Terahertz/optical sum and difference frequency generation in liquids (Englisch)
Nationallizenz
- Neue Suche nach: Feil, Thomas
- Neue Suche nach: Allen, S. J.
- Neue Suche nach: Feil, Thomas
- Neue Suche nach: Allen, S. J.
In:
Applied Physics Letters
;
98
, 6
;
3
;
2011
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Terahertz/optical sum and difference frequency generation in liquids
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Beteiligte:Feil, Thomas ( Autor:in ) / Allen, S. J. ( Autor:in )
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Erschienen in:Applied Physics Letters ; 98, 6 ; 3
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Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:07.02.2011
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Format / Umfang:3 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 98, Ausgabe 6
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Photoluminescence enhancement and quenching in metal-semiconductor quantum dot hybrid arrays (3 pages)Haridas, M. / Tripathi, L.N. / Basu, J.K. et al. | 2011
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Achieving high efficiency laminated polymer solar cell with interfacial modified metallic electrode and pressure induced crystallizationYuan, Yongbo / Bi, Yu / Huang, Jinsong et al. | 2011
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Achieving high efficiency laminated polymer solar cell with interfacial modified metallic electrode and pressure induced crystallization (3 pages)Yuan, Y. / Bi, Y. / Huang, J. et al. | 2011
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Photoinduced magnetoresistance in organic field-effect transistorsReichert, Thomas / Saragi, Tobat P. I. et al. | 2011
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Photoinduced magnetoresistance in organic field-effect transistors (3 pages)Reichert, T. / Saragi, T.P.I. et al. | 2011
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Room-temperature semiconductor coherent Smith-Purcell terahertz sources (3 pages)Smith, D.D. / Belyanin, A. et al. | 2011
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Room-temperature semiconductor coherent Smith–Purcell terahertz sourcesSmith, Don D. / Belyanin, Alexey et al. | 2011
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Temperature effect on negative bias-induced instability of HfInZnO amorphous oxide thin film transistor (3 pages)Kwon, D.W. / Kim, J.H. / Chang, J.S. / Kim, S.W. / Kim, W. / Park, J.C. / Song, I. / Kim, C.J. / Jung, U.I. / Park, B.-G. et al. | 2011
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Temperature effect on negative bias-induced instability of HfInZnO amorphous oxide thin film transistorKwon, Dae Woong / Kim, Jang Hyun / Chang, Ji Soo / Kim, Sang Wan / Kim, Wandong / Park, Jae Chul / Song, Ihun / Kim, Chang Jung / Jung, U In / Park, Byung-Gook et al. | 2011
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Diameter-dependent analytical model for light spot movement in carbon nanotube array transistors (3 pages)Abdolkader, T.M. / Alam, M.A. et al. | 2011
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Diameter-dependent analytical model for light spot movement in carbon nanotube array transistorsAbdolkader, Tarek M. / Alam, Muhammad A. et al. | 2011
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Bulk and interface trap generation under negative bias temperature instability stress of p-channel metal-oxide-semiconductor field-effect transistors with nitrogen and silicon incorporated gate dielectricsChoi, Changhwan / Lee, Jack C. et al. | 2011
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Bulk and interface trap generation under negative bias temperature instability stress of p-channel metal-oxide-semiconductor field-effect transistors with nitrogen and silicon incorporated HfO~2 gate dielectrics (3 pages)Choi, C. / Lee, J.C. et al. | 2011
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Fast polarization switching panel with high brightness and contrast ratio for three-dimensional displayShin, Hun Ki / Lee, Joong Ha / Kim, Jung-Wook / Yoon, Tae-Hoon / Kim, Jae Chang et al. | 2011
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Fast polarization switching panel with high brightness and contrast ratio for three-dimensional display (3 pages)Shin, H.K. / Lee, J.H. / Kim, J.-W. / Yoon, T.-H. / Kim, J.C. et al. | 2011
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Material anisotropy unveiled by random scattering of surface acoustic waves (3 pages)Laude, V. / Kokkonen, K. / Benchabane, S. / Kaivola, M. et al. | 2011
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Material anisotropy unveiled by random scattering of surface acoustic wavesLaude, Vincent / Kokkonen, Kimmo / Benchabane, Sarah / Kaivola, Matti et al. | 2011
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Atomic-scale origins of bias-temperature instabilities in structuresShen, Xiao / Zhang, En Xia / Zhang, Cher Xuan / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Dhar, Sarit / Ryu, Sei-Hyung / Pantelides, Sokrates T. et al. | 2011
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Atomic-scale origins of bias-temperature instabilities in SiC-SiO~2 structures (3 pages)Shen, X. / Zhang, E.X. / Zhang, C.X. / Fleetwood, D.M. / Schrimpf, R.D. / Dhar, S. / Ryu, S.-H. / Pantelides, S.T. et al. | 2011
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Ambient field effects on the current-voltage characteristics of nanowire field effect transistors (3 pages)Karmalkar, S. / Maheswaran, K.R.K. / Gurugubelli, V. et al. | 2011
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Ambient field effects on the current-voltage characteristics of nanowire field effect transistorsKarmalkar, Shreepad / Maheswaran, K. R. K. / Gurugubelli, Vijayakumar et al. | 2011
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Electric response of a cell of hydrogel: Role of the electrodes (3 pages)Alexe-Ionescu, A.L. / Atasiei, R. / Dascalu, C. / Freire, F.C.M. / Barbero, G. et al. | 2011
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Electric response of a cell of hydrogel: Role of the electrodesAlexe-Ionescu, A. L. / Atasiei, R. / Dascalu, C. / Freire, F. C. M. / Barbero, G. et al. | 2011
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Comment on ``Ultrahigh secondary electron emission of carbon nanotubes'' [Appl. Phys. Lett. 96, 213113 (2010)] (1 page)Alam, M.K. / Pease, R.F.W. / Nojeh, A. et al. | 2011
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Comment on “Ultrahigh secondary electron emission of carbon nanotubes” [Alam, M. K. / Pease, R. F. W. / Nojeh, A. et al. | 2011
Appl. Phys. Lett. 96, 213113 (2010)] -
Response to “Comment on ‘Ultrahigh secondary electron emission of carbon nanotubes’ ” [Luo, Jun / Warner, Jamie H. / Briggs, G. Andrew D. et al. | 2011
Appl. Phys. Lett. 98, 066101 (2011)] - 066102
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Response to ``Comment on `Ultrahigh secondary electron emission of carbon nanotubes' '' [Appl. Phys. Lett. 98, 066101 (2011)] (2 pages)Luo, J. / Warner, J.H. / Briggs, G.A.D. et al. | 2011
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Erratum: “Ferromagnetism of double-walled carbon nanotubes” [Yan, Der-Chung / Chen, Shih-Yun / Wu, Maw-Kuen / Chi, C. C. / Chao, J. H. / Green, Malcolm L. H. / Chu, Bryan Tsu-Te et al. | 2011
Appl. Phys. Lett. 96, 242503 (2010)] -
Erratum: Role of graphene/substrate interface on the local transport properties of the two-dimensional electron gas [Sonde, S. / Giannazzo, F. / Vecchio, C. / Yakimova, R. / Rimini, E. / Raineri, V. et al. | 2011
Appl. Phys. Lett. 97, 132101 (2010)]