Surface potential measurements of 2x1 reconstructed Si(001) using UHV Kelvin probe force microscopy (Englisch)
- Neue Suche nach: Lee, S.
- Neue Suche nach: Lee, S.
In:
SURFACE SCIENCE -AMSTERDAM-
;
641
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16-22
;
2015
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Surface potential measurements of 2x1 reconstructed Si(001) using UHV Kelvin probe force microscopy
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Beteiligte:Lee, S. ( Autor:in )
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Erschienen in:SURFACE SCIENCE -AMSTERDAM- ; 641 ; 16-22
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2015
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Format / Umfang:7 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 541.33
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 541.33 -
Datenquelle:
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