Improving 351-nm damage performance of large-aperture fused silica and DKDP optics [4679-53] (Englisch)
- Neue Suche nach: Burnham, A. K.
- Neue Suche nach: Hackel, L. A.
- Neue Suche nach: Wegner, P. J.
- Neue Suche nach: Parham, T. G.
- Neue Suche nach: Hrubesh, L. W.
- Neue Suche nach: Penetrante, B. M.
- Neue Suche nach: Whitman, P. K.
- Neue Suche nach: Demos, S. G.
- Neue Suche nach: Menapace, J. A.
- Neue Suche nach: Runkel, M.
- Neue Suche nach: SPIE
- Neue Suche nach: Burnham, A. K.
- Neue Suche nach: Hackel, L. A.
- Neue Suche nach: Wegner, P. J.
- Neue Suche nach: Parham, T. G.
- Neue Suche nach: Hrubesh, L. W.
- Neue Suche nach: Penetrante, B. M.
- Neue Suche nach: Whitman, P. K.
- Neue Suche nach: Demos, S. G.
- Neue Suche nach: Menapace, J. A.
- Neue Suche nach: Runkel, M.
- Neue Suche nach: Exarhos, G. J.
- Neue Suche nach: SPIE
In:
Optical materials for high-power lasers; Laser-induced damage in optical materials
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173-185
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2002
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Improving 351-nm damage performance of large-aperture fused silica and DKDP optics [4679-53]
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Beteiligte:Burnham, A. K. ( Autor:in ) / Hackel, L. A. ( Autor:in ) / Wegner, P. J. ( Autor:in ) / Parham, T. G. ( Autor:in ) / Hrubesh, L. W. ( Autor:in ) / Penetrante, B. M. ( Autor:in ) / Whitman, P. K. ( Autor:in ) / Demos, S. G. ( Autor:in ) / Menapace, J. A. ( Autor:in ) / Runkel, M. ( Autor:in )
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Kongress:Symposium; 33rd, Optical materials for high-power lasers; Laser-induced damage in optical materials ; 2001 ; Boulder, CO
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4679 ; 173-185
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.2002
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Format / Umfang:13 pages
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Anmerkungen:Also known as 33rd Annual Boulder Damage Symposium
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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LIGO optics: initial and advancedCamp, Jordan / Billingsley, GariLynn / Kells, William P. / Lazzarini, Albert / Sanders, Gary H. / Whitcomb, Stanley L. / Alexandrovski, A. / Fejer, Martin M. / Gustafson, Eric K. / Route, Roger K. et al. | 2002
- 1
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LIGO optics: initial and advanced (Invited Paper) [4679-03]Camp, J. B. / Billingsley, G. / Kells, W. P. / Lazzarini, A. / Sanders, G. H. / Whitcomb, S. / Alexandrovski, A. / Fejer, M. M. / Gustafson, E. K. / Route, R. K. et al. | 2002
- 17
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Initiation identification in fused-silica 35-nm opticsWall, Mark A. / Plitzko, J. / Fluss, Michael J. et al. | 2002
- 17
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Initiation identification in fused-silica 35-nm optics [4679-64]Wall, M. A. / Plitzko, J. / Fluss, M. J. / SPIE et al. | 2002
- 23
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Methods for mitigating surface damage growth in NIF final optics [4679-63]Hrubesh, L. W. / Norton, M. A. / Molander, W. A. / Donohue, E. E. / Maricle, S. M. / Penetrante, B. M. / Brusasco, R. M. / Grundler, W. / Butler, J. A. / Carr, J. W. et al. | 2002
- 23
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Methods for mitigating surface damage growth in NIF final opticsHrubesh, Lawrence W. / Norton, Mary A. / Molander, William A. / Donohue, Eugene E. / Maricle, Stephen M. / Penetrante, Bernie / Brusasco, Raymond M. / Grundler, Walter / Butler, Jim A. / Carr, Jeff et al. | 2002
- 34
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CO~2-laser polishing for reductoin of 351-nm surface damage initiation in fused silica [4679-60]Brusasco, R. M. / Penetrante, B. M. / Butler, J. A. / Maricle, S. M. / Peterson, J. E. / SPIE et al. | 2002
- 34
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CO2-laser polishing for reductoin of 351-nm surface damage initiation in fused silicaBrusasco, Raymond M. / Penetrante, Bernie M. / Butler, Jim A. / Maricle, Stephen M. / Peterson, John et al. | 2002
- 40
