Study on topography measurement of ultra-smooth surface [7155-90] (Englisch)
- Neue Suche nach: Li, Y.
- Neue Suche nach: Tong, X.
- Neue Suche nach: Lin, H.
- Neue Suche nach: Li, H.
- Neue Suche nach: Li, Q.
- Neue Suche nach: Nanyang Technological University
- Neue Suche nach: National University of Singapore
- Neue Suche nach: Singapore
- Neue Suche nach: Singapore Institue of Manufacturing Technology
- Neue Suche nach: Li, Y.
- Neue Suche nach: Tong, X.
- Neue Suche nach: Lin, H.
- Neue Suche nach: Li, H.
- Neue Suche nach: Li, Q.
- Neue Suche nach: Quan, Chenggen
- Neue Suche nach: Asundi, Anand
- Neue Suche nach: Nanyang Technological University
- Neue Suche nach: National University of Singapore
- Neue Suche nach: Singapore
- Neue Suche nach: Singapore Institue of Manufacturing Technology
In:
International symposium on laser metrology
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7155 2J
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2008
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Study on topography measurement of ultra-smooth surface [7155-90]
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Beteiligte:Li, Y. ( Autor:in ) / Tong, X. ( Autor:in ) / Lin, H. ( Autor:in ) / Li, H. ( Autor:in ) / Li, Q. ( Autor:in ) / Quan, Chenggen / Asundi, Anand / Nanyang Technological University / National University of Singapore / Singapore
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Kongress:9th, International symposium on laser metrology ; 2008 ; Singapore
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 7155 ; 7155 2J
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, Wash.
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Erscheinungsdatum:01.01.2008
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Format / Umfang:7155 2J
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Anmerkungen:Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 71550A
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Structure measurement of phase grating on post-magnification digital micro-holographyZhou, Wenjing / Yu, Yingjie / Asundi, Anand et al. | 2008
- 71550B
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Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive componentsYan, Hao / Asundi, Anand et al. | 2008
- 71550C
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Reduction of speckle noise by multi-kinoforms in holographic three-dimensional displayZheng, Huadong / Yu, Yingjie / Qian, Haiyan / Asundi, Anand et al. | 2008
- 71550D
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Deformation analysis on micro objects using multiple wavelength microscopic TV holographyKumar, U. Paul / Mohan, N. Krishna / Kothiyal, M. P. / Asundi, A. K. et al. | 2008
- 71550E
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Applications of laser ultrasound NDT methods on composite structures in aerospace industryKalms, Michael / Focke, Oliver / v. Kopylow, Christoph et al. | 2008
- 71550F
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Experimental study of unconveniant static and dynamic deformations of piezoelectric actuatorsBorza, D. N. et al. | 2008
- 71550G
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Long-term reliability measurements on MEMS using a laser-Doppler vibrometerDe Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. et al. | 2008
- 71550H
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Defect inspection by an active 3D multiresolution techniqueVargas, Javier / Quiroga, Juan Antonio et al. | 2008
- 71550I
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Development of a metrological atomic force microscope for nano-scale standards calibrationWang, S. H. / Xu, G. / Tan, S. L. et al. | 2008
- 71550J
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In-situ evaluation of nanoparticle diameter for visualizing self-assembly processOta, Satoshi / Hayashi, Terutake / Takaya, Yasuhiro et al. | 2008
- 71550K
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Evaluation on the probing error of a micro-coordinate measuring machineChao, Z. X. / Tan, S. L. / Xu, G. et al. | 2008
- 71550L
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High-resolution interferometry with Nd:YAG laser for local probe microscopyLazar, Josef / Šerý, Mojmír et al. | 2008
- 71550M
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High throughput measurement techniques for wafer level yield inspection of MEMS devicesVarela Pedreira, O. / Lauwagie, T. / De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. et al. | 2008
- 71550N
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Frequency-shifting method for phase retrieval from fringe patternsWang, Haixia / Qian, Kemao / Gao, Wenjing et al. | 2008
- 71550O
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Fast auto-focusing based on partial image characteristicsCui, Jiwen / Tan, Jiubin et al. | 2008
- 71550P
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Inspection method for directional texture defects on steel strip surfaceCong, J. H. / Yan, Y. H. et al. | 2008
- 71550Q
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General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGAGao, Wenjing / Qian, Kemao / Wang, Haixia / Lin, Feng / Seah, Hock Soon / Cheong, Lee Sing et al. | 2008
- 71550R
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Phase measurement via in-line digital holographic microscopyQu, Weijuan / Yu, Yingjie / Zhou, Wenjing / Yan, Hao / Asundi, Anand et al. | 2008
