Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopy (Englisch)
- Neue Suche nach: Komiyama, Masaharu
- Neue Suche nach: Kobayashi, Jun’ichi
- Neue Suche nach: Morita, Seizo
- Neue Suche nach: Komiyama, Masaharu
- Neue Suche nach: Kobayashi, Jun’ichi
- Neue Suche nach: Morita, Seizo
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
8
, 1
;
608-609
;
1990
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopy
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Weitere Titelangaben:Platinum ultrafine particles in Pt/C catalyst
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Beteiligte:
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.01.1990
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Format / Umfang:2 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 8, Ausgabe 1
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36th National Symposium of the American Vacuum Society, 23-27 Oct. 1989, Boston, MA, USA| 1990
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In situ scanning tunneling microscopy observation of surface roughness of electrochemically modified Ag under potentiostatic control in conjunction with surface‐enhanced Raman scatteringSakamaki, K. / Itoh, K. / Fujishima, A. / Gohshi, Y. et al. | 1990
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Chloride ion‐induced large scale reconstruction on an electrochemically roughened Ag electrodeOtsuka, I. / Iwasaki, T. et al. | 1990
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Scanning tunneling microscopy studies of semiconductor electrochemistryThundat, T. / Nagahara, L. A. / Lindsay, S. M. et al. | 1990
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A scanning tunneling microscopy study of the surface microstructure of alpha‐ and beta‐lead dioxideSexton, Brett A. / Cotterill, Guy F. / Fletcher, Stephen / Horne, Michael D. et al. | 1990
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Scanning tunneling spectroscopy on cleaved silicon pn junctionsKordić, S. / van Loenen, E. J. / Dijkkamp, D. / Hoeven, A. J. / Moraal, H. K. et al. | 1990
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Observation of double heterostructures for laser diodes using scanning tunneling microscopy and current imaging tunneling spectroscopy in airTanimoto, M. / Nakano, Y. et al. | 1990
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Power spectra of surface roughness of light emitting tunnel junctions measured by scanning tunneling microscopyTakeuchi, K. / Uehara, Y. / Ushioda, S. / Mikoshiba, N. / Morita, S. et al. | 1990
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- 571
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- 574
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Local modification of organic dye materials by dielectric breakdownKaneko, R. / Hamada, E. et al. | 1990
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Fabrication of nucleation sites for nanometer size selective deposition by scanning tunneling microscopeTerashima, Kazuo / Kondoh, Minoru / Yoshida, Toyonobu et al. | 1990
- 585
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Thermal noise in vacuum scanning tunneling microscopy at zero bias voltageMöller, R. / Esslinger, A. / Koslowski, B. et al. | 1990
- 594
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- 608
-
Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopyKomiyama, Masaharu / Kobayashi, Jun’ichi / Morita, Seizo et al. | 1990
- 610
-
Scanning tunneling microscopy investigation of a spontaneous monolayer dispersion system: HgCl2 on highly oriented pyrolitic graphite surfaceXie, Y. / Xu, Q. / Tang, Y. / Bai, C. / Dai, C. et al. | 1990
