Hydrogen desorption characteristics of composite Co-TiN nanoparticles (Englisch)
- Neue Suche nach: Sakka, Y.
- Neue Suche nach: Ohno, S.
- Neue Suche nach: Sakka, Y.
- Neue Suche nach: Ohno, S.
- Neue Suche nach: Feldman, L. C.
- Neue Suche nach: Nishizawa, J.
- Neue Suche nach: Van der Weg, W. F.
In:
A journal devoted to applied physics and chemistry of surfaces and interfaces
com
;
232-237
;
1996
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Hydrogen desorption characteristics of composite Co-TiN nanoparticles
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Beteiligte:Sakka, Y. ( Autor:in ) / Ohno, S. ( Autor:in ) / Feldman, L. C. / Nishizawa, J. / Van der Weg, W. F.
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Erschienen in:APPLIED SURFACE SCIENCE ; 100/101, com ; 232-237
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Verlag:
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Erscheinungsdatum:01.01.1996
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Format / Umfang:6 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.35
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 621.35 -
Datenquelle:
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- 11
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Auger electron peaks of Cu in XPSJo, M. / Tanaka, A. et al. | 1996
- 15
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Intrinsic Auger signal profiles derived by Monte Carlo analysisDing, Z.-J. / Shimizu, R. / Goto, K. et al. | 1996
- 20
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The influence of elastic scattering on the concentration dependence of the photoelectron line intensityTilinin, I. S. / Jablonski, A. / Lesiak-Orlowska, B. et al. | 1996
- 25
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True Auger spectral shapes (standards)Takeichi, Y. / Goto, K. / Gaidarova, V. et al. | 1996
- 30
-
Comparison of AES chemical shifts with XPS chemical shiftsSekine, T. / Ikeo, N. / Nagasawa, Y. et al. | 1996
- 36
-
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- 41
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A general procedure for extracting quantitative depth information from take-off-angle-resolved XPS and AESGries, W. H. et al. | 1996
- 47
-
Calculations of 'effective' inelastic mean free paths in solidsTanuma, S. / Ichimura, S. / Yoshihara, K. et al. | 1996
- 51
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Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systemsSuzuki, M. / Mogi, K. / Takenaka, H. et al. | 1996
- 56
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XPS depth profiling by changing incident X-ray energyShimada, H. / Matsubayashi, N. / Imamura, M. / Sato, T. / Nishijima, A. et al. | 1996
- 60
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- 64
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Surface mechanical property testing by depth sensing indentationMeneve, J. L. / Smith, J. F. / Jennett, N. M. / Saunders, S. R. J. et al. | 1996
- 69
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Depth-dependent non-destructive analysis of thin overlayers using total-reflection-angle X-ray spectroscopyShibata, N. / Okubo, S. / Yonemitsu, K. et al. | 1996
- 73
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High sensitivity of positron-annihilation induced Auger-electron spectroscopy to surface impuritiesOhdaira, T. / Suzuki, R. / Mikado, T. / Ohgaki, H. / Chiwaki, M. / Yamazaki, T. / Hasegawa, M. et al. | 1996
- 77
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High depth resolution depth profiling of metal films using SIMS and sample rotationSykes, D. E. / Chew, A. / Hems, J. / Stribley, K. et al. | 1996
- 84
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- 89
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- 92
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Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ionsZalar, A. / Seibt, E. W. / Panjan, P. et al. | 1996
- 97
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- 102
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Thickness dependent electron stimulated desorption of thin epitaxial films of alkali halidesSzymonski, M. / Kolodziej, J. / Czuba, P. / Piatkowski, P. / Korecki, P. / Postawa, Z. / Itoh, N. et al. | 1996
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UPS studies of conducting polymers: dopant effect on conjugated polymer systems sensitive to conductivityTakemura, S. / Kitagawa, Y. / Kato, H. / Nakajima, Y. et al. | 1996
- 112
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Surface characterization of cell adhesion controlled polymer modified by ion bombardmentNakao, A. / Kaibara, M. / Iwaki, M. / Suzuki, Y. / Kusakabe, M. et al. | 1996
- 116
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Photoresist characteristics of polyurea films prepared by vapor deposition polymerization. Depolymerization of polyureaIijima, M. / Sato, M. / Takahashi, Y. et al. | 1996
- 124
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Molecular orientation of polyimide films determined by an optical retardation methodSakamoto, K. / Arafune, R. / Ushioda, S. / Suzuki, Y. / Morokawa, S. et al. | 1996
- 129
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- 134
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Ion induced alteration at Pb-Sn alloy surface investigated by Auger electron spectroscopy and X-ray photoelectron spectroscopyKudo, M. / Ishijima, A. / Morohashi, T. et al. | 1996
