Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm [4932-407] (Englisch)
- Neue Suche nach: Hrubesh, L. W.
- Neue Suche nach: Brusasco, R. M.
- Neue Suche nach: Grundler, W.
- Neue Suche nach: Norton, M. A.
- Neue Suche nach: Donohue, E. E.
- Neue Suche nach: Molander, W. A.
- Neue Suche nach: Thompson, S. L.
- Neue Suche nach: Strodtbeck, S. R.
- Neue Suche nach: Whitman, P. K.
- Neue Suche nach: Shirk, M. D.
- Neue Suche nach: International Society for Optical Engineering
- Neue Suche nach: Hrubesh, L. W.
- Neue Suche nach: Brusasco, R. M.
- Neue Suche nach: Grundler, W.
- Neue Suche nach: Norton, M. A.
- Neue Suche nach: Donohue, E. E.
- Neue Suche nach: Molander, W. A.
- Neue Suche nach: Thompson, S. L.
- Neue Suche nach: Strodtbeck, S. R.
- Neue Suche nach: Whitman, P. K.
- Neue Suche nach: Shirk, M. D.
- Neue Suche nach: Exarhos, G. J.
- Neue Suche nach: International Society for Optical Engineering
In:
Optical materials for high-power lasers; Laser-induced damage in optical materials, 2002, and 7th international workshop on laser beam and optics characterization
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180-191
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2003
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm [4932-407]
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Beteiligte:Hrubesh, L. W. ( Autor:in ) / Brusasco, R. M. ( Autor:in ) / Grundler, W. ( Autor:in ) / Norton, M. A. ( Autor:in ) / Donohue, E. E. ( Autor:in ) / Molander, W. A. ( Autor:in ) / Thompson, S. L. ( Autor:in ) / Strodtbeck, S. R. ( Autor:in ) / Whitman, P. K. ( Autor:in ) / Shirk, M. D. ( Autor:in )
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Kongress:Symposium; 34th, Optical materials for high-power lasers; Laser-induced damage in optical materials, 2002, and 7th international workshop on laser beam and optics characterization ; 2002 ; Boulder, CO
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4932 ; 180-191
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.2003
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Format / Umfang:12 pages
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Anmerkungen:Also known as 34th annual Boulder damage symposium
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Degradation of a multilayer dielectric filter as a result of simulated space environmental exposureFuqua, Peter D. / Presser, Nathan / Barrie, James D. / Meshishnek, Michael J. / Coleman, Dianne J. et al. | 2003
- 1
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Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure (Invited Paper) [4932-458]Fuqua, P. D. / Presser, N. / Barrie, J. D. / Meshishnek, M. J. / Coleman, D. J. / International Society for Optical Engineering et al. | 2003
- 16
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Calculated and thermally measured laser damage in metallic thin films as a function of pulse durationGallais, Laurent / Amra, Claude / Natoli, Jean-Yves et al. | 2003
- 16
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Calculated and thermally measured laser damage in metallic thin films as a function of pulse duration [4932-433]Gallais, L. / Amra, C. / Natoli, J.-Y. / International Society for Optical Engineering et al. | 2003
- 26
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Nodular defects in sputtered coatings [4932-436]Lewis, K. L. / Smith, G. W. / Pidduck, A. J. / International Society for Optical Engineering et al. | 2003
- 26
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Nodular defects in sputtered coatingsLewis, Keith L. / Smith, Gilbert W. / Pidduck, Alan J. et al. | 2003
- 35
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Ion-assisted versus nonion-assisted high-laser-damage resistant coatings on BBO (Abstract Only) [4932-449]Herringer, J. H. / Caughey, T. A. / International Society for Optical Engineering et al. | 2003
- 35
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Ion-assisted versus nonion-assisted high-laser-damage resistant coatings on BBO (Abstract Only)Herringer, Jonathan H. / Caughey, Thomas A. et al. | 2003
- 38
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Influence of BK7 substrate solarization on the performance on hafnia and silica multilayer mirrors [4932-413]Stolz, C. J. / Menapace, J. A. / Genin, F. Y. / Ehrmann, P. R. / Miller, P. E. / Rogowski, G. T. / International Society for Optical Engineering et al. | 2003
- 38
