ZERODUR for stress mirror polishing [8126-04] (Englisch)
- Neue Suche nach: Jedamzik, R.
- Neue Suche nach: Kunisch, C.
- Neue Suche nach: Westerhoff, T.
- Neue Suche nach: SPIE (Society)
- Neue Suche nach: Jedamzik, R.
- Neue Suche nach: Kunisch, C.
- Neue Suche nach: Westerhoff, T.
- Neue Suche nach: Burge, James H.
- Neue Suche nach: Fahnle, Oliver W.
- Neue Suche nach: Williamson, Ray A.
- Neue Suche nach: SPIE (Society)
In:
Optical manufacturing and testing
;
8126 06
;
2011
-
ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Print
-
Titel:ZERODUR for stress mirror polishing [8126-04]
-
Beteiligte:Jedamzik, R. ( Autor:in ) / Kunisch, C. ( Autor:in ) / Westerhoff, T. ( Autor:in ) / Burge, James H. / Fahnle, Oliver W. / Williamson, Ray A. / SPIE (Society)
-
Kongress:conference; 9th, Optical manufacturing and testing ; 2011 ; San Diego, CA
-
Erschienen in:Optical manufacturing and testing ; 8126 06PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8126 ; 8126 06
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsort:Bellingham
-
Erscheinungsdatum:01.01.2011
-
Format / Umfang:8126 06
-
Anmerkungen:"SPIE Optics+Photonics" --cover. Includes bibliographical references and index. Optical manufacturing and testing 9. Optical manufacturing and testing nine.
-
ISBN:
-
ISSN:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Print
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 81260A
-
Progress in 4m class ZERODUR mirror productionWesterhoff, Thomas / Gruen, Steffen / Jedamzik, Ralf / Klein, Christopher / Werner, Thomas / Werz, Alexander et al. | 2011
- 81260B
-
Open-source data analysis and visualization software platform: SAGUAROKim, Dae Wook / Lewis, Benjamin J. / Burge, James H. et al. | 2011
- 81260C
-
Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moiré interferometerChen, Hsi-Chao / Huang, Kuo-Ting / Lo, Yen-Ming / Chiu, Hsuan-Yi / Chen, Guan-Jhen et al. | 2011
- 81260D
-
MicroFinish Topographer: surface finish metrology for large and small opticsParks, Robert E. et al. | 2011
- 81260E
-
Scanning Long-wave Optical Test System: a new ground optical surface slope test systemSu, Tianquan / Park, Won Hyun / Parks, Robert E. / Su, Peng / Burge, James H. et al. | 2011
- 81260F
-
Phase-shifting Zernike interferometer wavefront sensorWallace, J. Kent / Rao, Shanti / Jensen-Clem, Rebecca M. / Serabyn, Gene et al. | 2011
- 81260H
-
Dynamic surface roughness profilerKimbrough, Brad / Brock, Neal / Millerd, James et al. | 2011
- 81260I
-
Cryo-stability of HB-Cesic opticsKrödel, Matthias et al. | 2011
- 81260J
-
Analysis of fine-grinding techniques in terms of achievable surface qualitiesFähnle, O. / Hauser, K. et al. | 2011
- 81260K
-
Fabricating and testing complex optical elements with high precisionWang, Hexin / Giggel, Volkmar / Derst, Gerhard / Koch, Thomas et al. | 2011
- 81260L
-
Analytical process design for chemo-mechanical polishing of glass aspheresWaechter, Daniel / Dambon, Olaf / Klocke, Fritz et al. | 2011
- 81260M
-
Non-contact profilometry of E-ELT segments at OpTIC GlyndwrAtkins, Carolyn / Mitchell, John / Rees, Paul et al. | 2011
- 81260N
-
Electronic speckle pattern interferometric testing of JWST primary mirror segment assemblySmith, Koby Z. / Chaney, David M. / Saif, Babak N. et al. | 2011
- 81260O
-
Cryogenic optical testing results of JWST aspheric test plate lensSmith, Koby Z. / Towell, Timothy C. et al. | 2011
- 81260P
-
