A new technique for characterization of thin‐film ferroelectric memory devices (Englisch)
- Neue Suche nach: Rohrer, G.
- Neue Suche nach: Narayan, S.
- Neue Suche nach: McMillan, L.
- Neue Suche nach: Kulkarni, A.
- Neue Suche nach: Rohrer, G.
- Neue Suche nach: Narayan, S.
- Neue Suche nach: McMillan, L.
- Neue Suche nach: Kulkarni, A.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
6
, 3
;
1756-1758
;
1988
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:A new technique for characterization of thin‐film ferroelectric memory devices
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Weitere Titelangaben:Technique for characterization of memory devices
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Beteiligte:Rohrer, G. ( Autor:in ) / Narayan, S. ( Autor:in ) / McMillan, L. ( Autor:in ) / Kulkarni, A. ( Autor:in )
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Erschienen in:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films ; 6, 3 ; 1756-1758
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.05.1988
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Format / Umfang:3 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 6, Ausgabe 3
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 573
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Summary Abstract: Low‐energy electron microscopyBauer, E. / Telieps, W. / Turner, G. et al. | 1988
- 574
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Summary Abstract: Scanning electron microscopy with polarization analysis: Studies of magnetic microstructuresCelotta, R. J. / Unguris, J. / Pierce, D. T. et al. | 1988
- 575
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Summary Abstract: Atomic force microscopy studies of frictional forces and of force effects in scanning tunneling microscopyMate, C. Mathew / Erlandsson, Ragnar / McClelland, Gary M. / Chiang, Shirley et al. | 1988
- 576
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Summary Abstract: Chemisorption induced reconstruction in Ni(110)–H systemKuk, Y. / Silverman, P. J. / Nguyen, H. Q. et al. | 1988
- 577
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Summary Abstract: Imaging oxygen acceptor states on the GaAs(110) surfaceStroscio, Joseph A. / Feenstra, R. M. et al. | 1988
- 579
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Ferromagnetic order and critical behavior at surfaces of ultrathin V(100)p(1×1) films on Ag(100)Rau, C. / Xing, G. / Robert, M. et al. | 1988
- 582
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Two‐dimensional energy bands for Cr/Au(001)O’Neill, D. G. / Weaver, J. H. et al. | 1988
- 585
-
Summary Abstract: The magnetic probing depth of spin polarized secondary electrons and the influence of elastic spin–flip processesAbraham, D. L. / Hopster, H. et al. | 1988
- 586
-
Summary Abstract: Spin‐polarized electron energy‐loss spectroscopy of metastable body‐centered‐cubic CoIdzerda, Y. U. / Lind, D. M. / Prinz, G. A. / Jonker, B. T. / Krebs, J. J. et al. | 1988
- 588
-
Medium‐energy ion scattering studies of relaxation at metal surfacesYalisove, S. M. / Graham, W. R. et al. | 1988
- 597
-
Growth, atomic structure, and oxidation of chromium overlayers on W(110)Shinn, Neal D. / Berlowitz, Paul J. et al. | 1988
- 600
-
Nature of bonding between alkali metals and silicon surfaceBatra, Inder P. / Bagus, Paul S. et al. | 1988
- 607
-
Crystal growth of Ge studied by reflection high‐energy electron diffraction and photoemissionAarts, J. / Hoeven, A.‐J. / Larsen, P. K. et al. | 1988
- 611
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Surface structure analysis using reflection high‐energy electron diffractionJamison, K. D. / Zhou, D. N. / Cohen, P. I. / Zhao, T. C. / Tong, S. Y. et al. | 1988
- 615
-
Low‐energy electron diffraction analysis of the Si(111)7×7 structureTong, S. Y. / Huang, H. / Wei, C. M. / Packard, W. E. / Men, F. K. / Glander, G. / Webb, M. B. et al. | 1988
- 625
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Low‐energy neutral/ion backscattering at As/Si(001)Niehus, H. / Mann, K. / Eldridge, B. N. / Yu, M. L. et al. | 1988
- 630
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Summary Abstract: X‐ray diffraction study of multilayer W(001) surface reconstructionAltman, M. S. / Estrup, P. J. / Robinson, I. K. et al. | 1988
- 631
-
Summary Abstract: Field ion microscope studies of the deuterium‐induced surface reconstruction of Ni(110)Kellogg, G. L. et al. | 1988
- 633
-
Summary Abstract: The structure of benzene coadsorbed with CO on Pd(111): A dynamical low‐energy electron diffraction studyOhtani, H. / Van Hove, M. A. / Somorjai, G. A. et al. | 1988
- 634
-
Summary Abstract: Structural and electronic modification of Ni, Pd, and Fe strained metal overlayers on W(110) and W(100)Berlowitz, Paul J. / Goodman, D. Wayne et al. | 1988
- 636
-
Summary Abstract: Surface states and reconstruction on W(011) and Mo(011)Kevan, S. D. / Gaylord, R. H. et al. | 1988
- 637
-
Summary Abstract: Medium‐energy ion scattering study of the Si(111):As‐1×1 surfaceHeadrick, R. L. / Graham, W. R. et al. | 1988
- 639
-
Two‐dimensional phase transitions studied by thermal He scatteringKern, Klaus / Zeppenfeld, Peter / David, Rudolf / Comsa, George et al. | 1988
- 646
-
Kinetics of ordering in chemisorbed and physisorbed systemsGunton, J. D. et al. | 1988
- 649
-
Effects of random impurities on two‐dimensional island growth in a chemisorbed overlayerZuo, J.‐K. / Wang, G.‐C. et al. | 1988
- 654
-
Summary Abstract: The step roughening transition of a Cu(113) surface studied by surface x‐ray scatteringLiang, K. S. / Sirota, E. B. / D’Amico, K. L. / Hughes, G. J. / Sinha, S. K. et al. | 1988
- 655
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Summary Abstract: Roughening transitions on Cu(113) and Cu(115): A quantitative analysisSalanon, B. / Fabre, F. / Gorse, D. / Lapujoulade, J. / Selke, W. et al. | 1988
- 657
-
Summary Abstract: Surface phase separation of vicinal Si(111)Phaneuf, R. J. / Williams, Ellen D. et al. | 1988
- 658
-
The interaction of oxygen with a NiCu(100) single‐crystal surfaceShek, M. L. et al. | 1988
- 662
-
Atomic and molecular states of oxygen chemisorbed on tungsten(112)Wendelken, J. F. et al. | 1988
- 665
-
Surface oxidation of a Pt–20% CO alloy: An x‐ray photoelectron spectroscopy and low‐energy electron diffraction study on the [100] and [111] oriented single‐crystal surfacesBardi, Ugo / Beard, B. C. / Ross, P. N. et al. | 1988
- 671
-
Titanium surface chemistry: Chlorine adsorptionWatson, P. R. / Mokler, S. M. / Mischenko, J. et al. | 1988
- 675
-
The interaction of NF3 with Ru(0001): Order at stepsWalczak, M. M. / Johnson, A. L. / Thiel, P. A. / Madey, T. E. et al. | 1988
- 681
-
Experimental and theoretical investigation of chemisorbed Ga on Si(111)Thundat, T. / Mohapatra, S. M. / Dev, B. N. / Gibson, W. M. / Das, T. P. et al. | 1988
- 686
-
High‐resolution electron energy‐loss studies of space‐charge layers on doped GaAs(110) surfacesChen, Yu / Lapeyre, G. J. / Xu, Yabo et al. | 1988
- 689
-
The atomic structures of the Si(111)‐√3×√3‐ and ‐6×6‐Au surfaces studied by low‐energy ion scatteringHuang, Judy H. / Williams, R. Stanley et al. | 1988
- 692
-
Mechanism and consequences of surface reconstruction on the cleavage faces of wurtzite‐structure compound semiconductorsDuke, C. B. / Wang, Y. R. et al. | 1988
- 696
-
Scanning tunneling microscopy of cubic silicon carbide surfacesZheng, N. J. / Knipping, U. / Tsong, I. S. T. / Petuskey, W. T. / Kong, H. S. / Davis, R. F. et al. | 1988
- 699
-
Ion‐beam‐induced desorption of Ar+n ion clustersChristiansen, J. W. / Tsong, I. S. T. / Lin, S. H. et al. | 1988
- 703
-
An efficient algorithm for the simulation of hyperthermal energy ion scatteringGoodstein, David M. / Langer, Stephen A. / Cooper, B. H. et al. | 1988
- 708
-
Theoretical studies of ion bombardment: Many‐body interactionsLo, Davy Y. / Tombrello, Tom A. / Shapiro, Mark H. / Garrison, Barbara J. / Winograd, Nicholas / Harrison, Don E. et al. | 1988
- 712
-
Surface potential effects in low‐energy current image diffraction patterns observed on the Al(001) surfaceJette, A. N. / Bargeron, C. B. / Nall, B. H. et al. | 1988
- 717
-
Study of the vibrational modes of subsurface oxygen on Al(111) using diode laser infrared reflection–absorption spectroscopyBermudez, V. M. / Rubinovitz, R. L. / Butler, J. E. et al. | 1988
- 722
-
Domain mixtures in the NiAl(111) surfaceNoonan, J. R. / Davis, H. L. et al. | 1988
- 726
-
Percolative aspects of nonequilibrium adlayer structureEvans, J. W. / Sanders, D. E. et al. | 1988
- 730
-
X‐ray photoelectron forward scattering studies of epitaxial overlayers and sandwich structures of Au and Ag on Ni(100)Egelhoff, William F. et al. | 1988
- 735
-
Ordered phases and phase transitions of cesium on the Cu(111) surfaceFan, W. C. / Ignatiev, A. et al. | 1988
- 739
-
Electronic structure of Pd thin films on the Al(110) surfaceXu, Mingde / Smith, R. J. et al. | 1988
- 743
-
The change in Si–Al bonding with metal coverage at the Si(111)√3×√3–Al interfaceNelson, J. S. / Batra, Inder P. / Fong, C. Y. et al. | 1988
- 748
-
Alkali adsorption and its effect on hydrogen saturated Si(111) surfaceAvci, R. / Dabbousi, O. B. / Al‐Harthi, A. S. et al. | 1988
