Effect of Gate Metal on Reliability of Metamorphic HEMTS (Englisch)
- Neue Suche nach: Dammann, M.
- Neue Suche nach: Leuther, A.
- Neue Suche nach: Konstanzer, H.
- Neue Suche nach: Jantz, W.
- Neue Suche nach: Dammann, M.
- Neue Suche nach: Leuther, A.
- Neue Suche nach: Konstanzer, H.
- Neue Suche nach: Jantz, W.
In:
Gallium arsenide reliability workshop; GaAs reliability workshop
;
87-88
;
2001
-
ISBN:
- Aufsatz (Konferenz) / Print
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Titel:Effect of Gate Metal on Reliability of Metamorphic HEMTS
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Beteiligte:Dammann, M. ( Autor:in ) / Leuther, A. ( Autor:in ) / Konstanzer, H. ( Autor:in ) / Jantz, W. ( Autor:in )
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Kongress:Gallium arsenide reliability workshop; GaAs reliability workshop ; 2001 ; Baltimore, MD
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Erschienen in:GAAS RELIABILITY WORKSHOP ; 87-88
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Verlag:
- Neue Suche nach: JEDEC Solid State Technology Association
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Erscheinungsdatum:01.01.2001
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Format / Umfang:2 pages
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Anmerkungen:IEEE cat no 01TH8602
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ISBN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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- i
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2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602)| 2001