process of Silver in Atmospheric Environments Containing Hydrogen Sulfide and Nitrogen DioxidePayer, J. / Kim, H. / Electrochemical Society et al. | 2001
- 149
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Surface Analysis and Adhesion: From Locus of Failure to Interfacail ChemistryWatts, J. F. / Electrochemical Society et al. | 2001
- 150
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Combining Electrochemical and XPS Measurements for the Complete PictureDavis, G. / Electrochemical Society et al. | 2001
- 151
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An X-ray Photoelectron Spectroscopy (XPS) Study of the Modification of Passive Films by MicrobesClayton, C. R. / Halada, G. P. / Electrochemical Society et al. | 2001
- 152
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Surface Studies of Self Assembled Nanoscale Quantum DotsLuo, H. / Liang, Y. / Electrochemical Society et al. | 2001
- 153
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A Novel Stable Nano Dot System For Electron-Hole Pair Separation: Self-Assembled Cu~2O Dots On SrTiO~3(001)Liang, Y. / Electrochemical Society et al. | 2001
- 154
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Scanning Near-Field Infrared MicroscopyGillman, E. / Electrochemical Society et al. | 2001
- 155
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Scanning Probe Microscopy Measurements of Dissolution and Growth ProcessesBaer, D. R. / Liang, Y. / Lea, A. S. / Amonette, J. E. / Colton, N. G. / Electrochemical Society et al. | 2001
- 156
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Applications of Synchrotron Infrared Microspectroscopy (SIRMS) to Corrosion, Contamination and CoatingsHalada, G. / Clayton, C. / Electrochemical Society et al. | 2001
- 157
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X-ray Absorption Spectroscopy: Application to Electrode Surface and Interface AnalysisMcBreen, J. / Balasubramanian, M. / Electrochemical Society et al. | 2001
- 158
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In situ Studies of Corrosion Using X-ray Absorption Near Spectroscopy and Fluorescence TechniquesIsaacs, H. / Electrochemical Society et al. | 2001
- 159
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The Study of Corrosion and Oxidation of Metal Surfaces Using X-ray Absorption SpectroscopyO Grady, W. / Yu, S. / Ramaker, D. / Natishan, P. / Electrochemical Society et al. | 2001
- 160
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Characterisation of NaCl Particle Induced Corrosion Processes of using Complementary Surface Analysis ToolsNeufeld, A. / Cole, I. / Bond, A. / Isaacs, H. / Electrochemical Society et al. | 2001
- 161
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Novel Techniques for the Investigation of Long-Term Photo-Degradation of Multi-Layer Polymer CoatingsKeene, L. / Clayton, C. R. / Halada, G. / McKnight, S. / Kosik, W. / Electrochemical Society et al. | 2001
- 162
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Corrosion of Co-Sm based Media for Magnetic Recording: a Surface Analytical StudyZana, I. / Zangari, G. / Electrochemical Society et al. | 2001
- 163
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Electrochemical Ellipsometry Study on Corrosion Resistance of Fe~2O~3-Cr~2O~3-M~xO~y (M: Valve Metals and Si) Artificial Passivation Films in Acid SolutionsSugimoto, K. / Son, M. / Akao, N. / Hara, N. / Electrochemical Society et al. | 2001
- 164
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Measurement of Erosive Element Interactions with Gun Barrel Materials Using Nuclear Reaction AnalysisDemaree, D. / Marble, D. / Electrochemical Society et al. | 2001
- 165
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Corrosion Studies of AA2024-T3 using Scanning Kelvin Probe Force MicroscopyLeblanc, P. / Laget, V. / Frankel, G. S. / Electrochemical Society et al. | 2001
- 166
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Corrosion Inhibiting Characteristics of Plasma Polymerized Films on AluminumFan, G. L. / Boerio, J. / Dillingham, G. / Urbina, A. / Hernandez, M. / Genesca, J. / Electrochemical Society et al. | 2001
- 167
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Effect of Surface Pretreatments on Chromate Conversion CoatingsChidambaram, D. / Clayton, C. R. / Halada, G. P. / Electrochemical Society et al. | 2001
- 168
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Effects of Mg and Cu on Al Corrosion in Alkaline NaCl SolutionsWindisch, C. F. / Baer, D. R. / Engelhard, M. H. / Danielson, M. J. / Jones, R. H. / Electrochemical Society et al. | 2001
- 169
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Formation and Breakdown Behavior of Aluminum Oxide Films Formed in Dilute NaOH SolutionChoi, S. / Yoon, J. / Kim, H. / Mitton, B. / Latanision, R. / Takahashi, H. / Electrochemical Society et al. | 2001
- 170
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Study of the Structure and Formation of Chromate Conversion Coatings (CCC) on Thin Film Analogs of Copper-Containing Intermetallic Constituents in AA2024-T3Vasquez, M. J. / Halada, G. P. / Clayton, C. R. / Longtin, J. P. / Electrochemical Society et al. | 2001
- 171
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In situ XANES Investigations of Fe~2O~3/Cr~2O~3 Artificial Passive FilmsSchmuki, P. / Virtanen, S. / Isaacs, H. / Electrochemical Society et al. | 2001
- 172
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Effect of Abrasion on the Electrochemical Behavior Al in Acid SolutionKuo, H. / Huang, T.-M. / Tsai, W.-T. / Electrochemical Society et al. | 2001
- 173
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Studies on the Repassivation Behavior of Aluminum Exposed to Dichromate SolutionChidambaram, D. / Clayton, C. R. / Halada, G. P. / Electrochemical Society et al. | 2001
- 174
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Relationship of an Equivalent Electrical Circuit to Structure of Setting Calcium Phosphate BiocementsMueller, H. / Electrochemical Society et al. | 2001
- 175
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XPS Investigation of Oxidation of Cu Seed Layers for Microelectronics ApplicationsOpila, R. L. / Krautter, H. W. / Takahashi, K. M. / Electrochemical Society et al. | 2001
- 176
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In Situ Electrochemical Corrosion Sensor to Monitor Materials Degradation in the Laboratory and in the FieldDavis, G. / Krebs, L. / Dacres, C. / Electrochemical Society et al. | 2001
- 177
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The Corrosive Environment Monitoring System (CEMS): An Innovative Technique for Monitoring and Preventing the Formation of Corrosion on Aircraft StructureMoffatt, J. / Malver, F. / Menon, S. / Electrochemical Society et al. | 2001
- 178
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Use of Electrochemical Noise Methods (ENM) for In situ Monitoring of Coatings Electrochemical Properties during Accelerated Exposure TestingWang, X. / Bierwagen, G. / Tallman, D. / Electrochemical Society et al. | 2001
- 179
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Quantifying Atmospheric Corrosion Using Stacked Foil ElectrodesWall, D. / Martinez, M. / Electrochemical Society et al. | 2001
- 180
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Bridging Ideal and Practical Electrochemical Corrosion Measurements Using the Wire Beam Electrode MethodTan, Y.-J. / Electrochemical Society et al. | 2001
- 181
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Sensors for Relating Microbial Colonies and Their Chemistry to Localized CorrosionDexter, S. / Xu, K. / Luther, G. / Electrochemical Society et al. | 2001
- 182
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Development of a Multi-Electrode Array Sensor for Monitoring Localized CorrosionYang, L. / Sridhar, N. / Pensado, O. / Electrochemical Society et al. | 2001
- 183
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Potentiometric Detection of Gases and Corrosion Products in Ultrathin Water Layers Present during Atmospheric CorrosionZavadil, K. / Barbour, J. C. / Kravitz, S. / Ellis, R. / Electrochemical Society et al. | 2001
- 184
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Electrochemical Biocorrosion SensorsFesty, D. / Marchal, R. / Monfort-Moros, N. / Tribollet, B. / Electrochemical Society et al. | 2001
- 185
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In Situ Monitoring of Chemistry and Corrosion Processes Under Heat Transfer and Episodic Wetting ConditionsBrossia, S. / Dunn, D. / Moghissi, O. / Electrochemical Society et al. | 2001
- 186
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Video Camera Based Inspection Systems for Assessing the State of Corrosion of Shipboard Ballast TanksLemieux, E. / Slebodnick, P. / Nelson, B. / Krupa, M. / Singleton, W. / Lucas, K. / Seelinger, A. / Thomas, D. / Electrochemical Society et al. | 2001
- 187
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Use of Corrosion Monitoring Probes on Concrete-lined Steel Pipelines at the Stategic Petroleum ReserveMontes, L. / Molecke, M. / Electrochemical Society et al. | 2001
- 188
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Solid State Sensors for Electroless Gold PlatingSadik, O. / Xu, H. / Electrochemical Society et al. | 2001
- 189
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Non-Equilibrium, Atmospheric Pressure Plasmas for Semiconductor Materials ProcessingHicks, R. / Electrochemical Society et al. | 2001
- 190
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The Atmospheric Pressure Plasma JetHerrmann, H. W. / Selwyn, G. S. / Park, J. / Henins, I. / Electrochemical Society et al. | 2001
- 191
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DBD-based Pulsed Plasma Polymerisation at Atmospheric PressureKlages, C.-P. / Klake, N. / Thyen, R. / Electrochemical Society et al. | 2001
- 192
