Laterally heterogeneous optical films as design tools for reflectors and absorbers [5250-06] (Englisch)
- Neue Suche nach: Stenzel, O.
- Neue Suche nach: Kaiser, N.
- Neue Suche nach: Society of Photo-optical Instrumentation Engineers
- Neue Suche nach: Stenzel, O.
- Neue Suche nach: Kaiser, N.
- Neue Suche nach: Amra, C.
- Neue Suche nach: Kaiser, N.
- Neue Suche nach: Macleod, H. A.
- Neue Suche nach: Society of Photo-optical Instrumentation Engineers
In:
Advances in Optical Thin Films
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46-55
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2004
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Laterally heterogeneous optical films as design tools for reflectors and absorbers [5250-06]
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Beteiligte:Stenzel, O. ( Autor:in ) / Kaiser, N. ( Autor:in ) / Amra, C. / Kaiser, N. / Macleod, H. A. / Society of Photo-optical Instrumentation Engineers
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Kongress:Advances in Optical Thin Films ; 2003 ; St. Etienne, France
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Erschienen in:Advances in Optical Thin Films ; 46-55
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Verlag:
- Neue Suche nach: SPIE, the International Society for Optical Engineering:
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Erscheinungsort:Bellingham, Wash.:
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Erscheinungsdatum:01.01.2004
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Format / Umfang:10 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Density-related properties of metal oxide films (Invited Paper) [5250-01]Pulker, H. K. / Schlichtherle, S. S. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 1
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Density-related properties of metal oxide filmsPulker, Hans K. / Schlichtherle, Stefan S. et al. | 2004
- 12
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Optical thin films serving biotechnology: fluorescence enhancement of DNA-chipBarritault, Pierre / Getin, Stephane / Chaton, Patrick / Andre, Bernard / Vinet, Francoise / Fouque, Brigitte et al. | 2004
- 12
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Optical thin films serving biotechnology: fluorescence enhancement of DNA chip (Invited Paper) [5250-02]Barritault, P. / Getin, S. / Chaton, P. / Andre, B. / Vinet, F. / Fouque, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 21
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Metal island films for optics [5250-03]Heger, P. / Stenzel, O. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 21
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Metal island films for opticsHeger, Petra / Stenzel, Olaf / Kaiser, Norbert et al. | 2004
- 29
-
CdSe nanocrystals in sol-gelRabaste, Sebastien / Bellessa, Joel / Plenet, Jean-Claude / Spanhel, Lubomir et al. | 2004
- 29
-
CdSe nanocrystals in sol-gel microcavities [5250-04]Rabaste, S. / Bellessa, J. / Plenet, J.-C. / Spanhel, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 37
-
Interferential powders for the spectral control of light scatteringVoarino, Philippe / Deumie, Carole / Amra, Claude et al. | 2004
- 37
-
Interferential powders for the spectral control of light scattering [5250-05]Voarino, P. / Deumie, C. / Amra, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 46
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Laterally heterogeneous optical films as design tools for reflectors and absorbersStenzel, Olaf / Kaiser, Norbert et al. | 2004
- 46
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Laterally heterogeneous optical films as design tools for reflectors and absorbers [5250-06]Stenzel, O. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 56
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Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatterFlemming, Marcel / Hultaker, Annette / Reihs, Karsten / Duparre, Angela et al. | 2004
- 56
-
Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter [5250-07]Flemming, M. / Hultaker, A. / Reihs, K. / Duparre, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 64
