Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs (Englisch)
- Neue Suche nach: Jazaeri, Farzan
- Neue Suche nach: Borghello, Giulio
- Neue Suche nach: Faccio, Federico
- Neue Suche nach: Mattiazzo, Serena
- Neue Suche nach: Baschirotto, Andrea
- Neue Suche nach: Enz, Christian
- Neue Suche nach: Jazaeri, Farzan
- Neue Suche nach: Borghello, Giulio
- Neue Suche nach: Faccio, Federico
- Neue Suche nach: Mattiazzo, Serena
- Neue Suche nach: Baschirotto, Andrea
- Neue Suche nach: Enz, Christian
In:
IEEE transactions on nuclear science
;
66
, 1
;
38-47
;
2019
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs
-
Beteiligte:Jazaeri, Farzan ( Autor:in ) / Borghello, Giulio ( Autor:in ) / Faccio, Federico ( Autor:in ) / Mattiazzo, Serena ( Autor:in ) / Baschirotto, Andrea ( Autor:in ) / Enz, Christian ( Autor:in )
-
Erschienen in:IEEE transactions on nuclear science ; 66, 1 ; 38-47
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.01.2019
-
Format / Umfang:10 pages
-
ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 621.48
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 621.48 -
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis – Band 66, Ausgabe 1
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
Table of contents| 2019
- 5
-
Conference Comments by the General ChairLacoe, Ronald et al. | 2019
- 8
-
Special NSREC 2018 Issue of the IEEE Transactions on Nuclear Science Comments by the EditorsFleetwood, Dan J. / Brown, Dennis / Quinn, Heather / Esqueda, Ivan Sanchez / Robinson, William / Moss, Steven / Goiffon, Vincent / Paillet, Philippe et al. | 2019
- 9
-
NSREC 2018 Special Issue of the IEEE List of Reviewers| 2019
- 11
-
2018 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the ChairmanBuchner, Stephen P. et al. | 2019
- 13
-
Outstanding Conference Paper Award: 2018 IEEE Nuclear and Space Radiation Effects Conference| 2019
- 16
-
In Memoriam Wendland Beezhold (1939–2018)| 2019
- 17
-
A Brief History of Space Climatology: From the Big Bang to the PresentXapsos, Michael et al. | 2019
- 38
-
Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETsZhang, Chun-Min / Jazaeri, Farzan / Borghello, Giulio / Faccio, Federico / Mattiazzo, Serena / Baschirotto, Andrea / Enz, Christian et al. | 2019
- 48
-
Total Ionizing Dose Effects in 3-D NAND Flash MemoriesBagatin, Marta / Gerardin, Simone / Paccagnella, Alessandro / Beltrami, Silvia / Costantino, Alessandra / Muschitiello, Michele / Zadeh, Ali / Ferlet-Cavrois, Veronique et al. | 2019
- 54
-
Training a Neural Network on Analog TaOx ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSimJacobs-Gedrim, R. B. / Hughart, D. R. / Agarwal, S. / Vizkelethy, G. / Bielejec, E. S. / Vaandrager, B. L. / Swanson, S. E. / Knisely, K. E. / Taggart, J. L. / Barnaby, H. J. et al. | 2019
- 61
-
Ionizing Radiation Effects Spectroscopy for Analysis of Total-Ionizing Dose Degradation in RF CircuitsPatel, B. / Joplin, M. / Boggs, R. C. / Reising, D. R. / McCurdy, M. W. / Massengill, L. W. / Loveless, T. D. et al. | 2019
- 69
-
Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage EffectsTaggart, J. L. / Jacobs-Gedrim, R. B. / McLain, M. L. / Barnaby, H. J. / Bielejec, E. S. / Hardy, W. / Marinella, M. J. / Kozicki, M. N. / Holbert, K. et al. | 2019
- 77
-
Effects of Gamma Irradiation on Magnetic Properties of Double-Interface CoFeB/MgO MultifilmsWang, Bi / Wang, Zhaohao / Cao, Kaihua / Bi, Xiao / Zhao, Yuanfu / Zhang, Youguang / Zhao, Weisheng et al. | 2019
- 82
-
Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh DosesBonaldo, Stefano / Mattiazzo, Serena / Enz, Christian / Baschirotto, Andrea / Paccagnella, Alessandro / Jin, Xiaoming / Gerardin, Simone et al. | 2019
- 91
-
Effect of Proton Radiation on Ultrawide Bandgap AlN Schottky Barrier DiodesMontes, Jossue / Yang, Tsung-Han / Fu, Houqiang / Chen, Hong / Huang, Xuanqi / Fu, Kai / Baranowski, Izak / Zhao, Yuji et al. | 2019
- 97
-
Evaluation of Radiation Effects in RRAM-Based Neuromorphic Computing System for InferenceYe, Zhilu / Liu, Rui / Taggart, Jennifer L. / Barnaby, Hugh J. / Yu, Shimeng et al. | 2019
- 104
-
Dose and Single-Event Effects on a Color CMOS Camera for Space ExplorationVirmontois, Cedric / Belloir, Jean-Marc / Beaumel, Matthieu / Vriet, Antoine / Perrot, Nicolas / Sellier, Charles / Bezine, Julien / Gambart, Didier / Blain, Dominique / Garcia-Sanchez, Esther et al. | 2019
- 111
-
Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose LevelsRizzolo, Serena / Goiffon, Vincent / Corbiere, Franck / Molina, Romain / Chabane, Aziouz / Girard, Sylvain / Paillet, Philippe / Magnan, Pierre / Boukenter, Aziz / Allanche, Timothe et al. | 2019
- 120
-
Radiation-Induced Effects on Fiber Bragg Gratings Inscribed in Highly Birefringent Photonic Crystal FiberMorana, A. / Baghdasaryan, T. / Girard, S. / Marin, E. / Geernaert, T. / Thienpont, H. / Berghmans, F. / Boukenter, A. / Ouerdane, Y. et al. | 2019
- 125
-
Total Ionizing Dose Effects in 70-GHz Bandwidth Photodiodes in a SiGe Integrated Photonics PlatformGoley, Patrick S. / Tzintzarov, George N. / Zeinolabedinzadeh, Saeed / Ildefonso, Adrian / Motoki, Keisuke / Jiang, Rong / Zhang, En Xia / Fleetwood, Daniel M. / Zimmermann, Lars / Kaynak, Mehmet et al. | 2019
- 134
-
Comparative Study of Cryogenic Versus Room-Temperature Proton Irradiation of N-Channel CCDs and Subsequent AnnealingProd'homme, Thibaut / Verhoeve, Peter / Lemmel, Frederic / Smit, Hans / Blommaert, Sander / van der Luijt, Cornelis / Visser, Ivo / Beaufort, Thierry / Levillain, Yves / Shortt, Brian et al. | 2019
- 140
-
The Effect of 1–10-MeV Neutrons on the JESD89 Test StandardQuinn, Heather / Watkins, Adam / Dominik, Laura / Slayman, Charles et al. | 2019
- 148
-
Directional Dependence of Co-60 Irradiation on the Total Dose Response of Flash MemoriesGadlage, Matthew J. / Bruce, David I. / Ingalls, James D. / Bossev, Dobrin P. / Mckinney, Matthew / Kay, Matthew J. et al. | 2019
- 155
-
Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention VoltageKobayashi, Daisuke / Hayashi, Naoki / Hirose, Kazuyuki / Kakehashi, Yuya / Kawasaki, Osamu / Makino, Takahiro / Ohshima, Takeshi / Matsuura, Daisuke / Mori, Yoshiharu / Kusano, Masaki et al. | 2019
