Probing confined interfacial excitations in buried layers by Brillouin light scattering (Englisch)
Nationallizenz
- Neue Suche nach: Zhang, X.
- Neue Suche nach: Sooryakumar, R.
- Neue Suche nach: Zhang, X.
- Neue Suche nach: Sooryakumar, R.
In:
Applied Physics Letters
;
80
, 24
;
4501-4503
;
2002
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Probing confined interfacial excitations in buried layers by Brillouin light scattering
-
Beteiligte:Zhang, X. ( Autor:in ) / Sooryakumar, R. ( Autor:in )
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Erschienen in:Applied Physics Letters ; 80, 24 ; 4501-4503
-
Verlag:
- Neue Suche nach: American Institute of Physics
-
Erscheinungsdatum:17.06.2002
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 80, Ausgabe 24
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