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Design and fabrication of biperiodic AR gratings for the infrared [5250-08]Escoubas, L. / Loli, M. / Simon, J.-J. / Giovannini, H. / Flory, F. / Lemarquis, F. / Enoch, S. / Berginc, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 64
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Design and fabrication of biperiodic AR gratings for the infraredEscoubas, Ludovic / Loli, Michele / Simon, Jean-Jacques / Giovannini, Hugues / Flory, Francois / Lemarquis, Frederic / Enoch, Stefan / Berginc, Gerard et al. | 2004
- 72
-
New technological approach in phase-matched magneto-optic planar waveguide realization [5250-09]Royer, F. / Roux, H. / Jamon, D. / Rousseau, J.-J. / Zins, D. / Cabuil, V. / Bovier, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 72
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New technological approach in phase-matched magneto-optic planar waveguide realizationRoyer, Franeois / Roux, Hubert / Jamon, Damien / Rousseau, Jean Jacques / Zins, Daniel / Cabuil, Valerie / Bovier, Charles et al. | 2004
- 81
-
Technology trimming of a resonant multilayer laser polarizerAhmed, Marwan A. / Pommier, Jean Claude / Pigeon, Florent / Reynaud, Stephanie / Ouerdane, Youcef et al. | 2004
- 81
-
Technology trimming of a resonant multilayer laser polarizer [5250-10]Ahmed, M. A. / Pommier, J. C. / Pigeon, F. / Reynaud, S. / Ouerdane, Y. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 88
-
Study of ion-beam-sputtered Mo/Si mirrors for EUV lithography mask: influence of sputtering gasQuesnel, Etienne / Teyssier, Caroline / Muffato, Viviane / Thibault, Jany et al. | 2004
- 88
-
Study of ion-beam-sputtered Mo/Si mirrors for EUV lithography mask: influence of sputtering gas [5250-11]Quesnel, E. / Teyssier, C. / Muffato, V. / Thibault, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 99
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Ion-beam-deposited Mo/Si multilayers for EUV imaging applications in astrophysics [5250-12]Ravet, M.-F. / Bridou, F. / Zhang-Song, X. / Jerome, A. / Delmotte, F. / Mercier, R. / Bougnet, M. / Bouyries, P. / Delaboudiniere, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 99
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Ion beam deposited Mo/Si multilayers for EUV imaging applications in astrophysicsRavet, Marie-Francoise / Bridou, Francoise / Zhang-Song, Xueyan / Jerome, Arnaud / Delmotte, Franck / Mercier, Raymond / Bougnet, Marie / Bouyries, Philippe / Delaboudiniere, Jean-Pierre et al. | 2004
- 109
-
EUV and soft x-ray multilayer optics [5250-13]Kaiser, N. / Yulin, S. / Feigl, T. / Bernitzki, H. / Lauth, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 109
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EUV and soft x-ray multilayer opticsKaiser, Norbert / Yulin, Sergiy / Feigl, Torsten / Bernitzki, Helmut / Lauth, Hans et al. | 2004
- 119
-
Characterization of CaF~2 substrates for VUV fluoride coatings [5250-14]Hultaker, A. / Gliech, S. / Gessner, H. / Duparre, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 119
-
Characterization of CaF2substrates for VUV fluoride coatingsHultaker, Annette / Gliech, Stefan / Gessner, Henning / Duparre, Angela et al. | 2004
- 127
-
Development of mechanical stress in fluoride multilayers for UV applicationsThielsch, Roland / Heber, Joerg / Uhlig, Hein / Kaiser, Norbert et al. | 2004
- 127
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Development of mechanical stress in fluoride multilayers for UV applications [5250-15]Thielsch, R. / Heber, J. / Uhlig, H. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 137
-
157- and 193-nm scatter, R, and T measurement technique [5250-16]Gliech, S. / Gessner, H. / Hultaker, A. / Duparre, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 137
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157- and 193-nm scatter, R, and T measurement techniqueGliech, Stefan / Gessner, Henning / Hultaker, Annette / Duparre, Angela et al. | 2004
- 146
-
Radiation resistance of single- and multilayer coatings against synchrotron radiation [5250-17]Gunster, S. / Blaschke, H. / Ristau, D. / Danailov, M. / Trovo, M. / Gatto, A. / Kaiser, N. / Sarto, F. / Flori, D. / Menchini, F. et al. | 2004
