Scientific and Technological Issues Related to Rare Earth Oxides: An Introduction (Englisch)
- Neue Suche nach: Scarel, G.
- Neue Suche nach: Svane, A.
- Neue Suche nach: Fanciulli, M.
- Neue Suche nach: Scarel, G.
- Neue Suche nach: Svane, A.
- Neue Suche nach: Fanciulli, M.
- Neue Suche nach: Fanciulli, M.
- Neue Suche nach: Scarel, Giovanna
In:
Rare earth oxide thin films : growth, characterization, and applications
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1-14
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2007
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Scientific and Technological Issues Related to Rare Earth Oxides: An Introduction
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Beteiligte:Scarel, G. ( Autor:in ) / Svane, A. ( Autor:in ) / Fanciulli, M. ( Autor:in ) / Fanciulli, M. / Scarel, Giovanna
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Kongress:European workshop, Rare earth oxide thin films : growth, characterization, and applications ; 2005 ; Sanremo, Italy
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Erschienen in:TOPICS IN APPLIED PHYSICS ; 106 ; 1-14
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Verlag:
- Neue Suche nach: Springer
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Erscheinungsort:Berlin
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Erscheinungsdatum:01.01.2007
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Format / Umfang:14 pages
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Anmerkungen:International conference proceedings. Includes bibliographical references and index.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Scientific and Technological Issues Related to Rare Earth Oxides: An IntroductionScarel, G. / Svane, A. / Fanciulli, M. et al. | 2007
- 15
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Atomic Layer Deposition of Rare Earth OxidesPaivasaari, J. / Niinisto, J. / Myllymaki, P. / Dezelah, C. / Winter, C. H. / Putkonen, M. / Nieminen, M. / Niinisto, L. et al. | 2007
- 33
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MOCVD Growth of Rare Earth Oxides: The Case of the Praseodymium/Oxygen SystemNigro, R. L. / Malandrino, G. / Toro, R. G. / Fragala, I. L. et al. | 2007
- 53
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Requirements of Precursors for MOCVD and ALD of Rare Earth OxidesAspinall, H. C. et al. | 2007
- 73
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Models of ALD and MOCVD Growth of Rare Earth OxidesElliott, S. D. et al. | 2007
- 87
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Growth of Oxides with Complex Stoichiometry by the ALD Technique, Exemplified by Growth of La~1~-~xCa~xMnO~3Nilsen, O. / Lie, M. / Fjellvag, H. F. / Kjekshus, A. et al. | 2007
- 101
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Molecular Beam Epitaxy of Rare-Earth OxidesOsten, H. J. / Bugiel, E. / Czernohorsky, M. / Elassar, Z. / Kirfel, O. / Fissel, A. et al. | 2007
- 115
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Fabrication and Characterization of Rare Earth Scandate Thin Films Prepared by Pulsed Laser DepositionSchubert, J. / Heeg, T. / Wagner, M. et al. | 2007
- 127
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Film and Interface Layer Composition of Rare Earth (Lu, Yb) Oxides Deposited by ALDLebedinskii, Y. / Zenkevich, A. / Scarel, G. / Fanciulli, M. et al. | 2007
- 143
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Local Atomic Environment of High-kappa Oxides on Silicon Probed by X-Ray Absorption SpectroscopyMalvestuto, M. / Boscherini, F. et al. | 2007
- 153
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Local Structure, Composition and Electronic Properties of Rare Earth Oxide Thin Films Studied Using Advanced Transmission Electron Microscopy Techniques (TEM-EELS)Schamm, S. / Scarel, G. / Fanciulli, M. et al. | 2007
- 179
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Strain-Relief at Internal Dielectric Interfaces in High-kappa Gate Stacks with Transition Metal and Rare Earth Atom Oxide DielectricsLucovsky, G. / Phillips, J. C. et al. | 2007
- 203
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Electrical Characterization of Rare Earth Oxides Grown by Atomic Layer DepositionSpiga, S. / Wiemer, C. / Scarel, G. / Costa, O. / Fanciulli, M. et al. | 2007
- 225
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Dielectric Properties of Rare-Earth Oxides: General Trends from TheoryDelugas, P. / Fiorentini, V. / Filippetti, A. et al. | 2007
- 247
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Charge Traps in High-kappa Dielectrics: Ab Initio Study of Defects in Pr-Based MaterialsDabrowski, J. / Fleszar, A. / Lippert, G. / Lupina, G. / Mane, A. / Wenger, C. et al. | 2007
- 269
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Experimental Determination of the Band Offset of Rare Earth Oxides on Various SemiconductorsSeguini, G. / Perego, M. / Fanciulli, M. et al. | 2007
- 285
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Band Edge Electronic Structure of Transition Metal/Rare Earth Oxide DielectricsLucovsky, G. et al. | 2007
- 313
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Electronic Structure and Band Offset of Lanthanide OxidesRobertson, J. / Xiong, K. et al. | 2007
- 331
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Electronic Structure of Rare Earth OxidesPetit, L. / Svane, A. / Szotek, Z. / Temmerman, W. M. et al. | 2007
- 345
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Rare Earth Oxides in MicroelectronicsKakushima, K. / Tsutsui, K. / Ohmi, S.-I. / Ahmet, P. / Rao, V. R. / Iwai, H. et al. | 2007
- 367
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Requirements of Oxides as Gate Dielectrics for CMOS DevicesBersuker, G. / Zeitzoff, P. et al. | 2007
- 379
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Rare Earth Oxides Grown by Molecular Beam Epitaxy for Ultimate ScalingDimoulas, A. et al. | 2007
- 391
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The Magneto-Electric Properties of RMnO~3 CompoundsPalstra, T. T. M. et al. | 2007
- 401
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Sesquioxides as Host Materials for Rare-Earth-Doped Bulk Lasers and Active WaveguidesBar, S. / Scheife, H. / Petermann, K. / Huber, G. et al. | 2007