Brownian Machinery in Physics and Biology (Invited) (Englisch)
- Neue Suche nach: Hanggi, P.
- Neue Suche nach: IMEC
- Neue Suche nach: European Laboratory for Electronic Noise
- Neue Suche nach: Hanggi, P.
- Neue Suche nach: Bosman, G.
- Neue Suche nach: IMEC
- Neue Suche nach: European Laboratory for Electronic Noise
In:
Noise in physical systems and 1/f fluctuations
;
397-399
;
2001
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ISBN:
- Aufsatz (Konferenz) / Print
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Titel:Brownian Machinery in Physics and Biology (Invited)
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Beteiligte:
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Kongress:International conference; 16th, Noise in physical systems and 1/f fluctuations ; 2001 ; Gainesville, FL
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Erschienen in:
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Verlag:
- Neue Suche nach: World Scientific
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Erscheinungsdatum:01.01.2001
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Format / Umfang:3 pages
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Anmerkungen:Also known as ICNF 2001
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ISBN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 3
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Kinetic Theory of Fluctuations: Forty Years in Progress (Invited)Katilius, R. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 9
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Noise in Nanoscale Devices (Invited)Bandyopadhyay, S. / Cahay, M. / Svizhenko, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 15
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Frontiers of Noise Research (Invited)Kish, L. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 19
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Mesoscopic Noise Experiments on Colossal Magnetoresistance (Invited)Weissman, M. B. / Merithew, R. D. / Hess, F. M. / Palanisami, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 25
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1/f Noise in Thin Single Domain Ni~8~0Fe~2~0 Films (Invited)Briaire, J. / Vandamme, L. K. J. / Gijs, M. A. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 31
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Local Magnetic Order in Manganite Thin Films Studied by 1/f Noise MeasurementsMarx, A. / Philipp, B. / Gross, R. / Reutler, P. / Bensaid, A. / Herbstritt, F. / Hoefener, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 35
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1/f Voltage Noise Induced by Magnetic Flux Flow in Granular SuperconductorsGerashchenko, O. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 39
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Nature of Sharp Temperature Dependency of Normal Phase Flicker Noise of Epitaxial YBa~2Cu~3O~7~-~x FilmsBobyl, A. V. / Khrebtov, I. A. / Tkachenko, A. D. / Ivanov, K. V. / Dam, B. / Klaassen, F. C. / Huijbregtse, J. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 43
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Noise, Transport and Structural Properties of High-T~c YBa~2Cu~3O~7~-~x Films with Noise Hooge-parameter in Normal State Near to 10^-^6Khrebtov, I. A. / Tkachenko, A. D. / Ivanov, K. V. / Dam, B. / Klaassen, F. C. / Huijbregtse, J. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 47
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Dynamics of Individual Traps in Submicron High-temperature Superconductor Grain Boundary JunctionsMarx, A. / Kemen, T. / Alff, L. / Gross, R. / Herbstritt, F. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 51
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Large Conductance Noise in Ceramic High T~c Superconductors Submitted to a Low Frequency A.C. Magnetic FieldMazzetti, P. / Stepanescu, A. / Tura, P. / Masoero, A. / Puica, I. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 55
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Voltage Fluctuations Associated with Unbinding of Vortex Pairs in the Presence of CurrentKamada, M. / Okuma, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 59
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Current-induced Voltage Noise and Vortex Dynamics in Thick a-Mo~xSi~1~-~x FilmsOkuma, S. / Kamada, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 63
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Low-Frequency Noise in Gallium Nitride Thin Films Deposited by rf-plasma Assisted MBE on Intermediate-Temperature Buffer Layers (Invited)Leung, B. H. / Fong, W. K. / Zhu, C. F. / Surya, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 69
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Generation-recombination Noise in Si-doped A1NGoennenwein, S. T. B. / Zeisel, R. / Baldovino, S. / Ambacher, O. / Brandt, M. S. / Stutzmann, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 73
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Non-equilibrium Flicker Noise in Conducting Films and Thin Film ResistorsJones, B. K. / Zhigal skii, G. P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 77
