Discriminant analysis and secondary-beam charge recognition (Englisch)
- Neue Suche nach: Lukasik, J.
- Neue Suche nach: Adrich, P.
- Neue Suche nach: Aumann, T.
- Neue Suche nach: Bacri, C. O.
- Neue Suche nach: Barczyk, T.
- Neue Suche nach: Bassini, R.
- Neue Suche nach: Bianchin, S.
- Neue Suche nach: Boiano, C.
- Neue Suche nach: Botvina, A. S.
- Neue Suche nach: Boudard, A.
- Neue Suche nach: Lukasik, J.
- Neue Suche nach: Adrich, P.
- Neue Suche nach: Aumann, T.
- Neue Suche nach: Bacri, C. O.
- Neue Suche nach: Barczyk, T.
- Neue Suche nach: Bassini, R.
- Neue Suche nach: Bianchin, S.
- Neue Suche nach: Boiano, C.
- Neue Suche nach: Botvina, A. S.
- Neue Suche nach: Boudard, A.
In:
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A
;
587
, 2-3
;
413-419
;
2008
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Discriminant analysis and secondary-beam charge recognition
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Beteiligte:Lukasik, J. ( Autor:in ) / Adrich, P. ( Autor:in ) / Aumann, T. ( Autor:in ) / Bacri, C. O. ( Autor:in ) / Barczyk, T. ( Autor:in ) / Bassini, R. ( Autor:in ) / Bianchin, S. ( Autor:in ) / Boiano, C. ( Autor:in ) / Botvina, A. S. ( Autor:in ) / Boudard, A. ( Autor:in )
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Erschienen in:NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A ; 587, 2-3 ; 413-419
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2008
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Format / Umfang:7 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 539.7
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 539.7 -
Datenquelle:
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