Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr (Englisch)
- Neue Suche nach: Howald, L.
- Neue Suche nach: Lüthi, R.
- Neue Suche nach: Meyer, E.
- Neue Suche nach: Gerth, G.
- Neue Suche nach: Haefke, H.
- Neue Suche nach: Overney, R.
- Neue Suche nach: Güntherodt, H.‐J.
- Neue Suche nach: Howald, L.
- Neue Suche nach: Lüthi, R.
- Neue Suche nach: Meyer, E.
- Neue Suche nach: Gerth, G.
- Neue Suche nach: Haefke, H.
- Neue Suche nach: Overney, R.
- Neue Suche nach: Güntherodt, H.‐J.
In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
;
12
, 3
;
2227-2230
;
1994
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr
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Weitere Titelangaben:FFM on clean surfaces of NaCl, NaF, and AgBr
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Beteiligte:Howald, L. ( Autor:in ) / Lüthi, R. ( Autor:in ) / Meyer, E. ( Autor:in ) / Gerth, G. ( Autor:in ) / Haefke, H. ( Autor:in ) / Overney, R. ( Autor:in ) / Güntherodt, H.‐J. ( Autor:in )
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Erschienen in:
-
Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.05.1994
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 12, Ausgabe 3
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- 1809
-
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- 1813
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- 1823
-
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- 1827
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- 1835
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- 1843
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Atomic force microscopy study of Pd clusters on graphite and micaNie, H. Y. / Shimizu, T. / Tokumoto, H. et al. | 1994
- 1847
-
Nanostructure fabrication via direct writing with atoms focused in laser fieldsScholten, R. E. / McClelland, J. J. / Palm, E. C. / Gavrin, A. / Celotta, R. J. et al. | 1994
- 1851
-
Scanning tunneling microscope and tunneling stabilized magnetic force microscope characterization of magnetic nanocrystalline materialsNogués, J. / Rodell, B. / Rao, K. V. et al. | 1994
- 1856
-
Diamond‐coated tips and their applicationsLiu, N. / Ma, Z. / Chu, X. / Hu, T. / Xue, Z. / Pang, S. et al. | 1994
- 1860
-
Atomic force microscopy and friction force microscopy of Langmuir–Blodgett films for microlithographyFujihira, Masamichi / Takano, Hajime et al. | 1994
- 1866
-
Tunneling‐electron‐induced adsorption of pyridine on a hydrogen‐terminated silicon surfaceKomiyama, Masaharu / Kirino, Manabu et al. | 1994
- 1869
-
Construction of model supported metal catalysts for scanning tunneling microscopy examinations: Platinum ultrafine particles on silica and on aluminaKomiyama, Masaharu / Kirino, Manabu / Kurokawa, Hiroyuki et al. | 1994
- 1872
-
Formation of nanometer‐sized Au dots on Si substrate in airHosaka, Sumio / Koyanagi, Hajime / Kikukawa, Atsushi / Maruyama, Yohji / Imura, Ryou et al. | 1994
- 1876
-
Micromachining of metal surfaces by scanning probe microscopeSumomogi, T. / Endo, T. / Kuwahara, K. / Kaneko, R. / Miyamoto, T. et al. | 1994
- 1881
-
