XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals (Englisch)
- Neue Suche nach: Terekhov, V. A.
- Neue Suche nach: Turishchev, S. Y.
- Neue Suche nach: Pankov, K. N.
- Neue Suche nach: Zanin, I. E.
- Neue Suche nach: Domashevskaya, E. P.
- Neue Suche nach: Tetelbaum, D. I.
- Neue Suche nach: Mikhailov, A. N.
- Neue Suche nach: Belov, A. I.
- Neue Suche nach: Nikolichev, D. E.
- Neue Suche nach: Zubkov, S. Y.
- Neue Suche nach: Terekhov, V. A.
- Neue Suche nach: Turishchev, S. Y.
- Neue Suche nach: Pankov, K. N.
- Neue Suche nach: Zanin, I. E.
- Neue Suche nach: Domashevskaya, E. P.
- Neue Suche nach: Tetelbaum, D. I.
- Neue Suche nach: Mikhailov, A. N.
- Neue Suche nach: Belov, A. I.
- Neue Suche nach: Nikolichev, D. E.
- Neue Suche nach: Zubkov, S. Y.
In:
SURFACE AND INTERFACE ANALYSIS
;
42
, 6-7
;
891-896
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals
-
Beteiligte:Terekhov, V. A. ( Autor:in ) / Turishchev, S. Y. ( Autor:in ) / Pankov, K. N. ( Autor:in ) / Zanin, I. E. ( Autor:in ) / Domashevskaya, E. P. ( Autor:in ) / Tetelbaum, D. I. ( Autor:in ) / Mikhailov, A. N. ( Autor:in ) / Belov, A. I. ( Autor:in ) / Nikolichev, D. E. ( Autor:in ) / Zubkov, S. Y. ( Autor:in )
-
Erschienen in:SURFACE AND INTERFACE ANALYSIS ; 42, 6-7 ; 891-896
-
Verlag:
- Neue Suche nach: John Wiley & Sons, Ltd
-
Erscheinungsdatum:01.01.2010
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Format / Umfang:6 pages
-
ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 660.293
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 660.293 -
Datenquelle:
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XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystalsTerekhov, V. A. / Turishchev, S. Yu. / Pankov, K. N. / Zanin, I. E. / Domashevskaya, E. P. / Tetelbaum, D. I. / Mikhailov, A. N. / Belov, A. I. / Nikolichev, D. E. / Zubkov, S. Yu. et al. | 2010
- 897
-
Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE‐AESVandendael, I. / Hauffman, T. / Van Ingelgem, Y. / Hubin, A. / Terryn, H. et al. | 2010
- 902
-
Comparison of electrical properties of HgCdTe subsurface layers formed by low energy ion beam milling or anodic oxidationBerchenko, N. / Izhnin, I. / Yudenkov, V. / Pociask, M. / Yakovyna, V. et al. | 2010
- 906
-
Electronic and optical properties of GIZO thin film grown on SiO2/Si substratesTahir, Dahlang / Lee, Eun Kyoung / Kwon, Hyuk Lan / Kun Oh, Suhk / Kang, Hee Jae / Heo, Sung / Lee, Eun Ha / Chung, Jae Gwan / Lee, Jae Cheol / Tougaard, Sven et al. | 2010
- 911
-
Predicting the wettability of patterned ITO surface using ToF‐SIMS imagesYang, L. / Shard, A. G. / Lee, J. L. S. / Ray, S. et al. | 2010
- 916
-
XPS investigations of valence changes during cycling of LiCrMnO4‐based cathodes in Li‐ion batteriesOswald, S. / Nikolowski, K. / Ehrenberg, H. et al. | 2010
- 922
-
Auger electron spectroscopy and X‐ray photoelectron spectroscopy study of the electron‐stimulated surface chemical reaction mechanism for phosphor degradationSwart, H. C. / Terblans, J. J. / Coetsee, E. / Kumar, Vinay / Ntwaeaborwa, O. M. / Dhlamini, M. S. / Dolo, J. J. et al. | 2010
- 927
-