- 752
-
High‐resolution electron energy‐loss spectroscopy studies of hydrogen adsorption on the GaP(110) surfaceChen, Yu / Frankel, D. J. / Anderson, J. R. / Lapeyre, G. J. et al. | 1988
- 754
-
Ultraviolet‐light‐enhanced reaction of oxygen with gallium arsenide surfacesYu, C. F. / Schmidt, M. T. / Podlesnik, D. V. / Yang, E. S. / Osgood, R. M. et al. | 1988
- 757
-
The compensation effect in thermal desorption of adsorbate systems with lateral interactionsNiemantsverdriet, J. W. / Wandelt, K. et al. | 1988
- 762
-
Reactivity of organic molecules on amorphous Si and Ge filmsPiancastelli, M. N. / Zanoni, R. / Kelly, M. K. / McKinley, J. T. / Margaritondo, G. / Quaresima, C. / Capozi, M. / Perfetti, P. et al. | 1988
- 765
-
Infrared total internal reflection spectroscopy of dimethylcadmium on siliconSanchez, Esaul / Shaw, Ping / O’Neill, James A. / Osgood, Richard M. et al. | 1988
- 768
-
Summary Abstract: Structure determination for the S2 monolayer phase of ethane physisorbed on graphiteOsen, John W. / Fain, Samuel C. et al. | 1988
- 769
-
Summary Abstract: The surface chemistry of ketene on Ru(001)Henderson, M. A. / Radloff, P. L. / Greenlief, C. M. / White, J. M. / Mims, C. A. et al. | 1988
- 770
-
Summary Abstract: Laser‐assisted deposition of Fe and W: Photodecomposition of Fe(CO)5 and W(CO)6 on Si(111)‐(7×7)Swanson, Jon R. / Friend, C. M. et al. | 1988
- 772
-
Summary Abstract: K‐resolved inverse photoelectron spectroscopy investigations of Au and Ag on Ge(111)Knapp, B. J. / Tobin, J. G. et al. | 1988
- 774
-
Summary Abstract: The adsorption of H2 and D2 on Fe(110): Kinetics and energeticsKurz, Edward A. / Hudson, John B. et al. | 1988
- 775
-
Summary Abstract: The reaction of hydrogen with oxygen on a polycrystalline iron surfaceArbab, M. / Hudson, J. B. et al. | 1988
- 776
-
Summary Abstract: Observation of molecular H2 and D2 on Pd and Ag using thermal desorption between 5 and 20 KStulen, Richard H. et al. | 1988
- 778
-
Summary Abstract: Subsurface deuterium on Ni(110)Harrington, D. A. / Norton, P. R. et al. | 1988
- 780
-
Summary Abstract: Inverse photoemission studies of oxygen adsorption on the tungsten (100) surfaceKrainsky, I. L. et al. | 1988
- 781
-
Summary Abstract: Surface electronic structure and chemisorption properties of MnO(100)Lad, R. J. / Henrich, V. E. et al. | 1988
- 782
-
Summary Abstract: NO2 chemisorption: An example of surface linkage isomerismBartram, M. E. / Koel, B. E. et al. | 1988
- 784
-
Summary Abstract: Formation of Cr2N overlayers on a Fe/Cr{110} crystalRuppender, H. / Grunze, M. / Dowben, P. A. et al. | 1988
- 786
-
Summary Abstract: Coadsorbate induced ordering on Rh(111) and Rh(100) surfaces: Structural and chemical effectsKao, C.‐T. / Mate, C. M. / Blackman, G. S. / Bent, B. E. / Van Hove, M. A. / Somorjai, G. A. et al. | 1988
- 788
-
Summary Abstract: Molecular‐beam studies of dissociative chemisorption of O2 on Pt(111)Williams, M. D. / Bethune, D. S. / Luntz, A. C. et al. | 1988
- 789
-
Summary Abstract: Sulfur dioxide adsorption and reaction on clean and modified Pd(100)Burke, M. L. / Madix, R. J. et al. | 1988
- 790
-
Summary Abstract: Effects of laser‐induced surface defects and of sulfur on the diffusion of CO and D on Ni(100)Russell, J. N. / Hall, R. B. / Upton, T. H. et al. | 1988
- 792
-
Summary Abstract: Measurement of the island dimensions formed during CO adsorption on Pt(111) using infrared spectroscopyOlsen, C. W. / Masel, R. I. et al. | 1988
- 794
-
Summary Abstract: Surface diffusion of CO on Ru(001) studied using laser‐induced thermal desorptionDeckert, A. A. / Brand, J. L. / Arena, M. V. / George, S. M. et al. | 1988
- 796
-
Summary Abstract: Characterization of CO chemisorption on Fe(100)Cameron, S. D. / Dwyer, D. J. et al. | 1988
- 797
-
Summary Abstract: Alkali enhanced CO dissociation on Fe(100)Cameron, S. D. / Dwyer, D. J. et al. | 1988
- 798
-
Summary Abstract: Precursor adsorption of oxygen on Si(111) at low temperaturesSilvestre, C. / Shayegan, M. et al. | 1988
- 800
-
Summary Abstract: Scanning tunneling microscopy imaging and registration of the (√3×√3) R30° Ag/Si(111) surfaceWilson, R. J. / Chiang, S. et al. | 1988
- 801
-
Summary Abstract: Reconstruction of steps on the Si(111)2×1 surfaceFeenstra, R. M. / Stroscio, Joseph A. et al. | 1988
- 803
-
Summary Abstract: Combined field ion and scanning tunneling microscopeSakurai, T. / Hashizume, T. / Kamiya, I. / Hasegawa, Y. / Matsui, J. / Takahashi, S. / Kono, E. / Ogawa, M. et al. | 1988
- 804
-
Summary Abstract: Design and performance of ion optics for hyperthermal (10–100 eV) and kilo‐electron‐volt ion scatteringAdler, D. L. / Cooper, B. H. / Peale, D. R. et al. | 1988
- 805
-
Summary Abstract: Beam energy and glancing angle dependence of the neutral fraction of scattered K and directly recoiled Si from Si(100)Aduru, S. / Rabalais, J. W. et al. | 1988
- 807
-
Summary Abstract: Unconstrained optimization in low‐energy electron diffraction: Application to CdTe(110) and Ge(111)(1×1)–HCowell, P. G. / de Carvalho, V. E. / Tear, S. P. et al. | 1988
- 808
-
Summary Abstract: Impact collision ion scattering spectroscopy of Ag(110) using 7Li+ and 4He+Daley, Richard S. / Williams, R. Stanley et al. | 1988
- 810
-
Summary Abstract: Anomalous bulk penetration of a surface state near a bulk band edgeKevan, S. D. / Gaylord, R. H. et al. | 1988
- 811
-
Summary Abstract: Structure and composition of the NiAl(110) and NiAl(100) surfaces by low‐energy alkali ion scatteringMullins, D. R. / Overbury, S. H. et al. | 1988
- 812
-
Summary Abstract: Theory of the oscillatory relaxation of face‐centered‐cubic (110) surfacesSmith, John R. / Banerjea, Amitava et al. | 1988
- 814
-
Summary Abstract: Characterization of empty states on C(111) (diamond) (2×1) via angle‐resolved two‐photon photoemissionKubiak, Glenn D. / Kolasinski, Kurt W. et al. | 1988
- 816
-
Summary Abstract: Hydrogen phonon spectra on Pt(111) at T=100 and 160 KReutt, Janice E. / Chabal, Y. J. / Christman, S. B. et al. | 1988
- 819
-
Summary Abstract: Determination of the growth mode of metastable body‐centered‐cubic cobalt on GaAs(110)Lind, D. M. / Idzerda, Y. U. / Prinz, G. A. / Jonker, B. T. / Krebs, J. J. et al. | 1988
- 820
-
Summary Abstract: Helium diffraction from a stepped W(100) carbide surfaceElliott, G. S. / Miller, D. R. et al. | 1988
- 822
-
Summary Abstract: Subsurface hydrogen on Ru(0001): Quantification by Cu titrationPeden, C. H. F. / Goodman, D. W. / Houston, J. E. / Yates, J. T. et al. | 1988
- 823
-
Summary Abstract: K‐resolved inverse photoemission study of Pd/Nb(110)Pan, Xiaohe / Johnson, P. D. / Strongin, Myron et al. | 1988
- 825
-
Summary Abstract: CdTe(110)–Mn interface reaction and the formation of nonequilibrium ternary semimagnetic semiconductor alloysWall, A. / Raisanen, A. / Chang, S. / Troullier, N. / Franciosi, A. / Reifenberger, R. et al. | 1988
- 827
-
Summary Abstract: Valence‐level photon‐stimulated desorption of H+ from H2O/Si(111)(7×7)Rosenberg, R. A. / Wen, C.‐R. et al. | 1988
- 828
-
Summary Abstract: Oxygen‐vacancy‐derived defect electronic states on the SnO2 (110) surfaceCox, David F. / Fryberger, Teresa B. / Semancik, Steve et al. | 1988
- 829
-
Summary Abstract: Surface structures of β‐SiC and pseudomorphic Si adlayersKaplan, R. et al. | 1988
- 831
-
Summary Abstract: Valence‐band structure of V2O3(101̄2)Smith, Kevin E. / Henrich, Victor E. et al. | 1988
- 832
-
Summary Abstract: Structural analysis of the diamond C(111)‐(2×1) reconstructed surface by low‐energy electron diffractionSowa, Erik C. / Kubiak, Glenn D. / Stulen, Richard H. / Van Hove, Michel A. et al. | 1988
- 834
-
Summary Abstract: The role of electron–hole pairs in photon induced reaction and desorption of NO and Mo(CO)6 on Si(111)7×7Ying, Z. / Ho, W. et al. | 1988
- 835
-
Summary Abstract: Infrared‐induced single‐phonon desorption of HD from LiF(100)Ferm, Paul M. / Kurtz, Sarah R. / Pearlstine, Kathryn A. / McClelland, Gary M. et al. | 1988
- 836
-
Summary Abstract: Electron stimulated desorption and coherent electron scatteringSambe, H. / Ramaker, D. E. / Parenteau, L. / Sanche, L. et al. | 1988
- 837
-
Summary Abstract: Temperature‐ and coverage‐dependent structures of oxygen on Pd(100)Chang, S.‐L. / Thiel, P. A. et al. | 1988
- 839
-
Summary Abstract: Pulsed laser induced electron emission from Cu(100) under ultrahigh vacuum conditionsStrupp, P. G. / Grant, J. L. / Stair, P. C. / Weitz, E. et al. | 1988
- 840
-
Summary Abstract: Desorption dynamics of SiF4 etch productHoule, F. A. et al. | 1988
- 842
-
Summary Abstract: Surface diffusion of hydrogen on carbon‐ and sulfur‐covered Ru(001) studied using laser‐induced thermal desorptionBrand, J. L. / Mak, C. H. / Deckert, A. A. / Koehler, B. G. / George, S. M. et al. | 1988
- 843
-
Summary Abstract: The dynamics of NO scattering from NO‐ and CO‐covered Ni(100)Hamza, A. V. / Ferm, P. M. / Budde, F. / Ertl, G. et al. | 1988
- 845
-
Summary Abstract: Surface enhanced infrared spectroscopyOlsen, C. W. / Masel, R. I. et al. | 1988
- 847
-
Summary Abstract: Formamide adsorption at 80 K on clean and chemically modified Ru(001) surfacesParmeter, J. E. / Schwalke, U. / Weinberg, W. H. et al. | 1988
- 849
-
