Catalytic hydrogenation activity of a ZrNi3 intermetallic alloy (Englisch)
- Neue Suche nach: Wright, R. B.
- Neue Suche nach: Jolley, J. G.
- Neue Suche nach: Owens, M. S.
- Neue Suche nach: Cocke, D. L.
- Neue Suche nach: Wright, R. B.
- Neue Suche nach: Jolley, J. G.
- Neue Suche nach: Owens, M. S.
- Neue Suche nach: Cocke, D. L.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
5
, 4
;
586-589
;
1987
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Catalytic hydrogenation activity of a ZrNi3 intermetallic alloy
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Weitere Titelangaben:Catalytic hydrogenation activity of a ZrNi3 intermetallic alloy
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Beteiligte:Wright, R. B. ( Autor:in ) / Jolley, J. G. ( Autor:in ) / Owens, M. S. ( Autor:in ) / Cocke, D. L. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.07.1987
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 5, Ausgabe 4
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- 405
-
History of the International Union for Vacuum Science, Technique, and ApplicationsLafferty, J. M. et al. | 1987
- 419
-
Surface vibrational studies with electron energy‐loss spectroscopyIbach, H. et al. | 1987
- 424
-
Theory of H bonding and vibration on close‐packed metal surfacesFeibelman, Peter J. / Hamann, D. R. et al. | 1987
- 427
-
Time dependence of the infrared spectrum of N2 adsorbed at low coverage on the Ni(110) surfaceBrubaker, Mary E. / Malik, Igor J. / Trenary, Michael et al. | 1987
- 431
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Vibrational excitation of physisorbed CO2 on a Ag(111) surfaceSakurai, M. / Okano, T. / Tuzi, Y. et al. | 1987
- 435
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High‐resolution low‐energy electron reflection from W(100) using the electron energy‐loss spectrometer: A step towards quantitative analysis of surface vibrational spectraWoods, J. P. / Erskine, J. L. et al. | 1987
- 440
-
Structure and dynamics of periodic and randomly distributed surface features by high resolution helium atom scatteringToennies, J. Peter et al. | 1987
- 448
-
Simple approximation to thermal attenuation in low‐energy atom–surface scatteringManson, J. R. / Armand, G. et al. | 1987
- 452
-
Summary Abstract: Correlation of surface resonances with nondipole excitations of hydrogen on Pd surfacesConrad, H. / Kordesch, M. E. / Stenzel, W. / Sunjic, M. et al. | 1987
- 453
-
Summary Abstract: Vibrational modes of hydrogen adsorbed on Rh(100) and their relevance to desorption kineticsRichter, Lee J. / Ho, W. et al. | 1987
- 454
-
Summary Abstract: The vibrational line shapes of CO on Pt(111) studied by infrared emission spectroscopyTobin, R. G. / Richards, P. L. et al. | 1987
- 455
-
Summary Abstract: Multiple CO bonding states on potassium‐dosed Cu(100)Dubois, L. H. / Zegarski, B. R. / Luftman, H. S. et al. | 1987
- 457
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Summary Abstract: The influence of potassium on ethylene adsorption and decomposition on Pt(111)Windham, R. G. / Bartram, M. E. / Koel, B. E. et al. | 1987
- 459
-
Summary Abstract: Nitric oxide adsorption on Ru(001) at 78 and 120 K: Temperature dependence on the bonding geometrySchwalke, Udo / Weinberg, W. H. et al. | 1987
- 460
-
Summary Abstract: He atom beam scattering from W(001)/HErnst, H.‐J. / Hulpke, E. et al. | 1987
- 462
-
Summary Abstract: First principles calculation of surface phonons on Al surfacesBohnen, K. P. / Ho, K. M. et al. | 1987
- 464
-
Investigations of adsorption on Pt and Rh by laser‐induced desorptionSeebauer, E. G. / Kong, A. C. F. / Schmidt, L. D. et al. | 1987
- 469
-
Vibrational relaxation of adsorbed molecules: Comparison with relaxation rates of model compoundsCavanagh, R. R. / Casassa, M. P. / Heilweil, E. J. / Stephenson, J. C. et al. | 1987
- 473
-
Electronically excited photodissociation and desorption of molecules on surfacesChuang, T. J. / Domen, K. et al. | 1987
- 476
-
Dynamical processes at surfacesHolloway, S. et al. | 1987
- 485
-
Dissociative chemisorption of H2 on Ni surfaces: Incident kinetic energy dependence and the characteristics of the potential energy surfaceLee, Chyuan‐Yih / DePristo, Andrew E. et al. | 1987
- 488
-
Adsorption kinetics of H2/Ni and its dependence on surface structure, surface impurities, gas temperature, and angle of incidenceRendulic, K. D. / Winkler, A. / Karner, H. et al. | 1987
- 492
-
Dynamics of dissociative adsorption and vibrational excitation in molecule–surface collisionsGadzuk, J. W. et al. | 1987
- 496
-
Molecular‐beam scattering of O2 and Ar from Ag(111)Spruit, M. E. M. / Kuipers, E. W. / Tenner, M. G. / Kimman, J. / Kleyn, A. W. et al. | 1987
- 501
-
Effect of translational and vibrational energy on adsorption: The dynamics of molecular and dissociative chemisorptionCeyer, S. T. / Beckerle, J. D. / Lee, M. B. / Tang, S. L. / Yang, Q. Y. / Hines, M. A. et al. | 1987
- 508
-
Dynamics of gas–surface energy transfer: Inelastic scattering of NO from Ag(111)Rettner, C. T. / Kimman, J. / Fabre, F. / Auerbach, D. J. / Barker, J. A. / Tully, J. C. et al. | 1987
- 513
-
Population and alignment of N2 scattered from Ag(111)Sitz, Greg O. / Kummel, Andrew C. / Zare, Richard N. et al. | 1987
- 518
-
Summary Abstract: The decomposition kinetics of methanol on Ru(001) studied using laser induced thermal desorptionDeckert, A. A. / Brand, J. L. / Mak, C. H. / Koehler, B. G. / George, S. M. et al. | 1987
- 519
-
Summary Abstract: Surface photofragmentation of physisorbed CH3Br on Ni(111)Marsh, Eugene P. / Tabares, Francisco L. / Schneider, Mark R. / Cowin, James P. et al. | 1987
- 520
-
Summary Abstract: The dynamics of alkane activation on Ni(100) and Ir(110)Hamza, A. V. / Steinrück, H.‐P. / Madix, R. J. et al. | 1987
- 522
-
Summary Abstract: The dynamics of scattering and formation of NO at Ge surfacesMödl, A. / Budde, F. / Gritsch, T. / Chuang, T. J. / Ertl, G. et al. | 1987
- 523
-
Summary Abstract: Studies of OH radical formation in the H2+O2 reaction on noble‐metal catalystsHall, J. / Kasemo, B. / Ljungström, S. / Rosén, A. / Wahnström, T. et al. | 1987
- 525
-
Summary Abstract: Time‐resolved study of oxygen reaction on Si(100) surfaces using pulsed molecular beam reactive scatteringYu, Ming L. / Eldridge, Benjamin N. et al. | 1987
- 527
-
Thermodynamic and kinetic parameters of molecular nitrogen adsorption on Fe{111}Grunze, M. / Strasser, G. / Golze, M. / Hirschwald, W. et al. | 1987
- 535
-
Measurements of weakly bound hydrogen on Pd(111) between 5 and 80 KStulen, Richard H. / Kubiak, Glenn D. et al. | 1987
- 538
-
Summary Abstract: The kinetics of CO dissociation on Fe(111)Whitman, L. J. / Gurney, B. A. / Richter, L. J. / Villarrubia, J. S. / Ho, W. et al. | 1987
- 539
-
Summary Abstract: Bonding of oxygenated fluorocarbons to metal surfaces: Steric effects versus electronic effectsWalczak, M. M. / Leavitt, P. K. / Thiel, P. A. et al. | 1987
- 541
-
Photoemission study of nitric oxide adsorption on (110) gallium arsenideBermudez, V. M. / Williams, R. T. / Long, J. P. / Rife, J. C. / Wilson, R. M. / Tuttle, A. E. / Williams, G. P. et al. | 1987
- 546
-
Reflectance–difference spectroscopy of (110) GaAs and InPAspnes, D. E. / Studna, A. A. et al. | 1987
- 550
-
Occupied and empty surface states of monocrystalline (100) aluminum studied by low electron energy‐loss spectroscopy and inverse photoemissionGautier, M. / Marteaux, E. / Duraud, J. P. / Baptist, R. / Brénac, A. / Spanjaard, D. et al. | 1987
- 555
-
Bulk and surface optical absorption in molybdenum disulfideRoxlo, C. B. / Chianelli, R. R. / Deckman, H. W. / Ruppert, A. F. / Wong, P. P. et al. | 1987
- 558
-
Entropy‐driven surface segregation of Pt in PtRh alloysvan Langeveld, A. D. / Niemantsverdriet, J. W. et al. | 1987
- 562
-
Electron stimulated desorption of H+, O+, and OH+ from H2O adsorbed on niobiumRey, S. / Román, E. / de Segovia, J. L. et al. | 1987
- 568
-
High‐coverage surface phases of tellurium on Ni(111)Samanta, P. / Unertl, W. N. et al. | 1987
- 572
-
The mechanism and kinetics of the oxidation of Cr(100) single‐crystal surfaces studied by reflection high‐energy electron diffraction, x‐ray emission spectroscopy, and secondary ion mass spectrometry/Auger sputter depth profilingArlow, J. S. / Mitchell, D. F. / Graham, M. J. et al. | 1987
- 577
-
The gettering theory approach to reactive scattering on surfacesBrivio, G. P. / Grimley, T. B. et al. | 1987
- 581
-
A description of the high‐pressure ammonia synthesis reaction based on surface scienceStoltze, P. / No/rskov, J. K. et al. | 1987
- 586
-
Catalytic hydrogenation activity of a ZrNi3 intermetallic alloyWright, R. B. / Jolley, J. G. / Owens, M. S. / Cocke, D. L. et al. | 1987
- 590
-
Oxygen induced surface segregation of Fe in Fe–18Cr–3Mo(100)Polak, M. / Schiffmann, B. et al. | 1987
- 593
-
X‐ray photoelectron spectroscopy and Auger studies of selected Zr/Ni intermetallic alloy catalystsWright, R. B. / Hankins, M. R. / Owens, M. S. / Cocke, D. L. et al. | 1987
- 598
-
Surface characterization of clean polyimide films by high‐resolution electron energy‐loss spectroscopyPireaux, J. J. / Gregoire, C. / Thiry, P. A. / Caudano, R. / Clarke, T. C. et al. | 1987
- 603
-
Investigation of InAs and GaSb by high‐resolution electron energy‐loss spectroscopyThiry, P. A. / Longueville, J. L. / Pireaux, J. J. / Caudano, R. / Munekata, H. / Liehr, M. et al. | 1987
- 607
-
Lattice location of chemisorbed bromine on Si(111) thin crystal by mega‐electron‐volt 4He+ transmission channelingCheng, H.‐S. / Luo, Li / Okamoto, Masako / Thundat, T. / Hashimoto, Shin / Gibson, W. M. et al. | 1987
- 611
-
Surface disorder induced Kikuchi features in reflection high‐energy electron diffraction patterns of static and growing GaAs(001) filmsLarsen, P. K. / Meyer‐Ehmsen, G. / Bölger, B. / Hoeven, A.‐J. et al. | 1987
- 615
-
Atomic steps on Si(100) surfacesMartin, J. A. / Aumann, C. E. / Savage, D. E. / Tringides, M. C. / Lagally, M. G. / Moritz, W. / Kretschmar, F. et al. | 1987
- 619
-
Filled and empty states of H:GaAs(110) through electron energy‐loss and photoemission spectroscopiesNannarone, S. / Astaldi, C. / Sorba, L. / Colavita, E. / Calandra, C. et al. | 1987
- 623
-
