Modeling of soft x-ray induced ablation in solids [8077-04] (Englisch)
- Neue Suche nach: Iwan, B.
- Neue Suche nach: Andreasson, J.
- Neue Suche nach: Abreu, E.
- Neue Suche nach: Bergh, M.
- Neue Suche nach: Caleman, C.
- Neue Suche nach: Hajdu, J.
- Neue Suche nach: Timneanu, N.
- Neue Suche nach: SPIE (Society)
- Neue Suche nach: Iwan, B.
- Neue Suche nach: Andreasson, J.
- Neue Suche nach: Abreu, E.
- Neue Suche nach: Bergh, M.
- Neue Suche nach: Caleman, C.
- Neue Suche nach: Hajdu, J.
- Neue Suche nach: Timneanu, N.
- Neue Suche nach: Juha, Libor
- Neue Suche nach: Bajt, Sasa
- Neue Suche nach: London, Richard A.
- Neue Suche nach: SPIE (Society)
In:
Damage to VUV, EUV, and X-Ray Optics
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8077 05
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2011
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Modeling of soft x-ray induced ablation in solids [8077-04]
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Beteiligte:Iwan, B. ( Autor:in ) / Andreasson, J. ( Autor:in ) / Abreu, E. ( Autor:in ) / Bergh, M. ( Autor:in ) / Caleman, C. ( Autor:in ) / Hajdu, J. ( Autor:in ) / Timneanu, N. ( Autor:in ) / Juha, Libor / Bajt, Sasa / London, Richard A.
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Kongress:3rd, Damage to VUV, EUV, and X-Ray Optics ; 2011 ; Prague, Czech Republic
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Erschienen in:Damage to VUV, EUV, and X-Ray Optics ; 8077 05PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8077 ; 8077 05
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, Wash.
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Erscheinungsdatum:01.01.2011
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Format / Umfang:8077 05
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Anmerkungen:Includes bibliographical references.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 80770A
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Transient analysis of thermal distorsion in a silicon substrate on incidence of a single soft x-ray FEL pulsede Castro, A. Rubens B. / Vasconcellos, A. R. / Luzzi, R. et al. | 2011
- 80770B
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Computer simulation of heat transfer in zone plate optics exposed to x-ray FEL radiationNilsson, D. / Holmberg, A. / Sinn, H. / Vogt, U. et al. | 2011
- 80770D
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Time resolved optical methods for investigation of phase transformations in materials exposed to nanosecond laser pulsesMartan, J. / Semmar, N. / Cibulka, O. et al. | 2011
- 80770E
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Thermal analysis experiment to evaluate the stability of multilayer coatings in a space environment close to the sunMonaco, G. / Corso, A. J. / Zuppella, P. / Nicolosi, P. / Windt, D. L. / Pelizzo, M. G. et al. | 2011
- 80770F
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Responses of polymers to laser plasma EUV light beyond ablation threshold and micromachiningMakimura, Tetsuya / Torii, Shuichi / Okazaki, Kota / Nakamura, Daisuke / Takahashi, Akihiko / Niino, Hiroyuki / Okada, Tatsuo / Murakami, Kouichi et al. | 2011
- 80770H
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EUV: induced ablation and surface modifications of solidsBartnik, A. / Fiedorowicz, H. / Jarocki, R. / Kostecki, J. / Szczurek, M. / Szczurek, A. / Wachulak, P. et al. | 2011
- 80770I
-
Particle-induced damage effects on extreme UV (13.5-nm) source collector mirror opticsAllain, J. P. / Holybee, B. / List, M. / Kacic, A. / Nieto-Perez, M. / Hendricks, M. R. et al. | 2011
- 80770J
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Structural change induced in carbon materials by electronic excitationsMaeda, Koji / Liang, Shijin / Nakamura, Yoshiaki / Sato, Hiroaki / Mera, Yutaka et al. | 2011
- 80770K