- 71550S
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Random-phase-shift Fizeau interferometerDoloca, Nicolae Radu / Tutsch, Rainer et al. | 2008
- 71550T
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Faster window Fourier transform filters for fringe pattern analysisNam, Le Tran Hoai / Qian, Kemao et al. | 2008
- 71550U
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Application of plate vibration and DSPI in evaluation of elastic modulusKumar, Rajesh / Shakher, Chandra et al. | 2008
- 71550V
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Optical metrology of micro- and nanostructures at PTB: status and future developmentsBodermann, Bernd / Buhr, Egbert / Ehret, Gerd / Scholze, Frank / Wurm, Matthias et al. | 2008
- 71550W
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Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometrySchuster, Thomas / Rafler, Stephan / Frenner, Karsten / Osten, Wolfgang et al. | 2008
- 71550X
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Detection and active stabilization of beams position at a high-resolution laser interferometerBuchta, Zdeněk / Šmíd, Radek / Lazar, Josef et al. | 2008
- 71550Y
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Model-free and model-based methods for dimensional metrology during the lifetime of a productWeidner, Peter / Kasic, Alexander / Hingst, Thomas / Ehlers, Carsten / Philipp, Sylke / Marschner, Thomas / Moert, Manfred et al. | 2008
- 71550Z
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Determination of flatness on patterned wafer surfaces using wavefront sensing methodsNutsch, A. / Pfitzner, L. / Grandin, T. / Levecq, X. / Bucourt, S. et al. | 2008
- 71551A
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A double-prism lateral shear interferometer for wavefront analysis and collimation testingHii, K. U. / Kwek, K. H. et al. | 2008
- 71551B
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A cube splitter interferometer for phase shifting interferometry and birefringence analysisBhattacharya, K. / Ghosh, N. et al. | 2008
- 71551C
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Model building and measurement of the temporal noise for thermal infrared imagerYu, Xun / Nie, Liang / Hu, Tieli / Jiang, Xu / Wang, Fang et al. | 2008
- 71551D
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Speckle noise suppression in shape and deformation measurements by phase-shifting digital holographyYamaguchi, Ichirou et al. | 2008
- 71551E
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A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel componentsLiu, T. / Malcolm, A. A. / Yin, X. M. / Liew, S. J. / Prawiradiraja, T. P. et al. | 2008
- 71551F
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Full-field swept-source optical coherence tomography with Gaussian spectral shapingDubey, Satish Kumar / Sheoran, Gyanendra / Anna, Tulsi / Anand, Arun / Mehta, Dalip Singh / Shakher, Chandra et al. | 2008
- 71551G
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Phase shifting interferograms processing for fiber point-diffraction interferometerNie, Liang / Han, Jun / Yu, Xun / Liu, Baoyuan / Jiang, Xu / Wang, Fang et al. | 2008
- 71551H
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Study on a new method for measuring volumetric error of CMMShi, Enxiu / Guo, Junjie / Huang, Yumei et al. | 2008
- 71551I
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Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transformChen, Wen / Quan, Chenggen / Tay, Cho Jui et al. | 2008
- 71551J
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Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrievalMaallo, Anne Margarette S. / Almoro, Percival F. et al. | 2008
- 71551K
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On-line digital holographic measurement of size and shape of microparticles for crystallization processesKhanam, Taslima / Darakis, Emmanouil / Rajendran, Arvind / Kariwala, Vinay / Asundi, Anand K. / Naughton, Thomas J. et al. | 2008
- 71551L
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Reduction of speckle noise in digital holographic images using wavelet transformSharma, Akshay / Sheoran, Gyanendra / Jaffery, Z. A. / Moinuddin, . et al. | 2008
- 71551M
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The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing systemKo, C. L. / Yang, C. Y. / Huang, K. R. / Shih, Ming Chang et al. | 2008
- 71551N
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NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sectionsFindeis, Dirk / Gryzagoridis, Jasson / Musonda, Vincent et al. | 2008
- 71551O
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Development of an inexpensive optical method for studies of dental erosion process in vitroNasution, A. M. T. / Noerjanto, B. / Triwanto, L. et al. | 2008
- 71551P
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Modeling of coupling coefficient as a function of coupling ratioSaktioto, . / Ali, Jalil / Fadhali, Mohammed / Rahman, Rosly Abdul / Zainal, Jasman et al. | 2008
- 71551Q
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3D investigation of photonics elements by means of interferometric and photoelastic tomographyKumar, N. / Kujawinska, M. / Kniazewski, P. et al. | 2008
- 71551R
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A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivityWang, J. / Asundi, Anand K. et al. | 2008
