Magnetic susceptibility and microstructure of hydrogenated amorphous silicon measured by nuclear magnetic resonance on a single thin film (Englisch)
Nationallizenz
- Neue Suche nach: Baugh, Jonathan
- Neue Suche nach: Han, Daxing
- Neue Suche nach: Kleinhammes, Alfred
- Neue Suche nach: Wu, Yue
- Neue Suche nach: Baugh, Jonathan
- Neue Suche nach: Han, Daxing
- Neue Suche nach: Kleinhammes, Alfred
- Neue Suche nach: Wu, Yue
In:
Applied Physics Letters
;
78
, 4
;
466-468
;
2001
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Magnetic susceptibility and microstructure of hydrogenated amorphous silicon measured by nuclear magnetic resonance on a single thin film
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Beteiligte:Baugh, Jonathan ( Autor:in ) / Han, Daxing ( Autor:in ) / Kleinhammes, Alfred ( Autor:in ) / Wu, Yue ( Autor:in )
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Erschienen in:Applied Physics Letters ; 78, 4 ; 466-468
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Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:22.01.2001
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 78, Ausgabe 4
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