Influence of electron‐beam treatment of TiO2/Ti on properties of deposited Pt filmsKim, Kwang‐Dae / Tai, Wei Sheng / Kim, Young Dok / Lee, Byung Cheol / Yang, Ki Ho / Park, Ji Hyun et al. | 2010
- 931
-
Photoemission and thermo‐programmed reaction study of the catalytic properties of Rh/CeO2 systemNehasil, Václav / Ševčíková, Klára / Zahoranová, Tatiana et al. | 2010
- 935
-
Superconducting properties of YBaCuO ceramic doped with Ca and ZnMahtali, M. / Boudjema, E. H. / Labbani, R. / Chamekh, S. / Bouabellou, A. / Taoufik, A. / Simon, C. et al. | 2010
- 941
-
The features of copper oxidation by the data of photocurrent and photopotential studiesVvedenskii, A. / Grushevskaya, S. / Ganzha, S. / Maksimova, S. et al. | 2010
- 947
-
Combining degradation and contact angle data in assessing the photocatalytic TiO2:N surfaceManole, Alina / Dǎscǎleanu, V. / Dobromir, M. / Luca, D. et al. | 2010
- 955
-
Influence of active layer thickness and annealing in zinc oxide TFT grown by atomic layer depositionAhn, Cheol Hyoun / Woo, Chang Ho / Hwang, SooYeon / Lee, Jeong Yong / Cho, Hyung Koun / Cho, Hyoung Jin / Yeom, Geun Young et al. | 2010
- 959
-
Determining the surface acidic properties of solid catalysts by amine titration using Hammett indicators and FTIR‐pyridine adsorption methodsTopaloǧlu Yazıcı, D. / Bilgiç, C. et al. | 2010
- 963
-
A comparative study on ridge waveguide laser diodes with SiO2 and SiNx passivation layersBengi, A. / Jang, S. J. / Yeo, C. I. / Mammadov, T. / Özçelik, S. / Lee, Y. T. et al. | 2010
- 966
-
Specifics of Hg‐based narrow gap semiconductor oxidationBerchenko, N. N. / Kurbanov, K. / Fadeev, S. V. et al. | 2010
- 970
-
Structure and properties of nitrogen‐doped titanium dioxide thin films produced by reactive magnetron sputteringAbadias, G. / Paumier, F. / Eyidi, D. / Guérin, P. / Girardeau, T. et al. | 2010
- 974
-
Investigating the surface properties of polymer‐coated clay by IGCTopaloǧlu Yazıcı, Demet et al. | 2010
- 978
-
Growth of ZnO nanorod arrays by hydrothermal method using homo‐seed layers annealed at various temperaturesBae, Young Sook / Kim, Dong Chan / Ahn, Cheol Hyoun / Kim, Jae Hyun / Cho, Hyung Koun et al. | 2010
- 983
-
Synthesis, physicochemical characterization, and preliminary molecular modeling studies of SnO2 nanoparticlesIonita, Mariana / Branzoi, Ioan Viorel / Popa, Laurentiu et al. | 2010
- 987
-
Multiscale Molecular Modeling and Experimental Validation of Polyaniline‐CNTs Composite Coatings for Corrosion ProtectingIoniţǎ, M. / Brânzoi, I. V. / Pilan, L. et al. | 2010
- 991
-
Nanostructures produced by SPM voltage ramping in metal oxide filmsBukauskas, V. / Mironas, A. / Šetkus, A. / Strazdienė, V. et al. | 2010
- 996
-
The effect of Ca co-substitution in (Y1-xCax)Ba2 (Cu0.98Co0.02)3O7-d (0 <= x <= 0.35) ceramicBoudjema, E. H. / Mahtali, M. / Chamekh, S. / Taoufik, A. et al. | 2010
- 996
-
The effect of Ca co‐substitution in (Y1−xCax)Ba2 (Cu0.98Co0.02)3O7−δ (0 ≤ x ≤ 0.35) ceramicBoudjema, E. H. / Mahtali, M. / Chamekh, S. / Taoufik, A. et al. | 2010
- 1000
-
Characterizing the surface acidity of bentonite by various methodsBilgiç, C. / Topaloglu Yazıcı, D. / Vural, N. et al. | 2010
