STM Characterization of InP Gratings for DFB Laser Fabrication (Unbekannt)
- Neue Suche nach: Meneghini, G.
- Neue Suche nach: Picotto, G. B.
- Neue Suche nach: Gentili, M.
- Neue Suche nach: Grella, L.
- Neue Suche nach: Meneghini, G.
- Neue Suche nach: Picotto, G. B.
- Neue Suche nach: Gentili, M.
- Neue Suche nach: Grella, L.
In:
Proceedings of the European Conference on Applications of Surface and Interface Analysis
1/12
;
296
;
1994
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:STM Characterization of InP Gratings for DFB Laser Fabrication
-
Beteiligte:Meneghini, G. ( Autor:in ) / Picotto, G. B. ( Autor:in ) / Gentili, M. ( Autor:in ) / Grella, L. ( Autor:in )
-
Erschienen in:Proceedings of the European Conference on Applications of Surface and Interface Analysis , 1/12 ; 296SURFACE AND INTERFACE ANALYSIS ; 22, 1/12 ; 296
-
Verlag:
- Neue Suche nach: JOHN WILEY & SONS LTD
-
Erscheinungsdatum:01.01.1994
-
Format / Umfang:296 pages
-
ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Unbekannt
- Neue Suche nach: 660.293
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 660.293 -
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis – Band 22, Ausgabe 1/12
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 9
-
Combined Depth Profile Analysis with SNMS, SIMS and XPS: Preferential Sputtering and Oxygen Transport in Binary Metal Oxide Multilayer SystemsAlbers, T. / Neumann, M. / Lipinsky, D. / Wiedmann, L. et al. | 1994
- 14
-
Oxidation Study of 3d Transition Metals (Cr, Fe, Co and Ni) and Rare Earth (Tb): Application to Auger Depth Profiling of Magneto-optical DiskAbe, Y. / Kato, A. / Nakamura, T. et al. | 1994
- 18
-
Auger Electron Spectroscopy Studies of Interdiffusion in Electrodeposited Amorphous Ni-P AlloysBukaluk, A. et al. | 1994
- 22
-
Crystalline Effects on Depth Resolution in AES Depth ProfilingKajiwara, K. et al. | 1994
- 27
-
Laser Etching of Silicon: Dopant Desorption, Diffusion and Segregation During Laser Induced Surface MeltingDesmur, A. / Ozenne, J.-B. / Bourguignon, B. / Boulmer, J. et al. | 1994
- 31
-
Small-area XPS Investigation on Ion-induced Chemical Modifications During Depth-profiling of An Al~xGa~1~-~xAs/GaAs StructurePadeletti, G. / Ingo, G. M. et al. | 1994
- 36
-
X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy of -FeSi~2 Films Grown by Ion Beam Assisted DepositionArmelao, L. / Terrasi, A. / Boaro, M. / Ravesi, S. et al. | 1994
- 41
-
Application of Electron Spectroscopies Aided by the Pattern Recognition Method for Quantitative Analysis of Solid SurfacesJablonski, A. / Lesiak, B. / Zommer, L. / Bilinski, A. et al. | 1994
- 45
-
Local Electronic Structures in Phosphorus OxyanionsKoever, L. / Nemethy, A. / Cserny, I. / Nisawa, A. et al. | 1994
- 51
-
Experimental Determination of Attenuation Lengths of Photo- and Augerelectrons in Silicon Dioxide and in Silicon Nitride in the Energy Range 500 eV < E~k~i~n < 3100 eVEbel, M. F. / Ebel, H. / Hofmann, A. / Svagera, R. et al. | 1994
- 54
-
Quantitative Depth Profile Analysis by EPMA Combined with Monte-Carlo SimulationAmmann, N. / Karduck, P. et al. | 1994
- 60
-
Chemical Information from Auger Data using Factor Analysis: Some ExamplesChemelli, C. et al. | 1994
- 65
-
Weight Function for Linear Least Squares Fit of Binary CuNi and PtPd Alloy Auger SpectraRoos, W. D. / Van Wyk, G. N. / Du Plessis, J. et al. | 1994
- 69
-
