A Test Platform for the Noise Characterization of SiGe Microbolometer ROICs (Englisch)
- Neue Suche nach: Abbasi, Shahbaz
- Neue Suche nach: Shafique, Atia
- Neue Suche nach: Ceylan, Omer
- Neue Suche nach: Kaynak, Canan Baristiran
- Neue Suche nach: Kaynak, Mehmet
- Neue Suche nach: Gurbuz, Yasar
- Neue Suche nach: Abbasi, Shahbaz
- Neue Suche nach: Shafique, Atia
- Neue Suche nach: Ceylan, Omer
- Neue Suche nach: Kaynak, Canan Baristiran
- Neue Suche nach: Kaynak, Mehmet
- Neue Suche nach: Gurbuz, Yasar
In:
IEEE sensors journal
;
18
, 15
;
6217-6223
;
2018
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:A Test Platform for the Noise Characterization of SiGe Microbolometer ROICs
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Beteiligte:Abbasi, Shahbaz ( Autor:in ) / Shafique, Atia ( Autor:in ) / Ceylan, Omer ( Autor:in ) / Kaynak, Canan Baristiran ( Autor:in ) / Kaynak, Mehmet ( Autor:in ) / Gurbuz, Yasar ( Autor:in )
-
Erschienen in:IEEE sensors journal ; 18, 15 ; 6217-6223
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.01.2018
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Format / Umfang:7 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 681.2
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 681.2 -
Datenquelle:
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