- 71551S
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Precision optical metrology for MEMSmPryputniewicz, Ryszard J. et al. | 2008
- 71551T
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A path planning method for large-scale blade profile measurement based on neutral networkZhang, Fei / Jiang, Zhuang-de / Ding, Jian-jun / Li, Bing / Chen, Lei et al. | 2008
- 71551U
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Optical bi-sensorial measurement system for production control of extruded profilesWeckenmann, A. / Bernstein, J. et al. | 2008
- 71551V
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Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diodeAketagawa, Masato / Hoshino, Yuta / Ishige, Masashi / Banh Quoc, Tuan et al. | 2008
- 71551W
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Adaptive confocal system for 3-D profilingK., Ravi Kumar / Shen, Vernon Jialiang / Talukdar, Amitava / Asundi, Anand et al. | 2008
- 71551X
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Measurement of temperature field in steady laminar free convection flow using digital holographyShakher, Chandra / Hossain, Md. Mosarraf / Mehta, Dalip Singh / Sheoran, Gyanendra et al. | 2008
- 71551Y
-
Laser spectroscopic study of acetate-capped colloidal ZnO nanoparticlesOh, S. A. / Sim, X. W. / Tripathy, S. et al. | 2008
- 71551Z
-
The output characteristics of the erbium-doped fiber Bragg grating ring laserYang, C. Y. / Ko, C. L. / Huang, K. R. / Shih, Ming Chang et al. | 2008
- 71552A
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Static and dynamic 3D contouring by using structured lightRodriguez-Vera, R. / Vasquez, D. / Genovese, K. / Rayas, J. A. / Mendoza-Santoyo, F. et al. | 2008
- 71552B
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Temporal Paul wavelet analysis for phase retrieval using shadow moire techniqueNiu, H. T. / Quan, C. / Tay, C. J. et al. | 2008
- 71552C
-
Whole field residual stress measurement using computer aided reflection gratingNg, Chi Seng / Goh, Yoke Chin / Asundi, Anand K. et al. | 2008
- 71552D
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The effects of post-annealing on pulse laser deposition of Zr0.8Sn0.2TiO4thin film on Si(100)Chuang, C. T. / Shih, Ming Chang / Weng, M. H. et al. | 2008
- 71552E
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Ultra-thin-film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR)Burki, Ibrahim / Rivas, Cristian et al. | 2008
- 71552F
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Infrared of thin film graphene in a magnetic field and the Hall effectShrivastava, Keshav N. et al. | 2008
- 71552G
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Inspection of electroplated goldNg, T. W. / Yong, F. Y. et al. | 2008
- 71552H
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Sub-pixel matching with consideration of lens distortionDong, Shihao / Zhao, Xiaobo / Yin, Yongkai / Tian, Jindong / Peng, Xiang et al. | 2008
- 71552I
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The measurement of polymerization shrinkage of composite resins with ESPIZhang, Zhang / Yang, Guo Biao et al. | 2008
- 71552J
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Study on topography measurement of ultra-smooth surfaceLi, Yuhe / Tong, XiaoLei / Lin, Haoshan / Li, Huiyu / Li, Qingxiang et al. | 2008
- 71552K
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Study on measurement method for projectile location based on light screenHan, Feng / Liu, QunHua / Sun, GuoBin et al. | 2008
- 71552L
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Microlens testing: an applicationNg-Lee, Hooi Leng / Goh, Seach Chyr Ernest / Ranjit, Chris Stephen Naveen / Maryanto, . / Ng, Jie Ying Sarah / Asundi, Anand et al. | 2008
- 71552M
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Application of laser tracker used in the measuring and the adjusting of the workbench for SAR antennaYan, Bixi / Wang, Jun / Lu, Naiguang / Deng, Wenyi / Dong, Mingli / Lou, Xiaoping et al. | 2008
- 71552N
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Study on key algorithm for scanning white-light interferometryTian, Ailing / Wang, Chunhui / Jiang, Zhuangde / Wang, Hongjun / Liu, Bingcai et al. | 2008
- 71552O
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High-power laser diode array system for optical pumping of RbBuchta, Zdenek / Cíp, Ondrej / Rychnovský, Jan / Lazar, Josef et al. | 2008
- 71552P
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Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratchLin, Haoshan / Li, Yuhe / Wang, Dongsheng / Liu, Mei et al. | 2008
- 71552Q
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Error analysis and compensation of binocular-stereo-vision measurement systemZhang, Tao / Guo, Junjie et al. | 2008
- 71552R
-
Research of the conical cavity high-energy laser energy meter energy loss compensation techniqueYu, Xun / Li, Qian / Nie, Liang / Shang, Xiaoyan / Liu, Baoyuan et al. | 2008
- 71552S
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Design of laser source for fiber point diffraction interferometerYu, Xun / Nie, Liang / Han, Jun / Liu, Baoyuan / Jiang, Xu et al. | 2008
- 71552T
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Stabilization of semiconductor lasers by fiber Bragg gratingsMikel, Bretislav / Helan, Radek / Cip, Ondrej / Jedlicka, Petr et al. | 2008
- 71552U
-