- 614
-
Surface density of states of TiO2(110) single crystal and adsorbed molecular observation by scanning tunneling microscopy and tunneling spectroscopySakamaki, K. / Itoh, K. / Fujishima, A. / Gohshi, Y. et al. | 1990
- 618
-
Material contrast using the scanning tunneling microscope in ambient conditionsStrecker, H. / Stahl, C. / Starke, H. et al. | 1990
- 621
-
Evaluation of elastic emission machined surfaces by scanning tunneling microscopyMori, Yuzo / Yamauchi, Kazuto / Endo, Katsuyoshi / Ide, Takashi / Toyota, Hiromichi / Nishizawa, Keitaro / Hasegawa, Minoru et al. | 1990
- 625
-
A scanning tunneling microscopy/current imaging tunneling spectroscopy investigation of an organic molecule: 4‐cyano‐4’‐n‐heptylbiphenylOkumura, A. / Miyamura, K. / Gohshi, Y. et al. | 1990
- 628
-
Observation of Vickers imprints by scanning tunneling microscopyMiyazaki, Y. / Koga, Y. / Hayashi, H. et al. | 1990
- 631
-
Surface roughness of rubbed polyimide film for liquid crystals by scanning tunneling microscopySuzuki, M. / Maruno, T. / Yamamoto, F. / Nagai, K. et al. | 1990
- 635
-
Imaging of biomolecules with the scanning tunneling microscope: Problems and prospectsSalmeron, M. / Beebe, T. / Odriozola, J. / Wilson, T. / Ogletree, D. F. / Siekhaus, W. et al. | 1990
- 642
-
Molecular structure of organic compounds observed by high resolution scanning tunneling microscopySelci, S. / Cricenti, A. / Felici, A. C. / Generosi, R. / Gori, E. / Djaczenko, W. / Chiarotti, G. et al. | 1990
- 645
-
Direct observation of bioelectrochemical processes by scanning tunneling microscopyThundat, T. / Nagahara, L. A. / Oden, P. / Lindsay, S. M. et al. | 1990
- 648
-
Polypeptide structures imaged by the scanning tunneling microscopeMcMaster, T. J. / Carr, H. / Miles, M. J. / Cairns, P. / Morris, V. J. et al. | 1990
- 652
-
Direct observations of enzymes and their complexes by scanning tunneling microscopyElings, Virgil B. / Edstrom, Ronald D. / Meinke, Marilyn H. / Yang, Xiuru / Yang, Rui / Evans, D. Fennell et al. | 1990
- 655
-
Scanning tunneling microscopy for studying the biomaterial–biological tissue interfaceEmch, R. / Clivaz, X. / Taylor‐Denes, C. / Vaudaux, P. / Descouts, P. et al. | 1990
- 659
-
The topography of isolated molecules of copper–phthalocyanine adsorbed on GaAs(110)Möller, R. / Coenen, R. / Esslinger, A. / Koslowski, B. et al. | 1990
- 661
-
Scanning tunneling microscopy imaging of uncoated biological materialJericho, M. H. / Blackford, B. L. / Dahn, D. C. / Frame, C. / Maclean, D. et al. | 1990
- 667
-
Mechanisms for the deposition of nanometer‐sized structures from organic fluids using the scanning tunneling microscopeBernhardt, R. H. / McGonigal, G. C. / Schneider, R. / Thomson, D. J. et al. | 1990
- 672
-
Adsorption of liquid crystals imaged using scanning tunneling microscopyMcMaster, T. J. / Carr, H. / Miles, M. J. / Cairns, P. / Morris, V. J. et al. | 1990
- 675
-
Scanning tunneling spectroscopy study of adsorbed moleculesMizutani, W. / Shigeno, M. / Sakakibara, Y. / Kajimura, K. / Ono, M. / Tanishima, S. / Ohno, K. / Toshima, N. et al. | 1990
- 679
-
Reactive graphite etch and the structure of an adsorbed organic monolayer—a scanning tunneling microscopy studyRabe, Jürgen P. / Buchholz, Stefan / Ritcey, Anna M. et al. | 1990
- 684
-
Scanning tunneling microscopy of the phosphatidylcholine bilayersLuo, Changhong / Zhu, Chuanfeng / Ruan, Like / Huang, Guizhen / Dai, Changchun / Cheng, Zhengbo / Bai, Chunli / Su, Yaxian / Xu, Sanduo / Lin, Kechun et al. | 1990