Surface characterization of flexible magnetic disk with scanning probe microscopyMasai, J. / Shibata‐Seki, T. / Seki, K. / Mori, K. / Yamauchi, H. / Sasaki, K. / Yoshiyama, R. / Yamamoto, M. et al. | 1994
- 1886
-
Surface structure of YBa2Cu3O7−x probed by reversed‐bias scanning tunneling microscopyEdwards, H. L. / Markert, J. T. / Lozanne, A. L. de et al. | 1994
- 1890
-
Manipulation of rectangular arrangement of Se‐ring‐type molecules on graphite (highly oriented pyrolytic graphite) surfacesCzajka, R. / Kasuya, A. / Horiguchi, N. / Nishina, Y. et al. | 1994
- 1894
-
Nanofabrication and rapid imaging with a scanning tunneling microscopeRubel, S. / Trochet, M. / Ehrichs, E. E. / Smith, W. F. / de Lozanne, A. L. et al. | 1994
- 1898
-
Scanning tunneling microscopy study of ZnS particles generated from a controlled chemical reactionWang, Dawen / Liu, Yanqiu / Xu, Guangzhi / Bai, Chunli et al. | 1994
- 1901
-
Time‐resolved atomic‐scale modification of silicon with a scanning tunneling microscopeGrey, F. / Huang, D. H. / Kobayashi, A. / Snyder, E. J. / Uchida, H. / Aono, M. et al. | 1994
- 1906
-
Interaction of C60 with the Au(111) 23×√3 reconstructionAltman, Eric I. / Colton, Richard J. et al. | 1994
- 1910
-
Formation of crystalline islands of C60 on Si(111)Chen, D. M. / Xu, H. / Creager, W. N. / Burnett, P. et al. | 1994
- 1914
-
Scanning tunneling microscopy of liquid crystals, perylene‐tetracarboxylic‐dianhydride, and phthalocyanineFreund, J. / Probst, O. / Grafström, S. / Dey, S. / Kowalski, J. / Neumann, R. / Wörtge, M. / Putlitz, G. zu et al. | 1994
- 1918
-
Scanning tunneling microscopy study of C60 adsorption on 2H–MoS2 (0001) surfaceChen, Ting / Sarid, Dror et al. | 1994
- 1923
-
Observation of the bottom surface of contact holes by hopping scanning atomic force microscopy with a ZnO whisker tipKado, Hiroyuki / Yamamoto, Shin‐ichi / Yokoyama, Kazuo / Tohda, Takao / Umetani, Yukihiro / Yano, Kohsaku et al. | 1994
- 1927
-
Molecular mechanics calculation and scanning tunneling microscopic research of polyaniline doped with perchlorateBai, C. / Zhu, C. F. / Zhang, P. C. / Yu, T. / Wang, F. S. et al. | 1994
- 1930
-
Scanning tunneling microscopy investigation of monolayer of metal complexes adsorbed on highly oriented pyrolytic graphiteMiyamura, Kazuo / Kimura, Masahiro / Okumura, Akihiko / Gohshi, Yohichi et al. | 1994
- 1932
-
Electronic states of C60 molecules on Si(001)2×1 and Si(111)7×7 surfacesYamaguchi, Tsuyoshi et al. | 1994
- 1936
-
Crystallization process of Langmuir–Blodgett films of octadecylthiobenzoquinoneGarnaes, J. / Bjo/rnholm, T. / Jo/rgensen, M. / Zasadzinski, J. A. et al. | 1994
- 1942
-
Scanning tunneling microscopy of ordered C60 and C70 layers on Au(111), Cu(111), Ag(110), and Au(110) surfacesGimzewski, J. K. / Modesti, S. / David, T. / Schlittler, R. R. et al. | 1994
- 1947
-
Scanning tunneling microscopy study of the adsorption of C60 molecules on Si(100)‐(2×1) surfacesChen, Dong / Gallagher, Mark J. / Sarid, Dror et al. | 1994
- 1952
-
Nanostructures or submicrostructures from gas/solid reactions as probed by atomic force microscopyKaupp, Gerd et al. | 1994
- 1957
-