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Application of Spray Type Plasma Reactor to Fluorinated Polymer Deposition at Atmospheric PressureKogoma, M. / Tanaka, K. / Electrochemical Society et al. | 2001
- 193
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Atmospheric Plasma Treatment for Enhanced Surface Functionalization of Moving WebsYializis, A. / Decker, W. / Electrochemical Society et al. | 2001
- 194
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Fused Hollow Cathode Cold Atmospheric Plasma SourceBarankova, H. / Bardos, L. / Electrochemical Society et al. | 2001
- 195
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Effective Utilization of Active Oxygen Species in Nonthermal Plasma Chemical Processing of Volatile Organic CompoundsFutamura, S. / Ibusuki, T. / Einaga, H. / Electrochemical Society et al. | 2001
- 196
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Application of Non-Thermal Atmospheric Pressure Plasma for Treating Volatile Organic Compound EmissionsFridman, A. / Sobacchi, M. / Saveliev, A. / Gutsol, A. / Kennedy, L. / Electrochemical Society et al. | 2001
- 197
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Decomposition of Dioxine by PACT(Plasma Assisted Catalytic Technology)Hayashi, Y. / Tateyama, I. / Matsumoto, H. / Electrochemical Society et al. | 2001
- 198
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Highly Effective CYRANNUS Plasma for Various Plasma Chemical Processes at Ambient PressureSung-Spitzl, H. / Spitzl, R. / Electrochemical Society et al. | 2001
- 199
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Oxidizing Species Created by a Cold Atmospheric Plasma in AirBenstaali, B. / Benderdouche, N. / Addou, A. / Brisset, J. L. / Moussa, D. / Electrochemical Society et al. | 2001
- 200
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Orthogonal Experiment Application in C~3F~8 Chamber Clean ProcessLiu, W.-J. / Electrochemical Society et al. | 2001
- 201
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Comparison of PECVD Chamber Cleaning Processes (Environmental, Productivity, and Economic Considerations)Allgood, C. / Mocella, M. / Hsu, S. / Electrochemical Society et al. | 2001
- 202
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Reduced Clean Time and PFC Emissions Reduction through Remote Plasma Clean for Lamp Heated CVD ChambersMendicino, L. / Nauert, C. / Brown, P. T. / Atherton, A. / Nowak, T. / Silvetti, D. / Hartz, C. / Johnson, A. / Maroulis, P. / Electrochemical Society et al. | 2001
- 203
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The Evaluation of Hexafluorobenzene as an Environmentally Benign Dielectric Etch ChemistryChatterjee, R. / Karecki, S. / Reif, R. / Sparks, T. / Vartanian, V. / Goolsby, B. / Electrochemical Society et al. | 2001
- 204
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Reactor Dependence of NF~3/Hydrocarbon Chemistry for Global Warming Emissions Reduction in Dielectric EtchingPruette, L. / Karecki, S. / Chatterjee, R. / Reif, R. / Cowles, D. / Kirmse, K. / Electrochemical Society et al. | 2001
- 205
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Analysis of IPCC PFC Emissions Estimating MethodologyBeu, L. / Brown, P. T. / Peterson, J. / Electrochemical Society et al. | 2001
- 206
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Characterization of Implanter Effluent by FTIR and RGA AnalysisGoolsby, B. / Vartanian, V. / Mendicino, L. / Electrochemical Society et al. | 2001
- 207
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Characterization of Emissions in Plasma Ashing and Cleaning ApplicationsBanerjee, S. / Hills, G. / Ridgeway, R. / Pearce, R. / Strencosky, T. / Electrochemical Society et al. | 2001
- 208
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Characterization and Abatement of Emissions from Advanced CVD ProcessesMendicino, L. / Vartanian, V. / Goolsby, B. / Reid, K. / Brown, P. T. / Electrochemical Society et al. | 2001
- 209
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Fate of Fluorine Determination in Exhaust from NF3-Based CVD Chamber CleansVartanian, V. / Mendicino, L. / Goolsby, B. / Brown, P. T. / Babbitt, D. / Electrochemical Society et al. | 2001
- 210
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Spin Etch Planarization of Larger Copper Damascene StructuresDeBear, D. / Levert, J. / Electrochemical Society et al. | 2001
- 211
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RCA Clean OptimizationMolloy, J. / Raley, B. / Taylor-Burton, B. / Electrochemical Society et al. | 2001
- 212
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Novel Wafer Cleaning Technologies SurveyPawsat, S. / Electrochemical Society et al. | 2001
- 213
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ESH Aspects of Photo-resist Stripping with Ozonated Ultrapure WaterWorth, W. / Burnett, S. / Electrochemical Society et al. | 2001
- 214
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Reducing Environmental Impact With Ozone Based ProcessesNelson, S. / Electrochemical Society et al. | 2001
- 215
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Cryogenic CO~2 Cleaning Process Analysis in the Semiconductor IndustryBarbee, K. / Lee, J. J. / Electrochemical Society et al. | 2001
- 216
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Creating Win-Win: Leveraging Insight Into Industrial Environmental Decision-MakingBauer, D. / Krishnan, N. / Francis, T. / Electrochemical Society et al. | 2001
- 217
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Infrastructure Aging Issues in 200 mm Wafer FabsBrown, P. T. / Nauert, C. / Heironimus, J. / Reblin, R. / Electrochemical Society et al. | 2001
- 218
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Safe Fluorine Gas Source for Semiconductor Materials ProcessingArno, J. / Sturm, E. / Electrochemical Society et al. | 2001
- 219
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Current Issues with Monitoring Arsine in the Semiconductor IndustryBarbee, W. K. / Electrochemical Society et al. | 2001
- 220
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Methods and Apparatus for Reducing Waste Effluent from Chemical Mechanical Planarization (CMP) ProcessesOlsen, G. / Weldon, M. / Electrochemical Society et al. | 2001
- 221
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Reduction of Waste Generation and Extension of Bath Life in Copper Electroplating SystemsClark, J. / Blachier, O. / Dickinson, J. / Electrochemical Society et al. | 2001
- 222
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Recycling of Solvents in Used Photoresist StrippersFollweiler, D. / Peters, D. / Electrochemical Society et al. | 2001
- 223
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Management of W-CVD EffluentGu, Y. / Grout, K. / Haupt, S. / Electrochemical Society et al. | 2001
- 224
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The Future of Silicon IC TechnologyHillenius, S. / Electrochemical Society et al. | 2001
- 225
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Liquid Source Misted Chemical Deposition (LSMCD) of Thin Dielectric FilmsLee, D.-O. / Roman, P. / Mumbauer, P. / Grant, R. / Horn, M. / Ruzyllo, J. / Electrochemical Society et al. | 2001
- 226
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Comparison of Furnace and Rapid Photothermal Processing of IP9333 for High K ApplicationsFakhruddin, M. / Singh, R. / Poole, K. / Electrochemical Society et al. | 2001
- 227
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Anomalous Ti~xTa~yO High K Thin FilmsKuo, Y. / Tewg, J.-Y. / Donnelly, J. / Electrochemical Society et al. | 2001
- 228
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Precise Characterization of ZrO~2 Ultra Thin Gate Dielectrics by Various Independent TechniquesStehle, J. L. / Boher, P. / Defranoux, C. / Janicot, S. / Evrard, P. / Piel, J. P. / Hu, Y. / Tay, S.-P. / Electrochemical Society et al. | 2001
- 229
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Chemistry and Reactivity of Metal/Polymer InterfacesHo, P. S. / Electrochemical Society et al. | 2001
- 230
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High Dielectric Constant Ceramics for Electronic Applications: A ReviewBarlow, F. / Elshabini, A. / Ang, S. / Brown, W. D. / Electrochemical Society et al. | 2001
- 231
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Preparation of SiTiO Films by Liquid Phase DepositionLee, M.-K. / Shih, C.-M. / Electrochemical Society et al. | 2001
- 232
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Process and Material Characteristics of Titanium Tantalum Oxide (Ti~xTa~yO)- a New High K Thin FilmKuo, Y. / Tewg, J.-Y. / Donnelly, J. / Electrochemical Society et al. | 2001
- 233
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PECVD Deposited SiCOH Films with Reduced Dielectric ConstantsGrill, A. / Patel, V. / Electrochemical Society et al. | 2001
- 234
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Fluorine Distribution and Film Stability of HDP-FSG and PE-FSG Dielectric Materials- A Comparative StudyTseng, W.-T. / Song, J. / Electrochemical Society et al. | 2001
- 235
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Formation and Properties of Low-k, Porous Spin-on-GlassPadovani, A. / Allen, S. A. / Kohl, P. / Electrochemical Society et al. | 2001
- 236
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Patterning and Pattern Development in ParylenesPruden, K. G. / Beaudoin, S. / Electrochemical Society et al. | 2001
- 237
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Low Dielectric Constant Polymers for Next Generation Microelectronic PackagingAlexander, M. / Dang, T. / Specker, C. / Houtz, M. / Arnold, F. / Electrochemical Society et al. | 2001
- 238
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Low-k, Porous Spin-on-GlassPadovani, A. / Electrochemical Society et al. | 2001
- 239