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Influence of BK7 substrate solarization on the performance on hafnia and silica multilayer mirrorsStolz, Christopher J. / Menapace, Joseph A. / Genin, Francois Y. / Ehrmann, Paul R. / Miller, Philip E. / Rogowski, Gregory T. et al. | 2003
- 48
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Photochemical laminating of low-refractive-index transparent antireflective SiO2 filmMurahara, Masataka M. / Ogawa, Yasuhiro / Yoshida, Kunio / Okamoto, Yoshiaki et al. | 2003
- 48
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Photochemical laminating of low-refractive-index transparent antireflective SiO~2 film [4932-453]Murahara, M. M. / Ogawa, Y. / Yoshida, K. / Okamoto, Y. / International Society for Optical Engineering et al. | 2003
- 55
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Femtosecond damage threshold of multilayer metal filmsIbrahim, Wael M. G. / Elsayed-Ali, Hani E. / Shinn, Michelle D. / Bonner, Carl E. et al. | 2003
- 55
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Femtosecond damage threshold of multilayer metal films [4932-447]Ibrahim, W. M. G. / Elsayed-Ali, H. E. / Shinn, M. D. / Bonner, C. E. / International Society for Optical Engineering et al. | 2003
- 66
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Damage behavior of SiO~2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface [4932-462]Papernov, S. / Schmid, A. W. / International Society for Optical Engineering et al. | 2003
- 66
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Damage behavior of SiO2thin films containing gold nanoparticles lodged at predetermined distances from the film surfacePapernov, Semyon / Schmid, Ansgar W. et al. | 2003
- 75
-
Optical characteristics of THV fluorothermoplastic (Abstract Only)Yoshida, Kunio / Nobori, Takuo / Hatooka, K. / Ochi, Kanyoshi / Sunagawa, M. / Kamimura, Tomosumi / Okamoto, Yoshiaki et al. | 2003
- 75
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Optical characteristics of THV fluorothermoplastic (Abstract Only) [4932-435]Yoshida, K. / Nobori, T. / Hatooka, K. / Ochi, K. / Sunagawa, M. / Kamimura, T. / Okamoto, Y. / International Society for Optical Engineering et al. | 2003
- 76
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Investigation of high-power laser beam-, plasma-, debris-, and shrapnel-induced damage of optical coatings on the HELEN laser facilityWatson, Joe C. / Andrew, James E. / Bazin, Nicholas J. et al. | 2003
- 76
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Investigation of high-power laser beam-, plasma-, debris-, and shrapnel-induced damage of optical coatings on the HELEN laser facility [4932-418]Watson, J. C. / Andrew, J. E. / Bazin, N. J. / International Society for Optical Engineering et al. | 2003
- 88
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Operation of the Jefferson Lab FEL: optics lessons learnedShinn, Michelle D. et al. | 2003
- 88
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Operation of the Jefferson Lab FEL: optics lessons learned (Invited Paper) (Abstract Only) [4932-448]Shinn, M. D. / International Society for Optical Engineering et al. | 2003
- 91
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Mechanisms of CO2laser mitigation of laser damage growth in fused silicaFeit, Michael D. / Rubenchik, Alexander M. et al. | 2003
- 91
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Mechanisms of CO~2 laser mitigation of laser damage growth in fused silica [4932-410]Feit, M. D. / Rubenchik, A. M. / International Society for Optical Engineering et al. | 2003
- 103
-
Wet etching for the mitigation of laser damage growth in fused silicaBouchut, Philippe / Garrec, Pierre / Pelle, Catherine et al. | 2003
- 103
-
Wet etching for the mitigation of laser damage growth in fused silica [4932-431]Bouchut, P. / Garrec, P. / Pelle, C. / International Society for Optical Engineering et al. | 2003
- 112
-
Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processes [4932-463]Chow, R. / Thomas, M. D. / Bickel, R. C. / Taylor, J. R. / International Society for Optical Engineering et al. | 2003
- 112
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Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processesChow, Robert / Thomas, Michael D. / Bickel, Robert C. / Taylor, John R. et al. | 2003
- 119
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Large-spot COIL irradiation of Ge samplesRiede, Wolfgang / Gruenewald, Karin M. et al. | 2003
- 119
