Contactless analysis of electric dipoles at high-k/SiO2 interfaces by surface-charge-switched electron spectroscopy (Englisch)
- Neue Suche nach: Toyoda, S.
- Neue Suche nach: Fukuda, K.
- Neue Suche nach: Itoh, E.
- Neue Suche nach: Sugaya, H.
- Neue Suche nach: Morita, M.
- Neue Suche nach: Nakata, A.
- Neue Suche nach: Uchimoto, Y.
- Neue Suche nach: Matsubara, E.
- Neue Suche nach: Toyoda, S.
- Neue Suche nach: Fukuda, K.
- Neue Suche nach: Itoh, E.
- Neue Suche nach: Sugaya, H.
- Neue Suche nach: Morita, M.
- Neue Suche nach: Nakata, A.
- Neue Suche nach: Uchimoto, Y.
- Neue Suche nach: Matsubara, E.
In:
Applied Physics Letters
;
108
, 21
;
5
;
2016
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Contactless analysis of electric dipoles at high-k/SiO2 interfaces by surface-charge-switched electron spectroscopy
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Beteiligte:Toyoda, S. ( Autor:in ) / Fukuda, K. ( Autor:in ) / Itoh, E. ( Autor:in ) / Sugaya, H. ( Autor:in ) / Morita, M. ( Autor:in ) / Nakata, A. ( Autor:in ) / Uchimoto, Y. ( Autor:in ) / Matsubara, E. ( Autor:in )
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Erschienen in:Applied Physics Letters ; 108, 21 ; 5
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Verlag:
- Neue Suche nach: AIP Publishing LLC
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Erscheinungsdatum:23.05.2016
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Format / Umfang:5 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 108, Ausgabe 21
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