30 years of CPO-conferences (Unbekannt)
- Neue Suche nach: Wollnik, H.
- Neue Suche nach: Wollnik, H.
In:
Nuclear instruments and methods in physics research section A
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645
, 1
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1-2
;
2011
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:30 years of CPO-conferences
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Beteiligte:Wollnik, H. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2011
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Format / Umfang:2 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Unbekannt
- Neue Suche nach: 539.7
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 539.7 -
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis – Band 645, Ausgabe 1
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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30 years of CPO-conferencesWollnik, H. et al. | 2011
- 3
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Thirty years of charged particle optics conferencesHawkes, P.W. et al. | 2010
- 7
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The Wien filter: History, fundamentals and modern applicationsPlies, E. / Marianowski, K. / Ohnweiler, T. et al. | 2010
- 12
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Monochromators in electron microscopyTsuno, K. et al. | 2010
- 20
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Aplanatic imaging systems for the transmission electron microscopeMüller, Heiko / Maßmann, Ingo / Uhlemann, Stephan / Hartel, Peter / Zach, Joachim / Haider, Maximilian et al. | 2010
- 28
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C 3c measurement and dispersion reduction for beam-tilt optics of aberration-corrected SEMNakano, Tomonori / Hirose, Kotoko / Kawasaki, Takeshi et al. | 2010
- 33
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Electromagnetic mirror objective with removable spherical aberrationBimurzaev, S.B. / Yakushev, E.M. et al. | 2011
- 35
-
Electron optics for dual-beam low energy electron microscopyMankos, Marian et al. | 2010
- 41
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Permanent magnet finger-size scanning electron microscope columnsNelliyan, K. / Khursheed, A. et al. | 2010
- 46
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Very low energy scanning electron microscopyFrank, Luděk / Hovorka, Miloš / Konvalina, Ivo / Mikmeková, Šárka / Müllerová, Ilona et al. | 2011
- 55
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Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lensKonvalina, I. / Müllerová, I. et al. | 2011
- 60
-
Electron optics of multi-beam scanning electron microscopeMohammadi-Gheidari, A. / Kruit, P. et al. | 2010
- 68
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Towards quantitative scanning electron microscopy: Applications to nano-scale analysisEl-Gomati, M.M. / Walker, C.G.H. / Zha, X. et al. | 2010
- 74
-
Properties of the imaging performance of an electron optical system for SEMSato, Mitsugu et al. | 2011
- 79
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Comparison of calculated, simulated and measured signal amplification in a variable pressure SEMNeděla, V. / Konvalina, I. / Lencová, B. / Zlámal, J. et al. | 2010
- 84
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Silicon photodiodes for electron beam position and drift detection in scanning electron microscopy and electron beam lithography systemKuo, Yi-Hung / Wu, Cheng-Ju / Yen, Jia-Yush / Chen, Sheng-Yung / Tsai, Kuen-Yu / Chen, Yung-Yaw et al. | 2011
- 90
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Electron beam transport in dusty plasmaVaislieva, T. / Lysenko, S. / Bayandina, D. / Vasiliev, M. et al. | 2010
- 96
-
Advances in helium ion microscopyHill, R. / Faridur Rahman, F.H.M. et al. | 2010
- 102
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Development of a transmission positron microscopeMatsuya, M. / Jinno, S. / Ootsuka, T. / Inoue, M. / Kurihara, T. / Doyama, M. / Fujinami, M. et al. | 2011
- 113
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Proton beam writing nanoprobe facility design and first test resultsvan Kan, J.A. / Malar, P. / de Vera, Armin Baysic / Chen, Xiao / Bettiol, A.A. / Watt, F. et al. | 2010
- 116
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Coulomb interactions in a low-voltage focussed ion beam systemMarianowski, K. / Ohnweiler, T. / Plies, E. et al. | 2010
- 120
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Biased sample holder for complete correction of SIMS transmission losses with tilted samplesDowsett, D. / Philipp, P. / Wirtz, T. et al. | 2010
- 124
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Influence of clusters on Bi LMIS propertiesRadlička, Tomáš / Lencová, Bohumila et al. | 2011
- 130
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Correction of sample tilt in FIB instrumentsOral, M. / Lencová, B. et al. | 2010
- 136
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The neon gas field ion source—a first characterization of neon nanomachining propertiesLivengood, Richard H. / Tan, Shida / Hallstein, Roy / Notte, John / McVey, Shawn / Faridur Rahman, F.H.M. et al. | 2011
- 141
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Equilibrium ion distribution modeling in RF ion traps and guides with regard to Coulomb effectsGrinfeld, D.E. / Kopaev, I.A. / Makarov, A.A. / Monastyrskiy, M.A. et al. | 2010
- 146
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Coulomb dynamics of ion bunches in multi-reflection electrostatic trapsBolotskikh, P.A. / Grinfeld, D.E. / Makarov, A.A. / Monastyrskiy, M.A. et al. | 2010
- 153
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Ion beam neutralization using three-dimensional electron confinement by surface modification of magnetic polesNicolaescu, Dan / Sakai, Shigeki / Gotoh, Yasuhito / Ishikawa, Junzo et al. | 2010
- 159
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The differential equations defining deflection of particles of ion beam from axial trajectory in electric and magnetic fieldsBaisanov, O.A. / Doskeyev, G.A. / Doskeyev, T.G. / Spivak-Lavrov, I.F. et al. | 2011
- 163
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Influence of the fringe field on moving of the charged particles in flat and cylindrical capacitorsDoskeyev, G.A. / Edenova, O.A. / Spivak-Lavrov, I.F. et al. | 2011
- 168
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Single-particle dynamics in electron storage rings with extremely low emittanceCai, Yunhai et al. | 2010
- 175
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Optics and nonlinear effects in repetitive systemsBerz, Martin / Makino, Kyoko et al. | 2011