Summary Abstract: The effect of oriented defects on long‐range ordering of hydrocarbon films: Azulene on Pt(111)Flores, Cynthia R. / Hemminger, John C. et al. | 1988
- 851
-
Summary Abstract: The stability and chemistry of methyl radicals adsorbed on Ni(111)Yang, Q. Y. / Ceyer, S. T. et al. | 1988
- 852
-
Summary Abstract: Interactions and electronic energy transfer between molecules on dielectric surfaces: Phenanthrene on Al2O3(112̄0)Tro, N. J. / Nishimura, A. M. / George, S. M. et al. | 1988
- 854
-
Summary Abstract: Kinetics and mechanism of formic acid decomposition on Ru(001)Sun, Y.‐K. / Vajo, J. J. / Chan, C.‐Y. / Weinberg, W. H. et al. | 1988
- 856
-
Summary Abstract: Surface diffusion of cycloalkanes on Ru(001)Mak, C. H. / Koehler, B. G. / George, S. M. et al. | 1988
- 857
-
Summary Abstract: Orientation and reactivity of benzene on Mo(110)Liu, A. C. / Friend, C. M. et al. | 1988
- 859
-
Summary Abstract: X‐ray photoelectron spectroscopy, temperature programmed desorption, and Auger electron spectroscopy investigation of the interaction of [Rh(CO)2Cl]2 with oxidized Al(100)Belton, David N. / Schmieg, Steven J. et al. | 1988
- 860
-
Summary Abstract: Raman spectra of small molecules adsorbed on a palladium(111) surfaceHulse, John E. et al. | 1988
- 862
-
Summary Abstract: Fourier transform infrared reflection absorption spectroscopy results for ethylidyne on Pt(111)Malik, I. J. / Agrawal, V. K. / Trenary, M. et al. | 1988
- 864
-
How CO guides surface reactionsAkhter, S. / White, J. M. et al. | 1988
- 870
-
The decomposition of alkyl silanes (SiMenH4−n, 0≤n≤4) on Ni(100)Dubois, L. H. / Zegarski, B. R. et al. | 1988
- 875
-
Summary Abstract: Determination of bond orientation for CO on Mo(100) by using angle‐resolved ultraviolet photoelectron spectroscopy and near‐edge x‐ray absorption fine‐structure spectroscopyZaera, F. / Fulmer, J. P. / Tysoe, W. T. et al. | 1988
- 876
-
Summary Abstract: The electronic structure of O2 chemisorbed on Pt(111)Eberhardt, W. / Upton, T. H. / Cramm, S. / Incoccia, L. et al. | 1988
- 877
-
Summary Abstract: Faceting in an oscillatory surface reaction: The catalytic CO oxidation on Pt(110)Imbihl, R. / Ladas, S. / Ertl, G. et al. | 1988
- 879
-
Summary Abstract: Bonding at the K/Si(100)2×1 interface: A surface extended x‐ray absorption fine‐structure studyKendelewicz, T. / Woicik, J. C. / List, R. S. / Soukiassian, P. / Pate, B. B. / Pianetta, P. / Lindau, I. / Spicer, W. E. et al. | 1988
- 880
-
Summary Abstract: How potassium promotes dissociation of NO on Rh(100)Whitman, L. J. / Ho, W. et al. | 1988
- 882
-
Summary Abstract: Dynamics of ethane adsorption on and desorption from Pt(111) determined from direct sticking probability experimentsSchoofs, Gregory R. / Arumainayagam, Christopher R. / Madix, Robert J. et al. | 1988
- 883
-
Summary Abstract: Fundamental studies of metal/electrolyte interactions: The adsorption of nitric acid and water on Ag(110)Döhl‐Oelze, R. / Brown, C. C. / Stark, S. / Stuve, E. M. et al. | 1988
- 885
-
Summary Abstract: The adsorption of benzotriazole on copper and cuprous oxideZonnevylle, Marjanne C. / Hoffmann, Roald et al. | 1988
- 887
-
Summary Abstract: Contrast between the chemical, structural, and electronic properties of thin films of Cu and Ni on the Ru(0001) surfaceHouston, J. E. / Berlowitz, P. J. / White, J. M. / Goodman, D. W. et al. | 1988
- 889
-
Hyperthermal gas–surface scatteringWeiss, P. S. / Amirav, A. / Trevor, P. L. / Cardillo, M. J. et al. | 1988
- 895
-
Rotational dynamics and electronic energy partitioning in the electron‐stimulated desorption of NO from Pt(111)Burns, A. R. / Stechel, E. B. / Jennison, D. R. et al. | 1988
- 899
-
Promotion of dissociative chemisorption with vibrational and translational energyRettner, C. T. / Pfnür, H. E. / Stein, H. / Auerbach, D. J. et al. | 1988
- 902
-
Summary Abstract: New electron energy‐loss spectroscopy measurements of surface phonon dispersion on Cu(111)Mohamed, Mohamed H. / Kesmodel, L. L. / Hall, Burl M. / Mills, D. L. et al. | 1988
- 903
-
Summary Abstract: Collision induced dissociation and desorption: CH4 and CO on Ni (111)Beckerle, J. D. / Johnson, A. D. / Yang, Q. Y. / Ceyer, S. T. et al. | 1988
- 907
-
Quantitative surface electron spectroscopies: Application to the study of corrosion of metals and glassesMaschhoff, B. L. / Zavadil, K. R. / Nebesny, K. W. / Armstrong, N. R. et al. | 1988
- 914
-
Oxidation of amorphous Ni–Nb films: Surface spectroscopy studiesChristensen, T. M. et al. | 1988
- 918
-
Characterization of the surface oxidation and magnetic properties of MnFe thin filmsCohen, S. L. / Russak, M. A. / Baker, J. M. / McGuire, T. R. / Scilla, G. J. / Rossnagel, S. M. et al. | 1988
- 924
-
Al, Al–N alloy, and AlN‐coated steel corrosion behavior in O2‐free KCl solutionsTait, W. S. / Huber, C. O. / Begnoche, B. C. / Siettmann, J. R. / Aita, C. R. et al. | 1988
- 928
-
Oxidation of a cobalt chromium alloy: An x‐ray photoemission spectroscopy studyFowler, David E. / Rogozik, Juergen et al. | 1988
- 933
-
Surface chemical analysis of polydiacetylene films exposed to electron beam and ultraviolet irradiationColton, R. J. / DiLella, D. / Mowery, R. L. / Snow, A. / Wandass, J. H. / Marrian, C. R. K. et al. | 1988
- 936
-
Surface analysis of bulk polymers using single‐ and multiple‐photon ionizationSchühle, U. / Pallix, J. B. / Becker, C. H. et al. | 1988
- 941
-
The interaction of excimer laser ultraviolet radiation with Kapton‐H in vacuum and under mechanical stressTonyali, K. / Jensen, L. C. / Dickinson, J. T. et al. | 1988
- 946
-
Fingerprinting of polymer surfaces with Cf‐252 particle desorption mass spectrometryQuinones, L. / Schweikert, E. A. et al. | 1988
- 950
-
Surface composition and distribution of fluorine in plasma‐fluorinated polyimideMatienzo, L. J. / Emmi, F. / Egitto, F. D. / Van Hart, D. C. / Vukanovic, V. / Takacs, G. A. et al. | 1988
- 954
-
Influence of PF6 dopant concentration on the x‐ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy spectra of poly 3‐methylthiopheneNelson, A. J. / Glenis, S. / Frank, A. J. et al. | 1988
- 960
-
Reactive sputter sectioning: A tool for polymer film analysisMcClure, D. J. / Muller, C. L. / Tabar, R. J. et al. | 1988
- 964
-
Summary Abstract: X‐ray photoelectron spectroscopy characterization of polymers for biomedical applicationsCastner, David G. / Ratner, Buddy D. et al. | 1988
- 966
-
Characterization of phosphate crystal nucleation and growth on cold‐rolled steelGaarenstroom, Stephen W. / Ottaviani, Robert A. et al. | 1988
- 971
-
The surface chemistry of zinc dialkyldithiophosphate, an antiwear additive, on oxidized iron and steel foilsRhodes, Kent L. / Stair, Peter C. et al. | 1988
- 975
-
Onset of alkali adsorption on the vitreous silica surfaceGarofalini, Stephen H. / Zirl, David M. et al. | 1988
- 982
-
Summary Abstract: The surface composition and bonding of silicon carbide powders and whiskersTaylor, T. N. / Phillips, D. S. et al. | 1988
- 983
-
Summary Abstract: Surface analysis of amorphous Ta–Cu thin films deposited on GaAsPouch, J. J. / Alterovitz, S. A. / Woollam, J. A. / Oh, J. E. et al. | 1988
- 985
-
Metal–polymer chemistry. I. Charge‐transfer‐related modifications of polyimide (pyromellitic dianhydride‐4,4’‐oxydianiline)Clabes, J. G. / Goldberg, M. J. / Viehbeck, A. / Kovac, C. A. et al. | 1988
- 991
-
Metal–polymer chemistry. II. Chromium–polyimide interface reactions and related organometallic chemistryGoldberg, M. J. / Clabes, J. G. / Kovac, C. A. et al. | 1988
- 997
-
Copper carboxylate formation in the thermal oxidative degradation of atactic polypropylene on copper oxide filmsWebb, John D. / Czanderna, A. W. / Pitts, J. R. et al. | 1988
- 1002
-
Summary Abstract: X‐ray photoemission investigation of electron injection and trapping at the gold/polyimide interfaceMeyer, H. M. / Anderson, Steven G. / Atanasoska, Lj. / Weaver, J. H. et al. | 1988
- 1004
-
Summary Abstract: Ti as a diffusion barrier between Cu and polyimideOhuchi, F. S. / Freilich, S. C. et al. | 1988
- 1007
-
Neutralization and bonding mechanisms of shallow acceptors at grain boundaries in polycrystalline siliconKazmerski, L. L. / Nelson, A. J. / Dhere, R. G. / Yahia, A. / Abou‐Elfotouh, F. et al. | 1988
- 1012
-
The copper–silicon interface: Composition and interdiffusionCorn, Stewart H. / Falconer, John L. / Czanderna, A. W. et al. | 1988
- 1017
-
Local structure investigation of the ion sputtered oxide substratesChaug, Y. S. / Kim, Y. H. / Chou, N. J. et al. | 1988
- 1023
-
Summary Abstract: High‐resolution electron microscopy of the solid–vacuum interfaceCowley, J. M. et al. | 1988
- 1024
-
Summary Abstract: Characterization of multilayer thin films by laser‐induced thermal desorption mass spectrometryLand, Donald P. / Tai, Tsong‐Lin / Lindquist, John M. / Hemminger, John C. / McIver, Robert T. et al. | 1988
- 1025
-
Summary Abstract: Static secondary ion mass spectroscopy as a real‐time monitor of surface hydrogen coverage on Ni(100)Zhou, X.‐L. / Zhu, X.‐Y. / White, J. M. et al. | 1988
- 1027
-
Quantitative analysis of Cu implanted Co/Ni alloys by Auger electron spectroscopy/depth profiling using factor analysisWandass, J. H. / Turner, N. H. et al. | 1988
- 1032
-