The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurementZhang, Lu / Zhao, Hong / Wang, Xiaopin / Zhang, Weiguang et al. | 2008
- 71552V
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Vibration influence and error compensation of aspherical surface interferometerWang, Hongjun / Cao, Jianfeng / Tian, Ailing / Liu, Bingcai et al. | 2008
- 71552W
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Investigation of light scattering for scratch detectionZhong, Z. W. / Zhao, L. P. / Wang, L. J. et al. | 2008
- 71552X
-
The interaction performance of white light, laser diode and He-Ne laser with two wavefront sensing systemsZhong, Z. W. / Zhao, L. P. / Hein, A. A. et al. | 2008
- 71552Y
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The high resolution actuator based on giant magnetostrictionWang, Lei / Tan, Jiu-bin / Zhang, Shan et al. | 2008
- 71552Z
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Rigorous accuracy analysis of the fiber point diffraction interferometerHan, Jun / Nie, Liang / Yu, Xun / Jiang, Xu / Wang, Fang et al. | 2008
- 71553A
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Application research of spectrum measurement technology in thin-film thickness wideband monitoring systemHan, Jun / Shang, Xiao-yan / An, Yu-ying / Jiang, Xu / Wang, Fang et al. | 2008
- 71553B
-
Raman scattering from Zn/ZnO core-shell nanoparticlesBajaj, Geetika / Soni, R. K. et al. | 2008
- 71553C
-
Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopyHabib, K. / Al-Sabti, F. et al. | 2008
- 715501
-
Front Matter: Volume 7155| 2008
- 715503
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Some answers to new challenges in optical metrologyOsten, W. et al. | 2008
- 715505
-
Hardware-based error compensation in 3D optical metrology systemsHarding, Kevin et al. | 2008
- 715506
-
Characterization of optical surfaces for the present generations of synchrotron sourcesThomasset, M. / Polack, F. et al. | 2008
- 715508
-
Enhanced resolution methods in shearography and holography for time-average vibration measurementBorza, D. N. et al. | 2008
- 715509
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Characterisation of laser marks using digital holographic microscopySingh, Vijay Raj / Chee, Oi Choo / Sim, Eddy / Asundi, Anand et al. | 2008
- 715510
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New simplified measuring method for distributed low-level birefringenceGomi, Kenji / Suzuki, Tomoyuki / Niitsu, Yasushi / Ichinose, Kensuke et al. | 2008
- 715511
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Phase shift polarimetry for non-invasive detection of laser-induced damageWang, Pin / Asundi, Anand et al. | 2008
- 715512
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Residual stress in silicon wafer using IR polariscopeLu, Zhijia / Wang, Pin / Asundi, Anand et al. | 2008
- 715513
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Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniquesPfister, Thorsten / Günther, Philipp / Büttner, Lars / Czarske, Jürgen et al. | 2008
- 715514
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An endoscopic optical system for inner cylindrical measurement using fringe projectionAlbertazzi G., Armando / Hofmann, Allan C. / Fantin, Analucia V. / Santos, João M. C. et al. | 2008
- 715515
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Surface measurement with Shack-Hartmann wavefront sensing technologyLi, X. / Zhao, L. P. / Fang, Z. P. / Asundi, A. / Yin, X. M. et al. | 2008
- 715516
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A simple method to estimate surface reflectance parameters for three light photometric stereoYounes, Mohammad A. / Al-Nady, M. A. et al. | 2008
- 715517
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A low-cost antenna reflector shape and distortion measuring system with high accuracyLi, Xudong / Jiang, Hongzhi / Zhou, Jie / Li, Dong / Zhao, Huijie et al. | 2008
- 715518
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The comparison of different temporal phase analysis algorithms in optical dynamic measurementMiao, H. / Fu, Y. et al. | 2008
- 715519
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A polarization sensitive interferometer for stress analysisSarkar, Mahuya / Sarkar, S. K. / Basuray, A. et al. | 2008
- 715520
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Active alignment and reliable pigtailing of laser diode transmitterFadhali, M. / Saktioto, . / Zainal, J. / Munajat, Y. / Ali, J. / Rahman, R. et al. | 2008
- 715521
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Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan techniqueSreeja, R. / Reshmi, R. / Manu, George / Jayaraj, M. K. et al. | 2008
- 715522
-
Influence of iodine cell quality onto the stability and absolute frequency shifts of laser etalonsHrabina, Jan / Lazar, Josef / Jedlicka, Petr / Cip, Ondrej et al. | 2008
- 715523
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Investigation of laser produced Fe plasma plume dynamics using time resolved imaging and snow plow modelMahmood, S. / Jiaji, L. / Springham, S. V. / Tan, T. L. / Rawat, R. S. / Lee, P. et al. | 2008
- 715524
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Processing of digital holograms for size measurements of microparticleseDarakis, Emmanouil / Khanam, Taslima / Rajendran, Arvind / Kariwala, Vinay / Asundi, Anand K. / Naughton, Thomas J. et al. | 2008
- 715525