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Dependence of Current 1/f Noise of VO~x Films on Their Phase Composition and StructureZerov, V. Y. / Malyarov, V. G. / Khrebtov, I. A. / Shcadrin, E. B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 81
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Low Frequency Noise and Non-Linear Transport in Charge-ordered ManganitesGuha, A. / Ghosh, A. / Raychauhduri, A. K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 85
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1/f Noise in Undoped Hydrogenated Amorphous Silicon and Silicon-germanium Alloys (Invited)Gunes, M. / Johanson, R. E. / Kasap, S. O. / Yang, J. C. / Guha, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 91
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Low Frequency Noise of Thin Ta~2O~5 Amorphous FilmsPavelka, J. / Sikula, J. / Sedlakova, V. / Grmela, L. / Tacano, M. / Hashiguchi, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 95
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Low Frequency Noise Analysis of Different Types of Polysilicon ResistorsPenarier, A. / G-Jarrix, S. / Delseny, C. / Pascal, F. / Chay, C. / Llinares, P. / Granger, E. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 99
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1/f Resistance Fluctuation of the Carbon FiberAkabane, H. / Agu, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 103
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Spin-Dependent NoiseBrandt, M. S. / Goennenwein, S. / Stutzmann, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 107
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Universal Conductance Fluctuations and Scale Invariance Near the Metal-insulator TransitionGhosh, A. / Raychaudhuri, A. K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 111
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Temperature and Doping Dependence of Conductivity Noise in Degenerately Doped Si Single CrystalsKar, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 115
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Experimental Study of 1/f Fluctuations at Nonequilibrium Phase TransitionsSkokov, V. N. / Reshetnikov, A. V. / Koverda, V. P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 119
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Evaluation of Ni/n-SiC Ohmic Contacts by Current Noise MeasurementsTacano, M. / Tanuma, N. / Yokokura, S. / Hashiguchi, S. / Sikula, J. / Matsui, T. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 127
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Lorentzian Components in Low-frequency Noise Spectra of SOI MOSFETs (Invited)Lukyanchikova, N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 133
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On the 1/f Noise in Fully Depleted SOI TransistorsHaendler, S. / Jomaah, J. / Dieudonne, F. / Balestra, F. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 137
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Low Frequency Noise Characterization in 0.18 mum Technology n and p Channel MOSFETsAllogo, Y. A. / Marin, M. / De Murcia, M. / Llinares, P. / Cottin, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 141
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Effect of Forward and Reverse Substrate Biasing on Low Frequency Noise in Silicon P-MOSFETsDeen, M. J. / Marinov, O. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 145
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Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different TechnologiesFantini, P. / Vendrame, L. / Riccardi, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 149
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Impact of Gate Engineering and Silicidation on Low Frequency Noise Characteristics in 0.18 mum Technology MOSFETsDe Murcia, M. / Marin, M. / Allogo, Y. A. / Rigaud, D. / Llinares, P. / Cottin, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 153
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A Comparison of 1/f Noise of 0.25 mum-NMOS and PMOS Transistors from Deep-subthreshold to Strong InversionPark, N. / O, K. K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 157
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On-wafer Low Frequency Noise Investigation of the 0.35 mum n and p Type MOSFETs, Dependence Upon the Gate GeometrySakalas, P. / Zirath, H. / Litwin, A. / Schroter, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 161
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Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETsJohansen, J. A. / Figenschau, H. / Chen, X. / Rheenen, A. V. / Salm, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 165
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Gate Leakage Current Noise in Ultra-thin Gate Oxide MOSFETsLee, J. H. / Bosman, G. / Green, K. R. / Ladwig, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 169
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Phonon-induced 1/f Noise in MOS TransistorsMihaila, M. N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 173