Imaging molecular adsorbates: Resolution effects and determination of adsorption parametersChiang, S. / Hallmark, V. M. / Meinhardt, K.‐P. / Hafner, K. et al. | 1994
- 1963
-
Epitaxy and scanning tunneling microscopy image contrast of copper–phthalocyanine on graphite and MoS2Ludwig, C. / Strohmaier, R. / Petersen, J. / Gompf, B. / Eisenmenger, W. et al. | 1994
- 1967
-
Inhomogeneities of phase separated Langmuir–Blodgett films studied by atomic force microscopyChi, L. F. / Fuchs, H. / Johnston, R. R. / Ringsdorf, H. et al. | 1994
- 1973
-
Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopyOverney, R. M. / Bonner, T. / Meyer, E. / Rüetschi, M. / Lüthi, R. / Howald, L. / Frommer, J. / Güntherodt, H.‐J. / Fujihira, M. / Takano, H. et al. | 1994
- 1977
-
Structural study of a poly(methylmethacrylate) Langmuir–Blodgett film on a graphite surface by scanning tunneling microscopeHa, Jeong Sook / Roh, Hee‐Sook / Jung, Sang‐Don / Park, Seong‐Ju / Kim, Jang‐Joo / Lee, El‐Hang et al. | 1994
- 1981
-
Investigation of molecular chains structure of polyimide Langmuir–Blodgett films by atomic force microscopy*Yang, Xiao‐Min / Min, Guang‐Wei / Gu, Ning / Lu, Zu‐Hong / Wei, Yu et al. | 1994
- 1984
-
Scanning tunneling microscope investigation of semiconductor nanometer particlesMin, G. W. / Yang, X. M. / Lu, Z. H. / Yu, W. et al. | 1994
- 1988
-
Scanning probe microscopy and spectroscopy study of the organic salt (ET)2KHg(SCN)4Dubois, J. G. A. / Gerritsen, J. W. / van Kempen, H. / Campos, C. E. / Tibbitts, T. T. / Brooks, J. S. / Tokumoto, M. / Kinoshita, N. / Tanaka, Y. et al. | 1994
- 1992
-
C60 adsorption on the Si(100)2×1 and Cu(111)1×1 surfacesHashizume, T. / Sakurai, T. et al. | 1994
- 2000
-
Observation of vacuum‐deposited naphthalocyanine molecules using scanning tunneling microscopyManivannan, A. / Nagahara, L. A. / Yanagi, H. / Fujishima, A. et al. | 1994
- 2004
-
Scanning tunneling microscopy studies of self‐assembled monolayers of alkanethiols on goldStranick, S. J. / Kamna, M. M. / Krom, K. R. / Parikh, A. N. / Allara, D. L. / Weiss, P. S. et al. | 1994
- 2008
-
Scanning tunneling microscopy study of the reaction of AlCl3 with the Si(111) surfaceUesugi, K. / Takiguchi, T. / Yoshimura, M. / Yao, T. et al. | 1994
- 2012
-
Local atomic structures near the domain boundary between the Al‐√3×√3 and the 7×7 phases on Si(111): Substitutional defectsYoshimura, M. / Takaoka, K. / Yao, T. / Sueyoshi, T. / Sato, T. / Iwatsuki, M. et al. | 1994
- 2015
-
Scanning tunneling microscopy at low temperatures on the c(4×2)/(2×1) phase transition of Si(100)Badt, D. / Wengelnik, H. / Neddermeyer, H. et al. | 1994
- 2018
-
Scanning tunneling microscopy study of solid‐phase epitaxy processes of argon ion bombarded silicon surface and recovery of crystallinity by annealingUesugi, K. / Yoshimura, M. / Yao, T. / Sato, T. / Sueyoshi, T. / Iwatsuki, M. et al. | 1994
- 2022
-
Scanning tunneling microscopy/scanning tunneling spectroscopy study of Ge and Si dimers on Si substratesTomitori, Masahiko / Watanabe, Kōji / Kobayashi, Masato / Nishikawa, Osamu et al. | 1994
- 2026
-