The optical metrology system for cryogenic testing of the JWST primary mirror segmentsHadaway, James B. / Chaney, David M. / Carey, Larkin B. et al. | 2011
- 81260Q
-
The design of MTF test system based on point light sourceFu, Rongguo / Wu, Ning / Zhang, Xinlong / Qiu, Yafeng / Chang, Benkang et al. | 2011
- 81260R
-
Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devicesXiao, Muzheng / Jujo, Satomi / Takahashi, Satoru / Takamasu, Kiyoshi et al. | 2011
- 81260T
-
A complete qualification methodology for coatings of precision glass molding toolsKlocke, F. / Georgiadis, K. / Dambon, O. / Bouzakis, K.-D. / Gerardis, S. / Skordaris, G. et al. | 2011
- 81260U
-
Fluid jet and bonnet polishing of optical moulds for application from visible to x-rayBeaucamp, Anthony T. H. / Freeman, Richard R. / Matsumoto, Akihiro / Namba, Yoshiharu et al. | 2011
- 81260V
-
From Herschel to Gaia: 3-meter class SiC space opticsBougoin, Michel / Lavenac, Jérôme et al. | 2011
- 81260W
-
Swing arm optical CMM: self calibration with dual probe shear testSu, Peng / Wang, Yuhao / Oh, Chang Jin / Parks, Robert E. / Burge, James H. et al. | 2011
- 81260X
-
Determining parametric TIS behavior from optical fabrication metrology dataHarvey, James E. / Shröder, Sven / Choi, Narak / Duparré, Angela et al. | 2011
- 81260Y
-
Extended vertical range roughness measurements in non-ideal environmentsCreath, Katherine et al. | 2011
- 81261A
-
Manufacturing process optimization of phase plates for depth extension microscopy systemsHsu, Chih-Cheng / Sung, Hsin-Yueh / Chen, Yung-Lin / Chang, Chuan-Chung / Chang, Chir-Weei / Cheng, Wen-Hung / Liang, Chin-Tsia et al. | 2011
- 81261B
-
An intuitive concept for manufacturing and inspecting of aspherical componentsChou, Hsiao-Yu / Chang, Keng-Shou et al. | 2011
- 81261C
-
Verification program for a high-precision large cryogenic lens holderBoesz, A. / Grupp, F. / Leberle, T. / Mottaghibonab, A. / Geis, N. / Bender, R. et al. | 2011
- 81261D
-
Flexible manufacturing of large aspheres for VLT's Optical Tube AssembliesGubbels, G. / Henselmans, R. / van Drunen, C. et al. | 2011
- 81261E
-
New approach for pre-polish grinding with low subsurface damageJohnson, James B. / Kim, Dae Wook / Parks, Robert E. / Burge, James H. et al. | 2011
- 81261F
-
Optical contacting of low-expansion materialsKalkowski, G. / Risse, S. / Rothhardt, C. / Rohde, M. / Eberhardt, R. et al. | 2011
- 81261G
-
Package technology for microcavitiesZhang, Wen-Dong / Yan, Ying-Zhan / Liu, Jun / Yan, Shu-Bin / Xue, Chen-Yang / Xiong, Ji-Jun et al. | 2011
- 81261H
-
The photoanisotropy in the holographic media on the basis of silver halide emulsionShaverdova, Valentina / Petrova, Svetlana / Purtseladze, Anna / Tarasashvili, Lado et al. | 2011
- 81261I
-
Development of high-performance, stable, and moisture-resistant polarization-sensitive materialsChaganava, Irakli / Kakauridze, George / Kilosanidze, Barbara / Datukishvili, George et al. | 2011
- 812601
-
Front Matter: Volume 8126| 2011
- 812603
-
Optical manufacturing and testing requirements identified by the NASA Science Instruments, Observatories, and Sensor Systems Technology AssessmentStahl, H. Philip / Barney, Rich / Bauman, Jill / Feinberg, Lee / McCleese, Dan / Singh, Upendra et al. | 2011
- 812604
-
Technologies for producing segments for extremely large telescopesWalker, D. / Atkins, C. / Baker, I. / Evans, R. / Hamidi, S. / Harris, P. / Li, H. / Messelink, W. / Mitchell, J. / Parry-Jones, M. et al. | 2011
