Front Matter: Volume 11102 (Englisch)
In:
Applied Optical Metrology III
;
1110201-1110201-10
;
2019
-
ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Print
-
Titel:Front Matter: Volume 11102
-
Kongress:Applied Optical Metrology III
-
Erschienen in:Applied Optical Metrology III ; 1110201-1110201-10Proceedings of SPIE, the International Society for Optical Engineering ; 11102 ; 1110201-1110201-10
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:01.01.2019
-
Format / Umfang:1 pages
-
ISBN:
-
ISSN:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Print
-
Sprache:Englisch
-
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 111020A
-
Precise microscopic profilometry using diffractive image correlation and theoretical model simulationWu, Guo-Wei / Jiang, Ming-Jun / Chen, Liang-Chia et al. | 2019
- 111020B
-
Decomposition of non-rotationally symmetric wavefront aberrations into their azimuthal ordersReichelt, Stephan et al. | 2019
- 111020C
-
Hartmann vs reverse Hartmann test: a Fourier optics point of viewHénault, François / Pannetier, Cyril et al. | 2019
- 111020D
-
Air Force Research Laboratory Aero-Effects Laboratory system status and capabilitiesWilcox, Christopher C. / Healy, Keith P. / Tuffli, Andrea L. / Agena, Brian D. et al. | 2019
- 111020E
-
Analysis of shock waves in a supersonic wind tunnel at the AFRL Aero-Effects LaboratoryBingham, Samuel P. / Radosevich, Cameron / Healy, Keith / Agena, Brian / Tuffli, Andrea / Wilcox, Christopher et al. | 2019
- 111020F
-
Image degradation due to various aero-optical environmentsKalensky, Matthew / Wells, Jonathon / Jumper, Eric J. / Gordeyev, Stanislav et al. | 2019
- 111020G
-
Does interferometry work? A critical look at the foundations of interferometric surface topography measurementde Groot, Peter / Colonna de Lega, Xavier / Su, Rong / Leach, Richard et al. | 2019
- 111020H
-
3D morphology of melanoma cells using digital holographic interferometryPalacios-Ortega, Natalith / Mendoza Santoyo, Fernando / Flores Moreno, J. Mauricio / Hernández-Montes, María del Socorro / De la Torre Ibarra, Manuel H. / Plascencia, Germán et al. | 2019
- 111020K
-
Long-term stability of the wavelength method of height scale calibration for interference microscopyFitzgerald, Danette / de Groot, Peter et al. | 2019
- 111020L
-
Frequency sweeping interferometry for robust and reliable distance measurements in harsh accelerator environmentSosin, M. / Mainaud-Durand, H. / Rude, V. / Rutkowski, J. et al. | 2019
- 111020M
-
Linear algebra approach to phase shifting interferometry: numerical methodsEscobar, Marco A. / Estrada, Julio C. / Vargas, Javier et al. | 2019
- 111020N
-
Random dynamic interferometer: cavity amplified speckle spectroscopy using a highly symmetric coherent field created inside a closed Lambertian optical cavityGraciani, Guillaume / Amblard, Francois et al. | 2019
- 111020P
-
A new method for solving the height problem in deflectometryLiang, Hanning / Zimmermann, Alexander / Kickingereder, Reiner / Faber, Christian et al. | 2019
- 111020Q
-
Phase measurement deviations in deflectometry due to properties of technical surfacesPatra, Shekhar Kumar / Bartsch, Jonas / Kalms, Michael / Bergmann, Ralf B. et al. | 2019
- 111020R
-
Schlieren unwrapped: distortion correction in digital focusing schlierenBuckner, Benjamin D. / L'Esperance, Drew et al. | 2019
- 111020S
-
Precise positioning in the in-situ deflectometric measurement of optical surfacesZhang, Xiangchao / Xu, Xueyang / Niu, Zhenqi / Li, Shaoliang / Peng, Siping et al. | 2019
- 111020T
-
Point spread function measurement for projector based on Fourier single-pixel imagingWu, Ruotong / Jiang, Hongzhi / Zhao, Huijie / Li, Xudong / Guo, Qi et al. | 2019
- 111020U
-
Toward international standards on evaluation of hologramsYoshikawa, Hiroshi et al. | 2019
- 111020V
-
Photometric evaluation of hologramsCrenshaw, M. Melissa et al. | 2019
- 111020W
-
Quality requirements for fine art synthetic hologramsDesbiens, Jacques et al. | 2019
- 111020X
-
Evaluation of the spatial frequency response and the uncertainty for a commercial structured light systemJain, Swati / Allen, Angela Davies / Zhang, Bin et al. | 2019
- 111020Y
-
Correction for aberration introduced by the curvature of the reflective spatial light modulatorHe, A. / Quan, C. et al. | 2019
- 111021A
-
3D thickness measurement using pulse-driven optical coherence tomography based on wavelet transformSuzuki, Takamasa / Liu, Bin / Choi, Samuel et al. | 2019
- 111021C
-
Using wrapped phases for light-field three-dimensional imagingChen, Jiawei / Cai, Zewei / Liu, Xiaoli / Pedrini, Giancarlo / Osten, Wolfgang / Peng, Xiang et al. | 2019