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The Characteristic Potential Method of 1/f Noise Calculation in Si nMOSFETsPark, C. H. / Min, H. S. / Park, Y. J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 177
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Flicker Noise in Submicron MOSFETs with 3.5 nm Nitrided Gate OxideSimoen, E. / Da Rold, M. / Claeys, C. / Lukyanchikova, N. / Petrichuk, M. / Garbar, N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 181
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High-frequency noise of MOSFETsChen, C. / Deen, M. J. / Cheng, Y. / Matloubian, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 187
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Low Frequency Noise in Avalanche Breakdown of PN Junction Diodes (Invited)Marinov, O. / Deen, M. J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 193
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PN Junction Local Avalanche Breakdown Induced Microplasma Noise in Semiconductor GaAsP DiodesKoktavy, P. / Sikula, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 197
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Analysis of Low Frequency Noise in Resonant Tunneling DiodesDobrzanski, L. / Kosiel, K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 201
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Low Frequency Noise Sources in Submicron SiGe-base Heterojunction Bipolar TransistorsMilitaru, L. / Raoult, J. / Verdier, J. / Bremond, G. / Souifi, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 205
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Modeling the Level and Variation in the Low-frequency Noise in Polysilicon Emitter Bipolar TransistorsSanden, M. / Ostling, M. / Marinov, O. / Deen, M. J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 209
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Low Frequency Noise in InP/InGaAs Heterojunction Bipolar Transistors with Different TechnologiesDelseny, C. / Pascal, F. / Penarier, A. / G-Jarrix, S. / Chay, C. / Blayac, S. / Riet, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 213
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Modeling of Current Transport and 1/f Noise in GaN Based HBTsUnlu, H. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 217
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Microscopic Analysis of Microwave Noise Sources in SiGe HBTsMartin-Martinez, M. J. / Mateos, J. / Pardo, D. / Gonzalez, T. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 221
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A Stochastic Approach to Characterize the Noise Behavior of Microwave TransistorsSpagnolo, B. / Patti, F. / Miceli, V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 227
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Investigation of Low-frequency Noise in Heterostructure Field-effect Transistors Based on Wide Band Gap Semiconductors (Invited)Balandin, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 233
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Low Frequency Noise in Gate Current of HEMT StructuresLee, J. / Han, I. K. / Brini, J. / Chovet, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 237
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LF Gate Noise in P-HEMT in Impact Ionization RegimeLambert, B. / Malbert, N. / Labat, N. / Verdier, F. / Touboul, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 241
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Experimental Investigation of the Dependence of 1/f Noise on Ids/g~m^2 in the Pseudomorphic HEMT at 4.2 KLucas, T. / Jin, Y. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 245
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Noise Optimization of Ultra-short Gate HEMTs Using Monte Carlo SimulationMateos, J. / Gonzalez, T. / Pardo, D. / Bollaert, S. / Parenty, T. / Cappy, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 249
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Low Frequency Drain Current Noise of GaAs Based PHEMTsVildeuil, J. C. / Valenza, M. / Rigaud, D. / Prigent, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 253
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Excess Noise in Al/I-GaAs Barrier Structures Used as X-ray and Charged Particles DetectorsZhigal skii, G. P. / Gorbatsevich, A. A. / Lublin, V. V. / Rodin, M. S. / Shmelev, S. S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 257
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Low Frequency Noise in CdSe Thin Film Transistors (Invited)Deen, M. J. / Rumyantsev, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 263
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Model of Low Frequency Noise in Polycrystalline Silicon Thin-Film TransistorsDimitriadis, C. A. / Brini, J. / Kamarinos, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 267
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Conduction and Low-frequency Noise in Polysilicon Thin Film TransistorsMercha, A. / Rhayem, J. / Pichon, L. / Valenza, M. / Carin, R. / Bonnaud, O. / Rigaud, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 271