Photoemission extended x‐ray absorption fine structure of oxidized Al filmsKim, S. T. / Choudhary, K. M. / Shah, S. N. / Lee, J. H. / Rothberg, G. M. / denBoer, M. L. / Williams, G. P. et al. | 1987
- 627
-
Summary Abstract: Simulation of photoactive semiconductor/electrolyte interfaces in the ultrahigh vacuum by adsorption of H2O and halogens on layered semiconductorsJaegermann, W. / Schmeisser, D. et al. | 1987
- 628
-
Summary Abstract: Chemisorption of silanes on the Si(111)‐(7×7) surfaceGates, S. M. / Scott, B. A. / Beach, D. B. / Imbihl, R. / Demuth, J. E. et al. | 1987
- 630
-
Summary Abstract: Interpretation of Auger line shapes on systems with half‐filled valence bandsRamaker, D. E. / Hutson, F. L. et al. | 1987
- 631
-
Summary Abstract: Core‐level binding energies of surface atoms in ordered binary alloys obtained from ordered bimetallic surfacesGraham, G. W. et al. | 1987
- 632
-
Summary Abstract: Formate production from coadsorbed CO, H2O, and O on Rh(100)Gurney, Bruce A. / Ho, W. et al. | 1987
- 634
-
Summary Abstract: The chemisorption of organosulfur compounds on gold surfaces: Construction of well‐defined organic solidsDubois, L. H. / Zegarski, B. R. / Nuzzo, R. G. et al. | 1987
- 635
-
Summary Abstract: Electronic factors in thiophene adsorption and hydrodesulfurization on MoS2 surfacesZonnevylle, Marjanne C. / Hoffmann, Roald et al. | 1987
- 637
-
Summary Abstract: A theoretical analysis of the deactivation of metal surfaces upon carburizationJansen, S. A. / Hoffmann, R. et al. | 1987
- 640
-
Summary Abstract: The oxidation of carbon monoxide on the Pt(110)‐(1×2) surface: The influence of the adlayer composition on the reaction dynamicsEngstrom, J. R. / Weinberg, W. H. et al. | 1987
- 642
-
Summary Abstract: Adsorption and reaction of oxygen on Si(100): A modulated molecular beam and time‐resolved x‐ray photoelectron spectroscopy studyD’Evelyn, Mark P. / Nelson, Mark M. / Engel, Thomas et al. | 1987
- 644
-
Summary Abstract: The effect of premelting studied by molecular dynamicsSchommers, W. / von Blanckenhagen, P. et al. | 1987
- 646
-
Summary Abstract: The interaction of nonaqueous solvents with alkali metal surfacesHerrera‐Fierro, Pilar / Scherson, D. A. / Chottiner, G. S. et al. | 1987
- 647
-
Summary Abstract: Structure factors of two‐dimensional lattice gases: Theoretical investigation of some aspects of the capability of low‐energy electron diffraction to measure critical phenomena of surface phase transitionsEinstein, T. L. / Bartelt, N. C. / Roelofs, L. D. et al. | 1987
- 649
-
Summary Abstract: Temperature dependence of the structure of the Al(110) surfacevon Blanckenhagen, P. / Schommers, W. / Voegele, V. et al. | 1987
- 650
-
Summary Abstract: Surface segregation and low‐temperature oxidation of Ni–Cr alloysJeng, S.‐P. / Holloway, P. H. / Batich, C. D. / Hofmann, S. et al. | 1987
- 651
-
Summary Abstract: Soft x‐ray photoemission studies of CO on Pt3Ti(111) and Pt(111)Cameron, S. D. / Dwyer, D. J. et al. | 1987
- 653
-
Summary Abstract: On the geometric and electronic structure of K on Si(100)2×1Oellig, E. M. / Miranda, R. et al. | 1987
- 654
-
Summary Abstract: Low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy studies of (511) and (711) GaAs surfacesYoung, K. / Kahn, A. et al. | 1987
- 656
-
Summary Abstract: Rainbow scattering, charge exchange, and implantation of Na on Ag(111)Horn, T. C. M. / Haochang, Pan / Kleyn, A. W. et al. | 1987
- 657
-
Summary Abstract: Momentum resolved inverse photoemission and total current spectra of W(110)Funnemann, D. / Merz, H. et al. | 1987
- 658
-
Summary Abstract: Off‐normal and azimuthal photoelectron diffraction studies of the system C(2×2)S–Ni(001) by the multiple‐scattering methodTang, Jing‐Chang et al. | 1987
- 660
-
Summary Abstract: C–S bond activation on Mo(110)Roberts, Jeffrey T. / Friend, C. M. et al. | 1987
- 661
-
Summary Abstract: X‐ray photoelectron diffraction with high angular resolutionOsterwalder, J. / Stewart, E. / Saiki, R. / Cyr, D. / Fadley, C. S. et al. | 1987
- 664
-
Alkali overlayers on aluminum, alumina, and aluminum carbidePaul, J. et al. | 1987
- 671
-
Coverage dependence in the electron‐stimulated desorption of neutral NO from Pt(111)Burns, A. R. / Jennison, D. R. / Stechel, E. B. et al. | 1987
- 675
-
A theoretical study of CO on NiAl(110) and (111) surfaces using cluster modelsTatar, R. C. / Messmer, R. P. et al. | 1987
- 679
-
Electronic structure of cesium adsorbed on Al(111)Hohlfeld, A. / Sunjic, M. / Horn, K. et al. | 1987
- 684
-
The rehybridization of CO with K coadsorption on Ru(001)Jennison, D. R. et al. | 1987
- 688
-
Summary Abstract: Studies of the interaction of CO with the interface states for strained‐layer Cu on Ru(0001)Houston, J. E. / Peden, C. H. F. / Feibelman, P. J. / Hamann, D. R. et al. | 1987
- 689
-
Summary Abstract: Adsorption and reaction of SO2 on titanium oxide surfacesSmith, Kevin E. / Mackay, Janet L. / Henrich, Victor E. et al. | 1987
- 690
-
Summary Abstract: Second‐harmonic generation of adsorbates/Ag(110)Heskett, D. / Song, K.‐J. / Urbach, L. / Plummer, E. W. / Burns, A. / Dai, H.‐L. et al. | 1987
- 692
-
Summary Abstract: Structural and electronic properties of monolayer p(1×1) Si on W(001)Hong, Soon C. / Fu, C. L. / Freeman, A. J. et al. | 1987
- 692
-
Summary Abstract: Coadsorption structures of benzene and carbon monoxide on Rh(111) and Pt(111) by high‐resolution electron energy loss spectroscopy and low‐energy electron diffractionVan Hove, M. A. / Lin, R. F. / Ogletree, D. F. / Blackman, G. S. / Mate, C. M. / Somorjai, G. A. et al. | 1987
- 694
-
Summary Abstract: Evidence for subsurface carbon on Mo(111) by low energy alkali ion scatteringOverbury, S. H. et al. | 1987
- 695
-
Summary Abstract: Local density functional theory of alkali adsorption on transition metal surfaces: Work function lowering and catalytic promotionWimmer, E. / Chubb, S. R. / Fu, C.‐L. / Freeman, A. J. et al. | 1987
- 696
-
Summary Abstract: H2O adsorption on clean and oxygen‐dosed stepped Ni(s)(111)Benndorf, Carsten / Nöbl, Christa et al. | 1987
- 698
-
Summary Abstract: Theoretical picture of the adsorption of H2 on metal surfacesHarris, J. / Andersson, S. / Nordlander, P. / Holmberg, C. et al. | 1987
- 700
-
Summary Abstract: Heats of adsorption of atomic C, N, and O on Ni(100) and Cu(100) from a (Z+1) core‐level shift analysisEgelhoff, W. F. et al. | 1987
- 701
-
Summary Abstract: The interaction of NO with a metal surface: NO/Cu(100)Bagus, P. S. / Nelin, C. J. / Avouris, Ph. et al. | 1987
- 703
-
Discrimination between domain wall and uniformly incommensurate structures by surface extended x‐ray absorption fine structure: Adsorption of chlorine on Ag{110}Holmes, D. J. / Panagiotides, N. / Dus, R. / Norman, D. / Lamble, G. M. / Barnes, C. J. / Della Valle, F. / King, D. A. et al. | 1987
- 708
-
Summary Abstract: Energetics of surface roughening: A comparison of step formation on Ni(100), Ni(113), and Ni(115)Conrad, Edward H. / Allen, Lynn R. / Blanchard, David L. / Engel, Thomas et al. | 1987
- 709
-
Summary Abstract: Grazing incidence x‐ray crystallography from surfaces and interfacesAls‐Nielsen, J. et al. | 1987
- 710
-
Summary Abstract: Incommensurate phases of H2, HD, and D2 monolayers on graphiteCui, Jinhe / Fain, Samuel C. et al. | 1987
- 711
-
Summary Abstract: Low‐energy electron diffraction studies of incommensurate xenon layers on Cu(110)Berndt, Werner et al. | 1987
- 713
-
An ion scattering spectroscopy and temperature‐programed desorption study of the interaction of N2 with Si(111)Corallo, Cheryl F. / Hoflund, Gar B. et al. | 1987
- 718
-
Adsorption of CO on Fe, Cu, and Cu–Fe surface alloysGijzeman, O. L. J. / Vink, T. J. / van Pruissen, O. P. / Geus, J. W. et al. | 1987
- 722
-
Summary Abstract: Adsorption and interaction of O2, H2O, and CO on the NiO(100) surfaceMcKay, Jeffrey M. / Henrich, Victor E. et al. | 1987
- 723
-
Summary Abstract: On the difference of NO chemisorption on W(100) and (110)Miki, H. / Kawana, A. / Kioka, T. / Sugai, S. / Kawasaki, K. et al. | 1987
- 724
-
Summary Abstract: Infrared reflection absorption spectroscopy at high pressures: CO/H on single‐crystal Ru(001)Hoffmann, F. M. / Robbins, J. L. et al. | 1987
- 725
-
Summary Abstract: The desorption of simple gases from small platinum particlesAltman, E. I. / Gorte, R. J. et al. | 1987
- 727
-
Image potential at metal surfacesOssicini, Stefano / Bertoni, C. M. et al. | 1987
- 731
-
Two‐photon photoelectron spectroscopy of Pd(111)Kubiak, Glenn D. et al. | 1987
- 735
-
Inverse photoemission studies of the (100) surface of tungsten: Clean and with adsorbed submonolayers of hydrogenKrainsky, Isay L. et al. | 1987
- 739
-
Summary Abstract: Observation of final‐state screening in inverse photoemission from adsorbed xenon layersHorn, K. / Frank, K.‐H. / Wilder, J. / Reihl, B. et al. | 1987
- 740
-
Summary Abstract: Magnetic order at (100)p(1×1) surfaces of bulk and thin‐film vanadiumRau, C. / Liu, C. / Xing, G. / Jin, C. et al. | 1987
- 742
-
The reconstruction and relaxation of Ir(110) and Au(110) surfacesCopel, M. / Fenter, P. / Gustafsson, T. et al. | 1987
- 747
-
Field ion microscope observations of the reconstruction of platinum and iridium surfacesKellogg, G. L. et al. | 1987
- 751
-
Surface structure determination using alkali and noble gas ion scatteringNiehus, H. et al. | 1987
- 757
-
Iridium surface reconstruction: A field ion microscopy studyMüller, K. / Witt, J. / Schütz, O. et al. | 1987
- 761
-
Direct observation of atomic steps and atomic structures in the reconstruction of Pt and Ir surfacesGao, Q. J. / Tsong, T. T. et al. | 1987
- 766
-
Summary Abstract: The elastic properties and the reconstruction of Au and Pt (011) surfacesDregia, S. A. / Bauer, C. L. / Wynblatt, P. et al. | 1987
- 768
-
The effect of interaction range on the W(001) surface reconstruction phase transitionRoelofs, Lyle D. / Wendelken, J. F. et al. | 1987
- 771
-
Theory of the W(100) surface reconstruction and hydrogen adsorption effectsSugibayashi, T. / Hara, M. / Yoshimori, A. et al. | 1987
- 777
-
Impact of step edges on W(001) surface reconstructionZuo, J.‐K. / Lu, T.‐M. / Wang, G.‐C. / Wendelken, J. F. et al. | 1987
- 782
-
