Using engineered defects to study laser-induced damage in optical thin films with nanosecond pulses (Invited Paper) [8190-01] (Englisch)
- Neue Suche nach: Cheng, X.
- Neue Suche nach: Ding, T.
- Neue Suche nach: He, W.
- Neue Suche nach: Zhang, J.
- Neue Suche nach: Jiao, H.
- Neue Suche nach: Ma, B.
- Neue Suche nach: Shen, Z.
- Neue Suche nach: Wang, Z.
- Neue Suche nach: SPIE (Society); Lawrence Livermore National Laboratory
- Neue Suche nach: Cheng, X.
- Neue Suche nach: Ding, T.
- Neue Suche nach: He, W.
- Neue Suche nach: Zhang, J.
- Neue Suche nach: Jiao, H.
- Neue Suche nach: Ma, B.
- Neue Suche nach: Shen, Z.
- Neue Suche nach: Wang, Z.
- Neue Suche nach: Exarhos, G.J.
- Neue Suche nach: SPIE (Society); Lawrence Livermore National Laboratory
In:
Annual laser damage symposium; Laser-induced damage in optical materials, 2011
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8190 02
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2011
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Using engineered defects to study laser-induced damage in optical thin films with nanosecond pulses (Invited Paper) [8190-01]
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Beteiligte:Cheng, X. ( Autor:in ) / Ding, T. ( Autor:in ) / He, W. ( Autor:in ) / Zhang, J. ( Autor:in ) / Jiao, H. ( Autor:in ) / Ma, B. ( Autor:in ) / Shen, Z. ( Autor:in ) / Wang, Z. ( Autor:in ) / Exarhos, G.J. / SPIE (Society); Lawrence Livermore National Laboratory
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Kongress:43rd, Annual laser damage symposium; Laser-induced damage in optical materials, 2011 ; 2011 ; Boulder, CO
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Erschienen in:PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8190 ; 8190 02
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, Wash.
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Erscheinungsdatum:01.01.2011
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Format / Umfang:8190 02
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Anmerkungen:Includes bibliographical references and author index
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 81900A
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Laser-induced damage thresholds of optical coatings at different temperatureMikami, K. / Motokoshi, S. / Fujita, M. / Jitsuno, T. / Tanaka, K. A. et al. | 2011
- 81900B
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Investigation of the laser-induced damage of dispersive coatingsAngelov, Ivan B. / von Conta, Aaron / Trushin, Sergei A. / Major, Zsuzsanna / Karsch, Stefan / Krausz, Ferenc / Pervak, Vladimir et al. | 2011
- 81900C
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Characterization of 1064nm laser-induced damage on antireflection coatings grown by atomic layer depositionLiu, Zhichao / Wei, Yaowei / Chen, Songlin / Luo, Jin / Ma, Ping et al. | 2011
- 81900D
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Defect formation in oxide thin filmsJensen, Lars O. / Wagner, Frank / Mende, Mathias / Gouldieff, Céline / Blaschke, Holger / Natoli, Jean-Yves / Ristau, Detlev et al. | 2011
- 81900F
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Spontaneous and induced absorption in amorphous Ta2O5dielectric thin filmsMarkosyan, A. S. / Route, R. / Fejer, M. M. / Patel, D. / Menoni, C. S. et al. | 2011
- 81900I
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Database on damage thresholds of picoseconds pulse for HR coatingsMotokoshi, Shinji / Kato, Kota / Somekawa, Tomohiro / Mikami, Katsuhiro / Sato, Eiji / Jitsuno, Takahisa et al. | 2011
- 81900J
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Characterization of hafnia thin films made with different deposition technologiesAi, Wanjun / Xiong, Shengming et al. | 2011