Restructuring process of the Si(111) surface upon Ag deposition studied by in situ high‐temperature scanning tunneling microscopyShibata, A. / Kimura, Y. / Takayanagi, K. et al. | 1994
- 2030
-
Scanning tunneling microscopy of argon‐ion bombarded GaAs (001) surfacesOhkouchi, Shunsuke / Ikoma, Nobuyuki / Tanaka, Ichiro et al. | 1994
- 2033
-
Surface structures of InP and InAs thermally cleaned in an arsenic fluxOhkouchi, Shunsuke / Ikoma, Nobuyuki / Tanaka, Ichiro et al. | 1994
- 2037
-
Atomic force microscopy studies of polysilicon growth during deposition on siliconVatel, O. / André, E. / Chollet, F. / Dumas, P. / Salvan, F. et al. | 1994
- 2040
-
Early stages of Cu growth on boron segregated Si(111) surfaces: A scanning tunneling microscopy studyRoge, T. P. / Thibaudau, F. / Mathiez, Ph. / Dumas, Ph. / Salvan, F. et al. | 1994
- 2044
-
Scanning tunneling microscopy of alkali metal‐induced structures on the Si(111) surfaceJeon, D. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2049
-
Strain relief and ordering of (2×n)‐Bi structure on Si(100)Park, Ch. / Bakhtizin, R. Z. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2052
-
Atomic structure of Bi on the Si(111) surfaceBakhtizin, R. Z. / Park, Ch. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2055
-
Scanning tunneling microscopy/spectroscopy study of V2O5 surface with oxygen vacanciesOshio, Takanori / Sakai, Yoshiyuki / Ehara, Shaw et al. | 1994
- 2060
-
Scanning probe microscopy on the surface of Si(111)Meyer, E. / Howald, L. / Lüthi, R. / Haefke, H. / Rüetschi, M. / Bonner, T. / Overney, R. / Frommer, J. / Hofer, R. / Güntherodt, H.‐J. et al. | 1994
- 2064
-
Photon spectroscopy, mapping, and topography of 85% porous siliconDumas, Ph. / Gu, M. / Syrykh, C. / Hallimaoui, A. / Salvan, F. / Gimzewski, J. K. / Schlittler, R. R. et al. | 1994
- 2067
-
Nanostructuring of porous silicon using scanning tunneling microscopyDumas, Ph. / Gu, M. / Syrykh, C. / Hallimaoui, A. / Salvan, F. / Gimzewski, J. K. et al. | 1994
- 2070
-
Reconstructed structures in metal/Si(100) surfaces at high temperature observed by scanning tunneling microscopyIchinokawa, T. / Itoh, H. / Schmid, A. / Winau, D. / Kirschner, J. et al. | 1994
- 2074
-
Evolution of visible photoluminescence and surface morphology of ultrathin porous Si films imaged by scanning tunneling microscopy*Enachescu, M. / Hartmann, E. / Koch, F. et al. | 1994
- 2078
-
Dynamic observation of silicon homoepitaxial growth by high‐temperature scanning tunneling microscopyHasegawa, T. / Kohno, M. / Hosaka, S. / Hosoki, S. et al. | 1994
- 2082
-
Ag on Si(001)(2×1) formation of a 2×3 superstructureWinau, D. / Itoh, H. / Schmid, A. K. / Ichinokawa, T. et al. | 1994
- 2086
-
Growth mode and surface structures of the Pb/Si(001) system observed by scanning tunneling microscopyItoh, H. / Tanabe, H. / Winau, D. / Schmid, A. K. / Ichinokawa, T. et al. | 1994
- 2090
-
Au on the Si(001) surface: Room‐temperature growthLin, X. F. / Nogami, J. et al. | 1994
- 2094
-
Structure of nickel silicide on Si(001): An atomic viewKhang, Yoonho / Kahng, S. J. / Mang, K. M. / Jeon, D. / Lee, J. H. / Kim, Y. N. / Kuk, Y. et al. | 1994
- 2097
-
