ac heating–dc detecting method for Seebeck coefficient measurement of the thermoelectric micro/nano devices (Englisch)
- Neue Suche nach: Miao, Tingting
- Neue Suche nach: Ma, Weigang
- Neue Suche nach: Zhang, Xing
- Neue Suche nach: Miao, Tingting
- Neue Suche nach: Ma, Weigang
- Neue Suche nach: Zhang, Xing
In:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
;
30
, 5
;
5
;
2012
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:ac heating–dc detecting method for Seebeck coefficient measurement of the thermoelectric micro/nano devices
-
Weitere Titelangaben:ac heating–dc detecting method for Seebeck coefficient measurement
-
Beteiligte:
-
Erschienen in:
-
Verlag:
- Neue Suche nach: American Vacuum Society
-
Erscheinungsdatum:01.09.2012
-
Format / Umfang:5 pages
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 30, Ausgabe 5
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 50601
-
Letters - Creating nanoscale Ag patterns on the Si(111)-(√3 × √3)R30°-Ag surface via guided self-assemblyBelianinov, Alex et al. | 2012
-
Proximity error correction method for continuous moving stage electron beam writingKasture, Sachin / V. V., Nikesh / Mulay, Gajendra / Venu Gopal, Achanta et al. | 2012
-
Effect of niobium doping on the optical and electrical properties in titanium dioxide grown by pulsed laser depositionBae, Hyojung / Ha, Jun-Seok / Park, Seunghwan / Chikyow, Toyohiro / Chang, Jiho / Oh, Dongcheol et al. | 2012
- 50801
-
Review Article - Interplay of native point defects with ZnO Schottky barriers and dopingBrillson, Leonard J et al. | 2012
- 51201
-
Electronic & Optoelectronic Materials, Devices & Processing - Formation of high quality nano-crystallized Ge films on quartz substrates at moderate temperatureLi, Cong et al. | 2012
-
Thin InAs membranes and GaSb buffer layers on GaAs(001) substratesAstromskas, Gvidas / Borg, Mattias / Wernersson, Lars-Erik et al. | 2012
-
Studies on InAs/GaSb superlattice structural properties by high resolution x-ray diffractionZhou, Yi / Chen, Jianxin / Xu, Qingqing / He, Li et al. | 2012
-
Boron filling of high aspect ratio holes by chemical vapor deposition for solid-state neutron detector applicationsHuang, Kuan-Chih / Dahal, Rajendra / LiCausi, Nicolas / Lu, James J.-Q. / Danon, Yaron / Bhat, Ishwara B. et al. | 2012
-
In situ grown Ge in an arsenic-free environment for GaAs/Ge/GaAs heterostructures on off-oriented (100) GaAs substrates using molecular beam epitaxyHudait, Mantu K. / Zhu, Yan / Jain, Nikhil / Vijayaraghavan, Siddharth / Saha, Avijit / Merritt, Travis / Khodaparast, Giti A. et al. | 2012
-
Interface studies on high-k/GaAs MOS capacitors by deep level transient spectroscopyKundu, Souvik / Anitha, Yelagam / Chakraborty, Supratic / Banerji, Pallab et al. | 2012
-
Formation and morphological evolution of InAs quantum dots grown by chemical beam epitaxyZribi, Jihene / Morris, Denis / Arès, Richard et al. | 2012
-
Inductively coupled plasma deep etching of InP/InGaAsP in Cl2/CH4/H2 based chemistries with the electrode at 20 °CWieczorek, Andreas / Djara, Vladimir / Peters, Frank H. / O’Callaghan, James / Thomas, Kevin / Corbett, Brian et al. | 2012
-
193 nm excimer laser lift-off for AlGaN/GaN high electron mobility transistorsWang, Xiaotie / Lo, Chien-Fong / Liu, Lu / Cuervo, Camilo V. / Fan, Ren / Pearton, Stephen J. / Gila, Brent / Johnson, Michael R. / Zhou, Lin / Smith, David J. et al. | 2012
-
Effects of polarity and surface treatment on Ga- and N-polar bulk GaNFoussekis, Michael / Ferguson, Josephus D. / McNamara, Joy D. / Baski, Alison A. / Reshchikov, Michael A. et al. | 2012
- 51601
-
Lithography - Large contrast enhancement by sonication assisted cold development process for low dose and ultrahigh resolution patterning on ZEP520A positive tone resistTobing, Landobasa Y M et al. | 2012
-
Outgassing and photochemical studies of photosensitive films upon irradiation at 13.5 nmHo, Grace H. / Shao, Chih-H. / Sung, Jia-J. / Kang, Fu-H. / Kao, Chih-B. / Hung, Wei-L. / Chou, Yu-L. / Huang, Yen-H. et al. | 2012
-
