Achieving Traceability of Industrial Computed Tomography (Englisch)
- Neue Suche nach: Bartscher, M.
- Neue Suche nach: Neukamm, M.
- Neue Suche nach: Hilpert, U.
- Neue Suche nach: Neuschaefer-Rube, U.
- Neue Suche nach: Hartig, F.
- Neue Suche nach: Kniel, K.
- Neue Suche nach: Ehrig, K.
- Neue Suche nach: Staude, A.
- Neue Suche nach: Goebbels, J.
- Neue Suche nach: Bartscher, M.
- Neue Suche nach: Neukamm, M.
- Neue Suche nach: Hilpert, U.
- Neue Suche nach: Neuschaefer-Rube, U.
- Neue Suche nach: Hartig, F.
- Neue Suche nach: Kniel, K.
- Neue Suche nach: Ehrig, K.
- Neue Suche nach: Staude, A.
- Neue Suche nach: Goebbels, J.
- Neue Suche nach: Chugui, Y.
- Neue Suche nach: Gao, Y.
- Neue Suche nach: Fan, K.-C.
- Neue Suche nach: Taymanov, R.
- Neue Suche nach: Sapozhnikova, K.
In:
Measurement Technology and Intelligent Instruments IX
;
79-83
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Achieving Traceability of Industrial Computed Tomography
-
Beteiligte:Bartscher, M. ( Autor:in ) / Neukamm, M. ( Autor:in ) / Hilpert, U. ( Autor:in ) / Neuschaefer-Rube, U. ( Autor:in ) / Hartig, F. ( Autor:in ) / Kniel, K. ( Autor:in ) / Ehrig, K. ( Autor:in ) / Staude, A. ( Autor:in ) / Goebbels, J. ( Autor:in ) / Chugui, Y.
-
Erschienen in:KEY ENGINEERING MATERIALS ; 437 ; 79-83
-
Verlag:
- Neue Suche nach: TRANS TECH PUBLICATIONS
-
Erscheinungsdatum:01.01.2010
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Format / Umfang:5 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 620.11
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 620.11 -
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
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