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Large-spot COIL irradiation of Ge samples [4932-414]Riede, W. / Grunewald, K. M. / International Society for Optical Engineering et al. | 2003
- 125
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Dependence of surface damage resistance on bulk quality in CsLiB~6O~1~0 (CLBO) crystal (Abstract Only) [4932-430]Kamimura, T. / Fukumoto, S. / Nishioka, M. / Yoshimura, M. / Mori, Y. / Sasaki, T. / Yoshida, K. / International Society for Optical Engineering et al. | 2003
- 125
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Dependence of surface damage resistance on bulk quality in CsLiB6O10(CLBO) crystal (Abstract Only)Kamimura, Tomosumi / Fukumoto, Satoru / Nishioka, Munenori / Yoshimura, Masashi / Mori, Yusuke / Sasaki, Takatomo / Yoshida, Kunio et al. | 2003
- 127
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Parametric study of the growth of damage sites on the rear surface of fused silica windowsRaze, Gerard / Morchain, Jean-Marie / Loiseau, Marc / Lamaignere, Laurent / Josse, Michel A. / Bercegol, Herve et al. | 2003
- 127
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Parametric study of the growth of damage sites on the rear surface of fused silica windows [4932-423]Raze, G. / Morchain, J.-M. / Loiseau, M. / Lamaignere, L. / Josse, M. A. / Bercegol, H. / International Society for Optical Engineering et al. | 2003
- 136
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Overview of raster scanning for ICF-class laser optics [4932-411]Runkel, M. J. / Nostrand, M. C. / International Society for Optical Engineering et al. | 2003
- 136
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Overview of raster scanning for ICF-class laser opticsRunkel, Michael J. / Nostrand, Mike C. et al. | 2003
- 147
-
Influence of 527-nm laser light on debris- and shrapnel-contaminated optical surfacesAndrew, James E. / Mann, Karen R. / Tobin, Michael T. / Watson, Joe C. et al. | 2003
- 147
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Influence of 527-nm laser light on debris- and shrapnel-contaminated optical surfaces [4932-416]Andrew, J. E. / Mann, K. R. / Tobin, M. T. / Watson, J. C. / International Society for Optical Engineering et al. | 2003
- 158
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Environmental effects on optical component aging [4932-415]Bruel, L. / International Society for Optical Engineering et al. | 2003
- 158
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Environmental effects on optical component agingBruel, Laurent et al. | 2003
- 170
-
Long-term performances of very high-laser-damage resistance mirrorsRavel, Guillaume / Bouchut, Philippe / Garrec, Pierre / Andre, Bernard / Le Diraison, Carol / Veillerot, Marc et al. | 2003
- 170
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Long-term performances of very high-laser-damage resistant mirrors [4932-434]Ravel, G. / Bouchut, P. / Garrec, P. / Andre, B. / Le Diraison, C. / Veillerot, M. / International Society for Optical Engineering et al. | 2003
- 180
-
Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nmHrubesh, Lawrence W. / Brusasco, Raymond M. / Grundler, Walter / Norton, Mary A. / Donohue, Eugene E. / Molander, William A. / Thompson, Samuel L. / Strodtbeck, Steven R. / Whitman, Pamela K. / Shirk, Michael D. et al. | 2003
- 180
-
Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm [4932-407]Hrubesh, L. W. / Brusasco, R. M. / Grundler, W. / Norton, M. A. / Donohue, E. E. / Molander, W. A. / Thompson, S. L. / Strodtbeck, S. R. / Whitman, P. K. / Shirk, M. D. et al. | 2003
- 192
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Identification and elimination of fluorescent surface-damage precursors on DKDP optics [4932-406]Nostrand, M. C. / Thompson, S. L. / Siekhaus, W. J. / Fluss, M. J. / Hahn, D. E. / Whitman, P. K. / Burnham, A. K. / International Society for Optical Engineering et al. | 2003
- 192
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Identification and elimination of fluorescent surface-damage precursors on DKDP opticsNostrand, Mike C. / Thompson, Samuel L. / Siekhaus, Wigbert J. / Fluss, Michael J. / Hahn, Douglas E. / Whitman, Pamela K. / Burnham, Alan K. et al. | 2003
- 202
-
Femtosecond pulse damage and predamage behavior of dielectric thin filmsMero, Mark / Liu, Jianhua / Sabbah, Ali / Jasapara, Jayesh C. / Starke, Kai / Ristau, Detlev / McIver, John K. / Rudolph, Wolfgang G. et al. | 2003
- 202
-