Removal of surface relaxation of Cu(110) by hydrogen adsorptionBaddorf, A. P. / Lyo, I.‐W. / Plummer, E. W. / Davis, H. L. et al. | 1987
- 787
-
Electronically driven reconstruction of TaC(100)Noonan, J. R. / Davis, H. L. / Gruzalski, G. R. et al. | 1987
- 790
-
Summary Abstract: Helium scattering from W(001)Elliott, G. / Jonsson, H. / Miller, D. R. et al. | 1987
- 791
-
Summary Abstract: Reconstruction, adsorbate bonding, and desorption kinetics of H/Mo(100)Prybyla, J. A. / Estrup, P. J. / Chabal, Y. J. et al. | 1987
- 793
-
Summary Abstract: Strong vertical intralayer distortions as a key structural feature in the (1×2)H reconstructed Ni(110) surfaceKleinle, G. / Behm, R. J. / Ertl, G. / Moritz, W. / Penka, V. et al. | 1987
- 794
-
Summary Abstract: Potassium on Ni(110) and Au(110): Adlayer ordering and/or surface reconstructionFlynn, D. K. / Jamison, K. D. / Thiel, P. A. / Ertl, G. / Behm, R. J. et al. | 1987
- 796
-
Summary Abstract: Influence of atomic corrugations on alkali chemisorptionShinn, Neal D. / Szuromi, Phillip D. et al. | 1987
- 798
-
Investigation of oxidation of CO on Pd with a mixed molecular beamXi, Guangkang / Shao, Jun / Shao, Shumin / Li, Shenglin / He, Tianxi / Wang, Junrong et al. | 1987
- 801
-
Real‐time study of self‐sustained oscillations in the CO oxidation rate on PtBurrows, V. A. / Sundaresan, S. / Chabal, Y. J. et al. | 1987
- 805
-
Synchrotron radiation photoemission studies of CO chemisorption on Pt/Ta(110) and Ni/Ta(110)Ruckman, M. W. / Strongin, Myron / Pan, Xiaohe et al. | 1987
- 810
-
Surface science studies of the water–gas shift reaction on a model Cu(111) catalystCampbell, Charles T. / Koel, Bruce E. / Daube, K. A. et al. | 1987
- 814
-
An elastic recoil detection analysis investigation of the temperature dependence of the adsorption of ethylene and acetylene on Pt(111)Yu, R. / Gustafsson, T. et al. | 1987
- 818
-
Summary Abstract: The low‐temperature reactivity of Si(100) with NH3 and NO: Rate determining steps and rate enhancement via electronic excitationsBozso, F. / Avouris, Ph. et al. | 1987
- 819
-
Summary Abstract: Oxygen coverage dependence in the water forming reaction from ammonia and hydrogen on a palladium surfacePetersson, L.‐G. / Fogelberg, J. / Dannetun, H. / Lundström, I. et al. | 1987
- 820
-
Summary Abstract: Photoenhancement of the catalytic methanation reactionMoshfegh, A. Z. / Ignatiev, A. et al. | 1987
- 821
-
Summary Abstract: Oscillations of CO oxidation on Pt(210)Ehsasi, M. / Block, J. H. / Christmann, K. / Hirschwald, W. et al. | 1987
- 823
-
Summary Abstract: The catalytic, structural, and electronic properties of Cu on Ru(0001)Goodman, D. W. / Houston, J. E. / Peden, C. H. F. et al. | 1987
- 824
-
Summary Abstract: The effects of aluminum oxide on the ammonia synthesis over iron single crystalsStrongin, D. R. / Bare, S. R. / Somorjai, G. A. et al. | 1987
- 825
-
Summary Abstract: The hydrogenolysis of alkanes over single‐crystalline surfaces of iridium: The influence of surface structure on the catalytic selectivityEngstrom, J. R. / Goodman, D. W. / Weinberg, W. H. et al. | 1987
- 828
-
Summary Abstract: Evidence for unusual dissociative adsorption of benzene on Ru(001)Polta, J. A. / Thiel, P. A. et al. | 1987
- 829
-
Summary Abstract: Reactions of n‐butane on clean and carbided W(100)Liu, A. C. / Friend, C. M. et al. | 1987
- 831
-
Summary Abstract: Ethylene adsorption on (5×20) and (1×1) Pt(100)Hatzikos, G. H. / Masel, R. I. et al. | 1987
- 834
-
Atomic structure of GaAs(100)‐(2×1) and (2×4) reconstructed surfacesChadi, D. J. et al. | 1987
- 838
-
Imaging electronic surface states in real space on the Si(111) 2×1 surfaceStroscio, Joseph A. / Feenstra, R. M. / Fein, A. P. et al. | 1987
- 842
-
Adsorption of H2O on planar and stepped Si(100): Structural aspectsLarsson, C. U. S. / Johnson, A. L. / Flodström, A. / Madey, T. E. et al. | 1987
- 847
-
Reaction and structure of Ti on Si probed by surface extended energy‐loss fine structure and extended appearance potential fine structureIdzerda, Y. U. / Williams, E. D. / Einstein, T. L. / Park, R. L. et al. | 1987
- 852
-
The effect of alkali metals on the interaction of O2 and CO with some transition‐metal surfacesKiskinova, M. et al. | 1987
- 858
-
Interaction of boron with Mo(100) and its effect on surface chemistryFryberger, T. B. / Grant, J. L. / Stair, P. C. et al. | 1987
- 863
-
Summary Abstract: Interaction of NO with potassium and boron contaminated Rh surfacesBugyi, L. / Kiss, J. / Solymosi, F. et al. | 1987
- 864
-
Summary Abstract: The adsorption of simple molecules (H2, O2, CO) on Mn/Ru(001) surfacesHrbek, Jan et al. | 1987
- 865
-
Summary Abstract: Effects of sulfur on the kinetics of methoxy decomposition on Ni(111)Hall, R. B. / DeSantolo, A. M. / Grubb, S. G. et al. | 1987
- 867
-
Summary Abstract: The influence of sulfur on methanation over W(110)Szuromi, P. D. / Kelley, R. D. / Madey, T. E. et al. | 1987
- 869
-
Structural characterization of surfaces by extended energy‐loss fine‐structure spectroscopyDe Crescenzi, Maurizio et al. | 1987
- 875
-
Thermal desorption of strained monoatomic Ag and Au layers from Ru(001)Niemantsverdriet, J. W. / Dolle, P. / Markert, K. / Wandelt, K. et al. | 1987
- 879
-
Study of polycrystalline boron and boron‐containing metallic glasses by surface extended energy‐loss fine structureFei, L. / Zheng, Y. / Zhang, Q. J. / Hua, Z. Y. et al. | 1987
- 882
-
Surface electronic behavior of face‐centered‐cubic iron on copperFernando, Gayanath W. / Lee, Y. C. / Montano, Pedro A. / Cooper, Bernard R. / Moog, E. R. / Naik, H. M. / Bader, S. D. et al. | 1987
- 887
-
Summary Abstract: A multitechnique study of surface segregation of Sn on the (111) surface of an Fe–1.3 at. % Sn crystalHsiao, R. / McMahon, C. J. / Plummer, E. W. / Buck, T. M. et al. | 1987
- 888
-
Summary Abstract: Helium scattering study of the initial stages of growth of Pb overlayers on Cu(100)Sánchez, A. / de Miguel, J. J. / Ibáñez, J. / Miranda, R. / Ferrer, S. et al. | 1987
- 889
-
Summary Abstract: Calculation of the surface segregation of Pd–Cu, Pd–Ag, and Pd–Au alloysFoiles, Stephen M. et al. | 1987
- 892
-
Surface phase transitionsThiry, P. / Jezequel, G. / Petroff, Y. et al. | 1987
- 898
-
Inverse photoemission study of the Si(100)‐(2×1) K surfaceBatra, Inder P. / Nicholls, J. M. / Reihl, B. et al. | 1987
- 902
-
Roughness effect upon oxygen adsorption on Si(100) surfacesAndriamanantenasoa, I. / Lacharme, J. P. / Sébenne, C. A. et al. | 1987
- 906
-
Theoretical calculations for the dimer–adatom–stacking‐fault model of Si(111)‐7×7 surfaceQian, Guo‐Xin / Chadi, D. J. et al. | 1987
- 910
-
Electronic structure of oxygen vacancies on TiO2(110) and SnO2(110) surfacesMunnix, S. / Schmeits, M. et al. | 1987
- 914
-
Adsorption site identification in surface extended x‐ray absorption fine structureCrapper, M. D. / Woodruff, D. P. et al. | 1987
- 919
-
Near edge x‐ray absorption fine‐structure studies of molecules and molecular chains bonded to surfacesStöhr, J. / Outka, D. A. et al. | 1987
- 927
-
Adsorbate orientation on platinum by polar‐angle x‐ray photoelectron diffractionWesner, D. A. / Coenen, F. P. / Bonzel, H. P. et al. | 1987
- 932
-
Surface structures for the O/Ni(001) system from c(2×2)O to saturated NiOSaiki, R. / Kaduwela, A. / Osterwalder, J. / Sagurton, M. / Fadley, C. S. / Brundle, C. R. et al. | 1987
- 936
-
Time‐dependent local‐density‐response theory for strongly charged metal surfacesGies, P. / Gerhardts, R. R. et al. | 1987
- 941
-
Adsorption of metal cations from aqueous solution onto tin oxide thin filmsTarlov, Michael J. / Evans, John F. et al. | 1987
- 944
-
Effect of chemisorbed sulfur on the electrochemical hydrogen adsorption and recombination reactions on Pt (111)Protopopoff, E. / Marcus, P. et al. | 1987
- 948
-
Structure‐property relations for surface processes at the metal/solution interfaceRoss, Philip N. et al. | 1987
- 954
-
Summary Abstract: Coadsorption of water and oxygen on Ag(110): A study of the interactions among H2O, OH, and OBange, K. / Madey, T. E. / Sass, J. K. / Stuve, E. M. et al. | 1987
- 981
-
Shadow‐cone enhanced desorption with angle‐resolved secondary ion mass spectrometry detectionChang, Che‐Chen / Malafsky, Geoffrey / Winograd, Nicholas et al. | 1987
- 985
-
Auger electron spectroscopy–electron energy‐loss spectroscopy–low‐energy electron diffraction study of a V6C5(100) surfaceUsami, S. / Nakai, H. / Yaguchi, T. / Kumashiro, Y. / Fujimori, A. et al. | 1987
- 989
-
Energy distribution of primary backscattered electrons in Auger electron spectroscopyJousset, D. / Langeron, J. P. et al. | 1987
- 996
-
The room‐temperature oxidation of Cu/Si(100) and Cu/Si(111) interfaces studied by Auger electron spectroscopy, electron energy‐loss spectroscopy, and high‐resolution electron energy‐loss spectroscopyMo/ller, Preben J. / He, Jian‐wei et al. | 1987
- 1003
-
Unusual kinetics due to interface hydride formation in the hydriding of Pd/Mg sandwich layersKrozer, A. / Kasemo, B. et al. | 1987
- 1006
-
Extended energy‐loss fine‐structure study of carbon and oxygen on cobaltAtrei, A. / Bardi, U. / Rovida, G. / Torrini, M. / Zanazzi, E. / Maglietta, M. et al. | 1987
- 1009
-
Effects of carbon and sulfur on the decomposition of hydrocarbons on nickelKikowatz, R. / Flad, K. / Hörz, G. et al. | 1987
- 1015
-
Carbon segregation to the low‐index surfaces of an Fe–10 at. % Si single crystalViljoen, P. E. / du Plessis, J. / Bezuidenhout, F. et al. | 1987
- 1019
-
Adsorption of atomic oxygen on the Si(110)5×1 surface via interaction with N2OKeim, E. G. / van Silfhout, A. / Wolterbeek, L. et al. | 1987
- 1024
-
Hydrogen–oxygen interrelations on a niobium surfaceShamir, N. / Atzmony, U. / Schultz, J. A. / Mintz, M. H. et al. | 1987
- 1028
-
Reduction of oxidized Fe(110) by hydrogenVink, T. J. / Sas, S. J. M. / Gijzeman, O. L. J. / Geus, J. W. et al. | 1987
- 1032
-
Surface imaging by carbon monoxide field desorptionPanitz, J. A. / Hren, J. J. et al. | 1987
- 1036
-
Thermal decomposition of lubricant oil adsorbed on gold and oxidized iron foilsPan, Fu‐Ming / Stair, Peter C. et al. | 1987
- 1040
-
Structure and diffracted intensity in a model for irreversible island‐forming chemisorption with domain boundariesEvans, J. W. / Nord, R. S. et al. | 1987
- 1045
-