Computer Programs for Surface Analysis by SIMS and SNMSFitzgerald, A. G. / Watton, H. L. L. / Storey, B. E. / Colligon, J. S. et al. | 1994
- 75
-
True Auger Spectral Shapes: A Step to Standard SpectraGoto, K. / Sakakibara, N. / Takeichi, Y. / Numata, Y. et al. | 1994
- 79
-
Influence of the Elastic Scattering: Cross-section on Angle-resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and AuWerner, W. S. M. / Hayek, M. et al. | 1994
- 84
-
Correction of Drift and Slope Distortions in STM Image and Scanner CalibrationYurov, V. Y. / Klimov, A. N. et al. | 1994
- 89
-
SiO~x Surface Stoichiometry by XPS: a Comparison of Various MethodsAlfonsetti, R. / De Simone, G. / Lozzi, L. / Passacantando, M. et al. | 1994
- 93
-
Factor Analysis, a Useful Tool for Solving Analytical Problems in AES and XPS: a Study of the Performances and Limitations of the Indicator FunctionArranz, A. / Palacio, C. et al. | 1994
- 98
-
Internal Analyser Inelastic Scattering Effects in XPS Quantitative AnalysisBattistoni, C. / Mattogno, G. / Righini, G. et al. | 1994
- 103
-
Simultaneous Appearance of Sharp and Diffuse Spots in LEED: Experiments and Simulation for SiSakakibara, N. / Hisada, Y. / Hattori, T. / Goto, K. et al. | 1994
- 106
-
Ambient Oxygen Effect in Ga^+ FIB-SIMSSakamoto, T. / Tomiyasu, B. / Owari, M. / Nihei, Y. et al. | 1994
- 111
-
Charging and Mixing Effects During the XPS Analysis of Mixtures of OxidesFernandez, A. / Espinos, J. P. / Leinen, D. / Gonzalez-Elipe, A. R. et al. | 1994
- 115
-
Simulation of Insulator Charging by a Narrow Electron BeamVicario, E. / Rosenberg, N. / Renoud, R. et al. | 1994
- 120
-
Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and Al Determined by Elastic Peak Electron SpectroscopyBeilschmidt, H. / Tiliuin, I. S. / Werner, W. S. M. et al. | 1994
- 124
-
Quantitative Analysis of REELS Spectra of ZrO~2: Determination of the Dielectric Loss Function and Inelastic Mean Free PathsYubero, F. / Sanz, J. M. / Trigo, J. F. / Elizalde, E. et al. | 1994
- 129
-
Database of Relativistic Elastic Scattering Cross-sections for Calculations of Photoelectron and Auger Electron TransportJablonski, A. / Tougaard, S. et al. | 1994
- 134
-
Quantitative GDOS Analysis of Oxide Films on SteelsSuzuki, S. / Suzuki, K. / Mizuno, K. et al. | 1994
- 139
-
Preparation and Characterization of Cubic Boron Nitride and Metal Boron Nitride FilmsGissler, W. et al. | 1994
- 149
-
Recent Progress of Thin Film Technology in Automobile IndustryTaga, Y. et al. | 1994
- 156
-
In-depth Homogeneity of Vapour Deposited Multicomponent Thin FilmsJehn, H. A. / Huber, E. / Hofmann, S. et al. | 1994
- 162
-
Ex situ and In situ Characterization of Surfactant Monolayers Adsorbed on Nonmetallic Substrate by Infrared Reflection SpectroscopyMielczarski, J. A. et al. | 1994
- 167
-
Auger Electron Spectroscopy Studies on TiN~xHaupt, J. et al. | 1994
- 171
-
In situ Quantitative Soft x-ray Spectrometry of Thin Films Synthesized by DC SputteringLegrand, P. B. / Dauchot, J. P. / Wautelet, M. / Heco, M. et al. | 1994
- 175
-
Determination of the Depth Resolution of Auger Electron Spectroscopy Depth Profiles of Anodic Barrier Oxide Films on Differently Pretreated Aluminium SubstratesDe Laet, J. / De Boeck, K. / Terryn, H. / Vereecken, J. et al. | 1994
- 181
-
Pulsed Laser Induced Ablation Applied to Epitaxial Growth of Semiconductor Materials: Selenides and Tellurides Plume AnalysisTeghil, R. / Giardini Guidoni, A. / Mele, A. / Piccirillo, S. et al. | 1994