Femtosecond pulse damage and predamage behavior of dielectric thin films (Invited Paper) [4932-538]Mero, M. / Liu, J. / Sabbah, A. / Jasapara, J. C. / Starke, K. / Ristau, D. / McIver, J. K. / Rudolph, W. G. / International Society for Optical Engineering et al. | 2003
- 216
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Calculation of electric field intensity at dielectric interfaces (Abstract Only)Arenberg, Jonathan W. et al. | 2003
- 216
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Calculation of electric field intensity at dielectric interfaces (Abstract Only) [4932-403]Arenberg, J. W. / International Society for Optical Engineering et al. | 2003
- 218
-
Accuracy and repeatability of laser damage threshold measurements made via order statisticsArenberg, Jonathan W. et al. | 2003
- 218
-
Accuracy and repeatability of laser damage threshold measurements made via order statistics [4932-404]Arenberg, J. W. / International Society for Optical Engineering et al. | 2003
- 224
-
Toward an absolute measurement of LIDTNatoli, Jean-Yves / Gallais, Laurent / Bertussi, Bertrand / Commandre, Mireille / Amra, Claude et al. | 2003
- 224
-
Toward an absolute measurement of LIDT [4932-441]Natoli, J.-Y. / Gallais, L. / Bertussi, B. / Commandre, M. / Amra, C. / International Society for Optical Engineering et al. | 2003
- 238
-
Analysis of raster scanning damage and conditioning experiments [4932-409]Feit, M. D. / Rubenchik, A. M. / International Society for Optical Engineering et al. | 2003
- 238
-
Analysis of raster scanning damage and conditioning experimentsFeit, Michael D. / Rubenchik, Alexander M. et al. | 2003
- 250
-
Numerical simulations of laser/defect-induced absorption in SiO~2 [4932-439]Bonneau, F. / Combis, P. / Pujols, A. / Rullier, J.-L. / Seques, M. / Vierne, J. / International Society for Optical Engineering et al. | 2003
- 250
-
Numerical simulations of laser/defect-induced absorption in SiO2Bonneau, Florian / Combis, Patrick / Pujols, A. / Rullier, Jean-Luc / Seques, M. / Vierne, Jacques et al. | 2003
- 258
-
Trapping of electrical charges and laser damage [4932-405]Bigarre, J. / Hourquebie, P. / Doucet, L. / International Society for Optical Engineering et al. | 2003
- 258
-
Trapping of electrical charges and laser damageBigarre, Janick / Hourquebie, Patrick / Doucet, Ludovic et al. | 2003
- 268
-
Electromagnetic phenomena generated in laser-produced plasmas (Abstract Only) [4932-442]Scott, A. M. / Jones, D. C. / Benton, D. / Clark, S. / International Society for Optical Engineering et al. | 2003
- 268
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Electromagnetic phenomena generated in laser-produced plasmas (Abstract Only)Scott, Andrew M. / Jones, David C. / Benton, David / Clark, Susan et al. | 2003
- 269
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Luminescence of UV thin films [4932-432]Heber, J. / Muhlig, C. / Triebel, W. / Danz, N. / Thielsch, R. / Kaiser, N. / International Society for Optical Engineering et al. | 2003
- 269
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Luminescence of UV thin filmsHeber, Joerg / Muehlig, Christian / Triebel, Wolfgang / Danz, Norbert / Thielsch, Roland / Kaiser, Norbert et al. | 2003
- 276
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Self-focusing and reat surface damage in a fused silica window at 1064 nm and 355 nm [4932-420]Bercegol, H. / Lamaignere, L. / Le Garrec, B. / Loiseau, M. / Volto, P. / International Society for Optical Engineering et al. | 2003
- 276
-
Self-focusing and rear surface damage in a fused silica window at 1064 nm and 355 nmBercegol, Herve / Lamaignere, Laurent / Le Garrec, Bruno / Loiseau, Marc / Volto, Patricia et al. | 2003
- 286
-
Modified Z-scan method for determination of nonlinear refraction of optical materials through the measurement of power-weighted time-averaged beam propagation factorDement'ev, Alexander S. / Jovaisa, Andrius / Navakas, Robertas et al. | 2003
- 286
-
Modified Z-scan method for determination of nonlinear refraction of optical materials through the measurement of power-weighted time-averaged beam propagation factor [4932-427]Dement ev, A. S. / Jovaisa, A. / Navakas, R. / International Society for Optical Engineering et al. | 2003
- 297
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Comparison of numerical simulations with experiment on generation of craters in silica by a laserBercegol, Herve / Bonneau, Florian / Bouchut, Philippe / Combis, Patrick / Gallais, Laurent / Lamaignere, Laurent / Natoli, Jean-Yves / Rullier, Jean-Luc / Vierne, Jacques et al. | 2003
- 297