Modeling the effect of surface roughening on depth profiles. II. Polycrystalline metalTompkins, Harland G. / Lytle, Steve et al. | 1988
- 1036
-
A simple model for the Auger electron spectroscopy evaluation of thin‐film layer growth systems in which substrate–overgrowth atom mixing occursEce, M. / Vook, R. W. et al. | 1988
- 1040
-
Summary Abstract: Auger electron spectroscopy: Accurate signal and noise calibration and a ‘‘figure of merit’’ for instrument sensitivity performanceSeah, M. P. / Hunt, C. P. et al. | 1988
- 1041
-
Summary Abstract: Dependence of inelastic electron mean free paths on electron energy and materialTanuma, S. / Powell, C. J. / Penn, D. R. et al. | 1988
- 1042
-
Summary Abstract: Enhancing quantitative spectral analyses with multivariate statistical methodsHaaland, David M. / Thomas, Edward V. et al. | 1988
- 1044
-
Summary Abstract: Nonlinear least‐squares fitting employing fast Fourier transform background generation for the x‐ray photoelectron spectroscopy analysis of iron oxidationMaschhoff, B. L. / Armstrong, N. R. et al. | 1988
- 1045
-
Summary Abstract: Self‐deconvolution in CVV Auger electron spectroscopySasse, A. G. B. M. / Lakerveld, D. G. / van Silfhout, A. et al. | 1988
- 1049
-
Analysis of thin‐film systems using nonresonant multiphoton ionizationPallix, J. B. / Becker, C. H. / Newman, N. et al. | 1988
- 1053
-
The role of oxygen and fluorine in the electron emission of some kinds of cathodesLin, Li‐wei et al. | 1988
- 1058
-
Surface extended x‐ray absorption fine structure study of surface BaO layers on tungsten surfacesShih, A. / Hor, C. / Mueller, D. / Marrian, C. R. K. / Elam, W. T. / Wolf, P. / Kirkland, J. P. / Neiser, R. A. et al. | 1988
- 1063
-
Electronic properties of BaO on W(001)Hemstreet, L. A. / Chubb, S. R. / Pickett, W. E. et al. | 1988
- 1067
-
A synchrotron radiation study of BaO films on W(001) and their interaction with H2O, CO2, and O2Mueller, Donald / Shih, Arnold / Roman, Elisa / Madey, Theodore / Kurtz, Richard / Stockbauer, Roger et al. | 1988
- 1072
-
Summary Abstract: A quantum chemical study of BaO/W cathode surfacesMüller, Wolfgang et al. | 1988
- 1073
-
Summary Abstract: Study of poisoning of an oxide cathodeJi, Yaer / Wu, Ting et al. | 1988
- 1074
-
Summary Abstract: Characterization of H2O plasma treated nickel oxide by angle resolved x‐ray photoelectron spectroscopyHaasch, Richard T. / Evans, John F. et al. | 1988
- 1076
-
Summary Abstract: Surface‐limited permeation of deuterium through iron as a function of oxygen coverageSwansiger, W. A. / Wolfer, W. G. / Baskes, M. I. et al. | 1988
- 1077
-
Summary Abstract: Analysis of Co‐doped iron oxide thin films by grazing incidence x‐ray diffractionToney, Michael F. / Huang, Ting C. / Brennan, Sean / Rek, Zophia et al. | 1988
- 1079
-
Summary Abstract: Sensitivity factors for quantitative secondary ion mass spectrometry analysis of trace elements in coal fly ashShenasa, Mohsen / Yaron, Gadi / Lichtman, David et al. | 1988
- 1081
-
Summary Abstract: The barrier to oxygen penetration on transition‐metal oxide surfacesNordlander, Peter / Ronay, Maria et al. | 1988
- 1082
-
Summary Abstract: Quantitative depth profiling of (Al,Ga)As with sputtered neutral mass spectrometryKaiser, U. / Meeker, G. P. / Huneke, J. C. et al. | 1988
- 1084
-
Fractoemission from fused silica and sodium silicate glassesDickinson, J. T. / Langford, S. C. / Jensen, L. C. / McVay, G. L. / Kelso, J. F. / Pantano, C. G. et al. | 1988
- 1090
-
Adsorption of H2O on annealed and damaged ironBaer, D. R. / Jones, R. H. et al. | 1988
- 1094
-
Summary Abstract: Applications of surface science in circuitboard manufactureBrundle, C. R. et al. | 1988
- 1097
-
Summary Abstract: X‐ray photoelectron spectroscopy surface charge buildup used to study residue in deep features on integrated circuitsThomas, J. H. / Bryson, C. E. / Pampalone, T. R. et al. | 1988
- 1098
-
Summary Abstract: Surface reactions and glass fractureMichalske, Terry A. / Bunker, Bruce C. et al. | 1988
- 1100
-
Characterization of copper heterocyclic compounds: X‐ray photoelectron spectroscopy studyKatnani, A. D. / Drolet, D. P. / Lees, A. J. et al. | 1988
- 1105
-
Summary Abstract: An interpretation of the ‘‘ethylenic,’’ ‘‘carbidic,’’ and ‘‘graphitic’’ Auger line shapes of chemisorbed carbon speciesHutson, F. L. / Ramaker, D. E. et al. | 1988
- 1106
-
Summary Abstract: Auger analysis of sputter deposited TiNx thin filmsPamler, W. / Hüttinger, M. / Kohlhase, A. / Yurkov, S. et al. | 1988
- 1108
-
Applications of surface analytical techniques to the characterization of catalytic reactionsCampbell, Charles T. et al. | 1988
- 1113
-
Effect of substrate preparation on the structure and chemisorption properties of Pd/MgO model catalystHenry, C. R. / Poppa, H. et al. | 1988
- 1118
-
A study of organic/inorganic interactions in syncrude fines by x‐ray photoelectron spectroscopy and core electron energy‐loss spectroscopyZajac, G. W. / Fleisch, T. H. / Lee, F. S. C. et al. | 1988
- 1123
-
Interaction of SO2 with copper and copper oxide surfacesBaxter, J. P. / Grunze, M. / Kong, C. W. et al. | 1988
- 1128
-
CO adsorption and dissociation on Rh(111)de Koster, A. / van Santen, R. A. et al. | 1988
- 1134
-
Summary Abstract: Catalytic carbon deposition on Pt, Ir, and PtIrvan Langeveld, A. D. / Niemantsverdriet, J. W. et al. | 1988
- 1135
-
Summary Abstract: X‐ray photoelectron spectroscopy studies of the partial hydrogenation of cyanogen on Pt(111): Comparison with HCN and ethylenediamineLindquist, John M. / Ziegler, John P. / Hemminger, John C. et al. | 1988
- 1137
-
Summary Abstract: Ethylene hydrogenation on Pt(111) and (5×20)Pt(100) near atmospheric pressureBackman, A. L. / Masel, R. I. et al. | 1988
- 1141
-
Some characteristics of an inverted magnetron cold cathode ionization gauge with dual feedthroughsPeacock, N. T. / Peacock, R. N. et al. | 1988
- 1145
-
A time resolved study of velocity distributions in pulsed molecular beamsEldridge, Benjamin N. / Yu, Ming L. et al. | 1988
- 1150
-
Thin‐film thermocouple gaugeKuo, T. C. / Flattery, J. / Ghosh, P. K. / Kornreich, P. G. et al. | 1988
- 1153
-
Extension of thermocouple gauge sensitivity to atmospheric pressureZettler, J. / Sud, R. et al. | 1988
- 1156
-
Summary Abstract: A gas monitor for clinical useHolme, A. E. / Parris, M. / Purdy, S. et al. | 1988
- 1158
-
A generalized approach to vacuum system automationMcMahon, R. W. / Celler, Z. / Hanssmann, M. G. / Shuen, A. K. et al. | 1988
- 1161
-
Lubricating of mechanisms for vacuum serviceRoller, K. G. et al. | 1988
- 1166
-
The tribological properties of MoS2 coatings in vacuum, low relative humidity, and high relative humidity environmentsPanitz, J. K. G. / Pope, L. E. / Lyons, J. E. / Staley, D. J. et al. | 1988
- 1171
-
Auger electron spectroscopy analysis of the role of oxygen in the frictional behavior of steel lubricated with poly‐α‐olefinDugger, M. T. / Chung, Y. W. / Cheng, H. S. et al. | 1988
- 1175
-
Summary Abstract: Design of the ALT‐II vacuum systemMalinowski, M. E. / Ver Berkmoes, A. A. / Stewart, K. D. / Guthrie, S. E. et al. | 1988
- 1177
-
The emerging technologies of oil‐free vacuum pumpsHablanian, M. H. et al. | 1988
- 1183
-
An evaluation of the composition of the residual atmosphere above a commercial dry pumpWong, W. / Laurenson, L. / Livesey, R. G. / Troup, A. P. et al. | 1988
- 1187
-
The molecular drag pump: Principle, characteristics, and applicationsDuval, P. / Raynaud, A. / Saulgeot, C. et al. | 1988
- 1192
-
Analysis of frequency responses for different rotor configurations of small turbomolecular pumpsCasaro, F. et al. | 1988
- 1196
-
Thirty years of turbomolecular pumps: A review and recent developmentsHenning, J. et al. | 1988
- 1202
-
A new hybrid molecular pump with large throughputChu, J. G. et al. | 1988
- 1205
-
The influence of heavier gases in pumping helium and hydrogen in an ion pumpAudi, M. / De Simon, M. et al. | 1988
- 1209
-
Helium cryopumping for fusion applicationsSedgley, D. W. / Batzer, T. H. / Call, W. R. et al. | 1988
- 1214
-
Techniques for testing cryopump capacityPorter, John R. et al. | 1988
- 1217
-
Use of porous plugs in the transition flow range for the calibration of vacuum gaugesSharma, J. K. N. / Mohan, Pardeep et al. | 1988
- 1222
-
Leak detection on the DIII‐D tokamak using helium entrainment techniquesBrooks, N. H. / Baxi, C. / Anderson, P. et al. | 1988
- 1226
-
American Vacuum Society recommended practices for pumping hazardous gasesO’Hanlon, John F. / Fraser, David B. et al. | 1988
- 1255
-
Scrubbing characteristics of CCl4 and C2F6 with a titanium sublimation trapHu, Yao‐Zhi et al. | 1988
- 1259
-
Tritium removal from noble gas streamsShmayda, W. T. / Kherani, N. P. / Heics, A. G. et al. | 1988
- 1263
-
Summary Abstract: Advanced dry etch processing with a DRY pumpFarrow, Woodrow D. / Richman, Jay et al. | 1988
- 1264
-
Summary Abstract: Safe tritium handling at the Tritium Systems Test AssemblyCoffin, Don O. et al. | 1988
- 1266
-
Chemical cleaning of metal surfaces in vacuum systems by exposure to reactive gasesGrunze, M. / Ruppender, H. / Elshazly, O. et al. | 1988
- 1276
-
Glow discharge techniques for conditioning high‐vacuum systemsDylla, H. F. et al. | 1988
- 1288