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A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurementAlbertazzi G., Armando / Viotti, Matias R. / Kapp, Walter A. et al. | 2008
- 715526
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Electronics speckle interferometry applications for NDE of spacecraft structural componentsRao, M. V. / Samuel, R. / Ananthan, A. / Dasgupta, S. / Nair, P. S. et al. | 2008
- 715528
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Moire fringe method for the measurement of distortions of hot-embossed polymeric substratesTaylor, Hayden K. / Xu, Zhiguang / Li, Shiguang / Youcef-Toumi, Kamal / Fatt, Yoon Soon / Boning, Duane S. et al. | 2008
- 715529
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Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matchingChan, H. M. / Yen, K. S. / Ratnam, M. M. et al. | 2008
- 715530
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Robust isoclinic calculation for automatic analysis of photoelastic fringe patternsQuiroga, J. A. / Pascual, E. / Villa-Hernandez, J. et al. | 2008
- 715531
-
Fast wavefront estimation using multiple directional derivatives and quadrature transformLegarda-Saenz, Ricardo et al. | 2008
- 715532
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Influence of TFT-LCD pixel structure on holographic representationWang, Hongjun / Wang, Zhao / Tian, Ailing / Liu, Bingcai et al. | 2008
- 715533
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Research of the automatic imaging focusing measurement for off-axis Fresnel digital holographyYu, Xun / Nie, Liang / Wang, Fang / Jiang, Xu et al. | 2008
- 715533
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Research of the automatic imaging focusing measurement for off-axis Fresnel digital holography [7155-110]Yu, X. / Nie, L. / Wang, F. / Jiang, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
- 715535
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Measurement of human embryonic stem cell in the growing cycleLi, X. / Zhao, L. / Oh, Steve K. W. / Chong, W. K. / Ong, J. K. / Chen, Allen K. / Choo, Andre B. H. et al. | 2008
- 715536
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Complete deformation analysis of transparent samples using digital shearography and holographyCatalan, Francesca Celine I. / Santos, Raphael D. / Almoro, Percival F. et al. | 2008
- 715537
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The nondestructive testing research on porcelain-fused-to-metal (PFM) of oral cavityYang, Guo-biao / Zhang, Zhang / Ding, Yi et al. | 2008
- 715538
-
Development of a multi-resolution measurement system based on light sectioning methodZhang, Weiguang / Zhao, Hong / Zhou, Xiang / Zhang, Lu et al. | 2008
- 715539
-
Three-dimensional profile measurement using a flexible new multiview connection methodZheng, Peng / Guo, Hongwei / Yu, Yingjie / Chen, Mingyi et al. | 2008
-
Application of plate vibration and DSPI in evaluation of elastic modulus [7155-29]Kumar, R. / Shakher, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Active alignment and reliable pigtailing of laser diode transmitter [7155-71]Fadhali, M. / Saktioto / Zainal, J. / Munajat, Y. / Ali, J. / Rahman, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Vibration influence and error compensation of aspherical surface interferometer [7155-102]Wang, H. / Cao, J. / Tian, A. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement [7155-101]Zhang, L. / Zhao, H. / Wang, X. / Zhang, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
The interaction performance of white light, laser diode, and He-Ne laser with two wavefront sensing systems [7155-104]Zhong, Z.W. / Zhao, L.P. / Hein, A.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Robust isoclinic calculation for automatic analysis of photoelastic fringe patterns [7155-107]Quiroga, J.A. / Pascual, E. / Villa-Hernandez, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Some answers to new challenges in optical metrology [7155-02]Osten, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Characterization of optical surfaces for the present generations of synchrotron sources [7155-05]Thomasset, M. / Polack, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Characterisation of laser marks using digital holographic microscopy [7155-08]Singh, V.R. / Chee, O.C. / Sim, E. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of a metrological atomic force microscope for nano-scale standards calibration [7155-17]Wang, S.H. / Xu, G. / Tan, S.L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Defect inspection by an active 3D multiresolution technique [7155-16]Vargas, J. / Quiroga, J.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Speckle noise suppression in shape and deformation measurements by phase-shifting digital holography [7155-48]Yamaguchi, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Measurement of temperature field in steady laminar free convection flow using digital holography [7155-68]Shakher, C. / Hossain, M.M. / Mehta, D.S. / Sheoran, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Laser spectroscopic study of acetate-capped colloidal ZnO nanoparticles [7155-69]Oh, S.A. / Sim, X.W. / Tripathy, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurement [7155-76]Albertazzi G., A. / Viotti, M.R. / Kapp, W.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Whole field residual stress measurement using computer aided reflection grating [7155-83]Ng, C.S. / Goh, Y.C. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Microlens testing: an application [7155-92]Ng-Lee, H.L. / Goh, S.C.E. / Ranjit, C.S.N. / Maryanto / Ng, J.Y.S. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of a multi-resolution measurement system based on light sectioning method [7155-115]Zhang, W. / Zhao, H. / Zhou, X. / Zhang, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Faster window Fourier transform filters for fringe pattern analysis [7155-28]Nam, L.T.H. / Qian, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Surface measurement with Shack-Hartmann wavefront sensing technology [7155-40]Li, X. / Zhao, L.P. / Fang, Z.P. / Asundi, A. / Yin, X.M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The comparison of different temporal phase analysis algorithms in optical dynamic measurement [7155-43]Miao, H. / Fu, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Design of laser source for fiber point diffraction interferometer [7155-99]Yu, X. / Nie, L. / Han, J. / Liu, B. / Jiang, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Stabilization of semiconductor lasers by fiber Bragg gratings [7155-100]Mikel, B. / Helan, R. / Cip, O. / Jedlicka, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopy [7155-119]Habib, K. / Al-Sabti, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Raman scattering from Zn/ZnO core-shell nanoparticles [7155-118]Bajaj, G. / Soni, R.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Structure measurement of phase grating on post-magnification digital micro-holography [7155-09]Zhou, W. / Yu, Y. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Reduction of speckle noise by multi-kinoforms in holographic three-dimensional display [7155-11]Zheng, H. / Yu, Y. / Qian, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A polarization sensitive interferometer for stress analysis [7155-44]Sarkar, M. / Sarkar, S.K. / Basuray, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Model building and measurement of the temporal noise for thermal infrared imager [7155-47]Yu, X. / Nie, L. / Hu, T. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components [7155-49]Liu, T. / Malcolm, A.A. / Yin, X.M. / Liew, S.J. / Prawiradiraja, T.P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing system [7155-57]Ko, C.L. / Yang, C.Y. / Huang, K.R. / Shih, M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of an inexpensive optical method for studies of dental erosion process in vitro [7155-59]Nasution, A.M.T. / Noerjanto, B. / Triwanto, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Moire fringe method for the measurement of distortions of hot-embossed polymeric substrates [7155-79]Taylor, H.K. / Xu, Z. / Li, S. / Youcef-Toumi, K. / Fatt, Y.S. / Boning, D.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection of electroplated gold [7155-87]Ng, T.W. / Yong, F.Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The high resolution actuator based on giant magnetostriction [7155-105]Wang, L. / Tan, J. / Zhang, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Three-dimensional profile measurement using a flexible new multiview connection method [7155-116]Zheng, P. / Guo, H. / Yu, Y. / Chen, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Long-term reliability measurements on MEMS using a laser-Doppler vibrometer [7155-15]De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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New simplified measuring method for distributed low-level birefringence [7155-35]Gomi, K. / Suzuki, T. / Niitsu, Y. / Ichinose, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Reduction of speckle noise in digital holographic images using wavelet transform [7155-56]Sharma, A. / Sheoran, G. / Jaffery, Z.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sections [7155-58]Findeis, D. / Gryzagoridis, J. / Musonda, V. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A path planning method for large-scale blade profile measurement based on neutral network [7155-64]Zhang, F. / Jiang, Z. / Ding, J. / Li, B. / Chen, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of iodine cell quality onto the stability and absolute frequency shifts of laser etalons [7155-73]Hrabina, J. / Lazar, J. / Jedlicka, P. / Cip, O. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Infrared of thin film graphene in a magnetic field and the Hall effect [7155-86]Shrivastava, K.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on key algorithm for scanning white-light interferometry [7155-94]Tian, A. / Wang, C. / Jiang, Z. / Wang, H. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratch [7155-96]Lin, H. / Li, Y. / Wang, D. / Liu, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Investigation of light scattering for scratch detection [7155-103]Zhong, Z.W. / Zhao, L.P. / Wang, L.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of TFT-LCD pixel structure on holographic representation [7155-109]Wang, H. / Wang, Z. / Tian, A. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Hardware-based error compensation in 3D optical metrology systems [7155-04]Harding, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Experimental study of unconveniant static and dynamic deformations of piezoelectric actuators [7155-14]Borza, D.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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In-situ evaluation of nanoparticle diameter for visualizing self-assembly process [7155-18]Ota, S. / Hayashi, T. / Takaya, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Fast auto-focusing based on partial image characteristics [7155-23]Cui, J. / Tan, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection method for directional texture defects on steel strip surface [7155-24]Cong, J.H. / Yan, Y.