- 146
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Radiation resistance of single and multilayer coatings against synchrotron radiationGuenster, Stefan / Blaschke, Holger / Ristau, Detlev / Danailov, Miltcho / Trovo, Mauro / Gatto, Alexandre / Kaiser, Norbert / Sarto, Francesca / Flori, Daniel / Menchini, F. et al. | 2004
- 158
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Photothermal analysis of submicrometric scale defects in laser damage studies (Invited Paper) [5250-19]Commandre, M. / Fossati, C. / Natoli, J. Y. / Amra, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 158
-
Photothermal analysis of submicrometric scale defects in laser damage studiesCommandre, Mireille / Fossati, Caroline / Natoli, Jean-Yves / Amra, Claude et al. | 2004
- 170
-
Large-area sol-gel optical coatings for the Megajoule Laser prototypePegon, Philippe M. / Germain, Chantal V. / Rorato, Yannick R. / Belleville, Philippe F. / Lavastre, Eric et al. | 2004
- 170
-
Large-area sol-gel optical coatings for the Megajoule Laser prototype [5250-20]Pegon, P. M. / Germain, C. V. / Rorato, Y. R. / Belleville, P. F. / Lavastre, E. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 182
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Multiple pulses laser irradiation study in silicaNatoli, Jean-Yves / Bertussi, Bertrand / Gallais, Laurent / Commandre, Mireille / Amra, Claude et al. | 2004
- 182
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Multiple-pulse laser irradiation study in silica: comparison between 1064 and 355 nm [5250-22]Natoli, J. Y. / Bertussi, B. / Gallais, L. / Commandre, M. / Amra, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 188
-
Method for the optical measurement of size and complex index of laser damage precursors in optical components [5250-23]Gallais, L. / Voarino, P. / Natoli, J.-Y. / Amra, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 188
-
Method for the optical measurement of size and complex index of laser damage precursors in optical componentsGallais, Laurent / Voarino, Philippe / Natoli, Jean-Yves / Amra, Claude et al. | 2004
- 196
-
How smooth chemistry allows high-power laser optical coating preparationBelleville, Philippe F. / Prene, Philippe / Bonnin, Claude / Beaurain, Laurence / Montouillout, Yves / Lavastre, Eric et al. | 2004
- 196
-
How smooth chemistry allows high-power laser optical coating preparation [5250-24]Belleville, P. F. / Prene, P. / Bonnin, C. / Beaurain, L. / Montouillout, Y. / Lavastre, E. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 203
-
R and AR optical coatings for high-power laser and for X, DUV, VIS, and IR wavelengths [5250-25]Dumartin, S. / Robert, P. / Hayer, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 203
-
R and AR optical coatings for high-power laser and for X, DUV, VIS, and IR wavelengthsDumartin, Serge / Robert, Patrick / Hayer, Laurent et al. | 2004
- 220
-
LIDT of the AR coatings on quartz and sapphire under different laser modesWang, Yingjian / Zhao, YuanAn / Gao, WeiDong / Fan, ZhengXiu et al. | 2004
- 220
-
LIDT of the AR coatings on quartz and sapphire under different laser modes [5250-26]Wang, Y. / Zhao, Y. / Gao, W. / Fan, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 229
-
Flux resistance degradation in resonant grating multilayer mirror [5250-27]Ahmed, M. A. / Pommier, J.-C. / Pigeon, F. / Parriaux, O. M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 229
-
Flux resistance degradation in resonant grating multilayer mirrorAhmed, Marwan A. / Pommier, Jean Claude / Pigeon, Florent / Parriaux, Olivier M. et al. | 2004
- 234
-
Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidenceNevas, Saulius / Manoocheri, Farshid / Ikonen, Erkki / Tikhonravov, Alexander V. / Kokarev, Michail A. / Trubetskov, Michail K. et al. | 2004
- 234
-
Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence [5250-30]Nevas, S. / Manoocheri, F. / Ikonen, E. / Tikhonravov, A. V. / Kokarev, M. A. / Trubetskov, M. K. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 243
-
Optical and structural inhomogeneity in reactive evaporated and IAD CeO2films analyzed by x-ray diffraction and reverse optical engineeringThielsch, Roland et al. | 2004