-
Vacuum vessel heating system for the Advanced Toroidal FacilityLangley, R. A. / Neilson, G. H. / Alban, A. M. / Slaughter, E. / Sumner, J. N. / White, J. A. et al. | 1988
- 1293
-
99.99% Al/6063 alloy coextruded cryogenic beam tubeIshimaru, H. / Narushima, K. / Kanazawa, K. / Suetsugu, Y. / Bintinger, D. / Jöstlein, H. / Trobojevic, D. et al. | 1988
- 1297
-
Photon stimulated gas desorption from pure aluminumIwata, T. / Kanazawa, K. / Ishimaru, H. et al. | 1988
- 1300
-
Summary Abstract: Ion beam removal of contaminants from mirrors at cryogenic temperaturesHankins, Martha / George, Patricia M. et al. | 1988
- 1327
-
Application of reflectance difference spectroscopy to molecular‐beam epitaxy growth of GaAs and AlAsAspnes, D. E. / Harbison, J. P. / Studna, A. A. / Florez, L. T. et al. | 1988
- 1333
-
Transmission electron microscopy of elastic relaxation effects in Si–Ge strained layer superlattice structuresPerovic, D. D. / Weatherly, G. C. / Houghton, D. C. et al. | 1988
- 1337
-
Mechanism of band discontinuity control at heterojunction interfacesNiles, D. W. / Tang, Ming / Margaritondo, G. / Quaresima, C. / Perfetti, P. et al. | 1988
- 1340
-
Growth of epitaxial CaSi2 films on Si(111)Morar, J. F. / Wittmer, M. et al. | 1988
- 1343
-
Characterization of molecular‐beam epitaxially grown CdTe surfaces by high‐energy electron diffraction and synchrotron radiation photoemission spectroscopyHernández‐Calderón, Isaac / Niles, David W. / Höchst, Hartmut et al. | 1988
- 1348
-
Summary Abstract: The effect of strain on the band structure of GaAs and In0.2Ga0.8AsHwang, J. / Shih, C. K. / Pianetta, P. / Kubiak, G. D. / Stulen, R. H. / Dawson, L. R. / Pao, Y.‐C. / Harris, J. S. et al. | 1988
- 1350
-
Summary Abstract: X‐ray photoelectron spectroscopy measurements of kinetic parameters at elevated temperature for Ge/Si(111)‐7×7 heterojunction formationHill, D. M. / Xu, F. / Lin, Zhangda / Weaver, J. H. et al. | 1988
- 1352
-
Electron spin resonance of inherent and process induced defects near the Si/SiO2 interface of oxidized silicon wafersPoindexter, Edward H. / Caplan, Philip J. et al. | 1988
- 1358
-
X‐ray photoelectron spectroscopy and Auger spectroscopy studies of thin silicon nitride films thermally grown on siliconSobolewski, M. A. / Helms, C. R. et al. | 1988
- 1363
-
Electrical and structural characteristics of thin epitaxial dielectric films formed by in situ rapid isothermal processingRadpour, F. / Singh, R. / Krisa, W. L. / Chou, P. / Rahmati, M. / Chen, C. F. / Narayan, J. et al. | 1988
- 1367
-
A comparative study of the electrical properties of epitaxial fluoridesMcMullin, P. G. / Sinharoy, S. et al. | 1988
- 1371
-
An x‐ray photoelectron spectroscopy study of Fermi level position and surface composition during formation and removal of oxides on InPLau, W. M. / Sodhi, R. N. S. / Ingrey, S. et al. | 1988
- 1376
-
Summary Abstract: a‐Si:H/a‐SiOx:H and a‐Si:H/a‐SiNx:H interface formation studied by photoemission and soft x‐ray absorptionEberhardt, W. / Abeles, B. / Fu, Z. / Stasiewski, H. / Yang, L. / Sondericker, D. et al. | 1988
- 1377
-
Summary Abstract: Polyimide–copper interfaces: Growth sequence dependence and solvent effectsKowalczyk, Steven P. / Kim, Y.‐H. / Walker, G. F. / Kim, J. et al. | 1988
- 1379
-
Magnetron‐plasma ion beam etching: A new dry etching techniqueChinn, J. D. et al. | 1988
- 1384
-
Chemically enhanced ion etching on refractory metal silicidesO’Brien, W. L. / Rhodin, T. N. / Rathbun, L. C. et al. | 1988
- 1388
-
Effects of plasma stripping on the oxidation states of aluminum–silicon and tungsten surfacesHackenberg, J. / Linn, J. et al. | 1988
- 1393
-
Space–time resolved kinetics of mixed rare‐gas‐attaching gas plasmasGottscho, Richard A. / Scheller, Geoffrey R. / Intrator, Thomas / Graves, David B. et al. | 1988
- 1397
-
Transient fluorocarbon film thickness effects near the silicon dioxide/silicon interface in selective silicon dioxide reactive ion etchingJaso, Mark A. / Oehrlein, Gottlieb S. et al. | 1988
- 1402
-
Specific contact resistivity measurements of reactive ion etched contactsSchreyer, Tim A. / Bariya, Anand J. / McVittie, James P. / Saraswat, Krishna C. et al. | 1988
- 1407
-
Summary Abstract: Spontaneous thermal etching of silicon by CF3 radicalsRobertson, Robert M. / Golden, David M. / Rossi, Michel J. et al. | 1988
- 1409
-
The role of chlorinated surface films in excimer laser etching of Cu at low Cl2 pressuresBaller, T. S. / van Veen, G. N. A. / Dieleman, J. et al. | 1988
- 1414
-
The effects of p+ implant species and dose on black gold formationArac, Sabri / Packwood, Donald / Juanitas, Mark et al. | 1988
- 1417
-
Sputtering yield and radiation damage by neutral beam bombardmentMizutani, Tatsumi / Nishimatsu, Shigeru et al. | 1988
- 1421
-
Photoreflectance study of boron ion‐implanted {100} CdTeAmirtharaj, P. M. / Odell, M. S. / Bowman, R. C. / Alt, R. L. et al. | 1988
- 1426
-
Ultraviolet laser‐induced ion emission from siliconChen, Lee / Liberman, Vladimir / O’Neill, James A. / Wu, Zhen / Osgood, Richard M. et al. | 1988
- 1428
-
Optical phenomena observed in low‐energy ion and electron bombardment of silica surfacesMogul, H. C. / Haglund, R. F. / Weeks, R. A. / Kinser, D. L. / Tolk, N. H. / Wang, P. W. et al. | 1988
- 1435
-
Summary Abstract: Mechanisms of laser interaction with NO adsorbed on GaAs(110)So, S. K. / Kao, F. J. / Ho, W. et al. | 1988
- 1437
-
Cathodoluminescence spectroscopy of metal–semiconductor interface structuresBrillson, L. J. / Viturro, R. E. / Shaw, J. L. / Richter, H. W. et al. | 1988
- 1446
-
The effect of a thin ultraviolet grown oxide on metal–GaAs contactsSchmidt, M. T. / Podlesnik, D. V. / Evans, H. L. / Yu, C. F. / Yang, E. S. / Osgood, R. M. et al. | 1988
- 1451
-
Combined surface analysis by synchrotron radiation photoemission spectroscopy and surface extended x‐ray absorption fine structure of oxidation features of metal‐deposited GaAsOshima, Masaharu / Kawamura, Tomoaki / Maeyama, Satoshi / Miyahara, Tsuneaki et al. | 1988
- 1456
-
Studies of Co/Ga1−xAlxAs interfaces fabricated in ultrahigh vacuumPalmstro/m, C. J. / Chase, E. W. / Hwang, D. M. / Harbison, J. P. / Chang, C. C. / Kaplan, A. S. / Nazar, L. et al. | 1988
- 1462
-
EF pinning at the Sn/GaAs(110) interfaceStiles, K. / Kahn, A. / Kilday, D. / McKinley, J. / Margaritondo, G. et al. | 1988
- 1466
-
Chemical and electrical properties at the annealed Ti/GaAs(110) interfaceMcCants, C. E. / Kendelewicz, T. / Mahowald, P. H. / Bertness, K. A. / Williams, M. D. / Newman, N. / Lindau, I. / Spicer, W. E. et al. | 1988
- 1473
-
Interfacial reactions in the Ti/GaAs systemKim, Ki Bum / Kniffin, Margaret / Sinclair, Robert / Helms, C. R. et al. | 1988
- 1478
-
Summary Abstract: Thermal degradation of Au/GaAs contactsYeh, Liu Lu‐Min / Holloway, P. H. et al. | 1988
- 1480
-
A new growth enhancement in thin SiO2 formed by rapid isothermal oxidation of siliconSingh, R. / McGruer, N. E. / Rajkanan, K. / Weiss, J. H. et al. | 1988
- 1484
-
Quantitative reflection high‐energy electron diffraction measurements of surface roughness in GaAs(100)Heller, E. J. / Savage, D. E. / Lagally, M. G. et al. | 1988
- 1486
-
Photodesorption from CdS(0001) exposed to NO and COEkwelundu, E. C. / Ignatiev, A. et al. | 1988
- 1491
-
Multiple initial chemisorption sites: Al on GaAs(110)Menon, Madhu / Allen, Roland E. et al. | 1988
- 1495
-
Short‐range order in submonolayer Ni on GaAs(110) by x‐ray photoelectron forward scatteringEgelhoff, W. F. / Steigerwald, D. A. / Rowe, J. E. / Bussing, T. D. et al. | 1988
- 1499
-
Metal–Si bonding in Cu/Si(111)‘‘5×5’’ using angle‐resolved ultraviolet photoemission spectroscopy and band structure calculationsChambliss, D. D. / Rhodin, T. N. / Kasowski, R. V. et al. | 1988
- 1503
-
Valence‐band photoemission and electron energy‐loss studies of reactive ion etched silicon dioxideRobey, S. W. / Oehrlein, G. S. et al. | 1988
- 1508
-
Magnetoreflectivity study of excitons in molecular‐beam epitaxially grown Zn1−xFexSe crystalsLiu, X. / Petrou, A. / Jonker, B. T. / Prinz, G. A. / Krebs, J. J. / Warnock, J. et al. | 1988
- 1511
-
Metal‐induced gap states at the Ag and Au/GaAs interfacesStiles, K. / Kahn, A. / Kilday, D. / Margaritondo, G. et al. | 1988
- 1515
-
Photoluminescence spectra of some ternary and quaternary chalcopyrite semiconductorsAbou‐Elfotouh, F. / Dunlavy, D. J. / Kazmerski, L. L. / Albin, D. / Bachman, K. J. / Menner, R. et al. | 1988
- 1519
-
Angular dispersion of Fuchs–Kliewer modes on GaAs(100) by digital high‐resolution electron energy‐loss spectroscopyBlack, D. S. / Seo, J. M. / Holloway, P. H. / Rowe, J. E. et al. | 1988
- 1523
-
Angular resolved surface‐plasmon loss from Si(111) surfacesSeo, J. M. / Black, D. S. / Holloway, P. H. / Rowe, J. E. et al. | 1988
- 1526
-
Double‐crystal x‐ray topography and rocking curve studies of epitaxially grown ZnSeQadri, S. B. / Jonker, B. T. / Prinz, G. A. / Krebs, J. J. et al. | 1988
- 1531
-
Diffusion model for Ohmic contacts to GaAsKulkarni, A. K. / Lai, C. et al. | 1988
- 1535
-
Enhancement of silicon nitridation by alkali metalsSoukiassian, P. / Bakshi, M. H. / Starnberg, H. I. / Hurych, Z. / Gentle, T. M. / Schuette, K. P. et al. | 1988
- 1539
-