- 182
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Fragment separator momentum compression schemesBandura, Laura / Erdelyi, Bela / Hausmann, Marc / Kubo, Toshiyuki / Nolen, Jerry / Portillo, Mauricio / Sherrill, Bradley M. et al. | 2010
- 187
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Bunch compression efficiency of the femtosecond electron source at Chiang Mai UniversityThongbai, C. / Kusoljariyakul, K. / Saisut, J. et al. | 2010
- 191
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Study of thermionic RF-gun phase-space dynamics and slice emittance under influence of external electromagnetic fieldsKusoljariyakul, K. / Thongbai, C. et al. | 2010
- 197
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Non-linear time-of-flight synchronization mode for multi-turn TOF mass spectrometersBerdnikov, A.S. et al. | 2011
- 205
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Aberrational description of periodical time-of-flight optical systemsBerdnikov, A.S. et al. | 2011
- 210
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TOF systems with two-directional isochronous motionSudakov, Mikhail / Kumashiro, Sumio et al. | 2010
- 216
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New schemes of static mass spectrometersBaisanov, O.A. / Doskeyev, G.A. / Spivak-Lavrov, I.F. et al. | 2011
- 219
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On a possibility of reducing time-of-flight chromatic aberration of emission systemBimurzaev, S.B. / Bimurzaeva, R.S. et al. | 2011
- 221
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A parallel magnetic sector mass analyzer designCheong, K.H. / Khursheed, A. et al. | 2010
- 227
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Parallel acquisition electrostatic electron energy analyzers for high throughput nano-analysisCubric, D. / De Fanis, A. / Konishi, I. / Kumashiro, S. et al. | 2010
- 234
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Electron optics of spheroid charged particle energy analyzersCubric, D. / Kholine, N. / Konishi, I. et al. | 2010
- 241
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Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopesHoang, H.Q. / Osterberg, M. / Khursheed, A. et al. | 2010
- 245
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Improvement of a second-order focusing toroidal spectrometer by use of a pre-collimating lensHoang, H.Q. / Khursheed, A. et al. | 2010
- 248
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First-order focusing parallel electron energy magnetic sector analyzer designsKhursheed, Anjam / Nelliyan, Karuppiah / Chao, Fang et al. | 2010
- 253
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Second-order focusing parallel electron energy magnetic sector analyzer designsKhursheed, Anjam et al. | 2010
- 257
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A magnetic electron energy analyser for fast data acquisitionZha, X. / Walker, C.G.H. / El-Gomati, M.M. et al. | 2010
- 260
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Study of electro-chemical properties of metal–oxide interfaces using a newly constructed ambient pressure X-ray photoelectron spectroscopy endstationAksoy, Funda / Grass, Michael E. / Joo, Sang Hoon / Jabeen, Naila / Hong, Young Pyo / Hussain, Zahid / Mun, Bongjin S. / Liu, Zhi et al. | 2010
- 266
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Numerical simulation methods for electron and ion opticsMunro, Eric et al. | 2011
- 273
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The CPO programs and the BEM for charged particle opticsRead, Frank H. / Bowring, Nicholas J. et al. | 2011
- 278
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Development of the program EOD for design in electron and ion microscopyZlámal, J. / Lencová, B. et al. | 2011
- 283
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Highly accurate potential calculations for cylindrically symmetric geometries using multi-region FDM: A reviewEdwards, David Jr. et al. | 2010
- 292
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High order numerical differentiation and approximation of Laplace fields using regular grid dataBerdnikov, A.S. et al. | 2011
- 300
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Design and optimization of multipole lens and Wien filter systemsLiu, Haoning / Wang, Liping / Rouse, John / Munro, Eric et al. | 2011
- 307
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Increased-accuracy numerical modeling of electron–optical systems with space-chargeSveshnikov, V. et al. | 2011
- 310
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Simulation of Coulomb interaction effects in electron sourcesRouse, John / Zhu, Xieqing / Liu, Haoning / Munro, Eric et al. | 2010
- 316
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Modeling of tip evolution of point cathode for numerical calculation of electric field in electron gunIiyoshi, Ryo et al. | 2011
- 321
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Upgraded G-optk program for electron gun characterizationNagasao, K. / Takebe, M. / Ushio, W. / Fujita, S. / Ohye, T. / Shimoyama, H. et al. | 2010
- 327
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ELECTRA: Electrostatic lens calculation tool with real time adjustment. A virtual optics bench for rapid determination of optical parameters using pre-characterized lensesDowsett, D. et al. | 2010
- 332
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Optimal correction and design parameter search by modern methods of rigorous global optimizationMakino, K. / Berz, M. et al. | 2010
- 338
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The fast multipole method in the differential algebra frameworkZhang, He / Berz, Martin et al. | 2011
- 345
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Computer simulation of electron and ion trajectories in electron-impact ion sources of a quadrupole mass spectrometerAhn, Jong Rok / Park, Chang Joon et al. | 2011
- 350
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Author Index| 2011
- IFC
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Inside front cover (Editorial Board)| 2011
- vii
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EditorialKhursheed, Anjam et al. | 2011
- viii
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Conference photo| 2011
- x
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List of Participants| 2011
- xii
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Acknowledgements| 2011
- xiii
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Contents| 2011
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Committees and Sponsors| 2011