Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source (Englisch)
- Neue Suche nach: Mukhopadhyay, D.
- Neue Suche nach: Bandyopadhyay, M.
- Neue Suche nach: Tyagi, H.
- Neue Suche nach: Patel, K.
- Neue Suche nach: Mukhopadhyay, D.
- Neue Suche nach: Bandyopadhyay, M.
- Neue Suche nach: Tyagi, H.
- Neue Suche nach: Patel, K.
In:
Review of Scientific Instruments
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95
, 4
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14
;
2024
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source
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Weitere Titelangaben:Mukhopadhyay et al.
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Beteiligte:Mukhopadhyay, D. ( Autor:in ) / Bandyopadhyay, M. ( Autor:in ) / Tyagi, H. ( Autor:in ) / Patel, K. ( Autor:in )
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Erschienen in:Review of Scientific Instruments ; 95, 4 ; 14
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Verlag:
- Neue Suche nach: AIP Publishing LLC
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Erscheinungsdatum:01.04.2024
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Format / Umfang:14 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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