Thermally reflowed ZEP 520A for gate length reduction and profile rounding in T-gate fabricationDowney, Brian P. / Meyer, David J. / Bass, Robert / Katzer, D. Scott / Binari, Steven C. et al. | 2012
-
Simulation study of cleaning induced extreme ultraviolet reflectivity loss mechanisms on mask blanksUpadhyaya, Mihir / Denbeaux, Gregory / Kadaksham, Arun John / Jindal, Vibhu / Jones, Jenah Harris / Lee, Byunghoon / Goodwin, Frank et al. | 2012
-
Mitigation of extreme ultraviolet mask defects by pattern shifting: Method and statisticsWagner, Alfred / Burkhardt, Martin / Clay, Alexander B. / Levin, James P. et al. | 2012
-
Scanned-spot-array extreme ultraviolet imaging for high-volume maskless lithographyJohnson, Kenneth C. et al. | 2012
- 51801
-
Nanometer Science & Technology - Influence of film thickness and deposition rate on surface quality of polyparylene coatingsSchamberger, Florian et al. | 2012
-
First-principles calculations and XPS measurements of gold segregation at the Cu3Au(111) surfaceDionízio Moreira, Marcos / Fontes, Giselle N. / Niehus, Horst / Achete, Carlos A. / Capaz, Rodrigo B. et al. | 2012
-
Void detection in copper interconnects using energy dispersive x-ray spectroscopyTsigkourakos, Menelaos / Vandervorst, Wilfried / Hantschel, Thomas / Franquet, Alexis / Conard, Thierry / Carbonell, Laureen et al. | 2012
-
ac heating–dc detecting method for Seebeck coefficient measurement of the thermoelectric micro/nano devicesMiao, Tingting / Ma, Weigang / Zhang, Xing et al. | 2012
-
Substrate temperature and electron fluence effects on metallic films created by electron beam induced depositionRosenberg, Samantha G. / Landheer, Kees / Hagen, Cornelis W. / Fairbrother, D. Howard et al. | 2012
-
Laser polishing of niobium for application to superconducting radio frequency cavitiesSingaravelu, Senthilraja / Klopf, J. Michael / Xu, Chen / Krafft, Geoffrey / Kelley, Michael J. et al. | 2012
-
Band alignment of zinc oxide as a channel layer in a gate stack structure grown by plasma enhanced atomic layer depositionZhu, Chiyu / Smith, David J. / Nemanich, Robert J. et al. | 2012
- 52201
-
Microelectronic & Nanoelectronic Devices - Characterization of enhancement-mode n-channel sulfur-treated InP MOSFET with liquid phase deposition-TiO2 gate oxideYen, Chih-Feng et al. | 2012
-
Formation of large-area GaN nanostructures with controlled geometry and morphology using top-down fabrication schemeParamanik, Dipak / Motayed, Abhishek / Aluri, Geetha S. / Ha, Jong-Yoon / Krylyuk, Sergiy / Davydov, Albert V. / King, Matthew / McLaughlin, Sean / Gupta, Shalini / Cramer, Harlan et al. | 2012
-
Cu film thermal stability on plasma cleaned polycrystalline RuLiu, Xin / Zhu, Chiyu / Eller, Brianna S. / Sun, Tianyin / Jezewski, Christopher J. / King, Sean W. / Nemanich, Robert J. et al. | 2012
-
Nanotechnology & Microelectronics: Materials, Processing, Measurement, and Phenomena| 2012
-
Creating nanoscale Ag patterns on the Si(111)–(√3 × √3)R30°-Ag surface via guided self-assemblyBelianinov, Alex / Ünal, Barış / Tringides, Michael C. / Thiel, Patricia A. et al. | 2012
-
Large contrast enhancement by sonication assisted cold development process for low dose and ultrahigh resolution patterning on ZEP520A positive tone resistTobing, Landobasa Y. M. / Tjahjana, Liliana / Zhang, Dao Hua et al. | 2012
-
Formation of high quality nano-crystallized Ge films on quartz substrates at moderate temperatureLi, Cong / Xu, Jun / Li, Wei / Sun, Shenghua / Jiang, Xiaofan / Chen, Kunji et al. | 2012
-
CUMULATIVE AUTHOR INDEX| 2012
-
Influence of film thickness and deposition rate on surface quality of polyparylene coatingsSchamberger, Florian / Ziegler, Astrid / Franz, Gerhard et al. | 2012
-
Interplay of native point defects with ZnO Schottky barriers and dopingBrillson, Leonard J. / Dong, Yufeng / Tuomisto, Filip / Svensson, Bengt G. / Kuznetsov, Andrei Yu. / Doutt, Daniel / Mosbacker, H. Lee / Cantwell, Gene / Zhang, Jizhi / Song, Jin Joo et al. | 2012
-
Characterization of enhancement-mode n-channel sulfur-treated InP MOSFET with liquid phase deposition-TiO2 gate oxideYen, Chih-Feng / Lee, Ming-Kwei et al. | 2012