- 687
-
Scanning tunneling microscopy of cytoskeletal proteins: Microtubules and intermediate filamentsHameroff, Stuart / Simic‐Krstic, Yovana / Vernetti, Lawrence / Lee, Y. C. / Sarid, Dror / Wiedmann, Jerome / Elings, Virgil / Kjoller, Kevin / McCuskey, Robert et al. | 1990
- 692
-
Application of scanning tunneling microscopy for imaging of CNBr‐peptides of type I collagenSnellman, H. / Pelliniemi, L. J. / Penttinen, R. / Laiho, R. et al. | 1990
- 695
-
The surface structure of artificial and natural membranes as studied by scanning tunneling microscopyYa‐Xian, Su / Yue‐Kan, Jiao / San‐Duo, Xu / Jun‐En, Yao / Ke‐Chun, Lin et al. | 1990
- 698
-
Scanning tunneling microscopy of biomoleculesMiles, M. J. / McMaster, T. / Carr, H. J. / Tatham, A. S. / Shewry, P. R. / Field, J. M. / Belton, P. S. / Jeenes, D. / Hanley, B. / Whittam, M. et al. | 1990
- 703
-
Deoxyribonucleic acid structures visualized by scanning tunneling microscopyBendixen, C. / Besenbacher, F. / Lægsgaard, E. / Stensgaard, I. / Thomsen, B. / Westergaard, O. et al. | 1990
- 706
-
Scanning tunneling microscopy images of metal‐coated bacteriophages and uncoated, double‐stranded DNAKeller, Rebecca W. / Dunlap, David D. / Bustamante, Carlos / Keller, David J. / Garcia, Ricardo G. / Gray, Carla / Maestre, Marcos F. et al. | 1990
- 713
-
Scanning tunneling microscopic immunoassay: A preliminary experimentMasai, Junji / Sorin, Takaaki / Kondo, Shunzo et al. | 1990
- 1294
-
A comparison of SiO2 planarization layers by hollow cathode enhanced direct current reactive magnetron sputtering and radio frequency magnetron sputteringDawson-Elli, D.F. / Lefkow, A.R. / Nordman, J.E. et al. | 1990
- 1299
-
Film thickness distribution control with off-axis circular magnetron sources onto rotating substrate holders: comparison of computer simulation with practical resultsSwann, S. / Collett, S.A. / Scarlett, I.R. et al. | 1990
- 1325
-
Beam parameter effects on magnetic properties of sputtered amorphous Fe40Ni40B15Si5 and Fe40Co40B15Si5 filmsHarris, V.G. / Oliver, S.A. / Nowak, W.B. / Vittoria, C. et al. | 1990
- 1369
-
Electronic stability of the reactively sputtered hydrogenated amorphous silicon thin films: the effect of hydrogen contentPinarbasi, M. / Kushner, M.J. / Abelson, J.R. et al. | 1990
- 1399
-
Low resistivity indium-tin oxide transparent conductive films. I. Effect of introducing H2O gas or H2 gas during direct current magnetron sputteringIshibashi, S. / Higuchi, Y. / Ota, Y. / Nakamura, K. et al. | 1990
- 1403
-
Low resistivity indium-tin oxide transparent conductive films. II. Effect of sputtering voltage on electrical property of filmsIshibashi, S. / Higuchi, Y. / Ota, Y. / Nakamura, K. et al. | 1990
- 1411
-
Area selective metalorganic chemical vapor deposition of gold on tungsten patterned on siliconColgate, S.O. / Palenik, G.J. / House, V.E. / Schoenfeld, D.W. et al. | 1990
- 1413
-
Thermodynamic modeling of selective chemical vapor deposition processes in microelectronic siliconMadar, R. / Bernard, C. et al. | 1990
- 1474
-
The effects of alloying on stress induced void formation in aluminum-based metallizationsRyan, J.G. / Riendeau, J.B. / Shore, S.E. / Slusser, G.J. / Beyar, D.C. / Bouldin, D.P. / Sullivan, T.D. et al. | 1990
- 1480
-
Aluminum-samarium alloy for interconnections in integrated circuitsJoshi, A. / Gardner, D. / Hu, H.S. / Mardinly, A.J. / Nieh, T.G. et al. | 1990
- 1484
-
Submicron two-layer metal system of selective tungsten and TiW cap metallizationMattox, R.J. / Wilson, S.R. / Sellers, J.A. et al. | 1990
- 1498
-