- 138
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Influence of ion-implantation on native oxidation of Si in a clean-room atmosphereYano, F. / Hiraoka, A. / Itoga, T. / Kojima, H. / Kanehori, K. / Mitsui, Y. et al. | 1996
- 143
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Surface structure analysis of dispersed metal sites on single crystal metal oxides by means of polarization-dependent total-reflection fluorescent EXAFSChun, W.-J. / Asakura, K. / Iwasawa, Y. et al. | 1996
- 147
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Luminescent properties of an anodically oxidized P-doped silicon waferIwaso, M. / Arakawa, T. et al. | 1996
- 152
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Submicron particle analysis by the Auger microprobe (FE-SAM)Ito, H. / Ito, M. / Magatani, Y. / Soeda, F. et al. | 1996
- 156
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Determination of Al~xGa~1~-~x As Auger sensitivity factorsChen, W. D. / Cui, Y. D. et al. | 1996
- 160
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- 193
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- 199
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Thermal positive ion production from thallium chloride molecules impinging upon a tungsten surface heated in high vacuaKawano, H. / Ohgami, K. / Serizawa, N. et al. | 1996
- 203
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- 207
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Quantitative relationship between the work function and transfer ratio of a potassium-adsorbed MIM cathodeKusunoki, T. / Suzuki, M. et al. | 1996
- 211
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- 216
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- 222
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- 226
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- 232
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Hydrogen desorption characteristics of composite Co-TiN nanoparticlesSakka, Y. / Ohno, S. et al. | 1996
- 238
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- 243
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- 248
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- 252
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- 256
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NO interaction with thermally activated CaO and SrO surfacesYanagisawa, Y. et al. | 1996
- 260
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- 268
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Characterization of freeze-dried powders prepared by alkoxide route for YBCO superconductorsTachiwaki, T. / Sugimoto, J. / Ito, T. / Hiraki, A. et al. | 1996
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- 283
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Simulation of geometrical aberration and beam shape of scanning X-ray probeIwai, H. / Oiwa, R. / Larson, P. E. / Kudo, M. et al. | 1996
- 287
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Development of high spatial resolution Auger microscope as applied to semiconductor analysisYamada, T. / Kudo, M. / Ando, Y. / Sekine, T. / Sakai, Y. et al. | 1996
- 292
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A new type of RHEED apparatus equipped with an energy filterHorio, Y. / Hashimoto, Y. / Ichimiya, A. et al. | 1996
- 297
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Apparatus for positron-annihilation-induced Auger electron spectroscopy with a pulsed positron beamSuzuki, R. / Ohdaira, T. / Mikado, T. / Ohgaki, H. / Chiwaki, M. / Yamazaki, T. et al. | 1996
- 301
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Time-resolved detection of laser-ablated particles based on intensity decrease of cw probe laser beamHattori, M. / Sekine, S. / Ooie, T. / Nonaka, H. et al. | 1996
- 305
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- 311
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- 333
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Dissociative scattering of low-energy SiF^+~3 and SiF^+ ions (5-200 eV) on Cu(100) surfaceYamamoto, H. / Baba, Y. / Sasaki, T. A. et al. | 1996
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Monte Carlo simulation of ion-induced kinetic electron emission from a metal surfaceKawata, J. / Ohya, K. et al. | 1996
- 342
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Fundamental study on powder-scattering in positive- and negative-ion implantation into powder materialsTsuji, H. / Ishikawa, J. / Itoh, H. / Toyota, Y. / Gotoh, Y. et al. | 1996
- 347
-
Investigation of the physical and chemical interaction of a low energy oxygen ion beam with oxide superconducting filmsPindoria, G. / Badaye, M. / Wang, F. / Kawaguchi, K. / Morishita, T. et al. | 1996
- 351
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Angular distribution of particles sputtered from GaAs by Ar^+ and Xe^+ ion bombardmentAoyama, T. / Tanemura, M. / Okuyama, F. et al. | 1996
- 355
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Soft X-ray emissions by highly charged ions on solid surfaces: Mo and Ta surfacesEmoto, T. / Komatsu, K. / Ichimiya, A. / Ninomiya, S. / Sekiguchi, M. et al. | 1996
- 360
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Charging phenomenon of insulators in negative-ion implantationToyota, Y. / Tsuji, H. / Nagumo, S. / Gotoh, Y. / Ishikawa, J. et al. | 1996
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