Integrating independent research into science curricula to foster STEM leadership [8729-14] (Englisch)
- Neue Suche nach: Queenan, C.
- Neue Suche nach: Calabro, A.
- Neue Suche nach: Becker, D.
- Neue Suche nach: SPIE (Society)
- Neue Suche nach: Queenan, C.
- Neue Suche nach: Calabro, A.
- Neue Suche nach: Becker, D.
- Neue Suche nach: Postek, Michael T.
- Neue Suche nach: SPIE (Society)
In:
Scanning microscopies
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8729 0F
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2013
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Integrating independent research into science curricula to foster STEM leadership [8729-14]
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Beteiligte:Queenan, C. ( Autor:in ) / Calabro, A. ( Autor:in ) / Becker, D. ( Autor:in ) / Postek, Michael T. / SPIE (Society)
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Kongress:Conference, Scanning microscopies ; 2013 ; Baltimore, MD
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Erschienen in:Scanning microscopies ; 8729 0FPROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8729 ; 8729 0F
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, Washington
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Erscheinungsdatum:01.01.2013
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Format / Umfang:8729 0F
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Anmerkungen:Includes bibliographical references and index.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 87290B
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HTA educational outreach program and change the equation participationGordon, Robert et al. | 2013
- 87290C
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Bringing students to the mountain: developing partnerships to introduce students to cutting-edge researchGillian-Daniel, Anne Lynn / Gordon, Robert J. / Taylor, Benjamin L. / McCarthy, Jon J. et al. | 2013
- 87290D
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Using the Hitachi TM 3000 in a middle school classroomWolfinger, Mary Ellen et al. | 2013
- 87290E
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Implementing STEM technology in a Title One middle school classroomHolcomb, Carolyn et al. | 2013
- 87290F
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Integrating independent research into science curricula to foster STEM leadershipQueenan, Craig / Calabro, Alyssa / Becker, David et al. | 2013
- 87290H
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Advances in photo-thermal infrared imaging microspectroscopyFurstenberg, Robert / Kendziora, Chris / Papantonakis, Michael / Nguyen, Viet / McGill, Andrew et al. | 2013
- 87290I
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Surface optical properties for copper based on surface Kramers-Kroning analysisTang, T. / Zhang, Z. M. / Tőkési, K. / Goto, K. / Ding, Z. J. et al. | 2013
- 87290J
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Monte Carlo simulation of realistic beam-sample interaction in SEM: application to evaluation of sharpness measurement methodsRuan, Z. / Mao, S. F. / Zhang, P. / Li, H. M. / Ding, Z. J. et al. | 2013
- 87290K
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Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurementZhang, P. / Mao, S. F. / Zhang, Z. M. / Ding, Z. J. et al. | 2013
- 87290L
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Monte Carlo simulation of x-ray photoemission electron microscopic imageZhang, Z. M. / Tang, T. / Mao, S. F. / Ding, Z. J. et al. | 2013
- 872901
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Front Matter: Volume 8729| 2013
- 872902
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Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true natureNewbury, Dale E. / Ritchie, Nicholas W. M. et al. | 2013
- 872903
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Does your SEM really tell the truth? Part 2Postek, Michael T. / Vladár, András E. / Purushotham, Kavuri P. et al. | 2013
- 872904
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Electron microscopy and forensic practiceKotrlý, Marek / Turková, Ivana et al. | 2013
- 872905
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A large range metrological atomic force microscope and its uncertainty analysisGao, S. / Li, Q. / Li, W. / Lu, M. / Shi, Y. et al. | 2013
- 872906
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Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation methodLi, Qi / Gao, Sitian / Li, Wei / Lu, Mingzhen / Shi, Yushu et al. | 2013
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Does your SEM really tell the truth? Part 2 (Keynote Paper) [8729-2]Postek, M.T. / Vladar, A.E. / Purushotham, K.P. / SPIE (Society) et al. | 2013
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Integrating independent research into science curricula to foster STEM leadership [8729-14]Queenan, C. / Calabro, A. / Becker, D. / SPIE (Society) et al. | 2013
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Monte Carlo simulation of realistic beam-sample interaction in SEM: application to evaluation of sharpness measurement methods [8729-18]Ruan, Z. / Mao, S.F. / Zhang, P. / Li, H.M. / Ding, Z.J. / SPIE (Society) et al. | 2013
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Electron microscopy and forensic practice (Invited Paper) [8729-3]Kotrly, M. / Turkova, I. / SPIE (Society) et al. | 2013
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Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurement [8729-19]Zhang, P. / Mao, S.F. / Zhang, Z.M. / Ding, Z.J. / SPIE (Society) et al. | 2013
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Monte Carlo simulation of x-ray photoemission electron microscopic image [8729-20]Zhang, Z.M. / Tang, T. / Mao, S.F. / Ding, Z.J. / SPIE (Society) et al. | 2013
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Using the Hitachi TM 3000 in a middle school classroom [8729-12]Wolfinger, M.E. / SPIE (Society) et al. | 2013
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Scanning electron microscopy/energy dispersive spectrometry fixed-beam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature (Keynote Paper) [8729-1]Newbury, D.E. / Ritchie, N.W.M. / SPIE (Society) et al. | 2013
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Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research [8729-11]Gillian-Daniel, A.L. / Gordon, R.J. / Taylor, B.L. / McCarthy, J.J. / SPIE (Society) et al. | 2013
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HTA educational outreach program and change the equation participation [8729-10]Gordon, R. / SPIE (Society) et al. | 2013
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Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method [8729-5]Li, Q. / Gao, S. / Li, W. / Lu, M. / Shi, Y. / SPIE (Society) et al. | 2013
-
Advances in photo-thermal infrared imaging microspectroscopy [8729-16]Furstenberg, R. / Kendziora, C. / Papantonakis, M. / Nguyen, V. / McGill, A. / SPIE (Society) et al. | 2013
-
A large range metrological atomic force microscope and its uncertainty analysis [8729-4]Gao, S. / Li, Q. / Li, W. / Lu, M. / Shi, Y. / SPIE (Society) et al. | 2013
-
Implementing STEM technology in a Title One middle school classroom [8729-13]Holcomb, C. / SPIE (Society) et al. | 2013
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Surface optical properties for copper based on surface Kramers-Kroning analysis [8729-17]Tang, T. / Zhang, Z.M. / Tokesi, K. / Goto, K. / Ding, Z.J. / SPIE (Society) et al. | 2013