Fermi‐level pinning and heavily doped overlayersMahowald, P. H. / Spicer, W. E. et al. | 1988
- 1543
-
Chemical reactions at the Si/GaAs(110) and Si/InP(110) interfaces: Effects on valence‐band discontinuity measurementsList, R. S. / Kendelewicz, T. / Williams, M. D. / McCants, C. E. / Lindau, I. / Spicer, W. E. et al. | 1988
- 1548
-
Comparison of Au/GaAs Schottky contact properties modified by ion bombardment damage and mechanical polishingWang, Y. G. / Ashok, S. et al. | 1988
- 1552
-
Al surface mobility on Si(111) during initial stages of ionized cluster beam depositionLevenson, L. L. / Asano, M. / Tanaka, T. / Usui, H. / Yamada, I. / Takagi, T. et al. | 1988
- 1557
-
Summary Abstract: Surface composition of a thin Au film on Si surfaceYeh, J.‐J. / Hwang, J. / Cao, R. / Bertness, K. A. / Lindau, I. et al. | 1988
- 1558
-
Summary Abstract: A phase diagram for ultrathin nickel overlayers on Si(111)Bennett, P. A. / Johnson, A. P. / Halawith, B. N. et al. | 1988
- 1559
-
Summary Abstract: Theoretical investigation of Al chemisorbed on the (100) silicon surfaceRusso, N. / Toscano, M. et al. | 1988
- 1561
-
Summary Abstract: The role of interface states on Schottky behaviorJezequel, G. / Taleb‐Ibrahimi, A. / Ludeke, R. / Schäffler, F. et al. | 1988
- 1563
-
Summary Abstract: Direct evidence of the onset of In surface segregation for Co/InP(110)Vitomirov, I. M. / Xu, F. / Aldao, C. M. / Weaver, J. H. et al. | 1988
- 1564
-
Summary Abstract: Ternary solid phase equilibria in the systems (Ag,In,Au)–(Cd,Hg)–TeShuh, David K. / Williams, R. Stanley et al. | 1988
- 1565
-
Summary Abstract: Spectroscopic studies of the initial growth of AlSb on Sb(111) single crystalsSporken, R. / Xhonneux, P. / Caudano, R. / Delrue, J. P. et al. | 1988
- 1567
-
Summary Abstract: Catalytic oxidation of the Si(111)7×7 surface by cesiumStarnberg, H. I. / Bakshi, M. H. / Hurych, Z. / Soukiassian, P. et al. | 1988
- 1569
-
Summary Abstract: Adsorption of Cs on the GaAs(110) surfaceKendelewicz, T. / Soukiassian, P. / Bakshi, M. H. / Hurych, Z. / Lindau, I. / Spicer, W. E. et al. | 1988
- 1571
-
Summary Abstract: Temperature effects at the Sb/GaAs(110) interfaceCao, Renyu / Miyano, K. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1988
- 1572
-
Summary Abstract: A high‐resolution x‐ray photoelectron spectroscopy study of the valence‐band structure of single‐crystal metastable (GaAs)(1−x)(Ge2)xKramer, B. / Tomasch, G. / Ray, M. / Greene, J. E. / Salvati, L. / Barr, T. L. et al. | 1988
- 1575
-
Nonmonotonic evolution and thermodynamic trends at metal/(Hg,Cd)Te interfaces: Yb/Hg0.78Cd0.22TePeterman, D. J. / Raisanen, A. / Chang, S. / Philip, P. / Wall, A. / Franciosi, A. et al. | 1988
- 1579
-
Deep level formation and band bending at metal/CdTe interfacesShaw, J. L. / Viturro, R. E. / Brillson, L. J. / Kilday, D. / Kelly, M. / Margaritondo, G. et al. | 1988
- 1584
-
The interface formation and thermal stability of Ag overlayers grown on cubic SiC(100)Niles, David W. / Höchst, Hartmut / Zajac, G. W. / Fleisch, T. H. / Johnson, B. C. / Meese, J. M. et al. | 1988
- 1589
-
Effects of initial surface composition on the interface chemistry of gold on cubic SiC(100)Parrill, T. M. / Chung, Y. W. et al. | 1988
- 1593
-
Metal/semiconductor interfaces on SnO2(110)Erickson, J. W. / Fryberger, T. B. / Semancik, S. et al. | 1988
- 1599
-
Thermally stable tantalum nitride/silicon Schottky barriersAshok, S. / Crookshank, M. / Chu, M. / Sellers, G. et al. | 1988
- 1602
-
Transmission electron microscopy studies of brown and golden titanium nitride thin films as diffusion barriers in very large scale integrated circuitsKumar, N. / McGinn, J. T. / Pourrezaei, K. / Lee, B. / Douglas, E. C. et al. | 1988
- 1609
-
Summary Abstract: CoSi2 diffusion barrier modulation of Au/Si(111) interface reactionsAldao, C. M. / Xu, F. / Vitomirov, I. M. / Weaver, J. H. et al. | 1988
- 1611
-
Japanese programs and facilities for synchrotron radiation lithography and problems related to resistsOkada, K. et al. | 1988
- 1618
-
Summary Abstract: Synchrotron lithography in GermanyBetz, H. et al. | 1988
- 1621
-
Control of microstructure and properties of copper films using ion‐assisted depositionRoy, R. A. / Cuomo, J. J. / Yee, D. S. et al. | 1988
- 1627
-
Defining the fractal nature of thin‐film top surfaces from microdensitometer analysis of electron micrographs of surface replicasVarnier, F. / Dussert, C. / Rasigni, G. / Rasigni, M. / Llebaria, A. et al. | 1988
- 1631
-
Investigation of the void structure in amorphous germanium thin films as a function of low‐energy ion bombardmentYehoda, J. E. / Yang, B. / Vedam, K. / Messier, R. et al. | 1988
- 1636
-
The properties of aluminum thin films sputter deposited at elevated temperaturesInoue, M. / Hashizume, K. / Tsuchikawa, H. et al. | 1988
- 1640
-
Summary Abstract: Theory and simulations of zone II microstructures in thin filmsSrolovitz, D. J. / Mazor, A. / Bukiet, B. G. / Hagan, P. S. et al. | 1988
- 1642
-
Effect of resputtering on composition of WSix films deposited by multilayer sputteringBruce, R. / Eicher, S. / Westwood, W. D. et al. | 1988
- 1646
-
Investigation of cosputtered W–C thin films as diffusion barriersYang, H. Y. / Zhao, X.‐A. et al. | 1988
- 1650
-
Tungsten–rhenium alloys as diffusion barriers between aluminum and siliconHörnström, S. E. / Lin, T. / Thomas, O. / Fryer, P. M. / Harper, J. M. E. et al. | 1988
- 1656
-
Thermochemical modeling of interfacial reactions and selective deposition at growth from the vaporCarlsson, J. O. et al. | 1988
- 1663
-
Deposition of vanadium oxide films by direct‐current magnetron reactive sputteringKusano, E. / Theil, J. A. / Thornton, John A. et al. | 1988
- 1668
-
Selectively thermalized sputtering for the deposition of magnetic films with special anisotropiesCadieu, F. J. et al. | 1988
- 1675
-
Effects of residual gas control in relationship with sputtered aluminum film morphology and electromigration properties in fine‐line very large scale integrated structuresRocke, M. J. et al. | 1988
- 1681
-
Properties of hard tungsten films prepared by sputteringShih, K. K. / Smith, D. A. / Crowe, J. R. et al. | 1988
- 1686
-
Thin‐film infrared absorber structures for advanced thermal detectorsParsons, A. D. / Pedder, D. J. et al. | 1988
- 1690
-
Summary Abstract: Molecular dynamics studies of thin‐film depositionMüller, Karl‐Heinz et al. | 1988
- 1691
-
Summary Abstract: Intrinsic resputtering during sputter depositionHoffman, D. W. / Badgley, J. S. et al. | 1988
- 1693
-
Summary Abstract: Properties of titanium boride films prepared by reactive sputteringBlom, H.‐O. / Larsson, T. / Berg, S. / Östling, M. et al. | 1988
- 1694
-
Summary Abstract: Structure and properties of nitride thin films grown by magnetron sputter deposition: Effects of ion irradiation during growthSundgren, Jan‐Eric et al. | 1988
- 1695
-
Summary Abstract: Effect of oxygen incorporation in AlN thin filmsOhuchi, F. S. / French, R. H. et al. | 1988
- 1696
-
Summary Abstract: Thermomechanical properties of glow discharge deposited silicon and silicon oxide filmsJansen, F. / Machonkin, M. A. et al. | 1988
- 1699
-
Explosive crystallization in zirconium/silicon multilayersWickersham, C. E. / Poole, J. E. et al. | 1988
- 1703
-
Rugate filters by laser flash evaporation of SiOxNy on room‐temperature polycarbonateBartholomew, C. S. / Morrow, M. D. / Betz, H. T. / Grieser, J. L. / Spence, R. A. / Murarka, N. P. et al. | 1988
- 1708
-
Summary Abstract: Metastable face‐centered‐cubic Cu1−xCrx alloys (0<x<0.23) deposited by sputter deposition: Growth, structure, and physical propertiesMcIntyre, D. / Sundgren, J.‐E. / Greene, J. E. et al. | 1988
- 1709
-
Summary Abstract: Multilayer thin films for x‐ray opticsSpiller, Eberhard et al. | 1988
- 1710
-
Summary Abstract: The dependence of work function on overgrowth thickness in epitaxial Cu–Pd systemsVook, R. W. / Swirbel, T. J. / Bucci, J. V. et al. | 1988
- 1712
-
Growth of Al and Al nitride films in N2–Ne and N2–(Ne+Ar) discharges: Construction of a ternary gas phase diagramSiettmann, James R. / Aita, Carolyn Rubin et al. | 1988
- 1717
-
Resistivity changes and phase evolution in W–N films sputter deposited in Ne–N2 and Ar–N2 dischargesHuber, Karl John / Aita, Carolyn Rubin et al. | 1988
- 1722
-
Direct‐current magnetron fabrication of indium tin oxide/InP solar cellsCoutts, T. J. / Wu, X. / Gessert, T. A. / Li, X. et al. | 1988
- 1727
-
Effect of grain size on the oxidation kinetics of sputtered titanium nitride filmsThorpe, T. P. / Morrish, A. A. / Qadri, S. B. et al. | 1988
- 1730
-
The effects of oxygen contamination on the properties of reactively sputtered indium nitride filmsWestra, K. L. / Lawson, R. P. W. / Brett, M. J. et al. | 1988
- 1733
-
Area selective chemical vapor deposition of boron carbide achieved by molecular maskingJansson, Ulf / Carlsson, Jan‐Otto et al. | 1988
- 1736
-
Diffusion of boron, phosphorus, and arsenic implanted in thin films of cobalt disilicideThomas, O. / Gas, P. / d’Heurle, F. M. / LeGoues, F. K. / Michel, A. / Scilla, G. et al. | 1988
- 1740
-
Deposition of device quality silicon dioxide thin films by remote plasma enhanced chemical vapor depositionKim, Sang S. / Tsu, D. V. / Lucovsky, G. et al. | 1988