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Comparison of numerical simulations with experiment on generation of craters in silica by a laser [4932-437]Bercegol, H. / Bonneau, F. / Bouchut, P. / Combis, P. / Gallais, L. / Lamaignere, L. / Natoli, J.-Y. / Rullier, J.-L. / Vierne, J. / International Society for Optical Engineering et al. | 2003
- 309
-
Identification of point defects responsible for laser-induced ultraviolet absorption in LiB3O5(LBO) crystalsHong, W. / Garces, Nelson Y. / Chirila, M. M. / Halliburton, Larry E. et al. | 2003
- 309
-
Identification of point defects responsible for laser-induced ultraviolet absorption in LiB~3O~5 (LBO) crystals [4932-444]Hong, W. / Garces, N. Y. / Chirila, M. M. / Halliburton, L. E. / International Society for Optical Engineering et al. | 2003
- 319
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Optical limiting based on liquid-liquid immiscibilityExarhos, Gregory J. / Ferris, Kim F. / Samuels, William D. / Owings, Robert R. et al. | 2003
- 319
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Optical limiting based on liquid-liquid immiscibility [4932-455]Exarhos, G. J. / Ferris, K. F. / Samuels, W. D. / Owings, R. R. / International Society for Optical Engineering et al. | 2003
- 334
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Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silica [4932-438]Bercegol, H. / Bonneau, F. / Combis, P. / Gallais, L. / Lamaignere, L. / Loiseau, M. / Natoli, J.-Y. / Pellin, M. J. / Perra, M. / Rullier, J.-L. et al. | 2003
- 334
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Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silicaBercegol, Herve / Bonneau, Florian / Combis, Patrick / Gallais, Laurent / Lamaignere, Laurent / Loiseau, Marc / Natoli, Jean-Yves / Pellin, Michael J. / Perra, Michela / Rullier, Jean-Luc et al. | 2003
- 346
-
Self-guiding supercontinuum generation and damage in bulk materials induced by femtosecond pulses [4932-443]Sirutkaitis, V. / Gaizauskas, E. / Kudriashov, V. / Barkauskas, M. / Vaicaitis, V. / Grigonis, R. / Piskarskas, A. S. / International Society for Optical Engineering et al. | 2003
- 346
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Self-guiding supercontinuum generation and damage in bulk materials induced by femtosecond pulsesSirutkaitis, Valdas / Gaizauskas, Eugenijus / Kudriashov, Viacheslav / Barkauskas, Martynas / Vaicaitis, Virgilijus / Grigonis, Rimantas / Piskarskas, Algis S. et al. | 2003
- 358
-
Ultrashort pulse damage of Si and Ge semiconductorsAllenspacher, Paul / Huettner, Bernd / Riede, Wolfgang et al. | 2003
- 358
-
Ultrashort pulse damage of Si and Ge semiconductors [4932-428]Allenspacher, P. / Huttner, B. / Riede, W. / International Society for Optical Engineering et al. | 2003
- 366
-
Synchrotron-radiation-induced damages in optical materialsGatto, Alexandre / Kaiser, Norbert / Guenster, Stefan / Ristau, Detlev / Sarto, Francesca / Trovo, Mauro / Danailov, M. B. et al. | 2003
- 366
-
Synchrotron-radiation-induced damages in optical materials [4932-429]Gatto, A. / Kaiser, N. / Gunster, S. / Ristau, D. / Sarto, F. / Trovo, M. / Danailov, M. B. / International Society for Optical Engineering et al. | 2003
- 374
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Photothermal microscopy for in-situ study of laser damage induced by gold inclusionsDuring, Annelise / Commandre, Mireille / Fossati, Caroline / Natoli, Jean-Yves / Rullier, Jean-Luc / Bercegol, Herve / Bouchut, Philippe et al. | 2003
- 374
-
Photothermal microscopy for in-situ study of laser damage induced by gold inclusions [4932-450]During, A. / Commandre, M. / Fossati, C. / Natoli, J.-Y. / Rullier, J.-L. / Bercegol, H. / Bouchut, P. / International Society for Optical Engineering et al. | 2003
- 385
-
Experimental study of wavelength-dependent damage threshold in DKDPCarr, Christopher W. / Radousky, Harry B. / Demos, Stavros G. et al. | 2003
- 385
-
Experimental study of wavelength-dependent damage threshold in DKDP [4932-445]Carr, C. W. / Radousky, H. B. / Demos, S. G. / International Society for Optical Engineering et al. | 2003
- 391
-
Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only) [4932-421]Lamaignere, L. / Loiseau, M. / Piombini, H. / Plessis, D. / Bercegol, H. / International Society for Optical Engineering et al. | 2003
- 391
-
Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only)Lamaignere, Laurent / Loiseau, Marc / Piombini, Herve / Plessis, Daniel / Bercegol, Herve et al. | 2003