- 186
-
Deposition of CeO~2 on Si(111) Studied by LEED, AES, XPS and RBSGuillaume, C. E. / Vermeersch, M. / Sporken, R. / Verbist, J. J. et al. | 1994
- 190
-
Surface Stoichiometry Determination of SiO~xN~y Thin Films by Means of XPSLozzi, L. / Passacantando, M. / Picozzi, P. / Santucci, S. et al. | 1994
- 193
-
Initial Growth of AlN on Clean and Oxidised Iron Studied by AES and EELSMalengreau, F. / Vermeeersch, M. / Sporken, R. / Philippe, L. et al. | 1994
- 197
-
Investigation of CdS Passivation Layers on Hg~1~-~xCd~xTeKaciulis, S. / Mattogno, G. / Viticoli, S. / Marini, M. E. et al. | 1994
- 202
-
XPS Study of Amorphous As~2S~3 Films Deposited onto Chromium LayersPetkov, K. / Krastev, V. / Marinova, T. et al. | 1994
- 206
-
XPS Analysis of Lithium Intercalation in Thin Films of Molybdenum OxysulphidesBenoist, L. / Gonbeau, D. / Pfister-Guillouzo, G. / Schmidt, E. et al. | 1994
- 211
-
The Growth Mode of Copper and Iron for the Cu/Fe and Fe/Cu InterfacesPolzonetti, G. / Di Castro, V. / Furlani, C. et al. | 1994
- 214
-
Growth of Cobalt Overlayers onto Si(100)Benitez, G. / Carelli, J. L. / Heras, J. M. / Viscido, L. et al. | 1994
- 218
-
An XPS Study of Diamond Films Grown on Differently Pretreated Silicon SubstratesArezzo, F. / Severini, E. / Zacchetti, N. et al. | 1994
- 224
-
Surface Modification of PET Films with RF Plasma and Adhesion of in situ Evaporated Al on PETLe, Q. T. / Pireaux, J. J. / Verbist, J. J. et al. | 1994
- 230
-
The Chemical Environment of Nitrogen in the Surface of Carbon FibresAlexander, M. R. / Jones, F. R. et al. | 1994
- 236
-
XPS and AES Study of Al~2O~3/Ti6Al4V Interface: Influence of Oxidation and Nitruration of the Metal SurfaceDelogu, P. / Dikonimos-Makris, T. / Giorgi, R. / Lascovich, J. et al. | 1994
- 242
-
An XPS and SEMS Study of Silica Sol-gel/Metal Substrate InteractionStoch, A. / Stoch, J. / Rakowska, A. et al. | 1994
- 248
-
Characterization of Nanophase Powders Prepared by Laser SynthesisGiorgi, R. / Martelli, S. / Turtu, S. / Zappa, G. et al. | 1994
- 254
-
Insulator Surface AnalysisLe Gressus, C. / Blaise, G. et al. | 1994
- 258
-
Interface Analysis of Ceramic Matrix Composites by XPS, AES, SEM and XRDContarini, S. / Giunta, G. / Loreti, S. / Nistico, N. et al. | 1994
- 263
-
The Microchemistry of Interfaces in Fibre-reinforced Ceramics and GlassesSchneider, R. / Woltersdorf, J. et al. | 1994
- 267
-
Surface versus Bulk Composition of a Phosphate GlassMeisel, W. / Sprenger, D. / Guetlich, P. et al. | 1994
- 271
-
Electron Spectroscopy of Porous Silicon Layers. Indirect Detection of Hydrogen by Elastic Peak Electron SpectroscopyGergely, G. / Gruzza, B. / Bideux, L. / Bondot, P. et al. | 1994
- 275
-
XPS and SEM Studies of Ca- and Ni-substituted LaCrO~3 after Quenching from Reducing and Oxidizing Atmospheres at 800CGlenne, R. / Horst, J. A. / Joergensen, S. / Norby, T. et al. | 1994
- 280
-
High-Resolution Electron-Energy-Loss Spectroscopy of Hydroxyl Groups at the Surface of Bulk Insulating OxidesCoustet, V. / Jupille, J. et al. | 1994
- 284
-
Investigation of the Thermal Degradation of Polyacrylonitrile on Various GlassesKeller, B. A. / Loewe, C. / Hany, R. et al. | 1994
- 290
-
Surface Structure of the PAN-based Carbon Fibres Studied by the Scanning Probe Microscopy (SPM)Zhdan, P. A. / Grey, D. / Castle, J. E. et al. | 1994
- 296
-