Phase transformations of the H/W(110) and H/Mo(110) surfacesAltman, M. / Chung, J. W. / Estrup, P. J. / Kosterlitz, J. M. / Prybyla, J. / Sahu, D. / Ying, S. C. et al. | 1987
- 1049
-
The scattering of thermal helium atoms from Ag(110): A semiclassical Gaussian wave‐packet studyCapozzi, C. / Francis, S. M. / Roscoe, D. / Richardson, N. V. / Holloway, S. et al. | 1987
- 1053
-
A comparison of the interaction of CO, N2, and OC with Cu(100)Müller, W. / Bagus, P. S. et al. | 1987
- 1057
-
The effects of Na on the interaction of CO with Ta(110)Shek, M. L. / Pan, Xiaohe / Strongin, Myron et al. | 1987
- 1061
-
K–CO on transition metals: A local ionic interactionSchultz, Peter A. / Patterson, Charles H. / Messmer, Richard P. et al. | 1987
- 1065
-
Potassium promotion of carbon reactivity: 104‐fold increase of oxidation rate in O2Sjövall, P. / Hellsing, B. / Keck, K.‐E. / Kasemo, B. et al. | 1987
- 1070
-
X‐ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy study on the CO chemisorbed over amorphous FeNiB alloysGuczi, L. / Zsoldos, Z. / Schay, Z. et al. | 1987
- 1076
-
Crack initiation and crack growth in polymers induced by electron bombardmentDickinson, J. T. / Tonyali, K. / Klakken, M. L. / Jensen, L. C. et al. | 1987
- 1082
-
Summary Abstract: Spin‐polarized photoelectron diffraction: A new probe of surface magnetic orderHermsmeier, B. / Sinkovic, B. / Osterwalder, J. / Fadley, C. S. et al. | 1987
- 1083
-
Summary Abstract: Dehydrogenation of some unsaturated hydrocarbons on oxygen covered palladiumDannetun, H. / Lundström, I. / Petersson, L.‐G. et al. | 1987
- 1085
-
Summary Abstract: Photon‐stimulated desorption and electron‐stimulated desorption of H+ from solid H2O and NH3Rosenberg, R. A. / Rehn, Victor / Knotek, M. L. / Stulen, R. H. et al. | 1987
- 1086
-
Summary Abstract: Isotope effect in water desorption from Ru(001)Schmitz, P. J. / Polta, J. A. / Chang, S.‐L. / Thiel, P. A. et al. | 1987
- 1088
-
Summary Abstract: The adsorption and decomposition of molybdenum hexacarbonyl on Mo and Si surfacesCho, C.‐C. / Bernasek, S. L. et al. | 1987
- 1090
-
Summary Abstract: Observation of 2H‐NbSe2 surface by scanning tunneling microscopyTokumoto, H. / Bando, H. / Kajimura, K. / Mizutani, W. / Murakami, H. / Okano, M. / Okayama, S. / Ono, M. / Ono, Y. / Sakai, F. et al. | 1987
- 1092
-
Summary Abstract: Electron scattering from a polar solid: High‐resolution electron energy‐loss spectra of HCN filmsKordesch, M. E. / Stenzel, W. / Conrad, H. / Sunjić, M. et al. | 1987
- 1093
-
Summary Abstract: Surface phonon dynamics of 2H–TaSe2(001)Benedek, G. / Miglio, L. / Skofronick, J. G. / Brusdeylins, G. / Heimlich, C. / Toennies, J. P. et al. | 1987
- 1094
-
Summary Abstract: Phase transitions and critical phenomena of physisorbed films on metal surfaces. I. Krypton on cadmiumDericbourg, Jacques et al. | 1987
- 1096
-
Summary Abstract: Influence of film melting characteristics on the wetting behavior of multilayer oxygen films adsorbed on graphiteKrim, J. / Coulomb, J. P. / Bouzidi, J. et al. | 1987
- 1097
-
Summary Abstract: Cohesive forces and dissipation in monolayer filmsGregory, Stephen et al. | 1987
- 1099
-
Summary Abstract: Anderson–Hamiltonian model of adsorbate inverse and direct photoemission and electronic excitation spectroscopiesNordlander, P. / Avouris, Ph. et al. | 1987
- 1101
-
Summary Abstract: Local bonding and stability of the excited and ionic states of chemisorbed CO and NOAvouris, Ph. / Bagus, P. S. / Nelin, C. J. / Rossi, A. R. et al. | 1987
- 1103
-
Summary Abstract: Isotopic differences in low‐temperature sorption and desorption of hydrogen by Pd(111)Gdowski, G. E. / Stulen, R. H. / Felter, T. E. et al. | 1987
- 1104
-
Summary Abstract: The adsorption of thiophene and tetrahydrothiophene on several faces of platinumLang, J. F. / Masel, R. I. et al. | 1987
- 1106
-
Summary Abstract: Methylamine adsorption and decomposition on (5×20) and (1×1) Pt(100)Thomas, P. A. / Masel, R. I. et al. | 1987
- 1108
-
Summary Abstract: Adsorption and decomposition of formic acid on clean and potassium‐dosed Rh(111) surfacesSolymosi, F. / Kiss, J. / Kovács, I. et al. | 1987
- 1110
-
Summary Abstract: Face specificity of CO2 adsorption on iron surfacesBauer, R. / Behner, H. / Borgmann, D. / Pirner, M. / Spiess, W. / Wedler, G. et al. | 1987
- 1111
-
Summary Abstract: Photon stimulated desorption induced by core exciton states in MgOKurtz, Richard L. / Stockbauer, Roger / Nyholm, Ralf / Flodström, S. Anders / Senf, Friedmar et al. | 1987
- 1115
-
Optical characterization of SiO1.1 silicon oxide layers on InSbRemond, G. / Caye, R. / Holloway, P. H. / Ruzakowski, P. et al. | 1987
- 1120
-
The interaction of O2 and CO with polycrystalline ZrHoflund, Gar B. / Corallo, Gregory R. / Asbury, Douglas A. / Gilbert, Richard E. et al. | 1987
- 1124
-
An x‐ray photoelectron spectroscopy investigation of the incorporation of surface oxides into bulk zirconiumWest, Paul E. / George, Patricia M. et al. | 1987
- 1128
-
An investigation of the chemistry of the dielectric/FeCoTb interface by x‐ray photoelectron spectroscopy and Auger electron spectroscopyStickle, W. F. / Coulman, D. et al. | 1987
- 1132
-
A surface study of the oxidation of polycrystalline tinAsbury, Douglas A. / Hoflund, Gar B. et al. | 1987
- 1136
-
Initial adsorption kinetics of oxygen on a Cu0.82Li0.18 alloy surface studied by combined Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and time‐of‐flight spectrometry of direct recoilsMintz, M. H. / Atzmony, U. / Schultz, J. A. / Shamir, N. et al. | 1987
- 1142
-
Near‐surface disorder studied with slow positronsVehanen, A. / Huttunen, P. / Mäkinen, J. / Hautojärvi, P. et al. | 1987
- 1147
-
Surface analysis and electrochemical studies of sulfur enhanced corrosion of nickelBaer, D. R. / Danielson, M. J. et al. | 1987
- 1152
-
Corrosion/passivation of aluminum in dilute sulfate solutions: A comparison of Pourbaix and surface behavior diagramsDavis, G. D. / Moshier, W. C. / Ahearn, J. S. / Hough, H. F. / Cote, G. O. et al. | 1987
- 1158
-
A high‐resolution Auger electron spectroscopy study of the intergranular fracture of a temper‐embrittled steelMenyhard, M. / McMahon, C. J. / Yoshioka, Y. et al. | 1987
- 1162
-
Neutral molecule emission from the fracture of crystalline MgODickinson, J. T. / Jensen, L. C. / McKay, M. R. et al. | 1987
- 1169
-
Summary Abstract: X‐ray photoelectron spectroscopy and ion scattering spectroscopy of submonolayer coverage of Ag on SiO2Pitts, J. R. / Thomas, T. M. / Czanderna, A. W. / Passler, M. et al. | 1987
- 1170
-
Summary Abstract: Surface properties of clean and gas‐dosed SnO2(110)Cox, David F. / Fryberger, Teresa B. / Erickson, Jon W. / Semancik, Steve et al. | 1987
- 1172
-
Summary Abstract: Passivation of metals in thionyl‐chloride electrolytes for lithium batteriesPeebles, D. E. / Rogers, J. W. / Cieslak, W. R. / Delnick, F. M. et al. | 1987
- 1173
-
Summary Abstract: Effects of temperature on the surface contamination of LiF: An electron stimulated desorption studyKelber, J. A. et al. | 1987
- 1175
-
Summary Abstract: A study of room‐temperature Cu–Al2O3 and Cu–AlN interfacial reactionsOhuchi, F. S. / French, R. H. / Kasowski, R. V. et al. | 1987
- 1177
-
Summary Abstract: High‐temperature oxidation of Pd15Rh in air: X‐ray photoelectron spectroscopy and Raman resultsBaird, R. J. / Graham, G. W. et al. | 1987
- 1179
-
Summary Abstract: Chemical analysis of in situ fractured materials by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, and ion scattering spectroscopyStucki, F. / Brüesch, P. / Greuter, F. / Gisler, E. et al. | 1987
- 1181
-
On the use of nonresonant multiphoton ionization of desorbed species for surface analysisBecker, C. H. et al. | 1987
- 1186
-
Calibration of secondary neutral and secondary ion mass spectrometry: A comparative studyTümpner, J. / Wilsch, R. / Benninghoven, A. et al. | 1987
- 1191
-
Detection of neutral atoms sputtered from ion‐bombarded single‐crystal surfaces Rh{111} and p(2×2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy‐ and angle‐resolved measurementsSingh, J. / Reimann, C. T. / Baxter, J. P. / Schick, G. A. / Kobrin, P. H. / Garrison, B. J. / Winograd, N. et al. | 1987
- 1194
-
Quantitative analysis of He in solids by sputtered neutral mass spectrometryGnaser, H. / Bay, H. L. / Hofer, W. O. et al. | 1987
- 1198
-
Oxygen interaction with Pd3Sn: X‐ray photoelectron spectroscopy and secondary ion mass spectrometryRotermund, H. H. / Penka, V. / De Louise, L. A. / Brundle, C. R. et al. | 1987
- 1203
-
X‐ray and Auger‐electron yields for quantitative element analysisJitschin, W. / Werner, U. et al. | 1987
- 1206
-
Low‐energy ion induced Auger electron spectra and energy thresholds for some pure elements, compounds, and alloysFan, Chuizhen / Yu, Zhenjiang / Chen, Xuekang et al. | 1987
- 1209
-
Superposition of Auger electron spectroscopy depth profiles obtained on Cr/Ni multilayer samples with different roughnessesZalar, A. / Hofmann, S. et al. | 1987
- 1213
-
Sputter profiling of passive films in Fe–Cr alloys: A quantitative approach by Auger electron spectroscopyLorang, G. / Da Cunha Belo, M. / Langeron, J. P. et al. | 1987
- 1220
-
Summary Abstract: On the quantitative aspects of oxygen enhancement in secondary ion mass spectrometryYu, Ming L. et al. | 1987
- 1221
-
Summary Abstract: Calibration of Auger electron spectrometers for energy and intensity measurementSeah, M. P. / Smith, G. C. / Anthony, M. T. et al. | 1987
- 1222
-
Summary Abstract: Observation of Auger electron channeling pattern and eliminating method of crystal orientation dependency in quantitative Auger electron spectroscopySakai, Y. / Mogami, A. et al. | 1987
- 1224
-
Summary Abstract: Anisotropy of equilibrium surface composition of alloysSteigerwald, Daniel A. / Wynblatt, Paul et al. | 1987
- 1226
-
Quantitative x‐ray photoelectron spectroscopy analysis of inorganic mixturesPaparazzo, E. et al. | 1987
- 1230
-
Inelastic background removal in x‐ray excited photoelectron spectra from homogeneous and inhomogeneous solidsTougaard, S. et al. | 1987
- 1235
-
On angle resolved x‐ray photoelectron spectroscopy of oxides, serrations, and protusions at interfacesDarlinski, A. / Halbritter, J. et al. | 1987
- 1241
-
