3D inspection microscope using holographic primary objective [7432-30] (Englisch)
- Neue Suche nach: Ditto, T.D.
- Neue Suche nach: Knapp, J.
- Neue Suche nach: Biro, S.
- Neue Suche nach: SPIE (Society)
- Neue Suche nach: Ditto, T.D.
- Neue Suche nach: Knapp, J.
- Neue Suche nach: Biro, S.
- Neue Suche nach: Huang, Peisen S.
- Neue Suche nach: Yoshizawa, T�oru
- Neue Suche nach: Harding, Kevin G.
- Neue Suche nach: SPIE (Society)
In:
Optical inspection and metrology for non-optics industries
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7432 0V
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2009
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:3D inspection microscope using holographic primary objective [7432-30]
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Beteiligte:Ditto, T.D. ( Autor:in ) / Knapp, J. ( Autor:in ) / Biro, S. ( Autor:in ) / Huang, Peisen S. / Yoshizawa, T�oru / Harding, Kevin G. / SPIE (Society)
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Kongress:conference, Optical inspection and metrology for non-optics industries ; 2009 ; San Diego, CA
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 7432 ; 7432 0V
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, Wash.
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Erscheinungsdatum:01.01.2009
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Format / Umfang:7432 0V
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Anmerkungen:Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 74320A
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Automatic inspection of textured surfaces by support vector machinesJahanbin, Sina / Bovik, Alan C. / Pérez, Eduardo / Nair, Dinesh et al. | 2009
- 74320B
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Stokes parameters of reflected and scattered light by a rough surfaceJin, Lianhua / Takizawa, Kuniharu et al. | 2009
- 74320C
-
Data processing and parameter extraction for cutting tool inspectionChen, T. / Du, X. M. / Zheng, J. M. / Harding, K. G. et al. | 2009
- 74320D
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In-process inspection of internal threads of machined automotive partsZhang, Hongwei / Katz, Reuven / Agapiou, John S. et al. | 2009
- 74320E
-
Measure of roughness of paper using specklePino, Abdiel / Pladellorens, Josep et al. | 2009
- 74320F
-
A novel method for overlay measurement by scatterometryHsu, Wei-Te / Ku, Yi-Sha / Shyu, Deh-Ming et al. | 2009
- 74320H
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In-situ analysis of fruit anthocyanins by means of total internal reflectance, continuous wave and time-resolved spectroscopyZude, Manuela / Spinelli, Lorenzo / Dosche, Carsten / Torricelli, Alessandro et al. | 2009
- 74320J
-
Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometerSasaki, Osami / Yamamura, Ryota / Yokoyama, Kazushi / Suzuki, Takamasa et al. | 2009
- 74320K
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Digital processing of an interferometric velocimeter for ballistic shock measurementKumar, Pankaj / Thomas, Akhil / Weis, R. Stephen / Tayag, Tristan J. et al. | 2009
- 74320L
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In-plane and out-of-plane deformation and vibration measurement using an optomechanical image derotatorRahlves, Maik / Mirzaei, Sahar / Fahlbusch, Thomas / Reithmeier, Eduard et al. | 2009
- 74320N
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Digital multiple wavelength phase shifting algorithmZhang, Song et al. | 2009
- 74320O
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Continuous scanning phase measurement for high immunity to vibrationPark, Jungjae / You, Joonho / Kim, Seung-Woo et al. | 2009
- 74320P
-
Three-dimensional profilometry system incorporating a MEMS scannerYoshizawa, Toru / Wakayama, Toshitaka et al. | 2009
- 74320S