- 393
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Application of spectroscopic ellipsometry to characterization of optical thin films (Invited Paper) [4932-459]Woollam, J. A. / Bungay, C. L. / Yan, L. / Thompson, D. W. / Hilfiker, J. N. / International Society for Optical Engineering et al. | 2003
- 393
-
Application of spectroscopic ellipsometry to characterization of optical thin filmsWoollam, John A. / Bungay, Corey L. / Yan, Li / Thompson, Daniel W. / Hilfiker, James N. et al. | 2003
- 405
-
Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDPRunkel, Michael J. / Bruere, Justin / Sell, Walter D. / Weiland, Timothy L. / Milam, David / Hahn, Douglas E. / Nostrand, Mike C. et al. | 2003
- 405
-
Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP [4932-412]Runkel, M. J. / Bruere, J. / Sell, W. D. / Weiland, T. L. / Milam, D. / Hahn, D. E. / Nostrand, M. C. / International Society for Optical Engineering et al. | 2003
- 415
-
Growth of damage sites due to platinum inclusions in Nd-doped laser glass irradiated by the beam of a large-scale Nd:glass laserRaze, Gerard / Loiseau, Marc / Taroux, Daniel / Josse, Michel A. / Bercegol, Herve et al. | 2003
- 415
-
Growth of damage sites due to platinum inclusions in Nd-doped laser glass irradiated by the beam of a large-scale Nd:glass laser [4932-422]Raze, G. / Loiseau, M. / Taroux, D. / Josse, M. A. / Bercegol, H. / International Society for Optical Engineering et al. | 2003
- 421
-
Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only) [4932-440]Natoli, J.-Y. / Gallais, L. / Perra, M. / Bonneau, F. / Combis, P. / Rullier, J.-L. / Bouchut, P. / Lamaignere, L. / International Society for Optical Engineering et al. | 2003
- 421
-
Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only)Natoli, Jean-Yves / Gallais, Laurent / Perra, Michela / Bonneau, Florian / Combis, Patrick / Rullier, Jean Luc / Bouchut, Philippe / Lamaignere, Laurent et al. | 2003
- 422
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Radiation resistance of optical materials against synchrotron radiationGuenster, Stefan / Blaschke, Holger / Ristau, Detlev / Gatto, Alexandre / Heber, Joerg / Kaiser, Norbert / Diviacco, B. / Marsi, Marino / Trovo, Mauro / Sarto, Francesca et al. | 2003
- 422
-
Radiation resistance of optical materials against synchrotron radiation [4932-454]Gunster, S. / Blaschke, H. / Ristau, D. / Gatto, A. / Heber, J. / Kaiser, N. / Diviacco, B. / Marsi, M. / Trovo, M. / Sarto, F. et al. | 2003
- 429
-
Evolution of bulk damage initiation in DKDPCarr, Christopher W. / McMillian, T. H. / Staggs, Mike C. / Radousky, Harry B. / Demos, Stavros G. et al. | 2003
- 429
-
Evolution of bulk damage initiation in DKDP [4932-446]Carr, C. W. / McMillian, T. H. / Staggs, M. C. / Radousky, H. B. / Demos, S. G. / International Society for Optical Engineering et al. | 2003
- 434
-
Interferometric assessment of laser-induced damage to semiconductors [4932-457]Blackshire, J. L. / Zakel, A. / Guha, S. / International Society for Optical Engineering et al. | 2003
- 434
-
Interferometric assessment of laser-induced damage to semiconductorsBlackshire, James L. / Zakel, Andrew / Guha, Shekhar et al. | 2003
- 444
-
Characterizing CaF~2 for VUV optical components: roughness, surface scatter, and bulk scatter [4932-527]Hultaker, A. / Benkert, N. / Gliech, S. / Duparre, A. / International Society for Optical Engineering et al. | 2003
- 444
-
Characterizing CaF2for VUV optical components: roughness, surface scatter, and bulk scatterHultaker, Annette / Benkert, Nils / Gliech, Stefan / Duparre, Angela et al. | 2003
- 452
-
System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm [4932-529]Gliech, S. / Gessner, H. / Duparre, A. / International Society for Optical Engineering et al. | 2003
- 452
-
System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nmGliech, Stefan / Gessner, Henning / Duparre, Angela et al. | 2003
- 458
-
Calcium fluoride for ArF laser lithography: characterization by in-situ transmission and LIF measurementsMuehlig, Christian / Triebel, Wolfgang / Toepfer, Gabriela / Jordanov, A. et al. | 2003
- 458
-
Calcium fluoride for ArF laser lithography: characterization by in-situ transmission and LIF measurements [4932-537]Muhlig, C. / Triebel, W. / Topfer, G. / Jordanov, A. / International Society for Optical Engineering et al. | 2003
- 467
-
Absorptance measurements for the DUV spectral range by laser calorimetryBlaschke, Holger / Jupe, Marco / Ristau, Detlev et al. | 2003