Summary Abstract: Synchrotron radiation as a source for quantitative x‐ray photoelectron spectroscopy: Advantages and consequencesRosseel, T. M. / Carlson, T. A. / Negri, R. E. / Beall, C. E. / Taylor, J. W. et al. | 1987
- 1243
-
Design and performance of a reflectron based time‐of‐flight secondary ion mass spectrometer with electrodynamic primary ion mass separationNiehuis, E. / Heller, T. / Feld, H. / Benninghoven, A. et al. | 1987
- 1247
-
New data system for depth profiling of inhomogeneous samples by secondary ion mass spectrometryScholze, Chr. / Frenzel, H. / Maul, J. L. et al. | 1987
- 1250
-
Composite thin‐film production by ion bombardmentCarr, W. / Seidl, M. / Tompa, G. S. / Souzis, A. et al. | 1987
- 1254
-
High spatial resolution secondary ion mass spectrometry with parallel detection systemNihei, Y. / Satoh, H. / Tatsuzawa, S. / Owari, M. / Ataka, M. / Aihara, R. / Azuma, K. / Kammei, Y. et al. | 1987
- 1258
-
Electron energy‐loss microscopy of oxide filmsMitchell, D. F. / Graham, M. J. et al. | 1987
- 1262
-
Surface resonance effects in high‐ and low‐energy electron diffraction patterns in molybdeniteSmith, Andrew E. / Lynch, D. F. et al. | 1987
- 1266
-
A simple mirror electron microscope–low‐energy electron diffraction apparatus for surface studiesShern, C. S. / Unertl, W. N. et al. | 1987
- 1271
-
An experimental study of microarea analysis of insulators by secondary ion mass spectrometry using charge compensationFan, Chui‐zhen / Chen, Xue‐kang / Yu, Zhen‐jiang et al. | 1987
- 1275
-
X‐ray photoelectron spectroscopy peak shape analysis for the extraction of in‐depth composition informationTougaard, Sven et al. | 1987
- 1279
-
Change of surface composition of B4C single crystal due to heat treatmentInoue, S. / Fukuda, S. / Hino, T. / Yamashina, T. et al. | 1987
- 1283
-
Auger electron spectroscopy studies of silicon nitride, oxide, and oxynitride thin films: Minimization of surface damage by argon and electron beamsChao, S. S. / Tyler, J. E. / Tsu, D. V. / Lucovsky, G. / Mantini, M. J. et al. | 1987
- 1288
-
Interaction of Ti with fused silica and sapphire during metallizationChaug, Y. S. / Chou, N. J. / Kim, Y. H. et al. | 1987
- 1292
-
Surface segregation in donor and acceptor graphite intercalation compoundsLaguës, M. / Marchand, D. / Frétigny, C. et al. | 1987
- 1295
-
Investigation of the mechanism of the activation of GaAs negative electron affinity photocathodesGao, Huai‐rong et al. | 1987
- 1299
-
Impregnated cathode coated with tungsten thin film containing Sc2O3Yamamoto, Shigehiko / Taguchi, Sadanori / Watanabe, Isato / Kawase, Susumu et al. | 1987
- 1303
-
Studies of layered thin films of Prussian‐blue‐type compoundsSiperko, Lorraine M. / Kuwana, Theodore et al. | 1987
- 1307
-
Surface analysis of electrochromic displays of iron hexacyanoferrate films by x‐ray photoelectron spectroscopyEmrich, R. J. / Traynor, L. / Gambogi, W. / Buhks, E. et al. | 1987
- 1311
-
Summary Abstract: Scattered ion yields from 0.2 to 2 keV helium neutral or ion bombardment of solidsThomas, T. M. / Neumann, Herschel / Czanderna, A. W. / Pitts, J. R. et al. | 1987
- 1312
-
Summary Abstract: Noble gas ion bombardment of the basal plane surface of MoS2Lince, Jeffrey R. / Fleischauer, Paul D. et al. | 1987
- 1314
-
Summary Abstract: The dependence of the electrical properties of ion‐beam sputtered indium tin oxide on its composition and structureGessert, T. A. / Williamson, D. L. / Coutts, T. J. / Nelson, A. J. / Jones, K. M. / Dhere, R. G. / Aharoni, H. / Zurcher, P. et al. | 1987
- 1316
-
Summary Abstract: Applications of a system for real‐time imaging of analyzed areas in surface analysisGrazulis, L. / Tomich, D. H. / Koenig, M. F. / Grant, J. T. et al. | 1987
- 1317
-
Summary Abstract: Preliminary experiments on a new type of metastable‐atom‐beam sourceKanaji, T. / Yamanishi, A. / Urano, T. / Fujimoto, F. et al. | 1987
- 1318
-
Summary Abstract: Some optical and electron‐spin‐resonance properties of germanium rich a‐Ge1−xCx:H prepared by radio frequency sputtering in Ar/H2/C3H8Shinar, J. / Wu, H. S. / Shinar, R. / Seaverson, L. M. / Shanks, H. R. et al. | 1987
- 1319
-
Summary Abstract: The characterization of Cu(I) ions in Y zeolites by Fourier transform infrared spectroscopy and CO adsorptionNicol, J. M. / Howard, J. et al. | 1987
- 1321
-
X‐ray photoelectron and infrared spectroscopy of microwave plasma etched polyimide surfacesChou, N. J. / Paraszczak, J. / Babich, E. / Heidenreich, J. / Chaug, Y. S. / Goldblatt, R. D. et al. | 1987
- 1327
-
Infrared reflection–absorption spectroscopy of surface modified polyester filmsDunn, D. S. / McClure, D. J. et al. | 1987
- 1331
-
Summary Abstract: The application of secondary ion mass spectrometry to the study of thin polymer filmsBriggs, D. et al. | 1987
- 1332
-
Summary Abstract: Ion beam studies of polymer surfacesHook, K. J. / Gardella, J. A. et al. | 1987
- 1335
-
Kinetics and initial stages of oxidation of aluminum nitride: Thermogravimetric analysis and x‐ray photoelectron spectroscopy studyKatnani, A. D. / Papathomas, K. I. et al. | 1987
- 1341
-
Formations of TiN and TiC in titanium coated stainless steel by heat treatmentMachida, O. / Hashiba, M. / Hino, T. / Yamashina, T. et al. | 1987
- 1345
-
Nitrogen sorption on titanium: Reconstruction of the subsurface composition profile using low‐ and high‐energy Auger dataDawson, P. T. / Tzatzov, K. K. et al. | 1987
- 1352
-
Surface analysis in fusion devicesTaglauer, E. / Staudenmaier, G. et al. | 1987
- 1358
-
Ion beam effects on surface and subsurface composition of near‐noble silicidesValeri, S. / Ottaviani, G. et al. | 1987
- 1362
-
Surface analysis of palladium boride liquid metal ion beam deposition on silicon single‐crystal solid surfaceHiguchi‐Rusli, R. H. / Corelli, J. C. / Steckl, A. J. / Jin, H.‐S. et al. | 1987
- 1367
-
Formation of tungsten borides studied by field ion microscopyOhmae, N. / Nakamura, A. / Koike, S. / Umeno, M. et al. | 1987
- 1371
-
Summary Abstract: High energy resolution Auger electron spectroscopy of Ti and TiNPellerin, F. / Bodin, C. / Pech, T. et al. | 1987
- 1375
-
Ultrafine particlesHayashi, Chikara et al. | 1987
- 1385
-
Summary Abstract: Progress in magnetic fusion researchFurth, H. P. et al. | 1987
- 1387
-
Ultrahigh speed high electron mobility transistor large scale integration technologyAbe, Masayuki / Mimura, Takashi / Notomi, Seishi / Odani, Koichiro / Kondo, Kazuo / Kobayashi, Masaaki et al. | 1987
- 1393
-
Summary Abstract: Seeded lateral epitaxy in silicon‐on‐insulator structuresWarabisako, T. / Tokuyama, T. / Tamura, M. / Miyao, M. et al. | 1987
- 1394
-
Summary Abstract: Materials and physics issues in scaling bipolar devicesNing, Tak H. et al. | 1987
- 1396
-
Formation of self‐aligned TiSi2 for very large scale integrated contacts and interconnectsHo, V. Q. / Poulin, D. et al. | 1987
- 1402
-
Formation of silicides in the Ti, Ti(Ox)/Si(111), and Ti/SiO2/Si(111) systemsHsu, C. C. / Wang, You‐Xiang / Yin, Shi‐Duan / Li, Bao‐Qi / Ji, Ming‐Ron / Wu, Jian‐Xin et al. | 1987
- 1407
-
Resistive synaptic interconnects for electronic neural networksLamb, J. L. / Thakoor, A. P. / Moopenn, A. / Khanna, S. K. et al. | 1987
- 1412
-
Oxidation of thin WSi2 overlayers on Si(111)Nguyen Tan, T. A. / Azizan, M. / Derrien, J. et al. | 1987
- 1417
-
Summary Abstract: Some aspects of ion beam induced metal–silicon reactionsColligon, J. S. / Kheyrandish, H. / Stephens, G. A. et al. | 1987
- 1418
-
Summary Abstract: Electron spectroscopy for chemical analysis results relating titanium silicide formation to gas puritySherman, Robert / Berger, Henry et al. | 1987
- 1419
-
Summary Abstract: Interactions of Co thin films with Si substratesCoulman, Betty / Broadbent, Eliot K. et al. | 1987
- 1421
-
Low‐energy ion doping of GaAsCavalieri, S. / Gaucherel, Ph. / Monnom, G. / Paparoditis, C. / Roustan, J. C. et al. | 1987
- 1425
-
Desorption of the catalyst agent after catalytic oxidation of semiconductorsBakshi, M. H. / Soukiassian, P. / Gentle, T. M. / Hurych, Z. et al. | 1987
- 1428
-
Contrast enhancement techniques for submicron optical lithographyMack, Chris A. et al. | 1987
- 1432
-
Correlations between the chemical and electronic structure of thermally treated anodized InSbBregman, J. / Shapira, Yoram / Calahorra, Z. et al. | 1987
- 1437
-
Rapid thermal annealing of indium phosphide compound semiconductorsBiedenbender, Michael D. / Kapoor, Vik J. / Williams, W. D. et al. | 1987
- 1442
-
Determining metal–semiconductor interface structure by optical second‐harmonic generationMcGilp, J. F. et al. | 1987
- 1447
-
Metal induced crystallization of amorphous siliconRobertson, A. E. / Hultman, L. G. / Hentzell, H. T. G. / Hörnström, S.‐E. / Shaofang, G. / Psaras, P. A. et al. | 1987
- 1451
-
The stability and decomposition of gaseous chloroferrocenesBarfuss, S. / Grade, M. / Hirschwald, W. / Rosinger, W. / Boag, N. M. / Driscoll, D. C. / Dowben, P. A. et al. | 1987
- 1456
-
An Auger electron spectroscopy/electron energy‐loss spectroscopy study on the oxidation of WSi2 thin filmHe, Jian‐Wei / Mo/ller, Preben J. / Chen, Jiann‐Ruey et al. | 1987
- 1459
-
The Si/GaAs(110) heterojunction discontinuity: Amorphous versus crystalline overlayersList, R. S. / Woicik, J. / Mahowald, P. H. / Lindau, I. / Spicer, W. E. et al. | 1987
- 1464
-
Variations of energies and line shapes of the electroreflectance spectra of epitaxial AlxGa1−xAsWrobel, J. M. / Bassett, L. C. / Aubel, J. L. / Sundaram, S. / Davis, John L. / Comas, James et al. | 1987
- 1470
-
Depth profile analysis of hydrogenated carbon layers on silicon by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy‐loss spectroscopy, and secondary ion mass spectrometrySander, P. / Kaiser, U. / Altebockwinkel, M. / Wiedmann, L. / Benninghoven, A. / Sah, R. E. / Koidl, P. et al. | 1987
- 1474
-
Electron energy‐loss spectroscopy investigation of core levels and valence excitations of Pd2SiNannarone, S. / Fiorello, A. M. / del Pennino, U. / Mariani, C. / Betti, M. G. / De Crescenzi, M. et al. | 1987
- 1479
-
Summary Abstract: Growth of Ge overlayers onto (HgCd)Te: A comparison between cleaved and ion‐sputtered surfacesDavis, G. D. / Beck, W. A. / Kelly, M. K. / Mo, Y. W. / Margaritondo, G. et al. | 1987
