A 360-tilt specimen holder for electron tomography in an ultrahigh-voltage electron microscope (Englisch)
- Neue Suche nach: Zhang, H.
- Neue Suche nach: Takaoka, A.
- Neue Suche nach: Miyauchi, K.
- Neue Suche nach: Zhang, H.
- Neue Suche nach: Takaoka, A.
- Neue Suche nach: Miyauchi, K.
In:
REVIEW OF SCIENTIFIC INSTRUMENTS
;
69
, 11
;
4008-4009
;
1998
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:A 360-tilt specimen holder for electron tomography in an ultrahigh-voltage electron microscope
-
Beteiligte:
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Erschienen in:REVIEW OF SCIENTIFIC INSTRUMENTS ; 69, 11 ; 4008-4009
-
Verlag:
- Neue Suche nach: AMERICAN INSTITUTE OF PHYSICS
-
Erscheinungsdatum:01.01.1998
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Format / Umfang:2 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
-
Sprache:Englisch
- Neue Suche nach: 530 / 500
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
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Datenquelle:
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