Geometrical modeling of surface profile formation during laser ablation of materials (Englisch)
Nationallizenz
- Neue Suche nach: Vatsya, S. R.
- Neue Suche nach: Bordatchev, E. V.
- Neue Suche nach: Nikumb, S. K.
- Neue Suche nach: Vatsya, S. R.
- Neue Suche nach: Bordatchev, E. V.
- Neue Suche nach: Nikumb, S. K.
In:
Journal of Applied Physics
;
93
, 12
;
9753-9759
;
2003
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Geometrical modeling of surface profile formation during laser ablation of materials
-
Beteiligte:
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Erschienen in:Journal of Applied Physics ; 93, 12 ; 9753-9759
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Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:15.06.2003
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 93, Ausgabe 12
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Comment on “(Ta1−xNbx)2O5 films produced by atomic layer deposition: Temperature dependent dielectric spectroscopy and room-temperature I–V characteristics” [J. Appl. Phys. 90, 4532 (2001)]Brazis, R. / Pipinys, P. et al. | 2003
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Publisher’s Note: “Sample-detector coupling in atomic resolution magnetic resonance diffraction” [J. Appl. Phys. 92, 7345 (2002)]Barbic, Mladen / Scherer, Axel et al. | 2003