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Comparison of projection means for structured light systemsHarding, Kevin et al. | 2009
- 74320T
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Microscopic TV sherography for microsystems characterizationKumar, U. P. / Mohan, N. K. / Kothiyal, M. P. et al. | 2009
- 74320V
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3D inspection microscope using holographic primary objectiveDitto, Thomas D. / Knapp, Jim / Biro, Shoshana et al. | 2009
- 74320W
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Dual mode interferometer for measuring dynamic displacement of specular and diffuse componentsNorth Morris, Michael / Horner, Tim / Naradikian, Markar / Shiefman, Joe et al. | 2009
- 74320X
-
Combined stereovision and phase shifting method: use of a color-coded visibility-modulated fringe patternHan, Xu / Huang, Peisen / Deng, Zhicheng / Xu, Leon et al. | 2009
- 74320Y
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Pixel synchronous measurement of object shape and colourSiepmann, Jens / Heinze, Matthias / Kühmstedt, Peter / Notni, Gunther et al. | 2009
- 74320Z
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Chromatic confocal spectral interferometry for technical surface characterizationLyda, W. / Fleischle, D. / Haist, T. / Osten, W. et al. | 2009
- 74321A
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Measurement of frequency swept linearly with Fabry-Perot fiber interferometerLuan, Zhu / Xu, Nan / Liu, De'an / Zhou, Yu / Liu, Liren et al. | 2009
- 74321B
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Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometryParra Michel, Jorge / Martínez, Amalia / Rayas, J. A. et al. | 2009
- 74321C
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Three-dimensional embedded defect detection and localization in a semi-transparent mediumAbramovich, Gil / Nafis, Christopher / Williams, Yana / Harding, Kevin / Tkaczyk, Eric et al. | 2009
- 743201
-
Front Matter: Volume 7432| 2009
- 743202
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Optimal checkerboard selection for structured light system calibrationLohry, William / Xu, Ying / Zhang, Song et al. | 2009
- 743203
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Measurement accuracy of fringe projection depending on surface normal directionKühmstedt, Peter / Bräuer-Burchardt, Christian / Notni, Gunther et al. | 2009
- 743204
-
High precision calibration method of intrinsic parameters for fish-eye camerasKomagata, Hideki / Ishii, Ikuo / Makino, Hideo / Takahashi, Akira / Wakatsuki, Daisuke et al. | 2009
- 743205
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New calibration technique for a novel stereo cameraTu, Xue / Subbarao, Muralidhara et al. | 2009
- 743206
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3D cutting tool inspection system and its key technologiesDu, X. M. / Chen, T. / Zou, X. J. / Harding, K. G. et al. | 2009
- 743207
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3D measurement method based on wavelet transform by using SEMArai, Yasuhiko / Ando, M. / Yokozeki, S. et al. | 2009
- 743208
-
A fringe period unwrapping technique for digital fringe profilometry based on spatial shift estimationCao, Pu / Xi, Jiangtao / Chicharo, Joe F. / Yu, Yanguang et al. | 2009
- 743209
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Shift-variant image deblurring for machine vision: one-dimensional blurSubbarao, Muralidhara / Kang, Youn-sik / Tu, Xue et al. | 2009
- 743210
-
Three-dimensional profilometry based on focus method by projecting LC grating patternOtani, Yukitoshi / Kobayashi, Fumio / Mizutani, Yasuhiro / Yoshizawa, Toru et al. | 2009
- 743211
-
A portable 3D shape measurement system based on the combined stereovision and phase shifting methodHan, Xu / Huang, Peisen / Deng, Zhicheng / Xu, Leon et al. | 2009