Dry etching of TiN/Al(Cu)/Si for very large scale integrated local interconnectionsHu, C.K. / Mazzeo, N. / Basavaiah, S. / Small, M.B. / Choi, K.W. et al. | 1990
- 1503
-
Hydrogen plasmas for flux free flip-chip solder bondingPickering, K. / Southworth, P. / Wort, C. / Parsons, A. / Pedder, D.J. et al. | 1990
- 1509
-
Electrical conductivity of as-prepared and annealed amorphous hydrogenated carbon filmsReyes-Mena, A. / Gonzalez-Hernandez, J. / Asomoza, R. / Chao, B.S. et al. | 1990
- 1514
-
Impurity effects in partially ionized beam metal via fillingGittleman, B. / Bai, P. / Yang, G.R. / Lu, T.M. / Hu, C.K. et al. | 1990
- 1529
-
Slope control of molybdenum lines etched with reactive ion etchingYue Kuo / Crowe, J.R. et al. | 1990
- 1577
-
Structural characterization of alpha -Sn and alpha -Sn1-xGex alloys grown by molecular beam epitaxy on CdTe and InSbBowman, R.C. jun. / Adams, P.M. / Englehardt, M.A. / Hochst, H. et al. | 1990
- 1587
-
Ion-irradiation-induced suppression of three-dimensional island formation during InAs growth on Si(100)Choi, C.H. / Hultman, L. / Barnett, S.A. et al. | 1990
- 1603
-
Physical vapor deposition equipment evaluation and characterization using statistical methodsDharmadhikari, V.S. / Lynch, R.O. / Brennan, W. / Cronin, W. / Rastogi, R. et al. | 1990
- 1618
-
Continuous-wave laser doping of micrometer-sized features in gallium arsenide using a dimethylzinc ambientLicata, T.J. / Podlesnik, D.V. / Tang, H. / Herman, I.P. / Osgood, R.M. jun. / Schwarz, S.A. et al. | 1990
- 1648
-
The importance of free radical recombination reactions in CF4/O4 plasma etching of siliconDalvie, M. / Jensen, K.F. et al. | 1990
- 1654
-
Scaling laws for radio frequency glow discharges for dry etchingParanjpe, A.P. / McVittie, J.P. / Self, S.A. et al. | 1990
- 1677
-
Plasma-material interactionsHess, D.W. et al. | 1990
- 1690
-
Methyl radical etching of compound semiconductors with a secondary afterglow reactorSpencer, J.E. / Schimert, T.R. / Dinan, J.H. / Endres, D. / Hayes, T.R. et al. | 1990
- 1696
-
Reactive ion etching of silicon using bromine containing plasmasBestwick, T.D. / Oehrlein, G.S. et al. | 1990
- 1702
-
Reactive ion etching of plasma enhanced chemical vapor deposition amorphous silicon and silicon nitride: feeding gas effectsYue Kuo et al. | 1990
- 1706
-
The effects of polymer film formation on photoresist (OFPR-800) during plasma etching in C2F6/CHF3/HeThomas, J.H. III / White, L.K. / Miszkowski, N. et al. | 1990
- 1712
-
Plasma power dissipation at wafer surfaces measured using pulsed photoluminescence spectroscopyMitchell, A. / Gottscho, R.A. et al. | 1990
- 1835
-
High rate radio frequency sputtering using in-phase plasma confinementLogan, J.S. / Costable, J. / Jones, F. / Lucy, J.E. et al. | 1990
- 1840
-
Broad beam extraction from a new sputtering-type ion source using an electric mirrorMatsuoka, M. / Ono, K. et al. | 1990
- 1844
-
Digital chemical vapor deposition and etching technologies for semiconductor processingHoriike, Y. / Tanaka, T. / Nakano, M. / Iseda, S. / Sakaue, H. / Nagata, A. / Shindo, H. / Miyazaki, S. / Hirose, M. et al. | 1990
- 1851
-
Modulated discharges: effect on plasma parameters and depositionVerdeyen, J.T. / Beberman, J. / Overzet, L. et al. | 1990
- 1857
-
Defect microchemistry in SiO2/Si structuresRubloff, G.W. et al. | 1990
- 1871
-
Thermal stabilization of device quality films deposited at low temperaturesFitch, J.T. / Kim, S.S. / Lucovsky, G. et al. | 1990
- 1888
-
CdZnTe/ZnTe and HgCdTe/CdTe quantum wells grown by molecular beam epitaxyFeldman, R.D. et al. | 1990