- 1480
-
Summary Abstract: Optical monitoring of laser heating and interfacial reaction in Si/AuSu, J. C. / Meng, Q. K. / Allen, S. D. et al. | 1987
- 1482
-
Summary Abstract: Charging effects and the silicon‐on‐sapphire interface width during an Auger electron spectroscopy sputter profileRichmond, Eliezer Dovid / Turner, Noel H. et al. | 1987
- 1484
-
Summary Abstract: Chemically deposited Ni on Si(111) investigated with x‐ray standing wavesThundat, T. / Zegenhagen, J. / Gibson, W. M. et al. | 1987
- 1485
-
Summary Abstract: Transmission electron microscopy studies of the microstructure of AuNiGe ohmic contact to n‐type GaAsShih, Yih‐Cheng / Wilkie, E. L. / Murakami, Masanori et al. | 1987
- 1487
-
Summary Abstract: Surface morphology and electromigrationHuang, Huei Li / Yang, Jyh Shinn et al. | 1987
- 1489
-
Summary Abstract: Fundamental properties of superlatticesDöhler, Gottfried H. et al. | 1987
- 1493
-
Schottky barriers and band lineups at interfacesKane, Evan O. et al. | 1987
- 1500
-
Raman scattering in GaSb/AlSb strained‐layer latticesSchwartz, G. P. / Gualtieri, G. J. / Sunder, W. A. / Farrow, L. A. / Aspnes, D. E. / Studna, A. A. et al. | 1987
- 1503
-
Metal penetration and dopant redistribution beneath alloyed Ohmic contacts to n‐GaAsShappirio, J. R. / Lareau, R. T. / Lux, R. A. / Finnegan, J. J. / Smith, D. D. / Heath, L. S. / Taysing‐Lara, M. et al. | 1987
- 1508
-
Summary Abstract: Silicide formation at the Ti/Si(111) interfaceChambers, S. A. / del Giudice, M. / Hill, D. M. / Xu, F. / Joyce, J. J. / Ruckman, M. W. / Weaver, J. H. et al. | 1987
- 1509
-
Summary Abstract: Bridging the gap between solid–solid and solid–vacuum interfaces: A study of buried Si/αSi interfacesGossmann, H.‐J. / Gibson, J. M. / Bean, J. C. / Tung, R. T. / Feldman, L. C. et al. | 1987
- 1511
-
Study of the structure and properties of the Ti/GaAs interfaceKniffin, Margaret / Helms, C. R. et al. | 1987
- 1516
-
Optical emission properties of metal/InP and GaAs interface statesViturro, R. E. / Slade, M. L. / Brillson, L. J. et al. | 1987
- 1521
-
A chemical and structural investigation of Schottky and ohmic Au/GaAs contactsCoulman, D. / Newman, N. / Reid, G. A. / Liliental‐Weber, Z. / Weber, E. R. / Spicer, W. E. et al. | 1987
- 1526
-
Summary Abstract: Schottky barrier formation studies by temperature‐dependent high‐resolution electron energy loss spectroscopyKelly, M. K. / Margaritondo, G. / Papagno, L. / Lapeyre, G. J. et al. | 1987
- 1527
-
Summary Abstract: Kinetics of Schottky barrier formation: Au on low‐temperature GaAs(110)Stiles, K. / Kahn, A. / Kilday, D. G. / Margaritondo, G. et al. | 1987
- 1528
-
Summary Abstract: Metal‐induced impurity states at the InP/transition‐metal interfaceSchäffler, F. / Drube, W. / Hughes, G. / Ludeke, R. / Rieger, D. / Himpsel, F. J. et al. | 1987
- 1530
-
Summary Abstract: Binding energy shifts from alloying at metal/II–VI compound semiconductor interfacesNogami, J. / Friedman, D. J. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1987
- 1532
-
Summary Abstract: Reactivity of Au with GaAsYeh, Liu Lu‐Min / Xie, Yu‐Jun / Mueller, Carl / Holloway, P. H. et al. | 1987
- 1534
-
Summary Abstract: Low‐energy argon implantation studies on Au/GaAs Schottky diodesWang, Y. G. / Ashok, S. / Dietrich, H. et al. | 1987
- 1535
-
Summary Abstract: Semiconductor composition during metal/mercury–cadmium–telluride interface formationWall, A. / Raisanen, A. / Chang, S. / Philip, P. / Troullier, N. / Franciosi, A. / Peterman, D. J. et al. | 1987
- 1537
-
The effect of beam emittances on x‐ray lithography exposure line resolutionSo, D. / Lai, B. / Wells, G. M. / Cerrina, F. et al. | 1987
- 1544
-
Silicon cold cathodes as possible sources in electron lithography systemsvan Gorkom, G. G. P. / Hoeberechts, A. M. E. et al. | 1987
- 1549
-
Summary Abstract: Synchrotron lithography for high resolutionHeuberger, Anton et al. | 1987
- 1552
-
Summary Abstract: Focused ion beam implantation doping in GaAs/AlGaAs molecular‐beam epitaxy growthHashimoto, H. / Miyauchi, E. et al. | 1987
- 1554
-
Thin‐gate low‐pressure chemical vapor deposition oxidesFreeman, Dean W. et al. | 1987
- 1559
-
Kinetics of high‐temperature thermal decomposition of SiO2 on Si(100)Liehr, M. / Lewis, J. E. / Rubloff, G. W. et al. | 1987
- 1563
-
On dielectric breakdown in oxidized siliconWolters, D. R. / Zegers‐van Duijnhoven, A. T. A. et al. | 1987
- 1569
-
Characterization of ultrathin SiO2 films formed by direct low‐energy ion‐beam oxidationYu, C. F. / Todorov, S. S. / Fossum, E. R. et al. | 1987
- 1572
-
Gallium arsenide thin films by low‐temperature photochemical processesNishizawa, J. / Kurabayashi, T. / Abe, H. / Sakurai, N. et al. | 1987
- 1578
-
Relation of polymer structure to plasma etching behavior: Role of atomic fluorineCain, S. R. / Egitto, F. D. / Emmi, F. et al. | 1987
- 1585
-
Reactive ion etching related Si surface residues and subsurface damage: Their relationship to fundamental etching mechanismsOehrlein, Gottlieb S. / Lee, Young H. et al. | 1987
- 1595
-
Time‐of‐flight and surface residence time measurements for ion‐enhanced Si–Cl2 reaction productsRossen, Rebecca A. / Sawin, Herbert H. et al. | 1987
- 1600
-
Dry etching of n‐ and p‐type polysilicon: Parameters affecting the etch rateBerg, S. / Nender, C. / Buchta, R. / Norström, H. et al. | 1987
- 1604
-
Summary Abstract: A study of gallium arsenide and aluminum gallium arsenide reactive ion etching parametersScherer, A. / Beebe, E. / Craighead, H. G. et al. | 1987
- 1605
-
Summary Abstract: Silicon etching with a hot SF6 molecular beamSuzuki, Keizo / Ninomiya, Ken / Nishimatsu, Shigeru / Okada, Osami et al. | 1987
- 1606
-
Summary Abstract: Nanosecond ultraviolet laser induced etching of Si and Cu exposed to Cl2van Veen, G. N. A. / Baller, T. / Dieleman, J. / de Vries, A. E. et al. | 1987
- 1608
-
Summary Abstract: Mechanisms of laser interaction with metal carbonyls on Si(111)7×7: Identification of solely photochemical and solely thermal processesYing, Z. / Bartosch, C. E. / Gluck, N. S. / Ho, W. et al. | 1987
- 1617
-
An x‐ray photoelectron spectroscopy/Auger electron spectroscopy study of titanium–palladium thin films on silicon(111)Thomas, J. H. / Hoffman, D. M. / McGinn, J. T. / Tams, F. J. et al. | 1987
- 1621
-
An x‐ray photoelectron spectroscopy study on ozone treated InP surfacesIngrey, S. / Lau, W. M. / McIntyre, N. S. / Sodhi, R. et al. | 1987
- 1625
-
The growth and stability of Ag layers on Cu(110)Taylor, T. N. / Hoffbauer, M. A. / Maggiore, C. J. / Beery, J. G. et al. | 1987
- 1630
-
AlN thin films with controlled crystallographic orientations and their microstructureOhuchi, F. S. / Russell, P. E. et al. | 1987
- 1635
-
A study of O2 and CO adsorption on thin evaporated chromium filmsThurner, G. / Abermann, R. et al. | 1987
- 1640
-
The electronic structure of cubic SiC grown by chemical vapor deposition on Si(100)Hoechst, Hartmut / Tang, Ming / Johnson, B. C. / Meese, J. M. / Zajac, G. W. / Fleisch, T. H. et al. | 1987
- 1644
-
Structural order in Si–N and Si–N–O films prepared by plasma assisted chemical vapor deposition processBudhani, R. C. / Prakash, S. / Doerr, H. J. / Bunshah, R. F. et al. | 1987
- 1649
-
Sources of surface contamination affecting electrical characteristics of semiconductorsSlusser, G. J. / MacDowell, L. et al. | 1987
- 1652
-
Correlation of microstructure and composition of sputtered titanium nitride films with electrical and optical propertiesThorpe, T. P. / Elam, W. T. / Morrish, A. et al. | 1987
- 1655
-
Photoelectronic properties of a‐Si:H and a‐Ge:H thin films in surface cell structuresParsons, G. N. / Kusano, C. / Lucovsky, G. et al. | 1987
- 1661
-
Interference structure in optical scattering from oxide/metal interfacesBergkvist, M. / Roos, A. / Ribbing, C.‐G. et al. | 1987
- 1666
-
Molybdenum and tungsten–10% titanium deposition characterizationDawson, R. et al. | 1987
- 1671
-
Examination of thin films in the ZrO2–SiO2 system by transmission electron microscopy and x‐ray diffraction techniquesFarabaugh, E. N. / Feldman, A. / Sun, J. / Sun, Y. N. et al. | 1987
- 1675
-
Preparation and characterization of plasma enhanced chemical vapor deposited silicon nitride and oxynitride filmsVuillod, J. et al. | 1987
- 1680
-
Oxidation of microcrystalline Si:H:Cl filmsGrossman, E. / Grill, A. / Polak, M. et al. | 1987
- 1684
-
Summary Abstract: The importance of multiple scattering in x‐ray photoelectron and Auger electron diffraction in crystalsEgelhoff, W. F. et al. | 1987
- 1685
-
Summary Abstract: Characterization of ultrathin polyimide films (d∼11 Å) formed by vapor deposition of 4,4‐oxidianiline and 1,2,4,5‐benzenetetracarboxylic anhydrideGrunze, M. / Lamb, R. N. et al. | 1987
- 1686
-
Summary Abstract: Surface and structural characterization of thin films formed on aluminum alloysHomma, T. / Kobayashi, M. / Fujita, D. / Uda, M. et al. | 1987
- 1687
-
Summary Abstract: In situ surface and interface magnetic characterization of thin filmsKay, Eric et al. | 1987
- 1688
-
Summary Abstract: Characterization of sprayed antimony doped tin oxide filmsReddy, P. Sreedhara / Uthanna, S. / Reddy, P. Jayarama et al. | 1987
- 1690
-
Summary Abstract: Structure and electrical properties of grain boundaries in semiconductor crystalsMaurice, J.‐L. / Laval, J.‐Y. et al. | 1987
- 1691
-
Summary Abstract: Effect of grain boundaries on the electrical properties of a Schottky junctionCroitoru, N. / Mudrik, M. et al. | 1987
- 1693
-
Summary Abstract: Determination of electrical potential as a function of position on semi‐insulating polycrystalline silicon thin films using a scanning Auger microprobeComizzoli, R. B. / Opila, R. L. et al. | 1987
- 1694
-
Summary Abstract: Study of niobia–silica interfacial phenomena with model thin filmsWeissman, J. G. / Ko, E. I. / Wynblatt, P. et al. | 1987
- 1696
-
Formation of ceramic thin films by solid‐state interface reactionsHesse, D. et al. | 1987
- 1703
-
Selective deposition of Ti: An interface studyNender, C. / Berg, S. / Gelin, B. / Stridh, B. et al. | 1987
- 1708
-
Analysis of indium nitride surface oxidationFoley, C. P. / Lyngdal, J. et al. | 1987
- 1713
-
Oxidation kinetics for thin rare‐earth metal filmsBurnham, Alan K. / Jameson, Glen T. et al. | 1987