- 1745
-
Effects of sputtering through small apertures on the refractive index of niobium pentoxide filmsHickernell, Fred S. et al. | 1988
- 1749
-
Structural transitions in ballistic aggregation simulation of thin‐film growthBrett, M. J. et al. | 1988
- 1752
-
Lateral interactions in binary monolayer alloysMarkert, K. / Dolle, P. / Niemantsverdriet, J. W. / Wandelt, K. et al. | 1988
- 1756
-
A new technique for characterization of thin‐film ferroelectric memory devicesRohrer, G. / Narayan, S. / McMillan, L. / Kulkarni, A. et al. | 1988
- 1759
-
Complex impedance versus frequency analysis of Al:SiC:Al metal–insulator–metal structuresSoukup, R. J. / Tiwald, T. E. et al. | 1988
- 1763
-
Laser enhanced adhesion of copper films to sapphire substratesPedraza, Antonio J. / Godbole, Mukund J. / Kenik, Edward A. / Lowndes, Douglas H. / Thompson, James R. et al. | 1988
- 1768
-
Fabrication of ultrathin unsupported foilsGraper, Edward B. et al. | 1988
- 1770
-
Summary Abstract: Ceramic thin films from cluster beamsBrand, J. I. / Miller, D. R. et al. | 1988
- 1771
-
Summary Abstract: Small‐angle x‐ray scattering study of thin Au filmsLevine, J. R. / Chung, Y. W. / Cohen, J. B. / Georgopoulous, P. et al. | 1988
- 1772
-
Summary Abstract: Aluminum deposition on optical fibers by a hollow cathode magnetron sputtering systemKumar, N. / Pourrezaei, K. / Ihsan, M. et al. | 1988
- 1774
-
Summary Abstract: Pinhole‐free aluminum foilsArendt, P. N. / Reeves, G. A. / Cordi, R. C. / McCreary, W. J. / Springer, R. W. et al. | 1988
- 1775
-
Summary Abstract: Spatial variations in the electrode potential of capacitive radio‐frequency plasmas due to transverse electromagnetic modesSavas, Stephen E. / Plavidal, Richard W. et al. | 1988
- 1778
-
Dense ‘‘diamondlike’’ hydrocarbons as random covalent networksAngus, John C. / Jansen, Frank et al. | 1988
- 1783
-
Raman scattering characterization of carbon bonding in diamond and diamondlike thin filmsNemanich, R. J. / Glass, J. T. / Lucovsky, G. / Shroder, R. E. et al. | 1988
- 1788
-
Chemically bonded diamondlike films from ion‐beam depositionKasi, Srinandan R. / Kang, Heon / Rabalais, J. Wayne et al. | 1988
- 1793
-
Diamond films by ion‐assisted deposition at room temperatureKitabatake, Makoto / Wasa, Kiyotaka et al. | 1988
- 1798
-
Graphitization of amorphous diamondlike carbon films by ion bombardmentGonzález‐Hernández, J. / Asomoza, R. / Reyes‐Mena, A. / Rickards C., J. / Chao, S. S. / Pawlik, D. et al. | 1988
- 1803
-
Chemical erosion of graphite by hydrogen impact: A summary of the database relevant to diamond film growthHsu, W. L. et al. | 1988
- 1812
-
Plasma enhanced chemical vapor deposition of polycrystalline diamond and diamondlike filmsVitkavage, D. J. / Rudder, R. A. / Fountain, G. G. / Markunas, R. J. et al. | 1988
- 1816
-
Summary Abstract: Morphology and growth of diamond filmsKobashi, Koji / Nishimura, Kozo / Kawate, Yoshio / Horiuchi, Takefumi et al. | 1988
- 1818
-
Summary Abstract: Synthesis of semiconductive diamond on diamond substrate from gas phaseKamo, Mutsukazu / Yurimoto, Hisayoshi / Sato, Yoichiro / Setaka, Nobuo et al. | 1988
- 1819
-
Summary Abstract: Structural and chemical characterization of diamond films and diamond–substrate interfacesWilliams, B. E. / Glass, J. T. / Davis, R. F. / Kobashi, K. / Horiuchi, T. et al. | 1988
- 1821
-
Magnetron plasma diagnostics and processing implicationsRossnagel, S. M. et al. | 1988
- 1827
-
Radial current distribution at a planar magnetron cathodeWendt, A. E. / Lieberman, M. A. / Meuth, H. et al. | 1988
- 1832
-
A physical model for eliminating instabilities in reactive sputteringLarsson, T. / Blom, H‐O. / Nender, C. / Berg, S. et al. | 1988
- 1837
-
Hollow cathode etching and depositionHorwitz, Chris M. / Boronkay, S. / Gross, M. / Davies, K. et al. | 1988
- 1845
-
A quasi‐direct‐current sputtering technique for the deposition of dielectrics at enhanced ratesEste, G. / Westwood, W. D. et al. | 1988
- 1849
-
Spectroscopic emission studies of O2/He and N2/He plasmas in remote plasma enhanced chemical vapor depositionTsu, D. V. / Parsons, G. N. / Lucovsky, G. et al. | 1988
- 1855
-
Reversible change between metastable crystalline phases by laser beam irradiation in sputtered Au–Ge alloy filmsIkegawa, S. / Komatsu, S. / Arai, S. / Kikitsu, A. / Yasuda, N. et al. | 1988
- 1859
-
A quantitative characterization of tellurium suboxide thin films by x‐ray photoelectron spectroscopyRaychaudhuri, Pranab K. / Reznik, S. et al. | 1988
- 1862
-
Summary Abstract: Duplex coatings for the protection of magneto‐optic alloys against oxidation and corrosionFrankenthal, R. P. / van Dover, R. B. / Siconolfi, D. J. et al. | 1988
- 1863
-
Summary Abstract: Surface characterization of corrosion processes in FeTb alloy thin filmsStork, Kurt F. / Armstrong, Neal R. / Lee, Paul A. et al. | 1988
- 1864
-
Summary Abstract: Magneto‐optical recording in thin amorphous films of rare‐earth–transition‐metal alloysMansuripur, M. et al. | 1988
- 1865
-
Summary Abstract: Magnetic properties of thin metal cluster filmsAndrien, B. / Haugdahl, J. / Miller, D. R. et al. | 1988
- 1869
-
The deposition rate dependence of plasma polymerization on the radius of curvature of the substrateLintz, H. K. / Murrell, S. R. / Crawley, R. L. / Daukas, J. C. et al. | 1988
- 1872
-
Heat transport in doubly contained uranium storage bedsHeics, A. G. / Shmayda, W. T. / Kherani, N. P. et al. | 1988
- 1876
-
An analysis of the thermally induced formation of a uniform liquid layer of ternary deuterium–tritium mixture inside a cryogenic spherical shell inertial confinement fusion targetVaradarajan, V. / Kim, K. / Bernat, T. P. et al. | 1988
- 1882
-
A real‐time holographic interferometry technique for measuring cryogenic fuel layers in large inertial confinement fusion targetsPattinson, T. R. / Felmlee, W. J. et al. | 1988
- 1885
-
Beta energy driven uniform deuterium–tritium ice layer in reactor‐size cryogenic inertial fusion targetsMartin, A. J. / Simms, R. J. / Jacobs, R. B. et al. | 1988
- 1889
-
Apparatus for verification of beta heating driven layer uniformity in solid deuterium–tritiumMruzek, M. T. / Ankney, J. S. / Decker, D. N. et al. | 1988
- 1891
-
Summary Abstract: Analysis of sputter coating uniformity by computer modelingUpadhye, R. S. / Kong, M. K. / Hsieh, E. J. et al. | 1988
- 1893
-
Summary Abstract: Studies of internal stresses and surface roughness of sputtered Be and BeB filmsHsieh, E. J. / Gillespie, C. H. / Pierce, E. L. / Hatcher, C. W. et al. | 1988
- 1894
-
Summary Abstract: Low‐density polystyrene foam materials for direct‐drive laser inertial confinement fusion targetsKong, Fung‐Ming / Cook, Robert / Haendler, Blanca / Hair, Lucy / Letts, Steve et al. | 1988
- 1896
-
Summary Abstract: Characterization of low‐density foam materials for direct‐drive laser inertial confinement fusion targetsLetts, S. A. / Buckley, S. R. / Chen, C. / Cook, A. R. / Haendler, B. L. / Hair, L. M. / Kong, F. M. / Mance, S. C. / Overturf, G. E. / Thomas, C. et al. | 1988
- 1898
-
Summary Abstract: Imaging system for solid deuterium–tritium layers held in an isothermal environmentAnkney, J. S. / Mruzek, M. T. / Decker, D. N. et al. | 1988
- 1899
-
Summary Abstract: Spot spectroscopy targets made from powderSteinman, D. / Caldwell, V. / Husband, D. / Ruppe, J. / Welch, S. et al. | 1988
- 1901
-
A three‐barrel repeating pneumatic pellet injector for plasma fueling of the Joint European TorusCombs, S. K. / Milora, S. L. / Baylor, L. R. / Foust, C. R. / Gethers, F. E. / Sparks, D. O. et al. | 1988
- 1907
-
Vacuum vapor deposited thin films of a perylene dicarboximide derivative: Microstructure versus deposition parametersDebe, M. K. / Kam, K. K. / Liu, J. C. / Poirier, R. J. et al. | 1988
- 1912
-
Properties of intrinsic and doped a‐Si:H deposited by remote plasma enhanced chemical vapor depositionParsons, G. N. / Tsu, D. V. / Lucovsky, G. et al. | 1988
- 1917
-
Summary Abstract: Plasma polymerization: State, problems, and recent developments of the production technologyKieser, J. et al. | 1988
- 1918
-
Summary Abstract: Preparation and characterization of plasma polymerized ethylene oxide thin filmsProhaska, G. W. / Nickoson, C. G. et al. | 1988
- 1919
-
Summary Abstract: Molecular reactions at the film surface in plasma polymerizationBuss, R. J. et al. | 1988
- 1920
-
Summary Abstract: Surface chemical reactions in the metal–organic chemical vapor deposition of aluminum filmsBent, B. E. / Nuzzo, R. G. / Dubois, L. H. et al. | 1988
- 1922
-
Summary Abstract: Comparative study of plasma‐enhanced chemical vapor deposited silicon nitride filmsDharmadhikari, Vineet S. et al. | 1988
- 1924
-
Stress modification of Ni–Fe films by ion bombardment concurrent with film growth by alloy evaporationWojciechowski, P. H. et al. | 1988
- 1929
-
Ion beam self‐sputtering using a cathodic arc ion sourceSanders, D. M. et al. | 1988
- 1934
-
Summary Abstract: Factors important to achieving compositional control and reproducibility in a reactive ion beam assisted deposition processVan Vechten, D. / Hubler, G. K. / Donovan, E. P. et al. | 1988
- 1935
-
Summary Abstract: Investigation of low‐energy ion assisted deposition of refractory metalsWindow, B. / Sharples, F. / Savvides, N. et al. | 1988
