3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling (Englisch)
Freier Zugriff
- Neue Suche nach: Taylor, Michael
- Neue Suche nach: Scurr, David
- Neue Suche nach: Lutolf, Matthias
- Neue Suche nach: Buttery, Lee
- Neue Suche nach: Zelzer, Mischa
- Neue Suche nach: Alexander, Morgan
- Neue Suche nach: Taylor, Michael
- Neue Suche nach: Scurr, David
- Neue Suche nach: Lutolf, Matthias
- Neue Suche nach: Buttery, Lee
- Neue Suche nach: Zelzer, Mischa
- Neue Suche nach: Alexander, Morgan
In:
Biointerphases
;
11
, 2
;
7
;
2016
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling
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Weitere Titelangaben:3D chemical characterization of frozen hydrated hydrogels
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Beteiligte:Taylor, Michael ( Autor:in ) / Scurr, David ( Autor:in ) / Lutolf, Matthias ( Autor:in ) / Buttery, Lee ( Autor:in ) / Zelzer, Mischa ( Autor:in ) / Alexander, Morgan ( Autor:in )
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Erschienen in:Biointerphases ; 11, 2 ; 7
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.06.2016
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Format / Umfang:7 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 11, Ausgabe 2
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