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1/f Noise in Organic Thin-Film Transistors (Invited)Martin, S. / Dodabalapur, A. / Bao, Z. / Crone, B. / Katz, H. E. / Li, W. / Passner, A. / Rogers, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 277
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Low Frequency Noise in Polymer Transistors with Non-stationary MobilityMarinov, O. / Deen, M. J. / Yu, J. / Holdcroft, S. / Woods, W. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 281
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1/f Noise in Organic Thin Film Transistors: Dependence on Geometry, Bias and IlluminationFeyaerts, R. / Vandamme, L. K. J. / Trefan, G. / Detcheverry, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 285
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A Global Approach to the Noise and Small-signal Characterization of Microwave Field-Effect TransistorsCaddemi, A. / Martines, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 289
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Shot Noise in Macroscopic Resistors: A Predicted Experimental EvidenceGomila, G. / Reggiani, L. / Pennetta, C. / Sampietro, M. / Ferrari, G. / Bertuccio, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 293
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Instabilities and Fluctuations in Semiconductor Solid-state PlasmaMitin, V. V. / Vagidov, N. Z. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 299
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Intensity Optical Noise in Low and Medium Frequency Range of 0.85 and 1.55 mum Vertical Surface Emitting LasersBelleville, G. / Orsal, B. / Signoret, P. / Alabedra, R. / Jacquet, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 303
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Theoretical Investigation of Mode-Competition Noise in Semiconductor Lasers Including Asymmetric Cross-Saturation of GainAhmed, M. / Yamada, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 307
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Numerical Simulation of Intensity and Phase Fluctuations in Long-wavelength LasersAbdulrhmann, S. / Ahmed, M. / Yamada, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 311
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Spectral Density of Frequency Fluctuations in Semiconductor Laser Under Pseudorandom Pulsed OperationMorozov, Y. A. / Nefedov, I. S. / Gusyatnikov, V. N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 315
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Optical and Electrical Noise of Ridge Waveguide InGaAsP/InP F-P and DFB MQW LasersSobiestianskas, R. / Simmons, J. G. / Smetona, S. / Evans, J. D. / Pralgauskaite, S. / Matukas, J. / Palenskis, V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 319
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NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nmObarski, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 323
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Electrical Noise Characterization of n-type-doped Distributed Bragg MirrorsOrsal, B. / Belleville, G. / Signoret, P. / Alabedra, R. / Wintrebert-Fouquet, M. / Jacquet, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 327
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Evidence of Deep Levels in n-type-doped Distributed Bragg Mirrors Through Electrical Noise CharacterizationOrsal, B. / Signoret, P. / G-Jarrix, S. / Belleville, G. / Alabedra, R. / Wintrebert-Fouquet, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 331
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Temperature Dependence of the 1/f Noise of "hot" HgCdTe IR DetectorsBenjaminsen, F. / Van Rheenen, A. D. / Chen, X. Y. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 335
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Experimental Study of the Current Noise Spectral Density Versus Dark Current in CdTe: C1 and CdZnTe DetectorsImad, A. / Orsal, B. / Alabedra, R. / Arques, M. / Montemont, G. / Verges, L. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 339
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Physical Model of the Current Noise Spectral Density Versus Dark Current in CdTe DetectorsImad, A. / Orsal, B. / Alabedra, R. / Arques, M. / Montemont, G. / Verges, L. / Wintrebert-Fouquet, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 343
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Effects of Permanent Magnetic Fields on 1/f Noise in Ion-Implanted Mercury Cadmium Telluride PhotodiodesKhait, Y. L. / Garber, V. / Bahir, G. / Snapiro, I. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 347
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Effect of Coulomb Interaction on Noise in Quantum Well Infrared PhotodetectorsCarbone, A. / Mazzetti, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 353
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The Effects of Charge Quantization on Random Telegraph Signals in Deep-sub-micron MOSFETs (Invited)Celik-Butler, Z. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 359