Adsorption of Bi on Si(001) surface: An atomic viewNoh, H. P. / Park, Ch. / Jeon, D. / Cho, K. / Hashizume, T. / Kuk, Y. / Sakurai, T. et al. | 1994
- 2100
-
Cross‐sectional scanning tunneling microscopy of semiconductor vertical‐cavity surface‐emitting laser structureZheng, J. F. / Ogletree, D. F. / Walker, J. / Salmeron, M. / Weber, E. R. et al. | 1994
- 2104
-
Si donors (SiGa) in GaAs observed by scanning tunneling microscopyZheng, J. F. / Liu, X. / Weber, E. R. / Ogletree, D. F. / Salmeron, M. et al. | 1994
- 2107
-
Fine structure of the GaAs(001) surfaceHaga, Y. / Miwa, S. / Morita, E. et al. | 1994
- 2111
-
Scanning tunneling microscopy and spectroscopy of MoS2 thin films prepared by an intercalation–exfoliation methodManivannan, Ayyakkannu / Santiago, Yolanda / Cabrera, Carlos R. et al. | 1994
- 2115
-
Spiral growth of GaAs by metalorganic vapor phase epitaxyHsu, C. C. / Lu, Y. C. / Xu, J. B. / Wong, T. K. S. / Wilson, I. H. et al. | 1994
- 2118
-
Wigner glass on the magnetite (001) surface observed by scanning tunneling microscopy with a ferromagnetic tipWiesendanger, R. / Shvets, I. V. / Coey, J. M. D. et al. | 1994
- 2122
-
Tunneling through an epitaxial oxide film: Al2O3 on NiAl(110)Bertrams, Th. / Brodde, A. / Neddermeyer, H. et al. | 1994
- 2125
-
Potential distribution measurement of thin InGaAs resistors using scanning tunneling potentiometryTanimoto, Masafumi / Arai, Kunihiro et al. | 1994
- 2129
-
Laser‐frequency mixing in a scanning force microscope and its application to detect local conductivityVölcker, M. / Krieger, W. / Walther, H. et al. | 1994
- 2133
-
Progress toward spin‐sensitive scanning tunneling microscopy using optical orientation in GaAsJansen, R. / van der Wielen, M. C. M. M. / Prins, M. W. J. / Abraham, D. L. / van Kempen, H. et al. | 1994
- 2136
-
Local transformation of C60 fullerite into a new amorphous phase of carbon using a scanning tunneling microscopeLang, H. P. / Wiesendanger, R. / Thommen‐Geiser, V. / Hofer, R. / Güntherodt, H.‐J. et al. | 1994
- 2140
-
Spatial variation of 1/f current noise in scanning tunneling microscopesMaeda, K. / Sugita, S. / Kurita, H. / Uota, M. / Uchida, S. / Hinomaru, M. / Mera, Y. et al. | 1994
- 2144
-
Matteucci effect of an amorphous alloy tip used for high‐density magnetic recording with a scanning tunneling microscopeTsuji, Satoshi / Watanuki, Osaaki et al. | 1994
- 2148
-
Inelastic processes in time dependent tunneling in a scanning tunneling microscope junctionMiskovsky, N. M. / Park, Sookyung H. / Cutler, P. H. / Sullivan, T. E. et al. | 1994
- 2153
-
Internal structure of C60 on Au(110) as observed by low‐temperature scanning tunneling microscopyGaisch, R. / Berndt, R. / Schneider, W.‐D. / Gimzewski, J. K. / Reihl, B. / Schlittler, R. R. / Tschudy, M. et al. | 1994
- 2156
-
Proposal to study the thermopower produced by a vacuum‐tunneling junctionXu, J. / Koslowski, B. / Möller, R. / Läuger, K. / Dransfeld, K. / Wilson, I. H. et al. | 1994
- 2161
-
Calculation of current contrasts in two‐terminals atomic switchesVigneron, J. P. / Derycke, I. et al. | 1994
- 2164
-
Microscopic theory of scanning tunneling microscope for finite electric field and currentHirose, Kenji / Tsukada, Masaru et al. | 1994