- 81900M
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Subnanosecond bulk damage thresholds of single-crystal YAG and diffusion-bonded YAG structures at 1 micronStultz, Robert D. / Yokoyama, Karen E. / Lurier, Jeanette / Ushinsky, Michael / Farley, Robert W. / Rogers, Mark E. / Foran, Brendan J. / Thomas, Michael D. / Griffin, Andrew J. et al. | 2011
- 81900N
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Imaging studies of photodamage and recovery of anthraquinone derivatives doped into PMMAAnderson, Benjamin / Ramini, Shiva K. / Kuzyk, Mark G. et al. | 2011
- 81900O
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Recent progress in the development of pulse compression gratingsNéauport, J. / Bonod, N. / Hocquet, S. et al. | 2011
- 81900P
-
Recent progress in reversible photodegradation of Disperse Orange 11 when doped in PMMARamini, Shiva K. / Anderson, Benjamin / Kuzyk, Mark G. et al. | 2011
- 81900Q
-
Optical coatings on laser crystals for HiPER projectOulehla, Jindrich / Pokorný, Pavel / Lazar, Josef et al. | 2011
- 81900R
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Femtosecond laser microfabrication in polymers towards memory devices and microfluidic applicationsDeepak, K. L. N. / Venugopal Rao, S. / Narayana Rao, D. et al. | 2011
- 81900S
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Estimation of the transverse stimulated Raman scattering gain coefficient in KDP and DKDP at 2ω, 3ω, and 4ωDemos, Stavros G. / Raman, Rajesh N. / Yang, Steven T. / Negres, Raluca A. / Schaffers, Kathleen I. / Henesian, Mark A. et al. | 2011
- 81900V
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Third harmonic microscopy for optical material characterizationWeber, R. A. / Rodriguez, C. / Nguyen, D. N. / Emmert, L. A. / Rudolph, W. / Patel, D. / Menoni, C. S. et al. | 2011
- 81900W
-
Modeling max-of-n fluence distribution for optics lifetimeLiao, Zhi M. / Hubel, John / Trenholme, John B. / Carr, C. Wren et al. | 2011
- 81900Z
-
Deterministic single shot and multiple shot bulk laser damage thresholds of borosilicate glass at 1.064 μmKimmel, Mark / Do, Binh T. / Smith, Arlee V. et al. | 2011
- 81901C
-
Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laserQu, Zhechao / Han, Yanling / Xiong, Shengming / Li, Bincheng et al. | 2011
- 81901E
-
Laser-induced contamination on space opticsRiede, Wolfgang / Schroeder, Helmut / Bataviciute, Gintare / Wernham, Denny / Tighe, Adrian / Pettazzi, Federico / Alves, Jorge et al. | 2011
- 81901F
-
Pulsed ablation of carbon/graphite surfaces and development of plume-kinetics modelRoberts, C. Dean / Marciniak, Michael A. / Perram, Glen P. et al. | 2011
- 81901J
-
Formation mechanism of self-organized nanogratings induced by femtosecond laser pulses on titanium surfaceAhsan, Md. Shamim / Kim, Yeong Gyu / Lee, Man Seop et al. | 2011
- 81901P
-
Absorption measurement of HR coated mirrors at 193nm with a Shack-Hartmann wavefront sensorCho, Byungil / Danielewicz, Edward / Rudisill, J. Earl et al. | 2011
- 81901Q
-
Comparative study of fused silica materials for ArF laser applicationsMühlig, Ch. / Bublitz, S. / Bernitzki, H. et al. | 2011
- 81901S
-
Absolute measurement of absorptance in DUV optics from laser-induced wavefront deformationsMann, K. / Leinhos, U. / Sudradjat, J. / Schäfer, B. et al. | 2011
- 81901T
-
Impact of SiO2and CaF2surface composition on the absolute absorption at 193nmBalasa, I. / Blaschke, H. / Jensen, L. / Ristau, D. et al. | 2011
- 81901W
-
Electron dynamics in transparent materials under high-intensity laser irradiationBrenk, Oliver / Rethfeld, Baerbel et al. | 2011
- 81901Z
-
Laser ablation mechanism of transparent layers on semiconductors with ultrashort laser pulsesRublack, Tino / Hartnauer, Stefan / Mergner, Michael / Muchow, Markus / Seifert, Gerhard et al. | 2011