- 1005
-
SKP as a tool to study the physicochemical interaction at buried metal–coating interfacesWielant, Jan / Posner, Ralf / Hausbrand, René / Grundmeier, Guido / Terryn, Herman et al. | 2010
- 1010
-
Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniquesAudinot, J.‐N. / Lévêque, P. / Bechara, R. / Leclerc, N. / Guillot, J. / Migeon, H.‐N. / Hadziioannou, G. / Heiser, T. et al. | 2010
- 1014
-
How to increase the hydrophobicity of PTFE surfaces using an r.f. atmospheric‐pressure plasma torchCarbone, E.A.D. / Boucher, N. / Sferrazza, M. / Reniers, F. et al. | 2010
- 1019
-
Preparation of exfoliated clay/polymer nanocomposites via organosilane grafting and in situ ATRP of glycidyl methacrylateDjouani, Fatma / Herbst, Frederic / Chehimi, Mohamed M. / Benzarti, Karim et al. | 2010
- 1025
-
Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Binx+ cluster ion bombardmentHolzweber, Markus / Hutter, Herbert et al. | 2010
- 1030
-
Mechanisms of metal‐assisted secondary ion mass spectrometry: a mixed theoretical and experimental studyRestrepo, O. / Prabhakaran, A. / Hamraoui, K. / Wehbe, N. / Yunus, S. / Bertrand, P. / Delcorte, A. et al. | 2010
- 1035
-
Protein‐functionalized ultrathin glycidyl methacrylate polymer grafts on gold for the development of optical biosensors : an SPR investigationBernand‐Mantel, D. / Chehimi, M. M. / Millot, M. C. / Carbonnier, B. et al. | 2010
- 1041
-
Electrochemical grafting of poly(3‐hexylthiophene) on porous silicon for gas sensingBelhousse, S. / Boukherroub, R. / Szunerits, S. / Gabouze, N. / Keffous, A. / Sam, S. / Benaboura, A. et al. | 2010
- 1046
-
Dispersibility of silane‐functionalized alumina nanoparticles in syndiotactic polypropyleneTruong, Le Thuy / Larsen, Åge / Holme, Børge / Diplas, Spyros / Hansen, Finn Knut / Roots, Jaan / Jørgensen, Sissel et al. | 2010
- 1050
-
Aryl diazonium salt surface chemistry and ATRP for the preparation of molecularly imprinted polymer grafts on gold substratesGam‐Derouich, Sarra / Ngoc Nguyen, Minh / Madani, Ahmed / Maouche, Naima / Lang, Philippe / Perruchot, Christian / Chehimi, Mohamed M. et al. | 2010
- 1057
-
A comparative X‐ray photoelectron spectroscopy and medium‐energy ion‐scattering study of ultra‐thin, Hf‐based high‐k filmsSygellou, L. / Ladas, S. / Reading, M. A. / van den Berg, J. A. / Conard, T. / De Gendt, S. et al. | 2010
- 1061
-
An application for near‐real‐time analysis of XPS dataLea, A. S. / Swanson, K. R. / Haack, J. N. / Castle, J. E. / Tougaard, S. / Baer, D. R. et al. | 2010
- 1066
-
Effective medium theory for REELS analysis of amorphous carbon filmsCalliari, L. / Fanchenko, S. / Filippi, M. et al. | 2010
- 1072
-
Simulation of parallel angle‐resolved X‐ray photoelectron spectroscopy dataTasneem, G. / Werner, W. S. M. / Smekal, W. / Powell, C. J. et al. | 2010
- 1076
-
Energy loss function for Si determined from reflection electron energy loss spectra with factor analysis methodJin, Hua / Yoshikawa, Hideki / Tanuma, Shigeo / Tougaard, Sven et al. | 2010
- 1082
-
Surface investigation of carbon films: from diamond to graphiteMezzi, A. / Kaciulis, S. et al. | 2010
- 1085
-