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Damage formation and characterization with scanning photoemission spectromicroscopyGregoratti, L. / Amati, M. / Abyaneh, M. K. et al. | 2011
- 80770L
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Desorption mechanisms in PMMA irradiated by high order harmonicsDe Grazia, M. / Merdji, H. / Auguste, T. / Carré, B. / Gaudin, J. / Geoffroy, G. / Guizard, S. / Krejci, F. / Kuba, J. / Chalupsky, J. et al. | 2011
- 80770M
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Multilayer white beam studyFriedrich, K. / Morawe, Ch. / Peffen, J.-Ch. / Osterhoff, M. et al. | 2011
- 80770N
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Measurement of the point spread function of a soft x-ray microscope by single pixel exposure of photoresistsLeontowich, Adam F. G. / Tyliszczak, Tolek / Hitchcock, Adam P. et al. | 2011
- 80770Q
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Electron kinetics in semiconductors and metals irradiated with VUV-XUV femtosecond laser pulsesMedvedev, Nikita A. / Rethfeld, Bärbel et al. | 2011
- 80770R
-
Frenkel defect process in amorphous silicaKajihara, Koichi / Hirano, Masahiro / Skuja, Linards / Hosono, Hideo et al. | 2011
- 80770S
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Damage to low-k porous organosilicate glass from vacuum-ultraviolet irradiationShohet, J. L. / Sinha, H. / Ren, H. / Nichols, M. T. / Nishi, Y. / Tomoyasu, M. / Russell, N. M. et al. | 2011
- 80770T
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High-throughput beam splitters for high-order harmonics in soft-x-ray regionHatayama, Masatoshi / Takahashi, Eiji J. / Takenaka, Hisataka / Gullikson, Eric M. / Midorikawa, Katsumi et al. | 2011
- 80770U
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Relaxation and interaction of electronic excitations induced by intense ultra short light pulses in BaF2scintillatorKirm, M. / Nagirnyi, V. / Vielhauer, S. / Feldbach, E. et al. | 2011
- 80770W
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Damage to dry plasmid DNA induced by nanosecond XUV-laser pulsesNováková, Eva / Davídková, Marie / Vyšín, Ludék / Burian, Tomáš / Grisham, Michael E. / Heinbuch, Scott / Rocca, Jorge J. / Juha, Libor et al. | 2011
- 80770X
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Study on the lifetime of Mo/Si multilayer optics with pulsed EUV-source at the ETSSchürmann, Mark / Yulin, Sergiy / Nesterenko, Viatcheslav / Feigl, Torsten / Kaiser, Norbert / Tkachenko, Boris / Schürmann, Max C. et al. | 2011
- 807701
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Front Matter: Volume 8077| 2011
- 807702
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Lifetime and damage threshold properties of reflective x-ray coatings for the LCLS free-electron laserSoufli, Regina / Fernández-Perea, Mónica / Hau-Riege, Stefan P. / Baker, Sherry L. / Robinson, Jeff C. / Gullikson, Eric M. / Bozek, John D. / Kelez, Nicholas M. / Boutet, Sebastien et al. | 2011
- 807704
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Probing matter under extreme conditions at Fermi@Elettra: the TIMEX beamlineDi Cicco, Andrea / Bencivenga, Filippo / Battistoni, Andrea / Cocco, Daniele / Cucini, Riccardo / D'Amico, Francesco / Di Fonzo, Silvia / Filipponi, Adriano / Gessini, Alessandro / Giangrisostomi, Erika et al. | 2011
- 807705
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Modeling of soft x-ray induced ablation in solidsIwan, B. / Andreasson, J. / Abreu, E. / Bergh, M. / Caleman, C. / Hajdu, J. / Tîmneanu, N. et al. | 2011
- 807710
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Thermal stability on Mo/B4C multilayersBarthelmess, Miriam / Bajt, Saša et al. | 2011
- 807711
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FEL multilayer optics damaged by multiple shot laser beam: experimental results and discussionGiglia, A. / Mahne, N. / Bianco, A. / Svetina, C. / Cucini, R. / Vysin, L. / Burian, T. / Juha, L. / Nannarone, S. et al. | 2011