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Electromigration Characteristics of Copper Damascene Interconnect with Low k- (FSG/USG) DielectricsNguyen, D. / Rathore, H. / Electrochemical Society et al. | 2001
- 240
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Evaluation and Integration of PECVD Carbon-doped SiO~2 Low-k Thin Films for Copper Dual-damascene MetallizationHan, L. / Loke, N. / Shi, J. / Santhanesh, S. / Ii, C. / Kang, J. / Koh, L. / Xie, J. / Foo, P. D. / Electrochemical Society et al. | 2001
- 241
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Characterization of SiO~2 Dielectric Films in Photo-Chemical Vapor Deposition Using Vacuum Ultraviolet Excimer LampToshikawa, K. / Miyano, J. / Motoyama, Y. / Kurosawa, K. / Electrochemical Society et al. | 2001
- 242
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Selectivity Control in Plasma Etching for Dual Damascene with OSG filmsLi, S.-Y. / Sadjadi, S. M. R. / Electrochemical Society et al. | 2001
- 243
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Reliability of Silicon Oxide deposited by an Ion Beam as Insulator for Microelectronic Interconnect LayerWanzenboeck, H. D. / Gergov, S. / Auer, E. / Harasek, S. / Bertagnolli, E. / Gritsch, M. / Hutter, H. / Brenner, J. / Stoeri, H. / Electrochemical Society et al. | 2001
- 244
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Electrical Characteristics of Organic Monolayer Dielectrics on SiliconKar, S. / Vuillaume, D. / Electrochemical Society et al. | 2001
- 245
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Fluorine Concentration and Film Characteristics of PE-FSG and HDP-FSG: Their Differences and Impacts on IMD Process IntegrationTseng, W.-T. / Song, J. / Electrochemical Society et al. | 2001
- 246
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A Review of Oxide Wearout, Breakdown, and ReliabilityDumin, D. / Electrochemical Society et al. | 2001
- 247
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Surface and Interface Study of ion Beam Deposited Silicon Oxide Thin FilmsWanzenboeck, H. D. / Bertagnolli, E. / Basnar, B. / Smoliner, J. / Gritsch, M. / Hutter, H. / Brenner, J. / Stoeri, H. / Electrochemical Society et al. | 2001
- 248
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Study of Hole Mobility of PMOSFETs in Inversion Layer During High-Field StressingJarawal, R. / Misra, D. / Electrochemical Society et al. | 2001
- 249
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Two Limiting Thinnesses of the Ultrathin Gate OxidesKar, S. / Electrochemical Society et al. | 2001
- 250
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Stress Induced Leakage Currents: Atomic Scale DefectsLenahan, P. / Campbell, J. / Kang, A. / Electrochemical Society et al. | 2001
- 251
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Charging Damage During Plasma Enhanced Dielectric DepositionCheung, K. / Electrochemical Society et al. | 2001
- 252
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Charge Transfer, Trapping and Detrapping Dynamics at Semiconductor Interfaces Probed by Second Harmonic GenerationFomenko, V. / Borguet, E. / Electrochemical Society et al. | 2001
- 253
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Kinetics and Mechanisms of Organic Contaminant Interactions at Silicon Surfaces in High Temperature ProcessesRana, N. / Raghu, P. / Shadman, F. / Electrochemical Society et al. | 2001
- 254
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Remote Plasma Deposited Gate Dielectrics on Si and SiGe MOSFETsNgai, T. / Sharma, R. / Fretwell, J. / Chen, X. / Chen, J. / Brookover, W. / Banerjee, S. / Electrochemical Society et al. | 2001
- 255
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Rapid Thermal Processes of High Permittivity Films on Silicon for ULSI Gate Dielectrics ApplicationsTay, S.-P. / Sharangpani, R. / Hu, Y. Z. / Electrochemical Society et al. | 2001
- 256
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Processing of Thick Thermal Gate Oxides in TrenchsWu, C.-T. / Ridley, R. / Dolny, G. / Grebs, T. / Hao, J. / Suliman, S. / Venkataraman, B. / Awadelkarim, O. / Willams, R. / Roman, P. et al. | 2001
- 257
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Electrical Properties of SiO~2-Films Prepared by VUV Chemical Vapor DepositionMotoyama, Y. / Miyano, J. / Tosikawa, K. / Yagi, Y. / Kurosawa, K. / Yokotani, A. / Sasaki, W. / Electrochemical Society et al. | 2001
- 258
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SiO~2 Film Deposition on Different Substrate Materials by Photo-CVD Using Vacuum Ultraviolet RadiationMiyano, J. / Toshikawa, K. / Motoyama, Y. / Kurosawa, K. / Electrochemical Society et al. | 2001
- 259
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Monitoring and Removal of Organic Contaminants from Oxide-Passivated Silicon SurfacesTsai, C.-L. / Roman, P. / Wu, C.-T. / Kamieniecki, E. / Ruzyllo, J. / Electrochemical Society et al. | 2001
- 260
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Low Energy Ion Irradiation of Silicon: Compound Formation and Segregation of ImpuritiesPetravic, M. / Williams, J. S. / Deenapanray, P. N. K. / Electrochemical Society et al. | 2001
- 261
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The Effect of Thin Oxides and Oxynitrides During the Rapid Thermal Anneal of Ultra-Low Energy Phosphorus ImplantsFalk, S. / Downey, D. / Variam, N. / Roters, G. / Lerch, W. / Electrochemical Society et al. | 2001
- 262
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Characteristics of Silicon Oxynitrides made by ECR PlasmasDiniz, J. A. / Tatsch, P. J. / Swart, J. / Electrochemical Society et al. | 2001
- 263
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Radiation Hardening of Oxynitrides Formed by Low Nitrogen Implantation into Silicon Prior to OxidationDiniz, J. A. / Fo, J. G. / Tatsch, P. J. / Swart, J. / Electrochemical Society et al. | 2001
- 264
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Material and Process Considerations for Ultrathin Silicon (Oxy-)Nitride Films Grown on Silicon and SiO~2 SurfacesD Emic, C. P. / Gusev, E. P. / Chan, K. K. / Zabel, T. / Copel, M. / Murphy, R. / Kozlowski, P. / Newbury, J. / Electrochemical Society et al. | 2001
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Silicon Oxynitride: A Versitale Material for Integrated Optics ApplicationWorhoff, K. / Driessen, A. / Lambeck, P. V. / Electrochemical Society et al. | 2001
- 266
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Characterization of Silicon Oxynitride Thin Films Deposited by ECR-PECVDSimionescu, C. / Wojcik, J. / Haugen, H. K. / Davies, J. A. / Mascher, P. / Electrochemical Society et al. | 2001
- 267
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Characterizations of Low-Temperature Magnetoplasma-Grown Si Oxynitride and OxideIkoma, H. / Electrochemical Society et al. | 2001
- 268
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Advances in Single Wafer Chemical Vapor Deposition of Oxide and Nitride FilmsPamler, W. / Gabric, Z. / Electrochemical Society et al. | 2001
- 269
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Enhanced Oxidation of Silicon Nitride using In situ Steam GenerationTrowbridge, T. / Tam, N. / Chiang, M.-L. / Xing, G. / Joo, H. S. / Electrochemical Society et al. | 2001
- 270
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High Integrity Direct Oxidation/Nitridation at Low Temperatures using RadicalsOhmi, T. / Sugawa, S. / Hirayama, M. / Electrochemical Society et al. | 2001
- 271
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Thermally Induced Stress Changes in High-Density Plasma Deposited Silicon Nitride FilmsSah, R. E. / Baumann, H. / Serries, D. / Mikulla, M. / Kiefer, R. / Electrochemical Society et al. | 2001
- 272
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Effect of Oxygen in Deposited Ultra Thin Silicon Nitride Film on Electrical PropertiesMuraoka, K. / Kurihara, K. / Electrochemical Society et al. | 2001
- 273
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Analysis of Leakage Current in CVD Gate Silicon NitrideMorisaki, Y. / Tamura, Y. / Yoshida, C. / Irino, K. / Takasaki, K. / Electrochemical Society et al. | 2001
- 274
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Study of Silicon-Nitride Barriers for Cu MetallizationQin, W. / Han, M. / Bu, X. / Mo, Z. / Tang, L. / Wang, S. / Electrochemical Society et al. | 2001
- 275
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Influence of Low-Energy Argon Ion Bombardment and Vacuum Annealing on the Silicon Nitride Surface PropertiesPetrenko, I. P. / Gritsenko, V. A. / Logvinsky, L. M. / Wong, H. / Electrochemical Society et al. | 2001
- 276
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The Effect of Additives on Morphology Evolution During ElectrodepositionAlkire, R. / Electrochemical Society et al. | 2001
- 277
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The Role of Viscosity on Ion Transport in Thin-layer ElectrodepositionGonzalez, G. / Marshall, G. / Molina, F. / Dengra, S. / Sanchez, H. / Electrochemical Society et al. | 2001
- 278
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Dynamical Analysis of Dense Morphologies in Thin Cell ElectrodepositionArgoul, F. / Leger, C. / Elezgaray, J. / Electrochemical Society et al. | 2001
- 279
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Morphology Evolution in the Formation of CdTe using Electrochemical Atomic Layer Epitaxy (EC-ALE)Varazo, K. / Lay, M. / Sorenson, T. / Happek, U. / Stickney, J. / Electrochemical Society et al. | 2001
- 280
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Feedback Control of Morphology Evolution in Metal Electrodeposition by Optical MeansBozzini, B. / Corradini, L. / Lenardi, C. / Electrochemical Society et al. | 2001
- 281
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Morphology Evolution in BumpingKondo, K. / Munehiro, E. / Matsumoto, T. / Electrochemical Society et al. | 2001
- 282