- 467
-
Absorptance measurements for the DUV spectral range by laser calorimetry [4932-523]Blaschke, H. / Jupe, M. / Ristau, D. / International Society for Optical Engineering et al. | 2003
- 475
-
Repetition rate dependence of two-photon absorption and self-trapped exciton luminescence in CaF~2 at 193 nm [4932-515]Gorling, C. / Leinhos, U. / Mann, K. R. / International Society for Optical Engineering et al. | 2003
- 475
-
Repetition rate dependence of two-photon absorption and self-trapped exciton luminescence in CaF2at 193 nmGoerling, Christian / Leinhos, Uwe / Mann, Klaus R. et al. | 2003
- 482
-
Standard measurement procedures for the characterization of fs-laser optical components [4932-522]Starke, K. / Ristau, D. / Welling, H. / International Society for Optical Engineering et al. | 2003
- 482
-
Standard measurement procedures for the characterization of fs-laser optical componentsStarke, Kai / Ristau, Detlev / Welling, Herbert et al. | 2003
- 492
-
Characterization of particulate contamination of opticsArenberg, Jonathan W. et al. | 2003
- 492
-
Characterization of particulate contamination of optics [4932-506]Arenberg, J. W. / International Society for Optical Engineering et al. | 2003
- 500
-
A coherent spectrophotometer for optical coating chacterizationBalachninaite, Ona / Eckardt, Robert C. / Grigonis, Rimantas / Peckus, M. / Sirutkaitis, Valdas et al. | 2003
- 500
-
A coherent spectrophotometer for optical coating characterization [4932-517]Balachninaite, O. / Eckardt, R. C. / Grigonis, R. / Peckus, M. / Sirutkaitis, V. / International Society for Optical Engineering et al. | 2003
- 513
-
S-on-1 induced damage thresholds of high-reflection metallic coatings at 1064 nm [4932-518]Bingelyte, V. / Sirutkaitis, V. / Eckardt, R. C. / International Society for Optical Engineering et al. | 2003
- 513
-
S-on-1 induced damage thresholds of high-reflection metallic coatings at 1064 nmBingelyte, Virginija / Sirutkaitis, Valdas / Eckardt, Robert C. et al. | 2003
- 520
-
Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 mum [4932-508]Nickel, D. / Fleig, C. / Erhard, A. / Letsch, A. / Giesen, A. / Jupe, M. / Starke, K. / Ristau, D. / Wilhelm, O. / Huber, R. A. et al. | 2003
- 520
-
Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 μmNickel, Detlef / Fleig, Christoph / Erhard, Andrea / Letsch, Andreas / Giesen, Adolf / Jupe, Marco / Starke, Kai / Ristau, Detlev / Wilhelm, Oswald / Huber, Rudolf A. et al. | 2003
- 527
-
High-precision reflectivity measurements: improvements in the calibration procedure [4932-521]Jupe, M. / Grossmann, F. / Starke, K. / Ristau, D. / International Society for Optical Engineering et al. | 2003
- 527
-
High-precision reflectivity measurements: improvements in the calibration procedureJupe, Marco / Grossmann, Florian / Starke, Kai / Ristau, Detlev et al. | 2003
- 536
-
DUV/VUV spectrophotometry for high-precision spectral characterizationBlaschke, Holger / Kohlhaas, Jürgen / Kadkhoda, Puja / Ristau, Detlev et al. | 2003
- 536
-
DUV/VUV spectrophotometry for high-precision spectral characterization [4932-524]Blaschke, H. / Kohlhaas, J. / Kadkhoda, P. / Ristau, D. / International Society for Optical Engineering et al. | 2003
- 544
-
Spectrophotometry in the vacuum UVHeber, Joerg / Gatto, Alexandre / Kaiser, Norbert et al. | 2003
- 544
-
Spectrophotometry in the vacuum UV [4932-534]Heber, J. / Gatto, A. / Kaiser, N. / International Society for Optical Engineering et al. | 2003
- 549
-
On-line control of laser beam quality by means of diffractive optical componentsDuparre, Michael R. / Rockstuhl, Carsten / Letsch, Andreas / Schroeter, Siegmund / Pavelyev, Vladimir S. et al. | 2003
- 549
-
On-line control of laser beam quality by means of diffractive optical components [4932-539]Duparre, M. R. / Rockstuhl, C. / Letsch, A. / Schroeter, S. / Pavelyev, V. S. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 560
-
Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology [4932-514]Neubert, B. J. / Scharfe, W.-D. / Huber, G. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 560
-
Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technologyNeubert, Bert J. / Scharfe, Wolf-Dieter / Huber, Guenter et al. | 2003
- 569
-
Estimation of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wavefront sensorSchaefer, Bernd / Mann, Klaus R. et al. | 2003
- 569
-
Estimation of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wavefront sensor [4932-511]Schafer, B. / Mann, K. R. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 581