- 807712
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Handling the carbon contamination issue at SOLEILYao-Leclerc, I. / Brochet, S. / Chauvet, C. / De Oliveira, N. / Duval, J.-P. / Gil, J.-F. / Kubsky, S. / Lagarde, B. / Nahon, L. / Nicolas, F. et al. | 2011
- 807713
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Blistering behavior in Mo/Si multilayersKuznetsov, A. S. / Gleeson, M. A. / van de Kruijs, R. W. E. / Bijkerk, F. et al. | 2011
- 807714
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Micromachining of polydimethylsiloxane induced by laser plasma EUV lightTorii, S. / Makimura, T. / Okazaki, K. / Nakamura, D. / Takahashi, A. / Okada, T. / Niino, H. / Murakami, K. et al. | 2011
- 807716
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Dynamics of electrons in liquid water excited with an ultrashort VUV laser pulseHuthmacher, Klaus / Medvedev, Nikita / Rethfeld, Bärbel et al. | 2011
- 807718
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X-ray laser-induced ablation of lead compoundsHájková, V. / Juha, L. / Boháček, P. / Burian, T. / Chalupský, J. / Vyšín, L. / Gaudin, J. / Heimann, P. A. / Hau-Riege, S. P. / Jurek, M. et al. | 2011
- 807719
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Ablation of ionic crystals induced by capillary-discharge XUV laserPira, Peter / Burian, Tomáš / Vyšín, Ludék / Chalupský, Jaromír / Lančok, Ján / Wild, Jan / Střižík, Michal / Zelinger, Zdeněk / Rocca, Jorge J. / Juha, Libor et al. | 2011
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Damage formation and characterization with scanning photoemission spectromicroscopy (Invited Paper) [8077-21]Gregoratti, L. / Amati, M. / Abyaneh, M.K. / SPIE (Society) et al. | 2011
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Electron kinetics in semiconductors and metals irradiated with VUV-XUV femtosecond laser pulses (Invited Paper) [8077-27]Medvedev, N.A. / Rethfeld, B. / SPIE (Society) et al. | 2011
-
Modeling of soft x-ray induced ablation in solids [8077-04]Iwan, B. / Andreasson, J. / Abreu, E. / Bergh, M. / Caleman, C. / Hajdu, J. / Timneanu, N. / SPIE (Society) et al. | 2011
-
Computer simulation of heat transfer in zone plate optics exposed to x-ray FEL radiation (Invited Paper) [8077-11]Nilsson, D. / Holmberg, A. / Sinn, H. / Vogt, U. / SPIE (Society) et al. | 2011
-
Thermal stability on Mo/B[sub]4[/sub]C multilayers [8077-37]Barthelmess, M. / Bajt, S. / SPIE (Society) et al. | 2011
-
Desorption mechanisms in PMMA irradiated by high order harmonics [8077-22]De Grazia, M. / Merdji, H. / Auguste, T. / Carre, B. / Gaudin, J. / Geoffroy, G. / Guizard, S. / Krejci, F. / Kuba, J. / Chalupsky, J. et al. | 2011
-
FEL multilayer optics damaged by multiple laser shots: experimental results and discussion [8077-38]Giglia, A. / Mahne, N. / Bianco, A. / Svetina, C. / Cucini, R. / Vysin, L. / Burian, T. / Juha, L. / Nannarone, S. / SPIE (Society) et al. | 2011
-
Probing matter under extreme conditions at Fermi@Elettra: the TIMEX beamline (Invited Paper) [8077-03]Di Cicco, A. / Bencivenga, F. / Battistoni, A. / Cocco, D. / Cucini, R. / D Amico, F. / Di Fonzo, S. / Filipponi, A. / Gessini, A. / Giangrisostomi, E. et al. | 2011
-
Thermal analysis experiment to evaluate the stability of multilayer coatings in a space environment close to the Sun [8077-15]Monaco, G. / Corso, A.J. / Zuppella, P. / Nicolosi, P. / Windt, D.L. / Pelizzo, M.G. / SPIE (Society) et al. | 2011
-
High-throughput beam splitters for high-order harmonics in soft-x-ray region (Invited Paper) [8077-30]Hatayama, M. / Takahashi, E.J. / Takenaka, H. / Gullikson, E.M. / Midorikawa, K. / SPIE (Society) et al. | 2011
-
Blistering behavior in Mo/Si multilayers [8077-40]Kuznetsov, A.S. / Gleeson, M.A. / van de Kruijs, R.W.E. / Bijkerk, F. / SPIE (Society) et al. | 2011
-
Ablation of ionic crystals induced by capillary-discharge XUV laser [8077-46]Pira, P. / Burian, T. / Vysin, L. / Lan, J. / Wild, J. / Zelinger, Z. / Heyrovsky, J. / Rocca, J.J. / Juha, L. / SPIE (Society) et al. | 2011