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Localized Electrochemical Deposition of Copper Microstructures (I): Modeling of Structure FormationSaid, R. / Hussein, M. / Electrochemical Society et al. | 2001
- 283
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Localized Electrochemical Deposition of Copper Microstructures (II): Artifacts of Electrode-Tip GeometrySaid, R. / Electrochemical Society et al. | 2001
- 284
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Localized Electrochemical Deposition of Copper Microstructures (III): Factors Influencing Shape FormationSaid, R. / Electrochemical Society et al. | 2001
- 285
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The Effect of Current Waveform on The Surface Morphology and Texture of Copper Electrodeposits for ULSILee, H.-J. / Lee, D. N. / Jeon, Y. J. / Electrochemical Society et al. | 2001
- 286
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Effect Of Additives On Copper Electroplating In Damascene TrenchesKang, M. / Leung, T. Y. B. / Gross, M. / Gewirth, A. / Electrochemical Society et al. | 2001
- 287
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Dendritic Growth of Electrodeposited Copper and Tin in Well Supported SolutionBarkey, D. / Electrochemical Society et al. | 2001
- 288
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Epitaxial Growth to Thin Films Formation of Cu~2O by ElectrodepositionLee, J. / Janakiraman, U. / Noh, T.-G. / Tak, Y. / Electrochemical Society et al. | 2001
- 289
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Fabrication of Uniform Magnetic Nanoparticles in Ordered Aluminum Oxide TemplatesSun, M. / Zangari, G. / Metzger, R. / Electrochemical Society et al. | 2001
- 290
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In situ Simultaneous Electrochemical and Optical Measurements for Characterization of CaCO~3 ElectrodepositCachet, H. / Devos, O. / Folcher, G. / Gabrielli, C. / Perrot, H. / Tribollet, B. / Electrochemical Society et al. | 2001
- 291
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Effects of Organic Additives on Morphological Evolution of Electrodeposited Au and Au AlloysBozzini, B. / Cavallotti, P. L. / Giovannelli, G. / Electrochemical Society et al. | 2001
- 292
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Electroless Formation of Gold Deposits under Organized MonolayersRavaine, S. / Saliba, R. / Mingotaud, C. / Argoul, F. / Electrochemical Society et al. | 2001
- 293
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Spatially Coupled Bipolar Electrodeposition in Thin-Layer Cells under Periodic Voltage ControlD Angelo, V. / Marshall, G. / Bradley, J.-C. / Molina, F. V. / Gonzalez, G. / Iemmi, C. / Babu, S. / Electrochemical Society et al. | 2001
- 294
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Morphology of Electrodeposited Palladium on Graphite Powder under Pulsed Bipolar ConditionsBradley, J.-C. / Babu, S. / Mittal, A. / Ndungu, P. / Carroll, B. / Samuel, B. / Electrochemical Society et al. | 2001
- 295
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Formation of Nanostructured Copper Filaments in Electrochemical DepositionWang, M. / Zhong, S. / Yin, X.-B. / Zhu, J.-M. / Peng, R.-W. / Wang, Y. / Ming, N.-B. / Electrochemical Society et al. | 2001
- 296
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Proposal for a New Theory of Structure Control of Electrodeposited FilmsWatanabe, T. / Electrochemical Society et al. | 2001
- 297
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Microstructural Study of Gradient Copper- Alumina Films Electrocodeposited Using a Rotating Cylinder ElectrodeWang, D. / Talbot, J. / Electrochemical Society et al. | 2001
- 298
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Morphology of CdTe Electrodeposited from Ammoniacal Basic Aqueous SolutionsMurase, K. / Hirato, T. / Awakura, Y. / Electrochemical Society et al. | 2001
- 299
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Effects for Process Conditions on Film Properties of Electrochemically Deposited Sn-Ag-Cu Solder AlloysKim, B. / Funk, M. / Ritzdorf, T. / Electrochemical Society et al. | 2001
- 300
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Structure and Morphology of Manganese ElectrodepositsGong, J. / Zangari, G. / Electrochemical Society et al. | 2001
- 301
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Soft, High Moment Fe-Co-Ni Alloys Electroplated by Pulsed-Current MethodLiu, X. / Zangari, G. / Electrochemical Society et al. | 2001
- 302
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Morphology and the Electrochemical Properties of Electrochemically Synthesized Binary Oxides Systems - Promising Cathode Materials for Lithium Chemical Power SourcesShembel, E. / Nagirny, V. / Apostolova, R. / Lytvyn, P. / Kwasha, A. / Novak, P. / Electrochemical Society et al. | 2001
- 303
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Time Effect on FeNi Thin Films Deposited by Electroless Polyol MethodYin, H. / Chow, G. M. / Electrochemical Society et al. | 2001
- 304
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A Superfilling Model that Predicts Bump FormationWest, A. / Mayer, S. / Reid, J. / Electrochemical Society et al. | 2001
- 305
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Integrated Multiscale Simulation of Copper Electrochemical Deposition ProcessesBloomfield, M. / Jansen, K. / Cale, T. / Electrochemical Society et al. | 2001
- 306
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A Computationally Efficient Feature Scale Model and Experimental Study for Copper Electrodeposition in the Presence of AdditivesKim, G.-S. / Merchant, T. / D Urso, J. / Jensen, K. / Electrochemical Society et al. | 2001
- 307
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Electrochemical Deposition of Copper on Non-metallic Substrates for ULSI ApplicationsShaw, M. / Duquette, D. / Electrochemical Society et al. | 2001
- 308
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Investigation of the Effects of Byproduct Components in Cu Plating for Advanced Interconnect MetallizationKoh, L.-T. / You, G.-Z. / Li, C.-Y. / Foo, P.-D. / Electrochemical Society et al. | 2001
- 309
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Galvanostatic Method for Quantification of Organic Suppressor and Accelerator Additives in Acid Copper Plating BathsRoberston, P. / Fulton, D. / Tolmachev, Y. / Electrochemical Society et al. | 2001
- 310
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Copper Interconnection via Displacement Deposition atop Nitride Barrier Layer and Underneath Silicon SubstrateWu, Y. / Wang, Y.-Y. / Wan, C.-C. / Electrochemical Society et al. | 2001
- 311
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The Effects of Cleaning and Pre-treatment on the Electroless Copper DepositionOh, Y.-J. / Cung, C.-H. / Electrochemical Society et al. | 2001
- 312
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An Acid-Based Electroless Cu Deposition Process: Chemical Formulation, Film Characteristics and CMP PerformanceTseng, W.-T. / Lo, C.-H. / Lee, S.-C. / Electrochemical Society et al. | 2001
- 313
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Electrochemical Effects of Various Oxidants on Cu-CMP in Ammonia-Based SlurriesYen, S.-C. / Tsai, T.-H. / Electrochemical Society et al. | 2001
- 314
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Electrodeposition of Thermoelectric Materials for Quantum Cold Point CoolersGhoshal, U. / Cooper, E. / Andricacos, P. / Electrochemical Society et al. | 2001
- 315
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Integration of Thermoelectric Materials Onto SI Using Electrochemical Atomic Layer EpitaxyChen, Y. / Nicic, I. / Shannon, C. / Electrochemical Society et al. | 2001
- 316
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Electrodeposition of Au on Si(111): Towards Nanowire FormationAllongue, P. / Munford, M. / Pasa, A. / Electrochemical Society et al. | 2001
- 317
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Sub-Micron Pt Electrodes by Through-Mask PlatingSaenger, K. L. / Costrini, G. / Kotecki, D. E. / Kwietniak, K. T. / Andricacos, P. C. / Electrochemical Society et al. | 2001
- 318
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Hydrogen Peroxide Oxygen Precursor for Electrodeposition of Zinc OxidePauporte, T. / Lincot, D. / Electrochemical Society et al. | 2001
- 319
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Experimental Studies on Electrodeposition of CoFe AlloysXu, H. / Dinan, T. E. / Cooper, E. I. / Romankiw, L. T. / Miller, D. / Electrochemical Society et al. | 2001
- 320
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Effect of Cu Content and Cu Partial Current on GMR of Electrodeposited Co-Ni-Cu/Cu MultilayersNabiyouni, G. / Huo, S. / Roy, S. / Schwarzacher, W. / Electrochemical Society et al. | 2001
- 321
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Electrodeposition of Ferromagnetic Thin Films on Semiconductor SubstratesEvans, P. / Scheck, C. / Schad, R. / Zangari, G. / Electrochemical Society et al. | 2001
- 322
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Electrodeposition of Fe~3O~4 on Single Crystal Silicon SubstratesSorenson, T. / Nikoforov, M. / Switzer, J. / Electrochemical Society et al. | 2001
- 323
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Synthesis of Ternary Compounds on Ag(111) by Electrochemical ALEPezzatini, G. / Loglio, F. / Innocenti, M. / Forni, F. / Foresti, M. L. / Electrochemical Society et al. | 2001
- 324
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Progress in the Formation of Compound Semiconductors using Electrochemical Atomic Layer Epitaxy (EC-ALE)Flowers, B. / Wade, T. / Vaidyanathen, R. / Happek, U. / Stickney, J. / Electrochemical Society et al. | 2001
- 325