- 812606
-
ZERODUR for stress mirror polishingJedamzik, Ralf / Kunisch, Clemens / Westerhoff, Thomas et al. | 2011
- 812607
-
Design and fabrication of a 3m class light weighted mirror blank for the E-ELT M5Jedamzik, Ralf / Seibert, Volker / Thomas, Armin / Westerhoff, Thomas / Müller, Michael / Cayrel, Marc et al. | 2011
- 812609
-
Piezoelectric deformable mirror based on monolithic PVDF membranesFinney, Greg A. / Spradley, Kevin / Farmer, Brandon / Smith, Lensey / Patrick, Brian et al. | 2011
- 812610
-
Instantaneous measurement Fizeau interferometer with high spatial resolutionSykora, Daniel M. / de Groot, Peter et al. | 2011
- 812611
-
Study of air-driving fluid jet polishingYu, Zong-Ru / Kuo, Ching-Hsiang / Chen, Chun-Cheng / Hsu, Wei-Yao / Tsai, Din Ping et al. | 2011
- 812612
-
Optical bonding reinforced by femtosecond laser weldingLacroix, Fabrice / Hélie, David / Vallée, Réal et al. | 2011
- 812613
-
Incorporating VIBE into the precision optics manufacturing processDeGroote Nelson, Jessica / Gould, Alan / Klinger, Charles / Mandina, Michael et al. | 2011
- 812614
-
Computer-aided manufacturing for freeform optical elements by ultraprecision micromillingStoebenau, Sebastian / Kleindienst, Roman / Hofmann, Meike / Sinzinger, Stefan et al. | 2011
- 812615
-
Calibration and optimization of computer-controlled optical surfacing for large opticsKim, Dae Wook / Martin, Hubert M. / Burge, James H. et al. | 2011
- 812616
-
Centration of optical elementsMilby, Ezra / Burge, Jim et al. | 2011
- 812617
-
Slow tool servo diamond turning of optical freeform surface for astigmatic contact lensChen, Chun-Chieh / Cheng, Yuan-Chieh / Hsu, Wei-Yao / Chou, Hsiao-Yu / Wang, Pei-Jen / Tsai, Din Ping et al. | 2011
- 812618
-
The fabrication of high filling factor double side micro lens array with high alignment accuracyCheng, Yuan-Chieh / Chen, Chun-Chieh / Hsu, Wei-Yao / Wang, Pei Jen / Tsai, Din Ping et al. | 2011
- 812619
-
Mirror segments for large mirror systems of weak optical signals detectors for UV spectral rangeSchovanek, P. / Hrabovsky, M. / Palatka, M. / Pech, M. / Mandat, D. / Nozka, L. / Dejneka, A. / Jankuj, J. / Vujtek, M. et al. | 2011
- xiii
-
The history of telescopes and binoculars: an engineering perspective (Plenary Paper) [8129-100]Greivenkamp, J.E. / Steed, D.L. / SPIE (Society) et al. | 2011
-
Optical manufacturing and testing requirements identified by the NASA Science Instruments, Observatories, and Sensor Systems Technology Assessment (Invited Paper) [8126-01]Stahl, H.P. / Barney, R. / Bauman, J. / Feinberg, L. / McCleese, D. / Singh, U. / SPIE (Society) et al. | 2011
-
Design and fabrication of a 3m class light weighted mirror blank for the E-ELT M5 [8126-05]Jedamzik, R. / Seibert, V. / Thomas, A. / Westerhoff, T. / Muller, M. / Cayrel, M. / SPIE (Society) et al. | 2011
-
Analytical process design for chemo-mechanical polishing of glass aspheres [8126-19]Waechter, D. / Dambon, O. / Klocke, F. / SPIE (Society) et al. | 2011
-
Fluid jet and bonnet polishing of optical moulds for application from visible to x-ray [8126-53]Beaucamp, A.T.H. / Freeman, R.R. / Matsumoto, A. / Namba, Y. / SPIE (Society) et al. | 2011
-
Study of air-driving fluid jet polishing [8126-36]Yu, Z.-R. / Kuo, C.-H. / Chen, C.-C. / Hsu, W.-Y. / Tsai, D.-P. / SPIE (Society) et al. | 2011
-