- 2167
-
Effects of the tip shape on scanning tunneling microscope images: First‐principles calculationsWatanabe, Satoshi / Aono, Masakazu / Tsukada, Masaru et al. | 1994
- 2171
-
Studies on the scanning tunneling microscopy images of adsorbates with the method of exciton dynamics and their applicationLi, Y. P. / Huang, Xintang / Zhang, Haifeng / Huang, Wenhao et al. | 1994
- 2175
-
Current characteristics for the scanning tunneling microscopeStamp, A. P. / McIntosh, G. C. / Liu, Xue‐Wen et al. | 1994
- 2179
-
Interpretation of atomic force microscopy images: The mica (001) surface with a diamond tip apexTang, H. / Joachim, C. / Devillers, J. et al. | 1994
- 2184
-
Simulation and visualization of scanning probe microscope imagingPingali, Gopal Sarma / Jain, Ramesh / Kong, Lai‐Cheng et al. | 1994
- 2189
-
Theory of scanning tunneling microscopyLiu, Xue‐Wen / Stamp, A. P. et al. | 1994
- 2193
-
Corrugation reversal in scanning tunneling microscopyChen, C. Julian et al. | 1994
- 2200
-
Theory of scanning tunneling microscopy of oxygen‐adsorbed Ag(110) and Cu(110) surfacesSchimizu, T. / Tsukada, M. et al. | 1994
- 2205
-
Theory of scanning tunneling microscopy and spectroscopy on hydrogen‐adsorbed Si(100) surfaceUchiyama, Toshihiro / Tsukada, Masaru et al. | 1994
- 2209
-
Influence of a ferromagnetic tip on the Abrikosov vortex lattice in NbSe2 studied by low‐temperature scanning tunneling microscopyBehler, S. / Pan, S. H. / Bernasconi, M. / Jess, P. / Hug, H. J. / Fritz, O. / Güntherodt, H.‐J. et al. | 1994
- 2211
-
Measurement of nanomechanical properties of metals using the atomic force microscopeHues, Steven M. / Draper, Charles F. / Colton, Richard J. et al. | 1994
- 2215
-
Atomic force microscope for chemical sensingNakagawa, Tohru / Ogawa, Kazufumi / Kurumizawa, Toshimitsu et al. | 1994
- 2219
-
Accounting for the stiffnesses of the probe and sample in scanning probe microscopy*Burnham, N. A. et al. | 1994
- 2222
-
Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imagingMontelius, L. / Tegenfeldt, J. O. / van Heeren, P. et al. | 1994
- 2227
-
Friction force microscopy on clean surfaces of NaCl, NaF, and AgBrHowald, L. / Lüthi, R. / Meyer, E. / Gerth, G. / Haefke, H. / Overney, R. / Güntherodt, H.‐J. et al. | 1994
- 2231
-
Study and control of molecule–surface interaction at the atomic level: Sb4 on Si(001)Mo, Y. W. et al. | 1994
- 2237
-
Investigation of scanning tunneling microscopy tunneling barrier signals in air and waterSong, J. P. / Mo/rch, K. A. / Carneiro, K. / Thölén, A. R. et al. | 1994
- 2243
-
Electric field influence on the observation of molecules with a scanning tunneling microscopeHörber, J. K. H. / Häberle, W. / Ruppersberg, P. / Niksch, M. / Smith, D. P. E. / Binnig, G. et al. | 1994
- 2247
-
Systematic studies on the growth process of superconducting YBa2Cu3O7−δ and Bi2Sr2CuOy thin films by scanning tunneling microscopyZhu, Xing / Xiong, G. C. / Liu, R. / Li, Y. J. / Lian, G. J. / Gan, Z. Z. et al. | 1994
- 2251
-
Measurement and manipulation of van der Waals forces in atomic‐force microscopyHutter, Jeffrey L. / Bechhoefer, John et al. | 1994