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Localized CO~2-laser treatment for mitigation of 351-nm damage growth in fused silica [4679-52]Brusasco, R. M. / Penetrante, B. M. / Butler, J. A. / Hrubesh, L. W. / SPIE et al. | 2002
- 40
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Localized CO2-laser treatment for mitigation of 351-nm damage growth in fused silicaBrusasco, Raymond M. / Penetrante, Bernie / Butler, Jim A. / Hrubesh, Lawrence W. et al. | 2002
- 48
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UV-laser conditioning for reduction of 351-nm damage initiation in fused silicaBrusasco, Raymond M. / Penetrante, Bernie M. / Peterson, John E. / Maricle, Stephen M. / Menapace, Joseph A. et al. | 2002
- 48
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UV-laser conditioning for reduction of 351-nm damage initiation in fused silica [4679-59]Brusasco, R. M. / Penetrante, B. M. / Peterson, J. E. / Maricle, S. M. / Menapace, J. A. / SPIE et al. | 2002
- 56
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Combined advanced finishing and UV-laser conditioning for producing UV-damage-resistant fused-silica opticsMenapace, Joseph A. / Penetrante, Bernie / Golini, Donald / Slomba, Albert F. / Miller, Philip E. / Parham, Thomas G. / Nichols, Mike / Peterson, John et al. | 2002
- 56
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Combined advanced finishing and UV-laser conditioning for producing UV-damage-resistant fused-silica optics [4679-65]Menapace, J. A. / Penetrante, B. M. / Golini, D. / Slomba, A. F. / Miller, P. E. / Parham, T. G. / Nichols, M. / Peterson, J. E. / SPIE et al. | 2002
- 69
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Excimer-laser-induced photochemical polishing of SiC mirror [4679-31]Murahara, M. M. / SPIE et al. | 2002
- 69
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Excimer-laser-induced photochemical polishing of SiC mirrorMurahara, Masataka M. et al. | 2002
- 75
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Influence of glass surface layers on laser-induced damage thresholdGu, Zhengtian / Liang, Peihui / Zhang, Weiqing et al. | 2002
- 75
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Influence of glass surface layers on laser-induced damage threshold [4679-45]Gu, Z. / Liang, P. / Zhang, W. / SPIE et al. | 2002
- 79
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Initiation, growth, and mitigation of UV-laser-induced damage in fused silica (Invited Paper) [4679-01]Rubenchik, A. M. / Feit, M. D. / SPIE et al. | 2002
- 79
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Initiation, growth, and mitigation of UV-laser-induced damage in fused silicaRubenchik, Alexander M. / Feit, Michael D. et al. | 2002
- 96
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Engineered defects for investigation of laser-induced damage of fused silica at 355 nm [4679-57]Hamza, A. V. / Siekhaus, W. J. / Rubenchik, A. M. / Feit, M. D. / Chase, L. L. / Savina, M. / Pellin, M. J. / Hutcheon, I. D. / Nostrand, M. C. / Runkel, M. et al. | 2002
- 96
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Engineered defects for investigation of laser-induced damage of fused silica at 355 nmHamza, Alex V. / Siekhaus, Wigbert J. / Rubenchik, Alexander M. / Feit, Michael D. / Chase, Lloyd L. / Savina, M. / Pellin, Michael J. / Hutcheon, Ian D. / Nostrand, Mike C. / Runkel, Michael J. et al. | 2002
- 108
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Structural modifications in fused silica due to laser-damage-induced shock compression [4679-58]Kubota, A. / Caturla, M.-J. / Davila, L. / Stolken, J. / Sadigh, B. / Quong, A. / Rubenchik, A. M. / Feit, M. D. / SPIE et al. | 2002
- 108
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Structural modifications in fused silica due to laser-damage-induced shock compressionKubota, Alison / Caturla, Maria-Jose / Davila, Lilian / Stolken, James / Sadigh, Babak / Quong, A. / Rubenchik, Alexander M. / Feit, Michael D. et al. | 2002
- 117
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Effect of discreteness of laser action and condensed medium response on the nonlinear and photophysical phenomena [4679-48]Libenson, M. N. / Gruzdev, V. E. / SPIE et al. | 2002
- 117