Mirror segments for large mirror systems of weak optical signals detectors for UV spectral range [8126-42]Schovanek, P. / Hrabovsky, M. / Palatka, M. / Pech, M. / Mandat, D. / Nozka, L. / Dejneka, A. / Jankuj, J. / Vujtek, M. / SPIE (Society) et al. | 2011
-
Verification program for a high-precision large cryogenic lens holder [8126-45]Boesz, A. / Grupp, F. / Leberle, T. / Mottaghibonab, A. / Geis, N. / Bender, R. / SPIE (Society) et al. | 2011
-
The design of MTF test system based on point light source [8126-24]Fu, R. / Wu, N. / Zhang, X. / Qiu, Y. / Chang, B. / SPIE (Society) et al. | 2011
-
From Herschel to Gaia: 3-meter class SiC space optics [8126-30]Bougoin, M. / Lavenac, J. / SPIE (Society) et al. | 2011
-
Swing arm optical CMM: self calibration with dual probe shear test [8126-31]Su, P. / Wang, Y. / Oh, C.J. / Parks, R.E. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Technologies for producing segments for extremely large telescopes [8126-02]Walker, D. / Atkins, C. / Baker, I. / Evans, R. / Hamidi, S. / Harris, P. / Li, H. / Messelink, W. / Mitchell, J. / Parry-Jones, M. et al. | 2011
-
Piezoelectric deformable mirror based on monolithic PVDF membranes [8126-07]Finney, G.A. / Spradley, K. / Farmer, B. / Smith, L. / Patrick, B. / SPIE (Society) et al. | 2011
-
Dynamic surface roughness profiler [8126-15]Kimbrough, B. / Brock, N. / Millerd, J. / SPIE (Society) et al. | 2011
-
Centration of optical elements [8126-41]Milby, E. / Burge, J. / SPIE (Society) et al. | 2011
-
The fabrication of high filling factor double side micro lens array with high alignment accuracy [8126-29]Cheng, Y.-C. / Chen, C.-C. / Hsu, W.-Y. / Wang, P.J. / Tsai, D.P. / SPIE (Society) et al. | 2011
-
Computer-aided manufacturing for freeform optical elements by ultraprecision micromilling [8126-39]Stoebenau, S. / Kleindienst, R. / Hofmann, M. / Sinzinger, S. / SPIE (Society) et al. | 2011
-
Calibration and optimization of computer-controlled optical surfacing for large optics [8126-40]Kim, D.W. / Martin, H.M. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Manufacturing process optimization of phase plates for depth extension microscopy systems [8126-43]Hsu, C.-C. / Sung, H.-Y. / Chen, Y.-L. / Chang, C.-C. / Chang, C.-W. / Cheng, W.-H. / Liang, C.-T. / SPIE (Society) et al. | 2011
-
New approach for pre-polish grinding with low subsurface damage [8126-47]Johnson, J.B. / Kim, D.W. / Parks, R.E. / Burge, J.H. / SPIE (Society) et al. | 2011
-
MicroFinish Topographer: surface finish metrology for large and small optics [8126-11]Parks, R.E. / SPIE (Society) et al. | 2011
-
Cryo-stability of HB-Cesic optics [8126-16]Krodel, M. / SPIE (Society) et al. | 2011
-
Analysis of fine-grinding techniques in terms of achievable surface qualities [8126-17]Fahnle, O. / Hauser, K. / SPIE (Society) et al. | 2011
-
The optical metrology system for cryogenic testing of the JWST primary mirror segments [8126-25]Hadaway, J.B. / Chaney, D.M. / Carey, L.B. / SPIE (Society) et al. | 2011
-
Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moire interferometer [8126-10]Chen, H.-C. / Huang, K.-T. / Lo, Y.-M. / Chiu, H.-Y. / Chen, G.-J. / SPIE (Society) et al. | 2011
-
Non-contact profilometry of E-ELT segments at OpTlC Glyndwr [8126-21]Atkins, C. / Mitchell, J. / Rees, P. / SPIE (Society) et al. | 2011
-
Slow tool servo diamond turning of optical freeform surface for astigmatic contact lens [8126-28]Chen, C.-C. / Cheng, Y.-C. / Hsu, W.-Y. / Chou, H.-Y. / Wang, P.J. / Tsai, D.P. / SPIE (Society) et al. | 2011