STM Characterization of InP Gratings for DFB Laser FabricationMeneghini, G. / Picotto, G. B. / Gentili, M. / Grella, L. et al. | 1994
- 300
-
The Investigation of Instrumental and Sample Parameters as Potential Sources for Affecting the Reproducibility of Isotopic Ratio Measurements in Secondary Ion Mass SpectrometryAdriaens, A. / Adams, F. et al. | 1994
- 304
-
Automatic Matching of Dissimilar SAM-ImagesBoehmig, S. D. / Reichl, B. M. / Eisl, M. M. / Stoeri, H. et al. | 1994
- 308
-
An Interfacial Study of a Sigma Fibre/Ti-6Al-4V Composite Using Scanning Auger/EDX MicroscopyBaker, M. A. / Upadhyaya, D. et al. | 1994
- 314
-
Surface Structure of Al-Sn Layered Systems Codeposited in the Presence of OxygenKoever, L. / Nemethy, A. / Barna, P. B. / Adamik, M. et al. | 1994
- 318
-
Impurity Segregation in an Fe-3.5at.%Si BicrystalReichl, B. M. / Eisl, M. M. / Boehmig, S. D. / Stoeri, H. et al. | 1994
- 323
-
Surface Composition of Machined Leaded BrassWu, J. X. / Ji, M. R. / Galeotti, M. / Giusti, A. M. et al. | 1994
- 327
-
Evaluation of Temperature-dependent Surface Chemistry in Zr~2Fe and ZrVFe via X-ray Photoemission SpectroscopyKovac, J. / Sakho, O. / Manini, P. / Sancrotti, M. et al. | 1994
- 331
-
Advances in Auger Microanalysis for Semiconductor TechnologyPamler, W. et al. | 1994
- 338
-
Low Energy Field Emission Auger Electron SpectroscopyForsyth, N. M. / Bean, S. et al. | 1994
- 342
-
Secondary Ion Mass Spectrometry of Si/Ge Structures Grown by Surfactant-mediated Epitaxy and by Low Pressure Chemical Vapour DepositionHerion, J. / Siekmann, H. / Voigtlaender, B. / Vescan, L. et al. | 1994
- 346
-
Ellipsometric Investigation of Single Crystalline Cz-Si Subjected to Hydrostatic PressureKaminska, A. M. / Misiuk, A. / Wolf, J. et al. | 1994
- 350
-
Silicon-Insulator Interface Probing by Reflected Optical Second Harmonic GenerationKravetsky, I. V. / Kulyuk, L. L. / Micu, A. V. et al. | 1994
- 353
-
Characterization and Reliability of Ti/Ni/Au, Ti/Ni/Ag and Ti/Ni Back-Side Metallizations in the Die-bonding of Power Electronic DevicesScandurra, A. / Porto, A. / Mameli, L. / Viscuso, O. et al. | 1994
- 358
-
In-depth Inhomogeneous Photoluminescent Properties of Porous Silicon LayersParkhutik, V. P. / Martinez-Duart, J. M. / Moreno, D. / Albella, J. M. et al. | 1994
- 363
-
XPS Investigations of Electrochemically Modified Porous Silicon LayersJeske, M. / Jung, K. G. / Schultze, J. W. / Thoenissen, M. et al. | 1994
- 367
-
SIMS and X-ray Diffraction Characterization of Carbon-Doped GaAs, Al~xGa~1~-~xAs Films Grown by MBEGerardi, C. / Giannini, C. / Tapfer, L. / Fischer, A. et al. | 1994
- 372
-
ESCA Investigation of SnO~x Films Used as Gas SensorsSanjines, R. / Rosenfeld, D. / Gozzo, F. / Almeras, P. et al. | 1994
- 376
-
XPS Analysis of Sol-gel Processed Doped and Undoped TiO~2 Films for SensorsZanoni, R. / Righini, G. / Montenero, A. / Gnappi, G. et al. | 1994
- 380
-
Interfacial Depth Profiling of Superconducting High-T~c Mono- and Multilayer Structures by Auger Electron SpectroscopySeibt, E. W. / Zalar, A. / Panjan, P. et al. | 1994
- 387
-
Interfacial Phenomena in PbBiSrCaCuO/Ag and Ag-In: Wettability, AES and XPS StudiesPolak, M. / Baram, J. / Froumin, N. et al. | 1994
- 393
-
Tribological Behaviour of Heat-Treated Thin Films of Electropolymerized PolyacrylonitrileNoel, S. / Newton, P. / Bodin, C. / House, F. et al. | 1994
- 398
-
Characterisation of MoO~x/ZrO~2 System by XPS and IR SpectroscopiesGazzoli, D. / Prinetto, F. / Campa, M. C. / Cimino, A. et al. | 1994