- 243
-
Optical and structural inhomogeneity in reactive evaporated and IAD CeO~2 films analyzed by x-ray diffraction and reverse optical engineering [5250-31]Thielsch, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 254
-
Characterization of multilayer dielectric coatings by ellipsometry and x-ray grazing incidence reflectometry [5250-32]Tonova, D. A. / von Blanckenhagen, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 254
-
Characterization of multilayer dielectric coatings by ellipsometry and x-ray grazing incidence reflectometryTonova, Diana A. / von Blanckenhagen, Bernhard et al. | 2004
- 263
-
Magneto-optical properties of yttrium iron garnet (YIG) thin films elaborated by radio frequency sputteringBoudiar, Toufik / Payet-Gervy, Beatrice / Blanc-Mignon, Marie-Francoise / Rousseau, Jean-Jacques / Le Berre, Martine / Joisten, H. / Canut, Bruno et al. | 2004
- 263
-
Magneto-optical properties of yttrium iron garnet (YIG) thin films elaborated by radio frequency sputtering [5250-33]Boudiar, T. / Payet-Gervy, B. / Blanc-Mignon, M.-F. / Rousseau, J.-J. / Le Berre, M. / Joisten, H. / Canut, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 271
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Colorimetric properties of the light scattered by various objectsLequime, Michel / Abel, Laetitia / Deumie, Carole et al. | 2004
- 271
-
Colorimetric properties of the light scattered by various objects [5250-34]Lequime, M. / Abel, L. / Deumie, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 278
-
δn/δt measurements of sol-gel ZrO2thin filmsElalamy, Ziyad / Drouard, Emmanuel / Escoubas, Ludovic / Flory, Francois / Mc. Govern, Teresa / Simon, Jean-Jacques et al. | 2004
- 278
-
deltan/deltat measurements of sol-gel ZrO~2 thin films [5250-35]Elalamy, Z. / Drouard, E. / McGovern, T. / Escoubas, L. / Simon, J.-J. / Flory, F. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 286
-
Structural and optical characterizations of sol-gel-derived europium-doped YAG materials: powders and filmsBoyer, Damien / Bertrand-Chadeyron, Genevieve / Mahiou, Rachid et al. | 2004
- 286
-
Structural and optical characterizations of sol-gel-derived europium-doped YAG materials: powders and films [5250-36]Boyer, D. / Bertrand-Chadeyron, G. / Mahiou, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 294
-
Optical characterization of pulsed-laser-deposited LiNbO~3 waveguides [5250-37]Di Bin, P. / Di Bin, C. / Bouibrine, I. / Canale, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 294
-
Optical characterization of pulsed-laser-deposited LiNbO3waveguidesDi Bin, Philippe / Di Bin, Catherine / Bouibrine, Ismail / Canale, Laurent et al. | 2004
- 302
-
Tunable thin film filters: review and perspectivesLequime, Michel et al. | 2004
- 302
-
Tunable thin film filters: review and perspectives (Invited Paper) [5250-38]Lequime, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 312
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Key role of coating total optical thickness in solving design problems (Invited Paper) [5250-39]Tikhonravov, A. V. / Trubetskov, M. K. / Amotchkina, T. V. / Kokarev, M. A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 312
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Key role of the coating total optical thickness in solving design problemsTikhonravov, Alexander V. / Trubetskov, Michael K. / Amotchkina, Tatiana V. / Kokarev, Michael A. et al. | 2004
- 322
-
PVD coating for optical applications on temperature-resistant thermoplasticsMunzert, Peter / Schulz, Ulrike / Kaiser, Norbert et al. | 2004
- 322
-
PVD coating for optical applications on temperature-resistant thermoplastics [5250-40]Munzert, P. / Schuiz, U. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 331
-
Aging under mechanical stress: first experiments and related simulations for a silver-based multilayer mirrorLalo, Arnaud / Ravel, Guillaume / Ignat, Michel / Cousin, Bernard / Swain, Michael V. et al. | 2004
- 331
-
Aging under mechanical stress: first experiments and related simulations for a silver- based multilayer mirror [5250-41]Lalo, A. / Ravel, G. / Ignat, M. / Cousin, B. / Swain, M. V. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 343