-
Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurementsGuttman, Jeffrey L. / Fleischer, John M. et al. | 2003
- 581
-
Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from fat-field measurements [4932-528]Guttman, J. L. / Fleischer, J. M. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 590
-
Numerical phase retrieval from beam intensity measurements in three planes [4932-516]Bruel, L. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 590
-
Numerical phase retrieval from beam intensity measurements in three planesBruel, Laurent et al. | 2003
- 599
-
Single-shot laser beam profiling using multilevel imaging (Abstract Only)Scott, Andrew M. / Woods, Simon C. / Harrison, Paul et al. | 2003
- 599
-
Single-shot laser beam profiling using multilevel imaging (Abstract Only) [4932-532]Scott, A. M. / Woods, S. C. / Harrison, P. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 600
-
Calibration of laser power meters for high-power applications [4932-456]Brandl, V. / Hansel, K. / Klos, M. / Kramer, R. / Schwede, H. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 600
-
Calibration of laser power meters for high-power applicationsBrandl, Volker / Haensel, Klaus / Klos, Mike / Kramer, Reinhard / Schwede, Harald et al. | 2003
- 608
-
Characterization device for diode-laser-stack beam propagationRoehner, Markus / Muentz, Holger / Schroeder, Olaf / Boucke, Konstantin / Poprawe, Reinhart et al. | 2003
- 608
-
Characterization device for diode-laser-stack beam propagation [4932-526]Roehner, M. / Muentz, H. / Schroeder, O. / Boucke, K. / Poprawe, R. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 615
-
Practical absolute wavelength meter using iodine-stabilized diode laserAkimoto, Yoshiaki / Yong-Chol, Lee / Hatano, Satoshi / Niki, Shoji / Irisawa, Akiyoshi et al. | 2003
- 615
-
Practical absolute wavelength meter using iodine-stabilized diode laser [4932-533]Akimoto, Y. / Yong-Chol, L. / Hatano, S. / Niki, S. / Irisawa, A. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 624
-
Intrinsic and geometrical beam classification, and the beam identification after measurementNemes, George et al. | 2003
- 624
-
Intrinsic and geometrical beam classification, and the beam identification after measurement [4932-519]Nemes, G. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 637
-
General classification of partially polarized partially coherent beams [4932-513]Martinez-Herrero, R. / Piquero, G. / Mejias, P. M. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 637
-
General classification of partially polarized partially coherent beamsMartinez-Herrero, Rosario / Piquero, Gemma / Mejias, Pedro M. et al. | 2003
- 645
-
Laser radiometry for UV lasers at 193 nm [4932-507]Kuck, S. / Liegmann, K. / Mostl, K. / Brandt, F. / Metzdorf, J. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 645
-
Laser radiometry for UV lasers at 193 nmKueck, Stefan / Liegmann, Klaus / Moestl, Klaus / Brandt, Friedhelm / Metzdorf, Juergen et al. | 2003
- 656
-
Laser beam and optics characterization with Z-scan methodTabiryan, Nelson V. / Jonnalagadda, Vinay / Mora, Manuel J. / Nersisyan, Sarik R. et al. | 2003
- 656
-
Laser beam and optics characterization with Z-scan method [4932-509]Tabiryan, N. V. / Jonnalagadda, V. / Mora, M. J. / Nersisyan, S. R. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 668
-
Characterization of capabilities of Z-scan technique for measuring divergence and astigmatism of laser beams (Abstract Only) [4932-510]Nersisyan, S. R. / Mora, M. J. / Tabiryan, N. V. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 668
-
Characterization of capabilities of Z-scan technique for measuring divergence and astigmatism of laser beams (Abstract Only)Nersisyan, Sarik R. / Mora, Manuel J. / Tabiryan, Nelson V. et al. | 2003
- 669
-
Phase space analyzer with Gaussian slits [4932-520]Serna, J. / Nemes, G. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 669
-
Phase space analyzer with Gaussian slitsSerna, Julio / Nemes, George et al. | 2003
- 677
-
Laser beam characterization in uniaxial crystals [4932-505]Cincotti, G. / Ciattoni, A. / Provenziani, D. / Palma, C. / Weber, H. / International Society for Optical Engineering / Wissenschaftische Gesellschaft Lasertechnik e.V / Universitat Stuttgart et al. | 2003
- 677
-
Laser beam characterization in uniaxial crystalsCincotti, Gabriella / Ciattoni, Alessandro / Provenziani, Damiano / Palma, Claudio / Weber, Horst et al. | 2003