Universal oscillations of high‐order cumulants (Englisch)
- Neue Suche nach: Flindt, Christian
- Neue Suche nach: Fricke, Christian
- Neue Suche nach: Hohls, Frank
- Neue Suche nach: Novotný, Tomáš
- Neue Suche nach: Netočný, Karel
- Neue Suche nach: Brandes, Tobias
- Neue Suche nach: Haug, Rolf J.
- Neue Suche nach: Flindt, Christian
- Neue Suche nach: Fricke, Christian
- Neue Suche nach: Hohls, Frank
- Neue Suche nach: Novotný, Tomáš
- Neue Suche nach: Netočný, Karel
- Neue Suche nach: Brandes, Tobias
- Neue Suche nach: Haug, Rolf J.
- Neue Suche nach: Macucci, Massimo
- Neue Suche nach: Basso, Giovanni
In:
AIP Conference Proceedings
;
1129
, 1
;
453-456
;
2009
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Universal oscillations of high‐order cumulants
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Beteiligte:Flindt, Christian ( Autor:in ) / Fricke, Christian ( Autor:in ) / Hohls, Frank ( Autor:in ) / Novotný, Tomáš ( Autor:in ) / Netočný, Karel ( Autor:in ) / Brandes, Tobias ( Autor:in ) / Haug, Rolf J. ( Autor:in ) / Macucci, Massimo ( Herausgeber:in ) / Basso, Giovanni ( Herausgeber:in )
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Erschienen in:AIP Conference Proceedings ; 1129, 1 ; 453-456
-
Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:23.04.2009
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Format / Umfang:4 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 1129, Ausgabe 1
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- 553
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Noise Through Retino‐Cortical Pathways Assessed By Reaction TimesMedina, José M. / Díaz, José A. et al. | 2009
- 559
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The More Rehearsal, the More Noise in Timing PatternsGoan, Miki / Fukaya, Takugo / Tsujita, Katsuyoshi et al. | 2009
- 563
-
Nonlinear stochastic differential equation as the background of financial fluctuationsGontis, V. / Kaulakys, B. / Ruseckas, J. et al. | 2009
- 569
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A Semiconductor Device Noise Model: A Deterministic Approach to Semiconductor Device Current Noise for Semiclassical TransportNoaman, B. A. / Korman, C. E. et al. | 2009
- 573
-
Investigation of Noise Performance of SiGe HBTs by Deterministic Simulation of Boltzmann Equation in Two‐Dimensional Real SpaceHong, Sung‐Min / Jungemann, Christoph et al. | 2009
- 577
-
A High Frequency Compact Noise Model for Double‐Gate MOSFET DevicesLázaro, A. / Cerdeira, A. / Nae, B. / Estrada, M. / Iñíguez, B. et al. | 2009
- 581
-
Shot noise analysis in quasi one‐dimensional Field Effect TransistorsBetti, Alessandro / Fiori, Gianluca / Iannaccone, Giuseppe et al. | 2009
- 585
-
Influence of Dopant Profiles and Traps on the Low Frequency Noise of Four Gate TransistorsRodríguez, A. Luque / Tejada, J. A. Jiménez / Villanueva, J. A. López / Godoy, A. / Bullejos, P. Lara / Gómez‐Campos, M. et al. | 2009
- 589
-
Analytical Frequency‐Dependent Formulas of Excess Noise in Homogeneous SemiconductorsPark, Chan Hyeong / Hong, Sung‐Min et al. | 2009
- 593
-
Simulation of Microplasma Noise in PN JunctionsKoktavy, P. / Sadovsky, P. / Raska, M. et al. | 2009
- 599
-
A New Circuit Topology For The Realization Of Low Noise Voltage ReferencesCiofi, C. / Scandurra, G. / Cannatà, G. et al. | 2009
- 603
-
A Very Simple Low Noise Voltage Preamplifier For High Sensitivity Noise MeasurementsCannatà, G. / Scandurra, G. / Ciofi, C. et al. | 2009
- 607
-
About Quartz Crystal Resonator Noise: Recent StudySthal, F. / Galliou, S. / Imbaud, J. / Vacheret, X. / Salzenstein, P. / Rubiola, E. / Cibiel, G. et al. | 2009
- 611
-
High Precision Noise Measurements at Microwave FrequenciesIvanov, Eugene / Tobar, Michael et al. | 2009
- 615
-
Extraction and Analysis of Noise Parameters of On Wafer HEMTs up to 26.5 GHzCaddemi, Alina / Crupi, Giovanni / Macchiarella, Alessio et al. | 2009
- 621
-
Possible Correlation between Flicker Noise and Bias Temperature StressWagner, Paul‐Jürgen / Aichinger, Thomas / Grasser, Tibor / Nelhiebel, Michael / Vandamme, Lode K. J. et al. | 2009
- 625
-
Low Frequency Noise Evolution of AlGaN/GaN HEMT after 2000 hours of HTRB and HTO life testsSury, Charlotte / Curutchet, Arnaud / Malbert, Nathalie / Labat, Nathalie et al. | 2009
- 629
-
Low Frequency Noise in High Speed SiGe:C HBTs after Forward and Mixed‐Mode StressDiop, Malick / Leyris, Cedric / Revil, Nathalie / Marin, Mathieu / Ghibaudo, Gérard et al. | 2009
- 633
-
Low‐frequency Noise Characterizations of GaN‐based LEDs With Different Growth ParametersFone, W. K. / Leung, K. K. / Surya, C. et al. | 2009
- 637
-
Multi‐parameters Characterization of Electromigration Noise in Metal InterconnectionHe, Liang / Du, Lei / Zhuang, Yi‐Qi / Bao, Jun‐Lin et al. | 2009
- 641
-
Micro‐plasma Luminescence And Signal Noise Used To Solar Cells Defects DiagnosticJiri, Vanek / Pavel, Koktavy / Jan, Dolensky / Ales, Vesely / Zdenek, Chobola / Petr, Paracka et al. | 2009
- 645
-
Low Frequency Noise Measurement of Reverse Polarized Silicon Carbide Schottky DiodesSzewczyk, Arkadiusz / Stawarz‐Graczyk, Barbara et al. | 2009
- 651
-
Noise HarvestingGammaitoni, L. / Cottone, F. / Neri, I. / Vocca, H. et al. | 2009
- 655
-
Spectral analysis of electromagnetic and acoustic emission stochastic signalsTrcka, Tomas / Koktavy, Pavel / Koktavy, Bohumil et al. | 2009
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Front Matter for Volume 1129| 2009
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Back Matter for Volume 1129| 2009