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Ion Transport Modelling in Realistic Thin-Layer ECD for Gravitoconvection Prevailing RegimesMarshall, G. / Dengra, S. / Arias, E. / Molina, F. V. / Vallieres, M. / Gonzalez, G. / Electrochemical Society et al. | 2001
- 326
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Failure Analysis by new Scanning Transmission Electron Microscope HD-2000Koguchi, M. / Isakozawa, S. / Iwaki, M. / Electrochemical Society et al. | 2001
- 327
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Electrodeposition of Strained-Layer SuperlatticesMoffat, T. / Electrochemical Society et al. | 2001
- 328
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Cu~xNi~1~-~x Alloy and Cu~xNi~1~-~x/Cu~yNi~1~-~y Multilayer Films by Pulse ElectrodepositionKazeminezhad, I. / Schwarzacher, W. / Electrochemical Society et al. | 2001
- 329
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Additive Effect in Electrodeposition of NanolayersPeter, L. / Kupay, Z. / Toth, J. / Bakonyi, I. / Electrochemical Society et al. | 2001
- 330
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Epitaxial Electrodeposition of Cu/Cu~2O Multilayers on Au(100) and Au(111)Liu, R. / Vertegel, A. / Switzer, J. / Electrochemical Society et al. | 2001
- 331
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Working Towards the Electrodeposition of Compound Semiconductor NanostructuresWade, T. / Happek, U. / Vaidyanathen, R. / Stickney, J. / Electrochemical Society et al. | 2001
- 332
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Epitaxial Electrodeposition of Zinc Oxide and Zinc Oxide Based Composite Materials on Gallium NItridePauporte, T. / Yoshida, T. / Lincot, D. / Electrochemical Society et al. | 2001
- 333
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Soft-Solution Electrochemical Processing (SSEP) for Oxide FilmsMatsumoto, Y. / Electrochemical Society et al. | 2001
- 334
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Electrodeposition of Ultrahin Magnetic Layers on Au(111) with Anisot-Ropic Magnetic PropertiesAllongue, P. / Gomes, C. I. / Gundel, A. / Schmidt, J. E. / Electrochemical Society et al. | 2001
- 335
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Electrochemical Epitaxial Growth of Pd Thin Layers on Au(111) and Au(100)Uosaki, K. / Naohara, H. / Ye, S. / Kondo, T. / Electrochemical Society et al. | 2001
- 336
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Characterization of the Ultrathin Layer of CdS Deposited on Ag(111) by Electrochemical Atomic Layer EpitaxyForesti, M. L. / Cecconi, T. / Forni, F. / Atrei, A. / Bardi, U. / Innocenti, M. / Loglio, F. / Rovida, G. / Electrochemical Society et al. | 2001
- 337
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Study of Co Electrodeposition on Ag Single-Crystal ElectrodesMarcu, D. / Hall, N. / Morin, S. / Electrochemical Society et al. | 2001
- 338
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Metal Monolayer Deposition by Replacement of Metal Adlayers on Electrode SurfaceBrankovic, S. / Adzic, R. / Wang, J. / Electrochemical Society et al. | 2001
- 339
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Deposition of MoS2 Nanostructures Using The Electrochemical/Chemical MethodNg, K. / Zach, M. / Penner, R. / Electrochemical Society et al. | 2001
- 340
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Growth of Low-Dimensional Phases Using Electrochemical Atomic Layer EpitaxyNicic, I. / Chen, Y. / Shannon, C. / Electrochemical Society et al. | 2001
- 341
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Template-Directed Electro- and Photoelectro- Synthesis of Semiconductor NanostructuresRajeshwar, K. / Chenthamarakshan, C. R. / de Tacconi, N. / Ming, Y. / Electrochemical Society et al. | 2001
- 342
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Selective High-Resolution Electrodeposition on Semiconductor Defect PatternsSchmuki, P. / Erickson, L. / Electrochemical Society et al. | 2001
- 343
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Ivestigations on Nanostructured Silicon OxideBloess, H. / Staikov, G. / Schultze, J. W. / Electrochemical Society et al. | 2001
- 344
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Electrodeposition of Nanometallic Cores from Monolayer-Protected Clusters using Reductive DesorptionCliffel, D. / Amin, P. / Murray, R. / Electrochemical Society et al. | 2001
- 345
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Spontaneous Potential Oscillations in the Cu(II)/Tartrate and Lactate Systems, Aspects of Mechanisms and Film DepositionLeopold, S. / Herranen, M. / Carlsson, J.-O. / Electrochemical Society et al. | 2001
- 346
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Nonlinear Processes in Electrodeposition of Copper Nanocomposites in Lactate Baths, a Confocal Raman StudyArgoul, F. / Arrayet, J. C. / Servant, L. / Electrochemical Society et al. | 2001
- 347
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Preparation of Magnetic Nanopowders by Pulsed Electrochemistry Combined with UltrasoundDelplancke, J.-L. / Guzman, M. / Dille, J. / Long, G. / Grandjean, F. / Electrochemical Society et al. | 2001
- 348
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Reconciling Nanoscale Structure and Ion Intercalation Behavior in Electrodeposited Nickel HexacyanoferrateJeerage, K. / Steen, W. / Yu, Q. / Jiang, S. / Schwartz, D. / Electrochemical Society et al. | 2001
- 349
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Room Temperature Synhesis of Nano-Sized Ferrite Particles from Aqueous SolutionAbe, M. / Nishimura, K. / Electrochemical Society et al. | 2001
- 350
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Ordered Nanostructures produced by the Thermodynamic to Kinetic Transition During Epitaxial Electrodeposition of Copper(I) Oxide onto Single-Crystal GoldKothari, H. / Vertegel, A. / Switzer, J. / Electrochemical Society et al. | 2001
- 351
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The Under Potential Deposition of Antimony on the Low Index Planes of CopperWard, L. / Stickney, J. / Electrochemical Society et al. | 2001
- 352
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Recent Advances in the Modeling of Underpotential Deposition and Related PhenomenaDel Popolo, M. G. / Gimenez, M. C. / Sanchez, C. / Dassie, S. A. / Rojas, M. I. / Leiva, E. P. M. / Electrochemical Society et al. | 2001
- 353
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Electrochemical, in Situ STM, and in Situ FTIR Studies of Anomalous Phosphate Adsorption Induced on Zn UPD at Au Electrodes in the Presence of HalidesAramata, A. / Takahashi, S. / Nakamura, M. / Habu, T. / Electrochemical Society et al. | 2001
- 354
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The Initial Stages of Pt Deposition on Au(hkl)Waibel, H.-F. / Kleinert, M. / Kolb, D. M. / Electrochemical Society et al. | 2001
- 355
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Nanostructuring of Cu Overlayers on Pt Single Crystal ElectrodesXiao, X. / Berenz, P. / Baltruschat, H. / Electrochemical Society et al. | 2001
- 356
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In situ Spectroscopy: From Highly Controlled Interfaces to Actual Operating DevicesScherson, D. A. / Electrochemical Society et al. | 2001
- 357
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Role of Surface States in Pb Electrodeposition on n-GeEhlers, C. / Staikov, G. / Schultze, J. W. / Electrochemical Society et al. | 2001
- 358
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Interaction of Water and Other Solvents with Bare and Cation-Modified Gold SurfacesGewirth, A. / Yamada, R. / Leung, T. Y. B. / Ikemiya, N. / Si, S. / Electrochemical Society et al. | 2001
- 359
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Sum Frequency Generation Study on Molecular Structure of Solid Surfaces Modified with Organic Molecular Layers in Electrolyte SolutionsUosaki, K. / Ye, S. / Nihonyanagi, S. / Miyamoto, D. / Fujishima, K. / Electrochemical Society et al. | 2001
- 360
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Self-Assembly of Benzenethiol on Au(111) and Au(322): A Comparative Study of Vacuum and Liquid Phase AdsorptionBarnes, C. / Electrochemical Society et al. | 2001
- 361
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New Probes of the Electrochemical Interface: "Atomic" EXAFS and Fano Resonances in X-ray Absorption SpectroscopyO Grady, W. / Ramaker, D. / Electrochemical Society et al. | 2001
- 362
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X-ray In Situ Studies of Semiconductor/Electrolyte InterfacesZegenhagen, J. / Electrochemical Society et al. | 2001
- 363
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The Application of the Quartz Microbalance for the Investigation of Primary Processes of ElectrodepositionBund, A. / Plieth, W. / Electrochemical Society et al. | 2001
- 364
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Dynamics of Metastable Nanoscale Island Growth and Dissolution at Electrochemical Interfaces by Time-Resolved STMHe, Y. / Borguet, E. / Electrochemical Society et al. | 2001
- 365
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Phase Field Modeling of ElectrodepositionGuyer, J. E. / Boettinger, W. J. / Warren, J. A. / Electrochemical Society et al. | 2001
- 366
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Impedance Spectroscopy of Copper Films Deposited Electrochemically on 5MHz Quartz OscillatorsKussner, T. / Wunsche, M. / Schumacher, R. / Electrochemical Society et al. | 2001
- 367
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Electrochemistry in the Presence of Convective Flow Generated by Acoustic Streaming from a Focudrd Ultrasonic SourceStefan, I. / Mo, Y. / Zanelli, C. / Scherson, D. / Electrochemical Society et al. | 2001
- 368
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Au Nanoparticle Nucleation and Growth on Si(111)Suni, I. / Srinivasan, R. / Tian, Y. / Electrochemical Society et al. | 2001
- 369