-
Metal-dielectric coatings for variable transmission filters with wide rejection bandsPiegari, Angela M. / Janicki, Vesna et al. | 2004
- 343
-
Metal-dielectric coatings for variable transmission filters with wide rejection bands [5250-42]Piegari, A. M. / Janicki, V. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 349
-
Thin film approach for pi achromatic phase shifters [5250-43]Lemarquis, F. / Riaud, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 349
-
Thin film approach for π achromatic phase shiftersLemarquis, Frederic / Riaud, Pierre et al. | 2004
- 357
-
Multicycle AR coatings: a theoretical approach [5250-44]Schallenberg, U. B. / Schulz, U. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 357
-
Multicycle AR coatings: a theoretical approachSchallenberg, Uwe B. / Schulz, Ulrike / Kaiser, Norbert et al. | 2004
- 367
-
Spatial distribution of electric energy in multilayer and inhomogeneous dielectric mirrors [5250-45]Karyaev, K. V. / Putilin, E. S. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 367
-
Spatial distribution of electric energy in multilayer and inhomogeneous dielectric mirrorsKaryaev, Konstantin V. / Putilin, Edward S. et al. | 2004
- 378
-
Simple technique for the accurate design of square bandpass WDM interference filters [5250-46]Verly, P. G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 378
-
Simple technique for the accurate design of square bandpass WDM interference filtersVerly, Pierre G. et al. | 2004
- 384
-
Cascaded solid-spaced filters for DWDM applications [5250-47]Floriot, J. / Lemarchand, F. / Lequime, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 384
-
Cascaded solid-spaced filters for DWDM applicationsFloriot, Johan / Lemarchand, Fabien / Lequime, Michel et al. | 2004
- 393
-
Refined criteria for estimating limits of broadband AR coatings [5250-48]Willey, R. R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 393
-
Refined criteria for estimating limits of broadband AR coatingsWilley, Ronald R. et al. | 2004
- 400
-
Monitoring the last two (AR) layers in narrow-bandpass filtersWilley, Ronald R. et al. | 2004
- 400
-
Monitoring the last two (AR) layers in narrow-bandpass filfers [5250-49]Willey, R. R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 406
-
Online characterization and reoptimization of optical coatings [5250-50]Tikhonravov, A. V. / Trubetskov, M. K. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 406
-
Online characterization and reoptimization of optical coatingsTikhonravov, Alexander V. / Trubetskov, Michael K. et al. | 2004
- 414
-
Fully automated inline sputtering for optical coatings [5250-51]List, M. / Melde, C. / Strumpfel, J. / Illgen, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 414
-
Fully automated inline sputtering for optical coatingsList, Matthias / Melde, Christian / Struempfel, Johannes / Illgen, Claus et al. | 2004
- 423
-
High-refractive-index polymer coatings for optoelectronics applications [5250-53]Flaim, T. D. / Wang, Y. / Mercado, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 423
-
High-refractive-index polymer coatings for optoelectronics applicationsFlaim, Tony D. / Wang, Yubao / Mercado, Ramil et al. | 2004
- 435
-
Manufacturing of four-quadrant phase mask for nulling interferometry in the thermal infraredLemarquis, Frederic / Lequime, Michel / Albrand, Gerard / Escoubas, Ludovic / Simon, Jean-Jacques / Baudrand, Jacques / Riaud, Pierre / Rouan, Daniel / Boccaletti, Anthony / Baudoz, Pierre et al. | 2004
- 435
-
Manufacturing of four-quadrant phase mask for nulling interferometry in the thermal infrared [5250-54]Lemarquis, F. / Lequime, M. / Albrand, G. / Escoubas, L. / Simon, J.-J. / Baudrand, J. / Riaud, P. / Rouan, D. / Boccaletti, A. / Baudoz, P. et al. | 2004
- 444
-
Preparation, characterization, and luminescence properties of Pr3+-doped CaTiO3films processed by dip coatingPinel, Eric / Boutinaud, Philippe / Bertrand, Genevieve / Mahiou, Rachid et al. | 2004
- 444
-
Preparation, characterization, and luminescence properties of Pr^3^+-doped CaTiO~3 films processed by dip coating [5250-55]Pinel, E. / Boutinaud, P. / Bertrand, G. / Mahiou, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 452