Femto- and attosecond electron dynamics in 5prime-Guanosine monophosphate interface as probed by resonant Auger spectroscopyIkeura-Sekiguchi, H. / Sekiguchi, T. et al. | 2010
- 1085
-
Femto‐ and attosecond electron dynamics in 5′‐Guanosine monophosphate interface as probed by resonant Auger spectroscopyIkeura‐Sekiguchi, Hiromi / Sekiguchi, Tetsuhiro et al. | 2010
- 1089
-
Dead‐layer effect in silicon detectors: yield spectra of reflected electronsChaoui, Zine‐El‐Abidine / Azli, Tarek et al. | 2010
- 1093
-
Dead layer effect in silicon detectors: energy depositedChaoui, Zine‐El‐Abidine / Renschler, Pascal et al. | 2010
- 1096
-
A Monte Carlo simulation study on the image resolution in scanning electron microscopyMao, S. F. / Ding, Z. J. et al. | 2010
- 1100
-
Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eVPauly, N. / Tougaard, S. et al. | 2010
- 1105
-
Auger electron from silicon: comparison of full Monte Carlo simulations with experimentChaoui, Zine‐El‐Abidine / Goto, Keisuké et al. | 2010
- 1109
-
Near‐field optical microscopy simulations using graphics processing unitsKlapetek, Petr / Valtr, Miroslav et al. | 2010
- 1114
-
Simulation of phosphorus, arsenic or antimony ion implantation in silicon targetsLabbani, R. et al. | 2010
- 1118
-
An ATR–FTIR study of carbonate sorption onto magnetiteRoonasi, P. / Holmgren, A. et al. | 2010
- 1122
-
Influence of the contact angle on two‐phase flow in microreactors for nitrobenzene–hydrogen–stainless steel/carbonÖzkan, Furkan / Hecht, Kristin / Pfeifer, Peter / Schubert, Klaus / Kraushaar‐Czarnetzki, Bettina et al. | 2010
- 1128
-
Effects of pH variation in aqueous solutions on dissolution of copper oxideKo, Cheon Kwang / Lee, Won Gyu et al. | 2010
- 1131
-
Characterization of core/shell nanoparticle thin films for gas analytical applicationsFuchs, M. / Breitenstein, D. / Fartmann, M. / Grehl, T. / Kayser, S. / Koester, R. / Ochs, R. / Schlabach, S. / Szabó, D. V. / Bruns, M. et al. | 2010
- 1135
-
Storing Matter: a new analytical technique developed to improve the sensitivity and the quantification during SIMS analysesMansilla, C. / Wirtz, T. et al. | 2010
- 1140
-
X‐ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputteringJensen, I. J. T. / Diplas, S. / Løvvik, O. M. / Watts, J. / Hinder, S. / Schreuders, H. / Dam, B. et al. | 2010
- 1144
-
Characterization of a very thin overoxidized polypyrrole membrane: application to H2O2 determinationDebiemme‐Chouvy, Catherine / Gallois, Maud et al. | 2010
- 1148
-
Surface characterisation of boron nitride layers on multiwalled carbon nanotubesMohai, M. / Mohai, I. / Sebestyén, Z. / Gergely, A. / Németh, P. / Szépvölgyi, J. et al. | 2010
- 1152
-
Investigation of the UV/O3 treatment of ultrananocrystalline diamond filmsKulisch, W. / Popov, C. / Gilliland, D. / Ceccone, G. / Rossi, F. / Reithmaier, J. P. et al. | 2010
- 1156
-
SEM analysis of the microstructure of the layers in triple‐coated isotropic (TRISO) particlesvan der Berg, N. G. / Malherbe, Johan B. / Botha, A. J. / Friedland, E. et al. | 2010
- 1160
-
Study on surface morphology of nanoscale structure of pure and zinc‐doped tin oxide uniform thin filmsRozati, S. M. / Shadmani, E. et al. | 2010