- 403
-
XPS-investigation of Titanium Modified MFI-type ZeolitesGrohmann, I. / Pilz, W. / Walther, G. / Kosslick, H. et al. | 1994
- 407
-
Study of the Bulk and Surface Acidity of Protonated Y Zeolites by TPD and XPSGuimon, C. / Boreave, A. / Pfister-Guillouzo, G. et al. | 1994
- 412
-
Surface Reactions at the Controlled Structure of SrTiO~3 (001)Kudo, M. / Hikita, T. / Hanada, T. / Sekine, R. et al. | 1994
- 417
-
Identification of the Fixed Nitrogen Containing Species During the Photo-oxidative Fixation of Molecular Nitrogen on UV-illuminated TiO~2 SurfacesNavio, J. A. / Real, C. / Bickley, R. I. et al. | 1994
- 421
-
High Temperature Corrosion Characterisation by the Combined Use of Surface Microsurgery and Surface AnalysisBennett, M. J. et al. | 1994
- 431
-
Surface Analytical Investigations of Al and (Ti, Al) Nitrides Formed by Ion Implantation and their Corrosion PropertiesSimson, S. / Heide, N. / Schultze, J. W. et al. | 1994
- 436
-
Use of Ion Implantation to Study the Corrosion of an Austenitic Steel in an Oxidizing/Sulphidizing AtmosphereStroosnijder, M. F. / Norton, J. F. et al. | 1994
- 441
-
AES and SAM Studies of Oxide Formation on Inconel 600 at High TemperaturesAlstrup, N. C. / Langvad, N. / Chorkendorff, I. et al. | 1994
- 445
-
Non-destructive Characterization of Chromium Phosphate Coated Aluminium with SE and FTIRS Correlated to Surface Analytical Analysis by AES and TEMGoeminne, G. / De Laet, J. / Terryn, H. / Vereecken, J. et al. | 1994
- 451
-
Application of Reflectance Spectrophotometry to the Study of Copper (I) Oxides (Cu~2O and Cu~3O~2) on Metallic SubstrateLefez, B. / Kartouni, K. / Lenglet, M. / Roennow, D. et al. | 1994
- 456
-
Theoretical and Experimental Study of the Infrared Reflectance of Multilayer Oxide Films on MetalsLefez, B. / Lenglet, M. et al. | 1994
- 462
-
Analytical and Electrochemical Study of Passive Films Formed on Nickel-Chromium Alloys: Influence of the Chromium Bulk ConcentrationBoudin, S. / Vignes, J.-L. / Lorang, G. / Da Cunha Belo, M. et al. | 1994
- 467
-
AES Investigations of Local Inhomogeneities in Aluminium Oxide Films on Fe-based AlloysOswald, S. / John, A. / Quadakkers, W. J. et al. | 1994
- 472
-
Ion Beam Analyses of Ceramics and Glasses in Nuclear EnergyMatzke, H. et al. | 1994
- 477
-
A Spectroscopic Analysis of Plasma Polymers Prepared from a Series of Vinyl SulphonesWard, A. J. / Short, R. D. et al. | 1994
- 483
-
The Formation of the Copper/Polyphenylquinoxaline Interface: An HREELS StudyGregoire, C. / Pireaux, J. J. / Cros, A. / Caudano, R. et al. | 1994
- 485
-
The Use of XPS Valence Band Spectra in the Study of Plasma-deposited Films of Tetramethyldisiloxane or HydroxyethylmethacrylateGarbassi, F. / Morra, M. / Occhiello, E. / Pozzi, L. et al. | 1994
- 491
-
Interfacial Effects of a Multifunctional Additive on Carbon Black Filled RubberSheng, E. / Bradley, R. H. / Sutherland, I. / Freakley, P. K. et al. | 1994
- 497
-
XPS of Oxidised Wool Fibre SurfacesBradley, R. H. / Clackson, I. L. / Sykes, D. E. et al. | 1994
- 502
-
XPS Analysis of Polypropylene Grafted with Acrylic MonomersDe Lange, P. J. / Gebben, B. / Elfrink, P. J. et al. | 1994
- 507
-
An XPS Valence Band Study of Alkane Chains Secondary StructureRiga, J. / Delhalle, J. / Deleuze, M. / Pireaux, J. J. et al. | 1994
- 511
-
