Contributing to TAI with a secondary representation of the SI second (Englisch)
- Neue Suche nach: Guena, J.
- Neue Suche nach: Abgrall, M.
- Neue Suche nach: Clairon, A.
- Neue Suche nach: Bize, S.
- Neue Suche nach: Guena, J.
- Neue Suche nach: Abgrall, M.
- Neue Suche nach: Clairon, A.
- Neue Suche nach: Bize, S.
In:
METROLOGIA -BERLIN-
;
51
, 1
;
108
;
2014
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Contributing to TAI with a secondary representation of the SI second
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Beteiligte:Guena, J. ( Autor:in ) / Abgrall, M. ( Autor:in ) / Clairon, A. ( Autor:in ) / Bize, S. ( Autor:in )
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Erschienen in:METROLOGIA -BERLIN- ; 51, 1 ; 108
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Verlag:
- Neue Suche nach: IOP Publishing Ltd
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Erscheinungsdatum:01.01.2014
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Format / Umfang:108 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 530.8
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 530.8 -
Datenquelle:
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