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Temperature Controlled RTS Noise from a Single InGaAs Quantum Dot (Invited)Awano, Y. / Shima, M. / Sakuma, Y. / Sugiyama, Y. / Yokoyama, N. / Tacano, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 365
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Model for RTS Noise in Sub-micron MOSFETsCelik-Butler, Z. / Amarasinghe, N. V. / Thebieroz, H. / Zlotnicka, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 369
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Random Telegraph Noise in Microstructures (Invited)Kogan, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 375
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Softbreakdown and RTS in Gate and Drain Currents of MOS Transistors with Ultrathin OxidesAvellan, A. / Krautschneider, W. / Sell, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 379
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Time and Frequency Study of RTS in Bipolar TransistorsPenarier, A. / G-Jarrix, S. / Delseny, C. / Pascal, F. / Chay, C. / Sodini, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 383
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Temperature Dependent RTS Noise in SiGe HBTsVon Haartman, M. / Ostling, M. / Bosman, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 387
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RTS Noise Due to Electrostatic Discharge (ESD) Stress-induced Localized Damage in the Channel of Grounded-gate nMOS ESD Protection DevicesPogany, D. / Gornik, E. / Esmark, K. / Gossner, H. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 391
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Simulation and Measurement of RTS Noise in N-channel MOSFETs Under Switched Bias ConditionsVan Der Wel, A. P. / Klumperink, E. A. M. / Nauta, B. / Vandamme, L. K. J. / Gierkink, S. L. J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 397
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Brownian Machinery in Physics and Biology (Invited)Hanggi, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 400
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How Fast Can a Neuron Transfer Information: Bandwidth is the Real IssueKish, L. B. / Harmer, G. / Abbott, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 404
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Fluctuations of Cars and Neural Spikes at JunctionsRuszczynski, P. S. / Kish, L. B. / Bezrukov, S. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 408
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Nonlinear Stochastic Models of Neurons ActivitiesWang, R. / Zhang, Z. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 412
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Neural Network Based Adaptive Processing of ElectrogastrogramSelvan, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 416
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A Numerical Analysis of Stochastic Phenomena in One-dimensional Two-state SystemsTateno, T. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 420
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Colored Noise Driven Stochastic Resonance in a Double Well and in a Fitzhugh-Nagumo Neuronal ModelGingl, Z. / Makra, P. / Fulei, T. / Vajtai, R. / Mingesz, R. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 424
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Noise-induced Oscillations and Coherent Resonance in Chemical SystemXin, H. / Jiang, Y. / Hou, Z. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 431
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Monte Carlo Simulations of Mesoscopic Shot Noise (Invited)Gonzalez, T. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 437
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Background Charge Noise in Metallic Single Electron Transistors (Invited)Zorin, A. B. / Krupenin, V. A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 443
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Enhanced Shot Noise and Negative Differential Conductance in Quasi-Ballistic Single-barrier DiodesYa, V. / Aleshkin / Reggiani, L. / Reklaitis, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 447
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Shot Noise Enhancement and Suppression in Systems of Coupled Quantum DotsGattobigio, M. / Iannaccone, G. / Macucci, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 451
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Noise Properties of Ballistic ExclusionsGomila, G. / Reggiani, L. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 455
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Shot Noise Suppression in Single and Multiple Ballistic and Diffusive CavitiesMacucci, M. / Iannaccone, G. / Pellegrini, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 459
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Numerical Simulations of Weak Localization Correction to Shot Noise in Degenerate Disordered Conductors in Reduced DimensionsStadler, A. W. / Kolek, A. / Haldas, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 463
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Shot Noise as a Test of Entanglement and Nonlocality of Electrons in Mesoscopic SystemsSukhorukov, E. V. / Burkard, G. / Loss, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 466