- 1939
-
Overlayer interactions with (HgCd)TeDavis, G. D. et al. | 1988
- 1946
-
Epitaxial growth and x‐ray structural characterization of Zn1−xFexSe films on GaAs(001)Jonker, B. T. / Qadri, S. B. / Krebs, J. J. / Prinz, G. A. et al. | 1988
- 1950
-
Growth and luminescence spectroscopy of a CuCl quantum well structureWilliams, R. Stanley / Shuh, David K. / Segawa, Yusaburo et al. | 1988
- 1953
-
Summary Abstract: Device applications of diamondsGeis, M. W. / Efremow, N. N. / Rathman, D. D. et al. | 1988
- 1954
-
Summary Abstract: Epitaxial growth, doping, and analytical characterization of monocrystalline beta‐SiC semiconductor thin filmsKim, H. J. / Kong, H. / Edmond, J. A. / Ryu, J. / Palmour, J. / Carter, C. H. / Glass, J. T. / Davis, R. F. et al. | 1988
- 1957
-
Atomic and electronic structure of tetrahedrally coordinated compound semiconductor interfacesDuke, C. B. et al. | 1988
- 1963
-
Step structure and dimer row correlations in vicinal Si(100)Aumann, C. E. / Savage, D. E. / Kariotis, R. / Lagally, M. G. et al. | 1988
- 1966
-
The role of strain in Si(111)7×7 and related reconstructed surfacesRobinson, I. K. et al. | 1988
- 1971
-
The ‘‘other side’’ of the Schottky barrier formation process: Si 3×3 overlayers on Al(111)Chang, Y. / Colavita, E. / Tache, N. / Margaritondo, G. et al. | 1988
- 1973
-
Summary Abstract: Theoretical investigations of fluorine–silicon systemsVan de Walle, Chris G. / Bar‐Yam, Y. / McFeely, F. R. / Pantelides, S. T. et al. | 1988
- 1975
-
Radio‐frequency coupling to plasmasColestock, P. L. et al. | 1988
- 1984
-
Effect of oxygen on fluorine‐based remote plasma etching of silicon and silicon dioxideLoewenstein, Lee M. et al. | 1988
- 1989
-
X‐ray photoemission spectroscopy characterization of silicon surfaces after CF4/H2 magnetron ion etching: Comparisons to reactive ion etchingOehrlein, Gottlieb S. / Bright, Arthur A. / Robey, Steve W. et al. | 1988
- 1994
-
Summary Abstract: Nucleation and growth of ultrathin metallic overlayers on single‐crystal transition‐metal surfacesChambers, S. A. / Chen, H. W. / Wagener, T. J. / Weaver, J. H. et al. | 1988
- 1995
-
Summary Abstract: Growth of ultrathin Fe films on Cu(100): Mechanisms, morphology, and stabilitySteigerwald, D. A. / Egelhoff, W. F. et al. | 1988
- 1997
-
Phenomena produced by ion bombardment in plasma‐assisted etching environmentsWinters, Harold F. et al. | 1988
- 2001
-
Particle balance in the Tokamak Fusion Test ReactorUlrickson, M. / Dylla, H. F. / LaMarche, P. H. / Buchenauer, D. et al. | 1988
- 2004
-
Characteristics of radiated power for various Tokamak Fusion Test Reactor regimesBush, C. E. / Schivell, J. / McNeill, D. H. / Medley, S. S. / Hendel, H. W. / Hulse, R. A. / Ramsey, A. T. / Stratton, B. C. / Dylla, H. F. / Grek, B. et al. | 1988
- 2008
-
Summary Abstract: Plasma‐induced residual gas transientsMioduszewski, P. K. / Simpkins, J. E. / Uckan, T. et al. | 1988
- 2010
-
The influence of substrate temperature on the optical properties of ion‐assisted reactively evaporated vanadium oxide thin filmsCase, F. C. et al. | 1988
- 2015
-
Control of ion bombardment energy in the low‐temperature deposition of highly transparent and conducting In2O3 and ZnO thin films by activated reactive evaporationLau, W. S. et al. | 1988
- 2020
-
Summary Abstract: Optical characteristics of thin films deposited at low temperature using ion assisted depositionWilliams, Forrest L. / Jacobson, R. D. / McNeil, J. R. / Exarhos, G. J. / McNally, J. J. et al. | 1988
- 2022
-
Issues in molecular‐beam epitaxy kinetics of compound semiconductor based heterostructuresSingh, Jasprit / Bajaj, K. K. et al. | 1988
- 2029
-
Kinetics of growth coalescence of In/GaAsAdams, J. B. / Hitchon, W. N. G. / Holzmann, L. M. et al. | 1988
- 2034
-
Room‐temperature growth of ultrathin Ni films on Si(111)Porter, T. L. / Chang, C. S. / Knipping, U. / Tsong, I. S. T. et al. | 1988
- 2037
-
Summary Abstract: Surface diffusion and islanding in semiconductor heterostructures: Ge on SiGossmann, H.‐J. / Fisanick, G. J. et al. | 1988
- 2039
-
Summary Abstract: Monte Carlo simulations of the role of (2×1) reconstruction dimers and surface diffusion on the growth of Si(001)Rockett, A. / Barnett, S. A. et al. | 1988
- 2041
-
Laser diagnostic techniques for reactive ion etching: Plasma understanding to process controlSelwyn, Gary S. et al. | 1988
- 2047
-
Heated Langmuir probe measurements of reactive direct‐current magnetron plasmasBell, Brent C. / Glocker, David A. et al. | 1988
- 2051
-
Measurements of electron temperature in a capacitively coupled plasma using emission spectroscopyFelts, J. / Lopata, E. et al. | 1988
- 2054
-
Measurement of plasma potential using collecting and emitting probesHershkowitz, N. / Cho, M. H. et al. | 1988
- 2060
-
Summary Abstract: Diagnostics of film growth in plasma chemical vapor depositionKnights, John C. et al. | 1988
- 2061
-
Summary Abstract: New diagnostic approaches for high‐temperature plasmasYoung, Kenneth M. et al. | 1988
- 2062
-
Summary Abstract: Behavior and structure of metal vapor arc plasma between molten electrodesZanner, F. J. / Williamson, R. L. / Hareland, W. A. / Bertram, L. A. et al. | 1988
- 2064
-
Depth of origin of sputtered atoms: Experimental and theoretical study of Cu/Ru(0001)Burnett, J. W. / Biersack, J. P. / Gruen, D. M. / Jo/rgensen, B. / Krauss, A. R. / Pellin, M. J. / Schweitzer, E. L. / Yates, J. T. / Young, C. E. et al. | 1988
- 2069
-
Geometrical and surface effects in the sputtering processSchwarz, S. A. et al. | 1988
- 2073
-
Quantification of surface Li in 16.4% CuLi alloys by direct recoil and Auger analysis of element specific chemisorption complexesSchmidt, H. K. / Anderson, L. R. / Schultz, J. A. / Krauss, A. / Biwer, B. / Gruen, D. M. / Shamir, N. / Mintz, M. et al. | 1988
- 2077
-
Ion sputtering yield measurements for submicrometer thin filmsVeisfeld, Nina / Geller, Joseph D. et al. | 1988
- 2082
-
Summary Abstract: High sputter rate secondary ion mass spectrometry analysis of insulators used in microelectronics and lightwave applicationsStevie, F. A. / Rana, V. V. S. / Harrus, A. S. / Briggs, T. H. / Skeath, Perry et al. | 1988
- 2085
-
Elastic electron fine structure: Application to the study of local orderLin, B. Y. / Kahn, A. et al. | 1988
- 2089
-
Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscopeMarti, O. / Drake, B. / Gould, S. / Hansma, P. K. et al. | 1988
- 2093
-
Summary Abstract: Forward focusing of diffracted and emitted electrons as a surface structural toolXu, M. L. / Barton, J. J. / Van Hove, M. A. et al. | 1988
- 2094
-
Summary Abstract: Structure characterization of silicide–silicon interfacesFischer, A. E. M. J. et al. | 1988
- 2095
-
Summary Abstract: Development of a rapid imaging microscope for x‐ray photoelectron spectroscopySmith, G. C. / Seah, M. P. et al. | 1988
- 2097
-
Mechanisms of contaminant particle production, migration, and adhesionMiller, R. J. / Cooper, D. W. / Nagaraj, H. S. / Owens, B. L. / Peters, M. H. / Wolfe, H. L. / Wu, J. J. et al. | 1988
- 2103
-
Microprocessor controlled ultrahigh vacuum evaporations of critical thin films, multilayer structures, and coevaporated materialsFischer, H. / Grob, M. / Peter, G. / Koprio, J. A. et al. | 1988
- 2109
-
Summary Abstract: Sputter deposition in ultrahigh vacuum systemsFischer, H. / Peter, G. / Koprio, J. A. et al. | 1988
- 2111
-
Deposition of carbon, deuterium, and metals on the wall and limiters of the Tokamak Fusion Test ReactorWampler, W. R. / Doyle, B. L. / Lee, S. R. / Pontau, A. E. / Mills, B. E. / Causey, R. A. / Buchenauer, D. / Dylla, H. F. / Ulrickson, M. A. / LaMarche, P. H. et al. | 1988
- 2116
-
Residual hydrogen concentration levels in graphiteBastasz, R. et al. | 1988
- 2119
-
Helium‐ion‐induced release of hydrogen from graphiteLangley, R. A. et al. | 1988
- 2122
-
Performance testing of carbon–carbon composites as plasma‐facing materials for magnetic fusion reactorsCausey, R. A. / Hsu, W. L. / Pontau, A. E. / Croessmann, C. D. / Ulrickson, M. A. et al. | 1988
- 2125
-
Analysis of self‐regenerating coatings for pulsed‐mode fusion plasma operationDeWald, A. B. / Krauss, A. R. / Lam, N. Q. et al. | 1988
- 2130
-
Imaging of tritium implanted into graphiteMalinowski, M. E. / Causey, R. A. et al. | 1988
- 2136
-
Deposition and characterization of ternary nitridesRandhawa, H. / Johnson, P. C. / Cunningham, R. et al. | 1988
- 2140
-
On the existence of point defects in physical vapor deposited films of TiN, ZrN, and HfNPerry, A. J. et al. | 1988
- 2149
-
Mechanical property and structure relationships in hard coatings for cutting toolsQuinto, Dennis T. et al. | 1988
- 2158
-
Structure and composition of ZrN and (Ti,Al)N coatingsPenttinen, I. / Molarius, J. M. / Korhonen, A. S. / Lappalainen, R. et al. | 1988
- 2162
-
Summary Abstract: Characterization of AlN films produced by chemical vapor deposition using a novel metal azide precursorSchulze, R. K. / Mantell, D. R. / Gladfelter, W. L. / Evans, J. F. et al. | 1988
- 2163
-
Summary Abstract: Friction and wear studies of titanium nitride films formed by reactive deposition in ultrahigh vacuumPeebles, D. E. / Pope, L. E. et al. | 1988