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Electrodeposition of Metal NanowiresZach, M. / Liu, H. / Penner, R. / Electrochemical Society et al. | 2001
- 370
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Galvanostatic Pulse Plating of Cu-Al Alloy from the Lewis Acidic Chloride-1-Ethyl-3-methylimidazolium Chloride MeltHussey, C. / Zhu, Q. / Electrochemical Society et al. | 2001
- 371
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In situ EC-STM studies at the interface electrode/electrolyte in molten saltsEndres, F. / Electrochemical Society et al. | 2001
- 372
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Dependence of Sub-micron Integrated Circuit Feature Superfilling on Cu Electrolyte and Additive PropertiesReid, J. / Electrochemical Society et al. | 2001
- 373
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Surface Microstructure and the Growth Form of Electrodeposited CopperBarkey, D. / Electrochemical Society et al. | 2001
- 374
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Superconformal Electrodeposition of Copper in 500-90 nm FeaturesMoffat, T. / Bonevich, J. / Huber, W. / Stanishevsky, A. / Kelly, D. / Stafford, G. / Josell, D. / Electrochemical Society et al. | 2001
- 375
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Effect of Some Organic Additives on the Copper Deposition onto Au(111)Petri, M. / Kolb, D. M. / Meyer, H. / Electrochemical Society et al. | 2001
- 376
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Kinetics and Transport in Gallium Nitride Epitaxial Lateral OvergrowthColtrin, M. / Mitchell, C. / Han, J. / Electrochemical Society et al. | 2001
- 377
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Reduction of Threading Dislocations and Residual Strain in GaN Grown by Molecular Beam Epitaxy using RF-Plasma Nitrogen on Sapphire SubstratesKishino, K. / Kikuchi, A. / Electrochemical Society et al. | 2001
- 378
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The Ammonia- MBE Approach for High Electron Mobility in GaN Epilayers and AlGaN/GaN HFET StructuresTang, H. / Webb, J. / Bardwell, J. / Electrochemical Society et al. | 2001
- 379
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Scanning Probe Studies of Defect Dominated Electronic Transport in GaNHsu, J. / Lang, D. / Richter, S. / Manfra, M. / Kleiman, R. / Pfeiffer, L. / Molnar, R. / Electrochemical Society et al. | 2001
- 380
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Defects in GaN Delineated by Chemical Etches and Resonant Optical ExcitationMorkoc, H. / Electrochemical Society et al. | 2001
- 381
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Surface Preparation and Oxide Growth for GaN MOSFETsGila, B. P. / Johnson, J. W. / Lee, K. N. / Krishnamoorthy, V. / Abernathy, C. R. / Ren, F. / Pearton, S. J. / Electrochemical Society et al. | 2001
- 382
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Magnetic and Structural Properties of GaMnN Mixed CrystalsGebicki, W. / Adamowicz, L. / Palczewska, M. / Zajac, M. / Szyszko, J. / Szczytko, T. / Podsiado, S. / Twardowski, A. / Electrochemical Society et al. | 2001
- 383
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Growth of Ga~1~-~xMn~xN Single CrystalsSlawomir, P. / Tomasz, S. / Leszek, A. / Wojciech, G. / Jaroslaw, D. / Electrochemical Society et al. | 2001
- 384
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GaN Production Transfer From Single Wafer Equipment to Planetary ReactorsSchineller, B. / Schoen, O. / Protzmann, H. / Luenenbuerger, M. / Alam, A. / Heuken, M. / Juergensen, H. / Electrochemical Society et al. | 2001
- 385
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A Photoelectrochemical Study of In~xGa~1~-~xN FilmsTheuwis, A. / Strubbe, K. / Gomes, W. / Electrochemical Society et al. | 2001
- 386
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Market Outlook and Product Performance Requirements for Nitride-Based LEDsAlexander, W. B. / Electrochemical Society et al. | 2001
- 387
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UV Digital Cameras Based on 32x32 and 128x128 Arrays of AlGaN p-i-n PhotodiodesSchetzina, J. F. / Brown, J. D. / Matthews, J. / Li, J. / Srinivasan, P. / Electrochemical Society et al. | 2001
- 388
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The Effect of Photo-Assist Chemical Wet Etching on Schottcky Contact for AlGaNFang, C. Y. / Chang, E. Y. / Huang, W. J. / Wong, J. S. / Lee, C. S. / Feng, M. S. / Electrochemical Society et al. | 2001
- 389
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Optical, Electrical, and Physical Characteristics of Ni/Au Metal Contacts to p-GaN for High Brightness LEDsAlexander, W. B. / Johnson, T. / Gutierrez, D. / Kidney, K. / Ren, F. / Zhang, A. / Laroche, J. / Holloway, P. / Liu, B. / Lambers, E. et al. | 2001
- 390
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New Metallization Scheme for Low Resistance Ohmic Contacts to P-Type GaNWang, S. C. / Electrochemical Society et al. | 2001
- 391
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Intersubband Absorption at Lambda to 1.55 mum in GaN/AlGaN Multiple Quantum WellsGmachl, C. / Ng, H. M. / Chu, S.-N. G. / Cho, A. Y. / Electrochemical Society et al. | 2001
- 392
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Ion Beam Damage Processes in GaNKucheyev, S. O. / Williams, J. S. / Zou, J. / Jagadish, C. / Bradby, J. E. / Li, G. / Electrochemical Society et al. | 2001
- 393
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High Performance Small Area Contact GaN/AlGaN HBTsLee, K.-P. / Zhang, A. P. / Ren, F. / Han, J. / Hobson, W. S. / Pearton, S. J. / Electrochemical Society et al. | 2001
- 394
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High-Breakdown Voltage Planar GaN and AlGaN Schottky RectifiersZhang, A. P. / Johnson, J. W. / Ren, F. / Lee, K. P. / Pearton, S. J. / Han, J. / Electrochemical Society et al. | 2001
- 395
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ULSI Process Integration for 2005 and BeyondIwai, H. / Ohmi, S.-I. / Electrochemical Society et al. | 2001
- 396
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Process Technologies for Sub-100-nm CMOS DevicesWakabayashi, H. / Ueki, M. / Uejima, K. / Fukai, T. / Togo, M. / Yamamoto, T. / Takeuchi, K. / Mogami, T. / Narihiro, M. / Ochiai, Y. et al. | 2001
- 397
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Directions of Future Memory TechnologyPark, J. W. / Electrochemical Society et al. | 2001
- 398
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Future Prospects for sub. 100 nm LithographyIshitani, A. / Electrochemical Society et al. | 2001
- 399
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The Scaling Issues of COB Stack DRAM Cell Technology and Its Directions for Beyond 100 nm Technology NodeKim, K. / Electrochemical Society et al. | 2001
- 400
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Process Integration of In Situ Doped PolySilicon for ULSI TechnologiesPing, E.-X. / Electrochemical Society et al. | 2001
- 401
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Quantum Mechanical Narrow Channel Effect in Nano-Scale MOSFETsHiramoto, T. / Majima, H. / Electrochemical Society et al. | 2001
- 402
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Review of the FeRAM Process Integration: Issues and ProblemsKang, N. S. / Electrochemical Society et al. | 2001
- 403
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Copper and Low-k Dielectric Integration ChallengesRyan, J. G. / Anand, M. B. / Biery, G. / Davis, C. / Duncombe, P. / Edelstein, D. / Gates, S. / Greco, S. / Hedrick, J. / Jones, P. et al. | 2001
- 404
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Three-Dimensional Integration with Copper Wafer BondingReif, R. / Fan, A. / Electrochemical Society et al. | 2001
- 405
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Ultra-Shallow Junction Formation by Atomic Layer DopingKoyanagi, M. / Electrochemical Society et al. | 2001
- 406
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Silicon Germanium Trends on Process IntegrationKasper, E. / Electrochemical Society et al. | 2001
- 407
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SiGe HBT/CMOS Technology for RF and High-Speed Digital ApplicationsWashio, K. / Electrochemical Society et al. | 2001
- 408
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Modular, High-Performance BiCMOS by Integration of SiGe:C HBTsKnoll, D. / Heinemann, B. / Ehwald, K.-E. / Ricker, H. / Tillack, B. / Osten, H.-J. / Electrochemical Society et al. | 2001
- 409
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Fabrication of High Quality MOS Structures with SiGe Buried Channels for CMOS ApplicationsKar, S. / Zaumseil, P. / Electrochemical Society et al. | 2001
- 410
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Threshold Voltage Stability of P-Channel MOSFETs With Heavily Boron Doped SiGeC Gate LayersStewart, E. / Carroll, M. / Sturm, J. C. / Electrochemical Society et al. | 2001
- 411
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Integration Issues in Silicon-Based ICs for Telecommunication ApplicationsFreeman, G. / Electrochemical Society et al. | 2001
- 412
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Low Frequency Noise in Si~1~-~xGe~x-Channel pMOSFETsTsuchiya, T. / Matsuura, T. / Murota, J. / Electrochemical Society et al. | 2001
- 413
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Parasitic Channel in SiGe Heterojunction p-MOSFET'sHara, Y. / Inoue, A. / Takagi, T. / Kanzawa, Y. / Kubo, M. / Electrochemical Society et al. | 2001
- 414
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The Gate Stack / Shallow Junction Challenge for Sub-100 nm Technology Generations: Gate Stack EmphasisHuff, H. R. / Brown, G. A. / Larson, L. A. / Electrochemical Society et al. | 2001
- 415
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Process Integration for DRAM Cell Transistor OptimizationLee, S. / Park, S. / Kim, I. / Electrochemical Society et al. | 2001