- 163
-
Total Dose Testing Methodology for Bipolar Circuits Operating in the Jovian Radiation EnvironmentAdell, Philippe R. / McClure, Steve / Rax, Bernard / Thorbourn, Dennis / Kenna, Aaron / Jun, Insoo / Kim, Wousik / Scheick, Leif et al. | 2019
- 170
-
Dose-Rate Dependence of the Total-Ionizing-Dose Response of GaN-Based HEMTsJiang, Rong / Zhang, En Xia / McCurdy, Mike W. / Wang, Pengfei / Gong, Huiqi / Yan, Dawei / Schrimpf, Ronald D. / Fleetwood, Daniel M. et al. | 2019
- 177
-
Impacts of Proton Radiation on Heavy-Ion-Induced Single-Event Transients in 65-nm CMOS TechnologyWu, Zhenyu / Chen, Shuming / Chen, Jianjun / Huang, Pengcheng et al. | 2019
- 184
-
Methodology for Identifying Radiation Effects in Robotic Systems With Mechanical and Control Performance VariationsHoward, J. T. / Barth, E. J. / Schrimpf, R. D. / Reed, R. A. / Adams, L. C. / Vibbert, D. / Witulski, A. F. et al. | 2019
- 190
-
Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar TechnologiesPrivat, A. / Barnaby, H. J. / Adell, P. C. / Tolleson, B. S. / Wang, Y. / Han, X. / Davis, P. / Rax, B. R. / Buchheit, T. E. et al. | 2019
- 199
-
Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar DevicesLi, Xiaolong / Lu, Wu / Guo, Qi / Fleetwood, Daniel M. / He, Chengfa / Wang, Xin / Yu, Xin / Sun, Jing / Liu, Mohan / Yao, Shuai et al. | 2019
- 207
-
Strategies for Removing Common Mode Failures From TMR Designs Deployed on SRAM FPGAsCannon, Matthew J. / Keller, Andrew M. / Rowberry, Hayden C. / Thurlow, Corbin A. / Perez-Celis, Andres / Wirthlin, Michael J. et al. | 2019
- 216
-
Selective Hardening for Neural Networks in FPGAsLibano, F. / Wilson, B. / Anderson, J. / Wirthlin, M. J. / Cazzaniga, C. / Frost, C. / Rech, P. et al. | 2019
- 223
-
Microcontroller Compiler-Assisted Software Fault ToleranceBohman, Matthew / James, Benjamin / Wirthlin, Michael J. / Quinn, Heather / Goeders, Jeffrey et al. | 2019
- 233
-
Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI LayoutsBlack, Jeffrey D. / Dame, Jeff A. / Black, Dolores A. / Dodd, Paul E. / Shaneyfelt, Marty R. / Teifel, John / Salas, Joseph G. / Steinbach, Robert / Davis, Matthew / Reed, Robert A. et al. | 2019
- 240
-
Best Practices for Using Electrostatic Discharge Protection Techniques for Single-Event Transient MitigationCho, Moon-Kyu / Song, Ickhyun / Zachary, Fleetwood E. / Khachatrian, Ani / Warner, Jeffrey H. / Buchner, Stephen P. / McMorrow, Dale / Paki, Pauline / Cressler, John D. et al. | 2019
- 248
-
Evaluating the Impact of Repetition, Redundancy, Scrubbing, and Partitioning on 28-nm FPGA Reliability Through Neutron TestingKibar, Ogun O. / Mohan, Prashanth / Rech, Paolo / Mai, Ken et al. | 2019
- 255
-
Using the Galileo Solid-State Imaging Instrument as a Sensor of Jovian Energetic ElectronsCarlton, Ashley / de Soria-Santacruz Pich, Maria / Kim, Wousik / Jun, Insoo / Cahoy, Kerri et al. | 2019
- 262
-
Experimental Evidence of Ground Albedo Neutron Impact on Soft Error Rate for Nanoscale DevicesHubert, G. / Artola, L. et al. | 2019
- 270
-
