Performance-Energy Tradeoffs for Matrix Multiplication on FPGA-Based Mixed-Mode Chip Multiprocessors (Englisch)
- Neue Suche nach: Wang, X.
- Neue Suche nach: Ziavras, S.G.
- Neue Suche nach: Wang, X.
- Neue Suche nach: Ziavras, S.G.
In:
Quality electronic design; ISQED 2007
;
386-391
;
2007
-
ISBN:
- Aufsatz (Konferenz) / Print
-
Titel:Performance-Energy Tradeoffs for Matrix Multiplication on FPGA-Based Mixed-Mode Chip Multiprocessors
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Beteiligte:Wang, X. ( Autor:in ) / Ziavras, S.G. ( Autor:in ) / IEEE Electron Devices Society; IEEE Circuits and Systems Society; Synopsys (Firm)
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Kongress:INTERNATIONAL SYMPOSIUM; 8th, Quality electronic design; ISQED 2007 ; 2007 ; San Jose, Calif
-
Erschienen in:Quality electronic design; ISQED 2007 ; 386-391
-
Verlag:
- Neue Suche nach: IEEE Computer Society
-
Erscheinungsort:Los Alamitos, Calif.
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Erscheinungsdatum:01.01.2007
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Format / Umfang:6 pages
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Anmerkungen:Includes bibliographical references and author index
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ISBN:
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Medientyp:Aufsatz (Konferenz)
-
Format:Print
-
Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
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Transferring Optical Proximity Correction (OPC) Effect into Optical ModeLi, Jianliang / Yan, Qiliang / Melvin III, Lawrence S. et al. | 2007
- 776
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OPC-Friendly De-Compaction with Timing Constraints for Standard Cell LayoutsIizuka, Tetsuya / Ikeda, Makoto / Asada, Kunihiro et al. | 2007
- 782
-
An Automated and Fast OPC Algorithm for OPC-Aware Layout DesignChen, Ye / Shi, Zheng / Yan, Xiaolang et al. | 2007
- 788
-
A New Method of Implementing Hierarchical OPCZhang, Yufu / Shi, Zheng et al. | 2007
- 795
-
A New Flexible Algorithm for Random Yield ImprovementSinha, Subarna / Su, Qing / Wen, Linni / Lee, Frank / Chiang, Charles / Cheng, Yi-Kan / Lin, Jin-Lien / Harn, Yu-Chyi et al. | 2007
- 801
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Expression of Concern: Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process VariationsNieuwoudt, Arthur / Ragheb, Tamer / Nejati, Hamid / Massoud, Yehia et al. | 2007
- 801
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Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process VariationsNieuwoudt, A. / Ragheb, T. / Nejati, H. / Massoud, Y. / IEEE Electron Devices Society; IEEE Circuits and Systems Society; Synopsys (Firm) et al. | 2007
- 814
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Process Variation Tolerant Standard Cell Library Development Using Reduced Dimension Statistical Modeling and Optimization TechniquesBasu, Shubhankar / Thakore, Priyanka / Vemuri, Ranga et al. | 2007
- 821
-
Redundant Via Insertion in Restricted Topology LayoutsMcCullen, Kevin et al. | 2007
- 829
-
Recursive Function Smoothing of Half-Perimeter Wirelength for Analytical PlacementLi, Chen / Koh, Cheng-Koh et al. | 2007
- 835
-
Congestion Driven Buffer Planning for X-ArchitectureBai, Hongjie / Dong, Sheqin / Hong, Xianlong et al. | 2007
- 841
-
Probabilistic Congestion Prediction with Partial BlockagesLi, Zhuo / Alpert, Charles J. / Quay, Stephen T. / Sapatnekar, Sachin / Shi, Weiping et al. | 2007
- 847
-
OPC-Friendly Bus Driven FloorplanningXiang, Hua / Deng, Liang / Huang, Li-Da / Wong, Martin D.F. et al. | 2007
- 853
-
Power-Gating Aware FloorplanningJiang, Hailin / Marek-Sadowska, Malgorzata et al. | 2007
- 861
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Optimizing Checking-Logic for Reliability-Agnostic Control of Self-Calibrating DesignsWorm, Frederic / Thiran, Patrick / Ienne, Paolo et al. | 2007
- 867
-
An Infrastructure IP for Online Testing of Network-on-Chip Based SoCsBhojwani, Praveen / Mahapatra, Rabi N. et al. | 2007
- 873
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Expression of Concern: Provisioning On-Chip Networks under Buffered RC Interconnect Delay VariationsMondal, Mosin / Ragheb, Tamer / Wu, Xiang / Aziz, Adnan / Massoud, Yehia et al. | 2007
- 873
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Provisioning On-Chip Networks under Buffered RC Interconnect Delay VariationsMondal, M. / Ragheb, T. / Wu, X. / Aziz, A. / Massoud, Y. / IEEE Electron Devices Society; IEEE Circuits and Systems Society; Synopsys (Firm) et al. | 2007
- 879
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Virtual Channels Planning for Networks-on-ChipHuang, Ting-Chun / Ogras, Umit Y. / Marculescu, Radu et al. | 2007
- 885
-
A 3D-Layout Aware Binding Algorithm for High-Level Synthesis of Three-Dimensional Integrated CircuitsKrishnan, Vyas / Katkoori, Srinivas et al. | 2007
- 893
-
MARS-S: Modeling and Reduction of Soft Errors in Sequential CircuitsMiskov-Zivanov, Natasa / Marculescu, Diana et al. | 2007
- 899
-
An SEU-Tolerant Programmable Frequency DividerWang, Liang / Yue, Suge / Zhao, Yuanfu / Fan, Long et al. | 2007
- 905
-
A TMR Scheme for SEU Mitigation in Scan Flip-FlopsOliveira, Roystein / Jagirdar, Aditya / Chakraborty, Tapan J. et al. | 2007
- 911
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Variation Impact on SER of Combinational CircuitsRamakrishnan, K. / Rajaraman, R. / Suresh, S. / Vijaykrishnan, N. / Xie, Y. / Irwin, M.J. et al. | 2007
- 917
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MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple EnvironmentsHescott, Christian J. / Ness, Drew C. / Lilja, David J. et al. | 2007
- 923
-
Author index| 2007
- 928
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Participating Organizations| 2007
- 929
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Best Paper Award| 2007
- 930
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ISQED 2008 Call for Papers| 2007
- 1255
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Guest editorialDe Venuto, D. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1274