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Effect of discreteness of laser action and condensed medium response on the nonlinear and photophysical phenomenaLibenson, Mikhail N. / Gruzdev, Vitali E. et al. | 2002
- 124
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Effect of laser-induced antidiffusion on phonon-assisted electron transitions in semiconductor Fokker-Planck equationApostolova, T. / Huang, D / Alsing, Paul M. / McIver, John K. / Cardimona, David A. et al. | 2002
- 124
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Effect of laser-induced antidiffusion on phonon-assisted electron transitions in semiconductor Fokker-Planck equation [4679-35]Apostolova, T. / Huang, D. / Alsing, P. M. / McIver, J. K. / Cardimona, D. A. / SPIE et al. | 2002
- 138
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Use of order statistics in the determination of laser damage threshold [4679-42]Arenberg, J. W. / SPIE et al. | 2002
- 138
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Use of order statistics in the determination of laser damage thresholdArenberg, Jonathan W. et al. | 2002
- 146
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Calculation of relative damage thresholds for coated or contaminated total internal reflection surfacesArenberg, Jonathan W. et al. | 2002
- 146
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Calculation of relative damage thresholds for coated or contaminated total internal reflection surfaces [4679-40]Arenberg, J. W. / SPIE et al. | 2002
- 154
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Measurement of relative damage thresholds at total internal reflection surfacesArenberg, Jonathan W. / Mordaunt, David W. et al. | 2002
- 154
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Measurement of relative damage thresholds at total internal reflection surfaces [4679-41]Arenberg, J. W. / Mordaunt, D. W. / SPIE et al. | 2002
- 157
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Soliton-type waves of reflection and conduction in laser-matter interaction: as appeared in collected papers of the symposium on Laser-Induced Damage in Optical Materials: 1969-1998 (review) [4679-46]Kudriavtsev, E. M. / SPIE et al. | 2002
- 157
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Soliton-type waves of reflection and conduction in laser-matter interaction: as appeared in collected papers of the Symposium on Laser-Induced Damage in Optical Materials 1969-1998 (review)Kudriavtsev, Eugene M. et al. | 2002
- 167
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Soliton-type waves of reflection and conduction in metals at static loading as a possible tool of precatastrophic damage indications [4679-47]Kudriavtsev, E. M. / Abramova, K. B. / Scherbakov, I. P. / SPIE et al. | 2002
- 167
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Soliton-type waves of reflection and conduction in metals at static loading as a possible tool of precatastrophic damage indicationsKudriavtsev, Eugene M. / Abramova, K. B. / Scherbakov, I. P. et al. | 2002
- 173
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Improving 351-nm damage performance of large-aperture fused silica and DKDP optics [4679-53]Burnham, A. K. / Hackel, L. A. / Wegner, P. J. / Parham, T. G. / Hrubesh, L. W. / Penetrante, B. M. / Whitman, P. K. / Demos, S. G. / Menapace, J. A. / Runkel, M. et al. | 2002
- 173
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Improving 351-nm damage performance of large-aperture fused silica and DKDP opticsBurnham, Alan K. / Hackel, Lloyd A. / Wegner, Paul J. / Parham, Thomas G. / Hrubesh, Lawrence W. / Penetrante, Bernie M. / Whitman, Pamela K. / Demos, Stavros G. / Menapace, Joseph A. / Runkel, Michael J. et al. | 2002
- 186
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Simple thermal response model for a p-doped silicon substrate irradiated by 1.06- and 1.32-δμm lasersChernek, Paul J. / Orson, Jay A. et al. | 2002
- 186
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Simple thermal response model for a p-doped silicon substrate irradiated by 1.06- and 1.32-mum lasers [4679-39]Chernek, P. J. / Orson, J. A. / SPIE et al. | 2002
- 198
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Designing high-power components for optical telecommunications (Invited Paper) [4679-05]Kulakofsky, J. / Lewis, W. / Robertson, M. / Moore, T. / Krishnan, G. / SPIE et al. | 2002