- 743212
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Real-time 3D part metrology using polarization rotationAbramovich, Gil / Harding, Kevin / Paruchuru, Vijay / Manickam, Swaminathan / Nafis, Christopher / Czechowski, Joseph / Vemury, Arun et al. | 2009
- 743213
-
Laser Doppler distance sensors using phase and frequency evaluationCzarske, Jürgen W. / Pfister, Thorsten / Günther, Philipp / Büttner, Lars et al. | 2009
- 743214
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Research of the chromaticity coordinates and color spectrum calibration using tristimulus sensors and eigenspectrum methodMang, Ou-Yang / Huang, Ting-Wei / Hsieh, Yao-Fang / Kuob, Yi-Ting et al. | 2009
- 743216
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Iterative estimation of the topography by means of structured lightMartínez García, Amalia / Rayas-Alvarez, Juan Antonio / Puga Soberanes, Héctor José / Genovese, Katia et al. | 2009
- 743217
-
Multi-channel liquid crystal cell parameter measurement techniqueLiu, Chih-Shang / Chuang, Kai-Ping / Lin, Yeo-Sung / Zhuang, Ming-Yin / Chiang, Chih-Jung et al. | 2009
- 743218
-
Method to measure frequency change of tunable laser based on Jamin shearing interferometerWang, Lijuan / Liu, Liren / Sun, Jianfeng / Zhou, Yu / Luan, Zhu / Liu, De'an et al. | 2009
-
A novel method for overlay measurement by scatterometry [7432-14]Hsu, W.-T. / Ku, Y.-S. / Shyu, D.-M. / SPIE (Society) et al. | 2009
-
In-plane and out-of-plane deformation and vibration measurement using an optomechanical image derotator [7432-20]Rahlves, M. / Mirzaei, S. / Fahlbusch, T. / Reithmeier, E. / SPIE (Society) et al. | 2009
-
New calibration technique for a novel stereo camera [7432-04]Tu, X. / Subbarao, M. / SPIE (Society) et al. | 2009
-
A fringe period unwrapping technique for digital fringe profilometry based on spatial shift estimation [7432-07]Cao, P. / Xi, J. / Chicharo, J.F. / Yu, Y. / SPIE (Society) et al. | 2009
-
Combined stereovision and phase shifting method: use of a color visibility-modulated fringe pattern [7432-32]Han, X. / Huang, P. / Deng, Z. / Xu, L. / SPIE (Society) et al. | 2009
-
Three-dimensional embedded defect detection and localization in a semi-transparent medium [7432-48]Abramovich, G. / Nafis, C. / Williams, Y. / Harding, K. / Tkaczyk, E. / SPIE (Society) et al. | 2009
-
Iterative estimation of the topography by means of structured light [7432-42]Garcia, A.M. / Rayas-Alvarez, J.A. / Soberanes, H.J.P. / Genovese, K. / SPIE (Society) et al. | 2009
-
Measurement accuracy of fringe projection depending on surface normal direction [7432-02]Kuhmstedt, P. / Brauer-Burchardt, C. / Notni, G. / SPIE (Society) et al. | 2009
-
Stokes parameters of reflected and scattered light by a rough surface [7432-10]Jin, L. / Takizawa, K. / SPIE (Society) et al. | 2009
-
Comparison of projection means for structured light systems [7432-27]Harding, K. / SPIE (Society) et al. | 2009
-
Chromatic confocal spectral interferometry for technical surface characterization [7432-34]Lyda, W. / Fleischle, D. / Haist, T. / Osten, W. / SPIE (Society) et al. | 2009
-
In situ analysis of fruit anthocyanins by means of total internal reflectance, continuous wave and time-resolved spectroscopy [7432-16]Zude, M. / Spinelli, L. / Dosche, C. / Torricelli, A. / SPIE (Society) et al. | 2009
-
Continuous scanning phase measurement for high immunity to vibration [7432-23]Park, J. / You, J. / Kim, S.-W. / SPIE (Society) et al. | 2009
-
Shift-variant image deblurring for machine vision: one-dimensional blur [7432-08]Subbarao, M. / Kang, Y. / Tu, X. / SPIE (Society) et al. | 2009
-
Digital processing of an interferometric velocimeter for ballistic shock measurement [7432-19]Kumar, P. / Thomas, A. / Weis, R.S. / Tayag, T.J. / SPIE (Society) et al. | 2009
-
