PXRF, μ-XRF, Vacuum μ-XRF, and EPMA Analysis of Email Champleve Objects Present in Belgian Museums (Englisch)
- Neue Suche nach: Van der Linden, V.
- Neue Suche nach: Meesdom, E.
- Neue Suche nach: Devos, A.
- Neue Suche nach: Van Dooren, R.
- Neue Suche nach: Nieuwdorp, H.
- Neue Suche nach: Janssen, E.
- Neue Suche nach: Balace, S.
- Neue Suche nach: Vekemans, B.
- Neue Suche nach: Vincze, L.
- Neue Suche nach: Janssens, K.
- Neue Suche nach: Van der Linden, V.
- Neue Suche nach: Meesdom, E.
- Neue Suche nach: Devos, A.
- Neue Suche nach: Van Dooren, R.
- Neue Suche nach: Nieuwdorp, H.
- Neue Suche nach: Janssen, E.
- Neue Suche nach: Balace, S.
- Neue Suche nach: Vekemans, B.
- Neue Suche nach: Vincze, L.
- Neue Suche nach: Janssens, K.
In:
MICROSCOPY AND MICROANALYSIS -NEW YORK-
;
17
, 5
;
674-685
;
2011
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:PXRF, μ-XRF, Vacuum μ-XRF, and EPMA Analysis of Email Champleve Objects Present in Belgian Museums
-
Beteiligte:Van der Linden, V. ( Autor:in ) / Meesdom, E. ( Autor:in ) / Devos, A. ( Autor:in ) / Van Dooren, R. ( Autor:in ) / Nieuwdorp, H. ( Autor:in ) / Janssen, E. ( Autor:in ) / Balace, S. ( Autor:in ) / Vekemans, B. ( Autor:in ) / Vincze, L. ( Autor:in ) / Janssens, K. ( Autor:in )
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Erschienen in:MICROSCOPY AND MICROANALYSIS -NEW YORK- ; 17, 5 ; 674-685
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Verlag:
- Neue Suche nach: Cambridge University Press
-
Erscheinungsdatum:01.01.2011
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Format / Umfang:12 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
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Sprache:Englisch
- Neue Suche nach: 502.82
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 502.82 -
Datenquelle:
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Inhaltsverzeichnis – Band 17, Ausgabe 5
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