- 111021D
-
Phase-shifting by polarizer rotations in a common-path cube beam-splitter interferometerRivera-Ortega, U. / Lopez-Mago, D. et al. | 2019
- 111021E
-
Multiple absolute distances-based 3D coordinate measurement system for mobile machinesKim, S. / Oh, J. / Han, S.-H. / Nguyen, Q.-K. / Ro, S.-K. / Kim, S.-W. / Kim, W. et al. | 2019
- 111021F
-
Detection and discrimination of particles on and below smooth surfaces by laser scattering with polarization measurementWu, Fan / Du, Yubin / Zhang, Pengfei / Li, Yanwei / Yang, Yongying et al. | 2019
- 111021G
-
Absolute distance measurement system for precise 3D positioningHan, Seongheum / Kim, Seungman / Oh, Jeong-Seok / Ro, Seung-Kook / Kim, Seung-Woo et al. | 2019
- 111021I
-
Mechanical deformations in a graphene-reinforced cellulose sampleDomínguez, A. D. / Rayas, J. A. / Martínez, A. et al. | 2019
- 111021J
-
Real-time digital demodulation algorithm for an interferometric magnetic field sensorPrasai, Chris / Getz, Lauren / Krause, Ben / Tayag, Tristan J. et al. | 2019
- 111021K
-
Investigation and mapping strategy on influence of surface tilting in diffractive pattern correlation profilometryWu, Guo-Wei / Jiang, Ming-Jun / Chen, Liang-Chia et al. | 2019
- 111021L
-
Measurement of patterned surfaces with non-fluorescent structured illumination microscopeUsuki, S. / Shibata, G. / Miura, Kenjiro T. et al. | 2019
- 111021N
-
Nano-antennas excitation with visible light and their response as observed with a confocal microscopeLuis, Daniel / Mendoza Santoyo, Fernando / Flores Moreno, Jorge Mauricio / González Contreras, Francisco Javier / Méndez-Lozoya, Javier et al. | 2019
- 1110201
-
Front Matter: Volume 11102| 2019
- 1110203
-
Electromagnetic analysis of three-dimensional shape measurement method based on speckle interferometry for fine structure by detecting phase distributionArai, Y. et al. | 2019
- 1110204
-
Recent development in BTDF/BRDF metrology on large-scale Lambertian-like diffusers: application to on-board calibration units in space instrumentationMazy, E. / Michel, C. / Marcotte, S. / Clermont, L. / Marquet, B. / Jacobs, J. / Domken, I. / Stockman, Y. et al. | 2019
- 1110205
-
High-accuracy surface measurement through modelling of the surface transfer function in interference microscopySu, Rong / Thomas, Matthew / Liu, Mingyu / Coupland, Jeremy / Leach, Richard et al. | 2019
- 1110206
-
A proposal to eliminate the skew ray error in corneal topography using Placido disks imagesGomez-Tejada, Daniel / Malacara Hernández, Daniel et al. | 2019
- 1110207
-
Robust and objective automatic optical surface inspection using modulated dark field phasing illuminationChoi, Heejoo / Kam, John / Berkson, Joel D. / Graves, Logan R. / Lei, Huang / Kim, Dae Wook et al. | 2019
- 1110208
-
High-speed 3D imaging with three binary patterns using Hilbert transformHyun, Jae-Sang / Zhang, Song et al. | 2019
- 1110209
-
A novel aspherical surface measurement system based on a randomly encoded hybrid grating wavefront sensorZhang, Rui / Yang, Yongying / Liang, Zijian et al. | 2019
- 1110210
-
Detection and classification of glass defects based on machine visionJiang, Jiabin / Xiao, Xiang / Feng, Guohua / Lu, ZiChen / Yang, Yongying et al. | 2019
- 1110211
-
Close-range image stitching based on depth information and moving DLTXue, Mowen / Li, Xudong / Jiang, Hongzhi / Zhao, Huijie et al. | 2019
- 1110212
-
3D shop floor characterization of radii and chamfersNovak, Erik / Lindell, Kramer / Wheeler, Jared et al. | 2019
- 1110213
-
Stochastic resonance and speed enhancement of thermoreflectance imaging for photonic device applicationsKoskelo, EliseAnne / Allison, Kyle / Hallman, Mark / Hardin, Johanna / Radunskaya, Ami / Hudgings, Janice et al. | 2019
- 1110215
-
Scalar-field reconstruction algorithms using plenoptic camerasClifford, Chris / Thurow, Brian et al. | 2019
- 1110216
-
Volumetric spectral imaging and two-color pyrometry of flames using plenoptic camerasGeorge, Jacob / Clifford, Christopher / Jenkins, Thomas / Thurow, Brian et al. | 2019
- 1110217
-
In-situ monitoring and quality control for in-space additive manufacturing using laser acoustical resonance spectroscopyTrolinger, James D. / Dioumaev, Andrei K. / Lal, Amit K. / Valdevit, Lorenzo / Zhang, Yunfei et al. | 2019
- 1110218
-
Static Fourier transform mid-infrared spectrometer with continuous background correctionKöhler, Michael H. / Schardt, Michael / Ghazala, Hamza B. / Colicchia, Ennio / Kienle, Patrick / Dong, Xingchen / Wang, Kun / Koch, Alexander W. et al. | 2019