- 1163
-
Low‐temperature sintered conductive silver patterns obtained by inkjet printing for plastic electronicsScandurra, Antonino / Francesco Indelli, Giuseppe / Graziana Spartà, Noemi / Galliano, Francesco / Ravesi, Sebastiano / Pignataro, Salvatore et al. | 2010
- 1168
-
Reduction of thin oxide films on tungsten substrate with highly reactive cold hydrogen plasmaVesel, Alenka / Drenik, Aleksander / Zaplotnik, Rok / Mozetic, Miran / Balat‐Pichelin, Marianne et al. | 2010
- 1172
-
Surface and interface study of cermet coatings on aluminized steel by XPSRomero, R. / Martin, F. / Ramos‐Barrado, J. R. / Leinen, D. et al. | 2010
- 1176
-
Study of the deposition of Ti/TiN multilayers by magnetron sputteringSaoula, N. / Djerourou, S. / Yahiaoui, K. / Henda, K. / Kesri, R. / Erasmus, R. M. / Comins, J. D. et al. | 2010
- 1180
-
Monte Carlo simulation and AES characterization of phase formation in Pt‐Al thin filmsHarris, R. A. / van der Lingen, E. / Paul, D. F. / Swart, H. C. / Terblans, J. J. et al. | 2010
- 1184
-
Amine species on self‐assembled monolayers of ω‐aminothiolates on gold as identified by XPS and NEXAFS spectroscopyDietrich, Paul M. / Graf, Nora / Gross, Thomas / Lippitz, Andreas / Krakert, Simone / Schüpbach, Björn / Terfort, Andreas / Unger, Wolfgang E. S. et al. | 2010
- 1188
-
Surface analytical characterization of carbohydrate microarraysDietrich, Paul M. / Horlacher, Tim / Gross, Thomas / Wirth, Thomas / Castelli, Riccardo / Shard, Alexander G. / Alexander, Morgan / Seeberger, Peter H. / Unger, Wolfgang E. S. et al. | 2010
- 1193
-
Metallic photocathodes prepared by pulsed laser ablation deposition for application to bright electron sourcesLiu, B. Y. / Perrone, A. et al. | 2010
- 1197
-
Composition of plasma‐sprayed tungsten coatings on CuCrZr alloyKaciulis, S. / Mezzi, A. / Montanari, R. / Ucciardello, N. / Volterri, R. et al. | 2010
- 1201
-
Structural transformation of silane‐based zirconium‐modified sol–gel coatingsCollazo, A. / Covelo, A. / Pérez, C. et al. | 2010
- 1205
-
Photoelectrochemical and photocatalytic properties of mesoporous TiO2 films modified with silver and gold nanoparticlesSmirnova, N. / Vorobets, V. / Linnik, O. / Manuilov, E. / Kolbasov, G. / Eremenko, A. et al. | 2010
- 1209
-
Formation of multi‐layered inorganic film on polycarbonate surface modified by an atmospheric plasma dischargeWon, Dong Su / Kim, Tea Kyung / Lee, Won Gyu et al. | 2010
- 1213
-
Determining the diffusion coefficient of Ni in Cu from a Ni/Cu thin film using linear heating, scanning Auger microscopy and a numerical solution of Fick's second lawJoubert, H. D. / Terblans, J. J. / Swart, H. C. et al. | 2010
- 1217
-
Surface analyses of barium hexaferrite particles for magnetic suspensionsOvtar, Simona / Lisjak, Darja / Drofenik, Miha et al. | 2010
- 1222
-
Corrosion resistance of ZnNiP+Ni composite coatingsKubisztal, J. / Niedbała, J. / Budniok, A. et al. | 2010
- 1226
-
Electrodeposition and the properties of composite Zn + Ni coatingsPanek, Joanna / Bierska‐Piech, Bożena / Ła̧giewka, Eugeniusz / Budniok, Antoni et al. | 2010