-
Submicrometer scale growth morphology control: a new route for the making of photonic crystal structures? [5250-56]Gil-Lafon, E. / Trassoudaine, A. / Castelluci, D. / Pimpinelli, A. / Saoudi, R. / Parriaux, O. M. / Muravaud, A. / Darraud, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 452
-
Submicrometer scale growth morphology control: a new route for the making of photonic crystal structures?Gil-Lafon, Evelyne / Trassoudaine, Agnes / Castelluci, Dominique / Pimpinelli, Alberto / Saoudi, Rachida / Parriaux, Olivier M. / Muravaud, Alain / Darraud, Claire et al. | 2004
- 462
-
Optical bonding of high-refractive-index semiconductors using index-matched chalcogenide glassMcBrearty, Euan J. / Mason, Paul / Orchard, David / Harris, Michael / Lewis, Keith et al. | 2004
- 462
-
Optical bonding of high-refractive-index semiconductors using index-matched chalcogenide glass [5250-57]McBrearty, E. J. / Mason, P. D. / Orchard, D. A. / Harris, M. R. / Lewis, K. L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 471
-
Development of dielectric and amorphous-silicon-based thin film coatings for room- and cryogenic temperature applicationsPoirier, Michel / Ilias, Samir / Thibault, Simon / Topart, Patrice / Jerominek, Hubert et al. | 2004
- 471
-
Development of dielectric and amorphous-silicon-based thin film coatings for room- and cryogenic temperature applications [5250-62]Poirier, M. / Ilias, S. / Thibault, S. / Topart, P. / Jerominek, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 483
-
Low-loss coatings for the VIRGO large mirrors (Invited Paper) [5250-58]Beauville, F. / Buskulic, D. / Flaminio, R. / Marion, F. / Masserot, A. / Massonnet, L. / Mours, B. / Moreau, F. / Ramonet, J. / Tournefier, E. et al. | 2004
- 483
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Low-loss coatings for the VIRGO large mirrorsBeauville, F. / Buskulic, D. / Flaminio, R. / Marion, F. / Masserot, A. / Massonnet, L. / Mours, B. / Moreau, F. / Ramonet, J. / Tournefier, E. et al. | 2004
- 493
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Solutions for high-productivity high-performance coating systemsHagedorn, Harro et al. | 2004
- 493
-
Solutions for high-productivity high-performance coating systems (Invited Paper) [5250-59]Hagedorn, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 502
-
Silicon oxynitride rugate filters grown by reactive pulse magnetron sputteringBartzsch, Hagen / Lange, Stephan / Frach, Peter / Goedicke, Klaus et al. | 2004
- 502
-
Silicon oxynitride rugate filters grown by reactive pulse magnetron sputtering [5250-60]Bartzsch, H. / Lange, S. / Frach, P. / Goedicke, K. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 511
-
Metal-dielectric light absorbers manufactured by ion platingCathelinaud, Michel / Lemarquis, Frederic / Loesel, Jacques / Cousin, Bernard et al. | 2004
- 511
-
Metal-dielectric light absorbers manufactured by ion plafing [5250-61]Cathelinaud, M. / Lemarquis, F. / Loesel, J. / Cousin, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 519
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Ion-assisted deposition processes for precision and laser optics [5250-64]Ehlers, H. / Gross, T. / Lappschies, M. / Ristau, D. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 519
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Ion-assisted deposition processes for precision and laser opticsEhlers, Henrik / Gross, Tobias / Lappschies, Marc / Ristau, Detlev et al. | 2004
- 528
-
Molecular-ion-beam-assisted deposition of stable SiOF films [5250-65]Scherer, K. / Lacan, P. / Brunet-Bruneau, A. / Cado, H. / Keller, G. J. / Bosmans, R. / Rivory, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 528
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Molecular-ion-beam-assisted deposition of stable SiOF filmsScherer, Karin / Lacan, Pascale / Brunet-Bruneau, Aline / Cado, Herve / Keller, Gerhard J. / Bosmans, Richard / Rivory, Josette et al. | 2004
- 537