- 819001
-
Front Matter: Volume 8190| 2011
- 819002
-
Using engineered defects to study laser-induced damage in optical thin films with nanosecond pulsesCheng, Xinbin / Ding, Tao / He, Wenyan / Zhang, Jinlong / Jiao, Hongfei / Ma, Bin / Shen, Zhengxiang / Wang, Zhanshan et al. | 2011
- 819003
-
Low loss ion beam sputtered optical coatings and their applicationsLalezari, R. et al. | 2011
- 819004
-
Measurement and calculation of ternary oxide mixtures for thin films for ultra short pulse laser opticsJupé, M. / Mende, M. / Kolleck, C. / Ristau, D. / Gallais, L. / Mangote, B. et al. | 2011
- 819005
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HfO2/SiO2enhanced diamond turned aluminum mirrors for IR laser opticsWang, Jue / Davis, Ronald W. / Wang, Angela Q. / Schreiber, Horst / Wilkinson, Scott J. / Crifasi, Joseph C. / Felock, Robert D. et al. | 2011
- 819006
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Laser damage threshold results for sputtered coatings produced using different deposition technologiesMacKay, Peter / Wakeham, Steve / Wilde, Mike / Dutson, James / Allen, John et al. | 2011
- 819007
-
Excimer mirror thin film laser damage competitionStolz, Christopher J. / Blaschke, Holger / Jensen, Lars / Mädebach, Heinrich / Ristau, Detlev et al. | 2011
- 819008
-
Laser-induced damage of coatings on Yb:YAG crystals at cryogenic conditionWang, He / Zhang, Weili / Chen, Shunli / Zhu, Meiping / He, Hongbo / Fan, Zhengxiu et al. | 2011
- 819009
-
Laser-induced damage of Kapton thin films demonstrating temperature and wavelength dependent absorptance: a case study in remote-sensing material analysisPalm, William J. / Marciniak, Michael A. / Perram, Glen P. / Gross, Kevin C. / Bailey, William F. / Walters, Craig T. et al. | 2011
- 819010
-
Photothermal tomography of optical coatings based on surface thermal lensing technologyXu, Junhai / Zhu, Meiping / Zhao, Yuanan / Yi, Kui / Shao, Jianda et al. | 2011
- 819012
-
Effect of laser beam size on laser-induced damage performanceHan, Wei / Wang, Fang / Zhou, Lidan / Li, Fuquan / Feng, Bin / Jia, Huaiting / Xiang, Yong / Jing, Feng / Zheng, Wanguo et al. | 2011
- 819013
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Damage effects of filaments on non-transparent materials at long distancesDiener, Karsten / Borchert, Harmut / Schmitt, Rüdiger / Durand, Magali / Houard, Aurélien / Prade, Bernard / Mysyrowicz, André / Durécu, Anne / Fleury, Didier / Moreau, Bernard et al. | 2011
- 819014
-
Temperature dependences of fluorescence characteristic for Nd/Cr:YAG materialsHonda, Yoshiyuki / Yoshida, Minoru / Motokoshi, Shinji / Fujioka, Kana / Jitsuno, Takahisa / Nakatsuka, Masahiro et al. | 2011
- 819015
-
Potential of large diameter MgF2single crystal grown by Czochralski methodHashimoto, Yasuhiro / Ikeda, Yuichi / Ariyuki, Masao / Mochizuki, Naoto / Nawata, Teruhiko et al. | 2011
- 819016
-
Characterization of optical materials and coatings for high-power NIR/VIS laser applicationMühlig, Ch. / Bublitz, S. / Paa, W. et al. | 2011
- 819018
-
Self-laser conditioning of KDP and DKDP crystalsMaunier, C. / Balas, M. / Donval, T. / Lamaignère, L. / Duchateau, G. / Mennerat, G. et al. | 2011
- 819019
-
An empirical investigation of the laser survivability curve: IIArenberg, Jonathan / Riede, Wolfgang / Ciapponi, Alessandra / Allenspacher, Paul / Herringer, Jon et al. | 2011
- 819020
-
Growth mechanism of laser-induced damage in fused silicaHu, Guohang / Yi, Kui / Liu, Xiaofeng / Zhao, Yuanan / Shao, Jianda et al. | 2011
- 819021
-
Luminescence of different surface flaws in high purity silica glass under UV excitationFournier, J. / Néauport, J. / Grua, P. / Jubera, V. / Fargin, E. / Talaga, D. / Jouannigot, S. et al. | 2011