- 198
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Designing high-power components for optical telecommunicationsKulakofsky, Joseph / Lewis, Warren / Robertson, Michael / Moore, Thomas / Krishnan, Gokul et al. | 2002
- 211
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UV-laser modification of silica planar waveguide based DWDM devicesYan, Ming / Ball, David W. / Ticknor, Anthony J. et al. | 2002
- 211
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UV-laser modification of silica planar waveguide based DWDM devices (Abstract Only) [4679-06]Yan, M. / Ball, D. W. / Ticknor, T. / SPIE et al. | 2002
- 213
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Design issues for tunable filters for optical telecommunications [4679-09]Lewis, K. L. / Smith, G. / Mason, I. R. / Rochester, K. / SPIE et al. | 2002
- 213
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Design issues for tunable filters for optical telecommunicationsLewis, Keith L. / Smith, Gilbert / Mason, Ian R. / Rochester, Katie et al. | 2002
- 225
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Evaluation of materials selection criteria for composite optical limitersFerris, Kim F. / Windisch, Charles F. / Marmolejo, Theresa L. / Exarhos, Gregory J. et al. | 2002
- 225
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Evaluation of materials selection criteria for composite optical limiters [4679-38]Ferris, K. F. / Windisch, C. F. / Marmolejo, T. L. / Exarhos, G. J. / SPIE et al. | 2002
- 234
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Laser megajoule 1.06-mum mirror production with very high laser damage threshold [4679-27]Pinot, B. / Leplan, H. / Houbre, F. / Lavastre, E. / Poncetta, J.-C. / Chabassier, G. / SPIE et al. | 2002
- 234
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Laser megajoule 1.06-μm mirror production with very high laser damage thresholdPinot, B. / Leplan, Herve / Houbre, Francois / Lavastre, Eric / Poncetta, Jean-Christophe / Chabassier, Genevieve et al. | 2002
- 242
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Technological processing of silica as seen through laser-induced damage testsBouchut, Philippe / Garrec, Pierre / Neauport, Jerome / Gacoin, Philippe / Bonnemason, Francis / Kaladgew, S. et al. | 2002
- 242
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Technological processing of silica as seen through laser-induced damage tests [4679-22]Bouchut, P. / Garrec, P. / Neauport, J. / Gacoin, P. / Bonnemason, F. / Kaladgew, S. / SPIE et al. | 2002
- 251
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Influence of storage conditions on the LIDT of very high damage resistance mirrors [4679-23]Ravel, G. / Bouchut, P. / Garrec, P. / Andre, B. / Le Diraison, C. / Bercegol, H. / SPIE et al. | 2002
- 251
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Influence of storage conditions on the LIDT of very high damage resistance mirrorsRavel, Guillaume / Bouchut, Philippe / Garrec, Pierre / Andre, Bernard / Le Diraison, Carol / Bercegol, Herve et al. | 2002
- 257
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Performance of bare and sol-gel-coated DKDP crystal surfaces exposed to multiple 351-nm laser pulses in vacuum and airWhitman, Pamela K. / Norton, Mary A. / Nostrand, Mike C. / Molander, William A. / Nelson, A. / Engelhard, M. / Gaspar, D / Baer, D. / Siekhaus, Wigbert J. / Auerbach, J. et al. | 2002
- 257
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Performance of bare and sol-gel-coated DKDP crystal surfaces exposed to multiple 351-nm laser pulses in vacuum and air [4679-61]Whitman, P. K. / Norton, M. A. / Nostrand, M. C. / Molander, W. A. / Nelson, A. / Engelhard, M. / Gaspar, D. / Baer, D. / Siekhaus, W. J. / Auerbach, J. et al. | 2002
- 271
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Aperture scaling of 351-nm high-reflectivity sol-gel-based mirror coatings [4679-34]Andrew, J. E. / Bazin, N. J. / McInnes, H. A. / Morris, A. J. / Porter, K. J. / SPIE et al. | 2002
- 271
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Aperture scaling of 351-nm high-reflectivity sol-gel-based mirror coatingsAndrew, James E. / Bazin, Nicholas J. / McInnes, Hazel A. / Morris, A. J. / Porter, K. J. et al. | 2002