-
Flexible manufacturing of large aspheres for VLT's Optical Tube Assemblies [8126-46]Gubbels, G. / Henselmans, R. / van Drunen, C. / SPIE (Society) et al. | 2011
-
Phase-shifting Zernike interferometer wavefront sensor [8126-13]Wallace, J.K. / Rao, S. / Jensen-Clem, R.M. / Serabyn, G. / SPIE (Society) et al. | 2011
-
Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices [8126-26]Xiao, M. / Jujo, S. / Takahashi, S. / Takamasu, K. / SPIE (Society) et al. | 2011
-
Optical bonding reinforced by femtosecond laser welding [8126-37]Lacroix, F. / Helie, D. / Vallee, R. / SPIE (Society) et al. | 2011
-
The photoanisotropy in the holographic media on the basis of silver halide emulsion [8126-50]Shaverdova, V. / Petrova, S. / Purtseladze, A. / Tarasashvili, L. / SPIE (Society) et al. | 2011
-
ZERODUR for stress mirror polishing [8126-04]Jedamzik, R. / Kunisch, C. / Westerhoff, T. / SPIE (Society) et al. | 2011
-
Fabricating and testing complex optical elements with high precision [8126-18]Wang, H. / Giggel, V. / Derst, G. / Koch, T. / SPIE (Society) et al. | 2011
-
Cryogenic optical testing results of JWST aspheric test plate lens [8126-23]Smith, K.Z. / Towell, T.C. / SPIE (Society) et al. | 2011
-
Incorporating VIBE into the precision optics manufacturing process [8126-38]Nelson, J.D. / Gould, A. / Klinger, C. / Mandina, M. / SPIE (Society) et al. | 2011
-
An intuitive concept for manufacturing and inspecting of aspherical components [8126-44]Chou, H.-Y. / Chang, K.-S. / SPIE (Society) et al. | 2011
-
Open-source data analysis and visualization software platform: SAGUARO [8126-09]Kim, D.W. / Lewis, B.J. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Instantaneous measurement Fizeau interferometer with high spatial resolution [8126-35]Sykora, D.M. / de Groot, P. / SPIE (Society) et al. | 2011
-
Progress in 4m class ZERODUR mirror production [8126-08]Westerhoff, T. / Gruen, S. / Jedamzik, R. / Klein, C. / Werner, T. / Werz, A. / SPIE (Society) et al. | 2011
-
Scanning Long-wave Optical Test System: a new ground optical surface slope test system [8126-12]Su, T. / Park, W.H. / Parks, R.E. / Su, P. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Electronic speckle pattern interferometric testing of JWST primary mirror segment assembly [8126-22]Smith, K.Z. / Chaney, D.M. / Saif, B.N. / SPIE (Society) et al. | 2011
-
A complete qualification methodology for coatings of precision glass molding tools [8126-20]Klocke, F. / Georgiadis, K. / Dambon, O. / Bouzakis, K.-D. / Gerardis, S. / Skordaris, G. / SPIE (Society) et al. | 2011
-
Determining parametric TIS behavior from optical fabrication metrology data [8126-32]Harvey, J.E. / Shroder, S. / Choi, N. / Duparre, A. / SPIE (Society) et al. | 2011
-
Extended vertical range roughness measurements in non-ideal environments [8126-33]Creath, K. / SPIE (Society) et al. | 2011
-
Package technology for microcavities [8126-49]Zhang, W.-D. / Yan, Y.-Z. / Liu, J. / Yan, S.-B. / Xue, C.-Y. / Xiong, J.-J. / SPIE (Society) et al. | 2011
-
Optical contacting of low-expansion materials [8126-48]Kalkowski, G. / Risse, S. / Rothhardt, C. / Rohde, M. / Eberhardt, R. / SPIE (Society) et al. | 2011
-
Development of high-performance, stable, and moisture-resistant polarization-sensitive materials [8126-51]Chaganava, I. / Kakauridze, G. / Kilosanidze, B. / Datukishvili, G. / SPIE (Society) et al. | 2011