-
Multilayer white beam study [8077-23]Friedrich, K. / Morawe, C. / Peffen, J. / Osterhoff, M. / SPIE (Society) et al. | 2011
-
Measurement of the point spread function of a soft x-ray microscope by single pixel exposure of photoresists [8077-24]Leontowich, A.F.G. / Tyliszczak, T. / Hitchcock, A.P. / SPIE (Society) et al. | 2011
-
Study on the lifetime of Mo/Si multilayer optics with pulsed EUV-source at the ETS [8077-34]Schurmann, M. / Yulin, S. / Nesterenko, V. / Feigl, T. / Kaiser, N. / Tkachenko, B. / Schurmann, M.C. / SPIE (Society) et al. | 2011
-
Particle-induced damage effects on extreme UV (13.5-nm) source collector mirror optics (Invited Paper) [8077-19]Allain, J.P. / Holybee, B. / List, M. / Kacic, A. / Nieto-Perez, M. / Hendricks, M.R. / SPIE (Society) et al. | 2011
-
Electron kinetics in liquid water excited with a femtosecond VUV laser pulse [8077-43]Huthmacher, K. / Medvedev, N. / Rethfeld, B. / SPIE (Society) et al. | 2011
-
Relaxation and interaction of electronic excitations induced by intense ultra short light pulses in BaF[sub]2[/sub] scintillator (Invited Paper) [8077-31]Kim, M. / Nagirnyi, V. / Vielhauer, S. / Feldbach, E. / SPIE (Society) et al. | 2011
-
Micromachining of polydimethylsiloxane induced by laser plasma EUV light [8077-41]Torii, S. / Makimura, T. / Okazaki, K. / Nakamura, D. / Takahashi, A. / Okada, T. / Niino, H. / Murakami, K. / SPIE (Society) et al. | 2011
-
X-ray laser-induced ablation of lead compounds [8077-45]Hajkova, V. / Juha, L. / Boha, P. / Burian, T. / Chalupsky, J. / Vysin, L. / Gaudin, J. / Sinn, H. / Heimann, P.A. / Hau-Riege, S.P. et al. | 2011
-
Responses of polymers to laser plasma EUV light beyond ablation threshold and micromachining (Invited Paper) [8077-16]Makimura, T. / Torii, S. / Okazaki, K. / Nakamura, D. / Takahashi, A. / Niino, H. / Okada, T. / Murakami, K. / SPIE (Society) et al. | 2011
-
Lifetime and damage threshold properties of reflective x-ray coatings for the LCLS free-electron laser (Invited Paper) [8077-01]Soufli, R. / Fernandez-Perea, M. / Hau-Riege, S.P. / Baker, S.L. / Robinson, J.C. / Gullikson, E.M. / Bozek, J.D. / Kelez, N.M. / Boutet, S. / SPIE (Society) et al. | 2011
-
Time resolved optical methods for investigation of phase transformations in materials exposed to nanosecond laser pulses (Invited Paper) [8077-14]Martan, J. / Semmar, N. / Cibulka, O. / SPIE (Society) et al. | 2011
-
Transient analysis of thermal distorsion in a silicon substrate on incidence of a single soft X-ray FEL pulse (Invited Paper) [8077-10]de Castro, A.R.B. / Vasconcellos, A.R. / Luzzi, R. / SPIE (Society) et al. | 2011
-
Structural change induced in carbon materials by electronic excitations (Invited Paper) [8077-20]Maeda, K. / Liang, S. / Nakamura, Y. / Sato, H. / Mera, Y. / SPIE (Society) et al. | 2011
-
EUV: induced ablation and surface modifications of solids (Invited Paper) [8077-18]Bartnik, A. / Fiedorowicz, H. / Jarocki, R. / Kostecki, J. / Szczurek, M. / Szczurek, A. / Wachulak, P. / SPIE (Society) et al. | 2011
-
Damage to low-k porous organosilicate glass from vacuum ultraviolet irradiation (Invited Paper) [8077-29]Shohet, J.L. / Sinha, H. / Ren, H. / Nichols, M.T. / Nishi, Y. / Tomoyasu, M. / Russell, N.M. / SPIE (Society) et al. | 2011
-
Frenkel defect process in amorphous silica (Invited Paper) [8077-28]Kajihara, K. / Hirano, M. / Skuja, L. / Hosono, H. / SPIE (Society) et al. | 2011
-
Damage to dry plasmid DNA induced by nanosecond XUV-laser pulses [8077-33]Novakova, E. / Davidkova, M. / Yysin, L. / Burian, T. / Grisham, M.E. / Heinbuch, S. / Rocca, J.J. / Juha, L. / SPIE (Society) et al. | 2011
-
Handling the carbon contamination issue at SOLEIL [8077-39]Yao-Leclerc, I. / Brochet, S. / Chauvet, C. / De Oliveira, N. / Duval, J. / Gil, J. / Kubsky, S. / Lagarde, B. / Nahon, L. / Nicolas, F. et al. | 2011