- 282
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Establishing links between single gold nanoparticles buried inside SiO2thin film and 351-nm pulsed-laser damage morphologyPapernov, Semyon / Schmid, Ansgar W. / Rigatti, Amy L. / Howe, Jim et al. | 2002
- 282
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Establishing links between single gold nanoparticles buried inside SiO~2 thin film and 351-nm pulsed-laser damage morphology [4679-51]Papernov, S. / Schmid, A. W. / Rigatti, A. L. / Howe, J. D. / SPIE et al. | 2002
- 293
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Kinetic study of laser damage initiation by creation of an electron plasma from absorbing nano-inclusions [4679-24]Grua, P. / Morreeuw, J. P. / Bercegol, H. / SPIE et al. | 2002
- 293
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Kinetic study of laser damage initiation by creation of an electron plasma from absorbing nano-inclusionsGrua, Pierre / Morreeuw, J. / Bercegol, Herve et al. | 2002
- 303
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Fabrication of thin film exponential transmission lines by superconducting materials for high-speed communication devices [4679-49]Rrustemaj, E. / Ilazi, B. / SPIE et al. | 2002
- 303
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Fabrication of a thin film exponential transmission lines by superconducting materials for high-speed communication devicesRrustemaj, Etrur / Ilazi, Besim et al. | 2002
- 309
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Design and characterization of all-polymeric interference mirrors and optics (Invited Paper) (Abstract Only) [4679-02]Ouderkirk, A. J. / SPIE et al. | 2002
- 309
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Design and characterization of all-polymeric interference mirrors and opticsOuderkirk, Andrew J. et al. | 2002
- 312
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Study of laser-induced damage in PPLN [4679-36]Titterton, D. H. / Terry, J. A. C. / SPIE et al. | 2002
- 312
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Study of laser-induced damage in PPLNTitterton, David H. / Terry, Jonny A. et al. | 2002
- 321
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Intrinsic laser-induced breakdown of silicate glassesGlebov, Leonid B. et al. | 2002
- 321
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Intrinsic laser-induced breakdown of silicate glasses [4679-68]Glebov, L. B. / SPIE et al. | 2002
- 332
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Damage testing of partial reflectors for 157-nm laser calorimeters [4679-67]Laabs, H. / Jones, R. D. / Cromer, C. L. / Dowell, M. L. / Liberman, V. / SPIE et al. | 2002
- 332
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Damage testing of partial reflectors for 157-nm laser calorimetersLaabs, Holger / Jones, Richard D. / Cromer, Christopher L. / Dowell, Marla L. / Liberman, Vladimir et al. | 2002
- 339
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Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nmGoerling, Christian / Leinhos, Uwe / Mann, Klaus R. et al. | 2002
- 339
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Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm [4679-30]Gorling, C. / Leinhos, U. / Mann, K. R. / SPIE et al. | 2002
- 347
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Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nmDemos, Stavros G. / Nostrand, Mike C. / Staggs, Michael C. / Carr, Christopher W. / Hahn, Douglas E. / Kozlowski, Mark R. / Sheehan, Lynn M. / Battersby, Colin L. / Burnham, Alan K. et al. | 2002
- 347
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Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm [4679-56]Demos, S. G. / Nostrand, M. C. / Staggs, M. C. / Carr, C. W. / Hahn, D. / Kozlowski, M. R. / Sheehan, L. M. / Battersby, C. L. / Burnham, A. K. / SPIE et al. | 2002
- 360
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Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals [4679-55]Carr, C. W. / Radousky, H. B. / Staggs, M. C. / Rubenchik, A. M. / Feit, M. D. / Demos, S. G. / SPIE et al. | 2002
- 360