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Highly mechanical-damage-resistant sol-gel coating for high-power lasers [5250-21]Ferrara, M. C. / Perrone, M. R. / Protopapa, M. L. / Sancho-Parramon, J. / Bosch, S. / Mazzarelli, S. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 537
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High mechanical-damage-resistant sol-gel coating for high-power lasersFerrara, Maria Cristina / Perrone, Maria R. / Protopapa, Maria L. / Sancho-Parramon, Jordi / Bosch, Salvador / Mazzarelli, Saverio et al. | 2004
- 546
-
Determination of refractive index profile of ZrO2on amorphous and pre-evaporated substrates by reverse engineeringJanicki, Vesna / Zorc, Hrvoje et al. | 2004
- 546
-
Determination of refractive index profile of ZrO~2 on amorphous and pre-evaporated substrates by reverse engineering [5250-67]Janicki, V. / Zorc, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 554
-
The main thesis of the light transmittance law [5250-68]Ciosek, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 554
-
The main thesis of the light transmittance lawCiosek, Jerzy et al. | 2004
- 560
-
Thick silver coating deposited by DC magnetron sputteringTuan, Pham H. / Cu, Dang X. et al. | 2004
- 560
-
Thick silver coating deposited by DC magnetron sputtering [5250-69]Tuan, P. H. / Cu, D. X. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 564
-
Design, preparation, and characterization of high-performance narrow-bandpass filters for the infrared range [5250-70]Perez, G. / Genova, I. / Alvarado, C. G. / Sanz, J. M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 564
-
Design, preparation, and characterization of high-performance narrow-bandpass filters for the infrared rangePerez, Gloria / Genova, Ines / Alvarado, Concepcion G. / Sanz, Jose Maria et al. | 2004
- 575
-
Correlation between laser-induced-damage and nanosized absorbing defectsBertussi, Bertrand / Natoli, Jean-Yves / During, Annelise / Commandre, Mireille / Gallais, Laurent / Rullier, Jean Luc / Bercegol, Herve / Bouchut, Philippe et al. | 2004
- 575
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Correlation between laser-induced damage and nanosized absorbing defects [5250-73]Bertussi, B. / Natoli, J.-Y. / During, A. / Commandre, M. / Gallais, L. / Rullier, J.-L. / Bercegol, H. / Bouchut, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 581
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Preparation and characterization of sol-gel-derived YAG optical planar waveguide [5250-74]Wu, Y.-C. / Parola, S. / Mugnier, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 581
-
Preparation and characterization of sol-gel-derived YAG optical planar waveguideWu, Yuchun / Parola, Stephane / Mugnier, Jacques et al. | 2004
- 589
-
High-quality sol-gel thin films: elaboration, studies in waveguiding configuration, and application to sol-gel scintillators [5250-75]Mugnier, J. / Le Luyer, C. / Murillo, A. G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 589
-
High-quality sol-gel thin films: elaboration, studies in waveguiding configuration, and application to sol-gel scintillatorsMugnier, Jacques / Le Luyer, Cecile / Garcia Murillo, Antonieta et al. | 2004
- 597
-
Photothermal facility for optical characterization of DUV materialsGallais, Laurent / Hinsch, Hauke / Lay, Man-Long / Commandre, Mireille et al. | 2004
- 597
-
Photothermal facility for optical characterization of DUV materials [5250-77]Gallais, L. / Hinsch, H. / Lay, M.-L. / Commandre, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 603
-
Wafer-scale measurement of the modes of a dielectric multilayer [5250-79]Ahmed, M. A. / Pigeon, F. / Parriaux, O. M. / Tonchev, S. H. / Lyndin, N. M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 603
-
Wafer-scale measurement of the modes of a dielectric multilayerAhmed, Marwan A. / Pigeon, Florent / Parriaux, Olivier M. / Tonchev, Svetlen H. / Lyndin, Nikolay M. et al. | 2004
- 609
-
Optimization of the strength of a graded-index slab waveguide gratingMontalien, Olivier / Brioude, Valerie / Tishchenko, Alexandre V. / Parriaux, Olivier M. et al. | 2004
- 609
-
Optimization of the strength of a graded-index slab waveguide grating [5250-80]Montalien, O. / Brioude, V. / Tishchenko, A. V. / Parriaux, O. M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 619