Correlation of Single-Board Computer Ground-Test Data and On-Orbit Upset Rates From the Gaia MissionHansen, D. L. / Ecale, E. / Hillman, R. / Meraz, F. / Montoya, J. / Paulet, P. / Serpell, E. / Tatry, P. / Williamson, G. et al. | 2019
- 276
-
SRAM Dosimeter for Characterizing the TRIUMF Proton and Neutron BeamsBlackmore, Ewart / Trinczek, Michael / Jiang, Kai / Sachdev, Manoj / Wright, Derek et al. | 2019
- 282
-
An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18- $\mu$ m CMOS TechnologyPrinzie, Jeffrey / Thys, Sam / Van Bockel, Bjorn / Wang, Jialei / De Smedt, Valentijn / Leroux, Paul et al. | 2019
- 290
-
A Low-Power, Real-Time Displacement Damage DosimeterWarner, Jeffrey H. / Hoheisel, Raymond / Cress, Cory D / Jenkins, Phillip P. / Lorentzen, Justin R. / Scheiman, David A. / Yakes, Michael K. et al. | 2019
- 299
-
Dosimetry Mapping of Mixed-Field Radiation Environment Through Combined Distributed Optical Fiber Sensing and FLUKA SimulationDi Francesca, Diego / Infantino, Angelo / Li Vecchi, Gaetano / Girard, Sylvain / Alessi, Antonino / Kadi, Yacine / Brugger, Markus et al. | 2019
- 306
-
X-Rays, $\gamma$ -Rays, and Proton Beam Monitoring With Multimode Nitrogen-Doped Optical FiberGirard, S. / Di Francesca, D. / Morana, A. / Hoehr, C. / Paillet, P. / Duzenli, C. / Kerboub, N. / Reghioua, I. / Li Vecchi, G. / Alessi, A. et al. | 2019
- 312
-
TID Evaluation System With On-Chip Electron Source and Programmable Sensing Mechanisms on FPGALentaris, George / Maragos, Konstantinos / Soudris, Dimitrios / Di Capua, Francesco / Campajola, Luigi / Campajola, Marcello / Costantino, Alessandra / Furano, Gianluca / Tavoularis, Antonios / Santos, Lucana et al. | 2019
- 320
-
SOI Thin Microdosimeter Detectors for Low-Energy Ions and Radiation Damage StudiesJames, Benjamin / Tran, Linh T. / Vohradsky, James / Bolst, David / Pan, Vladimir / Carr, Madeline / Guatelli, Susanna / Pogossov, Alex / Petasecca, Marco / Lerch, Michael et al. | 2019
- 327
-
Uncertainty Characterization of Silicon Damage MetricsGriffin, Patrick J. et al. | 2019
- 337
-
Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETsBall, D. R. / Sierawski, B. D. / Galloway, K. F. / Johnson, R. A. / Alles, M. L. / Sternberg, A. L. / Witulski, A. F. / Reed, R. A. / Schrimpf, R. D. / Javanainen, A. et al. | 2019
- 344
-
Radiation Response of AlGaN-Channel HEMTsMartinez, M. J. / King, M. P. / Baca, A. G. / Allerman, A. A. / Armstrong, A. A. / Klein, B. A. / Douglas, E. A. / Kaplar, R. J. / Swanson, S. E. et al. | 2019
- 352
-
SET Sensitivity of Trigate Silicon Nanowire Field-Effect TransistorsRaine, Melanie / Gaillardin, Marc / Martinez, Martial / Duhamel, Olivier / Riffaud, Jonathan / Lagutere, Thierry / Marcandella, Claude / Paillet, Philippe / Richard, Nicolas / Vinet, Maud et al. | 2019
- 359
-
Optimizing Optical Parameters to Facilitate Correlation of Laser- and Heavy-Ion-Induced Single-Event Transients in SiGe HBTsIldefonso, Adrian / Fleetwood, Zachary E. / Tzintzarov, George N. / Hales, Joel M. / Nergui, Delgermaa / Frounchi, Milad / Khachatrian, Ani / Buchner, Stephen P. / Mcmorrow, Dale / Warner, Jeffrey H. et al. | 2019