- 1717
-
Effects of Au film on the kinetics of platinum silicide formationSong, Jerng‐Sik / Chang, Chin‐An et al. | 1987
- 1721
-
Insulator interface effects in sputter‐deposited NbN/MgO/NbN (superconductor–insulator–superconductor) tunnel junctionsThakoor, S. / Leduc, H. G. / Stern, J. A. / Thakoor, A. P. / Khanna, S. K. et al. | 1987
- 1726
-
Near‐eutectic Si–Cr alloy formation with electron‐beam and laser pulsesD’Anna, E. / Leggieri, G. / Luches, A. / Majni, G. / Ottaviani, G. et al. | 1987
- 1730
-
Structural and electronic effects of the solid‐state amorphization and recrystallization of Cu–Ho thin filmsVenkert, A. / Shamir, N. / Talianker, M. / Atzmony, U. / Dariel, M. P. et al. | 1987
- 1733
-
Crystalline and quasicrystalline phases formed by interdiffusion in evaporated Al–Mn thin filmsCsanády, Á. / Urban, K. / Mayer, J. / Barna, P. B. et al. | 1987
- 1735
-
Reflection electron microscope study of Pt(111) surfacesOgawa, S. / Tanishiro, Y. / Takayanagi, K. / Yagi, K. et al. | 1987
- 1739
-
Summary Abstract: Mechanisms for selectivity loss during tungsten chemical vapor deposition on Si and SiO2Creighton, J. R. et al. | 1987
- 1740
-
Summary Abstract: Effects of a cesium ion beam on GaAs, InP, and SiGries, W. H. / Miethe, K. et al. | 1987
- 1741
-
Summary Abstract: Preparation and surface study of high‐Tc superconducting Nb–Ge filmChen, L. F. / Cao, Z. X. / Meng, S. Z. / Lin, Y. F / Li, Y. X. / Kuo, Y. H. et al. | 1987
- 1742
-
Summary Abstract: A comprehensive explanation of existing gold on NaCl nucleation dataGates, A. D. / Robins, J. L. et al. | 1987
- 1743
-
Summary Abstract: Heterocluster motion on solids: W–Si2 on W(110)Wrigley, John D. / Ehrlich, Gert et al. | 1987
- 1745
-
Summary Abstract: Precursor and chemisorption of CO on polycrystalline surfaces of NiBarber, R. / Glover, R. E. et al. | 1987
- 1746
-
Summary Abstract: The segregation of gold at copper/silver interphase boundariesDregia, S. A. / Wynblatt, P. / Bauer, C. L. et al. | 1987
- 1748
-
Summary Abstract: Evolution of hole shape in {100}, {110}, and {111} monocrystalline thin films of goldLanxner, M. / Bauer, C. L. / Scholz, R. et al. | 1987
- 1750
-
Spatial distribution of sputtered atoms from magnetron sourceSwann, S. et al. | 1987
- 1755
-
Crystallographic target effects in magnetron sputteringWickersham, C. E. et al. | 1987
- 1759
-
Summary Abstract: The use of electron and laser beams in processing microelectronic filmsYu, Z. / Moore, C. A. / Collins, G. J. et al. | 1987
- 1760
-
Summary Abstract: A new technique for in situ thin‐film chemical analysis in sputtering depositionHecq, Michel / Leleux, Jacques et al. | 1987
- 1762
-
Influence of ion beam parameters on the electrical and optical properties of ion‐assisted reactively evaporated vanadium dioxide thin filmsCase, F. C. et al. | 1987
- 1767
-
New oxidation state of tantalum oxide formed by reactive ion‐beam cosputtering of Ta and SiMorisaki, H. / Masaki, S. / Watanabe, S. et al. | 1987
- 1771
-
Formation of high‐quality, magnetron‐sputtered Ta2O5 films by controlling the transition region at the Ta2O5/Si interfaceSeki, Shunji / Unagami, Takashi / Kogure, Osamu / Tsujiyama, Bunjiro et al. | 1987
- 1775
-
Electrical and optical properties of thin Ta and W oxide films produced by reactive direct current magnetron sputteringHichwa, B. P. / Caskey, G. / Betz, D. F. / Harlow, J. D. et al. | 1987
- 1778
-
Growth and properties of radio frequency reactively sputtered titanium nitride thin filmsKumar, N. / Pourrezaei, K. / Fissel, M. / Begley, T. / Lee, B. / Douglas, E. C. et al. | 1987
- 1783
-
Preparation of Ge–Pb–O thin films by radio frequency reactive sputteringUmezawa, T. / Sasaki, K. et al. | 1987
- 1786
-
Effect of oxygen contamination on the deposition of hydrogenated amorphous silicon films by tetrode radio frequency sputteringGekka, Yasuo / Fukuda, Tadashi / Yasumura, Yoh‐ichi / Kezuka, Hiroshi / Akimoto, Makio et al. | 1987
- 1791
-
Summary Abstract: Resputtering during ion beam sputter depositionHoffman, D. W. / Badgley, J. S. et al. | 1987
- 1792
-
Summary Abstract: Theory of thin‐film orientation by ion bombardment during depositionBradley, R. Mark / Harper, James M. E. / Smith, David A. et al. | 1987
- 1793
-
Summary Abstract: Hydrogen‐free SiN films prepared by ion‐beam sputter depositionKitabatake, M. / Wasa, K. et al. | 1987
- 1795
-
Influence of thickness and hydrogen concentration on optical and electrical properties of a‐Si:H thin filmsRava, P. / Demichelis, F. / Kaniadakis, G. / Mpawenayo, P. / Tagliaferro, A. / Tresso, E. et al. | 1987
- 1798
-
Thermal annealing effects on amorphous radio frequency sputtered Cd0.95Fe0.05Te thin filmsAlvarez‐F., Octavio / Mendoza‐Alvarez, J. G. / Sanchez‐Sinencio, F. / Romero, Saul / Vidal, Miguel Angel et al. | 1987
- 1802
-
Silicide thickness calculations and phase identificationsChen, Jiann‐Ruey et al. | 1987
- 1806
-
Surface roughness for metallic thin films deposited upon various dielectric coatingsVarnier, F. / Mayani, N. / Rasigni, G. / Rasigni, M. / Llebaria, A. et al. | 1987
- 1809
-
Auger sputter profiling and factor analysis of thermally treated Ni–GaAs structures: The influence of oxygen on compounding and diffusionSolomon, J. S. / Smith, S. R. et al. | 1987
- 1816
-
Properties of nitrogen implanted nickel foilsEhni, P. D. / Unertl, W. N. et al. | 1987
- 1819
-
Junction and ohmic contact formation in compound semiconductors by rapid isothermal processingSingh, R. / Radpour, F. / Chou, P. / Nguyen, Q. / Joshi, S. P. / Ullal, H. S. / Matson, R. J. / Asher, S. et al. | 1987
- 1824
-
Properties of silicon and aluminum oxide thin films deposited by dual ion beam sputteringEmiliani, G. / Scaglione, S. et al. | 1987
- 1828
-
Organic films containing metal prepared by plasma polymerizationKashiwagi, K. / Yoshida, Y. / Murayama, Y. et al. | 1987
- 1831
-
Laser annealing of copper and silicon thin filmsBloch, J. / Zeiri, Y. et al. | 1987
- 1836
-
Effects of oxygen in ion‐beam sputter deposition of vanadium oxideChain, E. E. et al. | 1987
- 1840
-
Growth of ultrathin single‐crystal NiSi2 layers on Si(111)Tung, R. T. et al. | 1987
- 1845
-
The influence of the mica surface composition on the growth morphology of discontinuous epitaxial palladium vapor depositsKoch, R. / Poppa, H. et al. | 1987
- 1849
-
Development of a direct current reactively sputtered black chromium oxide coating for use in a high‐resolution color cathode‐ray tube applicationKulkarni, Sudhakar / Miller, Paul / Wagner, Michael et al. | 1987
- 1856
-
In situ transmission electron microscopy annealing of NiCr thin films with simultaneous Hall‐voltage measurementTóth, L. / Barna, Á. / Sáfrán, G. et al. | 1987
- 1860
-
Friction measurement of coated surfaces with a vibrated diamond stylusBaba, S. / Kikuchi, A. / Kinbara, A. et al. | 1987
- 1863
-
Isothermal desorption spectroscopy of CO from epitaxial (111) Pd/mica filmsGotoh, Y. / Vook, R. W. / Morales De La Garza, L. / Pan, Y. et al. | 1987
- 1867
-
Spot deposition by focusing in Penning discharge sputteringSugita, T. / Nishikawa, E. / Ebisawa, S. et al. | 1987
- 1870
-
Preparation of CoCr thin films on polymer substrates by ion beam sputteringSuzuki, Y. / Takiguchi, K. / Yoshitake, M. / Yotsuya, T. / Ogawa, S. et al. | 1987
- 1874
-
Plasma‐enhanced chemical vapor deposition SiN films: Some electrical propertiesLing, C. H. / Kwok, C. Y. / Prasad, K. et al. | 1987
- 1879
-
Radio frequency sputter deposition of SiO2 films at high rateLogan, J. S. / Jones, F. / Costable, J. / Lucy, J. E. et al. | 1987
- 1883
-
Nucleation and initial growth of In deposited on Si3N4 using low‐energy (≤300 eV) accelerated beams in ultrahigh vacuumHasan, M.‐A. / Barnett, S. A. / Sundgren, J.‐E. / Greene, J. E. et al. | 1987
- 1888
-
Metastable amorphous and crystalline (α,σ) phase in physical vapor deposited Fe–(Cr)–Ni–(C) depositsMalavasi, S. / Oueldennaoua, A. / Foos, M. / Frantz, C. et al. | 1987
- 1892
-
Stress control in reactively sputtered AlN and TiN filmsEste, G. / Westwood, W. D. et al. | 1987
- 1898
-
Heteroepitaxy of Ge on (100) Si substratesBaribeau, J. M. / Jackman, T. E. / Maigné, P. / Houghton, D. C. / Denhoff, M. W. et al. | 1987
- 1903
-
Summary Abstract: Comparative study of polycrystalline silicon thin films deposited by very low pressure chemical vapor deposition with and without plasma enhancementHajjar, J.‐J. J. / Reif, R. / Adler, D. et al. | 1987
- 1905
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Summary Abstract: Molecular dynamics studies of dynamical processes on the silicon {100} reconstructed surfaceBrenner, Donald W. / Garrison, Barbara J. et al. | 1987
- 1906
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Summary Abstract: An optical, infrared, electron‐spin‐resonance, and Auger study of a‐Si:H films prepared by radio frequency sputtering in He/H2, Ar/H2, and Xe/H2Shinar, J. / Albers, M. L. / Bevolo, A. J. / Shanks, H. R. et al. | 1987
- 1907
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Summary Abstract: Glass and metal thin‐film interlayers for low‐temperature field assisted bondingLee, W. Y. / Sequeda, F. / Salem, J. / Chapman, D. et al. | 1987
- 1909
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Summary Abstract: Optical properties of Cu films deposited using ion assisted depositionAl‐Jumaily, G. A. / Wilson, S. R. / DeHainaut, L. L. / McNally, J. J. / McNeil, J. R. et al. | 1987
- 1910
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Summary Abstract: Realization of antiparallel‐magnetized ferromagnetic double layer and the observation of spin‐wave modes by Brillouin scatteringZhang, P. X. / Zinn, W. et al. | 1987
- 1911
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Summary Abstract: Germanium thin films deposited by the ionized‐cluster beam techniqueMcCalmont, Jonathan S. / Shanks, Howard R. / Lakin, Kenneth M. et al. | 1987
- 1913
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Summary Abstract: Properties of hydrocarbon polymer films containing metal clustersKay, Eric / Laurent, Christian et al. | 1987
- 1914
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Summary Abstract: Dramatic variation of the physical microstructure of a vapor deposited organic thin filmKam, K. K. / Debe, M. K. / Poirier, R. J. / Drube, A. R. et al. | 1987