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Use of online spectrophotometric data for the characterisation of VUV coatingsSancho-Parramon, Jordi / Bosch, Salvador / Ferre-Borrull, Josep / Guenster, Stefan / Ristau, Detlev et al. | 2004
- 619
-
Use of online spectrophotometric data for the characterization of VUV coatings [5250-81]Sancho-Parramon, J. / Bosch, S. / Ferre-Borrull, J. / Gunster, S. / Ristau, D. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 627
-
VUV mirrors for the (80-120 nm) spectral range [5250-82]Bridou, F. / Cuniot-Ponsard, M. / Desvignes, J. M. / Maksimovic, I. / Lemaire, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 627
-
VUV mirrors for the (80-120 nm) spectral rangeBridou, Francoise / Cuniot-Ponsard, Mireille / Desvignes, Jean-Michel / Maksimovic, Ivan / Lemaire, Philippe et al. | 2004
- 637
-
Broadband optical monitoring for the deposition of complex coatings [5250-84]Lappschies, M. / Gross, T. / Ehlers, H. / Ristau, D. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 637
-
Broadband optical monitoring for the deposition of complex coating designsLappschies, Marc / Gross, Tobias / Ehlers, Henrik / Ristau, Detlev et al. | 2004
- 646
-
Ion-assisted deposition processes: industrial network IntIonEhlers, Henrik / Becker, Karl-Josef / Beckmann, Rudolf / Beermann, Nils / Brauneck, Ulf / Fuhrberg, Peter / Gaebler, Dieter / Jakobs, Stefan / Kaiser, Norbert / Kennedy, Michael et al. | 2004
- 646
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Ion-assisted deposition processes: industrial network Intlon [5250-85]Ehlers, H. / Becker, K. / Beckmann, R. / Beermann, N. / Brauneck, U. / Fuhrberg, P. / Gabler, D. / Jakobs, S. / Kaiser, N. / Kennedy, M. et al. | 2004
- 656
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Laser-induced damage measurements on phase-unifying mirrors for XeF excimer laser cavitiesProtopapa, Maria Lucia / Perrone, Maria Rita / Piegari, Angela M. / Andre, Bernard / Ravel, Guillaume et al. | 2004
- 656
-
Laser-induced damage measurements on phase-unifying mirrors for XeF excimer laser cavities [5250-86]Protopapa, M. L. / Perrone, M. R. / Piegari, A. M. / Andre, B. / Ravel, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 663
-
High-precision longpass filter arrays for miniature spectrometers [5250-87]Jakobs, S. / Schallenberg, U. B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 663
-
High-precision longpass filter arrays for miniature spectrometersJakobs, Stefan / Schallenberg, Uwe B. et al. | 2004
- 670
-
Determination of optical parameters of phthalocyanine LB films based on reflection property of p-polarized beam [5250-88]Gu, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 670
-
Determination of optical parameters of phthalocyanine LB films based on reflection property of p-polarized beamGu, Zhengtian et al. | 2004
- 676
-
Effect of substrate temperature on optical properties of EB-PVD-deposited silicon oxynitride thin films [5250-90]Mohite, K. C. / Nouveau, C. / Pawar, S. T. / Pawar, B. N. / Jadkar, S. R. / Takwale, M. G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 676
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Effect of substrate temperature on optical properties of EB-PVD-deposited silicon oxynitride thin filmsMohite, K. C. / Nouveau, C. / Pawar, S. T. / Pawar, B. N. / Jadkar, S. R. / Takwale, M. G. et al. | 2004
- 691
-
Uniformity analysis and design optimization of multilayer thin film filters used in fiber optics communication systemsYang, Minghong / Liu, Jinsong / Chen, Qingming / Zhang, Bo et al. | 2004
- 691
-
Uniformity analysis and design optimization of multilayer thin film filters used in fiber optics communication systems [5250-92]Yang, M. / Liu, J. / Chen, Q. / Zhang, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 697
-
Low-intensity scatterering detection with commercial spectrophotometersMasetti, Enrico / Krasilnikova, Anna / Bulir, Jiri / Ferre-Borrul, Josep et al. | 2004
- 697
-
Low-intensity scatterering detection with commercial spectrophotometers [5250-93]Masetti, E. / Krasilnikova, A. / Bulir, J. / Ferre-Borrul, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004