- 368
-
Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray BeamKhachatrian, A. / Roche, N. J.-H. / Buchner, S. P. / Koehler, A. D. / Anderson, T. J. / McMorrow, D. / Lalumondiere, S. D. / Bonsall, J. P. / Dillingham, E. C. / Brewe, D. L. et al. | 2019
- 376
-
Pulsed-Laser Induced Single-Event Transients in InGaAs FinFETs on Bulk Silicon SubstratesGong, Huiqi / Ni, Kai / Zhang, En Xia / Sternberg, Andrew L. / Kozub, John A. / Alles, Michael L. / Reed, Robert A. / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Waldron, Niamh et al. | 2019
- 384
-
Laser-Induced Single-Event Transients in Black Phosphorus MOSFETsLiang, C. / Ma, R. / Li, K. / Su, Y. / Gong, H. / Ryder, K. L. / Wang, P. / Sternberg, A. L. / Zhang, E. X. / Alles, M. L. et al. | 2019
- 389
-
The Effects of Temperature on the Single-Event Transient Response of a High-Voltage (>30 V) Complementary SiGe-on-SOI TechnologyOmprakash, Anup P. / Ildefonso, Adrian / Fleetwood, Zachary E. / Tzintzarov, George N. / Cardoso, Adilson S. / Babcock, Jeffrey A. / Mukhopadhyay, Rajarshi / Khachatrian, Ani / Warner, Jeffrey H. / McMorrow, Dale et al. | 2019
- 397
-
Dopant-Type and Concentration Dependence of Total-Ionizing-Dose Response in Piezoresistive Micromachined CantileversArutt, Charles N. / Shuvra, Pranoy Deb / Lin, Ji-Tzuoh / Alles, Michael L. / Alphenaar, Bruce W. / Davidson, Jim L. / Walsh, Kevin M. / Mcnamara, Shamus / Fleetwood, Daniel M. / Schrimpf, Ronald D. et al. | 2019
- 405
-
A Multifield and Frequency Electrically Detected Magnetic Resonance Study of Atomic-Scale Defects in Gamma Irradiated Modern MOS Integrated CircuitryMyers, K. J. / Waskiewicz, R. J. / Lenahan, P. M. / Young, C. D. et al. | 2019
- 413
-
Effects of Proton Radiation-Induced Defects on Optoelectronic Properties of MoS2Foran, Brendan / Mann, Colin / Peterson, Mark / Bushmaker, Adam / Wang, Bo / Chen, Jihan / Yang, Sisi / Cronin, Stephen B. et al. | 2019
- 420
-
Total Ionizing Dose Effects and Proton-Induced Displacement Damage on MoS2-Interlayer-MoS2 Tunneling JunctionsWang, Pan / Perini, Christopher J. / O'Hara, Andrew / Gong, Huiqi / Wang, Pengfei / Zhang, En Xia / Mccurdy, Michael W. / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Pantelides, Sokrates T. et al. | 2019
- 428
-
A New Analytical Tool for the Study of Radiation Effects in 3-D Integrated Circuits: Near-Zero Field Magnetoresistance SpectroscopyAshton, James P. / Moxim, Stephen J. / Lenahan, Patrick M. / Mckay, Colin G. / Waskiewicz, Ryan J. / Myers, Kenneth J. / Flatte, Michael E. / Harmon, Nicholas J. / Young, Chadwin D. et al. | 2019
- 437
-
Mechanisms of Electron-Induced Single-Event LatchupTali, Maris / Alia, Ruben Garcia / Brugger, Markus / Ferlet-Cavrois, Veronique / Corsini, Roberto / Farabolini, Wilfrid / Javanainen, Arto / Santin, Giovanni / Boatella Polo, Cesar / Virtanen, Ari et al. | 2019
- 444
-
Understanding the Average Electron–Hole Pair-Creation Energy in Silicon and Germanium Based on Full-Band Monte Carlo SimulationsFang, Jingtian / Reaz, Mahmud / Weeden-Wright, Stephanie L. / Schrimpf, Ronald D. / Reed, Robert A. / Weller, Robert A. / Fischetti, Massimo V. / Pantelides, Sokrates T. et al. | 2019