- 1231
-
Formation and analysis of SiC coating layer on carbon short fiberLee, C‐W. / Kim, Il‐Ho / Lee, Wonsik / Ko, Se‐Hyun / Jang, Jin‐Man / Lee, T‐W. / Lim, S‐H. / Park, J. P. / Kim, J. D. et al. | 2010
- 1235
-
Optical behaviors of thin indium‐containing chalcogenide filmsPetkov, P. / Stoilova, A. / Nedeva, Y. / Petkov, E. et al. | 2010
- 1239
-
Preparation and structural properties of PbSe nanomaterialTerra, F. S. / Mahmoud, G. M. / Nasr, Mahmoud / Okr, M. M. El et al. | 2010
- 1244
-
Kinetics of rhodium electrodeposition for semiconductor interconnect applicationsSon, Seong‐Ho / Lee, Hong‐Kee / Park, Sung‐Cheol et al. | 2010
- 1247
-
Influence of thermal annealing on the structure and optical properties of d.c. magnetron sputtered titanium dioxide thin filmsKars, İ. / Çetin, S. Ş. / Kınacı, B. / Sarıkavak, B. / Bengi, A. / Altuntaş, H. / Öztürk, M. K. / Özçelik, S. et al. | 2010
- 1252
-
Effect of different P/As ratio on the optical and structural properties of GaAs1−xPx/GaAsCetin, Saime S. / Kinaci, Baris / Asar, Tarık / Kars, Ilknur / Ozturk, Mustafa K. / Mammadov, Tofig S. / Ozcelik, Suleyman et al. | 2010
- 1257
-
Interface state density analyzing of Au/TiO2(rutile)/n–Si Schottky barrier diodeAltuntas, H. / Bengi, A. / Asar, T. / Aydemir, U. / Sarıkavak, B. / Ozen, Y. / Altındal, Ş / Ozcelik, S. et al. | 2010
- 1261
-
Shapes and morphologies of inkjet‐printed nanosilver dots on glass substratesLee, Dong Jun / Oh, Je Hoon et al. | 2010
- 1266
-
Electrochemical fabrication and capacitance of composite films of carbon nanotubes and polyanilineBranzoi, Viorel / Branzoi, Florina / Pilan, Luisa et al. | 2010
- 1271
-
Ni and Ni alloy coatings electrodeposited from choline chloride‐based ionic liquids—electrochemical synthesis and characterizationFlorea, A. / Anicai, L. / Costovici, S. / Golgovici, F. / Visan, T. et al. | 2010
- 1276
-
Effect of zirconium incorporation on the stabilization of TiO2 mesoporous structureGnatyuk, Yu. / Smirnova, N. / Korduban, O. / Eremenko, A. et al. | 2010
- 1281
-
Extracting interdiffusion parameters from Ni/Cu thin films by means of profile reconstruction with the MRI modelJoubert, H. D. / Terblans, J. J. / Swart, H. C. et al. | 2010
- 1284
-
Angular distribution of liquid droplets during the laser ablation of silicon targetBelaroussi, Y. / Kerdja, T. / Malek, S. et al. | 2010
- 1289
-
Growth studies of Ti‐based films deposited on Si and SiO2 using angle‐resolved XPSOswald, S. et al. | 2010
- 1295
-
Fabrication and characterization of silicon pillars formed by nanosecond pulsed excimer laser in vacuumDjemaa, A. / Gabouze, N. / Yaddadene, C. / Belaroussi, Y. / Kerdja, T. / Kechouane, M. / Menari, H. / Khereddine, A. Y. et al. | 2010
- 1299
-
Phase explosion in tungsten target under interaction with Nd:YAG laser tripled in frequencyYahiaoui, K. / Kerdja, T. / Malek, S. et al. | 2010
- 1303
-
Optical properties of silver thin films, derived from REELSZhang, Z. M. / Chen, T. / Ding, Z. J. / Tang, T. / Csik, A. / Tóth, J. / Tökési, K. et al. | 2010
- 1307
-
A tool for the spectroscopic investigation of hydrogen–silicon interactionRomano, E. / Cerofolini, G. F. / Narducci, D. / Corni, F. / Frabboni, S. / Ottaviani, G. / Tonini, R. et al. | 2010