- 819022
-
Modeling free-carrier absorption and avalanching by ultrashort laser pulsesGulley, Jeremy R. et al. | 2011
- 819023
-
On the cooperativeness of nanosecond-laser induced damage during frequency doubling of 1064 nm light in KTiOPO4Wagner, Frank / Duchateau, Guillaume / Hildenbrand, Anne / Natoli, Jean-Yves / Commandre, Mireille et al. | 2011
- 819024
-
Carrier dynamics in KDP and DKDP crystals illuminated by intense femtosecond laser pulsesDuchateau, G. / Geoffroy, G. / Maunier, C. / Dyan, A. / Piombini, H. / Guizard, S. et al. | 2011
- 819027
-
Effect of strain on laser damage and its relation with precursor defects in KDP/DKDPGuillet, François / Bertussi, Bertrand / Surmin, Audrey / Duchateau, G. et al. | 2011
- 819028
-
The impact ionization coefficient in dielectric materials revisitedKarras, C. / Sun, Z. / Nguyen, D. N. / Emmert, L. A. / Rudolph, W. et al. | 2011
-
Laser-induced damage of Kapton thin films demonstrating temperature and wavelength dependent absorptance: a case study in remote-sensing material analysis [8190-08]Palm, W.J. / Marciniak, M.A. / Perram, G.P. / Gross, K.C. / Bailey, W.F. / Walters, C.T. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Characterization of optical materials and coatings for high-power NIR/VIS laser application [8190-69]Muhlig, C. / Bublitz, S. / Paa, W. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Absorption measurement of HR coated mirrors at 193nm with a Shack-Hartmann wavefront sensor [8190-34]Cho, B. / Danielewicz, E. / Rudisill, J.E. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Absolute measurement of absorptance in DUV optics from laser-induced wavefront deformations [8190-37]Mann, K. / Leinhos, U. / Sudradjat, J. / Schafer, B. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Laser ablation mechanism of transparent layers on semiconductors with ultrashort laser pulses [8190-44]Rublack, T. / Hartnauer, S. / Mergner, M. / Muchow, M. / Seifert, G. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Measurement and calculation of ternary oxide mixtures for thin films for ultra short pulse laser optics [8190-03]Jupe, M. / Mende, M. / Kolleck, C. / Ristau, D. / Gallais, L. / Mangote, B. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Third harmonic microscopy for optical material characterization [8190-24]Weber, R.A. / Rodriguez, C. / Nguyen, D.N. / Emmert, L.A. / Rudolph, W. / Patel, D. / Menoni, C.S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Effect of laser beam size on laser-induced damage performance [8190-13]Han, W. / Wang, F. / Zhou, L. / Li, F. / Feng, B. / Jia, H. / Xiang, Y. / Jing, F. / Zheng, W. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Impact of SiO~2 and CaF~2 surface composition on the absolute absorption at 193nm [8190-38]Balasa, I. / Blaschke, H. / Jensen, L. / Ristau, D. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Recent progress in the development of pulse compression gratings [8190-17]Neauport, J. / Bonod, N. / Hocquet, S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Self-laser conditioning of KDP and DKDP crystals [8190-71]Maunier, C. / Balas, M. / Donval, T. / Lamaignere, L. / Duchateau, G. / Mennerat, G. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Laser-induced damage thresholds of optical coatings at different temperature [8190-09]Mikami, K. / Motokoshi, S. / Fujita, M. / Jitsuno, T. / Tanaka, K.A. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Subnanosecond bulk damage thresholds of single-crystal YAG and diffusion-bonded YAG structures at 1 micron [8190-14]Stultz, R.D. / Yokoyama, K.E. / Lurier, J. / Ushinsky, M. / Farley, R.W. / Rogers, M.E. / Foran, B.J. / Thomas, M.D. / Griffin, A.J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Characterization of 1064nm laser-induced damage on antireflection coatings grown by atomic layer deposition [8190-11]Liu, Z. / Wei, Y. / Chen, S. / Luo, J. / Ma, P. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Damage effects of filaments on non-transparent materials at long distances [8190-65]Diener, K. / Borchert, H. / Schmitt, R. / Durand, M. / Houard, A. / Prade, B. / Mysyrowicz, A. / Durecu, A. / Fleury, D. / Moreau, B. et al. | 2011