- 452
-
SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic TemperaturesArtola, L. / Ducret, S. / Advent, F. / Hubert, G. / Mekki, J. et al. | 2019
- 458
-
Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects TestingAlia, Ruben Garcia / Martinez, Pablo Fernandez / Kastriotou, Maria / Brugger, Markus / Bernhard, Johannes / Cecchetto, Matteo / Cerutti, Francesco / Charitonidis, Nikolaos / Danzeca, Salvatore / Gatignon, Lau et al. | 2019
- 466
-
Impact of the Elemental Makeup of an IC in Generating Single-Event Upsets From Low-Energy (<10 MeV) Neutrons: A 3-D nand Flash Case StudyConway, Peter M. / Gadlage, Matthew J. / Ingalls, James D. / Williams, Aaron M. / Bruce, David I. / Bossev, Dobrin P. et al. | 2019
- 466
-
Impact of the Elemental Makeup of an IC in Generating Single-Event Upsets From Low-Energy (<10 MeV) Neutrons: A 3-D nand Flash Case Study| 2019
- 474
-
Heavy Ion Transport Modeling for Single-Event Burnout in SiC-Based Power DevicesMcPherson, Joseph A. / Kowal, Peter J. / Pandey, Gyanesh K. / Chow, T. Paul / Ji, Wei / Woodworth, Andrew A. et al. | 2019
- 482
-
Conference Author Index| 2019
- 486
-
IEEE Open Access Publishing| 2019
- 487
-
Effect of Gamma-Ray Energy on Image Quality in Passive Gamma Emission Tomography of Spent Nuclear FuelBelanger-Champagne, Camille / Peura, Pauli / Eerola, Paula / Honkamaa, Tapani / White, Timothy / Mayorov, Mikhail / Dendooven, Peter et al. | 2019
- 497
-
Improvement of a PET Detector Performance by Setting Reflectors in Parallel With PMT FaceInadama, Naoko / Murayama, Hideo / Nishikido, Fumihiko / Ohi, Junichi / Yamaya, Taiga et al. | 2019
- 506
-
La- and La-/Ce-Doped BaF2 Crystals for Future HEP Experiments at the Energy and Intensity Frontiers Part IYang, Fan / Chen, Junfeng / Zhang, Liyuan / Hu, Chen / Zhu, Ren-Yuan et al. | 2019
- 512
-
La- and La-/Ce-Doped BaF2 Crystals for Future HEP Experiments at the Energy and Intensity Frontiers Part IIYang, Fan / Chen, Junfeng / Zhang, Liyuan / Hu, Chen / Zhu, Ren-Yuan et al. | 2019
- 519
-
On the Instantaneous Dose Rate and Angular Dependence of Monolithic Silicon Array DetectorsBiasi, Giordano / Hardcastle, Nicholas / Petasecca, Marco / Guatelli, Susanna / Perevertaylo, Vladimir / Kron, Tomas / Rosenfeld, Anatoly B. et al. | 2019
- 528
-
Model-Based Pileup Events Correction via Kalman-Filter TunnelsLiu, Bingqi / Liu, Mingzhe / He, Mingfu / Ma, Yingjie / Tuo, Xianguo et al. | 2019
- 536
-
Compact and Effective Detector of the Fast Neutrons on a Base of Ce-doped Gd3Al2Ga3O12 Scintillation CrystalKorjik, Mikhail / Brinkmann, Kai-Thomas / Dosovitskiy, Georgy / Dormenev, Valery / Fedorov, Andrei / Kozlov, Dmitry / Mechinsky, Vitaly / Zaunick, Hans-Georg et al. | 2019
- C1
-
Front Cover| 2019
- C2
-
IEEE Transactions on Nuclear Science publication information| 2019
- C3
-
IEEE Transactions on Nuclear Science information for authors| 2019
- C4
-
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2019