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Modelling of hot-carrier degradation and its application for analog design for reliabilityDubois, B. / Kammerer, J. B. / Hebrard, L. / Braun, F. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1281
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A DC offset and CMRR analysis in a CMOS 0.35mm operational transconductance amplifier using Pelgroms area/accuracy tradeoffMartinez Brito, J. P. / Bampi, S. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1293
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Fault diagnosis and test of DNA sensor arrays by using IFA approachDe Venuto, D. / Ricco, B. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1300
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Postprocessing, readout and packaging methods for integrated gas flow sensorsBruschi, P. / Piotto, M. / Bacci, N. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1308
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A two electrode C-NiO Nafion amperometric sensor for NO2 detectionFort, A. / Lotti, C. / Mugnaini, M. / Palombari, R. / Rocchi, S. / Vignoli, V. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1313
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Ultra-low-power biopotential interfaces and their applications in wearable and implantable systemsYazicioglu, R. F. / Torfs, T. / Merken, P. / Penders, J. / Leonov, V. / Puers, R. / Gyselinckx, B. / Van Hoof, C. / IEEE Electron Devices Society / IEEE Circuits and Systems Society et al. | 2007
- 1322
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Wired and wireless sensor networks for industrial applicationsFlammini, A. / Ferrari, P. / Marioli, D. / Sisinni, E. / Taroni, A. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1337
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Photovoltaic scavenging systems: Modeling and optimizationBrunelli, D. / Dondi, D. / Bertacchini, A. / Larcher, L. / Pavan, P. / Benini, L. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1345
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Smart sensors for fast biological analysisLanzoni, M. / Stagni, C. / Ricco, B. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1350
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Design, qualification and production of integrated sensor interface circuits for high-quality automotive applicationsOhletz, M. J. / Schulze, F. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1358
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Design of an integrated low-noise read-out system for DNA capacitive sensorsDe Venuto, D. / Carrara, S. / Ricco, B. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1366
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Thermal investigations of integrated circuits in systems at THERMINIC'07Rencz, M. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1367
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Joule expansion imaging techniques on microlectronic devicesGrauby, S. / Patino Lopez, L. D. / Salhi, A. / Puyoo, E. / Rampnoux, J. M. / Claeys, W. / Dilhaire, S. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1373
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Quantification of thermoreflectance temperature measurements in high-power semiconductor devices-lasers and laser barsPierscinski, K. / Pierscinska, D. / Bugajski, M. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1379
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Comparison of transient and static test methods for chip-to-sink thermal interface characterizationSmith, B. / Brunschwiler, T. / Michel, B. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1387
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A novel system for displacement sensing, integrated on a plastic substratePetropoulos, A. / Kaltsas, G. / Goustouridis, D. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1393
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Micro-hotplates for thermal characterisation of structural materials of MEMSCsikvari, P. / Furjes, P. / Ducs, C. / Barsony, I. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1398
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One-dimensional modeling of TE devices considering temperature-dependent parameters using SPICEMitrani, D. / Salazar, J. / Turo, A. / Garcia, M. J. / Chavez, J. A. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1406
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Transient distributed parameter electrical analogous model of TE devicesMitrani, D. / Salazar, J. / Turo, A. / Garcia, M. J. / Chavez, J. A. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- 1411
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Dynamic electrothermal simulation of integrated resistors at device levelVermeersch, B. / De Mey, G. / IEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007
- c1
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8th International Symposium on Quality Electronic Design-Cover| 2007
- i
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8th International Symposium on Quality Electronic Design-Title| 2007
- iv
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8th International Symposium on Quality Electronic Design-Copyright| 2007
- v
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8th International Symposium on Quality Electronic Design-TOC| 2007
- xix
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Organizing Committee| 2007
- xvii
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Welcome Notes| 2007
- xx
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Technical Sub-Committees| 2007
- xxiii
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Steering Committee| 2007
- xxiii
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Advisory Committee| 2007
- xxiv
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Best Paper Selection Committee| 2007
- xxv
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Conference at a Glance| 2007
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Editorial boardIEEE Electron Devices Society / IEEE Circuits and Systems Society / Synopsys (Firm) et al. | 2007