-
An empirical investigation of the laser survivability curve: II [8190-72]Arenberg, J. / Riede, W. / Ciapponi, A. / Allenspacher, P. / Herringer, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laser [8190-79]Qu, Z. / Han, Y. / Xiong, S. / Li, B. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Excimer mirror thin film laser damage competition [8190-06]Stolz, C.J. / Blaschke, H. / Jensen, L. / Madebach, H. / Ristau, D. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Investigation of the laser-induced damage of dispersive coatings [8190-10]Angelov, I.B. / von Conta, A. / Trushin, S.A. / Major, Z. / Karsch, S. / Krausz, F. / Pervak, V. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Imaging studies of photodamage and recovery of anthraquinone derivatives doped into PMMA [8190-16]Anderson, B. / Ramini, S.K. / Kuzyk, M.G. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Optical coatings on laser crystals for HiPER project [8190-19]Oulehla, J. / Pokorny, P. / Lazar, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Recent progress in reversible photodegradation of Disperse Orange 11 when doped in PMMA [8190-18]Ramini, S.K. / Anderson, B. / Kuzyk, M.G. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Using engineered defects to study laser-induced damage in optical thin films with nanosecond pulses (Invited Paper) [8190-01]Cheng, X. / Ding, T. / He, W. / Zhang, J. / Jiao, H. / Ma, B. / Shen, Z. / Wang, Z. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
HfO~2/SiO~2 enhanced diamond turned aluminum mirrors for IR laser optics [8190-04]Wang, J. / Davis, R.W. / Wang, A.Q. / Schreiber, H. / Wilkinson, S.J. / Crifasi, J.C. / Felock, R.D. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Defect formation in oxide thin films [8190-52]Jensen, L.O. / Wagner, F. / Mende, M. / Gouldieff, C. / Blaschke, H. / Natoli, J.-Y. / Ristau, D. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Database on damage thresholds of picoseconds pulse for HR coatings [8190-57]Motokoshi, S. / Kato, K. / Somekawa, T. / Mikarni, K. / Sato, E. / Jitsuno, T. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Modeling max-of-n fluence distribution for optics lifetime [8190-25]Liao, Z.M. / Hubel, J. / Trenholme, J.B. / Carr, C.W. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Temperature dependences of fluorescence characteristic for Nd/Cr:YAG materials [8190-66]Honda, Y. / Yoshida, M. / Motokoshi, S. / Fujioka, K. / Jitsuno, T. / Nakatsuka, M. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Pulsed ablation of carbon/graphite surfaces and development of plume-kinetics model [8190-31]Roberts, C.D. / Marciniak, M.A. / Perram, G.P. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Electron dynamics in transparent materials under high-intensity laser irradiation (Invited Paper, Best Oral Presentation Award) [8190-41]Brenk, O. / Rethfeld, B. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Formation mechanism of self-organized nanogratings induced by femtosecond laser pulses on titanium surface [8190-59]Ahsan, M.S. / Kim, Y.G. / Lee, M.S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Luminescence of different surface flaws in high purity silica glass under UV excitation [8190-47]Fournier, J. / Neauport, J. / Grua, P. / Jubera, V. / Fargin, E. / Talaga, D. / Jouannigot, S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Low loss ion beam sputtered optical coatings and their applications [8190-02]Lalezari, R. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Laser damage threshold results for sputtered coatings produced using different deposition technologies [8190-05]MacKay, P. / Wakeham, S. / Wilde, M. / Dutson, J. / Allen, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Characterization of hafnia thin films made with different deposition technologies [8190-78]Ai, W. / Xiong, S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Deterministic single shot and multiple shot bulk laser damage thresholds of borosilicate glass at 1.064 μm [8190-27]Kimmel, M. / Do, B.T. / Smith, A.V. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Effect of stress on laser damage and its relation with precursor defects in KDP/DKDP [8190-76]Guillet, F. / Bertussi, B. / Surmin, A. / Duchateau, G. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Photothermal tomography of optical coatings based on surface thermal lensing technology [8190-28]Xu, J. / Zhu, M. / Zhao, Y. / Yi, K. / Shao, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Potential of large diameter MgF~2 single crystal grown by Czochralski method [8190-67]Hashimoto, Y. / Ikeda, Y. / Ariyuki, M. / Mochizuki, N. / Nawata, T. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Growth mechanism of laser-induced damage in fused silica [8190-45]Hu, G. / Yi, K. / Liu, X. / Zhao, Y. / Shao, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Carrier dynamics in KDP and DKDP crystals illuminated by intense femtosecond laser pulses [8190-50]Duchateau, G. / Geoffroy, G. / Maunier, C. / Dyan, A. / Piombini, H. / Guizard, S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Spontaneous and induced absorption in amorphous Ta~2O~5 dielectric thin films [8190-54]Markosyan, A.S. / Route, R. / Fejer, M.M. / Patel, D. / Menoni, C.S. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Femtosecond laser microfabrication in polymers towards memory devices and microfluidic applications [8190-20]Deepak, K.L.N. / Rao, S.V. / Rao, D.N. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
On the cooperativeness of nanosecond-laser induced damage during frequency doubling of 1064 nm light in KTiOPO~4 [8190-49]Wagner, F. / Duchateau, G. / Hildenbrand, A. / Natoli, J.-Y. / Commandre, M. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Laser-induced damage of coatings on Yb:YAG crystals at cryogenic condition [8190-07]Wang, H. / Zhang, W. / Chen, S. / Zhu, M. / He, H. / Fan, Z. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Estimation of the transverse stimulated Raman scattering gain coefficient in KDP and DKDP at 2 omega , 3 omega , and 4 omega [8190-21]Demos, S.G. / Raman, R.N. / Yang, S.T. / Negres, R.A. / Schaffers, K.I. / Henesian, M.A. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Laser-induced contamination on space optics (Invited Paper) [8190-30]Riede, W. / Schroeder, H. / Bataviciute, G. / Wernham, D. / Tighe, A. / Pettazzi, F. / Alves, J. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Comparative study of fused silica materials for ArF laser applications [8190-35]Muhlig, C. / Bublitz, S. / Bernitzki, H. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
Modeling free-carrier absorption and avalanching by ultrashort laser pulses [8190-48]Gulley, J.R. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011
-
The impact ionization coefficient in dielectric materials revisited (Best Poster Presentation Award) [8190-77]Karras, C. / Sun, Z. / Nguyen, D.N. / Emmert, L.A. / Rudolph, W. / SPIE (Society); Lawrence Livermore National Laboratory et al. | 2011