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Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystalsCarr, Christopher W. / Radousky, Harry B. / Staggs, Michael C. / Rubenchik, Alexander M. / Feit, Michael D. / Demos, Stavros G. et al. | 2002
- 368
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Results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasersRunkel, Michael J. / Neeb, Kurt P. / Staggs, Michael C. / Auerbach, Jerome / Burnham, Alan K. et al. | 2002
- 368
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Results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers [4679-54]Runkel, M. / Neeb, K. P. / Staggs, M. C. / Auerbach, J. / Burnham, A. K. / SPIE et al. | 2002
- 384
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Performance of thin borosilicate glass sheets at 351 nmWhitman, Pamela K. / Staggs, Michael C. / Carr, Christopher W. / Dixit, Sham N. / Sell, Walter D. / Milam, David et al. | 2002
- 384
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Performance of thin borosilicate glass sheets at 351 nm [4679-62]Whitman, P. K. / Staggs, M. C. / Carr, C. W. / Dixit, S. N. / Sell, W. D. / Milam, D. / SPIE et al. | 2002
- 392
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Method and laser system for creating high-resolution laser-induced damage images [4679-37]Troitski, I. N. / SPIE et al. | 2002
- 392
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Method and laser system for creating high-resolution laser-induced damage imagesTroitski, Igor N. et al. | 2002
- 400
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Development of a photothermal microscope for multiscale studies of defectsDuring, Annelise / Fossati, Caroline / Commandre, Mireille et al. | 2002
- 400
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Development of a photothermal microscope for multiscale studies of defects [4679-12]During, A. / Fossati, C. / Commandre, M. / SPIE et al. | 2002
- 410
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Time-resolved measurements of reflectivity, plasma formation, and damage of hafnia/silica multilayer mirrors at 1064 nmLamaignere, Laurent / Cavarro, V. / Allais, C. / Bernardino, D. / Josse, Michel A. / Bercegol, Herve et al. | 2002
- 410
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Time-resolved measurements of reflectivity, plasma formation, and damage of hafnia/silica multilayer mirrors at 1064 nm [4679-26]Lamaignere, L. / Cavarro, V. / Allais, C. / Bernardino, D. / Josse, M. A. / Bercegol, H. / SPIE et al. | 2002
- 420
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Dynamic absorptance behavior of hybrid multilayers at 193 nmBlaschke, Holger / Jupe, Marco / Ristau, Detlev / Martin, S. / Bock, S. / Welsch, E. et al. | 2002
- 420
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Dynamic absorptance behavior of hybrid multilayers at 193 nm [4679-28]Blaschke, H. / Jupe, M. / Ristau, D. / Martin, S. / Bock, S. / Welsch, E. / SPIE et al. | 2002
- 429
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Optical properties of porous fluoride coating for UV and DUV lasersYoshida, K. / Ohya, M. / Hatooka, K. / Ochi, Kanyoshi / Sunagawa, M. / Kamimura, Tomosumi et al. | 2002
- 429
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Optical properties of porous fluoride coating for UV and DUV lasers [4679-32]Yoshida, K. / Ohya, M. / Hatooka, K. / Ochi, K. / Sunagawa, M. / Kamimura, T. / SPIE et al. | 2002
- 435
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Pit formation in GaAs surface induced by picosecond and femtosecond laser pulsesSingh, Amit P. / Kapoor, Avinashi / Tripathi, K. N. / Kumar, G. R. et al. | 2002
- 435
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Pit formation in GaAs surface induced by picosecond and femtosecond laser pulses [4679-43]Singh, A. P. / Kapoor, A. / Tripathi, K. N. / Kumar, G. R. / SPIE et al. | 2002
- 440
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Four-layer polymeric optical waveguides based on styrene acrylonitrile (SAN) [4679-44]Qureshi, G. J. / Gupta, V. K. / Singh, A. P. / Kapoor, A. / Tripathi, K. N. / SPIE et al. | 2002
- 440
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Four-layer polymeric optical waveguides based on styrene acrylonitrile (SAN)Qureshi, G. J. / Gupta, V. K. / Singh, Amit P. / Kapoor, Avinashi / Tripathi, K. N. et al. | 2002