- 1917
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The effect of fluorine atoms on silicon and fluorocarbon etching in reactive ion beam etchingCheeks, Teresa L. / Ruoff, Arthur L. et al. | 1987
- 1921
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Ion enhanced reactive etching of tungsten single crystals and films with XeF2Bensaoula, A. / Strozier, J. A. / Ignatiev, A. / Yu, J. / Wolfe, J. C. et al. | 1987
- 1925
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Electrode separation and convex electrode surfaces in plasma etchingEisele, Konrad M. et al. | 1987
- 1928
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Summary Abstract: Etching with directed beams of ions or radicalsGeis, M. W. / Efremow, N. N. / Lincoln, G. A. et al. | 1987
- 1929
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Summary Abstract: Spectroscopic diagnostics of photoresist erosion in an aluminum etch plasmaKrogh, Ole / Slomowitz, Harry / Melaku, Yosias / Blom, Hans‐Olof et al. | 1987
- 1931
-
Graphoepitaxy of Bi, In, and SnKlews, P.‐M. / Anton, R. / Harsdorff, M. et al. | 1987
- 1935
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New phases of manganese achieved by epitaxial depositionHeinrich, B. / Arrott, A. S. / Liu, C. / Purcell, S. T. et al. | 1987
- 1941
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Effect of thin titanium interfacial layers on the formation of palladium silicide on siliconHoffman, D. M. / McGinn, J. T. / Tams, F. J. / Thomas, J. H. et al. | 1987
- 1946
-
Summary Abstract: Ion‐beam crystallography of semiconductor interfaces and heteroepitaxial filmsvan der Veen, J. F. et al. | 1987
- 1947
-
Summary Abstract: Crystal growth, atomic ordering, and physical properties of epitaxial metastable semiconductorsGreene, J. E. et al. | 1987
- 1949
-
Preparation of a magneto‐optical disk using a rare earth–transition metal alloy targetAsari, S. / Asaka, T. / Ota, Y. / Nakamura, K. / Itoh, A. et al. | 1987
- 1952
-
Properties of Sn‐doped In2O3 by reactive magnetron sputtering and subsequent annealingYamamoto, S. / Yamanaka, T. / Ueda, Z. et al. | 1987
- 1956
-
Morphology and electrical properties of In doped CdS thin filmsDhere, Neelkanth G. / Moutinho, Helio R. / Dhere, Ramesh G. et al. | 1987
- 1960
-
Optical properties of Cs2O and Ag–Cs2O thin filmsWu, Quan‐De / Xue, Zeng‐Quan / Li, Jian‐Ping et al. | 1987
- 1965
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Summary Abstract: Thin films for optical recording applicationsThomas, G. E. et al. | 1987
- 1966
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Summary Abstract: The correlation of pit shape with the valence state of Ti in Te–Se–Ti alloy thin films for optical recording disksAbe, S. / Kobayashi, T. / Tsukane, N. / Tsukada, H. / Ikematsu, K. / Toba, H. et al. | 1987
- 1968
-
Effects of argon pressure and substrate heating on the chromium underlayer used for high‐density longitudinal CoNiCr mediaRavipati, Durga P. / Haines, William G. / Dockendorf, James L. et al. | 1987
- 1971
-
Sputtering target for production of CoNiCr/Cr sputtered hard diskYamada, T. / Higuchi, Y. / Tani, N. / Ishikawa, M. / Ota, Y. / Nakamura, K. / Itoh, A. et al. | 1987
- 1975
-
Summary Abstract: Perpendicular magnetic anisotropy in Co/Pd and Co/Pt superlatticesCarcia, Peter F. et al. | 1987
- 1976
-
Summary Abstract: Scanning electron microscope with polarization analysis studies of magnetic materialsUnguris, J. / Hembree, G. G. / Celotta, R. J. / Pierce, D. T. et al. | 1987
- 1979
-
Quantitative analysis of chemical vapor deposition refractory metal silicidesStreit, Lori A. / Williams, Peter et al. | 1987
- 1984
-
Study of the Ti/Si interface using x‐ray photoelectron and Auger electron appearance potential spectroscopiesChopra, D. R. / Chourasia, A. R. / Dillingham, T. R. / Peterson, Keith L. / Gnade, B. et al. | 1987
- 1988
-
Homogenization of tantalum pentoxide reference materials and the establishment of a reference standard for sputtering fluxes and for cross section measurements in nuclear instrumentsSeah, M. P. / Holbourn, M. W. / Davies, J. A. / Ortega, C. et al. | 1987
- 1994
-
Evidence for the neutralization of boron in silicon using surface analysis techniquesKazmerski, L. L. / Nelson, A. J. / Dhere, R. G. et al. | 1987
- 1998
-
Deposition of silicon oxynitride thin films by remote plasma enhanced chemical vapor depositionTsu, D. V. / Lucovsky, G. / Mantini, M. J. / Chao, S. S. et al. | 1987
- 2003
-
Growth mechanisms of anodic oxide and sulfide films on HgCdTeStrong, R. L. et al. | 1987
- 2007
-
The effect of lattice mismatch on the dynamical microstructure of III–V compound surfacesEbner, J. T. / Arthur, J. R. et al. | 1987
- 2011
-
High‐resolution electron energy‐loss spectroscopy measurements on hydrophilic silicon (100) wafers: Temperature and aging effectsGrundner, M. et al. | 1987
- 2016
-
Electron energy‐loss spectroscopy study of hydrogenated amorphous siliconBurnham, N. A. / Fisher, R. F. / Asher, S. E. / Kazmerski, L. L. et al. | 1987
- 2019
-
Systematics of electronic structure and local bonding for metal/GaAs(110) interfacesJoyce, J. J. / Grioni, M. / del Giudice, M. / Ruckman, M. W. / Boscherini, F. / Weaver, J. H. et al. | 1987
- 2024
-
Summary Abstract: Growth kinetics of thermally nitrided Si(100) by N2H4Peden, Charles H. F. / Van Deusen, Stuart B. et al. | 1987
- 2025
-
Summary Abstract: X‐ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and Auger electron spectroscopy study of (Cs–O) activated GaAs(100) surfacesBesançon, M. / Landers, R. / Jupille, J. et al. | 1987
- 2027
-
Summary Abstract: Application of reflection high‐energy electron diffraction to thin‐film growth and characterizationCohen, P. I. / Pukite, P. R. et al. | 1987
- 2028
-
Summary Abstract: Extended x‐ray absorption fine‐structure features in the reflectivity of x‐ray multilayersvan Brug, H. / van der Wiel, M. J. / Bruijn, M. P. / Verhoeven, J. et al. | 1987
- 2030
-
Summary Abstract: Interface formation in IV–IV heterostructures: Tin on siliconZinke‐Allmang, M. / Gossmann, H.‐J. / Feldman, L. C. / Fisanick, G. J. et al. | 1987
- 2032
-
Topics in inverse photoemissionDose, V. et al. | 1987
- 2038
-
Experimental studies of the electronic structure of I–II and I–III intermetallic compounds with B32 (Zintl) structureCurelaru, I. M. / Din, K.‐S. / Jang, G.‐E. / Chen, L.‐G. / Wall, E. / Susman, S. / Brun, T. O. / Volin, K. J. / Koch, E.‐E. / Horn, K. et al. | 1987
- 2042
-
Angle resolved ultraviolet photoemission spectroscopy study of the electronic structure of InSb(111) surfaces along the [110] azimuthHernández‐Calderón, I. / Höchst, H. / Mazur, A. / Pollmann, J. et al. | 1987
- 2046
-
Angle resolved ultraviolet photoelectron spectroscopy study of ultrathin iron films on Si(111) surfacesUrano, T. / Ogawa, T. / Kanaji, T. / Fujimoto, F. et al. | 1987
- 2051
-
A photoemission survey of the electronic properties of ternary semimagnetic semiconductor alloysWall, A. / Chang, S. / Philip, P. / Caprile, C. / Franciosi, A. / Reifenberger, R. / Pool, F. et al. | 1987
- 2057
-
Straightforward experimental evidence against the electron affinity ruleNiles, D. W. / Tang, Ming / Höchst, H. / Margaritondo, G. et al. | 1987
- 2060
-
Nonlinear optical response of [111] growth axis strained‐layer superlatticesSmith, D. L. / Mailhiot, C. et al. | 1987
- 2065
-
Summary Abstract: Low‐energy electron transmission through Cu/Ni quantum wellsZhu, Qi‐Gao / Yang, Yunong / Williams, Ellen D. / Park, Robert L. et al. | 1987
- 2067
-
Advances in vacuum contamination control for electronic materials processingO’Hanlon, John F. et al. | 1987
- 2073
-
Development of test bed system for high melting temperature alloy fabrication and mass spectroscopy analysis of liquid metal ion beam sourceHiguchi‐Rusli, R. H. / Corelli, J. C. / Steckl, A. J. / Cadien, K. C. et al. | 1987
- 2077
-
Automatic process control for artificially layered structuresGogol, C. A. / Deutschman, R. A. / Bean, J. C. et al. | 1987
- 2081
-
End‐Hall ion sourceKaufman, Harold R. / Robinson, Raymond S. / Seddon, Richard Ian et al. | 1987
- 2085
-
Stabilization of tetragonal ZrO2 with Al2O3 in reactive magnetron sputtered thin filmsGilmore, C. M. / Quinn, C. / Qadri, S. B. / Gossett, C. R. / Skelton, E. F. et al. | 1987
- 2088
-
Substrate temperature dependence of hillock, grain, and crystal orientation in sputtered Al–alloy filmsKobayashi, Tsukasa / Kitahara, Hiroaki / Hosokawa, Naokichi et al. | 1987
- 2092
-
The structure and electroluminescent characteristics of ZnS:Mn thin filmsNakanishi, Yoichiro / Shimaoka, Goro et al. | 1987
- 2098
-
Summary Abstract: Integrated system for studies of thin‐film chemical growth processes on silicon wafersRenier, M. / Liehr, M. / Gates, S. M. / O’Sullivan, J. / Rubloff, G. W. / Meyerson, B. S. et al. | 1987
- 2100
-
Epitaxial photochemical deposition of II–VI semiconductorsIrvine, S. J. C. / Mullin, J. B. et al. | 1987
- 2106
-
Ion beam sputter deposition and epitaxy of CdTe and HgCdTe filmsKrishnaswamy, S. V. / Rieger, J. H. / Doyle, N. J. / Francombe, M. H. et al. | 1987
- 2111
-
Thin metallic silicide films epitaxially grown on Si(111) and their role in Si–metal–Si devicesDerrien, J. / d’Avitaya, F. Arnaud et al. | 1987
- 2121
-
Crystalline intermediate phases in the formation of epitaxial NiSi2 on Si(111)Bennett, P. A. / Halawith, B. N. / Johnson, A. P. et al. | 1987
- 2127
-
Conductivity and mobility in very thin epitaxial NiSi2 layersHenzler, M. / Adamski, C. / Rönner, K. et al. | 1987
- 2131
-
Electrical properties of vacuum annealed Si surfacesLiehr, M. / Renier, M. / Wachnik, R. A. / Werner, J. / Scilla, G. S. / Ho, P. S. et al. | 1987
- 2135
-
Low‐temperature epitaxy of Si and Ge by direct ion beam depositionZuhr, R. A. / Appleton, B. R. / Herbots, N. / Larson, B. C. / Noggle, T. S. / Pennycook, S. J. et al. | 1987
- 2140
-
Summary Abstract: Epitaxial growth of ZnS and ZnSe on the low index faces of GaAs using atomic layer epitaxyNelson, Jeffrey G. et al. | 1987
- 2141
-
Summary Abstract: Core level spectroscopy of the GaAs‐on‐Si interfaceBringans, R. D. / Olmstead, M. A. / Uhrberg, R. I. G. / Bachrach, R. Z. et al. | 1987