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Random-phase-shift Fizeau interferometer [7155-27]Doloca, N.R. / Tutsch, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Detection and active stabilization of beams position at a high-resolution laser interferometer [7155-32]Cip, O. / Buchta, Z. / Cizek, M. / Smid, R. / Lazar, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A low-cost antenna reflector shape and distortion measuring system with high accuracy [7155-42]Li, X. / Jiang, H. / Zhou, J. / Li, D. / Zhao, H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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On-line digital holographic measurement of size and shape of microparticles for crystallization processes [7155-55]Khanam, T. / Darakis, E. / Rajendran, A. / Kariwala, V. / Asundi, A.K. / Naughton, T.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Investigation of laser produced Fe plasma plume dynamics using time resolved imaging and snow plow model [7155-74]Mahmood, S. / Jiaji, L. / Springham, S.V. / Tan, T.L. / Rawat, R.S. / Lee, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Processing of digital holograms for size measurements of microparticles [7155-75]Darakis, E. / Khanam, T. / Rajendran, A. / Kariwala, V. / Asundi, A.K. / Naughton, T.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Temporal Paul wavelet analysis for phase retrieval using shadow moire technique [7155-82]Niu, H.T. / Quan, C. / Tay, C.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The measurement of polymerization shrinkage of composite resins with ESPI [7155-89]Zhang, Z. / Yang, G.B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Error analysis and compensation of binocular-stereo-vision measurement system [7155-97]Zhang, T. / Guo, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Research of the conical cavity high-energy laser energy meter energy loss compensation technique [7155-98]Yu, X. / Li, Q. / Nie, L. / Shang, X. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Frequency-shifting method for phase retrieval from fringe patterns [7155-22]Wang, H. / Qian, K. / Gao, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Residual stress in silicon wafer using IR polariscope [7155-37]Lu, Z. / Wang, P. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniques [7155-38]Pfister, T. / Gunther, P. / Buttner, L. / Czarske, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on a new method for measuring volumetric error of CMM [7155-52]Shi, E. / Guo, J. / Huang, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Modeling of coupling coefficient as a function of coupling ratio [7155-60]Saktioto / Ali, J. / Fadhali, M. / Rahman, R.A. / Zainal, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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3D investigation of photonics elements by means of interferometric and photoelastic tomography [7155-61]Kumar, N. / Kujawinska, M. / Kniazewski, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The effects of post-annealing on pulse laser deposition of Zr~0~.~8Sn~0~.~2TiO~4 thin film on Si(100) [7155-84]Chuang, C.T. / Shih, M.C. / Weng, M.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on measurement method for projectile location based on light screen [7155-91]Han, F. / Liu, Q. / Sun, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High-power laser diode array system for optical pumping of Rb [7155-95]Buchta, Z. / Cip, O. / Rychnovsky, J. / Lazar, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Enhanced resolution methods in shearography and holography for time-average vibration measurement [7155-07]Borza, D.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Applications of laser ultrasound NDT methods on composite structures in the aerospace industry [7155-13]Kalms, M. / Focke, O. / Kopylow, C.v. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Evaluation on the probing error of a micro-coordinate measuring machine [7155-19]Chao, Z.X. / Tan, S.L. / Xu, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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An endoscopic optical system for inner cylindrical measurement using fringe projection [7155-39]Albertazzi G., A. / Hofmann, A.C. / Fantin, A.V. / Santos, J.M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrieval [7155-54]Maallo, A.M.S. / Almoro, P.F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity [7155-62]Wang, J. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Application of laser tracker used in the measuring and the adjusting of the workbench for SAR antenna [7155-93]Yan, B. / Wang, J. / Lu, N. / Deng, W. / Dong, M. / Lou, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive components [7155-10]Yan, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High throughput measurement techniques for wafer level yield inspection of MEMS devices [7155-21]Pedreira, O.V. / Lauwagie, T. / De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGA [7155-25]Gao, W. / Qian, K. / Wang, H. / Lin, F. / Seah, H.S. / Cheong, L.