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Shot Noise in Hybrid Superconductor/normal Metal Heterostructures at Mesoscopic ScaleLefloch, F. / Hoffman, C. / Jehl, X. / Sanquer, M. / Calemczuk, R. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 473
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Noise Properties of Microwave Oscillators Based on Sapphire Loaded Cavity Resonators (Invited)Ivanov, E. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 479
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The Influence of the Main Noise Sources on Frequency Stability of the Quantum Frequency StandardBelyaev, A. A. / Sakharov, B. A. / Kozlov, A. K. / Yakimov, A. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 483
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Measurement of Long-term Frequency Stability of High Quality Oscillators in the Presence of Flicker-noisesBorisov, B. D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 487
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The Readout of Time, Continued Fractions and 1/f NoisePlanat, M. / Cresson, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 491
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Learning from Noise in Chua's OscillatorFriedt, J.-M. / Teytaud, O. / Planat, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 495
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Advanced Phase Noise Measurement MethodsRubiola, E. / Giordano, V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 499
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Up-conversion of 1/f Noise to Phase Noise in Voltage Controlled OscillatorsSanden, M. / Jonsson, F. / Ostling, M. / Marinov, O. / Deen, M. J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 503
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Correlation Between Phase and Amplitude Noises, and 1/f Phase Noise Reduction Methods in Oscillators & PLL (Phase-locked Loop) SystemsYamoto, T. / Kano, H. / Takagi, K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 509
-
Effects of Quantum Confinement on Low Frequency Noise in delta-Doped GaAs Structures Grown by MBEChen, X. Y. / Koenraad, P. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 513
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Longitudinal and Transverse Noise of Hot Electrons in 2DEG ChannelsLiberis, J. / Ardaravicius, L. / Matulionis, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 517
-
High-frequency Noise in InAlAs/InGaAs/InAlAs Quantum-well ChannelsMatulionis, A. / Ardaravicius, L. / Liberis, J. / Aninkevicius, V. / Gasquet, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 521
-
Microwave Noise in GaSb/AlSb/InAs/AlSb/GaSb/GaAs Quantum Well ChannelMatulionis, A. / Ardaravicius, L. / Liberis, J. / Matulioniene, I. / Mel tser, B. Y. / Solov ev, V. A. / Shubina, T. V. / Ivanov, S. V. / Kopev, P. S. / IMEC et al. | 2001
- 525
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Noise of a Quantum-dot System in the Cotunneling RegimeSukhorukov, E. V. / Burkard, G. / Loss, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 531
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Effects of Substrate Resistances on the Noise Performance of RF Circuits Implemented in Silicon-based Technologies (Invited)O, K. K. / Colvin, J. / Chen, T. / Hung, C.-M. / Kim, K.-H. / Floyd, B. / Huang, F.-J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 537
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The ADC-transformation of Probability Characteristics of Gaussian NoiseBelyakov, A. V. / Yakimov, A. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 541
-
1/f Noise in the Multi-agent Cooperative RoutingZhang, L. / Ren, Y. / Shan, X. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 545
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High Signal-to-noise Ratio Gain by Stochastic Resonance in a Double WellGingl, Z. / Vajtai, R. / Makra, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 549
-
S/N Optimization and Noise Considerations for Piezoresistive MicrophonesBhardwaj, S. / Nishida, T. / Sheplak, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 555
-
On the Additivity of Generation-recombination Spectra (Invited)Hooge, F. N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 561
-
Electronic Noise Due to Multiple Trap Levels, Discrete or Continuously Distributed: A Near-Exact Result for the Envelope Spectrum (Invited)Van Vliet, C. M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 568
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Sharp Increase of 1/f Noise Owing to Clusterization of Adatoms at Crystal Surfaces of Metals and Light Impurities in the BulkBobyl, A. V. / Berzin, A. A. / Morosov, A. I. / Sigov, A. S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 572
-
1/f Noise, Intermittency and Clustering Poisson ProcessGruneis, F. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 576
-
1/f Noise Due to Diffusion of Impurity Centers in SemiconductorsGruneis, F. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 580
-