Optical and Electronic Properties of Ag- and Cu-TCNQ in Polymeric MatrixArena, A. / Di Marco, G. / Giorgi, R. / Mezzasalma, A. M. et al. | 1994
- 515
-
ARXPS and LEISS Characterizations for Chemically Etched and Ion-bombarded GaAs(100) SurfacesSullivan, J. L. / Yu, W. / Saied, S. O. et al. | 1994
- 520
-
Comparison Between Pulsed Laser and Ion Irradiation of Hydrogenated Amorphous Carbon FilmsCompagnini, G. / Reitano, R. et al. | 1994
- 524
-
Irradiation Effects Induced by Reactive and Non-reactive Low Energy Ion Irradiation of Graphite: an Electron Spectroscopy StudyGouzman, I. / Brener, R. / Cytermann, C. / Hoffman, A. et al. | 1994
- 528
-
Radiation Effects in Static SIMS of PolymersLicciardello, A. / Wenclawiak, B. / Boes, C. / Benninghoven, A. et al. | 1994
- 532
-
Degradation of Polymers by Hyperthermal Atomic OxygenVered, R. / Matlis, S. / Nahor, G. / Lempert, G. D. et al. | 1994
- 538
-
Argon Bombardment-induced Topography Development on InPMalherbe, J. B. / Van der Berg, N. G. et al. | 1994
- 543
-
Surface Compositional Changes of InP due to Krypton Ion BombardmentMalherbe, J. B. / Van der Berg, N. G. et al. | 1994
- 547
-
Moessbauer and Auger Spectroscopic Investigations of Fe-Si Alloys Produced by Ion ImplantationReuther, H. et al. | 1994
- 551
-
Ion Bombardment Induced Modification of Polyvinyltrimethylsilane Studied by XPSToth, A. / Bertoti, I. / Khotimsky, V. S. et al. | 1994
- 556
-
Surface Concentration Modification of PtPd Alloys by Noble Gas Ion SputteringDu Plessis, J. / Taglauer, E. et al. | 1994
- 561
-
Recent Aspects of Surface Infrared SpectroscopyDumas, P. et al. | 1994
- 568
-
Hydrogen Content of C~6~0 Fullerenes, Measured by Elastic Recoil DetectionBrandstoetter, A. / Benka, O. / Palmetshofer, L. / Steinbauer, E. et al. | 1994
- 572
-
Glancing Incidence X-ray Analysis: Forgotten or to be Discovered?Hoogenhof, W. W. V. D. / De Boer, D. K. G. et al. | 1994
- 576
-
The Design and Development of a Time of Flight Fast Atom/Ion Scattering SpectrometerGiles, R. / Sullivan, J. L. / Pearce, C. G. et al. | 1994
- 581
-
Auger Imaging from Rough, Chemically Inhomogeneous, MaterialsCrone, M. / Barkshire, J. R. / Prutton, M. / Kenny, P. G. et al. | 1994
- 585
-
Surface Acoustic Wave Resonance Spectroscopy (SAWRS) as A Novel Technique to Study Surface PhenomenaBoronin, A. I. / Kvon, R. I. / Prosvirin, I. P. / Brezhnev, V. N. et al. | 1994
- 590
-
Extended Fine Structure in the Secondary Electron Emission Spectra of Graphite and Glassy CarbonHoffman, A. / Brener, R. / Cytermann, C. et al. | 1994
- 594
-
The Influence of Al Oxidation on the Cu/Al~2O~3 Interface Formation: an XPS StudyCiampi, S. / Di Castro, V. et al. | 1994
- 598
-
Bulk-to-Surface Diffusion Measurements in a (111)Cu(0.1at.%)Sn Single Crystal Using a Linear Programmed Heating MethodViljoen, E. C. / Du Plessis, J. et al. | 1994
- 602
-
Investigation of Thin Films by Soft X-ray Fluorescence and by Total Electron Yield MeasurementsEbel, H. / Mantler, M. / Svagera, R. / Kaitna, R. et al. | 1994
- 605
-
Optical Second Harmonic Generation as a Crystalline Surface Symmetry Probe for III-V SemiconductorsKravetsky, I. V. / Kulyuk, L. L. et al. | 1994
- 609
-
The Use of the Anaerobic Transfer Electrochemical Cell in the XPS Investigation of PolyanilineMorea, G. / Vickerman, J. C. / Walton, J. et al. | 1994
- 614
-
Small-area XPS and XAES Study of the Iron Ore Smelting ProcessIngo, G. M. / Mazzoni, S. / Bultrini, G. / Fontana, S. et al. | 1994