Sensitivity Analysis of Formula Not Shown -Parameter Measurements Due to Calibration Standards Uncertainty (Englisch)
- Neue Suche nach: Lenk, F.
- Neue Suche nach: Doerner, R.
- Neue Suche nach: Rumiantsev, A.
- Neue Suche nach: Lenk, F.
- Neue Suche nach: Doerner, R.
- Neue Suche nach: Rumiantsev, A.
In:
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
;
61
, 10
;
3800-3807
;
2013
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Sensitivity Analysis of Formula Not Shown -Parameter Measurements Due to Calibration Standards Uncertainty
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Beteiligte:
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Erschienen in:IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES ; 61, 10 ; 3800-3807
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Verlag:
- Neue Suche nach: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Erscheinungsdatum:01.01.2013
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Format / Umfang:8 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.3813 / 621 / 621.3
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
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Datenquelle:
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