- 416
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Vertical Pass Transistor Integration for Future DRAMDivakaruni, R. / Bronner, G. / Electrochemical Society et al. | 2001
- 417
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Improved Device Scaling & Process Simplification Through Advanced Ion Implantation TechniquesBorland, J. / Electrochemical Society et al. | 2001
- 418
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Transistor Design Methodology For Low Power CMOS MicroprocessorsBuller, J. / Cheek, J. / Wristers, D. / Electrochemical Society et al. | 2001
- 419
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L-Shape Spacer Architecture for Low Cost, High Performance CMOSAugendre, E. / Perello, C. / Vandamme, E. / Pochet, S. / Rooyackers, R. / Beckx, S. / De Potter, M. / Lauwers, A. / Badenes, G. / Electrochemical Society et al. | 2001
- 420
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Impact of Indium and Boron interaction on Short Channel and Reverse Short Channel Effects for nMOSFETsOng, S. Y. / Chor, E. F. / Lee, J. / Leung, Y. K. / See, A. / Chan, L. / Electrochemical Society et al. | 2001
- 421
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Enhanced Short-Channel Effects of sub-50 nm Gate Length MOSFETs with High-k Gate Insulator FilmsFujimura, R. / Takeda, M. / Sato, K. / Ohmi, S.-I. / Ishiwara, H. / Iwai, H. / Electrochemical Society et al. | 2001
- 422
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Side-Wall Protection by B in P-Doped Polysilicon in Gate EtchingSeino, T. / Fukuchi, A. / Matsuura, T. / Murota, J. / Electrochemical Society et al. | 2001
- 423
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Impact of Metallic Impurities on Integrity of Ultra-Thin Gate Oxides and Gettering in Advanced Si WafersKoveshnikov, S. / Beauchaine, D. / Gonzalez, F. / Electrochemical Society et al. | 2001
- 424
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Thermally Induced Dislocation and Slip Defects in SiliconCho, C.-R. / Kim, Y. S. / Lee, J. K. / Ko, S. W. / Noh, K. Y. / Choi, D. J. / Kim, D. H. / Son, C. B. / Cho, D. H. / Choi, J. J. et al. | 2001
- 425
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Process-Induced Defects and Diode Leakage in ULSI FEOL IntegrationParekh, K. / Mouli, C. / Hermes, M. / Gonzalez, F. / Electrochemical Society et al. | 2001
- 426
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Reduction of Substrate Leakage Current by Minimizing Trench-Isolation-Induced StressMiura, H. / Ishitsuka, N. / Suzuki, N. / Ohyu, K. / Ikeda, S. / Electrochemical Society et al. | 2001
- 427
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Plasma-Induced Damage Reduction by Spin-on Low-k Dielectrics ProcessMatsunaga, N. / Yoshinari, H. / Yamada, N. / Shibata, H. / Electrochemical Society et al. | 2001
- 428
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Evolution of the Metallization Concepts for Applications in the Integrated CircuitsMurarka, S. P. / Electrochemical Society et al. | 2001
- 429
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Silicon-Based Technologies for WirelessOurmazd, A. / Electrochemical Society et al. | 2001
- 430
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Practical Roadmap and Approach of Multi-level Interconnect Technology for Realizing Over-GHz-Age System-On-ChipShibata, H. / Electrochemical Society et al. | 2001
- 431
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Electromigration Failure Modes in Cu MetallizationGall, M. / Capasso, C. / Kawasaki, H. / Thrasher, S. / Zhao, L. / Herrick, M. / Electrochemical Society et al. | 2001
- 432
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High Density 0.16 mum Merged DRAM/Logic Technology for System-on-a-ChipTanaka, H. / Ida, J. / Takeda, M. / Shinohara, H. / Seo, E. / Kita, A. / Yokoyama, F. / Electrochemical Society et al. | 2001
- 433
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Back-end Process Integration for Logic LSISaito, S. / Electrochemical Society et al. | 2001
- 434
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Low Resistivity Contact Materials for ULSI Applications and Matal/Semiconductor InterfacesZaima, S. / Yasua, Y. / Electrochemical Society et al. | 2001
- 435
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A Manufacturing Process Technology for 0.16 mum Embedded DRAM with High Logic Speed and Small DRAM CellLee, J. H. / Oh, T. S. / Jeong, Y. S. / Kim, J. B. / Chi, S. Y. / Huh, E. M. / Jeon, S. D. / Jang, M. G. / Lee, D. H. / Electrochemical Society et al. | 2001
- 436
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MOS Transistor Scaling ChallengesBohr, M. / Electrochemical Society et al. | 2001
- 437
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Embedded DRAM and SOI Integration IssuesIyer, S. S. K. / Sadana, D. K. / Ho, H. L. / Iyer, S. S. / Electrochemical Society et al. | 2001
- 438
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SOI for Logic and Memory ApplicationsSadana, D. K. / Electrochemical Society et al. | 2001
- 439
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Sub-25 mum Device ChallengesWoo, J. / Electrochemical Society et al. | 2001
- 440
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Some Manufacturing Techniques for Thin Film SOIWittkower, A. / Maleville, C. / Barge, T. / Auberton-Herve, A.-J. / Electrochemical Society et al. | 2001
- 441
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Technologies for Large-Area Electronics on Deformable SubstratesSturm, J. C. / Hsu, P. I. / Huang, M. / Gleskova, H. / Wu, M. / Bhattacharya, R. / Miller, S. / Darhuber, A. / Wagner, S. / Suo, Z. et al. | 2001
- 442
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Interface Technology for Advanced Gate DielectricsNiwa, M. / Harada, Y. / Eriguchi, K. / Kwong, D.-L. / Electrochemical Society et al. | 2001
- 443
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Characterization of Traps in ONO Films for MONOS Nonvolatile MemoryAozasa, H. / Fujiwara, I. / Nomoto, K. / Tanaka, S. / Kobayashi, T. / Electrochemical Society et al. | 2001
- 444
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Optimisation of Active Area Edge Protection in Shallow Trench IsolationAugendre, E. / Rooyackers, R. / Pochet, S. / Grau, L. / Sleeckx, E. / Vandamme, E. / Badenes, G. / Electrochemical Society et al. | 2001
- 445
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A Study on the Microstructures and Electrical Properties of ZrO~2 Thin FilmsNam, S.-W. / Yoo, J.-H. / Kim, H.-Y. / Ko, D.-H. / Yang, C.-W. / Electrochemical Society et al. | 2001
- 446
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Diffusion Barrier Performance of CVD-Grown TiSiN FilmsAnjum, D. / Oktyabrsky, S. / Eisenbraun, E. / Kaloyeros, A. / Electrochemical Society et al. | 2001
- 447
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Ni Salicide Technology for Deep Sub-Quarter Micron TransistorChoi, C.-J. / Ku, J.-H. / Choi, S. / Fujihara, K. / Kang, H.-K. / Moon, J.-T. / Choi, H.-J. / Ko, D.-H. / Electrochemical Society et al. | 2001
- 448
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Formation and Properties of Co-Silicide by Using Co~1~-~xTa~x AlloyKim, M.-J. / Ko, D.-H. / Lee, D.-H. / Ku, J.-H. / Choi, S. / Fujihara, K. / Kang, H.-K. / Lee, H.-J. / Electrochemical Society et al. | 2001
- 449
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The Physical and Electrical Properties of Poly Si~1~-~x Ge~x as a Gate Electrode MaterialsKang, S.-K. / Ko, D.-H. / Ahn, T.-H. / Joo, M.-S. / Yeo, I.-S. / Whoang, S.-J. / Yang, D.-Y. / Whang, C.-J. / Lee, H.-J. / Electrochemical Society et al. | 2001
- 450
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A Study of the Solid Phase Reaction and Thermal Stability in the Ni-S~1~-~x System Using Rapid Thermal Annealing (RTA) ProcessChoi, H.-J. / Ko, D.-H. / Kim, H.-Y. / Lee, D.-H. / Ku, J.-H. / Choi, C.-J. / Choi, S. / Fujihara, K. / Kang, H. K. / Yang, C.-W. et al. | 2001
- 451
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Growth and Characterization of InAs and InSb Quantum Dot Superlattices in Ternary Alloy Matrices: Toward an Optimized Strain-Balanced Quantum Dot DetectorLeavitt, R. / Little, J. / Electrochemical Society et al. | 2001
- 452
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GaInNP: A Novel Material for Device ApplicationsTu, C. W. / Hong, Y. G. / Xin, H. P. / Andre, R. / Electrochemical Society et al. | 2001
- 453
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Extended Defects and Electrical Properties in MOVPE-Grown GaNTwigg, M. E. / Wickenden, A. E. / Koleske, D. D. / Henry, R. L. / Fatemi, M. / Culbertson, J. C. / Freitas, J. A. / Binari, S. / Electrochemical Society et al. | 2001
- 454
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The Mechanism of Photoenhanced Wet Etching of GaNBardwell, J. / Tang, H. / Webb, J. / Fraser, J. / Moisa, S. / Electrochemical Society et al. | 2001
- 455
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Characteristics of InP in KOH and (NH~4)~2S Solutions under Anodic ConditionsHarvey, E. / O Dwyer, C. / Melly, T. / Buckley, N. / Electrochemical Society et al. | 2001
- 456
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Self-Assembly of Phosphonate-based Monolayers on GaAs and GaNHughes, C. / Koh, S. / Polefrone, J. / Augustine, B. / Electrochemical Society et al. | 2001
- 457
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Decomposition of InP and Growth of Indium Islands in Systems with H-atomsGorbenko, V. / Shvets, J. / Gorban, A. / Electrochemical Society et al. | 2001
- 458
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Electroluminescence Characterization of Base Layers with In and N Incorporation in InGaP/InGaAsN HBTsFitch, R. / Schuermeyer, F. / Welser, R. / Jenkins, T. / Dettmer, R. / Gillespie, J. / Sewell, J. / Nakano, K. / Bozada, C. / Via, D. et al. | 2001