1/f Noise and Self-organization in Granular SuperconductorsGinzburg, S. L. / Savitskaya, N. E. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 584
-
New Insights on Fundamental 1/f Noise Theory and Applications (Invited)Handel, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 590
-
1/f Noise of the Density of States of an Electron GasPlanat, M. / Barrere, R. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 594
-
Information Transmission in Parallel Threshold Networks: Suprathreshold Stochastic Resonance and Coding EfficiencyStocks, N. G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 598
-
Green Noise in Stochastic SystemsGuz, S. A. / Ruzavin, I. G. / Sviridov, M. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 602
-
The Role of the Initial Conditions on the Enhancement of the Escape Time in Unstable StatesLa Barbera, A. / Spagnolo, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 606
-
Stochastic Properties of Deterministic SystemsKumicak, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 610
-
Hypersensitivity to Small Signals in a Stochastic System with Multiplicative NoiseGerashchenko, O. V. / Ginzburg, S. L. / Pustovoit, M. A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 612
-
Noise Enhanced Stability in Systems with Fluctuating PotentialsAgudov, N. V. / Dubkov, A. A. / Spagnolo, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 616
-
Bifurcations of Mechanical Systems Under Multiplicative NoiseCichon, M. G. / Wedig, W. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 620
-
Characterization of Noisy Waveforms by Means of Wavelet TechniquesMicciancio, S. / Principato, F. / Ferrante, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 624
-
Self-organized Criticality and 1/f Fluctuations at Nonequilibrium Phase TransitionsSkokov, V. N. / Koverda, V. P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 631
-
Noise Modeling for PDE Based Device Simulations (Invited)Bonani, F. / Ghione, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 637
-
Modeling and Simulation of Thermal Noise in Deep-submicron MOSFETsSpedo, S. / Fiegna, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 641
-
1/f-like Oxide Trapping Noise Simulation Using a PDE-based Device SimulatorHou, F. C. / Bosman, G. / Law, M. E. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 645
-
Simulation of Generation-recombination Noise of Resistors and Junctions Under Periodic Large-signal Steady-state ConditionsSanchez, J. E. / Bosman, G. / Law, M. E. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 649
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Fundamental and Equivalent Cyclostationary Microscopic Noise Sources for LS Device SimulationBonani, F. / Guerrieri, S. D. / Ghione, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 653
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Non-linear Noise in High-Frequency Devices (Invited)Danneville, F. / Cappy, A. / Llopis, O. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 659
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An Accurate and Efficient Methodology for RF Noise Simulations of nm-scale MOSFETs Based on Langevin-type Drift-diffusion ModelDecker, S. / Jungemann, C. / Neinhus, B. / Meinerzhagen, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 663
-
The Acceleration Scheme for Noise Modeling of Deep Submicron Devices (Invited)Starikov, E. / Shiktorov, P. / Gruzinskis, V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 669
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Comments About 1/f Noise Modeling by BSIM SoftwareContaret, T. / Mvongbote, A. E. / Valenza, M. / Hoffmann, A. / Rigaud, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 673
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A Comment on MESFET Noise Models Used in Electrical Simulators for Analog DesignChristoforou, Y. / Bolcato, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 677
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Monte Carlo Simulation of Electronic Noise Under Large-signal OperationShiktorov, P. / Starikov, E. / Gruzinskis, V. / Reggiani, L. / Varani, L. / Vaissiere, J. C. / Zarcone, M. / Adorno, D. P. / Ferrante, G. / IMEC et al. | 2001
- 681
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Modeling and Simulation of 1/f^g^a^m^m^a Noise in MOSFETs Based on Thermal-activated Mechanism and Monte Carlo ApproachYiqi, Z. / Lei, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 685
-
Scaling and Universality of Resistance Noise Near to Electrical Breakdown (Invited)Pennetta, C. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 691
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Influence of Magnetic Field on 1/f Noise and Thermal Noise in Multi-terminal n-GaAs ResistorsKim, Y. S. / Yun, S. S. / Min, H. S. / Park, Y. J. / Lee, H. C. / Sim, S. Y. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 697
-
Ultra Low-noise Cryogenic Correlation Amplifier for Shot Noise MeasurementsBasso, G. / Casarin, M. / Macucci, M. / Pellegrini, B. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 701
-