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Determination of flatness on patterned wafer surfaces using wavefront sensing methods [7155-34]Nutsch, A. / Pfitzner, L. / Grandin, T. / Levecq, X. / Bucourt, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A simple method to estimate surface reflectance parameters for three light photometric stereo [7155-41]Younes, M.A. / Al-Nady, M.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A cube splitter interferometer for phase shifting interferometry and birefringence analysis [7155-46]Bhattacharya, K. / Ghosh, N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase shifting interferograms processing for fiber point-diffraction interferometer [7155-51]Nie, L. / Han, J. / Yu, X. / Liu, B. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Optical bi-sensorial measurement system for production control of extruded profiles [7155-65]Weckenmann, A. / Bernstein, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Static and dynamic 3D contouring by using structured light [7155-81]Rodriguez-Vera, R. / Vasquez, D. / Genovese, K. / Rayas, J.A. / Mendoza-Santoyo, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Ultra-thin-film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR) [7155-85]Burki, I. / Rivas, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on topography measurement of ultra-smooth surface [7155-90]Li, Y. / Tong, X. / Lin, H. / Li, H. / Li, Q. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Application research of spectrum measurement technology in thin-film thickness wideband monitoring system [7155-117]Han, J. / Shang, X. / An, Y. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase measurement via in-line digital holographic microscopy [7155-26]Qu, W. / Yu, Y. / Zhou, W. / Yan, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A double-prism lateral shear interferometer for wavefront analysis and collimation testing [7155-45]Hii, K.U. / Kwek, K.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Full-field swept-source optical coherence tomography with Gaussian spectral shaping [7155-50]Dubey, S.K. / Sheoran, G. / Anna, T. / Anand, A. / Mehta, D.S. / Shakher, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform [7155-53]Chen, W. / Quan, C. / Tay, C.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode [7155-66]Aketagawa, M. / Hoshino, Y. / Ishige, M. / Quoc, T.B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The nondestructive testing research on porcelain-fused-to-metal (PFM) of oral cavity [7155-114]Yang, G. / Zhang, Z. / Ding, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Deformation analysis on micro objects using multiple wavelength microscopic TV holography [7155-12]Kumar, U.P. / Mohan, N.K. / Kothiyal, M.P. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High-resolution interferometry with Nd:YAG laser for local probe microscopy [7155-20]Lazar, J. / Cip, O. / Cizek, M. / Sery, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Optical metrology of micro- and nanostructures at PTB: status and future developments [7155-30]Bodermann, B. / Buhr, E. / Ehret, G. / Scholze, F. / Wurm, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometry [7155-31]Schuster, T. / Rafler, S. / Frenner, K. / Osten, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Complete deformation analysis of transparent samples using digital shearography and holography [7155-113]Catalan, F.C.I. / Santos, R.D. / Almoro, P.F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Model-free and model-based methods for dimensional metrology during the lifetime of a product [7155-33]Weidner, P. / Kasic, A. / Hingst, T. / Ehlers, C. / Philipp, S. / Marschner, T. / Moert, M. / Nanyang Technological University / National University of Singapore / Singapore et al. | 2008
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Phase shift polarimetry for non-invasive detection of laser-induced damage [7155-36]Wang, P. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Precision optical metrology for MEMS [7155-63]Pryputniewicz, R.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Adaptive confocal system for 3-D profiling [7155-67]K., R.K. / Shen, V.J. / Talukdar, A. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The output characteristics of the erbium-doped fiber Bragg grating ring laser [7155-70]Yang, C.Y. / Ko, C.L. / Huang, K.R. / Shih, M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan technique [7155-72]Sreeja, R. / Reshmi, R. / Manu, G. / Jayaraj, M.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Electronics speckle interferometry applications for NDE of spacecraft structural components [7155-77]Rao, M.V. / Samuel, R. / Ananthan, A. / Dasgupta, S. / Nair, P.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matching [7155-80]Chan, H.M. / Yen, K.S. / Ratnam, M.M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Sub-pixel matching with consideration of lens distortion [7155-88]Dong, S. / Zhao, X. / Yin, Y. / Tian, J. / Peng, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Fast wavefront estimation using multiple directional derivatives and quadrature transform [7155-108]Legarda-Saenz, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Rigorous accuracy analysis of the fiber point diffraction interferometer [7155-106]Han, J. / Nie, L. / Yu, X. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Measurement of human embryonic stem cell in the growing cycle [7155-112]Li, X. / Zhao, L. / Oh, S.K.W. / Chong, W.K. / Ong, J.K. / Chen, A.K. / Choo, A.B.H. / Nanyang Technological University / National University of Singapore / Singapore et al. | 2008