Digital multiple wavelength phase shifting algorithm [7432-22]Zhang, S. / SPIE (Society) et al. | 2009
-
Dual mode interferometer for measuring dynamic displacement of specular and diffuse components [7432-31]Morris, M.N. / Horner, T. / Naradikian, M. / Shiefman, J. / SPIE (Society) et al. | 2009
-
Pixel synchronous measurement of object shape and colour [7432-33]Siepmann, J. / Heinze, M. / Kuhmstedt, P. / Notni, G. / SPIE (Society) et al. | 2009
-
Multi-channel liquid crystal cell parameter measurement technique [7432-43]Liu, C.-S. / Chuang, K.-P. / Lin, Y.-S. / Zhuang, M.-Y. / Chiang, C.-J. / SPIE (Society) et al. | 2009
-
Method to measure frequency change of tunable laser based on Jamin shearing interferometer [7432-44]Wang, L. / Liu, L. / Sun, J. / Zhou, Y. / Luan, Z. / Liu, D. / SPIE (Society) et al. | 2009
-
Laser Doppler distance sensors using phase and frequency evaluation [7432-38]Czarske, J.W. / Pfister, T. / Gunther, P. / Buttner, L. / SPIE (Society) et al. | 2009
-
Optimal checkerboard selection for structured light system calibration [7432-01]Lohry, W. / Xu, Y. / Zhang, S. / SPIE (Society) et al. | 2009
-
3D cutting tool inspection system and its key technologies [7432-05]Du, X.M. / Chen, T. / Zou, X.J. / Harding, K.G. / SPIE (Society) et al. | 2009
-
Automatic inspection of textured surfaces by support vector machines [7432-09]Jahanbin, S. / Bovik, A.C. / Perez, E. / Nair, D. / SPIE (Society) et al. | 2009
-
Microscopic TV sherography for microsystems characterization [7432-28]Kumar, U.P. / Mohan, N.K. / Kothiyal, M.P. / SPIE (Society) et al. | 2009
-
Measurement of frequency swept linearly with Fabry-Perot fiber interferometer [7432-46]Luan, Z. / Xu, N. / Liu, D. / Zhou, Y. / Liu, L. / SPIE (Society) et al. | 2009
-
Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry [7432-47]Michel, J.P. / Martinez, A. / Rayas, J.A. / SPIE (Society) et al. | 2009
-
In-process inspection of internal threads of machined automotive parts [7432-12]Zhang, H. / Katz, R. / Agapiou, J.S. / SPIE (Society) et al. | 2009
-
Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer [7432-18]Sasaki, O. / Yamamura, R. / Yokoyama, K. / Suzuki, T. / SPIE (Society) et al. | 2009
-
High precision calibration method of intrinsic parameters for fish-eye cameras [7432-03]Komagata, H. / Ishii, I. / Makino, H. / Takahashi, A. / Wakatsuki, D. / SPIE (Society) et al. | 2009
-
3D measurement method based on wavelet transform by using SEM [7432-06]Arai, Y. / Ando, M. / Yokozeki, S. / SPIE (Society) et al. | 2009
-
Data processing and parameter extraction for cutting tool inspection [7432-11]Chen, T. / Du, X.M. / Zheng, J.M. / Harding, K.G. / SPIE (Society) et al. | 2009
-
Measure of roughness of paper using speckle [7432-13]Pino, A. / Pladellorens, J. / SPIE (Society) et al. | 2009
-
Three-dimensional profilometry system incorporating a MEMS scanner [7432-24]Yoshizawa, T. / Wakayama, T. / SPIE (Society) et al. | 2009
-
Three-dimensional profilometry based on focus method by projecting LC grating pattern [7432-35]Otani, Y. / Kobayashi, F. / Mizutani, Y. / Yoshizawa, T. / SPIE (Society) et al. | 2009
-
3D inspection microscope using holographic primary objective [7432-30]Ditto, T.D. / Knapp, J. / Biro, S. / SPIE (Society) et al. | 2009
-
A portable 3D shape measurement system based on the combined stereovision and phase shifting method [7432-36]Han, X. / Huang, P. / Deng, Z. / Xu, L. / SPIE (Society) et al. | 2009
-
Research of the chromaticity coordinates and color spectrum calibration using tristimulus sensors and eigenspectrum method [7432-39]Mang, O.-Y. / Huang, T.-W. / Hsieh, Y.-F. / Kuob, Y.-T. / SPIE (Society) et al. | 2009
-
Real-time 3D part metrology using polarization rotation [7432-37]Abramovich, G. / Harding, K. / Paruchuru, V. / Manickam, S. / Nafis, C. / Czechowski, J. / Vemury, A. / SPIE (Society) et al. | 2009