- 1912
-
Investigation of buried homojunctions in p-InP formed during sputter deposition of both indium tin oxide and indium oxideGessert, T.A. / Li, X. / Wanlass, M.W. / Nelson, A.J. / Coutts, T.J. et al. | 1990
- 1917
-
Controlled modification of heterojunction band lineups by diffusive intralayersMcKinley, J.T. / Hwu, Y. / Rioux, D. / Terrasi, A. / Zanini, F. / Margaritondo, G. / Debska, U. / Furdyna, J.K. et al. | 1990
- 1926
-
Band bending at Al, In, Ag, and Pt interfaces with CdTe and ZnTe(110)Wahi, A.K. / Miyano, K. / Carey, G.P. / Chiang, T.T. / Lindau, I. / Spicer, W.E. et al. | 1990
- 1934
-
Photoconductive characterization of ZnxCd1-xTe (0Lopez-Cruz, E. / Gonzalez-Hernandez, J. / Allred, D.D. / Allred, W.P. et al. | 1990
- 1939
-
Integrated thermal chemical vapor deposition processing for Si technologyLiehr, M. et al. | 1990
- 1947
-
Formation of silicon-based heterostructures in multichamber integrated-processing thin-film deposition systemsLucovsky, G. / Kim, S.S. / Tsu, D.V. / Parsons, G.N. / Fitch, J.T. et al. | 1990
- 1969
-
Molecular-beam study of gas-surface chemistry in the ion-assisted etching of silicon with atomic and molecular hydrogen and chlorineMei-Chen Chuang / Coburn, J.W. et al. | 1990
- 1983
-
Synchrotron radiation photoemission study of the formation of the Ag/GaSb(110) interfaceMao, D. / Soonckindt, L. / Kahn, A. / Terrasi, A. / Margaritondo, G. et al. | 1990
- 1988
-
Overlayer morphology and metallicity: formation of In/GaSb(110) barriers at room and low temperatureLu, Z.M. / Mao, D. / Soonckindt, L. / Kahn, A. et al. | 1990
- 1993
-
X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy studies of the effects of Ni layer on AuGe/GaAs(100) interfaceAres Fang, C.S. / Chang, Y.L. / Tse, W.S. et al. | 1990
- 2004
-
Minority carrier diffusion length of p-GaAs determined by time of flightKeyes, B.M. / Dunlavy, D.J. / Ahrenkiel, R.K. / Asher, S.E. / Partain, L.D. / Liu, D.D. / Kuryla, M.S. et al. | 1990
- 2012
-
Effects of annealing and surface preparation on the properties of polycrystalline CdZnTe films grown by molecular beam epitaxyRingel, S.A. / Sudharsanan, R. / Rohatgi, A. / Owens, M.S. / Gillis, H.P. et al. | 1990
- 2020
-
X-ray absorption of As low-energy ion implanted into Si(100) grown by molecular-beam epitaxyTyliszczak, T. / Hitchcock, A.P. / Jackman, T.E. et al. | 1990
- 2025
-
Microcorrosion of Al-Cu and Al-Cu-Si alloys: interaction of the metallization with subsequent aqueous photolithographic processingWeston, D. / Wilson, S.R. / Kottke, M. et al. | 1990
- 2033
-
Growth structure of excited oxygen on GaAs(111) surfacesAlonso, M. / Soria, F. / Gonzalez, M.L. et al. | 1990
- 2039
-
Substrate temperature dependence of subcutaneous oxidation at Si/SiO2 interfaces formed by remote plasma-enhanced chemical vapor depositionKim, S.S. / Stephens, D.J. / Lucovsky, G. / Fountain, G.G. / Markunas, R.J. et al. | 1990
- 2049
-
Electrical and structural characterization of Mo/Si contact to n-GaAsKulkarni, A.K. / Patkar, M.P. et al. | 1990
- 2079
-
Backside secondary ion mass spectrometry investigation of ohmic and Schottky contacts on GaAsSchwarz, S.A. / Palmstrom, C.J. / Schwartz, C.L. / Sands, T. / Shantharama, L.G. / Harbison, J.P. / Florez, L.T. / Marshall, E.D. / Han, C.C. / Lau, S.S. et al. | 1990
- 2084
-
'Pinning' and Fermi level movement at GaAs surfaces and interfacesSpicer, W.E. / Newman, N. / Spindt, C.J. / Liliental-Weber, Z. / Weber, E.R. et al. | 1990
- 2090
-
The interface state study of TaSix/GaAs Schottky barrierKao, C.H. / Huang, F.S. / Jiann-Ruey Chen et al. | 1990