- 459
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p-Ohmic Contact Study for Intra-Cavity Contacts in AlGaAs/GaAs VCSELsLuo, B. / Dang, G. / Lopata, J. / Chu, S. N. G. / Hobson, W. S. / Chirovsky, L. M. F. / Ren, F. / Pearton, S. J. / Electrochemical Society et al. | 2001
- 460
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Effects of N~2 or Ar Plasma Exposure on GaAs/AlGaAs Heterojunction Bipolar TransistorsHsu, C. H. / Chen, C. C. / Luo, B. / Dang, G. / Ren, F. / Pearton, S. J. / Abernathy, C. R. / Lee, J. W. / Mackenzie, K. D. / Sasserath, J. et al. | 2001
- 461
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Study of Radiation Induced Resistance Mechanisms in GaAs MESFET and TLM StructuresLuo, B. / Schoenfeld, D. / Ren, F. / Electrochemical Society et al. | 2001
- 462
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Electrical Properties of InAlP Native Oxides for GaAs-Based MOS ApplicationsBarrios, P. / Hall, D. / Snider, G. / Chowdhury, U. / Dupuis, R. / Electrochemical Society et al. | 2001
- 463
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Performance of Intra-Cavity Contacted, Shallow Implant Apertured Vertical-Cavity Surface Emitting LasersHobson, W. S. / Lopata, J. / Dang, G. / Chirovsky, L. M. F. / Chu, S. N. G. / Tayahi, M. / Ren, F. / Pearton, S. J. / Electrochemical Society et al. | 2001
- 464
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Progress on Vertical-Cavity Surface-Emitting LasersSerkland, D. K. / Choquette, K. D. / Hadley, G. R. / Fischer, A. J. / Geib, K. M. / Allerman, A. A. / Electrochemical Society et al. | 2001
- 465
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High-Performance Back-Illuminated Solar-Blind AlGaN Photodetectors Grown by Metalorganic Chemical Vapor DepositionLambert, D. J. H. / Yang, B. / Li, T. / Collins, C. J. / Wong, M. M. / Chowdhury, U. / Campbell, J. C. / Dupuis, R. D. / Electrochemical Society et al. | 2001
- 466
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Asymmetry in MSM Detector/Mixer and Its Implication in FM/cw Ladar SystemsShen, P. H. / Stead, M. / Ruff, W. / Stann, B. / Uppal, P. / Electrochemical Society et al. | 2001
- 467
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Design Optimization of InGaAsN-based Pnp Heterojunction Bipolar Transistors for Low-Power ApplicationsMonier, C. / Chang, P. C. / Baca, A. G. / Li, N. Y. / Laroche, J. R. / Hou, H. Q. / Ren, F. / Pearton, S. J. / Electrochemical Society et al. | 2001
- 468
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Orientation and Dielectric Overlayer Effects in InGaP/GaAs HBTsBaca, A. / Monier, C. / Chang, P.-C. / Armendariz, M. / Briggs, R. / Pearton, S. / Electrochemical Society et al. | 2001
- 469
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2.4-V Operated Enhancement-Mode Pseudomorphic HEMT's for Wireless CommunicationsChang, E. Y. / Chen, S. H. / Wang, S. P. / Electrochemical Society et al. | 2001
- 470
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Ultimate SOI TransistorsTaur, Y. / Electrochemical Society et al. | 2001
- 471
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Silicon on Nothing (SON) Fabrication, Material and DevicesSkotnicki, T. / Electrochemical Society et al. | 2001
- 472
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Single Electron Transistors and Other Nanodevices on SOIHiramoto, T. / Takahashi, N. / Ishikuro, H. / Saitoh, M. / Electrochemical Society et al. | 2001
- 473
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Variants on Bonded SOI for Advanced ICsGamble, H. / Electrochemical Society et al. | 2001
- 474
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Ion Beam Synthesis of SiC on Insulator StructuresChristophe, S. / Alejandro, P.-R. / Albert, R.-R. / Ramon, M. J. / Jaume, E. / Cruz, A. M. / Dieter, P. / Reinhard, K. / Wolfgang, S. / Electrochemical Society et al. | 2001
- 475
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Relaxed SiGe On Insulator Fabricated via Wafer Bonding and Layer Transfer: Etch-back and Smart-cut AlternativesTaraschi, G. / Cheng, Z.-Y. / Currie, M. T. / Leitz, C. W. / Langdo, T. A. / Lee, M. L. / Pitera, A. / Fitzgerald, E. A. / Antoniadis, D. A. / Hoyt, J. L. et al. | 2001
- 476
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Recent Advances in SOS Material and DevicesMoriyasu, Y. / Morishita, T. / Matsui, M. / Yasujima, A. / Electrochemical Society et al. | 2001
- 477
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From SOI to SOIM technology: Application for specific semiconductor processesRayssac, O. / Moriceau, H. / Olivier, M. / Stoimenos, I. / Cartier, A. M. / Aspar, B. / Electrochemical Society et al. | 2001
- 478
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Volume Production in ELTRAN SOI-Epi WafersIsaj, H. / Nakayama, J. / Yonehara, T. / Electrochemical Society et al. | 2001
- 479
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The BELPHI-SOI TechnologyAmato, G. / Boarino, L. / Rossi, A. M. / Borini, S. / Lulli, G. / Parisini, A. / Electrochemical Society et al. | 2001
- 480
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Electrolytic Hydrogenation of Buried Preamorphized Layer in Silicon for SOI Wafer ProcessUsenko, A. / Carr, W. / Electrochemical Society et al. | 2001
- 481
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Silicon on Insulator Materials Created by Microwave HybridLee, T. H. / Lin, J. / Peng, J. / Electrochemical Society et al. | 2001
- 482
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Atomic-Layer Cleaving for SOI Wafer Fabrication and a Path Towards Laminated ElectronicsCurrent, M. I. / Malik, I. J. / Bedell, S. W. / Kirk, H. / Korolik, M. / Kang, S. / Henley, F. J. / Electrochemical Society et al. | 2001
- 483
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Defects and Strain in Hydrogen and Helium Co-Implanted SiliconDuo, X. / Liu, W. / Zhang, M. / Wang, S. X. / Wang, L. M. / Lin, C. / Electrochemical Society et al. | 2001
- 484
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Non-deatructive Impulsive Stimulated Thermal Scattering (ISTS) Analysis of SOI defects in SIMOXAnc, M. J. / Gostein, M. / Banet, M. / Allen, L. P. / Electrochemical Society et al. | 2001
- 485
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Detection of SOI Fatal Defects by Cu Decoration in Conjunction with HF ImmersionNotsu, K. / Honma, N. / Yonehara, T. / Electrochemical Society et al. | 2001
- 486
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Analysis of Microstructural Properties of SIMOX Wafers with PhotoluminescenceHiggs, V. / Anc, M. J. / Electrochemical Society et al. | 2001
- 487
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Monte Carlo Simulation of Transport in Silicon-on-Insulator Inversion LayersGamiz, F. / Electrochemical Society et al. | 2001
- 488
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Study of Self-Heating Effect on Device Performance of Sub-0.1 mum SOI MOSFETs Including Velocity OvershootKawanaka, S. / Matsuzawa, K. / Inoh, K. / Katsumata, Y. / Yoshimi, M. / Ishiuchi, H. / Electrochemical Society et al. | 2001
- 489
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Analysis of Non-Stationary Transport and Quantum Effects in Realistic 0.1 mum Partially-Depleted SOI TechnologyMunteanu, D. / Lecarval, G. / Fenouillet-Beranger, C. / Electrochemical Society et al. | 2001
- 490
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Modeling Short-Channel Effects in SOI MOSFETsMonroe, D. / Oh, S.-H. / Hergenrother, J. M. / Electrochemical Society et al. | 2001
- 491
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A Simulation Study of Partially Depleted SOI MOSFETsGritsch, M. / Kosina, H. / Grasser, T. / Selberherr, S. / Electrochemical Society et al. | 2001
- 492
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A New Fully-Depleted SOI MOSFET Macro-Model Valid from DC to RFIniguez, B. / Raskin, J.-P. / Deme s, L. / NEve, A. / Goffioul, M. / Simon, P. / Vanhoenacker, D. / Flandre, D. / Electrochemical Society et al. | 2001
- 493
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Electrical Properties of Metal-Buried Oxide-Silicon Structures Fabricated by Low Dose SIMOX ProcessDimitrakis, P. / Papaioannou, G. / Cristoloveanu, S. / Electrochemical Society et al. | 2001
- 494
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Extraction of the Oxide Charge Density at Front and Back Interfaces of SOI nMOSFETs DevicesNicolett, A. S. / Martino, J. A. / Simoen, E. / Claeys, C. / Electrochemical Society et al. | 2001
- 495
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MOSFFET Based "Gated-Diode" Characterization of the Buried Oxide Interface of Irradiated and non-Irradiated SIMOX and UNIBOND WafersIoannou, D. / Electrochemical Society et al. | 2001
- 496
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Measurements of Low Field Mobility in Ultre-Thin SOI n- and p-MosfetsMastrapasqua, M. / Esseni, D. / Celler, G. K. / Baumann, F. H. / Fiegna, C. / Selmi, L. / Sangiorgi, E. / Electrochemical Society et al. | 2001
- 497
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Electrical Characterization of Bonded SOI with Hg-contact "Horseshoe" Probes and InGa-contact iH-FETi StructuresKirk, H. / Bedell, S. / Current, M. / Electrochemical Society et al. | 2001
- 498
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Charge Injection Characterization of Thin-Film SOI MOS Transistors at High TemperaturePicun, G. / Demeus, L. / Flandre, D. / Electrochemical Society et al. | 2001
- 499
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Total Dose Radiation Response of 0.25 Micron SOI PD CMOS TransistorsLiu, M. / Jenkins, W. / Barge, T. / Electrochemical Society et al. | 2001
- 500
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Cryogenic Operation of Fully-Depleted SOI nFETsLi, Y. / Cressler, J. D. / Niu, G. / Patel, J. / Electrochemical Society et al. | 2001