- 1311
-
Comparison of surface activation processes for protein immobilization on plasma‐polymerized acrylic acid filmsStrola, S. / Ceccone, G. / Gilliand, D. / Valsesia, A. / Lisboa, P. / Rossi, F. et al. | 2010
- 1316
-
Surface modification of polymer films with a remote atmospheric pressure d.c. glow discharge: influence of substrate locationJacobs, T. / Carbone, E. / Morent, R. / De Geyter, N. / Reniers, F. / Leys, C. et al. | 2010
- 1321
-
Comparing the IR spectra of H‐terminated inner and outer silicon surfacesRomano, E. / Cerofolini, G. F. / Narducci, D. / Galati, C. / Renna, L. et al. | 2010
- 1326
-
First-principle studies of dissociative adsorption of H2O on NiAl(110)-(2 x 2) surfaceEvecen, M. / Cakmak, M. et al. | 2010
- 1326
-
First‐principle studies of dissociative adsorption of H2O on NiAl(110)‐(2 × 2) surfaceEvecen, M. / Çakmak, M. et al. | 2010
- 1330
-
Role of the surface in Li insertion into nanowires of TiO2‐BKoudriachova, M. V. et al. | 2010
- 1333
-
Photoelectric threshold of silicon wafer surfaces implanted with H, Si and Ar ionsMomose, Y. / Kosaka, S. / Sakurai, T. / Yanagisawa, M. / Nakayama, K. et al. | 2010
- 1338
-
Preparation and characterization of activated carbons from poplar wood (Populus L.)Demiral, Hakan / Uzun, Işıl et al. | 2010
- 1342
-
Chemical and electrochemical grafting of polyaniline on aniline‐terminated porous siliconChiboub, Nawel / Boukherroub, Rabah / Szunerits, Sabine / Gabouze, Noureddine / Moulay, Saad / Sam, Sabrina et al. | 2010
- 1347
-
Surface characterization of activated carbons obtained from olive bagasse by chemical activationDemiral, İlknur / Demiral, Hakan et al. | 2010
- 1351
-
Preparation of HDTMA‐bentonite: Characterization studies and its adsorption behavior toward dibenzofuranErdem, Bilge / Özcan, A. Safa / Özcan, Adnan et al. | 2010
- 1357
-
Surface analysis of cylinder liners from tribological model experiments and internal combustion enginesTomastik, C. / Jech, M. / Wopelka, T. / Franek, F. et al. | 2010
- 1361
-
Investigation of anomalous physical properties of multilayer nanolaminate (TiAl)N/Cu coatings by electron spectroscopy techniquesKovalev, Anatoly / Wainstein, Dmitry / Rashkovskiy, Alexandr et al. | 2010
- 1364
-
Titanium nitride with silicon additions for tribological applicationsZimowski, S. / Rakowski, W. / Grzonka, J. et al. | 2010
- 1368
-
Investigation of electronic and atomic structure of tribofilms on the surface of cutting tools with TiAlCrSiYN and multilayer TiAlCrSiYN/TiAlCrN coatings during machining of hardened steelsKovalev, A. / Wainstein, D. / Rashkovskiy, A. / Fox‐Rabinovich, G. / Veldhuis, S. / Agguire, M. / Yamamoto, K. et al. | 2010
- 1373
-
Observation of self‐assembled monolayers on diamond‐like carbon films: agglomeration of self‐assembled FDTS moleculesChoi, Junho / Sakurai, Kenichi / Kato, Takahisa et al. | 2010
- 1377
-
Erratum: SEM analysis of the microstructure of the layers in triple‐coated isotropic (TRISO) particlesvan der Berg, N. G. / Malherbe, Johan B. / Botha, A. J. / Friedland, E. et al. | 2010