Low Frequency Noise Point Probe Measurements on a Wafer Level Using a Novel Programmable Current AmplifierChroboczek, J. A. / Szewczyk, A. / Piantino, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 705
-
Current Noise Measurement with a Correlation Spectrum AnalyzerFerrari, G. / Sampietro, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 709
-
Simultaneous Measurement of Current and Voltage Noise in a GaN-resistorHoffmann, M. H. W. / Pasch, M. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 713
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A Further Improvement of the Measuring Technique of Bulk and Contact Components of Resistance NoiseKolek, A. / Ptak, P. / Mleczko, K. / Wrona, A. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 717
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The Comparative Analysis of Methods of the 1/f Noise Non-gaussianity TestMakarov, S. V. / Medvedev, S. Y. / Yakimov, A. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 721
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Fully Computer-controlled Battery Power Source for Low-Frequency Noise MeasurementsYokokura, S. / Tanuma, N. / Tacano, M. / Hashiguchi, S. / Sikula, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 725
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Methods of Slope Estimation of Noise Power Spectral DensitySmulko, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 729
-
The Influence of ADC and FFT on the Spectrum EstimationMedvedev, S. Y. / Perov, M. Y. / Yakimov, A. V. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 735
-
A Percolative Approach to Current Fluctuations in the Soft Breakdown of Ultrathin OxidesTrefan, G. / Pennetta, C. / Reggiani, L. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 739
-
Non-linearity and Noise as a Quality Indicators for Silicon Solar CellsIbrahim, A. / Chobola, Z. / Sikula, J. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 743
-
Reliability and Low-frequency Noise Measurements of InGaAsP MQW Buried-Heterostructure LasersLetal, G. / Smetona, S. / Mallard, R. / Matukas, J. / Palenskis, V. / Pralgauskaite, S. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 747
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Low-frequency Noise and Third Harmonic Testing of Thick-Film Resistors as Reliability IndicatorsSedlakova, V. / Pavelka, J. / Sikula, J. / Rocak, D. / Hrovat, M. / Belavic, D. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 751
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On Electrical Noise and Reliability of Semiconductor LasersChen, X. Y. / Xu, Y. L. / Liu, C. L. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 755
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1/f noise in WO~3 Nanoparticle Films as a Diagnostic ToolHoel, A. / Vandamme, L. K. J. / Kish, L. B. / Olsson, E. / Trefan, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 759
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Noise Diagnostics of Insulating Materials for Operation at High TemperatureKoktavy, P. / Sikula, J. / Koktavy, B. / Liedermann, K. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 763
-
Analysis of LF Noise Evolution in Power HEMT After DC Step LifetestsLambert, B. / Malbert, N. / Labat, N. / Verdier, F. / Touboul, A. / Huguet, P. / Pataut, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 767
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Noise Measurements for Material Dielectric Characterization: Application to a Liquid CrystalGerard, L. / Joel, G. / Redouane, D. / Christian, L. / Pierre, T. / Nguyen, H. T. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 771
-
Physical Properties of Nanostructured Semiconductors Studied via Flicker Noise SpectroscopyParkhutik, V. P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 775
-
Flicker-noise Spectroscopy as a Tool for Analysis of Fluctuations in Physical SystemsTimashev, S. F. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 779
-
How Can Noise "Smell" and Remember that "Smell": Sampling-and-hold Electronic NoseKish, L. B. / Solis, J. / Vajtai, R. / Granqvist, C.-G. / Marlow, W. / Olsson, J. / Schnurer, J. / Lantto, V. / Gingl, Z. / IMEC et al. | 2001
- 784
-
Noise Measurements for Timing Purposes: An Application to Organic SemiconductorsFerrari, G. / Natali, D. / Sampietro, M. / Wenzl, F. P. / Scherf, U. / Annan, K. O. / Leising, G. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 791
-
1/f and 1/f^2 Noise in Financial Time Series (Invited)Bonanno, G. / Lillo, F. / Mantegna, R. N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 797
-
1/f Noise: An Appropriate Stochastic Process for EcologyHalley, J. M. / Inchausti, P. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 801
-
Orbital Noise in the Earth System and Climate FluctuationsLiu, H. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 805
-
Characteristics of the Ground Observed ULF Emissions and their Dynamics Depending on Solar Wind Parameters and Geomagnetic ConditionsSmirnova, N. / IMEC / European Laboratory for Electronic Noise et al. | 2001
- 811
-
Noise in State of the Art Clocks and their Impact for Fundamental Physics (Invited)Maleki, L. / IMEC / European Laboratory for Electronic Noise et al. | 2001